Test socket and manufacturing method thereof

The test socket addresses uneven load distribution by partitioning the conductive part array into regions with varying gaps and insulating support, preventing damage and improving test performance and accuracy.

WO2026147004A1PCT designated stage Publication Date: 2026-07-09ISC CO LTD

Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
ISC CO LTD
Filing Date
2025-12-17
Publication Date
2026-07-09

AI Technical Summary

Technical Problem

Existing test sockets for semiconductor devices face damage due to uneven load distribution, particularly in the outer areas, leading to deformation and reduced lifespan, as the conductive parts in these areas experience concentrated loads during testing.

Method used

The test socket design includes a conductive part array with varying gaps between conductive parts and insulating support members, optimizing the dielectric constant and repulsive force characteristics by partitioning the socket into regions with different gap configurations to evenly distribute load and prevent damage.

Benefits of technology

This design effectively prevents damage to conductive parts by evenly distributing loads, enhancing test performance and accuracy by ensuring even contact of conductive parts with terminals, thus extending the socket's lifespan.

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Abstract

Disclosed is a test socket capable of effectively preventing damage to a conductive part by preventing a load from being concentrated on a specific conductive part when testing an element to be tested (for example, a semiconductor device) In the test socket according to an embodiment of the present invention, a plurality of first conductive parts have a gap with respect to an insulating support part in a first conductive part array arranged in a first region, and a plurality of second conductive parts are supported without a gap by the insulating support part in a second conductive part array arranged in a second region different from the first region.
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