Alloy composition calculation device, method, program, and system

Abstract

As the composition of the alloy, indexes capable of comparing different manufacturing batches or alloy particles can be easily calculated. An alloy composition calculation device according to one embodiment of the present invention is provided with: an image acquisition unit for acquiring each element image of an alloy; a luminance determination unit that determines points in an orthogonal coordinate system, which take each luminance of each element image as an axis, on the basis of each luminance at the same coordinate on each element image; and a composition calculation unit that calculates the deflection angle of the polar coordinates of the point as the alloy composition.

Description

Technical Field The present invention relates to an alloy composition calculation device, method, program and system. Background Art Conventionally, methods for analyzing the element composition contained in alloys are known. For example, in Non-Patent Document 1, an alloy is statistically analyzed based on an element mapping image obtained by STEM (scanning transmission electron microscopy)-XEDS (X-ray energy-dispersive spectroscopy). [Prior art literature]

Non-patent literature

Methods to solve the problem

[0001] An alloy composition calculation device, comprising: An image acquisition unit, which acquires images of each element of the alloy; a brightness determination unit that determines a point of an orthogonal coordinate system with the brightness of each element image as an axis according to each brightness at the same coordinate on each element image; and The composition calculation unit calculates the deflection angle of the polar coordinates of the point as the alloy composition.

[0002] According to the alloy composition calculation device described in [1], the composition calculation unit calculates the alloy composition for each particle of the alloy or each image of the alloy.

[0003] In the alloy composition calculation device described in [1] or [2], the composition calculation unit calculates the alloy composition based on the distribution of the calculated deflection angles of the polar coordinates.

[0004] According to the alloy composition calculation device described in [3], the alloy composition is at least one of a standard deviation, a median, an average, and a skewness.

[0005] The alloy composition calculation device according to any one of [1] to [4], further comprising: a visualization unit that visualizes the alloy composition based on the calculated deflection angle of the polar coordinates.

[0006] According to the alloy composition calculation device described in [5], the visualization unit represents the distribution of the deflection angle of the polar coordinates in a histogram.

[0007] According to the alloy composition calculation device described in [5], the visualization unit visualizes the distribution of brightness on each element image.

[0008] A method performed by an alloy composition calculation device comprises the following steps: Obtain images of each element of the alloy; Determining, according to each brightness at the same coordinate on each element image, a point of an orthogonal coordinate system with each brightness of each element image as an axis; and The deflection angle of the polar coordinates of the point is calculated as the alloy composition.

[0009] A program for causing an alloy composition calculation device to function as follows: An image acquisition unit, which acquires images of each element of the alloy; a brightness determination unit that determines a point of an orthogonal coordinate system with the brightness of each element image as an axis according to each brightness at the same coordinate on each element image; and The composition calculation unit calculates the deflection angle of the polar coordinates of the point as the alloy composition.

[0010] A system comprising an alloy composition calculation device, an alloy observation device and an alloy manufacturing device, The alloy composition calculation device comprises: An image acquisition unit that acquires images of each element of the alloy from the alloy observation device; a brightness determination unit that determines a point of an orthogonal coordinate system with the brightness of each element image as an axis according to each brightness at the same coordinate on each element image; and A composition calculation unit calculates the deflection angle of the polar coordinates of the point as the alloy composition, The alloy manufacturing device manufactures the alloy based on the result calculated by the alloy composition calculating device. [Effects of the Invention] According to the present invention, an index that can be easily compared and contrasted can be calculated as the composition of the alloy. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 It is an overall structural diagram according to one embodiment of the present invention. Figure 2 FIG. 4 is a hardware structure diagram of an alloy composition calculation device according to one embodiment of the present invention. Figure 3 is a functional block diagram of an alloy composition calculation device according to one embodiment of the present invention. Figure 4 1 is a diagram for explaining calculation of the alloy composition of each particle of the alloy and calculation of the alloy composition of each image of the alloy according to one embodiment of the present invention. Figure 5 is a flowchart of an overall process according to one embodiment of the present invention. Figure 6 is a flowchart of preprocessing according to one embodiment of the present invention. Figure 7 1 is an example of an image of each element of an alloy according to one embodiment of the present invention. Figure 8 This is an example of an image being preprocessed according to one embodiment of the present invention. Fig. 9 is a flowchart of an alloy composition calculation process according to one embodiment of the present invention. Fig.10 This is a diagram for explaining polar coordinates according to one embodiment of the present invention. Fig.11 This is an example of a screen according to one embodiment of the present invention. Fig.12 This is an example of a screen according to one embodiment of the present invention. Fig.13 This is an example of a screen according to one embodiment of the present invention. Fig.14 This is an example of a screen according to one embodiment of the present invention. Fig.15 This is an example of a screen according to one embodiment of the present invention. Fig.16 This is an example of a screen according to one embodiment of the present invention. Fig.17 This is an example of a screen according to one embodiment of the present invention. Fig.18 This is an example of a screen according to one embodiment of the present invention. Fig.19 This is an example of a screen according to one embodiment of the present invention. DETAILED DESCRIPTION Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. In addition, in this specification and the drawings, components having substantially the same functional configuration are denoted by the same reference numerals to omit repeated descriptions. <Overall structure> Figure 1 1 is an overall structural diagram according to one embodiment of the present invention. The alloy composition calculation device 10 is operated by an operator 20. The alloy composition calculation device 10 can transmit and receive data with an alloy observation device 11 and an alloy production device 12. The alloy composition calculation device 10 is a device for calculating the composition of the alloy. The alloy composition calculation device 10 is composed of one or more computers (for example, a personal computer operated by the operator 20 or a personal computer and a server operated by the operator 20). Figure 2 and Figure 3 The alloy composition calculating device 10 will be described in detail. The alloy observation device 11 is a device for acquiring an image of an alloy. For example, the alloy observation device 11 is an electron microscope such as a SEM (scanning electron microscope) or a STEM (scanning transmission electron microscope). The alloy production device 12 is a device for producing an alloy. One embodiment of the present invention is a system including an alloy composition calculation device 10, an alloy observation device 11, and an alloy manufacturing device 12. In one embodiment of the present invention, the alloy manufacturing device 12 manufactures an alloy, the alloy observation device 11 obtains an image of the alloy (i.e., the alloy manufactured by the alloy manufacturing device 12), and the alloy composition calculation device 10 calculates the composition of the alloy (i.e., the alloy manufactured by the alloy manufacturing device 12). Then, the alloy manufacturing device 12 can manufacture an alloy according to the result calculated by the alloy composition calculation device 10 (for example, change the manufacturing conditions according to the result calculated by the alloy composition calculation device 10). <Hardware Structure> Figure 21 is a hardware structure diagram of an alloy composition calculation device 10 according to an embodiment of the present invention. The alloy composition calculation device 10 has a CPU (Central Processing Unit) 1, a ROM (Read Only Memory) 2, and a RAM (Random Access Memory) 3. CPU1, ROM2, and RAM3 form a so-called computer. In addition, the alloy composition calculation device 10 may have an auxiliary storage device 4, a display device 5, an operating device 6, an I / F (Interface) device 7, and a drive device 8. In addition, the hardware of the alloy composition calculation device 10 is connected to each other via a bus B. The CPU 1 is a computing device that executes various programs installed in the auxiliary storage device 4 . ROM2 is a nonvolatile memory. ROM2 functions as a main storage device and stores various programs and data required for CPU1 to execute various programs installed in auxiliary storage device 4. Specifically, ROM2 functions as a main storage device that stores boot programs such as BIOS (Basic Input / Output System) or EFI (Extensible Firmware Interface). The RAM 3 is a volatile memory such as a DRAM (Dynamic Random Access Memory) or a SRAM (Static Random Access Memory). The RAM 3 functions as a main storage device and provides a work area that is developed when the CPU 1 executes various programs installed in the auxiliary storage device 4 . The auxiliary storage device 4 is an auxiliary storage device that stores various programs and information used when executing the various programs. The display device 5 is a display device that displays the input / output status and operation of the program of the alloy composition calculation device 10 . The operation device 6 is an input device for the administrator of the alloy composition calculation device 10 to input various instructions to the alloy composition calculation device 10 . The I / F device 7 is a communication device for connecting to a network and communicating with other devices. The drive device 8 is a device for setting a storage medium 9. The storage medium 9 mentioned here includes a medium that records information optically, electrically or magnetically, such as a CD-ROM, a floppy disk, an optical magnetic disk, etc. In addition, the storage medium 9 may also include a semiconductor memory that records information electrically, such as an EPROM (Erasable Programmable Read Only Memory) and a flash memory. In addition, various programs installed in the auxiliary storage device 4 are installed by, for example, placing the distributed storage medium 9 in the drive device 8 and having the drive device 8 read out various programs recorded in the storage medium 9. Alternatively, various programs installed in the auxiliary storage device 4 may be downloaded from the network via the I / F device 7 and installed. <Function block> Figure 3 1 is a functional block diagram of an alloy composition calculation device 10 according to one embodiment of the present invention. The alloy composition calculation device 10 may include an image acquisition unit 101, a brightness determination unit 102, a composition calculation unit 103, and a visualization unit 104. In addition, the alloy composition calculation device 10 can function as the image acquisition unit 101, the brightness determination unit 102, the composition calculation unit 103, and the visualization unit 104 by executing a program. The image acquisition unit 101 acquires an image including images of each element of the alloy (specifically, two or more element images). For example, the image acquisition unit 101 acquires images of each element of the alloy acquired by an electron microscope (for example, an image including an element mapping image acquired by using EDS (X-ray energy-dispersive spectroscopy) in a SEM (scanning electron microscope) or a STEM (scanning transmission electron microscope)). In addition, the alloy may be any alloy. In addition, the two or more element images may all be images of metal elements, or may be a combination of an image of a non-metal element and an image of at least one metal element. As alloys targeted by the alloy composition calculation device 10 of the present invention, for example, Pt-Co catalysts used in combustion cell catalysts, Pt-Rh catalysts used in automobile exhaust systems, etc., alloy particles such as various alloy catalysts used in the manufacture of organic molecular materials or the decomposition of organic molecules, etc. can be listed. As long as the type of element can obtain the image of each element, even a catalyst containing an element other than a metal can be targeted. The brightness determination unit 102 determines a point of an orthogonal coordinate system having the brightness of each element image as an axis, based on the brightness at the same coordinates on each element image acquired by the image acquisition unit 101 (ie, the brightness of pixels located at the same coordinates on each element image). The composition calculation unit 103 calculates, as the alloy composition, the deflection angle of the polar coordinates of the point determined by the brightness determination unit 102. The composition calculation unit 103 can calculate the alloy composition for each particle of the alloy or for each image of the alloy. Alternatively, the composition calculation unit 103 may calculate the deflection angle of the polar coordinates of the point and the distance of the polar coordinates of the point from the origin as the alloy composition. The visualization unit 104 visualizes the alloy composition based on the deflection angle of the polar coordinates calculated by the composition calculation unit 103. For example, the visualization unit 104 displays the distribution of the deflection angle of the polar coordinates using a histogram. The composition calculation unit 103 may also calculate the alloy composition based on the distribution of the calculated polar coordinate deflection angles. For example, the composition calculation unit 103 may calculate the standard deviation, median, average, skewness, etc. of the polar coordinate deflection angle distribution as the alloy composition. <<Calculation of alloy composition for each particle of the alloy, and calculation of alloy composition for each image of the alloy>> As described above, the alloy composition calculation device 10 can calculate the alloy composition for each particle of the alloy or each image of the alloy. Figure 4 Provide detailed explanation. Figure 4 1 is a diagram for explaining calculation of the alloy composition of each particle of the alloy and calculation of the alloy composition of each image of the alloy according to one embodiment of the present invention. like Figure 4 As shown in [Calculation of alloy composition for each alloy particle] on the left, the alloy composition calculation device 10 can calculate the alloy composition for each particle ( Figure 4 The alloy composition calculation device 10 calculates the alloy composition based on the particles ( Figure 4 The brightness of each pixel in the area surrounded by the dotted line is calculated to calculate the deflection angle of the polar coordinates. like Figure 4 As shown in [Calculation of alloy composition for each image of alloy] on the right side of the figure, the alloy composition calculation device 10 is capable of calculating the alloy composition for each image ( Figure 4 The alloy composition calculation device 10 calculates the alloy composition according to the image ( Figure 4 The brightness of each pixel in the area surrounded by the dotted line is calculated to calculate the deflection angle of the polar coordinates. In addition, the calculation of the alloy composition for each particle of the alloy is mainly described below, but the calculation of the alloy composition for each image of the alloy is also similar. <Method> Figure 5 is a flowchart of an overall process according to one embodiment of the present invention. In step 1 ( S1 ), the image acquisition unit 101 reads an image of particles of an alloy (alloy (particle) image) and an image of each element of the alloy. In steps 2 to 5, pre-processing of the image acquired in S1 is performed. In step 2 ( S2 ), the image acquisition unit 101 cuts out a region to be analyzed (analysis region) from the image read in S1 . In step 3 ( S3 ), the image acquisition unit 101 detects the region of particles (particle region) in the analysis region cut out in S2 . In step 4 ( S4 ), the image acquisition unit 101 deletes the region other than the particle region detected in S3 in the analysis region in S2 . In step 5 ( S5 ), the image acquisition unit 101 acquires the particle region. In steps 6 and 7, a process of calculating the alloy composition is performed. In step 6 ( S6 ), the brightness determination unit 102 obtains the brightness of the pixel. In step 7 (S7), the composition calculation section 103 calculates the declination angle of the polar coordinates. Figure 6 is a flowchart of preprocessing according to one embodiment of the present invention. <<Processing of alloy (particle) images>> In step 11 ( S11 ), the image acquisition unit 101 reads an image of particles of the alloy (alloy (particle) image). In step 12 ( S12 ), the image acquisition unit 101 cuts out a region to be analyzed (analysis region) from the image read in S11 . In step 13 (S13), the image acquisition unit 101 detects the region of particles in the image (particle region). Specifically, the image acquisition unit 101 binarizes the image (for example, using simple binarization, Otsu binarization, or adaptive binarization), performs shrinkage processing, expansion processing, and noise removal (in addition, the shrinkage processing, expansion processing, and noise removal are irrelevant in order. In addition, the shrinkage processing, expansion processing, and noise removal can be omitted) to detect the particle region. In step 14 ( S14 ), the image acquisition unit 101 divides the region of the particle (particle region) in the image for each particle. <<Processing of element images>> In step 21 ( S21 ), the image acquisition unit 101 reads each element image (for example, the element image of element A and the element image of element B). In step 22 ( S22 ), the image acquisition unit 101 cuts out a region to be analyzed (analysis region) from the image read in S21 . In step 23 (S23), the image acquisition unit 101 performs pooling processing (e.g., average pooling, maximum pooling, etc.) on the analysis area cut out in S22. For example, the image acquisition unit 101 may set the average value, maximum value, etc. of the pixel values ​​of n×n pixels as the pixel value of each of the n×n pixels. In step 24 ( S24 ), the image acquisition unit 101 deletes the area other than the particle area in each element image based on the information of the particle area of ​​the alloy (particle) image in S14 . Figure 7 It is an example of each element image of the alloy according to one embodiment of the present invention. [Image of alloy (particles)] is an example of an image of particles of the alloy. [Image of element A] is an example of an element image of element A of the alloy. [Image of element B] is an example of an element image of element B of the alloy. [Image of alloy (particles)], [Image of element A], and [Image of element B] are obtained by electron microscope (for example, scanning electron microscope (SEM) image, scanning transmission electron microscope (STEM) image, etc.). Figure 8 This is an example of an image being preprocessed according to one embodiment of the present invention. [Alloy (particle) image] is in Figure 6 This is an example of an image of particles of an alloy read in S11 and cut out in the analysis region in S12. [Detection of particle area] is Figure 6 An example of an image of a particle region detected in S13. [Particle area division] is Figure 6 An example of an image in which the particle region is segmented in S14. [Delete outside particle area] is Figure 6 An example of an image in which the area outside the particle is deleted in S24. Fig. 9 is a flowchart of an alloy composition calculation process according to one embodiment of the present invention. <<Processing of alloy (particle) images>> In step 101 ( S101 ), the brightness determination unit 102 reads the image of the alloy particles (alloy (particle) image) obtained by dividing the regions for each particle in the above-mentioned pre-processing S14 . <<Processing of element images>> In step 201 ( S201 ), the brightness determination unit 102 reads each element image obtained in the above-mentioned pre-processing S24 (for example, the element image of element A and the element image of element B). In step 202 ( S202 ), the brightness determination unit 102 obtains the region of a particle (referred to as particle 1 ) in each element image based on the image of the alloy particle divided into regions for each particle (alloy (particle) image). In step 203 ( S203 ), the brightness determination unit 102 acquires the brightness of a pixel (referred to as pixel 1 ) within the region of the particle (referred to as particle 1 ) acquired in S202 . In step 204 (S204), the composition calculation unit 103 calculates the deflection angle of the polar coordinates based on the brightness of the pixels in the region of the particles of each element image obtained in S202. Then, the process returns to S203 to obtain the brightness of the next pixel (set as pixel 2). This process is repeated until the deflection angles of the polar coordinates of all pixels in the particle region are obtained. In step 205 (S205), the composition calculation unit 103 performs statistical processing based on the distribution of the deflection angle of the polar coordinates calculated in S204. As a statistical processing, the distribution of the deflection angle of the polar coordinates throughout the region of the particle (set as particle 1) is statistically processed to calculate the alloy composition of the particle. As the calculated alloy composition, at least one calculation of the mean value, standard deviation, central value, and skewness can be cited. Afterwards, return to S202 to obtain the distribution of the deflection angle of the polar coordinates in the region of the next particle (set as particle 2). In this way, repeat until the distribution of the deflection angle of the polar coordinates in the region of all particles is statistically processed respectively. In step 206 ( S206 ), the composition calculation unit 103 displays the alloy composition calculated in S205 for each particle. <Polar coordinates> Fig.10 It is a diagram for explaining polar coordinates according to one embodiment of the present invention. In addition, although the case where the alloy has two elements (the case of two-dimensional polar coordinates) is described, the case where the alloy has three or more elements (the case of three or more-dimensional polar coordinates) is also the same. Fig.10 Represents an orthogonal coordinate system with the vertical axis as the axis of the brightness of the element image of element A of the alloy and the horizontal axis as the axis of the brightness of the element image of element B of the alloy. A "point" is a point where each brightness at the same coordinate on the element image of element A and the element image of element B (that is, each brightness of the pixels located at the same coordinate on each element image) is plotted. The angle formed by the vector from the origin to the "point" and the half-line (the axis of the brightness of the element image of element B of the alloy set as the horizontal axis) is taken as the deflection angle θ. In addition, the distance of the polar coordinate from the origin (the distance between the origin and the "point") is set to r. For all pixels, the deflection angle θ of the polar coordinates and the distance r from the origin of the polar coordinates are calculated. In addition, pixels where the brightness of the element image of element A = the brightness of the element image of element B = 0 are excluded. Here, the brightness value is scaled to a maximum of 1. The deflection angle θ of the polar coordinates is the direction of the brightness between the element images, that is, the direction of the element. In addition, the distance r from the origin of the polar coordinates is the magnitude of the brightness, that is, the amount of the element. In the following, reference is made to Figures 11 to 18 , an example of a screen of an application according to an embodiment of the present invention is described. [Initial screen] Fig.11 This is an example of a screen according to one embodiment of the present invention. Fig.11 This is the screen where the application user selects alloy data and element data, inputs correction values ​​(k-factors), and inputs set values. The alloy data and the data of each element may be numerical data (for example, in a csv file format) indicating the brightness (X-ray intensity) of each pixel, or may be image data such as a bitmap. The correction value (k-factor) is a correction value when converting from brightness (X-ray intensity) to composition. The set value is the composition of the alloy data selected by the user (in Fig.11 In the example of FIG. 1 , element A is 33.3% and element B is 66.7%), for example, the design composition is input. The brightness of the element image is calibrated based on the set values. [Parameter setting screen (binarization)] Fig.12 This is an example of a screen according to one embodiment of the present invention. Fig.12 This is a screen for the user of the application to set the binarization. The user can set (for example, change from the initial value) the parameters related to the binarization. In addition, instead of the user inputting the values ​​of various settings, the alloy composition calculation device 10 may determine the optimal values. [Parameter setting screen (contraction and expansion)] Fig.13 This is an example of a screen according to one embodiment of the present invention. Fig.13 This is a screen for the user of the application to set shrinkage and expansion. The user can set (for example, change from the initial value) the parameters related to shrinkage and expansion. In addition, instead of the user inputting various setting values, the alloy composition calculation device 10 may determine the optimal value. [Parameter setting screen (noise removal)] Fig.14 This is an example of a screen according to one embodiment of the present invention. Fig.14 This is a screen for the user of the application to set noise removal. The user can set (for example, change from the initial value) the parameters for noise removal. In the case where there is a small area suitable for processing as noise, the area below the specified area can be excluded from the analysis object. In addition, instead of the user inputting various setting values, the alloy composition calculation device 10 can determine the optimal value. [Parameter setting screen (for analysis)] Fig.15 This is an example of a screen according to one embodiment of the present invention. Fig.15 This is a screen for application users to perform settings for analysis. When the user selects "Data Analysis" in the parameter setting screen (for analysis), data analysis (i.e., calculation of the alloy composition) is performed. For the alloy composition calculated for each particle, the distribution of the deflection angle based on the polar coordinates, such as the default selected average value, is displayed on the particle area in an overlapping manner for each particle. The minimum value of the deflection angle θ set by the user in "Specify the minimum value of Theta" on the parameter setting screen (for analysis) is used as the range of the deflection angle θ in the heat map of the deflection angle θ of each pixel (details will be described later). The composition of the set minimum value is displayed (in Fig.15 In the example, element A is 22.28% and element B is 77.72%). The maximum value of the deflection angle θ set by the user in "Specify the maximum value of Theta" on the parameter setting screen (for analysis) is used as the range of the deflection angle θ in the heat map of the deflection angle θ of each pixel (details will be described later). The composition of the set maximum value is displayed (in Fig.15 In the example, element A is 26.68% and element B is 73.32%). When the user selects "data save" on the parameter setting screen (for analysis), the data of the analysis result is saved. When the user selects "Select another data" in the parameter setting screen (for analysis), the user can reselect data of another alloy and data of each element. [Analysis results] Fig.16 This is an example of a screen according to one embodiment of the present invention. Fig.16 This is a screen showing the results of the analysis for the selected particle (an example of visualization of the alloy composition). The horizontal axis represents the deflection angle θ of the polar coordinates, and the vertical axis represents the number of pixels for which each deflection angle θ is calculated. Fig.16 The bar on the right in represents the intensity of red, which is proportional to the intensity of brightness. In this way, the deflection angle θ of each pixel can be histogrammed. The statistical value calculated based on the histogram corresponds to the deviation of the alloy composition of the particles. The smaller the deflection angle θ is, Fig.16 The higher the brightness of element B, the larger the deflection angle θ. Fig.16 The higher the brightness of element A. In this way, the alloy composition calculation device 10 can display the distribution of the deflection angle θ of the polar coordinates (that is, the deflection of element A and element B) for each particle of the alloy or each image of the alloy. Fig.16 The dotted line represents the deflection angle θ corresponding to the set value (the composition of the alloy data selected by the user and input on the initial screen). Ideally, if there is no deviation, the data will converge on the set value (dotted line). Furthermore, by representing the number of pixels according to different distances from the origin of the polar coordinates (e.g., Fig.16 As shown in the figure, the different concentrations of the colors are shown separately), and the detailed content of r in each deflection angle θ can be visualized. In this way, the alloy composition calculation device 10 can display the distribution of the deflection angle θ of the polar coordinates (i.e., the deflection of element A and element B) and the distribution of the distance of the polar coordinates from the origin (i.e., the amount of the element) for each particle of the alloy or each image of the alloy. Fig.17 This is an example of a screen according to one embodiment of the present invention. Fig.17 This is a screen showing the analysis results (an example of visualization of alloy composition). The vertical axis represents the brightness of the element image of element A, and the horizontal axis represents the brightness of the element image of element B. Fig.17 The bar on the right of the graph represents the intensity of blue, which is proportional to the number of corresponding brightnesses. The number of pixels of each brightness can be displayed separately (e.g., Fig.17 As shown, the different concentrations of the colors are displayed separately. In this way, the brightness of each pixel can be heat-mapped (i.e., the frequency distribution of the brightness can be visualized). Fig.17 The dotted line (diagonal line) represents the brightness corresponding to the set value (the composition of the alloy data entered on the initial screen and selected by the user). Ideally, if there is no deviation, the data is concentrated on Fig.17 Thus, in one embodiment of the present invention, the correlation coefficient between the brightness of element A and the brightness of element B can be visualized. Fig.18 This is an example of a screen according to one embodiment of the present invention. Fig.18 This is a screen showing the analysis results (an example of visualization of alloy composition). Fig.18 As shown on the left side of , the deflection angle θ of each pixel can be thermally mapped. Fig.18 As shown on the right side of , the thermal map of the range of the deflection angle θ input on the parameter setting screen (for analysis) can also be represented by a single color. Fig.19 This is an example of a screen according to one embodiment of the present invention. Fig.19 This is a screen showing the results of the analysis (an example of visualization of the alloy composition). In this way, the centroid (the center of the brightness of the particle area), the center of gravity of the brightness of element A, and the center of gravity of the brightness of element B can be shown. From the positional relationship (distance and angle) between the centroid (the center of the brightness of the particle area) and the center of gravity of the brightness of each element, the bias of each element can be known. <Bias of alloy composition> In one embodiment of the present invention, the deflection angle θ of each pixel is histogrammed, and at least one of the standard deviation of the histogram, the central value of the histogram, the average value of the histogram, and the skewness of the histogram is used to represent the bias of the alloy composition. For example, the alloy composition calculation device 10 uses the area (nm) of the image. 2) , the standard deviation of the histogram, the central value of the histogram, the skewness of the histogram, the average brightness of each element, and the correlation coefficient of the brightness of each element in the heat map of the brightness of each pixel can show the bias of the alloy composition. In addition, for example, the alloy composition calculation device 10 uses the positional relationship (distance and angle) between the center of the brightness of the particle area and the center of gravity of the brightness of each element to show the bias of the alloy composition. <Effect> As described above, in one embodiment of the present invention, the composition bias of the alloy can be calculated based on the brightness of the image of each element of the alloy, and can be visualized or quantified. As mentioned above, although embodiment of this invention is described in detail, this invention is not limited to the said specific embodiment, Various deformation|transformation and change are possible within the range of the summary of this invention described in a claim. Industrial Availability The alloy composition calculated by the alloy composition calculation device of the present invention can be used as a suitable index in quantitative comparison between alloy particles or between production batches of alloys. This international application claims priority based on Japanese Patent Application No. 2022-094234 filed on June 10, 2022, the entire contents of which are incorporated herein by reference.

Explanation of symbols

Claims

1. An alloy composition calculation device, comprising: An image acquisition unit, which acquires images of each element of the alloy; a brightness determination unit, which determines a point of an orthogonal coordinate system with the brightness of each element image as an axis according to each brightness at the same coordinate on each element image; as well as The composition calculation unit calculates the deflection angle of the polar coordinates of the point as the alloy composition.

2. The alloy composition calculation device according to claim 1, wherein: The composition calculation unit calculates the alloy composition for each particle of the alloy or each image of the alloy.

3. The alloy composition calculation device according to claim 1 or 2, wherein: The composition calculation unit calculates the alloy composition based on the distribution of the calculated deflection angles of the polar coordinates.

4. The alloy composition calculation device according to claim 3, wherein: The alloy composition is at least one of a standard deviation, a median, an average, and a skewness.

5. The alloy composition calculation device according to any one of claims 1 to 4, wherein: The device further includes a visualization unit for visualizing the alloy composition based on the calculated deflection angle of the polar coordinates.

6. The alloy composition calculation device according to claim 5, wherein: The visualization unit represents the distribution of the deflection angles of the polar coordinates in a histogram.

7. The alloy composition calculation device according to claim 5, wherein: The visualization unit visualizes the distribution of brightness on each element image.

8. A method performed by an alloy composition calculation device, comprising the following steps: Obtain images of each element of the alloy; Determining, according to each brightness at the same coordinate on each element image, a point of an orthogonal coordinate system with each brightness of each element image as an axis; and The deflection angle of the polar coordinates of the point is calculated as the alloy composition.

9. A program for causing an alloy composition calculation device to function as follows: An image acquisition unit, which acquires images of each element of the alloy; a brightness determination unit, which determines a point of an orthogonal coordinate system with the brightness of each element image as an axis according to each brightness at the same coordinate on each element image; as well as The composition calculation unit calculates the deflection angle of the polar coordinates of the point as the alloy composition.

10. A system comprising an alloy composition calculation device, an alloy observation device and an alloy manufacturing device, The alloy composition calculation device comprises: An image acquisition unit that acquires images of each element of the alloy from the alloy observation device; a brightness determination unit, which determines a point of an orthogonal coordinate system with the brightness of each element image as an axis according to each brightness at the same coordinate on each element image; as well as A composition calculation unit calculates the deflection angle of the polar coordinates of the point as the alloy composition, The alloy manufacturing device manufactures the alloy based on the result calculated by the alloy composition calculating device.

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