Substrate work system, method for estimating cause of production delay, and substrate work management program
The substrate work system effectively identifies and resolves production delays by analyzing delay times and device information, focusing on downstream issues and stoppages, leading to targeted improvements in production efficiency.
WO2026140076A1PCT designated stage Publication Date: 2026-07-02YAMAHA MOTOR CO LTD
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- YAMAHA MOTOR CO LTD
- Filing Date
- 2024-12-24
- Publication Date
- 2026-07-02
AI Technical Summary
Technical Problem
Existing substrate working systems fail to accurately identify the causes of production delays that lead to improvements in production time, often misattributing delays to cycle time deviations rather than underlying issues, leading to ineffective improvements.
Method used
A substrate work system and method that estimates production delay causes by analyzing production delay time and device-related information, focusing on downstream delays and specific work stoppages, and outputs actionable information for improvement.
Benefits of technology
Accurately identifies and addresses the root causes of production delays, reducing production time by the amount of the delay and enabling effective improvements.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure JP2024045734_02072026_PF_FP_ABST
Abstract
This substrate work system 100 comprises: a substrate work line 10 that includes a plurality of substrate work devices 1 (2, 3, 4, 5, 6) configured to perform substrate production work; and a control device 7 that acquires a production delay time Tid, which is a delay from a reference cycle time Cyc based on a production time Cya1 serving as a reference per one of a plurality of production substrates P. The control device 7 performs control for estimating the cause of a production delay on the basis of the acquired production delay time Tid and device-related information pertaining to each of the plurality of substrate work devices 1 (2, 3, 4, 5, 6) related to the production substrate P in which the production delay time Tid has occurred.
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