Handheld deflectometry imaging devices for specular surfaces, systems and methods of using the same

Abstract

A handheld imaging system for a surface is presented that includes a housing, a handle coupled to the housing, and an image capturing device configured to capture an image of the surface, with the image capturing device at least partially housed within the housing. The system also includes a light source that projects a static structured light pattern with a period and a dark-to-light ratio onto the surface. Additionally, the system includes a position detection mechanism that provides a detectable position indication of the image capturing device relative to the surface, and an alignment detection mechanism that provides a detectable alignment indication of the image capturing device relative to the surface. The surface is at least a partially specular surface.

Description

PA103503W002HANDHELD DEFLECTOMETRY IMAGING DEVICES FOR SPECULAR SURFACES,SYSTEMS AND METHODS OF USING THE SAMEBACKGROUND

[0001] Surface modification on specular surfaces presents challenges for imaging, surface trajectory design, and evaluation pre and post-modification.SUMMARY

[0002] A handheld imaging system for a surface is presented that includes a housing, a handle coupled to the housing, and an image capturing device configured to capture an image of the surface, with the image capturing device at least partially housed within the housing. The system also includes a light source that projects a static structured light pattern with a period and a dark-to-light ratio onto the surface. Additionally, the system includes a position detection mechanism that provides a detectable position indication of the image capturing device relative to the surface, and an alignment detection mechanism that provides a detectable alignment indication of the image capturing device relative to the surface. The surface is at least a partially specular surface.BRIEF DESCRIPTION OF THE DRAWINGS

[0003] In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. The drawings illustrate generally, by way of example, but not by way of limitation, various embodiments discussed in the present document.

[0004] FIG. 1 is a schematic of a prior art robotic surface modification system.

[0005] FIG. 2 illustrates a method of surface modification in which systems and methods herein may be helpful.

[0006] FIGS. 3A-3E illustrate images of specular surfaces captured using deflectometry imaging techniques.

[0007] FIGS. 4A-4D illustrates a schematic of light reflections off of different surfaces.

[0008] FIGS. 5A to 5C-3 illustrate a schematic of a handheld deflectometry image capturing device in accordance with embodiments herein.

[0009] FIG. 6 illustrates a handheld deflectometry imaging system moving into alignment with a specular surface to be imaged in accordance with embodiments herein.

[0010] FIG. 7 illustrates a block diagram of a handheld deflectometry image capturing device in accordance with embodiments herein.

[0011] FIG. 8 illustrates a method of detecting defects on a surface using a handheld deflectometry image capturing device in accordance with embodiments herein.

[0012] FIG. 9 illustrates different structured light patterns that can be placed over a backlight, for example, to provide structured illumination for the imaging system.

[0013] FIG. 10 is a defect detection system architecture.

[0014] FIG. 11 is a block diagram of a computing environment that can be used in embodiments shown in previous Figures.DETAILED DESCRIPTION

[0015] Recent advancements in imaging technology and computational systems have made feasible the process of clear coat inspection at production speeds. In particular, stereo deflectometry has recently been shown to be capable of providing images and locations of paint and clear coat defects at appropriate resolution with spatial information (providing coordinate location information and defect classification) to allow subsequent accurate relocation and automated spot repair.

[0016] In the automotive industry, defect detection is particularly difficult because of the specular surfaces of vehicles (e.g. painted and clear-coat covered surfaces). Some prior art systems, such as that illustrated in FIG. 1, have attempted to automate the robotic repair process with both automated scanning, detection and repair of surface defects.

[0017] However, such prior art systems require a source of information about the geometry of a worksurface. For example, a CAD or 3D model of a vehicle may be needed for a robotic repair system to associate a defect with a location on a vehicle and for a robotic repair unit to verify its position prior to a surface modification operation.

[0018] Deflectometry imaging systems for an end-of-arm system are discussed, for example, in PCT Publication WO 2024 / 141858, published on July 4, 2024 and PCT Publication WO 2024 / 141859, published on July 4, 2024. Such systems, however, are designed for mounting near a robotic surface modifying tool on the robotic unit. However, such imaging systems can be expensive and difficult to maneuver.

[0019] A system is desired that is portable and can be operated by an individual. Such a system could have more broad applicability, for example being used in automotive aftermarket scenarios such as body shops as well as being used in OEM environments. A handheld system that can provide quick information about a surface, by detecting and analyzing defects quickly, including defect classification, such as defect types and dimensions, which can lead to consistent categorization and treatment. This can reduce the time it takes for humans to review and locate defects on a surface. Systems herein can also be used for post-inspection to classify and evaluate repair quality.

[0020] Handheld imaging systems described herein may be useful when paired with robotic repair systems - for example, as described below, a handheld imaging system may replace the initial scanning system required for a robotic repair system to find and repair defects. Handheld imagingsystems described herein may also be useful when paired with human-operated repair systems as well.

[0021] Defect classification and quantification using systems herein may, in some embodiments, also include generating repair recommendations, or even a control signal for a robotic repair unit to automatically repair a detected defect.

[0022] Systems and methods herein may provide fast, high-resolution and high-detail defect detection and characterization that can lead to faster and more accurate repair of detected defects, resulting in better repair outcomes.

[0023] As used herein, the term “vehicle” is intended to cover a broad range of mobile structures that receive at least one coat of paint and / or clear coat during manufacturing. While many examples herein concern automobiles, it is expressly contemplated that methods and systems described herein are also applicable to trucks, trains, boats (with or without motors), airplanes, helicopters, motorcycles, etc. Additionally, while vehicles are described herein as one example of a worksurface having a specular surface, it is noted that systems herein may be useful for other specular surfaces as well.

[0024] The term “paint” is used herein to refer broadly to any of the various layers of e-coat, filler, primer, paint, clear coat, etc. of the vehicle that have been applied in the finishing process. Additionally, the term “paint repair” involves locating and repairing any visual artifacts (defects) on or within any of the paint layers. In some embodiments, systems and methods described herein use clear coat as the target paint repair layer. However, the systems and methods presented apply to any particular paint layer (e-coat, filler, primer, paint, clear coat, etc.) with little to no modification. Painted surfaces may refer to surfaces having some specularity, specularity being a measure of how much light an object reflects. For example, a surface is considered to be partially specular if it is at least 2% specular.

[0025] As used herein, the term “defect” refers to an area on a worksurface that interrupts the visual aesthetic. For example, many vehicles have specular, or reflective, surfaces that may appear shiny or metallic after painting is completed. A “defect” can include debris trapped within one or more of the various paint layers on the work surface. Defects can also include smudges in the paint, excess paint including smears or dripping, as well as dents. As used herein, “defect” includes both aesthetic interruptions occurring during paint application or during a repair process. A surface may have some haze on a surface, for example, which is created or made worse during a defect repair operation. A surface modification operation may also cause other defects.

[0026] As used herein, the term “real-time” generally refers to data that is processed within seconds or milliseconds so that it is available virtually immediately. While some delay due to processing is inevitable, “real-time” is intended to cover systems and methods where data can becollected or entered without any noticeable delay. For example, a data entry into a system is substantially immediately available for further processing.

[0027] “Deflectometry,” as used herein, refers to a non-contact optical measurement technique used to determine the shape of specular surfaces. It involves analyzing the reflection of light off the surface to infer its shape. It offers advantages like non-contact measurement of large and complex surface. Deflectometry imaging techniques may be sued to capture images that are processed to detect defects on a surface. Systems herein may be used for either single-shot imaging or multishot imaging processes. Single-shot or single view imaging refers to capturing and analyzing images from a single perspective or viewpoint. Multi-shot or multi-view imaging involves utilizing multiple perspectives or viewpoints to enhance understanding, depth perception, or scene reconstruction in computer vision tasks.

[0028] Deflectometry often includes the use of a light source or projector that projects a structured light pattern onto a surface. The structured light pattern may be static or dynamic. In some embodiments herein the structured light pattern is a fringe pattern having a period and a dark-to-light portion ratio, however it is expressly contemplated that other patterns may be used. A defect can be detected on a surface by noting a disturbance in the structured light pattern projected on the surface.

[0029] The defect can be characterized - e.g. a type of defect can be detected, a defect dimension may be determined, etc. - by analyzing the disturbance on the pixel-level of images capturing the structured light pattern on the surface.

[0030] It is noted that some examples and embodiments are described herein with respect to imaging a flat surface. While systems and methods can be used herein to image and detect defects on a flat surface, it is expressly contemplated that systems and methods herein may be particularly useful for imaging and detecting defects on a curved or angular surface.

[0031] Robotic defect characterization and repair may be done using methods described, for example, in PCT Publication WO 2020 / 044178, published on March 5, 2020; WO 2020 / 084523, published on April 30, 2020; WO 2020 / 161534, published on August 13, 2020; and WO 2021 / 105865, published on June 3, 2021.

[0032] FIG. l is a schematic of a prior art robotic paint repair system which could be improved using systems and methods described herein. System 100 generally includes two units, a visual inspection system 110 and a defect repair system 120. Both systems may be controlled by a motion controller 112, 122, respectively, which may receive instructions from one or more application controllers 150. The application controller may receive input, or provide output, to a user interface 160. Repair unit 120 includes a force control unit 124 that can be aligned with an end-effector 126. As illustrated in FIG. 1, end effector 126 includes two tools 128, as furtherdescribed in co-pending U.S. Provisional Patent Application 62 / 940950 filed on November 27, 2019. However, other arrangements are also expressly contemplated. For example, while FIG.1 illustrates a repair unit 120 operating simultaneously with imaging system 110, it is expressly contemplated that repair unit 120 operates at least at a time delay from imaging system 110, such that at least some movement of repair unit 120 is informed by data collected from repair unit 110.

[0033] The first of the two main challenges, inspection of vehicle 130 by inspection unit 110, is interesting due to the nature of the underlying problem domain. In general, the surface of interest is very large in comparison to the defects themselves, with the difference being multiple orders of magnitude. This results in trade-offs between field of view and resolution when it comes to sensor selection as well as lens selection, crucial for creating a required angular field of view. Additionally, each paint layer of the finishing process (e-coat, primer, paint, clear coat, etc.) differs in its visual appearance with specularity being particular noteworthy. Highly specular surfaces (i.e., high-gloss or highly reflective surfaces) pose unique imaging challenges. These issues together make inspection difficult. Recent progress in the last few years has been made in this area making use of increasing computational resources, resulting in the availability of several commercial solutions. The presence of a sufficiently capable inspection system 110 is important for identifying defects for repair by repair unit 120.

[0034] Systems and methods herein may be used in addition to an imaging system 110, or instead of imaging system 110. For example, systems and methods herein may be more easily maneuvered around a vehicle, particularly vehicles that are not located on an assembly line of an OEM. In an aftermarket repair environment, for example, an imaging system 110 may be too cumbersome or take up too much space to be worth the investment. Systems and methods herein may be designed with no permanent footprint requirement, may be easily portable from one location to another, and may be significantly cheaper to purchase.

[0035] The current state of the art in vehicle paint repair is to use fine abrasive and / or polish systems to manually sand / polish out the defects, with or without the aid of a power tool, while maintaining the desirable finish (e.g., matching specularity in the clear coat).

[0036] It is expressly noted that, throughout the present description, the example of surface modification of a vehicle surface to remove paint-related defects from a surface is presented as one potential use case. However, other surface modifications are expressly contemplated, such as other abrasive operations (sanding, grinding), other additive processes (e.g. additive manufacturing, adhesive deposition, etc.), or subtractive processes (material removal, cutting, etc.)

[0037] FIG. 2 illustrates a method of surface modification in which systems and methods herein may be helpful. While method 200 is described in the context for surface defect repair on a vehicle surface having some specularity, it is expressly contemplated that other use cases mayalso benefit from systems and methods herein.

[0038] In block 210, an initial scan of the surface to be modified is done. This initial scan may be done at a first location, for example in the vehicle repair context, at an inspection station. Systems and methods herein may be useful for conducting an initial scan. For example, an individual may carry or move a handheld deflectometry imaging system around a vehicle or part needing to be repaired. A number of images may be captured, either automatically or triggered by the individual.

[0039] Some prior art systems, for example using an imaging system like system 110 of FIG.1, benefited from a second surface imaging 220, which was done by an imaging system on an end-of-arm of a robotic repair unit.

[0040] It is expressly contemplated that systems and methods herein may be particularly useful for collecting more detailed information about a defect and the surrounding surface of a surface having some specularity.

[0041] In block 230, the surface is characterized. Surface characterization may include identifying defects on the surface as well as identifying information about the surface - for example it may be useful to understand not only what type of defect exists on a surface, but what the surface texture, often called “orange peel” is near the defect. Existing haze may be detected and quantified. For example, a scratch is repaired by a robotic repair unit differently than a bump caused by trapped debris. Additionally, a crater is repaired in yet another manner. Additionally, defect size is important for selecting or generating a repair strategy - e.g. large piece of trapped debris may require additional pressure, longer contact time, or a different abrasive article, then a small piece of trapped debris. Other surface characterization considerations may also be important, such as anticipated vehicle use, status of other layers of paint, etc. For example, an initial orange peel characterization may be done on the surface around a detected defect, to ensure that a selected surface modification sequence maintains, or blends into the orange peel around the surface.

[0042] The information gathered from block 230 is important for conducting a surface modification operation, illustrated in block 240. The surface modification operation may be conducted by a robotic repair unit, in some embodiments, or may be conducted by a human operator. Surface characterization information may at least partially drive a selection of a repair strategy - e.g. what abrasive tools, abrasive articles, sanding or polishing fluid, etc. are used.

[0043] The surface modification may be either an additive or subtractive modification based on a need of a work surface being modified. For a robotic repair operation, the surface modification 240 may include a trajectory that includes a path consisting of a series of waypoints, between each waypoint a surface modification tool travels at a speed, angle, and applied pressure.

[0044] In block 260, a post-modification evaluation is conducted. The post-modificationevaluation may be used to determine whether a repair was successful. Success may be determined based on whether a defect was sufficiently removed. Success may also be determined based on whether a repair area is sufficiently blended into the surrounding area - e.g. how much was local orange peel disrupted, how much haze was introduced, etc.

[0045] As illustrated by block 250, in some embodiments the steps of imaging 220, surface characterization 230, surface modification 240, and post-modification evaluation 260, are repeated for a number of defects on the surface.

[0046] In the vehicle context, a surface may have multiple discrete defects needing repair on a surface. However, some detected defects during and the initial scan of block 210 may not need repair, or may not be repairable by an on-site repair unit. For the number of defects that can be repaired by a robotic repair unit, the steps 220, 230, 240, and 260 repeat until all defects are repaired to an acceptable level, or as allowed by production / timing constraints. An acceptable level may be determined, for example, by an industry accepted size, a manufacturer quality tolerance, or another standard such as visibility by the human eye, etc.

[0047] In block 270, a second scan of the entire surface may be completed, for example by the same imaging system as that of block 210, using the imaging system of blocks 220 - 260, or another imaging system.

[0048] In the paint defect repair context, the scan conducted in block 210 is often used to locate defects on a surface, not necessarily to characterize the defects in detail, or to select a surface modification sequence for addressing detected defects. The initial scan of block 210 may be used, for example to determine which defects detected need to be repaired, and can be repaired by an on-site robotic surface modification unit. In prior art systems, the location of defects has often been done in conjunction with a CAD or other 3D model of a vehicle needing to be repaired. However, it is expressly contemplated that systems and methods herein may be used in scenarios where a CAD or other 3D model is not available.

[0049] Systems and methods herein may provide defect location information in any of a number of suitable forms. For example, in some embodiments, the location is provided in association with a captured image - e.g. the image could have an indication highlighting where the defect is, and / or coordinates within the image could be provided. In some embodiments the location information is communicated to an API, where one application or service is communicating to another. In some embodiments, the location information is appended to a CAD file or other 3D model. In some embodiments, the location information is written to a file as a coordinate entry, for example in the form of JSON. Simple text or other formatting may be used, in other embodiments. It is expressly contemplated that other methods for outputting defect location information are possible.

[0050] FIGS. 3A-3E illustrate images captured by an image capturing system as described in embodiments herein. FIGS. 3A-3C illustrate structured light images captured using deflectometry imaging systems.

[0051] FIG. 3 A illustrates a structured light image 310 of a surface containing a defect. The defect illustrated in image 310 is a nib. FIG. 3B illustrates a structured light image 330 of a surface containing a defect. The defect illustrated in image 330 is a trapped fiber. FIG. 3C illustrates a structured light image 320 of us surface containing a defect. The defect illustrated in image 320 is a crater. As illustrated, a defect can be detected using deflectometry by detecting a aberration in the reflected structured light pattern.

[0052] FIG. 3D and 3E illustrate an original image 340, and a processed image 350 of a surface after a surface modification has been completed. As illustrated in image 350, it is possible using systems and methods herein to determine a boundary of the surface modification and evaluate the amount of Haze (higher being illustrated by darker portions of the image) introduced to the surface by the surface modification. Haze is caused by the non-specular reflections of surface scratches which scatter the incoming light, rather than reflecting through resonance. More reflected light is received from the micro-scratches, making haze detectable and quantifiable. It is noted that the illustrated images are inverted images. However, the image is inverted for ease of human viewing. It is expressly contemplated that defect detection and surface characterization may be done of the captured images or the inverted images.

[0053] Systems and methods herein enable the automatic detection of defects on a specular surface with a singular image without moving the object. Many prior art specular surface inspection systems are complex and often involve multiple cameras, light or motion of the object with respect to the one or more cameras. Systems and methods herein allow for coordination of machine vision equipment, image capture under different illumination conditions, and identification of features and defects using machine vision algorithms. Illustrated herein are systems and methods for sub-millimeter defects on specular surfaces. However, systems and methods herein may also be used to address other challenges with other surface conditions.

[0054] Systems and methods herein use different lighting arrangements in order to obtain different images of a surface prior to a surface modification. FIG. 4A illustrates a schematic of different lighting operations that might be useful for different evaluations of a surface, any of which may be used by systems and methods described herein. An incident light 412 is projected on a surface 410 at an incident angle. Light may then reflect off of surface 410 either as diffuse reflection 414, or as a specular reflection 416. Diffuse reflection of incident light 412 bounces off the surface in a number of directions, and at a variety of angles, as illustrated in FIG. 4A. Specular reflection 416 reflects off of surface 410 at an opposite angle of the incident light angle. FIGS.4B-4D illustrate light reflections off of different surfaces having different degrees of specularity.

[0055] Systems and methods herein include a handheld deflectometry imaging device configured to project a structured light pattern onto a surface and capture an image of the surface with the structured light pattern. The handheld deflectometry imaging device may be coupled to a processing system which can process the captured images. The processing system may receive and process deflectometry images in real-time, in some embodiments. In some embodiments, the processing system processes deflectometry images at a later time or on a delay. In some embodiments, captured images are stored locally, either on a memory associated with the handheld deflectometry imaging device or on a memory associated with the processing system. However, it is expressly contemplated that images and / or analysis thereof may be stored on a memory remote from both the handheld deflectometry imaging device and the processing system.

[0056] The processing system may be a computing device with a display in some embodiments, such as a desktop, laptop, tablet, or cellular phone.

[0057] In some embodiments, the handheld deflectometry system is communicably coupled to the processing system using a wired, wireless or cloud computing network protocol.

[0058] In some embodiments, the handheld deflectometry system contains processing circuitry and memory sufficient to perform at least some of the analytical functions described herein. In some embodiments, an edge processor is included as part of the handheld deflectometry system.

[0059] Capturing deflectometry images using a handheld system presents several challenges. Most importantly is maintaining position and alignment of the imaging system with respect to the surface. Because defect characterization, in embodiments herein, includes information about defect size, it is important that the projected structured light pattern be projected from a known distance, such that defect size can be determined. Additionally, it is important that the light be projected at a known angle from the surface (e.g. normal to the surface, in some embodiments) to ensure that the structured light pattern is visible in a field of view of a camera.

[0060] It is expressly contemplated that, in some embodiments, it may be possible to calculate a distance of the handheld imaging device from the surface. For example, at a first distance is may be known that a specific structured light pattern will project, for example, lines on a surface being a certain number of pixels wide in a captured image. Using a known structured light pattern, then, it may be possible to calculate an actual distance from the surface being imaged based on a deviation between the expected number of pixels wide and the actual width (in number of pixels) in a captured image. Other adjustment techniques may also be possible.

[0061] In some embodiments herein, a position detection mechanism, or position indication aid, is present. For example, handheld deflectometry image capturing systems in embodimentsherein may include one or more lasers that project onto a surface. A pair of coplanar lasers may be sufficient for determining a distance between a handheld imaging system and the surface. A third laser, not coplanar with both the first and second laser may be sufficient for determining an alignment of the handheld imaging system with respect to a surface. Additional lasers could also be used to increase accuracy. For example, some embodiments herein include four lasers.

[0062] The lasers may be useful for a human operator to know whether they are at a desired position and orientation with respect to a surface. While it may be possible to correct for distance, it may be preferred to have a handheld imaging device within a suitable distance range to have a suitable image resolution or image quality. A human operator may be able to see the lasers projected onto the surface and, when the lasers are aligned, manually actuate an image capture function of the handheld imaging system. Alternatively, laser detectors may be able to determine a correct position / alignment and automatically cause the imaging device to capture an image.

[0063] Lasers are described as one example sensing system that could be used to detect or verify position / alignment, it is expressly contemplated that other sensors or sensing systems could be used. For example, LIDAR systems may be used. Lasers may be preferred for handheld systems as more computational power is needed for LIDAR. However, as processing power of devices continues to increase, LIDAR may be more suitable for a handheld system in the near future. Additionally, ultrasonic sensing systems may be used in some embodiments. IR-based sensing systems may also be useful. Additionally, in the event that the surface being image exhibits magnetic properties (e.g. has sufficient iron content, or other magnetic material content, loaded therein), an impedance sensor may be suitable.

[0064] In some embodiments herein, a single image of a surface is captured at a time. However, it is expressly contemplated that, in some embodiments, a number of images are captured when an image capture operation is initiated. Image capture may be automatically initiated in some embodiments, e.g. when an acceptable position / alignment is detected. In some embodiments, handheld imaging system includes a video camera or a camera that is constantly taking images.

[0065] It may be helpful, for defect and surface characterization, to capture images from the same position / alignment, but with a different structured light pattern. In some embodiments, a different structured light pattern is achieved by moving a light source within the handheld imaging system with respect to a physical structure forming the structured light pattern - e.g. a mask having a pattern of apertures or another suitable structure. However, it is expressly contemplated that, in some embodiments, the structured light pattern is projected onto the light source - e.g. using a LCD or other screen as the light source, and a different structured light pattern can then be obtained by projecting a second structured light pattern onto the light source. A combination of projectionand physical movement of the light or pattern are expressly contemplated herein. A plurality of images may be captured with a number of different structured light patterns while a handheld imaging system is in position / alignment with a surface.

[0066] FIGS. 5A-5C illustrate a schematic of a handheld deflectometry image capturing device in accordance with embodiments herein. System 500 illustrates one embodiment of a handheld deflectometry image capturing device - it is expressly contemplated that other configurations are possible.

[0067] System 500, in some embodiments, includes a case 510 or other housing that provides some protection for internal components from damage - e.g. from the device being dropped or otherwise colliding with other structures. The presence of a housing 510 may provide a greater crumple zone before a camera, light source, processing component or other internal components are damaged.

[0068] In some embodiments, as illustrated in FIGS. 5A-5B, case 510 is only a partial housing that does not completely enclose all components of system 500. A partial enclosure 510 may be useful for an operator to have access to internal components, while providing protection of those internal components. However, it is expressly contemplated that system 500 may have a housing 510 that completely encloses a camera 520 and a light source (not shown in FIGS. 5A-5B). Housing 510 may include one or more handles 512 for ease of use. As illustrated in FIG. 5 A, in one embodiment a pair of handles 512 are integrally formed with housing 510. However, handles may also be formed separately and coupled to housing 510 in other embodiments.

[0069] FIG. 5A illustrates an embodiment where folded optics are used. Camera 520 is positioned such that a camera lens is directed away from a surface being imaged. This may be useful for protecting camera 520 from damage. A mirror 522 is used to redirect reflected light from a surface into a camera lens, as described and illustrated in FIG. 5B. However, while folded optics are illustrated in FIGS. 5A-5B, it is expressly contemplated that a camera 520 may have a lens directed toward a surface being imaged. Camera 520 may be positioned offset from a light source (not shown in FIGS. 5A-5B), or may capture an image through the light source. For example, a light source may include a display or other component with an aperture therein that allows a lens to receive light reflected back from the surface being imaged.

[0070] A structured light pattern 540 is illustrated in FIG. 5 A that is a physical structure placed over a light source (not shown in FIG. 5A). Structured light pattern 540 may be removeable in some embodiments, e.g. so that a different structured light pattern can be placed in position as needed. In some embodiments, structured light pattern 540 is part of, or forms part of, hosing 510.

[0071] FIG. 5A illustrates an embodiment where a static structured light pattern 540 is used. Static structured light pattern 540 includes a number of bars and slits, through which light isprojected, which may be referred to as a fringe pattern. The fringe pattern has a set dark-to-light ratio (e.g. a thickness of the bars vs. a thickness of the slits), and a fringe period (e.g. a width of one bar and one slit).

[0072] While it is expressly contemplated that a number of offset images may also be obtained by adjusting the fringe period or dark-to-light ratio or by selecting or projecting a different structured light pattern, in the embodiment illustrated in FIG. 5A a light position adjustment mechanism 542 is responsible for moving a relative position of a light source (not shown in FIG.5A), so that a plurality of offset images can be obtained. Illustrated in FIG. 5A is a linear actuator 542 that moves a light source up or down, respectively, according to arrows 544.

[0073] As described herein, system 500 may include one or more mechanisms for determining whether system 500 is at a desired distance from, and alignment to, a surface. In FIG. 5A, the distance detection mechanism and alignment detection mechanism are a number of lasers 530 positioned at different points on the exterior of housing 510. For example, lasers 533 and 532 are positioned on either side of housing 510. A third laser, laser 531, may be positioned at a third position not line with 532-533. The combination of three lasers points on a surface may be used to determine a position and alignment of system 500 with respect to a surface being imaged.

[0074] As described herein, system 500 may also include a communication component that can provide images captured by camera 533 to a defect detection system capable of analyzing captured images to detect a defect on the imaged surface.

[0075] FIG. 5B illustrates a schematic of how the deflectometry image capturing may work with a system 550 using folded optics. FIG. 5B illustrates an embodiment with a single mirror 520. However, it is expressly contemplated that a system may have multiple mirrors 520 to accommodate a different orientation of camera 520 within housing 510.

[0076] A light source (not shown, located behind static structured light pattern 540) projects a light. The projected light may include multiple rays of light. The rays of light interact with the structured light pattern at 552, where rays of light that are angled correctly will pass through the apertures or slits of the structured light pattern. At 554, the ray of light strikes a surface to be imaged. The ray of light will, as described in FIG. 4, be scattered and reflected in a number of different directions. A single reflected ray is illustrated, for the sake of understanding. The reflected ray of light is reflected back towards system 550, where it strikes a mirror 556. The ray of light reflects off the mirror 556 into a camera lens, at 558, where the image is captured.

[0077] FIG. 5C illustrates three scenarios, 5C-1, 5C-2, 5C-3 which illustrate how a distance detection mechanism using a plurality of lasers may be used. Such a system may be useful for a manually-operated handheld deflectometry system so that a user can determine when they are at a correct distance.

[0078] A handheld imaging device 560 has a first laser 561 and a second laser 562. First and second lasers 561-562 are angled with respect to each other such that the emitted laser beams will interest at a point in front of handheld imaging device 560. The angle between laser 561 and housing 560 is selected, in some embodiments, based on a desired distance between the imaging device 560 and a surface 565 being imaged. The distance may be set based on camera settings for the imaging device 560, such as aperture and gain.

[0079] When imaging device 560 is too close to the surface, as illustrated in 5C-1, the laser beams will not intersect before hitting the surface, and two laser points will be visible on the surface, spaced apart from each other. When a user is too far from the surface, as illustrated in 5C-3, the laser beams will intersect prior to hitting the surface, again resulting in two laser points visible on the surface, spaced apart from each other. When a user is at the specified distance, illustrated in 5C-2, the laser beams will intersect at the surface, and a single laser point will be visible.

[0080] An operator of the handheld imaging device may be able to determine if they are too far away, or too close, by moving further toward or away from the surface, and watching whether the laser points get closer or further from the surface. In some embodiments, the laser beams are selected to have different colors such that it is more readily detectable whether they have intersected prior to hitting the surface.

[0081] FIGS. 5C-1, 5C-2 and 5C-3 illustrate two lasers for ease in understanding. While an image capturing device may be at a specified distance, only two lasers may be insufficient to determine whether or not the imaging device is aligned correctly with the surface (e.g. the imaging device may be tilted forward, such that projected light will project below the desired field of view, or tilted backward, such that the projected light will project above the desired field of view). It is expressly contemplated that a third laser may be added so that a user can determine whether the device is aligned correctly with respect to the surface.

[0082] In some embodiments, the system includes a photo-diode sensor, or other laser detection mechanism, capable of detecting that a reflected laser has come back to its complementary match - indicating that the device is in both the correct orientation and the correct distance from the surface being imaged. In some embodiments, the photo-diode sensor automatically triggers the image capturing device to capture one or more images when correct alignment and position is detected. In some embodiments, an intensity threshold is used to ensure that only the laser sets off the photo-diode sensor. In some embodiments, a band-gap filter is present so that only a set wavelength of light (e.g. a selected laser) will actuate the image capture device. The image capturing device may have a refractory period that causes the image capturing device to capture an image after a set amount of time has passed - e.g. one image every secondthat the device is in the correct position and alignment. This may provide a balance between the user of the handheld imaging system to have to actuate the image capturing device (e.g. pressing a button, switching a switch, etc.), which could cause the device to come out of alignment or position, while not requiring a continuous stream of images to be captured, which presents a storage and battery power concern.

[0083] It may also be possible to detect that a device is in position and / or alignment with a surface using an imaging device which, when the laser points overlap, triggers image capturing. The laser-detecting imaging device may be the same or different from the image capturing device capturing deflectometry images. Image processing techniques may be used to detect the laser points on the surface and determine when they are overlapping.

[0084] Lasers are illustrated in FIG. 5C as one potential distance detection mechanism. However, it is expressly contemplated that other suitable distance detection mechanisms may be used. For example, instead of (or in additional to) lasers mounted on a housing of a handheld image capturing device, it is expressly contemplated that fiducials may be placed on the surface of the vehicle.

[0085] Fiducials may also be useful for creating a point-cloud of the specular surface, to which captured images, and detected defects, may be mapped.

[0086] In some embodiments, two or more radar sensitive fiducials may be used to detect system position or orientation with respect to a small-scale radar imager using synthetic aperture radar.

[0087] In some embodiments, a sonar sensor may be used to determine a distance between the image capturing device and the surface, or to indicate that a correct distance has been achieved.

[0088] In some embodiments, the handheld imaging system includes, or is mounted to, a rolling gantry which may help reduce accidental or small movements by a human operator and relieve a human operator from holding the system during operation.

[0089] In some embodiments the handheld imaging system includes, or is mounted to, a gimbal that may assist in maintaining a desired orientation of the imaging device with respect to a surface being imaged.

[0090] In some embodiments, the handheld imaging system also includes a movement detection mechanism which can be used to detect that the handheld imaging system has moved from a first position to a second position. For example, one or more accelerometers may be able to detect that the handheld imaging system has moved far enough that it likely is in a new position for a new image to be captured. In some embodiments, it may be possible to track accelerometer sensor signals and track where the handheld imaging system has been positioned previously. This may be useful for determining how captured images relate to one another.

[0091] An accelerometer and / or a gyroscope may also be able to detect whether the camera is being held steady enough to capture an image.

[0092] FIG. 6 illustrates a handheld deflectometry imaging system moving into alignment with a specular surface to be imaged in accordance with embodiments herein. An automotive part 600 having a specular surface is being imaged by a handheld deflectometry imaging system 650, with a plurality of lasers 652. Three laser points 660 are visible in proximity to each other, but not yet overlapping, indicating that handheld deflectometry imaging system 650 is not yet in both position and alignment with respect to automotive part 600.

[0093] In some embodiments, to reduce blurring, a lower maximum exposure is used by the image capturing device. For example, the exposure may be set to a maximum of no more than 6 ms, or even no more than 5 ms, or even no higher than 4 ms. In some embodiments, to account for the lower light due to the structured light pattern, the applied gain is less than about 8, or less than about 6, or less than about 4. The applied gain, in some embodiments, is greater than 0, or greater than about 2. In some embodiments, the applied gain is about 3.

[0094] In some embodiments, the image capturing device is configured to capture an image periodically, for example once every 2 seconds. In some embodiments, the image capturing device is configured to capture an image at least once every 5 seconds, or at least once every 3 seconds, or at least every 2 seconds, or at least once every second, or at least twice every second, or at least 5 times every second, or at least 10 times every second. In some embodiments, the camera is a high speed camera capable of capturing more than 10 images per second.

[0095] FIG. 7 illustrates a handheld deflectometry imaging system in accordance with embodiments herein. System 700 includes a deflectometry imaging system 710 configured to capture deflectometry images of a surface. System 700 also includes an image processing system 730, configured to process the images, in addition to any received sensor information. System 700 also includes a datastore 770, where images being analyzed may be stored, for example, along with other information helpful for image analysis or for designing a defect repair strategy based on defect characterization information detected from captured images. System 700 may also include a display component 760, which may display captured images, defect characterization information, or other data on a user interface 762. However, while FIG. 7 illustrates systems 710, 730 as separate from each other and from display component 760 and datastore 770, it is expressly contemplated that this is for illustration purposes only.

[0096] Imaging system 710, in some embodiments, includes a housing 720 that encases and protects the various internal components, such as the image capturing device 702, light source 706, and processing system 730, from physical damage, dust, and other environmental factors. Inaddition to providing protection, the housing 720 offers structural integrity by securely holding all components in place and ensuring proper alignment.

[0097] Deflectometry imaging system 710 includes an image capturing device 702, which is actuated by an image capture trigger 704. In some embodiments, image capture trigger 704 is a button, switch or other physical actuator that a user actuates to cause image capturing device 702 to capture an image. In some embodiments, image capture trigger 704 causes image capturing device 702 to capture an image automatically when image capturing device 702 is in position and alignment with the surface to be imaged. For example, image capture trigger 704 may actuate image capture when a distance detector 742 and an alignment detector 744 detect that image capturing device 702 is in position and alignment with the surface being imaged.

[0098] Image capturing device 702 may be a camera, in some embodiments. In some embodiments, image capturing device 702 is a video camera, and capturing images, as described herein, refers to isolation of frames captured while image capturing device 702 is in position / alignment. In some embodiments, image capturing device 702 is a high-speed camera.

[0099] Image capturing system 710 also includes a light source 706 which is configured to illuminate a surface being imaged. Image capturing system 710 also includes a diffusion mechanism 716 configured to diffuse light from light source 706. Diffusion mechanism 716, in some embodiments, is part of light source 706, e.g. light source 706 is an LCD display in some embodiments, that is capable of projecting a light pattern onto a surface to be imaged. However, while liquid crystal displays (LCDs) are described herein as one possible form for a light source, it is expressly contemplated that other devices, such as LED, OLED or another suitable display component configured to provide sufficient light could be used.

[0100] In some embodiments, diffusion mechanism 716 is a separate component from light source 706, for example diffusion mechanism 716 may be a mask applied over light source 706 in some embodiments herein.

[0101] In some embodiments, diffusion mechanism 716 includes a repeating geometric pattern such as bars, circles, rectangles, triangles, or other geometric shapes. In some embodiments, diffusion mechanism 716 includes a fringe pattern having a fringe period and a dark-to-light ratio.

[0102] Deflectometry imaging system 710 may also include a light source adjustment mechanism 708 configured to adjust a setting or position of light source 706 or diffusion mechanism 716 after an image such that, for example, a plurality of images may be captured of the same surface under different lighting conditions. For example, light source adjustment mechanism 708 may adjust a diffusion pattern provided by diffusion mechanism 716, or mayadjust a relative position between light source 706 and diffusion mechanism 716, for example by moving either light source 706 and / or diffusion mechanism 716 relative to each other.

[0103] Deflectometry imaging system 710 may include an alignment mechanism 712 and / or a distance detection mechanism 714. It is expressly contemplated that, in some embodiments, a single position detection system is used that serves as both alignment mechanism 712 and distance detection mechanism 714.

[0104] In some embodiments, distance detection mechanism 714 includes a set of two or more lasers mounted or coupled to housing 720. In some embodiments, the two or more lasers overlap when the operator of system 700 is holding system 700 is at a preferred distance from a surface being imaged. In some embodiments, distance detection mechanism 714 is configured to indicate when system 700 is at a set distance from a surface that will provide a higher quality image based on image capture settings for image capturing device 702. However, it is expressly contemplated that in some embodiments distance detection mechanism 714 detects a distance between image capturing device 702 and the surface to be imaged, such that a defect detector 748 can correctly determine a size or volume of a defect detected on the surface based on the images captured. In some embodiments, distance detector 742 automatically causes an image capture trigger 704 to actuate when image capturing device 702 is at a set distance from the surface being imaged.

[0105] In some embodiments, a detected distance may be used to generate a set of settings for image capturing device 702 that will result in improved image quality. For example, image capture settings adjustor 726 may, for example, adjust any of a focus, an aperture, a gain, a light intensity, or any other appropriate setting.

[0106] Alignment mechanism 712 may include a third and / or a fourth laser mounted or coupled to housing 720 such that a rotational position of the image capturing device 702 relative to the surface being imaged can be detected. In some embodiments, alignment detector 744 automatically causes an image capture trigger 704 to actuate when image capturing device 702 is at a set alignment with the surface being imaged. In some embodiments, image capture trigger 704 only actuates an image capture operation when both distance detector 742 detects a set distance between image capturing device 702 and alignment detector 744 detects a proper alignment between image capturing device 702 and the surface being imaged.

[0107] While the example of lasers are described as an example alignment mechanism 712 and / or distance detection mechanism 714, it is expressly contemplated that other mechanisms may be suitable. For example, a photo-diode sensor is used in some embodiments. A sonar sensor is used in some embodiments. An ultrasonic sensor is used in some embodiments. An IR-based sensor is used in some embodiments.

[0108] In some embodiments the deflectometry imaging system 710 includes a movement detector 722. Movement detector 722 may include, for example, an accelerometer, a gyroscope, or another suitable movement detection device. Movement detection mechanism 722 is configured to provide an indication of movement of the imaging system during the image capture process. Movement detector 746 is configured, in some embodiments, to provide a signal to image capture trigger 704 to capture an image when movement of image capturing device is sufficiently low -e.g. to reduce the risk of capturing blurry images due to hand and body movements of an operator. In some embodiments, image capture trigger 704 does not actuate an image capture operation until a signal is received from each of the distance detector 742, alignment detector 744, and movement detector 746.

[0109] Deflectometry imaging system 710 may include other features 724 as well, such as other sensors that provide other information about a status of system 710 and / or a surface being imaged. Deflectometry imaging system 710 may also include, in some embodiments a rolling gantry which allows for movement of image capturing device 702 around a space, while reducing the number of small movements by a user which can affect image quality. Deflectometry imaging system 710 may also include, in some embodiments, a gimbal which may assist in maintaining a preferred alignment of image capturing device 702 with respect to the surface being imaged.

[0110] Handheld deflectometry imaging system 7000 also includes an imaging processing system 730. As noted previously, in some embodiments at least some of the functionality attributed to image processing system 730 is onboard deflectometry imaging system 710, either within or physically coupled to housing 720. In some embodiments, however, at least some of the functionality of image processing system 730 is remote from, but communicably coupled to deflectometry imaging system 710. For example, systems 710 and 730 may be communicably coupled using any suitable wired, wireless or cloud network communication protocol.

[0111] In some embodiments, at least some of the functionality of image processing system 730 is completed in real-time, or substantially real-time, such that, as an operator of deflectometry imaging system 710 moves with respect to a surface to be imaged, distance detector 742, alignment detector 744 and movement detector 746 can determine that image capturing device 702 is in position, alignment and sufficiently stable to capture an image of the surface within a sufficiently fast time period that an image capture signal generator 736 may generate and send a signal to image capture trigger 704 to capture an image while image capturing device 702 is still in position, alignment and sufficiently stable.

[0112] Images, or an image stream, is received by image receiver 732 and processed by image processor 734, which may perform initial processing of the raw image data. This processingincludes tasks such as noise reduction, contrast enhancement, thresholding, and other image correction techniques that are necessary to prepare the images for further analysis.

[0113] In embodiments where image capture is automatically triggered, an image analyzer may analyze received images and / or sensor signal information to determine whether image capturing device 702 is in position, alignment and / or sufficiently stable for image capture. In some embodiments, image capture device 702 only needs to be in a suitable alignment and sufficiently stable for image capture. Distance detector 742, in such embodiments, may detect a distance, using distance detection mechanism 714, which may be used by defect detector 748 to detect an accurate defect size and / or volume.

[0114] In some embodiments, distance detector 742 detects a distance between image capturing device 702 in real-time, or substantially real-time, such that an image capture signal generator 736 can send an image capture signal to image capturing device based on a detected distance. For example, based on a detected distance, image capture trigger 704 may change one or more settings of image capturing device 702 or light source 706 to improve image quality. For example, an image capture signal may include an instruction for an image capture settings adjustor 726 to adjust a gain, an aperture, a focus or another setting of image capturing device.

[0115] In some embodiments, movement detector 746 is configured to detect and track movement in between image capture operations. In some embodiments, the movement tracking information may be used to determine relative positions of defects, detected by defect detector 748, with respect to each other. In some embodiments, movement tracking information may be useful for generating a point cloud representative of the surface of the workpiece being imaged.

[0116] In some embodiments, image processing system 730 also includes a defect detector 748. In some embodiments, defect detection by defect detector 748 occurs in real-time or substantially real-time. In some embodiments, however, defect detection is done at a later time than when a workpiece is imaged. Defect detector 748 is configured to identify and characterize any defects present on the specular, or partially specular, surface. Defect detector 748 may detect defects as described in greater detail, for example, in in PCT Publication WO 2024 / 141858, published on July 4, 2024, FIGS. 19-20 and the accompanying description being incorporated by reference herein, as well as in PCT Publication WO 2024 / 141859, published on July 4, 2024.

[0117] In some embodiments, image processing system 730 also includes a surface characterizer 752 configured to, based on the received images, characterize a surface ofthe imaged workpiece near the defect. Characterizing the surface may include, for example, identifying a paint color, a density of metallic flakes in the paint, orange peel texture of the surface, or local curvature around the defect (e.g. flat, amount of curvature, a sharp comer, etc.).

[0118] In some embodiments, based on characteristics of a detected defect (e.g. size, volume, type, location) and the characteristics of the surrounding surface (paint color, other paint characteristics, local curvature, orange peel) an abrasive repair strategy generator 750 may generate a repair strategy for the defect. For defects that will be repaired by a human operating a handheld tool, generating a repair strategy may include a recommendation of abrasive article make and model, sanding and / or polishing conditions and products, and / or settings for the handheld power tool. For defects that will be repaired by a robotic repair unit, the abrasive repair strategy generator 750 may generate a control signal for a robotic repair unit that includes a location of the defect, as well as a repair strategy to execute. The repair strategy may include a trajectory to follow, as well as a force profile, speed profile, and / or attack angle profile to use along the trajectory. The control signal may, when received, cause the robotic repair unit to automatically execute the repair strategy, in some embodiments.

[0119] Image processing system 730 may include other functionality 752 as well.

[0120] Image processing system 730, in some embodiments, includes a GUI generator 738, which creates a graphical user interface 762 for displaying on display component 760 any of the processed images, defect and surface characterization results, and / or repair strategy to a user. A user may be able to interact with the graphical user interface 762 using any suitable input / output mechanism such as a touchscreen, a mouse, a keypad, buttons, switches, trackpads, etc. Display component 760 may include other features 766.

[0121] Image processing system 730 may be integrated into a computing device containing, or communicably coupled to, a datastore 770. Datastore 770 may include any number of useful information and / or algorithms that may be useful for image analyzer. For example, captured images 772 from a current image capture operation of a worksurface may be stored. In some embodiments, captured images 772 are associated with a timestamp and any location or movement information received from a movement detection mechanism 722 and any distance information received from distance detection mechanism 716. Datastore 770 may include a number of repair strategy templates 774 and may also include a repair strategy template selector algorithm capable of selecting a repair strategy template based on captured images 772, or based on defect characteristics determined by defect detector or surface characterization determined by surface characterizer 752. Defect datastore 776 may include information useful for defect characterizer 748 to characterize defects, such as severity criteria, repair criteria, classification algorithms, etc.A general image datastore 778 may store images from other image capture operations. Datastore 770 may include other information 780 as well.

[0122] FIG. 8 illustrates a method of detecting defects on a surface using a handheld deflectometry image capturing device in accordance with embodiments herein. Method 800 may be used by systems described herein, for example, or with another suitable system.

[0123] At block 810, a position of an image capture device is detected. In some embodiments herein, detecting the position of image capture device refers to detecting that image capture device is in the correct position, e.g. at a correct distance, with respect to the surface being imaged. In some embodiments, detecting the position refers to detecting an actual distance between the image capture device and a surface being imaged, such that defect characterization can be corrected based on an actual distance.

[0124] At block 820, an alignment of the image capture device is detected. In some embodiments, the same mechanism is used to detect position and alignment, such that the steps of blocks 820 can occur simultaneously, as indicated in block 812. However, it is expressly contemplated that the operations of blocks 810 and 820 do not have to occur simultaneously.

[0125] Any suitable sensors may be used to detect a position or alignment of an image. Described herein are laser sensor systems, which may be easily detectable by a human operator or used with an automated image capture system, or which may be used in conjunction with a photodiode. In some embodiments, however, other sensor systems are used such as LIDAR, sonar, ultrasonic, infrared, impedance, etc.

[0126] In block 830, light is projected onto the area of the worksurface to be imaged. Projecting light, in embodiments herein, refers to projecting a structured light pattern onto the surface. The structured light pattern may be static or dynamic. The structured light pattern may be projected using a light source, or may be formed using a mask placed between the light source and the worksurface.

[0127] In block 840, an image of the surface is captured. In some embodiments, a number of images are captured at a single position with respect to the surface being imaged, as indicated in block 842. In such embodiments, it may be useful to obtain a series of images with lighting differences - either a lighting offset, where a position of a light source with respect to a structured light pattern changes, or a different structured light pattern entirely. For example, a first fringe pattern may be used for a first image captured in block 840, a second fringe pattern may be selected, as indicated in block 832, projected onto the surface, as indicated in block 830, before a second image is again captured in block 840. This process may repeat at least twice, at least three times, or even more times at a single position. In some embodiments multiple images are captured using the same lighting conditions, in the event an image is blurry due to operator movement.

[0128] Images may be captured based on a human triggering an image capturing device as indicated in block 842, for example by pressing a button on a camera, e.g. For example, when ahuman sees that the image capturing device is both in position and aligned, they may capture an image. In some embodiments, however, it is expressly contemplated that images are captured automatically, as indicated in block 846. In some embodiments, the image capturing device is configured to capture an image periodically - e.g. once every second, twice every second, once every 5 seconds, etc. In some embodiments, the image capturing device is configured to capture images only when the image capturing device is in position and alignment with respect to a surface, or only when the image capturing device is in alignment and sufficiently stable, or when a different set of conditions are met. Other image capturing scenarios are also envisioned, as indicated in block 848.

[0129] A movement detection may detect that the image capturing device has moved from a first position with respect to a surface to a second position with respect to the surface. For example, an accelerometer or gyroscope may detect that the image capturing device has moved to the right, the left, up, or down more than a threshold distance selected to reduce noise from operator movement. In some embodiments, detecting movement to a new position, as indicated in block 860, may cause method 800 to repeat. In some embodiments, an amount and direction of movement is tracked, such that captured images can be spatially tagged and a point cloud of the surface may be generated.

[0130] In block 850, a defect is detected on the imaged surface, based on the image. Defect detection techniques described herein, and described in in PCT Publication WO 2024 / 141858, published on July 4, 2024 and PCT Publication WO 2024 / 141859, published on July 4, 2024, incorporated herein by reference, or other suitable defect detection techniques may be used. Defect detection in block 850, may occur in substantially real-time, or substantially immediately after each image, or sequence of images, is captured at a position, such that defect characterization information can be reported out to a user quickly. However, it is expressly contemplated that, in some embodiments, defect detection and characterization occurs at a later time and / or using other processing circuitry not associated with the handheld image capturing system. Defect detection may include, in addition to detecting a defect location, detecting a defect type 852, a defect size or volume 854, surface characteristics 856 near the defect, or other information 858 relevant to selecting or designing a repair strategy for said defect.

[0131] FIG. 9 illustrates a few possible structured light patterns that could be used in embodiments herein. However, it is expressly contemplated that the four illustrated alternatives are only a few of a number of different patterns that could be used. As illustrated in patterns 902, 904, 906, and 908, a number of different geometric shapes can be arranged to provide a repeating pattern having a repeating unit, and a dark-to-light ratio of said repeating unit. Pattern 902 illustrates a typical fringe pattern having alternating dark and light portions.

[0132] For example, some prior art systems require a 3’ x 4’ high intensity display screen, through which multiple patterns are presented. While each pattern is presented, an image is taken. The images must then be analyzed and combined to provide a single surface map. Systems and methods herein can obtain the surface information necessary to conduct a surface modification sequence using a more convenient, and more portable, handheld system. In some embodiments, only a single image is captured. However, it may be beneficial to capture multiple images without significantly increasing cycle time.

[0133] The different structured light patterns illustrated in FIG. 9 are presented as examples only, and not intended to be limiting. For example, while pattern 902 illustrates vertical lines, it is expressly contemplated that horizontal or angled lines may also be used. Additionally, pattern 804 illustrates alternating sized grid patterns, however it is expressly contemplated that a single size grid pattern could also be used. Images 906 and 908 illustrate different patterns that involve circular apertures. Patterns 902-908 may be provided by a patterned lighting device, or a lighting device projecting a pattern. However, it is expressly contemplated that other grid aperture shapes and sizes are also possible. Additionally, dynamically changing light patterns, e.g. deflectometry, single shot deflectometry, etc. may also be used.

[0134] Systems and methods herein utilize a handheld deflectometry imaging system to detect surface defects on specular or partially specular surfaces. Systems and methods herein may be useful for conducting an initial scan of a part or vehicle to identify defects, a post-operational scan to determine whether a repair was successful, or to confirm a location of a defect. Systems and methods herein may be useful for manual or robotic repair operations.

[0135] It is important for systems and methods described herein to maintain alignment of the field of view and the surface being imaged. For specular surfaces, the main rays of light reflect off the surface such that an angle of reflectance is equal to an angle of incidence. Because of specular reflection, the incident and reflected light are within a plane. The main axis of the camera / lens therefore should be set at the correct position and orientation such that this axis intercepts those main rays of light with accuracy. The field of view needs to be in line with the normal vector from the surface area of interest, e.g. the area containing a defect. It may also be important to maintain stability of an imaging system such that the alignment remains correct.

[0136] Camera systems have a number of variables that can be adjusted to capture different information about a surface - gain, aperture and exposure time, angle of acceptance (incoming angles / vectors that can be mapped to a pixel), angular field of view, as well as numerous other settings. For example, increasing gain may increase a signal to noise ratio for haze on a surface. Some embodiments herein, then, may shift the gain multiple times, capturing multiple images. Comparison of the different images taken at different gains facilitates the enhancement of themeasurement of haze. Haze can be a combination of signal and noise and, therefore, variation in a set of captured images taken at different gains, may help identify and quantify haze. Gain, and / or light intensity, may also be adjusted based on a color of a base coat of paint.

[0137] While other suitable light sources may be used, some systems and methods herein utilize a suitable LED lighting systems at a range of intensities. The conditions of imaging may include a high frequency and small aperture on a camera’s lens to provide a large depth of field require LEDs. High intensity LEDs may be particularly useful for specular surfaces, which do not diffuse light and reflect most light in a single direction. High intensity LEDs increase the probability of capturing defect information, given a certain exposure time, as increasing the amount of incoming light increases the amount of light captured. While, generally, exposure time increases for small apertures, a high intensity light can compensate, allowing for a reduced time needed to capture each image required. Systems and methods herein use static structured light to identify clearcoat defects, and scattered light to identify optical haze in the clearcoat.

[0138] Haze can be quantified, by determining a scratch density for a given area of haze. Using systems and methods herein, it is possible to have the system automatically identify an area of haze, determine a density of the scratches within that haze area, and calculate a percent haze that a human eye might perceive. The calculation may be done in any suitable manner, for example using a segmentation algorithm, a machine learning based algorithm, or another suitable algorithm.

[0139] However, while systems and methods described herein are described with respect to painted vehicles, it is expressly contemplated that systems and methods herein may be useful for other industries, for example, recurring or constant evaluations of internal or external processes such as part repairs, evaluating metallic and / or paint finishes for other groups of products, or even high spatial resolution mapping of an environment using a mobile robot.

[0140] Further, it is contemplated that a surface imaging system herein may be useful for other specular surfaces, for example imaging a surface pre-and post-adhesive application, for example.

[0141] FIG. 10 is a block diagram of a repair strategy generation architecture. The remote server architecture 1000 illustrates one embodiment of an implementation of a repair strategy generator 1010. As an example, remote server architecture 1000 can provide computation, software, data access, and storage services that do not require end-user knowledge of the physical location or configuration of the system that delivers the services. In various embodiments, remote servers can deliver the services over a wide area network, such as the internet, using appropriate protocols. For instance, remote servers can deliver applications over a wide area network and they can be accessed through a web browser or any other computing component. Software orcomponents shown or described in FIGS. 1-9 as well as the corresponding data, can be stored on servers at a remote location. The computing resources in a remote server environment can be consolidated at a remote data center location or they can be dispersed. Remote server infrastructures can deliver services through shared data centers, even though they appear as a single point of access for the user. Thus, the components and functions described herein can be provided from a remote server at a remote location using a remote server architecture. Alternatively, they can be provided by a conventional server, installed on client devices directly, or in other ways.

[0142] In the example shown in FIG. 10, some items are similar to those shown in earlier figures. FIG. 10 specifically shows that a surface inspection system can be located at a remote server location 1002. Therefore, computing device 1020 accesses those systems through remote server location 1002. Operator 1050 can use computing device 1020 to access user interfaces 1022 as well. Similarly, a handheld imaging system 1070 may be located remotely from computing device 1020. Imaging system and / or computing device 1020 may be communicably coupled to a surface modification system, e.g. a robotic repair unit, through network 1002 as well.

[0143] FIG. 10 shows that it is also contemplated that some elements of systems described herein are disposed at remote server location 1002 while others are not. By way of example, storage 1030, 1040 or 1060 or repair systems 1080 can be disposed at a location separate from location 1002 or imaging system 1070, and accessed through the remote server at location 1002. Regardless of where they are located, they can be accessed directly by computing device 1020, through a network (either a wide area network or a local area network), hosted at a remote site by a service, provided as a service, or accessed by a connection service that resides in a remote location. Also, the data can be stored in substantially any location and intermittently accessed by, or forwarded to, interested parties. For instance, physical carriers can be used instead of, or in addition to, electromagnetic wave carriers.

[0144] It will also be noted that the elements of systems described herein, or portions of them, can be disposed on a wide variety of different devices. Some of those devices include servers, desktop computers, laptop computers, imbedded computer, industrial controllers, tablet computers, or other mobile devices, such as palm top computers, cell phones, smart phones, multimedia players, personal digital assistants, etc.

[0145] FIG. 11 is a block diagram of a computing environment that can be used in embodiments shown in previous Figures. Computing environment 1100 may be incorporated into, for example, a handheld deflectometry imaging system as described herein, or may be remote from a handheld deflectometry imaging system and process received images.

[0146] FIG. 11 is one example of a computing environment in which elements of systems and methods described herein, or parts of them (for example), can be deployed. With reference to FIG.11, an example system for implementing some embodiments includes a general-purpose computing device in the form of a computer 1110. Components of computer 1110 may include, but are not limited to, a processing unit 1120 (which can comprise a processor), a system memory 1130, and a system bus 1121 that couples various system components including the system memory to the processing unit 1120. The system bus 1121 may be any of several types of bus structures including a memory bus or memory controller, a peripheral bus, and a local bus using any of a variety of bus architectures. Memory and programs described with respect to systems and methods described herein can be deployed in corresponding portions of FIG. 11.

[0147] Computer 1110 typically includes a variety of computer readable media. Computer readable media can be any available media that can be accessed by computer 1110 and includes both volatile / nonvolatile media and removable / non-removable media. By way of example, and not limitation, computer readable media may comprise computer storage media and communication media. Computer storage media is different from, and does not include, a modulated data signal or carrier wave. It includes hardware storage media including both volatile / nonvolatile and removable / non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by computer 1110. Communication media may embody computer readable instructions, data structures, program modules or other data in a transport mechanism and includes any information delivery media. The term “modulated data signal” means a signal that has one or more of its characteristics set or changed in such a manner as to encode information in the signal.

[0148] The system memory 1130 includes computer storage media in the form of volatile and / or nonvolatile memory such as read only memory (ROM) 1131 and random access memory (RAM) 1132. A basic input / output system 1133 (BIOS) containing the basic routines that help to transfer information between elements within computer 1110, such as during start-up, is typically stored in ROM 1131. RAM 1132 typically contains data and / or program modules that are immediately accessible to and / or presently being operated on by processing unit 1120. By way of example, and not limitation, FIG. 11 illustrates operating system 1134, application programs 1135, other program modules 1136, and program data 1137.

[0149] The computer 1110 may also include other removable / non-removable and volatile / nonvolatile computer storage media. By way of example only, FIG. 11 illustrates a hard disk drive 1141 that reads from or writes to non-removable, nonvolatile magnetic media, nonvolatile magnetic disk 1152, an optical disk drive 1155, and nonvolatile optical disk 1156. The hard disk drive 1141 is typically connected to the system bus 1121 through a non-removable memory interface such as interface 1140, and optical disk drive 1155 are typically connected to the system bus 1121 by a removable memory interface, such as interface 1150.

[0150] Alternatively, or in addition, the functionality described herein can be performed, at least in part, by one or more hardware logic components. For example, and without limitation, illustrative types of hardware logic components that can be used include Field-programmable Gate Arrays (FPGAs), Application-specific Integrated Circuits (e.g., ASICs), Application-specific Standard Products (e.g., ASSPs), System-on-a-chip systems (SOCs), Complex Programmable Logic Devices (CPLDs), etc.

[0151] The drives and their associated computer storage media discussed above and illustrated in FIG. 11, provide storage of computer readable instructions, data structures, program modules and other data for the computer 1110. In FIG. 11, for example, hard disk drive 1141 is illustrated as storing operating system 1144, application programs 1145, other program modules 1146, and program data 1147. Note that these components can either be the same as or different from operating system 1134, application programs 1135, other program modules 1136, and program data 1137.

[0152] A user may enter commands and information into the computer 1110 through input devices such as a keyboard 1162, a microphone 1163, and a pointing device 1161, such as a mouse, trackball or touch pad. Other input devices (not shown) may include a joystick, game pad, satellite receiver, scanner, or the like. These and other input devices are often connected to the processing unit 1120 through a user input interface 1160 that is coupled to the system bus, but may be connected by other interface and bus structures. A visual display 1191 or other type of display device is also connected to the system bus 1121 via an interface, such as a video interface 1190. In addition to the monitor, computers may also include other peripheral output devices such as speakers 1197 and printer 1196, which may be connected through an output peripheral interface 1195.

[0153] The computer 1110 is operated in a networked environment using logical connections, such as a Local Area Network (LAN) or Wide Area Network (WAN) to one or more remote computers, such as a remote computer 1180.

[0154] When used in a LAN networking environment, the computer 1110 is connected to the LAN 1171 through a network interface or adapter 1170. When used in a WAN networkingenvironment, the computer 1110 typically includes a modem 1172 or other means for establishing communications over the WAN 1173, such as the Internet. In a networked environment, program modules may be stored in a remote memory storage device. FIG. 11 illustrates, for example, that remote application programs 1185 can reside on remote computer 1180.

[0155] A handheld imaging system for a surface includes a housing, a handle coupled to the housing, and an image capturing device configured to capture an image of the surface. The image capturing device is at least partially housed within the housing. The system also includes a light source that projects a static structured light pattern with a period and a dark-to-light ratio onto the surface. Additionally, the system includes a position detection mechanism that provides a detectable position indication of the image capturing device relative to the surface, and an alignment detection mechanism that provides a detectable alignment indication of the image capturing device relative to the surface. The surface is at least a partially specular surface.

[0156] The handheld imaging system can include a handle integrated into the housing.

[0157] The handheld imaging system can include a memory configured to store images captured by the image capturing device and processing circuitry communicatively coupled to the memory. The processing circuitry can detect, based on the position detection mechanism, that the image capturing device is at a set distance from the surface, detect, based on the alignment detection mechanism, that the image capturing device is in a set alignment with the surface, and generate a control signal for the image capturing device to capture the image.

[0158] The image capturing device can be configured to automatically capture the image based on the generated control signal.

[0159] The position detection mechanism can include a laser, and the detectable position indication can include a laser point on the surface from a laser beam emitted by the laser.

[0160] The position detection mechanism can include a first laser and a second laser.

[0161] The first laser can be in a first position of the housing at a first angle with respect to the housing, and the second laser can be in a second position of the housing at a second angle with respect to the housing. The first and second lasers can be angled with respect to each other.

[0162] The first laser can generate a first beam, the second laser can generate a second beam, and the first and second laser beams can cross in front of the imaging device.

[0163] The position detection mechanism can include a relative distance between the first beam and the second beam on the surface.

[0164] The handheld imaging device can include a third laser at a third position. The alignment detection mechanism can include the third laser, and the third laser can be spaced apart from a hypothetical straight line containing the first and second lasers.

[0165] The alignment detection mechanism can include a laser detector detecting a reflected beam of the first laser from the surface.

[0166] The laser detector can include an image analyzer coupled to the image capturing device.

[0167] The laser detector can include an image analyzer coupled to a second image capturing device.

[0168] The position detection mechanism can include a sonar sensor.

[0169] The position detection mechanism can include a fiducial detector configured to detect a fiducial on the surface.

[0170] The handheld imaging device can include a rolling gantry and a gimbal configured to allow for movement of the image capturing device in six degrees of freedom.

[0171] The handheld imaging device can include an accelerometer.

[0172] The handheld imaging device can include a movement detector configured to, based on a signal from the accelerometer, detect movement of the handheld imaging device from a first position to a second position.

[0173] The handheld imaging device can include a radar-sensitive fiducial configured to provide an indication of a position or alignment of the handheld imaging device.

[0174] The processing circuitry can be communicably coupled to the handheld imaging system.

[0175] The processing circuitry can be coupled to the handheld imaging system by a wired coupling.

[0176] An exposure of the image capturing device can be set to less than 5 ms.

[0177] A gain of the image capturing device can be set to between about 0 and 8.

[0178] The image capturing device can be configured to automatically capture the image based on the position and the alignment.

[0179] The image capturing device can be configured to automatically capture a second image after a time delay.

[0180] The control signal can include a signal to capture multiple images.

[0181] The control signal can be sent based on a comparison of a received intensity of the position detection mechanism to an intensity threshold.

[0182] The position detection mechanism can include a photo-diode sensor.

[0183] The alignment detection mechanism can also include the photo-diode sensor.

[0184] The handheld imaging system can include a LIDAR system, wherein the LIDAR system is the position detection mechanism and the alignment mechanism.

[0185] The position detection mechanism or the alignment mechanism can include an ultrasonic sensor.

[0186] The position detection mechanism or the alignment mechanism can include an IR-based sensor.

[0187] The handheld imaging system can include an impedance sensor.

[0188] The image capturing device can be remote from the processing circuitry.

[0189] The housing can include an edge processing unit, wherein the edge processing unit performs at least some of the functionality of the processing circuitry.

[0190] The image capturing device can be configured to communicate with the processing circuitry using a wireless communication protocol.

[0191] The handheld imaging system can include a light source adjustment mechanism configured to adjust a projected light pattern on the surface.

[0192] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0193] The light source adjustment mechanism can be configured to automatically adjust the relative position of the light source to the static structure in response to the image being captured.

[0194] The image can be a first image, captured with the light source at a first relative position, and the image capturing device can be configured to automatically capture a second image, with the light source at a second relative position, the second relative position being different from the first relative position.

[0195] The image capturing device can be configured to face a different direction than the light source. The handheld imaging system can include a mirror, wherein the image capturing device is oriented to face the mirror, such that light reflected from the surface is redirected from the mirror to a lens of the image capturing device.

[0196] The static structured light pattern can be formed by a diffuser grid placed between the light and the surface.

[0197] The static structured light pattern can be projected onto the surface by the light source.

[0198] The image capturing device can be configured to capture an image through the light source.

[0199] The light source can include an aperture aligned with a lens of the image capturing device.

[0200] The handheld imaging system can include an image capturing device settings adjuster configured to automatically adjust a device setting, the device setting including a focus, an exposure, or a gain of the image capturing device.

[0201] The image capturing device settings adjuster can be configured to automatically adjust the device setting based on a detected distance between the image capturing device and the surface.

[0202] The handheld imaging system can include a defect detector configured to, based on the image, detect a defect on the surface.

[0203] The handheld imaging system can include a surface characterizer configured to detect a surface characteristic near the detected defect.

[0204] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0205] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0206] The surface can be a specular surface.

[0207] The surface can be a partially specular surface.

[0208] A handheld imaging system for a surface includes a housing, a handle coupled to the housing, and an image capturing device configured to capture an image of the surface. The image capturing device is at least partially housed within the housing. The system also includes a light source that projects a static structured light pattern with a period and a dark-to-light ratio onto the surface. Additionally, the system includes a position detection mechanism that provides a detectable position indication of the image capturing device relative to the surface, and an alignment detection mechanism that provides a detectable alignment indication of the image capturing device relative to the surface. The system further includes a memory configured to store images captured by the image capturing device and processing circuitry communicatively coupled to the memory. The processing circuitry detects, based on the position detection mechanism, that the image capturing device is at a set distance from the surface, detects, based on the alignment detection mechanism, that the image capturing device is in a set alignment with the surface, generates a control signal for the image capturing device to automatically capture the image based on the detection that the image capturing device is at the set distance in the set alignment, and detects, based on the captured image, a defect on the surface.

[0209] The handle can be integrated into the housing.

[0210] The image capturing device can be configured to automatically capture the image based on the generated control signal.

[0211] The position detection mechanism can include a first laser and a second laser, with the first laser being in a first position of the housing at a first angle with respect to the housing, and the second laser being in a second position of the housing at a second angle with respect to the housing. The first and second lasers are angled with respect to each other.

[0212] The first laser can generate a first beam, the second laser can generate a second beam, and the first and second laser beams can cross in front of the image capturing device.

[0213] The position detection mechanism can include a relative distance between the first beam and the second beam on the surface.

[0214] The alignment detection mechanism can include a third laser at a third position, with the third laser being configured to provide an indication of alignment when the third laser beam intersects with the first and second laser beams.

[0215] The alignment detection mechanism can include a laser detector configured to detect a reflected beam of the first laser from the surface.

[0216] The laser detector can include an image analyzer coupled to the image capturing device, with the image analyzer being configured to detect the laser beam on the surface in a field of view of the image capturing device.

[0217] The position detection mechanism can include a sonar sensor.

[0218] The position detection mechanism can include a fiducial detector configured to detect a fiducial on the surface.

[0219] The handheld imaging system can include a rolling gantry and a gimbal configured to allow for movement of the image capturing device in six degrees of freedom.

[0220] The handheld imaging system can include an accelerometer.

[0221] The handheld imaging system can include a movement detector configured to, based on a signal from the accelerometer, detect movement of the handheld imaging device from a first position to a second position.

[0222] The handheld imaging system can include a radar-sensitive fiducial configured to provide an indication of a position or alignment of the handheld imaging device.

[0223] An exposure of the image capturing device can be set to less than 5 ms.

[0224] A gain of the image capturing device can be set to about 3.0.

[0225] The image capturing device can be configured to automatically capture a second image after a time delay.

[0226] The control signal can include a signal to capture multiple images.

[0227] The control signal can be sent based on a comparison of a received intensity of the position detection mechanism to an intensity threshold.

[0228] The position detection mechanism can include a photo-diode sensor.

[0229] The alignment detection mechanism can also include the photo-diode sensor.

[0230] The handheld imaging system can include a LIDAR system, wherein the LIDAR system is the position detection mechanism or the alignment mechanism.

[0231] The position detection mechanism or the alignment mechanism can include an ultrasonic sensor, an IR-based sensor, or an impedance sensor.

[0232] The housing can include an edge processing unit, wherein the edge processing unit performs at least some of the functionality of the processing circuitry.

[0233] The image capturing device can be configured to communicate with the processing circuitry using a wireless communication protocol.

[0234] The handheld imaging system can include a light source adjustment mechanism configured to adjust a projected light pattern on the surface.

[0235] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0236] The light source adjustment mechanism can be configured to automatically adjust the relative position of the light source to the static structure in response to the image being captured.

[0237] The image can be a first image, captured with the light source at a first relative position, and the image capturing device can be configured to automatically capture a second image, with the light source at a second relative position, the second relative position being different from the first relative position.

[0238] The image capturing device can be configured to face a different direction than the light source. The handheld imaging system can include a mirror, wherein the image capturing device is oriented to face the mirror, such that light reflected from the surface is redirected from the mirror to a lens of the image capturing device.

[0239] The static structured light pattern can be formed by a diffuser grid placed between the light and the surface.

[0240] The static structured light pattern can be projected onto the surface by the light source.

[0241] The image capturing device can be configured to capture an image through the light source.

[0242] The light source can include an aperture aligned with a lens of the image capturing device.

[0243] The handheld imaging system can include an image capturing device settings adjuster configured to automatically adjust a device setting, the device setting including a focus, an exposure, or a gain of the image capturing device.

[0244] The image capturing device settings adjuster can be configured to automatically adjust the device setting based on a detected distance between the image capturing device and the surface.

[0245] The handheld imaging system can include a defect detector configured to, based on the image, detect a defect on the surface.

[0246] The handheld imaging system can include a surface characterizer configured to detect a surface characteristic near the detected defect.

[0247] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0248] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0249] The surface can be a specular surface.

[0250] The surface can be a partially specular surface.

[0251] A method for capturing an image of a surface using a handheld imaging system includes detecting a position indication indicative of a relative position of the handheld imaging system with respect to the surface using a position detection mechanism, the handheld imaging system including a housing, and the position detection mechanism being coupled to the housing. The method also includes detecting an alignment of the handheld imaging system relative to the surface using an alignment detection mechanism, the alignment detection mechanism being coupled to the housing. The method further includes detecting, based on a comparison of the position indication to a distance indication indicative of a set distance, that the handheld imaging system is at a set distance from the surface, detecting, based on the alignment detection mechanism, that the handheld imaging system is in a set alignment with the surface, generating a control signal for an image capturing device of the handheld imaging system to capture an image, based on the detected position and alignment, and automatically capturing the image of the surface using the image capturing device based on the generated control signal. Capturing also includes illuminating the surface with a light source, the light source including a static structured light pattern such that the static structured light pattern is projected onto the surface, wherein the static structured light pattern has a period and a dark-to-light ratio, and the image capturing device and the light source are at least partially housed by the housing.

[0252] The method can include analyzing the captured image, using a defect detection system, to detect a defect on the surface.

[0253] The position detection mechanism can include a first laser and a second laser, and detecting the position indication can include causing the first and second lasers to emit a first and second laser beam, the first laser being coupled to the housing in a first position, at a first angle with respect to the housing, and the second laser being coupled to the housing, in a second position, at a second angle with respect to the housing, wherein the first and second lasers are angled with respect to each other, detecting the intersection of the first and second laser beams with the surface, and measuring a distance between the first and second laser beams on the surface.

[0254] Detecting the intersection can include detecting, using a field of view analyzer, that the first and second laser beams are within a field of view of a camera.

[0255] The camera can be the image capturing device, and the field of view analyzer can include processing circuitry communicably coupled to the handheld imaging system, wherein generating the control signal includes the processing circuitry generating the control signal.

[0256] Detecting the alignment can include detecting a third laser beam contacting the surface, the third laser beam emanating from a third laser coupled to the housing in a third position.

[0257] Detecting the alignment can include detecting a laser beam contacting the surface using a laser detector to detect a reflected beam of a laser from the surface, the laser being coupled to the housing.

[0258] The position detection mechanism can include a sonar sensor, wherein the sonar sensor is coupled to the housing.

[0259] Detecting the relative position can include a fiducial detector, coupled to the housing, to detect a fiducial on the surface.

[0260] The handheld imaging system can include a rolling gantry and a gimbal to allow for movement in six degrees of freedom.

[0261] The method can include detecting movement of the handheld imaging system from a first position to a second position using an accelerometer.

[0262] Detecting the relative position or the alignment can include using a radar-sensitive fiducial.

[0263] Capturing the image can include setting an exposure of the image capturing device to less than 5 ms.

[0264] Capturing the image can include setting a gain of the image capturing device to about 3.0.

[0265] The method can include automatically capturing a second image after a time delay.

[0266] Generating the control signal can include generating a signal to capture multiple images.

[0267] Generating the control signal can include comparing a received intensity of the detected position indication to an intensity threshold.

[0268] Positioning the handheld imaging system can include using a photo-diode sensor.

[0269] Aligning the handheld imaging system can also include using the photo-diode sensor.

[0270] The position detection mechanism or the alignment mechanism can include a LIDAR system, an ultrasonic sensor, an IR-based sensor, or an impedance sensor.

[0271] The method can include adjusting a setting of the light source using a light source adjustment mechanism, wherein adjusting a setting of the light source also adjusts a projected light pattern on the surface.

[0272] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0273] Illuminating the source can include the light source projecting the static structured light pattern onto the surface.

[0274] Capturing can include the image capturing device capturing the image through the light source.

[0275] The method can include detecting, based on the image, using a defect detector, a defect on the surface, and detecting, based on the image, using a surface characterizer, a surface characteristic near the detected defect.

[0276] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0277] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0278] The surface can be a specular surface.

[0279] The surface can be a partially specular surface.

[0280] A method of capturing images of a surface includes providing a handheld imaging system for the surface. The system includes a housing, a handle coupled to the housing, an image capturing device configured to capture an image of the surface, wherein the image capturing device is at least partially housed within the housing, a light source comprising a static structured light pattern having a fringe period and a dark-to-light ratio, the light source being at least partially housed within the housing, a position detection mechanism configured to provide a detectable position indication of a position of the image capturing device relative to the surface, the position detection mechanism being coupled to the housing, and an alignment detection mechanism configured to provide a detectable alignment indication of the image capturing device relative to the surface, the alignment detection mechanism being coupled to the housing. The method includes detecting, using the position detection mechanism, that the image capturing device is at a set distance from the surface, detecting, using the alignment detection mechanism, that the image capturing device is in a set alignment with the surface, generating a control signal for the image capturing device to automatically capture the image based on the detected position and alignment, capturing the image of the surface using the image capturing device in response to the control signal, storing the captured image in a memory communicatively coupled to the image capturing device, and analyzing the captured image to detect a defect on the surface.

[0281] The position detection mechanism can include a laser, the laser being coupled to the housing at a first position, and a laser beam detector, wherein the laser beam detector includes a field of view analyzer configured to detect a laser beam emitted by the laser on the surface within a field of view of a camera.

[0282] The laser can be a first laser, and the position detection mechanism can further include a second laser, the second laser being coupled to the housing, at a second position, wherein the laser beam detector is configured to detect a second laser beam emitted by the second laser on the surface within the field of view of the camera.

[0283] The first and second lasers can be coupled to the housing such that they are angled with respect to each other.

[0284] The camera can be the image capturing device.

[0285] The field of view analyzer can be remote from, but communicably coupled to, the image capturing device.

[0286] The position detection mechanism can include a relative distance between the first beam and the second beam on the surface.

[0287] The alignment detection mechanism can include a laser detector detecting a beam from an alignment laser on the surface.

[0288] The laser detector can include an image analyzer coupled to the image capturing device.

[0289] The position detection mechanism can include a sonar sensor.

[0290] The position detection mechanism can include a fiducial detector configured to detect a fiducial on the surface.

[0291] The handheld imaging system can include a rolling gantry and a gimbal configured to allow for movement of the image capturing device in six degrees of freedom.

[0292] The handheld imaging system can include an accelerometer.

[0293] The method can include detecting movement of the handheld imaging system from a first position to a second position based on a signal from the accelerometer.

[0294] The method can include a radar-sensitive fiducial configured to provide an indication of the detectable position or an indication of the detectable alignment of the handheld imaging device.

[0295] The control signal can include a signal to capture multiple images.

[0296] The control signal can be sent based on a comparison of a received intensity of the position detection mechanism to an intensity threshold.

[0297] The image capturing device can be configured to automatically capture a second image after a time delay.

[0298] The position detection mechanism can include a photo-diode sensor.

[0299] The alignment detection mechanism can also include the photo-diode sensor.

[0300] The position detection mechanism or the alignment mechanism can include a LIDAR system, an ultrasonic sensor, an IR-based sensor, or an impedance sensor.

[0301] The method can include adjusting a setting of the light source using a light source adjustment mechanism, wherein adjusting a setting of the light source also adjusts a projected light pattern on the surface.

[0302] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0303] Illuminating the source can include the light source projecting the static structured light pattern onto the surface.

[0304] Capturing can include the image capturing device capturing the image through the light source.

[0305] The method can include detecting, based on the image, using a defect detector, a defect on the surface, and detecting, based on the image, using a surface characterizer, a surface characteristic near the detected defect.

[0306] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0307] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0308] The surface can be a specular surface.

[0309] The surface can be a partially specular surface.

[0310] A method of imaging a surface using a handheld imaging system includes providing a handheld imaging system comprising a housing, a handle coupled to the housing, an image capturing device at least partially housed within the housing, a light source, a position detection mechanism, and an alignment detection mechanism. The method includes illuminating the surface with the light source, wherein illuminating includes projecting a static structured light pattern onto the surface, detecting a position of the image capturing device relative to the surface using the position detection mechanism, wherein detection includes the position detection mechanism detecting, within a field of view of the image capturing device, a first indication and a second indication on the surface, detecting an alignment of the image capturing device relative to the surface using the alignment detection mechanism, wherein detecting includes the alignment detection mechanism detecting a third indication within the field of view on the surface, and based on detection of the relative position and the alignment, automatically causing the image capturing device to capture an image of the surface using the image capturing device.

[0311] The first, second, and third indications can be reflections from a first, second, and third laser coupled to the handheld imaging system.

[0312] The method can include detecting, using the position detection mechanism, that the image capturing device is at a set distance from the surface, detecting, based on the alignmentdetection mechanism, that the image capturing device is in a set alignment with the surface, generating a control signal for the image capturing device to capture the image, and storing the captured image in a memory.

[0313] The image capturing device can automatically capture the image based on the generated control signal.

[0314] The first laser can be in a first position of the housing, at a first angle with respect to the housing, the second laser can be in a second position of the housing, at a second angle with respect to the housing, and the first and second lasers can be angled with respect to each other.

[0315] The first laser can generate a first beam, the second laser can generate a second beam, and the first and second laser beams can cross in front of the imaging device.

[0316] The position detection mechanism can include detecting a relative distance between the first beam and the second beam on the surface.

[0317] The alignment detection mechanism can include a laser detector detecting a reflected beam of the third laser from the surface.

[0318] The first and second indications can include a first and second fiducial on the surface.

[0319] The handheld imaging system can include an accelerometer.

[0320] The method can include detecting movement of the handheld imaging system from a first position to a second position based on a signal from the accelerometer.

[0321] The steps of detecting a position and detecting an alignment can be performed by processing circuitry that is communicably coupled to the handheld imaging system.

[0322] The processing circuitry can be coupled to the handheld imaging system by a wired coupling.

[0323] An exposure of the image capturing device can be set to less than 5 ms.

[0324] A gain of the image capturing device can be set to between 0-8.

[0325] The method can include the processing circuitry sending a control signal for the image capturing device to automatically capture the image based on the position and the alignment.

[0326] The method can include the processing circuitry sending a second control signal for the image capturing device to automatically capture a second image after a time delay.

[0327] The method can include comparing a received intensity of the detected first and second indication to a threshold intensity, and sending the control signal based on the comparison.

[0328] The position detection mechanism or the alignment mechanism can include a LIDAR system, an ultrasonic sensor, an IR-based sensor, or an impedance sensor.

[0329] The method can include adjusting a setting of the light source using a light source adjustment mechanism, wherein adjusting a setting of the light source also adjusts a projected light pattern on the surface.

[0330] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0331] Illuminating the source can include the light source projecting the static structured light pattern onto the surface.

[0332] Capturing can include the image capturing device capturing the image through the light source.

[0333] The method can include detecting, based on the image, using a defect detector, a defect on the surface, and detecting, based on the image, using a surface characterizer, a surface characteristic near the detected defect.

[0334] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0335] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0336] The surface can be a specular surface.

[0337] The surface can be a partially specular surface.

[0338] A system for detecting defects on a surface includes a housing, a handle coupled to the housing, and an image capturing device configured to capture an image of the surface. The image capturing device is at least partially housed within the housing. The system also includes a light source that projects a static structured light pattern, a position detection mechanism configured to detect a position indication indicative of a relative position of the image capturing device relative to the surface, and an alignment detection mechanism configured to detect an alignment indication indicative of an alignment of the image capturing device relative to the surface. The system further includes a memory configured to store images captured by the image capturing device and processing circuitry communicatively coupled to the memory. The processing circuitry detects, based on the position indication, that the image capturing device is at a set distance from the surface, detects, based on the alignment detection mechanism, that the image capturing device is in a set alignment with the surface, generates a control signal for the image capturing device to capture the image, wherein the image capturing device is configured to capture the image automatically based on the control signal, and analyzes the captured image to detect a defect on the surface.

[0339] The handle can be integrated into the housing.

[0340] The image capturing device can be configured to automatically capture the image based on the generated control signal.

[0341] The system can include a laser coupled to the housing, wherein the position indication includes a reflected beam from the laser, and detecting that the image capturing device is at a set distance includes measuring an intensity of the reflected beam.

[0342] The system can include a first and second laser coupled to the housing, wherein the position indication includes a first and second beam from the first and second lasers, and detecting that the image capturing device is at a set distance includes detecting a distance between the first and second laser beams on the surface.

[0343] The laser can be a first laser, and the position detection mechanism can include a second laser.

[0344] The first laser can be in a first position of the housing, at a first angle with respect to the housing, and the second laser can be in a second position of the housing, at a second angle with respect to the housing. The first and second lasers can be angled with respect to each other.

[0345] The system can include a third laser at a third position, wherein the alignment detection mechanism includes the third laser.

[0346] The position detection mechanism can include a sonar sensor.

[0347] The position detection mechanism can include a fiducial detector configured to detect a fiducial on the surface.

[0348] The system can include a rolling gantry and a gimbal configured to allow for movement of the image capturing device in six degrees of freedom.

[0349] The system can include an accelerometer.

[0350] The system can include a movement detector configured to, based on a signal from the accelerometer, detect movement of the handheld imaging device from a first position to a second position.

[0351] The system can include a radar-sensitive fiducial configured to provide the position indication or the alignment indication of the handheld imaging device.

[0352] The processing circuitry can be communicably coupled to the handheld imaging system.

[0353] The processing circuitry can be coupled to the handheld imaging system by a wired coupling.

[0354] An exposure of the image capturing device can be set to less than 5 ms.

[0355] A gain of the image capturing device can be set to about 3.0.

[0356] The processing circuitry can be configured to automatically send a control signal to capture a second image after a time delay.

[0357] The control signal can include a signal to capture multiple images.

[0358] The control signal can be sent based on a comparison of a received intensity of the position indication or alignment indication to an intensity threshold.

[0359] The position detection mechanism can include a photo-diode sensor.

[0360] The alignment detection mechanism can also include the photo-diode sensor.

[0361] The position detection mechanism or the alignment mechanism can include a LIDAR system, an ultrasonic sensor, an IR-based sensor, or an impedance sensor.

[0362] The image capturing device can be remote from the processing circuitry.

[0363] The housing can include an edge processing unit, wherein the edge processing unit performs at least some of the functionality of the processing circuitry.

[0364] The image capturing device can be configured to communicate with the processing circuitry using a wireless communication protocol.

[0365] The system can include a light source adjustment mechanism configured to adjust a projected light pattern on the surface.

[0366] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0367] The light source adjustment mechanism can be configured to automatically adjust the relative position of the light source to the static structure in response to the image being captured.

[0368] The image can be a first image, captured with the light source at a first relative position, and the image capturing device can be configured to automatically capture a second image, with the light source at a second relative position, the second relative position being different from the first relative position.

[0369] The image capturing device can be configured to face a different direction than the light source. The system can include a mirror, wherein the image capturing device is oriented to face the mirror, such that light reflected from the surface is redirected from the mirror to a lens of the image capturing device.

[0370] The static structured light pattern can be formed by a diffuser grid placed between the light and the surface.

[0371] The static structured light pattern can be projected onto the surface by the light source.

[0372] The image capturing device can be configured to capture an image through the light source.

[0373] The light source can include an aperture aligned with a lens of the image capturing device.

[0374] The system can include an image capturing device settings adjuster configured to automatically adjust a device setting, the device setting including a focus, an exposure, or a gain of the image capturing device.

[0375] The image capturing device settings adjuster can be configured to automatically adjust the device setting based on a detected distance between the image capturing device and the surface.

[0376] The system can include a defect detector configured to, based on the image, detect a defect on the surface.

[0377] The system can include a surface characterizer configured to detect a surface characteristic near the detected defect.

[0378] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0379] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0380] The surface can be a specular surface.

[0381] The surface can be a partially specular surface.

[0382] At least one non-transitory computer-readable medium stores instructions that, when executed, configure at least one processor to detect, using a position detection mechanism, that an image capturing device is at a set distance from a surface, wherein the position detection mechanism is physically coupled to the image capturing device. The instructions also configure the processor to detect, using an alignment detection mechanism, that the image capturing device is in a set alignment with the surface, wherein the alignment detection mechanism is physically coupled to the image capturing device. The instructions further configure the processor to generate a control signal for a light source physically coupled to the image capturing device to illuminate the surface, wherein the light source includes a static structured light pattern having a period and a dark-to-light ratio, generate a control signal for the image capturing device to capture an image based on the detection that the image capturing device is at the set distance and in the set alignment, automatically capture the image of the surface using the image capturing device in response to the control signal, and analyze the captured image and detect defects on the surface based on a distortion in the reflected static structured light pattern in the captured image.

[0383] The position detection mechanism can include a laser.

[0384] The laser can be a first laser, and the position detection mechanism can further include a second laser.

[0385] The first laser can be in a first position of the housing, at a first angle with respect to the housing, and the second laser can be in a second position of the housing, at a second angle with respect to the housing. The first and second lasers can be angled with respect to each other.

[0386] The first laser can generate a first beam, the second laser can generate a second beam, and the first and second laser beams can cross in front of the imaging device.

[0387] The position detection mechanism can include a relative distance between the first beam and the second beam on the surface.

[0388] The alignment detection mechanism can include a laser detector detecting a reflected beam from the surface.

[0389] The laser detector can include an image analyzer coupled to the image capturing device.

[0390] The position detection mechanism can include a sonar sensor.

[0391] The position detection mechanism can include a fiducial detector configured to detect a fiducial on the surface.

[0392] The non-transitory computer-readable medium can include instructions to control a rolling gantry and a gimbal configured to allow for movement of the image capturing device in six degrees of freedom.

[0393] The non-transitory computer-readable medium can include instructions to control an accelerometer.

[0394] The non-transitory computer-readable medium can include instructions to control a movement detector configured to, based on a signal from the accelerometer, detect movement of the handheld imaging device from a first position to a second position.

[0395] The non-transitory computer-readable medium can include instructions to control a radar-sensitive fiducial configured to provide an indication of a position or alignment of the handheld imaging device.

[0396] The control signal can include a signal to capture multiple images.

[0397] The control signal can be sent based on a comparison of a received intensity of the position detection mechanism to an intensity threshold.

[0398] The image capturing device can be configured to automatically capture the image based on the position and the alignment.

[0399] The image capturing device can be configured to automatically capture a second image after a time delay.

[0400] The position detection mechanism can include a photo-diode sensor.

[0401] The alignment detection mechanism can also include the photo-diode sensor.

[0402] The position detection mechanism or the alignment mechanism can include a LIDAR system, an ultrasonic sensor, an IR-based sensor, or an impedance sensor.

[0403] The non-transitory computer-readable medium can include instructions to adjust a setting of the light source using a light source adjustment mechanism, wherein adjusting a setting of the light source also adjusts a projected light pattern on the surface.

[0404] The light source adjustment mechanism can adjust a relative position of the light source to the static structured light pattern.

[0405] Illuminating the source can include the light source projecting the static structured light pattern onto the surface.

[0406] Capturing can include the image capturing device capturing the image through the light source.

[0407] The non-transitory computer-readable medium can include instructions to detect, based on the image, using a defect detector, a defect on the surface, and detect, based on the image, using a surface characterizer, a surface characteristic near the detected defect.

[0408] The defect detector can detect a defect characteristic of the defect, wherein the defect characteristic includes a defect type, a defect size, or a defect volume.

[0409] The surface characteristic can include a local curvature, a color of the surface, a metallic flake density of the surface, a haze severity, or an orange peel measurement of the surface.

[0410] The surface can be a specular surface.

[0411] The surface can be a partially specular surface.

Claims

CLAIMSWhat is claimed is:

1. A handheld imaging system for a surface, the system comprising:a housing;a handle coupled to the housing;an image capturing device configured to capture an image of the surface, wherein the image capturing device is at least partially housed within the housing;a light source comprising a static structured light pattern, the static structured light pattern having a period and a dark-to-light ratio;a position detection mechanism configured to provide a detectable position indication of a position of the image capturing device relative to the surface;an alignment detection mechanism configured to provide a detectable alignment indication of the image capturing device relative to the surface; andwherein the surface is at least a partially specular surface.

2. The handheld imaging system of claim 1, and further comprising a handle integrated into housing.

3. The handheld imaging system of claim 1, and further comprising:a memory configured to store images captured by the image capturing device; and processing circuitry communicatively coupled to the memory, the processing circuitry being configured to:detect, based on the position detection mechanism, that the image capturing device is at a set distance from the surface;detect, based on the alignment detection mechanism, that the image capturing device is in a set alignment with the surface; andgenerate a control signal for the image capturing device to capture the image.

4. The handheld imaging system of claim 3, wherein the image capturing device is configured to automatically capture the image based on the generated control signal.

5. The handheld imaging system of any of claims 1-4, wherein the position detection mechanism comprises a laser, and wherein the detectable position indication comprises a laser point on the surface from a laser beam emitted by the laser.

6. The handheld imaging system of claim 5, wherein the laser is a first laser, and wherein the position detection mechanism comprises a second laser.

7. The handheld imaging system of claim 6. wherein the first laser is in a first position of the housing, at a first angle with respect to the housing, wherein the second laser is in a second position of the housing, at a second angle with respect to the housing, and wherein the first and second lasers are angled with respect to each other.

8. The handheld imaging system of claim 7, wherein the first laser is configured to generate a first beam, the second laser is configured to generate a second beam, and wherein the first and second laser beams are configured to cross in front of the imaging device.

9. The handheld imaging device of claim 8, wherein the position detection mechanism comprises a relative distance between the first beam and the second beam, on the surface. position detection mechanism.

10. The handheld imaging device of claim 7, and further comprising a third laser, at a third position, wherein the alignment detection mechanism comprises the third laser, and wherein the third laser is spaced apart from a hypothetical straight line containing the first and second lasers.

11. The handheld imaging device of claim 5, wherein the alignment detection mechanism comprises a laser detector detecting a reflected beam of the first laser from the surface.

12. The handheld imaging device of claim 10, wherein the alignment detection mechanism comprises a laser detector detecting a reflected beam of the third laser from the surface.

13. The handheld imaging device of claim 11, wherein the laser detector comprises an image analyzer coupled to the image capturing device.

14. The handheld imaging device of claim 11, wherein the laser detector comprises an image analyzer coupled to a second image capturing device.

15. The handheld imaging device of any of claims 1-14, wherein the position detection mechanism comprises a sonar sensor.

16. The handheld imaging device of any of claims 1-15, wherein the position detection mechanism comprises a fiducial detector configured to detect a fiducial on the surface.

17. The handheld imaging system of any of claims 3-16, wherein the image capturing device is remote from the processing circuitry.

18. The handheld imaging system of any of claims 1-17, wherein the housing comprises an edge processing unit, wherein the edge processing unit performs at least some of the functionality of the processing circuitry.

19. The handheld imaging system of any of claims 1-18, and further comprising a light source adjustment mechanism configured to adjust a projected light pattern on the surface.

20. The handheld imaging system of any of claims 1-19, and further comprising an image capturing device settings adjuster configured to automatically adjust a device setting, the device setting comprising a focus, an exposure, or a gain of the image capturing device.

21. The handheld imaging system of any of claims 1-20, and further comprising:a defect detector configured to, based on the image, detect a defect on the surface.

22. The handheld imaging system of claim 21, and further comprising:a surface characterizer configured to detect a surface characteristic near the detected defect.

23. The handheld imaging system of claim 21, wherein the defect detector detects a defect characteristic of the defect, wherein the defect characteristic comprises a defect type, a defect size, or a defect volume.

24. A method for capturing an image of a surface using a handheld imaging system, the method comprising:detecting a position indication indicative of a relative position of the handheld imaging system with respect to the surface using a position detection mechanism, the handheld imaging system comprising a housing, and wherein the position detection mechanism is coupled to the housing;detecting an alignment of the handheld imaging system relative to the surface using an alignment detection mechanism, wherein the alignment detection mechanism is coupled to the housing;detecting, based on a comparison of the position indication to a distance indication indicative of a set distance, that the handheld imaging system is at a set distance from the surface;detecting, based on the alignment detection mechanism, that the handheld imaging system is in a set alignment with the surface;generating a control signal for an image capturing device of the handheld imaging system to capture an image, based on the detected position and alignment; and automatically capturing the image of the surface using the image capturing device based on the generated control signal, wherein capturing also comprises illuminating the surface with a light source, the light source comprising a static structured light pattern such that the static structured light pattern is projected onto the surface, wherein the static structured light pattern has a period and a dark-to-light ratio, wherein the image capturing device and the light source are at least partially housed by the housing.

25. The method of claim 24, further comprising:analyzing the captured image, using defect detection system, to detect a defect on the surface.

26. The method of claim 24 or 25, wherein the position detection mechanism comprises a first laser and a second laser, and wherein detecting the position indication comprises:causing the first and second lasers to emit a first and second laser beam, the first laser being coupled to the housing in a first position, at a first angle with respect to the housing, and the second laser being coupled to the housing, in a second position, at a second angle with respect to the housing, wherein the first and second lasers are angled with respect to each other;detecting the intersection of the first and second laser beams with the surface; and measuring a distance between the first and second laser beams on the surface.

27. The method of claim 26, wherein detecting the intersection comprises detecting, using an field of view analyzer, that the first and second laser beams are within a field of view of a camera.

28. The method of claim 27, wherein the camera is the image capturing device, and wherein the field of view analyzer comprises processing circuitry communicably coupled to the handheldimaging system, wherein generating the control signal comprises the processing circuitry generating the control signal.

29. The method of any of claims 24-28, and further comprising adjusting a setting of the light source, using a light source adjustment mechanism, wherein adjusting a setting of the light source also adjusts a projected light pattern on the surface.

30. The method of any of claims 29, wherein the light source adjustment mechanism adjusts a relative position of the light source to the static structured light pattern.

31. The method of any of claims 24-30, wherein illuminating the source comprises the light source projecting the static structured light pattern onto the surface.

32. The method of any of claims 24-31 , wherein capturing comprises the image capturing device capturing the image through the light source.

33. The method of any of claims 24-32, and further comprising:detecting, based on the image, using a defect detector, a defect on the surface; anddetecting, based on the image, using a surface characterizer, a surface characteristic near the detected defect.

34. The method of claim 33, wherein the defect detector detects a defect characteristic of the defect, wherein the defect characteristic comprises a defect type, a defect size, or a defect volume.

35. The method of any of claims 24-34, wherein the surface is a specular surface.

36. The method of any of claims 24-35, wherein the surface is a partially specular surface.

37. A system for detecting defects on a surface, the system comprising:a housing;a handle coupled to the housing;an image capturing device configured to capture an image of the surface, wherein the image capturing device is at least partially housed within the housing;a light source comprising a static structured light pattern;a position detection mechanism configured to detect a position indication indicative of a relative position of the image capturing device relative to the surface; an alignment detection mechanism configured to detect an alignment indication indicative of an alignment of the image capturing device relative to the surface; a memory configured to store images captured by the image capturing device; and processing circuitry communicatively coupled to the memory, the processing circuitry being configured to:detect, based on the position indication, that the image capturing device is at a set distance from the surface;detect, based on the alignment detection mechanism, that the image capturing device is in a set alignment with the surface;generate a control signal for the image capturing device to capture the image, wherein the image capturing device is configured to capture the image automatically based on the control signal; andanalyze the captured image to detect a defect on the surface.

38. The system of claim 37, wherein the handle is integrated into the housing.

39. The system of any of claims 37-38, wherein the system comprises a laser coupled to the housing, wherein the position indication comprises a reflected beam from the laser, and wherein detecting that the image capturing device is at a set distance comprises measuring an intensity of the reflected beam.

40. The system of claim 39, wherein the system comprises a first and second laser coupled to the housing, wherein the position indication comprises a first and second beam from the first and second lasers, and wherein detecting that the image capturing device is at a set distance comprises detecting a distance between the first and second laser beams on the surface.

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