Optical power measurement circuit, system and method and laser

Abstract

An optical power measurement circuit (10), an optical power measurement system (1), an optical power measurement method and a laser. The optical power measurement circuit (10) comprises: an analog signal processing circuit (100), which is configured to convert into an analog circuit signal (PD_OUT) a laser pulse signal emitted by a laser; a peak detection circuit (201), which is configured to perform peak signal detection on the analog circuit signal (PD_OUT) output by the analog signal processing circuit (100), and output a peak signal (PEAK_OUT) of the analog circuit signal (PD_OUT); an integration circuit (202), which is configured to perform integration processing on the analog circuit signal (PD_OUT) output by the analog signal processing circuit (100), and output an integral value signal (INTE_OUT) of the analog circuit signal (PD_OUT); and a microcontroller (300), which is configured to receive the peak signal (PEAK_OUT) and the integral value signal (INTE_OUT) and, on the basis of the peak signal (PEAK_OUT) and the integral value signal (INTE_OUT), calculate output parameters of the laser. The efficiency of optical power measurement can be improved.

Description

Optical power detection circuit, system, method and laser Technical Field

[0001] This application relates to the field of laser technology, and in particular to an optical power detection circuit, system, method and laser. Background Technology

[0002] With the development of laser technology, optical power feedback modules have emerged. These modules can sample the output of the laser and perform power detection, thereby providing power feedback.

[0003] In traditional technology, after the laser emits light, it undergoes analog signal processing such as amplification and filtering. Then, the MCU (Micro Controller Unit) directly collects the analog circuit signals and calculates the output power and other related parameters of the laser pulse. However, the MCU has limited computing resources and capabilities and faces heavy computational pressure, resulting in low calculation efficiency for output power and other related parameters. This leads to untimely and inaccurate optical power detection and feedback. In particular, for laser equipment used in the medical field, untimely optical power detection may cause equipment safety issues. Summary of the Invention

[0004] Therefore, it is necessary to provide an optical power detection circuit, system, method, laser method, device, computer equipment, and storage medium that can improve the efficiency of laser power detection, addressing the aforementioned technical problems.

[0005] In a first aspect, an optical power detection circuit is provided, which is applied to a laser. The optical power detection circuit includes:

[0006] An analog signal processing circuit is configured to convert laser pulse signals emitted by a laser into analog circuit signals;

[0007] A peak detection circuit is configured to detect the peak signal of the analog circuit signal output by the analog signal processing circuit and output the peak signal of the analog circuit signal.

[0008] An integrating circuit is configured to integrate the analog circuit signal output by the analog signal processing circuit and output the integrated value signal of the analog circuit signal.

[0009] The microcontroller is configured to receive peak and integral signals and calculate the laser's output parameters based on the peak and integral signals.

[0010] In some embodiments, the peak detection circuit includes a front-end comparator follower circuit, a first unidirectional conducting element, a field-effect transistor element, and a first capacitor element, wherein...

[0011] The first input terminal of the front-end comparator follower circuit is configured to receive an analog circuit signal, and the output terminal of the front-end comparator follower circuit is connected to the positive terminal of the first unidirectional conducting element;

[0012] The negative terminal of the first unidirectional conducting element is connected to the second terminal of the field-effect transistor element;

[0013] The first terminal of the field-effect transistor element is used to output the peak signal, and the third terminal of the field-effect transistor element is connected to the first terminal of the first capacitor element.

[0014] The second terminal of the first capacitor element is grounded.

[0015] In some embodiments, the peak detection circuit further includes a negative feedback circuit, wherein...

[0016] The non-inverting input terminal of the negative feedback circuit is connected to the first terminal of the field-effect transistor element;

[0017] The output of the negative feedback circuit is connected to the inverting input of the negative feedback circuit, the negative terminal of the first unidirectional conducting element, the second terminal of the field-effect transistor element, and the second input of the front-end comparator follower circuit.

[0018] In some embodiments, the front-end comparator follower circuit includes a first operational amplifier, a second unidirectional conducting element, and a second capacitor element; wherein...

[0019] The non-inverting input of the first operational amplifier is configured to receive an analog circuit signal;

[0020] The inverting input of the first operational amplifier is connected to the negative terminal of the second unidirectional conducting element, the first terminal of the second capacitor element, and the output terminal of the negative feedback circuit.

[0021] The output terminal of the first operational amplifier is connected to the positive terminal of the second unidirectional conducting element, the second terminal of the second capacitor element, and the positive terminal of the first unidirectional conducting element.

[0022] In some embodiments, the integrating circuit includes a second operational amplifier, a third capacitor element, a fourth capacitor element, a first resistor element, a second resistor element, and a third resistor element; wherein,

[0023] The inverting input of the second operational amplifier is connected to the first terminal of the third capacitor element and the first terminal of the first resistor element, and the second terminal of the first resistor element is grounded.

[0024] The non-inverting input of the second operational amplifier is connected to the first terminal of the second resistor element and the first terminal of the fourth capacitor element. The second terminal of the fourth capacitor element is grounded, and the second terminal of the second resistor element is connected to the output terminal of the analog signal processing circuit.

[0025] The output of the second operational amplifier is connected to the second terminal of the third capacitor and the first terminal of the third resistor. The second terminal of the third resistor is connected to the analog-to-digital converter pin of the microcontroller.

[0026] In some embodiments, the optical power detection circuit further includes:

[0027] The trigger signal generation circuit is configured to trigger and detect the analog circuit signal output by the analog signal processing circuit, and transmit the analog circuit signal to the microcontroller for pulse width detection after the amplitude of the analog circuit signal is greater than the preset trigger threshold.

[0028] The microcontroller is also configured to calculate the laser's output parameters based on the peak signal, the integral signal, and the pulse width.

[0029] In some embodiments, the optical power detection circuit further includes:

[0030] The pulse detection circuit is connected to the analog signal processing circuit, the trigger signal generation circuit, and the microcontroller. It is configured to amplify the analog circuit signal output by the analog signal processing circuit and then input the amplified analog circuit signal into the trigger signal generation circuit for trigger detection.

[0031] In some embodiments, the trigger signal generation circuit includes a comparator, a fourth resistive element, a fifth resistive element, and a level shifter; wherein,

[0032] The non-inverting input of the comparator is connected to the output of the analog signal processing circuit;

[0033] The inverting input of the comparator is connected to the first terminal of the fourth resistor element and the first terminal of the fifth resistor element. The second terminal of the fourth resistor element is connected to the power supply voltage, and the second terminal of the fifth resistor element is grounded.

[0034] The comparator's output is connected to the level converter's input, and the level converter's output is connected to the microcontroller's analog-to-digital converter pin.

[0035] In some embodiments, the pulse detection circuit is implemented using a non-inverting amplifier circuit.

[0036] Secondly, an optical power detection system is also provided, comprising a power supply circuit, a bus circuit, a photoelectric sensor, and an optical power detection circuit according to any one of the components in the first aspect; wherein,

[0037] The power supply circuit is configured to supply power to the optical power detection circuit, the photoelectric sensor, and the bus circuit.

[0038] The photoelectric sensor is configured to acquire the laser pulse signal from the laser and convert the laser pulse signal into a current signal, which is then input to the analog signal processing circuit.

[0039] The bus circuit is configured as a host computer connecting the microcontroller and the laser.

[0040] Thirdly, a method for detecting optical power is also provided, wherein the method is applied to a microprocessor of the optical power detection circuit of any one of the first aspects, the method comprising:

[0041] In response to the detection of a laser pulse signal from the laser, the optical power detection circuit is enabled to acquire the analog circuit signal output by the analog signal processing circuit;

[0042] Acquire the peak and integral signals output by the optical power detection circuit, and calculate the laser's output parameters based on the peak and integral signals; and

[0043] The peak signal, integral signal, and calculated output parameters are sent to the host computer, which then compares the peak signal, integral signal, and calculated output parameters with the corresponding preset standard parameters and adjusts the laser's next output parameters based on the comparison results.

[0044] Fourthly, a laser is also provided, which includes a host computer, a main control board circuit, and an optical power detection system as described in the second aspect.

[0045] The aforementioned optical power detection circuit, system, method, and laser, by adding a peak detection circuit and an integration circuit at the front end of the microcontroller's signal acquisition path—that is, between the analog signal processing circuit and the microcontroller—can perform partial pre-processing of the analog circuit signal based on hardware circuitry before the microcontroller acquires the analog circuit signal, thereby obtaining the peak signal and the integral value signal. Then, the peak signal and the integral value signal are directly transmitted to the microcontroller for subsequent calculation of output parameters such as laser output power. Since the peak detection circuit and the integration circuit share some of the computational burden of the microcontroller, and the signal processing speed based on hardware circuitry is faster than that based on software, the microcontroller can calculate the laser's output parameters more promptly and quickly, thereby reducing the computational burden on the microcontroller, improving its computational speed, and ultimately improving the efficiency of optical power detection. Attached Figure Description

[0046] Figure 1 is a schematic diagram of the optical power detection circuit in some embodiments;

[0047] Figure 2 is a schematic diagram of the peak detection circuit in some embodiments;

[0048] Figure 3 is a schematic diagram of the integrator circuit in some embodiments;

[0049] Figure 4 is a schematic diagram of the optical power detection circuit in some other embodiments;

[0050] Figure 5 is a schematic diagram of the trigger signal generation circuit in some embodiments;

[0051] Figure 6 is a schematic diagram of the pulse detection circuit in some embodiments;

[0052] Figure 7 is a structural block diagram of the optical power detection system of the laser in some embodiments;

[0053] Figure 8 is a flowchart illustrating the optical power detection method in some embodiments. Detailed Implementation

[0054] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0055] In some embodiments, as shown in FIG1, an optical power detection circuit 100 is provided. This optical power detection circuit 100 can be applied in the optical power detection system 1 of the laser shown in FIG7. The optical power detection circuit 100 may include:

[0056] Analog signal processing circuit 100 is configured to convert laser pulse signals emitted by a laser into analog circuit signals;

[0057] Peak detection circuit 201 is configured to detect the peak signal of the analog circuit signal output by the analog signal processing circuit and output the peak signal of the analog circuit signal.

[0058] Integrating circuit 202 is configured to integrate the analog circuit signal output by the analog signal processing circuit and output the integrated value signal of the analog circuit signal.

[0059] The microcontroller 300 is configured to receive peak and integral signals and calculate the output parameters of the laser based on the peak and integral signals.

[0060] The aforementioned optical power detection circuit 10, by adding a peak detection circuit 201 and an integration circuit 202 at the front end of the signal acquisition path of the microcontroller 300, that is, between the analog signal processing circuit 100 and the microcontroller 300, can perform partial pre-processing of the analog circuit signal based on hardware circuitry before the microcontroller 300 acquires the analog circuit signal, thereby obtaining the peak signal and the integration value signal. Then, the peak signal and the integration value signal are directly transmitted to the microcontroller 300 for subsequent calculation of output parameters such as laser output power. Since the peak detection circuit 201 and the integration circuit 202 share some of the computational burden of the microcontroller 300, and the signal processing speed based on hardware circuitry is faster than that based on software, the microcontroller 300 can calculate the laser output parameters more timely and quickly, thereby reducing the computational burden of the microcontroller 300, improving the computational speed of the microcontroller 300, and thus improving the efficiency of optical power detection.

[0061] In some embodiments, referring to FIG2, FIG2 shows a schematic diagram of the peak detection circuit in some embodiments. The peak detection circuit 201 may include a front-end comparison follower circuit 2011, a first unidirectional conducting element D2, a field-effect transistor element Q1, and a first capacitor element C3.

[0062] The first input terminal of the front-end comparator follower circuit 2011 is configured to receive the analog circuit signal PD_OUT, and the output terminal of the front-end comparator follower circuit 2011 is connected to the positive terminal D2+ of the first unidirectional conducting element D2;

[0063] The negative terminal D2- of the first unidirectional conducting element D2 is connected to the second terminal (gate G, pin 2) of the field-effect transistor element Q1;

[0064] The first terminal (drain D, pin 1) of the field-effect transistor Q1 can be used to output the peak signal PEAK_OUT. The third terminal (source S, pin 3) of the field-effect transistor Q1 is connected to the first terminal of the first capacitor C3; and

[0065] The second terminal of the first capacitor element C3 is grounded to GND.

[0066] For example, the field-effect transistor element Q1 can be, for example, a JFET (Junction Field-Effect Transistor). A JFET is a three-terminal active device with amplification function, which can be either N-channel or P-channel. In practical applications, the connection method of the three terminals of the JFET can be adaptively adjusted according to the different types selected.

[0067] For example, the first capacitor element C3 can be a polystyrene capacitor. Since polystyrene material itself has high chemical stability, using a polystyrene capacitor can make the charging speed faster and the discharging speed slower. Moreover, the capacitance value is not easily affected by working conditions and temperature changes, and it can better store charge, thereby making the peak value obtained by the peak detection circuit 201 more accurate.

[0068] In this embodiment, peak detection can begin when a signal is input to the input terminal of the front-end comparison follower circuit 2011. Since the first unidirectional conducting element D2 has a certain on-state voltage drop, when the input analog circuit signal PD_OUT is less than the on-state voltage drop of the first unidirectional conducting element D2, the first unidirectional conducting element D2 will not conduct, that is, the peak detection circuit 201 will be in a malfunctioning state. Alternatively, when the difference between the voltage of the input analog circuit signal PD_OUT and the on-state voltage drop of the first unidirectional conducting element D2 is less than a threshold, the charging speed of the first capacitor element C3 will be very slow. These factors all affect the detection efficiency of the peak detection circuit 201. Therefore, by adding a current-end comparison follower circuit 2011 before the first unidirectional conducting element D2, it can, on the one hand, act as a voltage follower, isolating and buffering the preceding and following circuits, ensuring that the operation of the preceding analog signal processing circuit is not affected. On the other hand, even when the voltage of the input analog circuit signal PD_OUT is low, it can capture and amplify the voltage signal so that it quickly reaches the conduction condition of the first unidirectional conducting element D2, thereby triggering the normal operation of the peak detection circuit 201 in a timely and accurate manner. Then, by connecting a field-effect transistor element Q1 after the first unidirectional conducting element D2, since the field-effect transistor element Q1 has a smaller leakage current and a smaller junction capacitance than the crystal diode, its placement here allows the first capacitor element C3 to discharge more slowly. Due to the above configuration, the first capacitor element C3 charges faster and discharges more slowly, thus improving the peak holding effect of the peak detection circuit 201, thereby improving the stability and accuracy of the peak signal output.

[0069] Furthermore, by adding a negative feedback circuit 2012 after the field-effect transistor element Q1, referring to Figure 2, the negative feedback circuit 2012 may include an operational amplifier U1B, resistors R1, R3, and R4. The connection relationship between the negative feedback circuit 2012 and other units in the peak detection circuit 201 can be as follows:

[0070] The non-inverting input of the negative feedback circuit 2012 (e.g., pin 5 of U1B+ and U1B) is connected to the first terminal (drain D, pin 1) of the field-effect transistor element Q1.

[0071] The output terminal of the negative feedback circuit 2012 (e.g., pin 7 of U1B) is connected to the inverting input terminal of the negative feedback circuit 2012 (e.g., pin 6 of U1B-), the negative terminal D2- of the first unidirectional conducting element D2, the second terminal (gate G, pin 2) of the field-effect transistor element Q1, and the second input terminal of the front-end comparator follower circuit 2011. The resistance values, number, and connection method of the resistors R1, R3, and R4 in Figure 2 can be adjusted according to the actual application, as long as the function of the negative feedback circuit can be achieved.

[0072] In this embodiment, the negative feedback circuit 2012 based on the operational amplifier U1B can make the operation of the operational amplifier in the current comparison follower circuit 2011 more stable, thereby making the output of the entire peak detection circuit 201 more stable. In addition, the operational amplifier U1B in the negative feedback circuit 2012 can also act as a voltage follower. Utilizing the characteristics of the voltage follower itself, which has high input impedance and low output impedance, it plays a role in isolating and buffering the preceding and following circuits, so that the peak signal PEAK_OUT output to the microcontroller 300 will not be affected.

[0073] In some embodiments, continuing to refer to FIG2, the front-end comparator follower circuit 2011 may include a first operational amplifier U5B, a second unidirectional conducting element D1, and a second capacitor element C2; wherein, the non-inverting input terminal U5B+ of the first operational amplifier U5B is configured to connect to the analog circuit signal PD_OUT; the inverting input terminal U5B- of the first operational amplifier U5B is connected to the negative terminal D1- of the second unidirectional conducting element D1, the first terminal of the second capacitor element C2, and the output terminal of the negative feedback circuit 2012; the output terminal of the first operational amplifier U5B is connected to the positive terminal D1+ of the second unidirectional conducting element D1, the second terminal of the second capacitor element C2, and the positive terminal D2+ of the first unidirectional conducting element D2.

[0074] In this embodiment, the first operational amplifier U5B and the second capacitor C2 can function as a front-end operational amplifier comparator and a voltage follower. When there is a signal input at the non-inverting input terminal U5B+ (pin 5) of the first operational amplifier U5B, the peak detection circuit 201 can start peak detection. However, if there is no first operational amplifier U5B, when the input analog circuit signal PD_OUT is less than the on-state voltage drop of the first unidirectional conducting element D2, the first unidirectional conducting element D2 will not conduct, that is, the peak detection circuit 201 will be in a malfunctioning state. Alternatively, when the difference between the voltage of the input analog circuit signal PD_OUT and the on-state voltage drop of the first unidirectional conducting element D2 is less than a threshold, the charging speed of the first capacitor C3 will be very slow. All of these will affect the detection efficiency of the peak detection circuit 201. Therefore, by configuring the first operational amplifier U5B and the second capacitor C2 for preventing self-oscillation, on the one hand, it can act as a voltage follower, providing isolation and buffering for the preceding and following circuits, so that the operation of the preceding analog signal processing circuit is not affected. On the other hand, even when the voltage of the input analog circuit signal PD_OUT is small, it can capture and amplify the voltage signal so that it can quickly reach the conduction condition of the first unidirectional conducting element D2. Furthermore, a second unidirectional conducting element D1 with the same conduction capability can be configured to further compensate for the conduction voltage drop of the first unidirectional conducting element D2, thereby further improving the charging speed of the first capacitor C3 and improving the working efficiency of the peak detection circuit 201.

[0075] In some embodiments, referring to FIG3, FIG3 shows a schematic diagram of the structure of an integrating circuit in some embodiments. The integrating circuit 202 may include a second operational amplifier U3B, a third capacitor C5, a fourth capacitor C7, a first resistor R6, a second resistor R8, and a third resistor R7; wherein,

[0076] The inverting input terminal U3B- (pin 6) of the second operational amplifier U3B is connected to the first terminal of the third capacitor C5 and the first terminal of the first resistor R6. The second terminal of the first resistor R6 is grounded to GND.

[0077] The non-inverting input terminal U3B+ (pin 5) of the second operational amplifier U3B is connected to the first terminal of the second resistor R8 and the first terminal of the fourth capacitor C7. The second terminal of the fourth capacitor C7 is grounded to GND. The second terminal of the second resistor R8 is connected to the output terminal of the analog signal processing circuit 100 to access the analog circuit signal PD_OUT.

[0078] The output terminal (pin 7) of the second operational amplifier U3B is connected to the second terminal of the third capacitor C5 and the first terminal of the third resistor R7. The second terminal of the third resistor R7 is connected to the analog-to-digital converter (ADC) pin of the microcontroller 300.

[0079] In this embodiment, the integrator circuit 202 can be an in-phase integrator circuit, the specific structure of which can be referred to in Figure 3. The integrator circuit 202 performs hardware-based integration processing on the input analog circuit signal PD_OUT. The integrated value signal INTE_OUT after integration processing is connected to the microprocessor 300 and read through the ADC pin of the microprocessor 300. The integrator circuit 202 can realize integration feedback and realize hardware-based integration calculation. By adjusting the components in the integrator circuit 202, the integration time and rate can be adjusted. Therefore, by configuring the integrator circuit 202, part of the computational pressure of the microprocessor 300 can be relieved to improve its operation speed. The microprocessor 300 does not need to calculate the integration value through software control; it only needs to collect the integration value signal INTE_OUT to obtain the output power-related integration value. Moreover, the hardware-based integration calculation has a faster response, thereby improving the calculation efficiency of optical power-related output parameters.

[0080] In some embodiments, referring to FIG4, FIG4 shows a schematic diagram of the structure of an optical power detection circuit in other embodiments, the optical power detection circuit 10 may further include:

[0081] The trigger signal generation circuit 203 is configured to trigger and detect the analog circuit signal PD_OUT output by the analog signal processing circuit 100, and transmit the analog circuit signal PD_OUT to the microcontroller 300 for pulse width detection after the amplitude of the analog circuit signal PD_OUT is greater than the preset trigger threshold.

[0082] The microcontroller 300 is also configured to calculate the laser's output parameters based on the peak signal PEAK_OUT, the integral signal INTE_OUT, and the pulse width value.

[0083] In this embodiment, hardware triggering using the trigger signal generation circuit 203 is simpler than software control triggering of the microcontroller 300. Since software control triggering of the microcontroller 300 requires the microcontroller 300 to continuously monitor signals, it may cause a waste of the microcontroller 300's computing resources. By configuring the trigger signal generation circuit 203, the resource usage of the microcontroller 300 can be further reduced, and the overall resource utilization and computing efficiency of the microcontroller 300 can be improved.

[0084] In some embodiments, referring to FIG5, FIG5 shows a schematic diagram of the structure of the trigger signal generation circuit 203 in some embodiments.

[0085] The trigger signal generation circuit 203 may include a comparator U9, a fourth resistor R17, a fifth resistor R18, and a level converter U8; wherein,

[0086] The non-inverting input terminal U9+ (pin 3) of comparator U9 is connected to the output terminal of analog signal processing circuit 100;

[0087] The inverting input terminal U9- (pin 4) of comparator U9 is connected to the first terminal of the fourth resistor R17 and the first terminal of the fifth resistor R18. The second terminal of the fourth resistor R17 is connected to the power supply voltage VDD, and the second terminal of the fifth resistor R18 is grounded to GND.

[0088] The output (pin 1) of comparator U9 is connected to the input (pin B) of level converter U8, and the output (pin A) of level converter U8 is connected to the analog-to-digital converter (ADC) pin of microcontroller 300. The other pins of comparator U9 and level converter U8 can be referenced in Figure 5, or other connection configurations can be made according to the actual application scenario.

[0089] In this embodiment, the trigger threshold of the trigger signal generation circuit 203 can be changed by adjusting the resistance values ​​of the fourth resistor element R17 and the fifth resistor element R18. When the input analog circuit signal PD_OUT is greater than the trigger threshold, the comparator U9 outputs a positive voltage signal. After level conversion, U8 converts the voltage signal into a voltage signal that meets the receiving conditions of the microprocessor 300, and then connects it to the analog-to-digital conversion pin (ADC) of the microprocessor 300.

[0090] In some embodiments, continuing to refer to FIG4, the optical power detection circuit 10 may further include: a pulse detection circuit 204, which is connected to the analog signal processing circuit, the trigger signal generation circuit, and the microcontroller, and is configured to amplify the analog circuit signal output by the analog signal processing circuit and connect the amplified analog circuit signal to the trigger signal generation circuit for trigger detection.

[0091] For example, reference can be made to FIG6, which shows a schematic diagram of the structure of the pulse detection circuit 204 in some embodiments.

[0092] In this embodiment, the pulse detection circuit 204 can be implemented using a non-inverting amplifier circuit. The pulse detection circuit 204 may include an operational amplifier U10B and resistors R16, R20, and R21. Referring to the connection shown in Figure 6, a non-inverting amplifier circuit can be constructed. By adjusting the resistance values ​​of resistors R16 and R20, the amplification factor of the pulse detection circuit 204 for the input analog circuit signal PD_OUT can be adjusted, so that the relatively small input analog circuit signal PD_OUT is appropriately amplified to the range that the MCU can receive, thereby outputting the amplified analog circuit signal PD_OUT_S, which is then connected to the trigger signal generation circuit 203. Since the analog circuit signal is appropriately amplified, the trigger signal generation circuit 203 can more accurately and quickly detect the start position of the amplified analog circuit signal PD_OUT_S, thereby improving the accuracy of pulse width acquisition by the trigger microcontroller 300 and thus improving the accuracy of output parameter calculation.

[0093] In some embodiments, an optical power detection system 1 is also provided. Referring to Figures 1-7, Figure 7 shows a schematic diagram of the structure of the optical power detection system in some embodiments. The optical power detection system 1 may include a power supply circuit 20, a bus circuit 30, a photoelectric sensor 40, and an optical power detection circuit 10 according to any one or more of the above embodiments. The power supply circuit 20 is configured to supply power to the optical power detection circuit 10, the photoelectric sensor 40, and the bus circuit 30. The photoelectric sensor 40 is configured to collect the laser pulse signal of the laser and convert the laser pulse signal into a current signal and input it to the analog signal processing circuit 100. The bus circuit 30 is configured to connect the microcontroller 300 and the host computer 2 of the laser.

[0094] The photoelectric sensor 40 can be, but is not limited to, a photodiode (PD), an organic photodiode (OPD), etc.

[0095] More specifically, referring to Figure 7, the power supply circuit 20 may include power supply circuit A, power supply circuit B, and power supply circuit C. Power supply circuit A can be provided with a suitable power supply by the main control board circuit 3, which generates an isolation voltage VCC1 via power module U1, supplying power to the analog signal processing circuit 100, photoelectric sensor 40, trigger signal generation circuit 203, and pulse detection circuit 204 respectively. Power supply circuit B then generates voltage VCC2 from VCC1 via power module U2, supplying power to the microcontroller 300 and bus circuit 30 respectively. Power supply circuit C generates voltage VCC3 from VCC2 via power module U3, supplying power to the peak detection circuit 201 and integration circuit 202 respectively. In other embodiments, the specific power supply distribution of power supply circuit 20 can be planned according to the actual application situation, and is not limited here.

[0096] For example, the microcontroller 300 may include a gain control pin for controlling the analog signal processing circuit 100, a discharge control pin for controlling the peak detection circuit 201, and a discharge control pin for controlling the integrator circuit 202, which respectively provide level signal inputs for their three functions. It may also include a CAN communication pin for data interaction with the bus circuit 30.

[0097] For a detailed description of the optical power detection circuit 10 in the optical power detection system 1, please refer to the description of the optical power detection circuit 10 in the above embodiments, and it will not be repeated here.

[0098] In some embodiments, this application also provides an optical power detection method, which can be implemented based on a microprocessor of the optical power detection circuit involved in this application. Referring to FIG8, FIG8 shows a flowchart of the optical power detection method in some embodiments. Specifically, it may include:

[0099] Step S802: In response to the detection of the laser pulse signal from the laser, the optical power detection circuit is enabled to acquire the analog circuit signal output by the analog signal processing circuit.

[0100] Specifically, the trigger signal generation circuit 203 can feed back to the microcontroller 300 after detecting laser light emission for external hardware triggering, causing the optical power detection circuit 10 to start signal sampling. For example, an indicator light can be lit to indicate that the optical power detection circuit 10 is in working condition.

[0101] After the optical power detection circuit 10 is triggered and started: the peak detection circuit 204 detects the analog circuit signal PD_OUT output by the analog signal processing circuit 100 and outputs the peak signal PEAK_OUT. Then, the peak signal PEAK_OUT is input to the microcontroller 300 for processing.

[0102] The integrator circuit 202 detects the analog circuit signal PD_OUT output by the analog signal processing circuit 100 and outputs the integral value signal PEAK_OUT. Then, the integral value signal INTE_OUT is input to the microcontroller 300 for processing.

[0103] Furthermore, when the optical power detection circuit 10 includes a trigger signal generation circuit 203 and a pulse detection circuit 204, the pulse detection circuit 204 amplifies the analog circuit signal PD_OUT output by the analog signal processing circuit 100 according to preset requirements and outputs an amplified analog circuit signal PD_OUT_S. The trigger signal generation circuit 203 detects the amplified analog circuit signal PD_OUT_S and triggers it when the amplitude of the amplified analog circuit signal PD_OUT_S is detected to be greater than a preset threshold, so that the microcontroller 300 starts to detect the amplified analog circuit signal PD_OUT_S and detects the pulse width value.

[0104] Step S804: Obtain the peak signal and integral signal output by the optical power detection circuit, and calculate the output parameters of the laser based on the peak signal and integral signal.

[0105] Specifically, after receiving the peak signal PEAK_OUT output by the peak detection circuit 204 and the integral signal INTE_OUT output by the integrator circuit 202, the microcontroller 300 can further combine the pulse width value obtained by acquiring the analog circuit signal PD_OUT or the amplified analog circuit signal PD_OUT_S through the ADC pin to perform data analysis and processing, and use the least squares method to calculate the output parameters such as the output power and frequency of the laser pulse signal. Then, the microcontroller 300 can upload the acquired peak signal PEAK_OUT, the integral signal INTE_OUT, and the calculated output parameters such as output power and frequency to the host computer 2 through the bus circuit 30.

[0106] Step S806: Send the peak signal, integral signal, and calculated output parameters to the host computer so that the host computer can compare the peak signal, integral signal, and calculated output parameters with the corresponding preset standard parameters and adjust the laser's next output parameters according to the comparison results.

[0107] Specifically, after the microcontroller 300 uploads the acquired peak signal PEAK_OUT, integral signal INTE_OUT, and calculated output parameters such as output power and frequency to the host computer 2, the host computer 2 compares the peak signal PEAK_OUT, integral signal INTE_OUT, and calculated output parameters with their respective preset standard parameters. If the comparison result shows that the acquired and calculated parameters are inconsistent with the preset standard parameters, the host computer 2 can adjust the laser's next output parameters based on the calculated output parameters. If the comparison result shows that the acquired and calculated parameters are consistent with the preset standard parameters, the host computer 2 does not need to adjust the laser's next output parameters and can control the next output based on the current output parameters.

[0108] Furthermore, after the laser stops emitting light, the indicator light goes out, and the process of optical power detection is restarted after the laser emits light again. The main control board circuit 3 controls the laser's light emission based on the new data (the output parameters for the next light emission) sent by the host computer 2. The optical power detection circuit 10 starts working after detecting the light source, and the process repeats to form a closed loop.

[0109] In the aforementioned optical power detection method, after the optical power detection circuit is triggered, the microcontroller can directly obtain the peak signal and integral signal obtained after processing by the optical power detection circuit. Based on the peak signal and integral signal, the microcontroller can calculate the output parameters of the laser, such as output power and frequency, more quickly and timely. Moreover, through the interaction between the microcontroller and the host computer, the host computer can compare the currently dynamically calculated output parameters with preset standard parameters, thereby adjusting the output parameters of the laser for the next emission more timely, efficiently, and accurately based on the comparison results, thus achieving efficient and accurate optical power feedback.

[0110] It should be understood that although the steps in the flowchart of Figure 8 are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some of the steps in Figure 8 may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0111] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0112] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. An optical power detection circuit, wherein the optical power detection circuit is applied to a laser, the optical power detection circuit comprising: An analog signal processing circuit is configured to convert laser pulse signals emitted by the laser into analog circuit signals; A peak detection circuit is configured to detect the peak signal of the analog circuit signal output by the analog signal processing circuit and output the peak signal of the analog circuit signal. An integrating circuit is configured to integrate the analog circuit signal output by the analog signal processing circuit and output the integrated value signal of the analog circuit signal. A microcontroller is configured to receive the peak signal and the integral signal, and to calculate the output parameters of the laser based on the peak signal and the integral signal.

2. The circuit according to claim 1, characterized in that, The peak detection circuit includes a front-end comparison follower circuit, a first unidirectional conducting element, a field-effect transistor element, and a first capacitor element, wherein... The first input terminal of the front-end comparator follower circuit is configured to receive the analog circuit signal, and the output terminal of the front-end comparator follower circuit is connected to the positive terminal of the first unidirectional conducting element. The negative terminal of the first unidirectional conducting element is connected to the second terminal of the field-effect transistor element; The first terminal of the field-effect transistor element is used to output the peak value signal, and the third terminal of the field-effect transistor element is connected to the first terminal of the first capacitor element. The second terminal of the first capacitor element is grounded.

3. The circuit according to claim 2, characterized in that, The peak detection circuit also includes a negative feedback circuit, wherein... The non-inverting input terminal of the negative feedback circuit is connected to the first terminal of the field-effect transistor element; The output terminal of the negative feedback circuit is connected to the inverting input terminal of the negative feedback circuit, the negative terminal of the first unidirectional conducting element, the second terminal of the field-effect transistor element, and the second input terminal of the front-end comparator follower circuit.

4. The circuit according to claim 3, characterized in that, The front-end comparator follower circuit includes a first operational amplifier, a second unidirectional conducting element, and a second capacitor element; wherein... The non-inverting input of the first operational amplifier is configured to receive the analog circuit signal; The inverting input terminal of the first operational amplifier is connected to the negative terminal of the second unidirectional conducting element, the first terminal of the second capacitor element, and the output terminal of the negative feedback circuit. The output terminal of the first operational amplifier is connected to the positive terminal of the second unidirectional conducting element, the second terminal of the second capacitor element, and the positive terminal of the first unidirectional conducting element.

5. The circuit according to claim 1, characterized in that, The integrating circuit includes a second operational amplifier, a third capacitor element, a fourth capacitor element, a first resistor element, a second resistor element, and a third resistor element; wherein, The inverting input terminal of the second operational amplifier is connected to the first terminal of the third capacitor element and the first terminal of the first resistor element, and the second terminal of the first resistor element is grounded; The non-inverting input of the second operational amplifier is connected to the first terminal of the second resistor element, the first terminal of the fourth capacitor element, the second terminal of the fourth capacitor element is grounded, and the second terminal of the second resistor element is connected to the output terminal of the analog signal processing circuit. The output of the second operational amplifier is connected to the second terminal of the third capacitor element and the first terminal of the third resistor element, and the second terminal of the third resistor element is connected to the analog-to-digital conversion pin of the microcontroller.

6. The circuit according to claim 1, characterized in that, The optical power detection circuit also includes: A trigger signal generation circuit is configured to trigger and detect the analog circuit signal output by the analog signal processing circuit, and transmit the analog circuit signal to the microcontroller for pulse width detection after the amplitude of the analog circuit signal is greater than a preset trigger threshold. The microcontroller is also configured to calculate the output parameters of the laser based on the peak signal, the integral signal, and the pulse width value.

7. The circuit according to claim 6, characterized in that, The optical power detection circuit also includes: A pulse detection circuit, connected to the analog signal processing circuit, the trigger signal generation circuit, and the microcontroller, is configured to amplify the analog circuit signal output by the analog signal processing circuit and input the amplified analog circuit signal into the trigger signal generation circuit for trigger detection.

8. The circuit according to claim 6, characterized in that, The trigger signal generation circuit includes a comparator, a fourth resistive element, a fifth resistive element, and a level shifter; wherein, The non-inverting input of the comparator is connected to the output of the analog signal processing circuit. The inverting input terminal of the comparator is connected to the first terminal of the fourth resistor element and the first terminal of the fifth resistor element, the second terminal of the fourth resistor element is connected to the power supply voltage, and the second terminal of the fifth resistor element is grounded. The output of the comparator is connected to the input of the level converter, and the output of the level converter is connected to the analog-to-digital converter pin of the microcontroller.

9. The circuit according to claim 7, characterized in that, The pulse detection circuit is implemented using a non-inverting proportional amplifier circuit.

10. An optical power detection system, the system comprising a power supply circuit, a bus circuit, a photoelectric sensor, and an optical power detection circuit according to any one of claims 1 to 9; wherein, The power supply circuit is configured to supply power to the optical power detection circuit, the photoelectric sensor, and the bus circuit. The photoelectric sensor is configured to acquire the laser pulse signal of the laser and convert the laser pulse signal into a current signal, which is then input to the analog signal processing circuit. The bus circuit is configured as a host computer connecting the microcontroller and the laser.

11. A method for detecting optical power, said method being applied to a microcontroller of an optical power detection circuit according to any one of claims 1 to 9, said method comprising: In response to the detection of a laser pulse signal from the laser, the optical power detection circuit is enabled to acquire the analog circuit signal output by the analog signal processing circuit; The peak signal and integral signal output by the optical power detection circuit are obtained, and the output parameters of the laser are calculated based on the peak signal and the integral signal. as well as The peak signal, the integral signal, and the calculated output parameters are sent to the host computer, so that the host computer compares the peak signal, the integral signal, and the calculated output parameters with the corresponding preset standard parameters, and adjusts the output parameters of the laser for the next light emission based on the comparison result.

12. A laser, the laser comprising a host computer, a main control board circuit, and an optical power detection system according to claim 10.

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