Method and apparatus for analyzing emission energy spectrum of x-ray tube assembly, and storage medium
Patent Information
- Application Number
- PCT/CN2025/134991
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-02-21
- Filing Date
- 2025-11-14
- Publication Date
- 2026-08-27
Smart Images
Figure CN2025134991_27082026_PF_FP_ABST
Abstract
Description
A method, apparatus, and storage medium for analyzing the emission energy spectrum of an X-ray tube assembly. Technical Field
[0001] This application relates to the field of data processing technology, and in particular to a method, apparatus and storage medium for analyzing the emission energy spectrum of an X-ray tube assembly. Background Technology
[0002] During operation, in the high-vacuum X-ray tube assembly, electrons emitted from the cathode bombard a rotating target surface to generate X-rays. A high-voltage DC power supply is applied directly between the anode and cathode of the tube to generate an electric field that accelerates the electrons; a filament power supply is applied to the cathode to heat the filament and provide electrons for the high voltage. Due to their short wavelength, high energy, and strong penetrating power, X-rays pass through the X-ray tube window, insulating oil layer, and tube assembly window before reaching the human body for medical diagnosis. However, the choice of window material and thickness, as well as the applied electron energy, all affect the emitted X-ray energy spectrum.
[0003] Before being put into use, the X-ray energy spectrum emitted from the window of the X-ray tube assembly must be tested. However, traditional testing methods have obvious problems: they can only be carried out after the X-ray tube assembly is manufactured into a finished product. If the test finds that the energy spectrum does not meet the requirements, the finished product needs to be repeatedly optimized and iterated. This is not only costly and time-consuming, but also has a lag effect and cannot provide effective guidance in the design stage.
[0004] There are currently no effective solutions to the technical problems of traditional X-ray tube assembly emission energy spectrum testing methods, such as lag, high cost, and long research and development cycle. Summary of the Invention
[0005] The embodiments of this disclosure provide a method, apparatus, and storage medium for analyzing the emission energy spectrum of an X-ray tube assembly. This addresses at least the technical problems of existing traditional X-ray tube assembly emission energy spectrum testing methods, such as lag, high cost, and long development cycles.
[0006] According to one aspect of the present disclosure, a method for analyzing the emission energy spectrum of an X-ray tube assembly is provided, comprising: setting relevant parameters of key structures in a target model; setting different incident electron energies of an electron beam incident on the target model; wherein the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include an X-ray tube window, an insulating oil layer, and a tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; using Monte Carlo software to calculate the flux distribution of X-rays emitted from the target model under different incident electron energies; analyzing the flux distribution to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model; and determining whether the X-ray tube assembly meets design requirements based on the emission energy spectrum.
[0007] According to another aspect of the present disclosure, a storage medium is also provided, the storage medium including a stored program, wherein the methods described above are executed by a processor when the program is running.
[0008] According to another aspect of the present disclosure, an analysis device for the emission energy spectrum of an X-ray tube assembly is also provided, comprising: a setting module for setting relevant parameters of key structures in a target model and setting different incident electron energies of electron beams incident on the target model; wherein the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include an X-ray tube window, an insulating oil layer, and a tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; a flux distribution calculation module for using Monte Carlo software to calculate the flux distribution of X-rays emitted from the target model under different incident electron energies; an emission energy spectrum determination module for analyzing the flux distribution and determining the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model; and a judgment module for judging whether the X-ray tube assembly meets the design requirements based on the emission energy spectrum.
[0009] According to another aspect of the present disclosure, an analysis system for the emission energy spectrum of an X-ray tube assembly is also provided, comprising setting relevant parameters of key structures in a target model, and setting different incident electron energies of electron beams incident on the target model; wherein the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include an X-ray tube window, an insulating oil layer, and a tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; using Monte Carlo software, calculating the flux distribution of X-rays emitted from the target model under different incident electron energies; analyzing the flux distribution to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model; and determining whether the X-ray tube assembly meets the design requirements based on the emission energy spectrum.
[0010] This application constructs a target model corresponding to an X-ray tube assembly. By setting relevant parameters (including material density, material thickness, and cross-sectional area) of key structures such as the X-ray tube window, insulating oil layer, and tube assembly window in the target model, the real X-ray tube assembly environment is simulated. By setting different incident electron energies of the electron beam incident on the target model, the X-rays generated after electrons of different energies bombard the anode target disk in the actual X-ray tube assembly are simulated. Then, Monte Carlo software is used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energy conditions. Next, the calculated flux distribution is analyzed to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model. Finally, based on the calculated emission energy spectrum, it is determined whether the X-ray tube assembly meets the design requirements. Thus, the emission energy spectrum of the X-ray tube assembly can be effectively evaluated during the design stage, avoiding the lag of traditional testing methods that require testing after the finished product is completed. Since there is no need to manufacture a finished product for testing, material and manufacturing costs are greatly saved. Meanwhile, by predicting and optimizing the energy spectrum during the design phase, the design can be iterated and improved more quickly, thereby shortening the overall R&D cycle. This solves the technical problems of lag, high cost, and long R&D cycle in existing traditional X-ray tube assembly emission energy spectrum testing methods. Attached Figure Description
[0011] The accompanying drawings, which are included to provide a further understanding of this disclosure and form part of this application, illustrate exemplary embodiments of this disclosure and are used to explain this disclosure, but do not constitute an undue limitation of this disclosure. In the drawings:
[0012] Figure 1 is a hardware structure block diagram of a computing device for implementing the method according to Embodiment 1 of this application;
[0013] Figure 2 is a flowchart illustrating the method for analyzing the emitted energy spectrum of an X-ray tube assembly according to Embodiment 1 of this application;
[0014] Figure 3 is a schematic diagram of the target model according to Embodiment 1 of this application;
[0015] Figure 4 is a schematic diagram of the flux distribution of X-rays emitted from the target model when the incident electron energy is 140 keV according to Embodiment 1 of this application.
[0016] Figure 5 is a schematic diagram of the first emission energy spectrum of X-rays emitted from the target model in different solid angle ranges when the incident electron energy is 140 keV according to Embodiment 1 of this application.
[0017] Figure 6 is a schematic diagram of the second emission energy spectrum of X-rays emitted from the target model under different incident electron energies according to Embodiment 1 of this application in the solid angle range of 0-0.5π.
[0018] Figure 7 is a schematic diagram of the X-ray tube assembly emission energy spectrum analysis device according to Embodiment 2 of this application; and
[0019] Figure 8 is a schematic diagram of the X-ray tube assembly emission energy spectrum analysis system according to Embodiment 3 of this application. Detailed Implementation
[0020] To enable those skilled in the art to better understand the technical solutions of this disclosure, the technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are merely some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this disclosure.
[0021] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this disclosure are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this disclosure described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0022] Example 1
[0023] According to this embodiment, a method embodiment for analyzing the emission energy spectrum of an X-ray tube assembly is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.
[0024] The method embodiments provided in this example can be executed in mobile terminals, computer terminals, servers, or similar computing devices. Figure 1 shows a hardware structure block diagram of a computing device for implementing a method for analyzing the emission energy spectrum of an X-ray tube assembly. As shown in Figure 1, the computing device may include one or more processors (processors may include, but are not limited to, microprocessors such as MCUs or programmable logic devices such as FPGAs), a memory for storing data, a transmission device for communication functions, and an input / output interface. The memory, transmission device, and input / output interface are connected to the processor via a bus. In addition, it may include a display, a keyboard, and a cursor control device connected to the input / output interface. Those skilled in the art will understand that the structure shown in Figure 1 is merely illustrative and does not limit the structure of the aforementioned electronic device. For example, the computing device may include more or fewer components than shown in Figure 1, or have a different configuration than shown in Figure 1.
[0025] It should be noted that the aforementioned one or more processors and / or other data processing circuits are generally referred to herein as "data processing circuits". These data processing circuits may be embodied, in whole or in part, in software, hardware, firmware, or any other combination thereof. Furthermore, the data processing circuits may be a single, independent processing module, or may be integrated, in whole or in part, into any other element in a computing device. As involved in the embodiments of this disclosure, the data processing circuits serve as processor control (e.g., selection of a variable resistor termination path connected to an interface).
[0026] The memory can be used to store software programs and modules of application software, such as the program instructions / data storage device corresponding to the X-ray tube assembly emission energy spectrum analysis method in the embodiments of this disclosure. The processor executes various functional applications and data processing by running the software programs and modules stored in the memory, thereby realizing the X-ray tube assembly emission energy spectrum analysis method of the aforementioned application. The memory may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory may further include memory remotely located relative to the processor, and these remote memories can be connected to the computing device via a network. Examples of the aforementioned networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.
[0027] The transmission device is used to receive or send data via a network. Specific examples of the network described above may include a wireless network provided by the computing device's communications provider. In one example, the transmission device includes a Network Interface Controller (NIC), which can connect to other network devices via a base station to communicate with the Internet. In another example, the transmission device may be a Radio Frequency (RF) module, used for wireless communication with the Internet.
[0028] The display can be, for example, a touchscreen liquid crystal display (LCD), which allows users to interact with the user interface of the computing device.
[0029] It should be noted that, in some alternative embodiments, the computing device shown in FIG1 may include hardware elements (including circuitry), software elements (including computer code stored on a computer-readable medium), or a combination of both hardware and software elements. It should be pointed out that FIG1 is merely one example of a specific embodiment and is intended to illustrate the types of components that may be present in the aforementioned computing device.
[0030] According to a first aspect of this embodiment, a method for analyzing the emission energy spectrum of an X-ray tube assembly is provided. Figure 2 shows a schematic flowchart of the method. Referring to Figure 2, the method includes:
[0031] S102: Set the relevant parameters of the key structures in the target model, and set different incident electron energies of the electron beam incident on the target model; wherein, the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include the X-ray tube window, the insulating oil layer, and the tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area;
[0032] S104: Using Monte Carlo software, calculate the flux distribution of X-rays emitted from the target model under different incident electron energies;
[0033] S106: Analyze the flux distribution to determine the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; and
[0034] S108: Based on the emitted energy spectrum, determine whether the X-ray tube assembly meets the design requirements.
[0035] Specifically, a simplified model corresponding to the X-ray tube assembly, i.e., the target model, needs to be constructed in advance. This target model is structurally similar to the actual X-ray tube assembly, but has undergone necessary simplifications, retaining the main structural elements of the X-ray tube assembly to facilitate subsequent calculations and analysis. Figure 3 shows a schematic diagram of the target model. As shown in Figure 3, the target model includes an anode target disk 2, an X-ray tube window 5, an insulating oil layer 6, and a tube assembly window 7. Furthermore, Figure 3 also illustrates the electron beam 3 incident on the target model, the focal point 1 of the electron beam 3 bombarding the anode target disk 2, and the resulting X-rays 4.
[0036] In order to simulate the real X-ray tube assembly environment and the X-rays generated after electrons of different energies bombard the anode during the emission energy spectrum analysis, it is necessary to set the relevant parameters of key structures in the target model (such as X-ray tube window, insulating oil layer and tube assembly window). These parameters include material density, material thickness and structural cross-sectional area. Electron beams with different incident electron energies are set to simulate various situations in actual use (corresponding to step S102).
[0037] In an embodiment of the present invention, Table 1 below provides an example of the material density of the X-ray tube window, the insulating oil layer, and the tube assembly window. Wherein, P5 density is the material density of the X-ray tube window, P6 density is the material density of the insulating oil layer, and P7 density is the material density of the tube assembly window.
[0038] Table 1
[0039] In an embodiment of the present invention, Table 2 below provides an example of the material thickness of the X-ray tube window, the insulating oil layer, and the tube assembly window. Wherein, P5 is the material thickness of the X-ray tube window, P6 is the material thickness of the insulating oil layer, and P7 is the material thickness of the tube assembly window.
[0040] Table 2
[0041] In this embodiment of the invention, Table 3 below provides an example of the cross-sectional area of the X-ray tube window, the insulating oil layer, and the tube assembly window. Specifically, P5 is the cross-sectional area of the X-ray tube window, P6 is the cross-sectional area of the insulating oil layer, and P7 is the cross-sectional area of the tube assembly window.
[0042] Table 3
[0043] In an embodiment of the present invention, Table 4 below provides an example of different incident electron energies of the electron beam.
[0044] Table 4
[0045] Then, using Monte Carlo software, the flux distribution of X-rays emitted from the target model under different incident electron energies is calculated (corresponding to step S104). In the simulation of the X-ray tube assembly, Monte Carlo software can simulate the transport of electrons in the material and the generation and attenuation processes of X-rays. This step allows us to understand the transport characteristics of X-rays under different energy conditions. In this embodiment of the invention, the Monte Carlo software is, for example, FLUKA or GEANT.
[0046] In this embodiment of the invention, referring to Table 4 above, Monte Carlo software is needed to calculate the flux distribution of X-rays emitted from the target model when the incident electron energies are 70 keV, 80 keV, 100 keV, 120 keV, and 140 keV. Taking 140 keV as an example, the flux distribution of X-rays emitted from the target model in the yoz plane when the incident electron energy is 140 keV is shown in Figure 4. The unit of this flux distribution is photon number / cm. 2 .
[0047] Next, the flux distribution is analyzed to determine the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model (corresponding to step S106). Figure 6 shows the emission energy spectra of X-rays emitted from the target model when the incident electron energies are 70 keV, 80 keV, 100 keV, 120 keV, and 140 keV. It should be noted that the emission energy spectrum of X-rays will differ under different incident electron energies. By analyzing and comparing these emission energy spectra, the performance of the X-ray tube assembly under different operating conditions can be understood.
[0048] Finally, based on the emitted energy spectrum, it is determined whether the X-ray tube assembly meets the design requirements (corresponding to step S108). In this embodiment of the invention, the design requirements of the X-ray tube assembly include, but are not limited to, requirements for emitted energy spectrum range, energy resolution, radiation dose, etc., which are determined according to the actual application scenario and user needs. By comparing the calculated emitted energy spectrum with the design requirements, it can be determined whether the X-ray tube assembly meets the design requirements. If it does not meet the requirements, the model parameters need to be adjusted or redesigned.
[0049] In this way, the performance of X-ray tube components can be predicted and optimized during the design phase, thereby avoiding lag, saving optimization costs, and shortening the R&D cycle.
[0050] As described in the background section, traditional methods for testing the emission energy spectrum of X-ray tube assemblies can only be performed after the X-ray tube assembly has been manufactured. Once the test reveals that the energy spectrum does not meet the requirements, the finished product needs to be repeatedly optimized and iterated. This is not only costly and time-consuming, but also the test is lagging and cannot provide effective guidance during the design phase.
[0051] In view of this, the technical solution of this application constructs a target model corresponding to the X-ray tube assembly. By setting relevant parameters (including material density, material thickness, and structural cross-sectional area) of key structures such as the X-ray tube window, insulating oil layer, and tube assembly window in the target model, the real X-ray tube assembly environment is simulated. By setting different incident electron energies of the electron beam incident on the target model, the X-rays generated after electrons of different energies bombard the anode target disk in the actual X-ray tube assembly are simulated. Then, Monte Carlo software is used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energy conditions. Next, the calculated flux distribution is analyzed to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model. Finally, based on the calculated emission energy spectrum, it is determined whether the X-ray tube assembly meets the design requirements. Thus, the emission energy spectrum of the X-ray tube assembly can be effectively evaluated at the design stage, avoiding the lag of traditional testing methods that require testing after the finished product is completed. Since there is no need to manufacture a finished product for testing, material and manufacturing costs are greatly saved. Meanwhile, by predicting and optimizing the energy spectrum during the design phase, the design can be iterated and improved more quickly, thereby shortening the overall R&D cycle. This solves the technical problems of lag, high cost, and long R&D cycle in existing traditional X-ray tube assembly emission energy spectrum testing methods.
[0052] Optionally, the operation of analyzing the flux distribution to determine the X-ray emission energy spectrum emitted from the target model when electron beams with different incident electron energies are incident on the target model includes: analyzing the flux distribution to determine the first emission energy spectrum of X-rays in different solid angle ranges under different incident electron energy conditions; and based on the first emission energy spectrum, determining the second emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model in each solid angle range.
[0053] Specifically, the flux distribution describes the intensity and direction of X-rays emitted from the target model, as shown in Figure 4. To analyze the emission characteristics of X-rays more deeply, the entire space needs to be divided into multiple solid angle ranges. Each solid angle range represents a specific emission direction or angle interval. For each solid angle range, based on the corresponding flux distribution data, the energy distribution of X-rays under different incident electron energies is determined, i.e., the first emission energy spectrum. The first emission energy spectrum describes the relative intensity of X-rays with different energies within that solid angle range; therefore, the first emission energy spectrum provides information on the energy distribution of X-rays within different solid angle ranges under each incident electron energy condition.
[0054] Then, based on the first emission energy spectrum, a second emission energy spectrum of X-rays emitted from the target model is further determined when electron beams with different incident electron energies are incident on the target model within each solid angle range. This process essentially involves comprehensively summarizing the emission energy spectra of X-rays emitted from the target model under different incident electron energies within each solid angle range to obtain the second emission energy spectrum.
[0055] This approach allows for a more comprehensive understanding of the performance of X-ray tube components under different incident electron energies and exit directions, providing strong data support for subsequent design optimization and performance evaluation.
[0056] Optionally, the operation of analyzing the flux distribution to determine the first emission energy spectrum of X-rays in different solid angle ranges under different incident electron energies includes: determining multiple solid angle ranges within a 2π solid angle according to a preset solid angle step size; and analyzing the flux distribution to determine the first emission energy spectrum of X-rays in the multiple solid angle ranges under different incident electron energies.
[0057] Specifically, in determining the first emitted energy spectrum, it is first necessary to divide the solid angle range within a 2π solid angle according to a pre-set solid angle step size. Taking a step size of 0.5π as an example, four solid angle ranges can be determined within the 2π solid angle: 0-0.5π, 0.5π-π, π-1.5π, and 1.5π-2π. Each solid angle range corresponds to a specific X-ray emission direction or angle interval, allowing for the study of X-ray energy distribution within these intervals, which helps in a more detailed analysis of the X-ray emission characteristics. It should be noted that the solid angle step size can be determined according to the actual application scenario and user requirements.
[0058] Furthermore, the flux distribution is analyzed to determine the first exit energy spectrum of X-rays within the multiple solid angle ranges under different incident electron energies. Taking FLUKA Monte Carlo software as an example, after calculating the flux distribution using FLUKA, the USRBDX boundary flux detector of FLUKA can be used to analyze the flux distribution of X-rays emitted from the tube assembly to obtain the first exit energy spectrum of X-rays within the multiple solid angle ranges under different incident electron energies. USRBDX is a dual-differential detector; the first variable measured is the incident electron energy, and the second variable is the solid angle of the X-ray exit direction.
[0059] Therefore, the emission energy spectra of X-rays emitted from the target model in the solid angle ranges of 0-0.5π, 0.5π-π, π-1.5π, 1.5π-2π, and 2π can be obtained when the incident electron energies are 70keV, 80keV, 100keV, 120keV, and 140keV, respectively. Figure 5 shows the emission energy spectra of X-rays emitted from the target model in the solid angle ranges of 0-0.5π, 0.5π-π, π-1.5π, 1.5π-2π, and 2π when the incident electron energy is 140keV.
[0060] In this way, the first exit energy spectrum of X-rays within multiple solid angle ranges can be obtained for each incident electron energy condition. This provides detailed information on the performance of the X-ray tube assembly under different exit directions and incident electron energies, aiding in subsequent design optimization and performance evaluation.
[0061] Optionally, the abscissa of the first emission energy spectrum is the energy range from 0 to the corresponding incident electron energy, and the ordinate is the photon count of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range; and, based on the first emission energy spectrum, the operation of determining the second emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model includes: based on the first emission energy spectrum, determining the third emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model; wherein, the first... The third emission energy spectrum has an abscissa representing the energy range from 0 to different incident electron energies, and a ordinate representing the photon count of X-rays emitted from the target model within the corresponding solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range; and the third emission energy spectrum is transformed to determine the second emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model; wherein, the abscissa of the second emission energy spectrum is the energy range from 0 to different incident electron energies, and the ordinate represents the intensity of X-rays emitted from the target model within the corresponding solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range.
[0062] Specifically, when the incident electron energy of the electron beam is 70 keV, the horizontal axis of the first emission energy spectrum represents the energy range from 0 to 70 keV, and the vertical axis represents the photon count of X-rays emitted from the target model within the energy range of the incident electron beam at various solid angles (0-0.5π, 0.5π-π, π-1.5π, 1.5π-2π, and 2π). The unit of photon count is photons / (keV*primary), where photons is the number of photons and primary is the incident electron, i.e., the flux distribution result calculated using Monte Carlo methods, representing the effect produced by each incident electron.
[0063] Similarly, when the incident electron energy of the electron beam is 80 keV, the abscissa of the first emission energy spectrum is the energy range from 0 to 80 keV, and the ordinate is the photon count of X-rays emitted from the target model within each solid angle range (0-0.5π, 0.5π-π, π-1.5π, 1.5π-2π, and 2π) when the electron beam is incident on the target model within the energy range. This process is repeated to obtain the first emission energy spectrum of X-rays within different solid angle ranges under different incident electron energies. Figure 5 shows the first emission energy spectrum when the incident electron energy of the electron beam is 140 keV, with the abscissa being the energy range from 0 to 140 keV and the ordinate being the photon count of X-rays emitted from the target model within each solid angle range (0-0.5π, 0.5π-π, π-1.5π, 1.5π-2π, and 2π) when the electron beam is incident on the target model within the energy range.
[0064] In determining the second emission energy spectrum based on the first emission energy spectrum, it is necessary to determine the third emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model within each solid angle range, based on the first emission energy spectrum. The horizontal axis of the third emission energy spectrum represents the energy range from 0 to different incident electron energies, and the vertical axis represents the photon count of X-rays emitted from the target model within the corresponding solid angle range when electron beams within the energy range are incident on the target model.
[0065] Specifically, for each solid angle range, when electron beams with different incident electron energies are incident on the target model, the first emission energy spectrum of the X-rays emitted from the target model is comprehensively summarized to obtain the third emission energy spectrum. Taking a solid angle of 0-0.5π as an example, when electron beams with incident electron energies of 70keV, 80keV, 100keV, 120keV, and 140keV are incident on the target model, the first emission energy spectra of the X-rays emitted from the target model within the 0-0.5π solid angle range are comprehensively summarized to obtain the third emission energy spectrum within the 0-0.5π solid angle range. The horizontal axis of the third emission energy spectrum represents the energy range from 0 to 70keV, 80keV, 100keV, 120keV, and 140keV, and the vertical axis represents the photon count of the X-rays emitted from the target model within the 0-0.5π solid angle range when electron beams within the energy range are incident on the target model. Similarly, the third emission energy spectrum of X-rays emitted from the target model can be obtained when electron beams with different incident electron energies are incident on the target model within various solid angle ranges.
[0066] Furthermore, the unit of the vertical axis value (i.e., photon count) in the third emission energy spectrum is photons / (keV*primary). This embodiment of the invention transforms the third emission energy spectrum to further simplify the unit to photons / (mA*s*mm²*keV). Specifically, with an electron charge of 1.6 × 10⁻⁶, the unit is... -19 According to calculations, each mA of electron beam produces 6.25 × 10⁻⁶ electrons per second (s). 15 When the cross-sectional area of the three key structures shown in Table 2 (X-ray tube window, insulating oil layer, and tube assembly window) is 63 mm, 2 When performing the transformation, the calculated result of the third emitted energy spectrum needs to be multiplied by a coefficient of 9.92 × 10. 13 The result obtained is the X-ray intensity of the average area on the window of the tube assembly, thus representing the second exit energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model within various solid angle ranges. Figure 6 shows the second exit energy spectrum of X-rays emitted from the target model when electron beams with incident electron energies of 70keV, 80keV, 100keV, 120keV, and 140keV are incident on the target model within the solid angle range of 0-0.5π.
[0067] The third emission energy spectrum needs to be transformed to determine the second emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model within each solid angle range; wherein, the horizontal axis of the second emission energy spectrum is the energy range from 0 to different incident electron energies, and the vertical axis is the intensity of X-rays emitted from the target model within the corresponding solid angle range when electron beams within the energy range are incident on the target model.
[0068] In this way, reference curves can be provided during the design phase, avoiding testing after product manufacturing and preventing project delays and waste of raw materials caused by changes in project materials and structures.
[0069] It should be noted that in this embodiment, the names of the first, second, and third emission spectra are primarily used to distinguish the different spectral results in each analytical step. They do not represent a strict definition or essential difference in practical applications. In actual operation, these spectra may simply be different manifestations of intermediate products or final results in the analytical process.
[0070] Optionally, the operation of determining whether the X-ray tube assembly meets the design requirements based on the emission energy spectrum includes: determining the spectral peaks and characteristic peaks in the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; determining whether the relevant parameters of the key structure meet the design requirements based on the spectral peaks; and determining whether the anode target disk material in the X-ray tube assembly meets the design requirements based on the characteristic peaks.
[0071] Specifically, it is necessary to analyze the exit energy spectrum (e.g., the third exit energy spectrum shown in Figure 6) to determine the bremsstrahlung peaks and assess whether the relevant parameters (such as material and thickness) of key structures (e.g., the anode target disk, the X-ray tube assembly window, etc.) meet the design requirements. Furthermore, it is necessary to determine the characteristic peaks of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model; these characteristic peaks correspond to specific elements or compounds in the anode target disk material. By comparing the position and intensity of the characteristic peaks with the design requirements or information in a known material database (containing characteristic peak information for various anode target disk materials), it can be determined whether the anode target disk material meets expectations. In this way, it is possible to effectively evaluate whether the X-ray tube assembly and its key structures meet the design requirements during the design phase.
[0072] Optionally, the operation of determining whether the X-ray tube assembly meets the design requirements based on the emitted energy spectrum further includes: determining whether the incident electron energy of the electron beam incident on the X-ray tube assembly meets the design requirements based on the characteristic peak.
[0073] Specifically, for specific applications (such as low-dose scanning in pediatric CT scanners), it is necessary to ensure that the X-ray tube assembly meets these requirements. Therefore, based on the identified characteristic peaks, it can be determined whether the position and intensity of the characteristic peaks at a specific incident electron energy meet the expected design requirements. If the position and intensity of the characteristic peaks meet the expected design requirements, then the incident electron energy can be considered to meet the design requirements. Conversely, if the position or intensity of the characteristic peaks does not meet the requirements, the structural design of the X-ray tube assembly needs to be optimized.
[0074] Taking the emitted energy spectrum shown in Figure 6 as an example, assuming that the low dose of the pediatric CT machine is 70keV, since the intensity curve of the X-ray does not show a characteristic peak when the incident electron energy is 70keV, it can be determined that the current structure of the X-ray tube assembly does not meet the design requirements and the material of the X-ray tube anode target plate needs to be further adjusted.
[0075] In this way, it is possible to determine whether an X-ray tube assembly meets the specific application requirements (such as low-dose scanning) by calculating and observing characteristic peaks during the design phase, thereby guiding the design and development process.
[0076] Optionally, the method further includes: determining the spectral peaks and characteristic peaks in the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; and determining the design requirements of the CT scanner based on the spectral peaks and the characteristic peaks.
[0077] Specifically, in the design of a CT scanner, to ensure image quality and diagnostic accuracy, it is necessary to minimize the impact of bremsstrahlung spectral peaks on the detector, ensuring that the detector primarily receives characteristic peaks. Detailed analysis of the emitted energy spectrum is crucial, aiming to determine key information such as the location, intensity, and shape of bremsstrahlung spectral peaks and characteristic peaks. Based on these analysis results, the design requirements of the CT scanner can be further determined, such as optimizing shielding design and adjusting parameters like tube voltage and tube current, to ensure the detector can accurately capture the required characteristic peaks while minimizing unnecessary bremsstrahlung interference.
[0078] Furthermore, according to this embodiment, a storage medium is also provided. The storage medium includes a stored program, wherein, during program execution, a processor executes any of the methods described above.
[0079] In summary, this embodiment constructs a target model corresponding to an X-ray tube assembly. By setting relevant parameters (including material density, material thickness, and cross-sectional area) of key structures such as the X-ray tube window, insulating oil layer, and tube assembly window in the target model, the real X-ray tube assembly environment is simulated. By setting different incident electron energies of the electron beam incident on the target model, the X-rays generated after electrons of different energies bombard the anode target disk in the actual X-ray tube assembly are simulated. Then, Monte Carlo software is used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energy conditions. Next, the calculated flux distribution is analyzed to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model. Finally, based on the calculated emission energy spectrum, it is determined whether the X-ray tube assembly meets the design requirements. Thus, the emission energy spectrum of the X-ray tube assembly can be effectively evaluated during the design stage, avoiding the lag of traditional testing methods that require testing after the finished product is completed. Since there is no need to manufacture a finished product for testing, material and manufacturing costs are greatly saved. Meanwhile, by predicting and optimizing the energy spectrum during the design phase, the design can be iterated and improved more quickly, thereby shortening the overall R&D cycle. This solves the technical problems of lag, high cost, and long R&D cycle in existing traditional X-ray tube assembly emission energy spectrum testing methods.
[0080] Example 2
[0081] Figure 7 shows a schematic diagram of the structure of the X-ray tube assembly emission energy spectrum analysis device 700 according to this embodiment. The analysis device 700 includes: a setting module 710, used to set relevant parameters of key structures in a target model and set different incident electron energies of electron beams incident on the target model; wherein the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include an X-ray tube window, an insulating oil layer, and a tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; a flux distribution calculation module 720, used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energies using Monte Carlo software; an emission energy spectrum determination module 730, used to analyze the flux distribution and determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model; and a judgment module 740, used to determine whether the X-ray tube assembly meets the design requirements based on the emission energy spectrum.
[0082] Optionally, the emission energy spectrum determination module 730 is specifically used to: analyze the flux distribution to determine the first emission energy spectrum of X-rays in different solid angle ranges under different incident electron energy conditions; and based on the first emission energy spectrum, determine the second emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model in each solid angle range.
[0083] Optionally, the operation of analyzing the flux distribution to determine the first emission energy spectrum of X-rays in different solid angle ranges under different incident electron energies includes: determining multiple solid angle ranges within a 2π solid angle according to a preset solid angle step size; and analyzing the flux distribution to determine the first emission energy spectrum of X-rays in the multiple solid angle ranges under different incident electron energies.
[0084] Optionally, the abscissa of the first emission energy spectrum is the energy range from 0 to the corresponding incident electron energy, and the ordinate is the photon count of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range; and, based on the first emission energy spectrum, the operation of determining the second emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model includes: based on the first emission energy spectrum, determining the third emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model; wherein, the first... The third emission energy spectrum has an abscissa representing the energy range from 0 to different incident electron energies, and a ordinate representing the photon count of X-rays emitted from the target model within the corresponding solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range; and the third emission energy spectrum is transformed to determine the second emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model; wherein, the abscissa of the second emission energy spectrum is the energy range from 0 to different incident electron energies, and the ordinate represents the intensity of X-rays emitted from the target model within the corresponding solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range.
[0085] Optionally, the judgment module 740 is specifically used to: determine the spectral peaks and characteristic peaks in the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; determine whether the relevant parameters of the key structure meet the design requirements based on the spectral peaks; and determine whether the anode target disk material in the X-ray tube assembly meets the design requirements based on the characteristic peaks.
[0086] Optionally, the judgment module 740 is further specifically used to: determine, based on the characteristic peak, whether the incident electron energy of the electron beam incident on the X-ray tube assembly meets the design requirements.
[0087] Optionally, the analysis device 700 further includes: a first determining module, used to determine the spectral peaks and characteristic peaks in the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; and a second determining module, used to determine the design requirements of the CT scanner based on the spectral peaks and the characteristic peaks.
[0088] Therefore, according to this embodiment, a target model corresponding to the X-ray tube assembly was constructed. By setting relevant parameters (including material density, material thickness, and structural cross-sectional area) of key structures such as the X-ray tube window, insulating oil layer, and tube assembly window in the target model, the real X-ray tube assembly environment was simulated. By setting different incident electron energies of the electron beam incident on the target model, the X-rays generated after electrons of different energies bombard the anode target disk in the actual X-ray tube assembly were simulated. Then, Monte Carlo software was used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energy conditions. Next, the calculated flux distribution was analyzed to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies were incident on the target model. Finally, based on the calculated emission energy spectrum, it was determined whether the X-ray tube assembly met the design requirements. Thus, the emission energy spectrum of the X-ray tube assembly can be effectively evaluated at the design stage, avoiding the lag of traditional testing methods that require testing after the finished product is completed. Since there is no need to manufacture a finished product for testing, material and manufacturing costs are greatly saved. Meanwhile, by predicting and optimizing the energy spectrum during the design phase, the design can be iterated and improved more quickly, thereby shortening the overall R&D cycle. This solves the technical problems of lag, high cost, and long R&D cycle in existing traditional X-ray tube assembly emission energy spectrum testing methods.
[0089] Example 3
[0090] Figure 8 illustrates an X-ray tube assembly emission energy spectrum analysis system 800 according to this embodiment, including: a processor 810; and a memory 820 connected to the processor 810, used to provide the processor 810 with instructions to process the following steps: acquiring multispectral image data of a monitored area at multiple time points and dividing the monitored area into multiple candidate sub-regions; determining salinization feature information of the monitored area and each candidate sub-region based on the multispectral image data at multiple time points; selecting candidate sub-regions with a similarity greater than a predetermined threshold to the monitored area as sample sub-regions based on the salinization feature information of the monitored area and each candidate sub-region; determining the feature sequence of the monitored area at each time point based on the multispectral image data of all sample sub-regions and inputting it into a pre-trained land salinization inversion model to determine the salinity of the monitored area.
[0091] Optionally, the operation of analyzing the flux distribution to determine the X-ray emission energy spectrum emitted from the target model when electron beams with different incident electron energies are incident on the target model includes: analyzing the flux distribution to determine the first emission energy spectrum of X-rays in different solid angle ranges under different incident electron energy conditions; and based on the first emission energy spectrum, determining the second emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model in each solid angle range.
[0092] Optionally, the operation of analyzing the flux distribution to determine the first emission energy spectrum of X-rays in different solid angle ranges under different incident electron energies includes: determining multiple solid angle ranges within a 2π solid angle according to a preset solid angle step size; and analyzing the flux distribution to determine the first emission energy spectrum of X-rays in the multiple solid angle ranges under different incident electron energies.
[0093] Optionally, the abscissa of the first emission energy spectrum is the energy range from 0 to the corresponding incident electron energy, and the ordinate is the photon count of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range; and, based on the first emission energy spectrum, the operation of determining the second emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model includes: based on the first emission energy spectrum, determining the third emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model; wherein, the first... The third emission energy spectrum has an abscissa representing the energy range from 0 to different incident electron energies, and a ordinate representing the photon count of X-rays emitted from the target model within the corresponding solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range; and the third emission energy spectrum is transformed to determine the second emission energy spectrum of X-rays emitted from the target model within each solid angle range when an electron beam with different incident electron energies is incident on the target model; wherein, the abscissa of the second emission energy spectrum is the energy range from 0 to different incident electron energies, and the ordinate represents the intensity of X-rays emitted from the target model within the corresponding solid angle range when an electron beam with different incident electron energies is incident on the target model within the energy range.
[0094] Optionally, the operation of determining whether the X-ray tube assembly meets the design requirements based on the emission energy spectrum includes: determining the spectral peaks and characteristic peaks in the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; determining whether the relevant parameters of the key structure meet the design requirements based on the spectral peaks; and determining whether the anode target disk material in the X-ray tube assembly meets the design requirements based on the characteristic peaks.
[0095] Optionally, the operation of determining whether the X-ray tube assembly meets the design requirements based on the emitted energy spectrum further includes: determining whether the incident electron energy of the electron beam incident on the X-ray tube assembly meets the design requirements based on the characteristic peak.
[0096] Optionally, the memory 820 is also configured to provide the processor 810 with instructions to process the following steps: determining the spectral peaks and characteristic peaks in the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies are incident on the target model; and determining the design requirements of the CT scanner based on the spectral peaks and the characteristic peaks.
[0097] Therefore, according to this embodiment, a target model corresponding to the X-ray tube assembly was constructed. By setting relevant parameters (including material density, material thickness, and structural cross-sectional area) of key structures such as the X-ray tube window, insulating oil layer, and tube assembly window in the target model, the real X-ray tube assembly environment was simulated. By setting different incident electron energies of the electron beam incident on the target model, the X-rays generated after electrons of different energies bombard the anode target disk in the actual X-ray tube assembly were simulated. Then, Monte Carlo software was used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energy conditions. Next, the calculated flux distribution was analyzed to determine the emission energy spectrum of X-rays emitted from the target model when electron beams of different incident electron energies were incident on the target model. Finally, based on the calculated emission energy spectrum, it was determined whether the X-ray tube assembly met the design requirements. Thus, the emission energy spectrum of the X-ray tube assembly can be effectively evaluated at the design stage, avoiding the lag of traditional testing methods that require testing after the finished product is completed. Since there is no need to manufacture a finished product for testing, material and manufacturing costs are greatly saved. Meanwhile, by predicting and optimizing the energy spectrum during the design phase, the design can be iterated and improved more quickly, thereby shortening the overall R&D cycle. This solves the technical problems of lag, high cost, and long R&D cycle in existing traditional X-ray tube assembly emission energy spectrum testing methods.
[0098] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.
[0099] In the above embodiments of the present invention, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments.
[0100] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. The device embodiments described above are merely illustrative; for example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual coupling, direct coupling, or communication connection may be through some interfaces; the indirect coupling or communication connection between units or modules may be electrical or other forms.
[0101] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.
[0102] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.
[0103] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.
[0104] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.
Claims
1. A method for analyzing the emission energy spectrum of an X-ray tube assembly, characterized in that, include: The relevant parameters of the key structures in the target model are set, and the different incident electron energies of the electron beam incident on the target model are set; wherein, the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include the X-ray tube window, the insulating oil layer, and the tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; Using Monte Carlo software, the flux distribution of X-rays emitted from the target model under different incident electron energies was calculated; The flux distribution is analyzed to determine the emission energy spectrum of X-rays exiting the target model when electron beams with different incident electron energies are incident on the target model; and Based on the emitted energy spectrum, determine whether the X-ray tube assembly meets the design requirements.
2. The method according to claim 1, characterized in that, The operation of analyzing the flux distribution to determine the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model includes: The flux distribution was analyzed to determine the first exit energy spectrum of X-rays within different solid angle ranges under different incident electron energies; and Based on the first emission energy spectrum, the second emission energy spectrum of X-rays emitted from the target model is determined when electron beams with different incident electron energies are incident on the target model within each solid angle range.
3. The method according to claim 2, characterized in that, The operation of analyzing the flux distribution to determine the first exit energy spectrum of X-rays in different solid angle ranges under different incident electron energies includes: Based on a pre-set step size for the solid angle, multiple solid angle ranges are determined within a 2π solid angle; and The flux distribution is analyzed to determine the first emission energy spectrum of X-rays within the multiple solid angle ranges under different incident electron energies.
4. The method according to claim 2, characterized in that, The horizontal axis of the first emitted energy spectrum is the energy range from 0 to the corresponding incident electron energy, and the vertical axis is the photon count of X-rays emitted from the target model in each solid angle range when the electron beam in the energy range is incident on the target model. Furthermore, based on the first emission energy spectrum, the operation of determining the second emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model within each solid angle range includes: Based on the first emission energy spectrum, a third emission energy spectrum of X-rays emitted from the target model is determined when electron beams with different incident electron energies are incident on the target model within each solid angle range; wherein, the abscissa of the third emission energy spectrum is the energy range from 0 to different incident electron energies, and the ordinate is the photon count of X-rays emitted from the target model within the corresponding solid angle range when electron beams within the energy range are incident on the target model; and The third emission energy spectrum is transformed to determine the second emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model within each solid angle range; wherein, the abscissa of the second emission energy spectrum is the energy range from 0 to different incident electron energies, and the ordinate is the intensity of X-rays emitted from the target model within the corresponding solid angle range when electron beams within the energy range are incident on the target model.
5. The method according to claim 1, characterized in that, The operation of determining whether the X-ray tube assembly meets the design requirements based on the emitted energy spectrum includes: When electron beams with different incident electron energies are incident on the target model, the spectral peaks and characteristic peaks in the emission energy spectrum of the X-rays emitted from the target model are determined. Based on the spectral peaks, determine whether the relevant parameters of the key structure meet the design requirements; and Based on the characteristic peaks, it is determined whether the anode target material in the X-ray tube assembly meets the design requirements.
6. The method according to claim 5, characterized in that, The operation of determining whether the X-ray tube assembly meets the design requirements based on the emitted energy spectrum further includes: determining whether the incident electron energy of the electron beam incident on the X-ray tube assembly meets the design requirements based on the characteristic peak.
7. The method according to claim 1, characterized in that, Also includes: When electron beams with different incident electron energies are incident on the target model, the spectral peaks and characteristic peaks in the emission energy spectrum of the X-rays emitted from the target model are determined. as well as Based on the spectral peaks and the characteristic peaks, the design requirements for the entire CT scanner are determined.
8. A storage medium, characterized in that, The storage medium includes a stored program, wherein, when the program is executed, the method described in any one of claims 1 to 7 is performed by a processor.
9. An analysis device for the emission energy spectrum of an X-ray tube assembly, comprising: The setting module is used to set relevant parameters of key structures in the target model and set different incident electron energies of the electron beam incident on the target model; wherein, the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include the X-ray tube window, the insulating oil layer, and the tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; The flux distribution calculation module is used to calculate the flux distribution of X-rays emitted from the target model under different incident electron energies using Monte Carlo software. An emission energy spectrum determination module is used to analyze the flux distribution and determine the emission energy spectrum of X-rays emitted from the target model when electron beams with different incident electron energies are incident on the target model; and The judgment module is used to determine whether the X-ray tube assembly meets the design requirements based on the emitted energy spectrum.
10. A system for analyzing the emission energy spectrum of an X-ray tube assembly, characterized in that, include: processor; as well as A memory, connected to the processor, for providing the processor with instructions to perform the following processing steps: The relevant parameters of the key structures in the target model are set, and the different incident electron energies of the electron beam incident on the target model are set; wherein, the target model is a pre-constructed simplified model corresponding to the X-ray tube assembly; the key structures include the X-ray tube window, the insulating oil layer, and the tube assembly window; the relevant parameters include material density, material thickness, and structural cross-sectional area; Using Monte Carlo software, the flux distribution of X-rays emitted from the target model under different incident electron energies was calculated; The flux distribution is analyzed to determine the emission energy spectrum of X-rays exiting the target model when electron beams with different incident electron energies are incident on the target model; and Based on the emitted energy spectrum, determine whether the X-ray tube assembly meets the design requirements.