An automatic test system and method for an ADC chip

Abstract

The application provides an automatic testing system and method for an ADC chip, wherein a host computer generates a signal starting instruction and parameter information for configuring a tested ADC chip to perform automatic testing; a signal injector inputs a continuous sine wave signal to the tested ADC chip according to the signal starting instruction; the tested ADC chip acquires a digital signal formed after the sine wave signal is converted into a digital signal according to the parameter information; a logic analyzer captures the digital signal and uploads it to the host computer; and the host computer processes the digital signal to obtain a performance test result. The ADC chip is inputted with a continuous sine wave analog signal, and the test parameters are configured by the host computer, and the conversion result is read, so that the test efficiency is improved, the test cost is reduced, and the flexibility of the test is improved by configuring the parameters by the host computer.

Description

Technical Field

[0001] This invention relates to the field of analog-to-digital converter (ADC) testing technology, and more particularly to an automated testing system and method for ADC chips. Background Technology

[0002] In data acquisition systems, the ADC (Analog-to-Digital Converter) is a crucial component for the interface between analog and digital signals. Real-world signals, such as temperature, sound, radio waves, or images, are all analog signals and need to be converted into digital forms that are easy to store, encode, compress, or filter. The analog-to-digital converter was developed for this purpose and plays an irreplaceable role. Currently, with the rapid development of digital processing technology, the demand for ADCs is increasing in communications, consumer electronics, industrial and medical instruments, and military products.

[0003] As the accuracy of ADCs continues to improve, research on high-precision ADC measurements is also increasing. However, high-precision ADC measurements are easily affected by environmental factors and human error, which can lead to deviations in measurement parameters. Furthermore, manual testing of ADC chips by test engineers is often inefficient. For example, for a 12-bit ADC, with the input voltage increasing by 1 LSB, it requires 4096 voltage inputs to convert the voltage into the corresponding digital value and then calculate the relevant parameters. This involves numerous repetitive operations, a large amount of data to be processed, low testing efficiency, and a high risk of errors. Summary of the Invention

[0004] To address the aforementioned problems, this invention provides an automated testing system and method for ADC chips, aiming to solve the technical problems of low testing efficiency, high cost, and susceptibility to errors in the prior art.

[0005] An automated testing system for ADC chips, comprising:

[0006] The host computer, connected to the ADC chip under test, is used to: generate signal start commands, configure test parameters, and input parameter information to the ADC chip under test.

[0007] The signal injector is connected to the host computer and the analog signal input terminal of the ADC chip under test, respectively, and is used to input a continuous sine wave signal to the ADC chip under test according to the signal start command.

[0008] The ADC chip under test obtains the digital signal formed by the analog-to-digital conversion of the sine wave signal based on the parameter information;

[0009] The logic analyzer is connected to the ADC chip under test and the host computer respectively, captures the digital signal output by the ADC chip under test and transmits it to the host computer.

[0010] The host computer processes the digital signals to obtain performance test results.

[0011] Furthermore, the ADC chip under test includes several analog-to-digital conversion units and a processing module, with the analog-to-digital conversion units connected to the processing module;

[0012] The parameter information includes the identifier of the analog-to-digital conversion unit;

[0013] The processing module is used for:

[0014] Receive and parse parameter information;

[0015] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0016] Connect the analog-to-digital converter unit under test to the analog signal input terminal;

[0017] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0018] Furthermore, the ADC chip under test includes several analog-to-digital conversion units and a processing module, with the analog-to-digital conversion units connected to the processing module;

[0019] The parameter information includes the identifiers of multiple analog-to-digital conversion units and the order of the identifiers;

[0020] The processing module is also used for:

[0021] Receive and parse the parameter information;

[0022] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0023] Connect the analog-to-digital converter unit under test to the analog signal input terminal in the order indicated by the labels;

[0024] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0025] Furthermore, the parameter information also includes the sampling frequency;

[0026] The analog-to-digital converter under test converts the sine wave signal into a digital signal according to the sampling frequency.

[0027] Furthermore, the ADC chip under test has a UART interface;

[0028] The host computer transmits parameter information to the ADC chip under test via the UART interface.

[0029] Furthermore, the ADC chip under test has a GPIO interface;

[0030] The logic analyzer is connected to the GPIO interface of the ADC chip under test.

[0031] An automated testing method for an ADC chip, using the aforementioned automated testing system for an ADC chip, includes:

[0032] The host computer generates a signal start command and configures the test parameters, and inputs the parameter information to the ADC chip under test.

[0033] The signal injector inputs a continuous sine wave signal to the ADC chip under test according to the signal start command; the ADC chip under test obtains the digital signal formed by the analog-to-digital conversion of the sine wave signal according to the parameter information.

[0034] The logic analyzer captures digital signals and uploads them to the host computer;

[0035] The host computer processes the digital signals to obtain performance test results.

[0036] Furthermore, the ADC chip under test includes several analog-to-digital conversion units, and the parameter information includes the identifier of the analog-to-digital conversion unit;

[0037] The process by which the ADC chip under test generates a digital signal based on parameter information and a sine wave signal includes:

[0038] Receive and parse parameter information;

[0039] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0040] Connect the analog-to-digital converter unit under test to the analog signal input terminal;

[0041] When the analog signal input terminal is turned on, the analog-to-digital converter unit under test converts the sine wave signal into a digital signal and outputs it.

[0042] Furthermore, the ADC chip under test includes several analog-to-digital conversion units;

[0043] The parameter information includes the identifiers of multiple analog-to-digital conversion units and the order of the identifiers;

[0044] The process by which the ADC chip under test generates a digital signal based on parameter information and a sine wave signal includes: 5. Receiving and parsing parameter information;

[0045] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0046] Connect the analog-to-digital converter unit under test to the analog signal input terminal in the order indicated by the labels;

[0047] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0048] Furthermore, the parameter information also includes the sampling frequency;

[0049] During the process of the ADC chip under test forming a digital signal based on parameter information and a sine wave signal, the analog-to-digital conversion unit under test converts the sine wave signal into a digital signal according to the sampling frequency.

[0050] The beneficial technical effects of this invention are as follows: by inputting continuous sinusoidal analog signals into the ADC chip, and configuring the test parameters and reading the conversion results by the host computer, the test efficiency is improved and the test cost is reduced. Attached Figure Description

[0051] Figure 1 This is a schematic diagram of the modules of an automatic testing system for an ADC chip according to the present invention;

[0052] Figure 2 This is a flowchart illustrating one embodiment of an automatic testing method for an ADC chip according to the present invention.

[0053] Figure 3 This is a flowchart illustrating one embodiment of an automatic testing method for an ADC chip according to the present invention.

[0054] Figure 4 This is a flowchart illustrating another embodiment of the automatic testing method for an ADC chip according to the present invention. Detailed Implementation

[0055] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0056] It should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other.

[0057] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, but this is not intended to limit the scope of the invention.

[0058] See Figure 1 This invention provides an automated testing system for ADC chips, comprising:

[0059] The host computer (3) is connected to the ADC chip under test (2) to generate signal start commands and configure the parameter information for testing, and input the parameter information to the ADC chip under test (2).

[0060] The signal injector (1) is connected to the analog signal input terminals of the host computer (3) and the ADC chip (2) under test, respectively, and is used to input continuous sine wave signals to the ADC chip (2) under test according to the signal start command.

[0061] The ADC chip under test (2) obtains the digital signal formed by the analog-to-digital conversion of the sine wave signal according to the parameter information;

[0062] The logic analyzer (4) is connected to the ADC chip under test (2) and the host computer (3) respectively, and captures the digital signal output by the ADC chip under test (2) and transmits it to the host computer (3);

[0063] The host computer (3) processes the digital signal to obtain the performance test results.

[0064] In this invention, the signal injector (1) is the Texas Instruments Precision Signal Injector (PSI) Evaluation Module.

[0065] In this invention, the signal injector (1) inputs a 2kHz continuous sine wave signal to the analog signal input terminal of the ADC chip according to a fixed period. For high-precision ADCs, such as 12-bit ADCs, the voltage increases by 1LSB according to the continuous sine wave signal, eliminating the need for manual input of voltage each time, thereby realizing automatic testing of the ADC chip, reducing testing costs and improving testing efficiency.

[0066] Furthermore, the host computer (3) configures the parameter information, which can be adjusted as needed. The parameter information includes, for example, the sampling frequency, which can be adjusted to improve the flexibility of the test. In this invention, the signal injector (1) is connected to the analog signal input terminal of the ADC chip via a coaxial cable.

[0067] In this invention, the amplitude of the sine wave signal is determined by the reference voltage of the ADC chip.

[0068] In this invention, the test performance of the ADC chip includes signal-to-noise ratio (SNR), signal-to-noise ratio (SINAD), effective number of bits (ENOB), total harmonic distortion (THD), integral nonlinearity (INL), differential nonlinearity (DNL), etc. The host computer (3) processes the digital signal to obtain the performance test results.

[0069] Furthermore, the ADC chip under test (2) includes several analog-to-digital conversion units and a processing module, with the analog-to-digital conversion units connected to the processing module;

[0070] The parameter information includes the identifier of the analog-to-digital conversion unit;

[0071] The processing module is used for:

[0072] Receive and parse parameter information;

[0073] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0074] Connect the analog-to-digital converter unit under test to the analog signal input terminal;

[0075] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0076] The analog-to-digital converter unit converts the input voltage into 12-bit data.

[0077] The processing module knows which analog-to-digital converter (ADC) needs to be tested based on the identifier of the ADC, connects the ADC under test, inputs a sine wave signal to the ADC under test, and obtains the corresponding digital signal.

[0078] Furthermore, the parameter information includes the identifiers of multiple analog-to-digital conversion units and the order of the identifiers;

[0079] The processing module is also used for:

[0080] Receive and parse the parameter information;

[0081] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0082] Connect the analog-to-digital converter unit under test to the analog signal input terminal in the order indicated by the labels;

[0083] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0084] In this invention, multiple analog-to-digital converters can also be tested automatically. As long as the analog-to-digital converter to be tested is selected on the host computer, the processing module will connect the analog signal input terminal of the analog-to-digital converter to be tested in sequence to realize the testing of each analog-to-digital converter, further saving the configuration of each analog-to-digital converter on the host computer (3), saving testing time and improving testing efficiency.

[0085] Furthermore, the parameter information also includes the sampling frequency;

[0086] The analog-to-digital converter under test converts the sine wave signal into a digital signal according to the sampling frequency.

[0087] Furthermore, the ADC chip under test (2) has a UART interface;

[0088] The host computer (3) transmits parameter information to the ADC chip (2) under test through the UART interface.

[0089] The UART interface, or Universal Asynchronous Receiver / Transmitter interface, is also known as an asynchronous transmit / receive interface.

[0090] Furthermore, the ADC chip under test (2) has a GPIO interface;

[0091] The logic analyzer (4) is connected to the GPIO interface of the ADC chip (2) under test.

[0092] GPIO stands for General-purpose input / output interface, also known as a general-purpose input / output interface.

[0093] See Figure 2 The present invention also provides an automatic testing method for an ADC chip, using the aforementioned automatic testing system for an ADC chip, comprising:

[0094] The host computer (3) generates a signal start command and configures the parameter information for testing, and inputs the parameter information to the ADC chip (2) under test;

[0095] The signal injector (1) inputs a continuous sine wave signal to the ADC chip under test (2) according to the signal start command;

[0096] The ADC chip under test (2) obtains the digital signal formed by the analog-to-digital conversion of the sine wave signal according to the parameter information;

[0097] The logic analyzer (4) receives digital signals and uploads them to the host computer (3);

[0098] The host computer (3) processes the digital signal to obtain the performance test results.

[0099] See Figure 3 Furthermore, the ADC chip under test (2) includes several analog-to-digital conversion units (21), and the parameter information includes the identifiers of the analog-to-digital conversion units;

[0100] The process by which the ADC chip under test (2) generates a digital signal based on parameter information and a sine wave signal includes:

[0101] Receive and parse parameter information;

[0102] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0103] Connect the analog-to-digital converter unit under test to the analog signal input terminal;

[0104] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0105] See Figure 4 Furthermore, the ADC chip under test includes several analog-to-digital conversion units;

[0106] The parameter information includes the identifiers of multiple analog-to-digital conversion units and the order of the identifiers;

[0107] The process by which the ADC chip under test generates a digital signal based on parameter information and a sine wave signal includes:

[0108] Receive and parse parameter information;

[0109] The analog-to-digital conversion unit that matches the identifier is used as the analog-to-digital conversion unit under test;

[0110] Connect the analog-to-digital converter unit under test to the analog signal input terminal in the order indicated by the labels;

[0111] The analog-to-digital converter unit under test, when connected to the analog signal input terminal, converts the sine wave signal into a digital signal and outputs it.

[0112] Furthermore, the parameter information also includes the sampling frequency;

[0113] During the process of the ADC chip under test forming a digital signal based on parameter information and a sine wave signal, the analog-to-digital conversion unit under test converts the sine wave signal into a digital signal according to the sampling frequency.

[0114] The above are merely preferred embodiments of the present invention and are not intended to limit the implementation methods and protection scope of the present invention. Those skilled in the art should recognize that any equivalent substitutions and obvious changes made based on the description and illustrations of the present invention should be included within the protection scope of the present invention.

Claims

1. An automated testing system for an ADC chip, characterized in that, include: The host computer, connected to the ADC chip under test, is used to: generate a signal start command, configure the parameter information for testing, and input the parameter information to the ADC chip under test; A signal injector is connected to the analog signal input terminals of the host computer and the ADC chip under test, respectively, and is used to input a continuous sine wave signal to the ADC chip under test according to the signal start command. The ADC chip under test obtains the digital signal formed by the analog-to-digital conversion of the sine wave signal according to the parameter information; The logic analyzer is connected to the ADC chip under test and the host computer respectively, captures the digital signal output by the ADC chip under test and transmits it to the host computer. The host computer processes the digital signal to obtain the performance test results; The ADC chip under test includes several analog-to-digital conversion units and a processing module, wherein the analog-to-digital conversion units are connected to the processing module. The parameter information includes the identifier of the analog-to-digital conversion unit; The processing module is used for: Receive and parse the parameter information; The analog-to-digital conversion unit that matches the identifier is taken as the analog-to-digital conversion unit under test; Connect the analog-to-digital converter unit under test to the analog signal input terminal; The analog-to-digital converter unit under test, connected to the analog signal input terminal, converts the sine wave signal into the digital signal and outputs it. The parameter information also includes the sampling frequency; The analog-to-digital converter under test converts the sinusoidal signal into the digital signal according to the sampling frequency.

2. The automatic testing system for an ADC chip as described in claim 1, characterized in that, The ADC chip under test has a UART interface; The host computer transmits the parameter information to the ADC chip under test through the UART interface.

3. The automatic testing system for an ADC chip as described in claim 1, characterized in that, The ADC chip under test has a GPIO interface; The logic analyzer is connected to the GPIO interface of the ADC chip under test.

4. An automatic testing method for an ADC chip, characterized in that, An automated test system for an ADC chip as described in any one of claims 1-3 includes: The host computer generates a signal start command and configures the test parameters, and inputs the parameter information to the ADC chip under test. The signal injector inputs a continuous sine wave signal to the ADC chip under test according to the signal start command; The ADC chip under test obtains the digital signal formed by the analog-to-digital conversion of the sine wave signal based on the parameter information. The logic analyzer receives the digital signal and uploads it to the host computer; The host computer processes the digital signal to obtain the performance test results.

5. The automatic testing method for an ADC chip as described in claim 4, characterized in that, The ADC chip under test includes several analog-to-digital conversion units, and the parameter information includes the identifiers of the analog-to-digital conversion units; The process by which the ADC chip under test generates a digital signal based on the parameter information and the sine wave signal includes: Receive and parse the parameter information; The analog-to-digital conversion unit that matches the identifier is taken as the analog-to-digital conversion unit under test; Connect the analog-to-digital converter unit under test to the analog signal input terminal; The analog-to-digital converter unit under test, connected to the analog signal input terminal, converts the sine wave signal into the digital signal and outputs it.

6. The automatic testing method for an ADC chip as described in claim 5, characterized in that, The parameter information also includes the sampling frequency; During the process of the ADC chip under test forming a digital signal based on the parameter information and the sine wave signal, the analog-to-digital conversion unit under test converts the sine wave signal into the digital signal according to the sampling frequency.

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