A method for splicing detectors with angled incidence

Abstract

The present invention discloses a method for splicing detectors with angled incidence, which belongs to the field of optical remote sensing technology and includes a focal panel assembly, a splicing base, and a splicing instrument. The focal panel assembly includes a focal plane substrate and three detectors and a grinding pad connected to the focal plane substrate. The splicing base is a high-rigidity, high-precision process tooling developed to achieve splicing of detectors with angled incidence; the splicing instrument is a core optical instrument for achieving high-precision splicing of the focal panel assembly, which can achieve high-precision three-dimensional translation and provide a high-precision fixed platform for the splicing base. The method for splicing detectors with angled incidence of the present invention is more adaptable to scenarios. On the basis of meeting the coplanarity of detector splicing, it can ensure that the entire image plane will not be blocked, and can realize the verification of the splicing effect through two angle detections, thereby improving the imaging effect.

Description

Technical Field

[0001] The present invention relates to the field of optical remote sensing technology, and in particular to a method for splicing detectors with angled incidence. Background Art

[0002] Detectors are the core components of optical remote sensing cameras. As the field of space optical remote sensing continues to demand higher resolution and larger fields of view, the size of focal planes is growing. However, due to limitations in detector size and cost-effectiveness, large-scale focal planes are typically achieved by stitching together smaller detectors. As a core technology in space optical remote sensing, focal plane stitching requires exceptionally high precision, typically achieved using high-precision visual stitching instruments that can achieve micron-level stitching accuracy.

[0003] The current method uses the splicing instrument base as a reference, leveling the entire detector mounting surface and then coplanar splicing the detectors. However, in actual optical systems, considering the field of view requirements, the focal plane may be at a certain angle to the optical axis, that is, the detector mounting surface is not perpendicular to the optical axis. Due to the size, weight, structural stability, and stray light suppression requirements of space optical remote sensing, the edge of the detector is very close to the structural components, and there is a certain height difference. In this case, if the traditional splicing method is continued, the focal plane after splicing may be blocked by the structural components, affecting the imaging effect.

[0004] Based on the above technical problems, technical personnel in this field urgently need to develop a method for splicing detectors with angled incidence, which can not only ensure the coplanarity of the detector splicing, but also ensure that the entire image surface will not be blocked, and can realize the verification of the splicing effect through two angle detections. Summary of the Invention

[0005] The purpose of the present invention is to provide a method for splicing detectors with angled incidence, which can ensure that the entire image surface is not blocked on the basis of satisfying the coplanarity of the detector splicing, and can realize the verification of the splicing effect through two angle detections.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] A method for splicing angled-incidence detectors of the present invention includes a focal plane assembly, a splicing base, and a splicing instrument. The focal plane assembly includes a focal plane substrate, three detectors connected to the focal plane substrate, and a grinding pad. The splicing method includes the following steps:

[0008] S1: Use a microscope to detect the relationship between the marking points and pixel positions of each detector, revise the designed theoretical data, and establish the actual relationship between the marking points and pixel positions;

[0009] S2: Connect the focal plane substrate to the splicing base, and use three-dimensional coordinate measurement to measure the angle between the mounting surface of the grinding pad on the focal plane substrate and the bottom surface of the splicing base;

[0010] S3: Use the three-dimensional model to build a model of the splicing state of the three detectors at the angle measured in step S2, and ensure that the coordinate system direction is consistent with the coordinate system direction of the splicing instrument, and record the XYZ coordinates of all the marking points of the three detectors;

[0011] S4: Remove the focal plane substrate, install the three detectors and the grinding pad onto the focal plane substrate to form a focal plane assembly;

[0012] S5: Install the splicing base on the plane of the splicing instrument and align it to ensure that it is consistent with the direction of 3D modeling;

[0013] S6: Integrate the focus panel assembly with the assembly of the splicing base, install them on the splicing instrument platform, and align them to ensure they are consistent with the direction of the 3D modeling;

[0014] S7: Use the stitching machine to find a marking point, and clear the coordinates of the point to zero on the stitching machine, which is the origin;

[0015] S8: Test the coordinates of all marked points and compare them with the model coordinates. By plane fitting, calculate the amount and direction of each detector’s grinding;

[0016] S9: Process the grinding pad according to the calculated value;

[0017] S10: Install the spliced ​​focus panel assembly onto the six-dimensional adjustment frame, then place the assembly onto the splicing instrument platform, and verify the coplanarity data of the three detector marking points by adjusting the angle of the six-dimensional adjustment frame.

[0018] Furthermore, after recording the coordinates in step S3, a marking point on one of the detectors is used as the coordinate origin, and the direction of the coordinate axis remains unchanged, and the new XYZ coordinates of the other marking points are recalculated;

[0019] In step S7, a marking point as the coordinate origin is found by a stitching instrument.

[0020] Furthermore, after the processing in step S9 is completed, the focus panel assembly is restored and steps S6-S9 are repeated until the index requirements are met.

[0021] Furthermore, the detector includes a plurality of photosensitive surfaces and marking points, and the photosensitive surface is composed of a plurality of pixels for collecting light information.

[0022] In the above technical solution, the present invention provides a method for splicing detectors with angled incidence, which has the following beneficial effects:

[0023] The angled incidence detector splicing method of the present invention is more adaptable to scenes. On the basis of satisfying the detector splicing coplanarity, it can ensure that the entire image surface will not be blocked, and can realize the verification of the splicing effect through two angle detections, thereby improving the imaging effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments described in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0025] Figure 1 A schematic diagram of the detector splicing structure provided by an embodiment of the present invention;

[0026] Figure 2 A structural diagram of a detector in a method for splicing detectors with angled incidence provided by an embodiment of the present invention;

[0027] Figure 3 A schematic diagram of a focal panel assembly in a method for splicing detectors with angled incidence provided by an embodiment of the present invention;

[0028] Figure 4 A side view of a focal panel assembly in a method for splicing detectors with angled incidence provided by an embodiment of the present invention.

[0029] Description of reference numerals:

[0030] 1. Focus panel assembly; 2. Splicing base; 3. Splicing instrument;

[0031] 101. focal plane substrate; 102. detector; 103. grinding pad;

[0032] 1021. Photosensitive surface; 1022. Marking point. DETAILED DESCRIPTION

[0033] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings.

[0034] See also Figures 1 to 4 As shown;

[0035] A method for splicing detectors with angled incidence according to the present invention comprises the following steps:

[0036] The invention comprises a focal plane assembly 1, a splicing base 2 and a splicing instrument 3. The focal plane assembly 1 comprises a focal plane substrate 101 and three detectors 102 and a grinding pad 103 connected to the focal plane substrate 101. The splicing method comprises the following steps:

[0037] S1: Using a microscope to detect the position relationship between the marking points and pixels of each detector 102, correcting the designed theoretical data, and establishing the actual position relationship between the marking points and pixels;

[0038] S2: Connect the focal plane substrate 101 to the splicing base 2, and use three-dimensional coordinate measurement to measure the angle between the mounting surface of the grinding pad 103 on the focal plane substrate 101 and the bottom surface of the splicing base 2;

[0039] S3: Use the three-dimensional model to build a model of the spliced ​​state of the three detectors 102 at the angle measured in step S2, and ensure that the coordinate system direction is consistent with the coordinate system direction of the splicing device 3, and record the XYZ coordinates of all the marking points of the three detectors 102;

[0040] S4: Remove the focal plane substrate 101, and install the three detectors 102 and the grinding pad 103 on the focal plane substrate 101 to form the focal plane assembly 1;

[0041] S5: Install the splicing base 2 on the plane of the splicing instrument 3 and align it to ensure that it is consistent with the direction of the three-dimensional modeling;

[0042] S6: Integrate the focus panel assembly 1 with the assembly of the splicing base 2, and install them on the platform of the splicing instrument 3, align them to ensure that they are consistent with the direction of the three-dimensional modeling;

[0043] S7: Use the stitching device 3 to find a marking point, and clear the coordinates of the point on the stitching device 3 to zero, which is the origin;

[0044] S8: Test the coordinates of all the marking points and compare them with the model coordinates. Calculate the amount and direction of the grinding of each detector 102 through plane fitting.

[0045] S9: Processing the grinding pad 103 according to the calculated value;

[0046] S10: Install the spliced ​​focus panel assembly 1 on the six-dimensional adjustment frame, then place the assembly on the platform of the splicing instrument 3, and check the coplanarity data of the marking points of the three detectors 102 by adjusting the angle of the six-dimensional adjustment frame.

[0047] It should be noted that there is a strict positioning relationship between the focus panel assembly 1 and the splicing base 2, the detector 102 and the grinding pad 103, and the grinding pad 103 and the focus plane substrate 101. The relative positions must be kept consistent during each installation; the torque applied must be the same during each installation and integration to ensure that the stress state of the components is consistent during each operation.

[0048] As a further introduction to this embodiment, after recording the coordinates in step S3, a marking point on one of the detectors 102 is used as the coordinate origin, and the direction of the coordinate axis remains unchanged, and the new XYZ coordinates of the other marking points are recalculated;

[0049] In step S7, the marking point which is the coordinate origin is found by the stitching device 3.

[0050] As a further introduction to this embodiment, after the processing of step S9 is completed, the focus panel assembly 1 is restored and steps S6-S9 are repeated until the index requirements are met.

[0051] As a further introduction to this embodiment, the detector 102 includes multiple photosensitive surfaces 1021 and marking points 1022. The photosensitive surface 1021 is composed of a large number of small-sized pixels (usually micron-sized) and is an important interface for the detector's photoelectric conversion. This interface collects light information and forms an electrical signal through a series of photoelectric conversions. The marking points 1022 are marks etched around the photosensitive surface. These marking points 1022 have a predetermined relative positional relationship with the pixels, and the marking points 1022 are larger than the pixel size. When the detector is integrated, the marking points are generally used instead of the pixels for splicing. The splicing base 2 is a high-rigidity, high-precision process tool developed to achieve angled incidence detector splicing. Its upper end is arranged with the mechanical structure mounting holes of the focus panel assembly 1, and the lower end is arranged with the mounting holes for the splicing instrument 3. The stitching instrument 3 is the core optical instrument for achieving high-precision stitching of the focal panel assembly 1. It is usually composed of a marble platform, a motion track, an optical microscope and other auxiliary components. It can achieve high-precision three-dimensional translation (XYZ) and provide a high-precision fixed platform for the stitching base 2.

[0052] In the above technical solution, the present invention provides a method for splicing detectors with angled incidence, which has the following beneficial effects:

[0053] The angled incidence detector splicing method of the present invention is more adaptable to scenes. On the basis of satisfying the detector splicing coplanarity, it can ensure that the entire image surface will not be blocked, and can realize the verification of the splicing effect through two angle detections, thereby improving the imaging effect.

[0054] The above description is merely illustrative of certain exemplary embodiments of the present invention. It goes without saying that those skilled in the art will be able to modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and description are illustrative in nature and should not be construed as limiting the scope of protection of the claims.

Claims

1. A method for splicing detectors with angled incidence, characterized in that: The invention comprises a focal plane assembly (1), a splicing base (2) and a splicing apparatus (3); the focal plane assembly (1) comprises a focal plane substrate (101) and three detectors (102) and a grinding pad (103) connected to the focal plane substrate (101); and the splicing method comprises the following steps: S1: Using a microscope to detect the relationship between the marking points and the pixel positions of each detector (102), correcting the designed theoretical data, and establishing the actual relationship between the marking points and the pixel positions; S2: Connect the focal plane substrate (101) to the splicing base (2), and use three-coordinate measurement to measure the angle between the mounting surface of the grinding pad (103) on the focal plane substrate (101) and the bottom surface of the splicing base (2); S3: Using a three-dimensional model, a model of the spliced ​​state of the three detectors (102) at the angle measured in step S2 is established, and the direction of the coordinate system is ensured to be consistent with the direction of the coordinate system of the splicing instrument (3), and the XYZ coordinates of all the marking points of the three detectors (102) are recorded; S4: Remove the focal plane substrate 101, and install the three detectors 102 and the grinding pad 103 on the focal plane substrate 101 to form the focal plane assembly 1; S5: Install the splicing base (2) on the plane of the splicing instrument (3) and align it to ensure that it is consistent with the direction of the three-dimensional modeling; S6: Integrate the focus panel assembly (1) and the assembly of the splicing base (2), and install them on the platform of the splicing instrument (3), align them and ensure that they are consistent with the direction of the three-dimensional modeling; S7: Use the splicing device (3) to find a marking point, and clear the coordinates of the point on the splicing device (3) to zero, which is the origin; S8: testing the coordinates of all the marked points and comparing them with the model coordinates, and calculating the amount and direction of the grinding of each detector (102) by plane fitting; S9: Processing the grinding pad (103) according to the calculated value; S10: Install the spliced ​​focus panel assembly (1) onto a six-dimensional adjustment frame, then place the assembly onto a platform of a splicing apparatus (3), and review the coplanarity data of the marking points of the three detectors (102) by adjusting the angle of the six-dimensional adjustment frame.

2. The method for splicing detectors with angled incidence according to claim 1, wherein: After recording the coordinates in step S3, a marking point on one of the detectors (102) is used as the coordinate origin, and the direction of the coordinate axis remains unchanged, and new XYZ coordinates of other marking points are recalculated; In step S7, the marking point which is the origin of the coordinates is found by the splicing apparatus (3).

3. The method for splicing detectors with angled incidence according to claim 1, wherein: After the processing in step S9 is completed, the focus panel assembly (1) is restored and steps S6-S9 are repeated until the index requirements are met.

4. The method for splicing detectors with angled incidence according to claim 1, wherein: The detector (102) comprises a plurality of photosensitive surfaces (1021) and marking points (1022); the photosensitive surface (1021) is composed of a plurality of picture elements and is used to collect light information.

Images