A co-path shear interferometric imaging system and method with independent adjustable shear and carrier frequencies
By using a common-path shear interferometry imaging system with independent control of shear quantity and carrier frequency, the problem of entanglement between shear quantity and spatial carrier frequency in collinear common-path systems is solved, enabling high-precision and wide-range measurement of complex surfaces or deformations, suitable for industrial environments.
Patent Information
- Application Number
- CN202310003555.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-01-03
- Publication Date
- 2026-03-17
- Estimated Expiration
- 2043-01-03
AI Technical Summary
Existing collinear shear interferometry systems struggle to achieve independent control of shear quantity and spatial carrier frequency, resulting in limitations in accuracy and range for measuring complex surface shapes or deformations.
A common-path shearing interferometric imaging system with independently adjustable shearing and carrier frequency is adopted. By adjusting the distance between the Wollaston prism and the intermediate real image plane and the image distance of the 4f imaging system, the shearing amount and spatial carrier frequency are controlled respectively. Combined with Fourier transform and inverse Fourier transform, the independent adjustment of shearing amount and carrier frequency is achieved.
It provides a convenient system installation method, has excellent noise resistance, is suitable for complex surface or deformation measurement, ensures high accuracy and a large measurement range, and is particularly suitable for industrial environments.