Control device for measurement apparatus, measurement apparatus, and control method for measurement apparatus
The control device for measuring devices simplifies the setting of measurement conditions by automatically determining them from scanned manufacturing management information, addressing user confusion and error-prone manual selection in existing technologies.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- TOKYO SEIMITSU CO LTD
- Filing Date
- 2025-10-17
- Publication Date
- 2026-05-07
Smart Images

Figure JP2025036635_07052026_PF_FP_ABST
Abstract
Description
Control device for a measuring device, measuring device, and control method for a measuring device
[0001] The present invention relates to a control device for a measuring device that measures a workpiece, the measuring device, and a control method for the measuring device.
[0002] In the manufacturing process of an object, measurements (inspections) of properties such as the surface shape, contour, and roundness of the object are performed. When measuring the properties of an object (hereinafter referred to as a workpiece), it is necessary to set the measurement conditions when measuring the workpiece in a measuring device. Note that the measurement conditions here also include the measurement procedure, analysis conditions for measurement results, output format, and the like.
[0003] For example, the measuring device described in Patent Document 1 creates a playback file indicating the measurement conditions to be set in the measuring device and a two-dimensional code for playback for reading the playback file based on scan data obtained by reading, with a code scanner, a two-dimensional code selected by the user from a plurality of types of two-dimensional codes encoding various measurement conditions of the workpiece. Then, when the user scans the two-dimensional code for playback with the code scanner, the measuring device described in Patent Document 1 reads the playback file to set the measurement conditions and measures the workpiece according to these measurement conditions.
[0004] Japanese Patent Application Laid-Open No. 2021-173694
[0005] By the way, when setting the measurement conditions of a workpiece in a measuring device by the method described in Patent Document 1, it is necessary to select a two-dimensional code for playback corresponding to the workpiece to be measured and scan it with a code scanner. For this reason, when a plurality of types of two-dimensional codes for playback corresponding to a plurality of types of workpieces are prepared, it becomes difficult for the user to determine which one to select from the plurality of types of two-dimensional codes for playback. Also, when a production management code indicating the type or the like of the workpiece is attached to the workpiece, there is a risk that the user may mistake the production management code for the two-dimensional code for playback.
[0006] This invention has been made in view of these circumstances, and aims to provide a control device for a measuring device, a measuring device, and a control method for a measuring device that make it easier to set the measurement conditions when measuring a workpiece with a measuring device.
[0007] A control device for a measuring device that achieves the objectives of the present invention comprises: a control device for a measuring device that measures a workpiece, a scan data acquisition unit that acquires scan data of a code output from a code scanner that scans a code encoding manufacturing management information of a workpiece; a measurement condition information acquisition unit that acquires measurement condition information which stores a plurality of combinations of scan data and measurement conditions when measuring a workpiece with a measuring device; and a measurement condition determination unit that determines the measurement conditions of a workpiece based on the scan data acquired by the scan data acquisition unit and by referring to the measurement condition information acquired by the measurement condition information acquisition unit.
[0008] According to this control device, the measurement conditions for a workpiece can be determined simply by scanning the code with a code scanner.
[0009] In another embodiment of the present invention, a control device for a measuring device includes a measurement control unit that causes the measuring device to perform measurement of a workpiece under the measurement conditions determined by a measurement condition determination unit.
[0010] A control device for a measuring device that achieves the object of the present invention is a control device for a measuring device that measures a workpiece, comprising: a scan data acquisition unit that acquires scan data of a code output from a code scanner that scans a code encoding manufacturing management information of a workpiece; a decoding unit that decodes the manufacturing management information from the scan data acquired by the scan data acquisition unit; a measurement condition information acquisition unit that acquires measurement condition information which stores a plurality of combinations of manufacturing management information and measurement conditions when measuring a workpiece with a measuring device; and a measurement condition determination unit that determines the measurement conditions of a workpiece by referring to the measurement condition information acquired by the measurement condition information acquisition unit based on the manufacturing management information decoded by the decoding unit.
[0011] According to this control device, the measurement conditions for a workpiece can be determined simply by scanning the code with a code scanner.
[0012] In another embodiment of the present invention, the control device for a measuring device includes a measurement control unit that causes the measuring device to perform measurement of a workpiece under measurement conditions determined by a measurement condition determination unit, and a measurement data processing unit that adds the manufacturing management information decoded by a decoding unit to the measurement data of the workpiece measured by the measuring device. This clarifies the correspondence between the measurement data and the workpiece.
[0013] In a control device for a measuring device according to another aspect of the present invention, the manufacturing management information includes at least one of the workpiece type and specific information that can identify the workpiece or the workpiece lot.
[0014] In another embodiment of the present invention, the control device for a measuring device is a surface roughness measuring machine.
[0015] A measuring device for achieving the objectives of the present invention comprises a code scanner that scans a code encoding manufacturing management information of a workpiece, and the control device described above.
[0016] A control method for a measuring device to achieve the object of the present invention is a control method for a measuring device that measures a workpiece, comprising: a scan data acquisition step of acquiring scan data of a code output from a code scanner that scans a code encoding manufacturing management information of a workpiece; a measurement condition information acquisition step of acquiring measurement condition information which stores a plurality of combinations of scan data and measurement conditions when measuring a workpiece with a measuring device; and a measurement condition determination step of determining the measurement conditions of a workpiece based on the scan data acquired in the scan data acquisition step and referring to the measurement condition information acquired in the measurement condition information acquisition step.
[0017] A control method for a measuring device to achieve the object of the present invention is a control method for a measuring device that measures a workpiece, comprising: a scan data acquisition step of acquiring scan data of a code output from a code scanner that scans a code encoding manufacturing management information of a workpiece; a decoding step of decoding the manufacturing management information from the scan data acquired in the scan data acquisition step; a measurement condition information acquisition step of acquiring measurement condition information which stores a plurality of combinations of manufacturing management information and measurement conditions when measuring a workpiece with a measuring device; and a measurement condition determination step of determining the measurement conditions of a workpiece based on the manufacturing management information decoded in the decoding step and referring to the measurement condition information acquired in the measurement condition information acquisition step.
[0018] This invention makes it easier to set measurement conditions when measuring a workpiece with a measuring device.
[0019] This is a schematic diagram of the measuring device of the first embodiment. This is a block diagram of the data processing unit of the first embodiment. This is a diagram showing an example of measurement condition information of the first embodiment. This is a flowchart showing the flow of the workpiece surface roughness measurement process using the measuring device of the first embodiment. This is a block diagram of the data processing unit of the measuring device of the second embodiment. This is a diagram showing the first to third examples of measurement condition information of the second embodiment. This is a flowchart showing the flow of the workpiece surface roughness measurement process using the measuring device of the second embodiment.
[0020] [First Embodiment] Figure 1 is a schematic diagram of the measuring device 10 of the first embodiment. In the mutually orthogonal XYZ directions in the figure, the XY direction is parallel to the horizontal direction, and the Z direction is parallel to the vertical direction.
[0021] The measuring device 10 is a surface roughness measuring machine for measuring the surface roughness of a workpiece W. This measuring device 10 comprises a measuring machine body 100, a code scanner 150, and a data processing unit 200. An external device 500 is also connected to the data processing unit 200.
[0022] The measuring machine body 100 has basically the same configuration as a known surface roughness measuring machine and includes a table 102, a column 104, a measuring unit 106, and a drive unit 108 (see Figure 2).
[0023] The workpiece W to be measured is placed on the top surface of the table 102. As will be described in more detail later, the workpiece W is pre-attached with a manufacturing control code 160, which is a code (barcode) that encodes the manufacturing control information of the workpiece W.
[0024] Column 104 is erected on the upper surface of table 102 and extends upward in the Z direction from this upper surface.
[0025] The measuring unit 106 is held by a column 104 so as to be displaceable in the Z direction. The measuring unit 106 includes a stylus 120 that contacts the surface of the workpiece W, a displacement detector 122 that holds the stylus 120 so as to be swingable and detects the displacement of the stylus 120 in the Z direction, and a detector holder 124 that holds the displacement detector 122 so as to be displaceable in the X direction. The detailed configuration and function of each part of the measuring unit 106 are known technology, so a specific explanation is omitted here.
[0026] The drive unit 108 (see Figure 2) includes an actuator for moving the measuring unit 106 along the column 104 in the Z direction, and an actuator for moving the displacement detector 122, which is held in the detector holder 124, in the X direction.
[0027] When measuring the surface roughness of the workpiece W, the drive unit 108 is driven to adjust the Z-direction position of the measuring unit 106, thereby bringing the stylus 120 of the measuring unit 106 into contact with the surface of the workpiece W. The drive unit 108 is then driven to move the displacement detector 122 and the stylus 120, which are held in the detector holder 124, in the X-direction. As a result, the displacement detector 122 detects the amount of displacement of the stylus 120 in the Z-direction for each position of the stylus 120 in the X-direction (hereinafter referred to as surface roughness data).
[0028] The code scanner 150 is a code reading device that scans various codes, such as known one-dimensional codes and two-dimensional codes, and is connected to the data processing unit 200 via wired or wireless means for communication. The code scanner 150 includes, for example, a light source (e.g., an LED (Light Emitting Diode)) that projects red light toward the code from a reading window, and an image sensor (e.g., a CCD (Charge Coupled Device) or CMOS (Complementary Metal Oxide Semiconductor)).
[0029] The code scanner 150 scans the manufacturing control code 160 pre-assigned to the workpiece W placed on the upper surface of the table 102 before measurement begins, and outputs the scanned data of the manufacturing control code 160 to the data processing unit 200. The manufacturing control code 160 is a code that encodes manufacturing control information (production control information) that includes, for example, the model number (model name), the manufacturing number (serial number) of the workpiece W, and the lot number of the workpiece W. This manufacturing control code 160 is pre-assigned to the workpiece W by the manufacturer of the workpiece W (which in this embodiment is the user of the measuring device 10). The manufacturing number and lot number of the workpiece W correspond to the identifying information of the present invention that can identify the workpiece W and its lot.
[0030] Figure 2 is a block diagram of the data processing unit 200 of the first embodiment. As shown in Figure 2 and Figure 1 described above, the data processing unit 200 controls the measurement unit 106 to measure the surface roughness of the workpiece W and generate surface roughness measurement data. This data processing unit 200 is connected to the measurement unit 106 (displacement detector 122), the drive unit 108, the code scanner 150, and the external device 500 via a communication interface, AD / DA converter, and cables (not shown).
[0031] The data processing unit 200 includes an operation unit 202, a display 204, a printer 206, a storage unit 210, and a control device 220.
[0032] The operation unit 202 is, for example, an operation button that receives operation input from an operator and outputs the operation input signal to the control device 220. Alternatively, a touch panel display 204 may be used as the operation unit 202.
[0033] The display 204 displays, for example, a GUI (Graphical User Interface) for operating the measurement unit 106 and the data processing unit 200, and measurement data of the surface roughness of the workpiece W.
[0034] The printer 206 prints surface roughness data and surface roughness measurement data of the workpiece W onto printing paper under the control of the control device 220.
[0035] In addition to the control program of the control device 220 (not shown), the memory unit 210 stores measurement condition information 212, which is used to determine the measurement conditions 170 (see Figure 3) when the measuring device 10 measures the workpiece W, as will be described in more detail later.
[0036] The control device 220 includes an arithmetic circuit composed of various processors and memory. These various processors include CPUs (Central Processing Units), GPUs (Graphics Processing Units), ASICs (Application Specific Integrated Circuits), and programmable logic devices [e.g., SPLDs (Simple Programmable Logic Devices), CPLDs (Complex Programmable Logic Devices), and FPGAs (Field Programmable Gate Arrays)]. The various functions of the control device 220 may be implemented by a single processor, or by multiple processors of the same or different types.
[0037] The control device 220 functions as a scan data acquisition unit 222, a measurement condition information acquisition unit 224, a measurement condition determination unit 226, a measurement control unit 228, and a measurement data analysis unit 230 by executing a control program (not shown) stored in the storage unit 210.
[0038] The scan data acquisition unit 222 operates before the start of measurement of the workpiece W, acquires scan data of the manufacturing control code 160 from the code scanner 150, and outputs this scan data to the measurement condition determination unit 226.
[0039] The measurement condition information acquisition unit 224 operates before the start of measurement of the workpiece W, acquires the measurement condition information 212 stored in the storage unit 210, and outputs this measurement condition information 212 to the measurement condition determination unit 226.
[0040] Figure 3 shows an example of measurement condition information 212 in the first embodiment. As shown in Figure 3, the measurement condition information 212 stores multiple combinations of scan data (pre-decoded data) of multiple types of manufacturing control codes 160 that are pre-assigned to each type of workpiece W, and measurement conditions 170 when measuring the workpiece W with the manufacturing control code 160 attached using the measuring device 10.
[0041] The measurement conditions 170 include, for example, "measurement speed," "measurement length," "calculation standard," and "parameters." "Measurement speed" is the movement speed in the X direction of the stylus 120 and displacement detector 122 when measuring the surface roughness of the workpiece W. "Measurement length" is the amount of movement in the X direction of the stylus 120 and displacement detector 122 when measuring the surface roughness of the workpiece W.
[0042] The "calculation standard" is a standard related to roughness (roughness standard). This roughness standard conforms to standards such as the Japanese Industrial Standards (JIS), the International Organization for Standardization (ISO), or the American Society of Mechanical Engineers (ASME).
[0043] "Parameters" are evaluation parameters for surface roughness measurement, and are defined, for example, in JIS B 0601: 2013 (ISO 4287: 1997, Amd.1: 2009) (see Patent Document 1 above).
[0044] Note that the measurement conditions 170 are not limited to "measurement speed", "measurement length", "calculation standard", and "parameters", and may include various known conditions used for surface roughness measurement based on roughness standards (for example, cut-off values, etc.) and analysis of the measurement data thereof.
[0045] Such measurement condition information 212 is created in advance and stored in the storage unit 210. Note that instead of storing the measurement condition information 212 in the storage unit 210, it may be stored in an external device 500. In this case, the measurement condition information acquisition unit 224 acquires the measurement condition information 212 from the external device 500 and outputs this measurement condition information 212 to the measurement condition determination unit 226. Further, the measurement condition information acquisition unit 224 may be provided with a function of generating and updating the measurement condition information 212.
[0046] The measurement condition determination unit 226 operates before the measurement of the workpiece W starts. The measurement condition determination unit 226 refers to the measurement condition information 212 input from the measurement condition information acquisition unit 224 based on the scan data of the pre-decoded production management code 160 input from the scan data acquisition unit 222, and determines the measurement conditions 170 corresponding to the workpiece W to be measured.
[0047] Returning to FIG. 2, the measurement control unit 228 operates when a measurement start operation is input to the operation unit 202, drives the drive unit 108 according to the measurement conditions 170 determined by the measurement condition determination unit 226, and executes the surface roughness measurement of the workpiece W by the measurement unit 106.
[0048] The measurement data analysis unit 230 calculates the measurement data of the surface roughness of the workpiece W based on the surface roughness data output from the displacement detector 122 in the surface roughness measurement of the workpiece W by the measurement unit 106 and the measurement conditions 170 determined by the measurement condition determination unit 226. Then, the measurement data analysis unit 230 outputs the measurement data of the surface roughness of the workpiece W to the display 204, the printer 206, and the external device 500.
[0049] The external device 500 is, for example, a personal computer or a workstation. The external device 500 has the function of generating and updating measurement condition information 212, storing the measurement condition information 212 in the storage unit 210, or updating the measurement condition information 212 in the storage unit 210. The external device 500 also stores the measurement data of the surface roughness of the workpiece W input from the measurement data analysis unit 230.
[0050] [Operation of the measuring device of the first embodiment] Figure 4 is a flowchart showing the flow of the measurement process for the surface roughness of the workpiece W by the measuring device 10 of the first embodiment according to the control method of the present invention. The measurement condition information 212 is assumed to be stored in the storage unit 210 in advance.
[0051] As shown in Figure 4, the operator places the workpiece W to be measured on the upper surface of the table 102 and then scans the manufacturing control code 160 attached to the workpiece W using the code scanner 150. As a result, scan data of the manufacturing control code 160 is output from the code scanner 150, and this scan data is acquired by the scan data acquisition unit 222 (step S1, corresponding to the scan data acquisition step of the present invention). The scan data acquisition unit 222 then outputs the scan data of the manufacturing control code 160 to the measurement condition determination unit 226.
[0052] Furthermore, the measurement condition information acquisition unit 224 acquires the measurement condition information 212 stored in the storage unit 210 when scan data of the manufacturing management code 160 is input from the code scanner 150 or when the power of the measuring device 10 is turned ON (step S2, corresponding to the measurement condition information acquisition step of the present invention). Step S2 may be performed simultaneously with step S1 or before step S1. The measurement condition information acquisition unit 224 then outputs the measurement condition information 212 to the measurement condition determination unit 226.
[0053] Next, the measurement condition determination unit 226 determines the measurement conditions 170 corresponding to the workpiece W to be measured by referring to the measurement condition information 212 based on the scan data of the manufacturing control code 160 before decryption, and outputs these measurement conditions 170 to the measurement control unit 228 (step S3, corresponding to the measurement condition determination step of the present invention). This makes it possible to set the measurement conditions 170 for the workpiece W using the scan data of the manufacturing control code 160 before decryption as is.
[0054] Then, after the operator operates the control unit 202 to bring the stylus 120 into contact with the measurement surface of the workpiece W to be measured (automatic operation is also possible), when the operator inputs a measurement start operation to the control unit 202, the measurement control unit 228 drives the drive unit 108 according to the measurement conditions 170 determined by the measurement condition determination unit 226, and the measurement unit 106 performs surface roughness measurement of the workpiece W (step S4). As a result, surface roughness data is output from the displacement detector 122 to the measurement data analysis unit 230 in accordance with the movement of the stylus 120 and the displacement detector 122 in the X direction.
[0055] Once the measurement unit 106 has completed measuring the surface roughness of the workpiece W, the measurement data analysis unit 230 calculates the measurement data for the surface roughness of the workpiece W based on the surface roughness data input from the displacement detector 122 and the measurement conditions 170 determined by the measurement condition determination unit 226 (step S5). The measurement data analysis unit 230 then outputs the measurement data for the surface roughness of the workpiece W to the display 204, printer 206, and external device 500. This enables the display of the measurement data on the display 204, printing of the measurement data by the printer 206, and storage of the measurement data by the external device 500.
[0056] As described above, in the measuring device 10 of the first embodiment, the measurement conditions 170 for the workpiece W can be set using the scan data of the manufacturing control code 160 before decoding, eliminating the need to separately generate a playback 2D code dedicated to setting the measurement conditions 170, as in the conventional method. Therefore, the operator only needs to scan the manufacturing control code 160 with the code scanner 150 before measuring the workpiece W, and the measurement conditions 170 for the workpiece W can be easily set. Furthermore, it is possible to prevent errors in setting the measurement conditions 170 for the workpiece W.
[0057] Furthermore, if the manufacturing control code 160 (manufacturing control information) includes the manufacturing number or lot number of workpiece W, even if the model of workpiece W is the same but the measurement conditions 170 differ depending on the delivery destination of workpiece W, the measurement conditions 170 for workpiece W corresponding to the delivery destination can be easily and accurately set.
[0058] [Second Embodiment] Figure 5 is a block diagram of the data processing unit 200 of the measuring device 10 of the second embodiment. In the measuring device 10 of the first embodiment, the measurement conditions 170 of the workpiece W are set using the scan data of the manufacturing control code 160 before decoding. In contrast, in the measuring device 10 of the second embodiment, the measurement conditions 170 of the workpiece W are set using at least a part of the manufacturing control information obtained by decoding the scan data of the manufacturing control code 160.
[0059] As shown in Figure 5, the measuring device 10 of the second embodiment has basically the same configuration as the measuring device 10 of the first embodiment, except that the control device 220 functions as a code decoding unit 225 (corresponding to the decoding unit of the present invention) and the storage unit 210 stores different measurement condition information 212A than that of the first embodiment.
[0060] The code decoding unit 225 decodes the manufacturing management information from the scan data of the manufacturing management code 160 acquired by the scan data acquisition unit 222, and outputs this manufacturing management information to the measurement condition determination unit 226.
[0061] In the second embodiment, the measurement condition information acquisition unit 224 operates before the start of measurement of the workpiece W, acquires the measurement condition information 212A stored in the storage unit 210, and outputs this measurement condition information 212A to the measurement condition determination unit 226.
[0062] Figure 6 shows the first to third examples of the measurement condition information 212A of the second embodiment. As shown by reference numeral 6A in Figure 6, the measurement condition information 212A of the first example stores multiple combinations of model information 161 indicating the model of the workpiece W in the manufacturing management information of the workpiece W, and measurement conditions 170 for the workpiece W corresponding to the model of the workpiece W.
[0063] As shown by reference numeral 6B in Figure 6, the measurement condition information 212A in the second example stores multiple combinations of manufacturing number information 162, which indicates the manufacturing number of workpiece W within the manufacturing management information of workpiece W, and measurement conditions 170 for workpiece W that correspond to the manufacturing number of workpiece W.
[0064] As shown by reference numeral 6C in Figure 6, the measurement condition information 212A in the third example stores multiple combinations of workpiece W model information 161 and serial number information 162, and measurement conditions 170 for workpiece W that correspond to both the workpiece W model and serial number.
[0065] Although not shown in the diagram, the measurement condition information 212A may store multiple combinations of lot number information indicating the lot number of the workpiece W and the measurement conditions 170 for the workpiece W corresponding to the lot number of the workpiece W. Alternatively, the measurement condition information 212A may store multiple combinations of two or more pieces of information from the manufacturing management information of the workpiece W (model, serial number, lot number, etc.) and the measurement conditions 170 for the workpiece W corresponding to these two or more pieces of information.
[0066] Returning to Figure 5, the measurement condition determination unit 226 of the second embodiment determines the measurement conditions 170 corresponding to the workpiece W to be measured by referring to the measurement condition information 212A input from the measurement condition information acquisition unit 224, based on at least a portion of the manufacturing management information of the workpiece W input from the code decoding unit 225.
[0067] For example, if the measurement condition information 212A is the first example shown by reference numeral 6A in Figure 6, the measurement condition determination unit 226 detects the model information 161 from the manufacturing management information of the workpiece W and determines the measurement conditions 170 for the workpiece W by referring to the measurement condition information 212A based on this model information 161.
[0068] Furthermore, if the measurement condition information 212A is the second example shown by reference numeral 6B in Figure 6, the measurement condition determination unit 226 detects the manufacturing number information 162 from the manufacturing management information of the workpiece W and determines the measurement conditions 170 of the workpiece W by referring to the measurement condition information 212A based on this manufacturing number information 162. Moreover, if the measurement condition information 212A is the third example shown by reference numeral 6C in Figure 6, the measurement condition determination unit 226 detects the model information 161 and the manufacturing number information 162 from the manufacturing management information of the workpiece W and determines the measurement conditions 170 of the workpiece W by referring to the measurement condition information 212A based on this model information 161 and the manufacturing number information 162.
[0069] By determining the measurement conditions 170 for workpiece W based on the manufacturing number information 162 (lot number information is also acceptable) in this way, even if the workpiece W has the same model but the measurement conditions 170 differ depending on the delivery destination, the measurement conditions 170 for workpiece W corresponding to the delivery destination can be easily and accurately set.
[0070] In the second embodiment, the measurement data analysis unit 230 calculates measurement data for the surface roughness of the workpiece W, similar to the first embodiment, but adds manufacturing management information for the workpiece W (at least one of the following: model, manufacturing number, and lot number) to the measurement data. In this case, the measurement data analysis unit 230 of the second embodiment functions as the measurement data processing unit of the present invention.
[0071] Figure 7 is a flowchart showing the flow of the measurement process for the surface roughness of the workpiece W using the measuring device 10 of the second embodiment. As shown in Figure 7, in the second embodiment, after step S1 in which the scan data acquisition unit 222 acquires scan data of the manufacturing management code 160, the code decoding unit 225 decodes the manufacturing management information of the workpiece W from the scan data and outputs this manufacturing management information to the measurement condition determination unit 226 (step S1A, corresponding to the decoding step of the present invention).
[0072] Then, after the processing in step S1A and the processing in step S2, in which the measurement condition information acquisition unit 224 acquires the measurement condition information 212A from the storage unit 210 and outputs it to the measurement condition determination unit 226, the measurement condition determination unit 226 determines the measurement conditions 170 for the workpiece W by referring to the measurement condition information 212 based on the manufacturing management information of the workpiece W (step S3). As a result, similar to the first embodiment, the surface roughness measurement of the workpiece W by the measurement unit 106 (step S4) and the calculation of the measurement data of the surface roughness of the workpiece W by the measurement data analysis unit 230 (step S5) are performed.
[0073] Next, the measurement data analysis unit 230 adds at least a portion of the manufacturing management information of the workpiece W, decoded by the code decoding unit 225, to the measurement data, and then outputs this measurement data to the display 204, printer 206, and external device 500 (step S6). By adding the manufacturing management information of the workpiece W to the measurement data, the correspondence between the measurement data and the workpiece W can be easily understood.
[0074] As described above, in the measuring device 10 of the second embodiment, the measurement conditions 170 of the workpiece W can be set using product management information decoded from the scan data of the manufacturing management code 160, thus achieving the same effects as in the first embodiment.
[0075] [Other] In the above embodiments, one-dimensional or two-dimensional barcodes were used as examples to describe the manufacturing control code 160, but various codes that encode product management information of the workpiece W and are attached to the workpiece W can be used for the measuring device 10.
[0076] In the embodiments described above, the example given was that the manufacturing control code 160 is attached to the workpiece W. However, the manufacturing control code 160 may also be attached to a check sheet used in the manufacturing process of the workpiece W or to a tag attached to the workpiece W.
[0077] In each of the above embodiments, a surface roughness measuring machine was used as an example of the measuring device 10, but the present invention can be applied to various measuring devices used to measure the properties of a workpiece W.
[0078] 10... Measuring device, 100... Measuring machine body, 102... Table, 104... Column, 106... Measuring unit, 108... Drive unit, 120... Stylus, 122... Displacement detector, 124... Detector holder, 150... Code scanner, 160... Manufacturing control code, 161... Model information, 162... Serial number information, 170... Measurement conditions, 200... Data processing unit, 202... Operation unit, 204... Display, 206... Printer, 210... Storage unit, 212... Measurement condition information, 212A... Measurement condition information, 220... Control device, 222... Scan data acquisition unit, 224... Measurement condition information acquisition unit, 225... Code decoding unit, 226... Measurement condition determination unit, 228... Measurement control unit, 230... Measurement data analysis unit, 500... External device, W... Workpiece
Claims
1. A control device for a measuring device that measures a workpiece, comprising: a scan data acquisition unit that acquires scan data of a code output from a code scanner that scans a code encoding manufacturing management information of the workpiece; a measurement condition information acquisition unit that acquires measurement condition information which stores a plurality of combinations of the scan data and measurement conditions when measuring the workpiece with the measuring device; and a measurement condition determination unit that determines the measurement conditions of the workpiece based on the scan data acquired by the scan data acquisition unit and by referring to the measurement condition information acquired by the measurement condition information acquisition unit.
2. The control device for a measuring device according to claim 1, further comprising a measurement control unit that causes the measuring device to perform measurement of the workpiece under the measurement conditions determined by the measurement condition determination unit.
3. A control device for a measuring device that measures a workpiece, comprising: a scan data acquisition unit that acquires scan data of a code output from a code scanner that scans a code encoding manufacturing management information of the workpiece; a decoding unit that decodes the manufacturing management information from the scan data acquired by the scan data acquisition unit; a measurement condition information acquisition unit that acquires measurement condition information which stores a plurality of combinations of the manufacturing management information and measurement conditions when measuring the workpiece with the measuring device; and a measurement condition determination unit that determines the measurement conditions of the workpiece by referring to the measurement condition information acquired by the measurement condition information acquisition unit based on the manufacturing management information decoded by the decoding unit.
4. A control device for a measuring device according to claim 3, comprising: a measurement control unit that causes the measuring device to perform measurement of the workpiece under the measurement conditions determined by the measurement condition determination unit; and a measurement data processing unit that adds the manufacturing management information decoded by the decoding unit to the measurement data of the workpiece measured by the measuring device.
5. A control device for a measuring device according to any one of claims 1 to 4, wherein the manufacturing management information includes at least one of the model of the workpiece and identifying information that can identify the workpiece or the lot of the workpiece.
6. A control device for a measuring device according to any one of claims 1 to 4, wherein the measuring device is a surface roughness measuring device.
7. A measuring device comprising: a code scanner for scanning a code that encodes manufacturing management information of a workpiece; and a control device according to any one of claims 1 to 4.
8. A control method for a measuring device that measures a workpiece, comprising: a scan data acquisition step of acquiring scan data of a code output from a code scanner that scans a code encoding manufacturing management information of the workpiece; a measurement condition information acquisition step of acquiring measurement condition information which stores a plurality of combinations of the scan data and measurement conditions for measuring the workpiece with the measuring device; and a measurement condition determination step of determining the measurement conditions of the workpiece based on the scan data acquired in the scan data acquisition step and referring to the measurement condition information acquired in the measurement condition information acquisition step.
9. A control method for a measuring device that measures a workpiece, comprising: a scan data acquisition step of acquiring scan data of a code output from a code scanner that scans a code encoding manufacturing management information of the workpiece; a decoding step of decoding the manufacturing management information from the scan data acquired in the scan data acquisition step; a measurement condition information acquisition step of acquiring measurement condition information which stores a plurality of combinations of the manufacturing management information and measurement conditions for measuring the workpiece with the measuring device; and a measurement condition determination step of determining the measurement conditions of the workpiece based on the manufacturing management information decoded in the decoding step and referring to the measurement condition information acquired in the measurement condition information acquisition step.
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