Method for testing irradiation intensity of area light source device

Abstract

The invention belongs to the technical field of optoelectronic equipment testing, and particularly relates to a method for testing irradiation intensity of an area light source device, which comprises the following steps of: firstly, dividing the area light source device into a plurality of test areas, and numbering each area; secondly, acquiring the irradiation intensity of each test area in real time by using a high-precision optical sensor array; then, the collected analog signals are converted into digital signals through an A / D conversion circuit, and the digital signals are transmitted to a data processing unit; then, the data processing unit calculates the irradiation intensity value of each area, and analyzes the uniformity and consistency of the overall irradiation intensity distribution; and finally, displaying a test result through an upper computer control system, and generating an irradiation intensity distribution diagram. Through the high-precision sensor array and the data processing technology, the irradiation intensity distribution of the area light source device can be rapidly and accurately tested, a reliable basis is provided for light source performance optimization, and the method has the advantages of being efficient, accurate and high in practicability.

Description

Technical Field

[0001] The present invention belongs to the technical field of optoelectronic device testing, and particularly relates to a method for testing the irradiation intensity of a surface light source device. Background Art

[0002] Surface light source devices are widely used in fields such as light curing, exposure machines, and medical treatment. In the prior art, there are certain problems in the testing of the irradiation intensity of surface light source devices. Traditional testing methods usually adopt the method of randomly selecting points, and a small number of test points are selected for measurement within the effective irradiation area of the surface light source device. For traditional point light sources or strip light sources, due to the integration and filtering of the optical path by optical devices, the energy uniformity is less affected by the light source, and this random point selection testing method is feasible. However, for a surface light source device composed of multiple LED lamp beads, due to factors such as differences in the LED lamp beads themselves and processing errors, there are differences in the energy of each point, and it is difficult to accurately find the highest and lowest points of the actual energy by using the random point selection testing method, and the testing accuracy is low.

[0003] Most of the testing methods in the prior art are off-line testing, that is, the surface light source device to be tested is taken out for testing after the irradiation reaches the target dose, and the change of the irradiation intensity of the surface light source device cannot be monitored in real time. In addition, the prior art cannot effectively evaluate the aging performance of the surface light source device, and cannot analyze the attenuation characteristics of the light source by monitoring the change of the irradiation intensity for a long time.

[0004] The prior art cannot perform high-precision and real-time testing and evaluation on the irradiation intensity of the surface light source device, and cannot effectively monitor the aging performance of the surface light source device. There is an urgent need for a new testing method to solve the above problems. Summary of the Invention

[0005] In view of the above technical problems that the prior art cannot perform high-precision and real-time testing and evaluation on the irradiation intensity of the surface light source device and cannot effectively monitor the aging performance of the surface light source device, the present invention provides a method for testing the irradiation intensity of a surface light source device.

[0006] In order to solve the above technical problems, the technical solution adopted by the present invention is as follows:

[0007] A method for testing the irradiation intensity of a surface light source device includes the following steps:

[0008] Step 1: Divide the light-emitting surface of the surface light source device into n test areas, and sequentially number each area as 1, 2,..., i,..., n;

[0009] Step 2: Use a high-precision optical sensor array to collect the irradiation intensity of each test area in real time, where each optical sensor corresponds to a test area;

[0010] Step 3: Convert the collected analog signals into digital signals through an A / D conversion circuit and transmit them to the data processing unit through a UART communication interface;

[0011] Step 4: The data processing unit filters, calibrates, and normalizes the digital signals, and calculates the irradiation intensity values of each test area;

[0012] Step 5: Display the test results through the host computer control system, including the irradiation intensity values of each test area, the irradiation intensity distribution map, the uniformity and consistency analysis results, and generate a test report.

[0013] Each photosensor of the high-precision photosensor array in Step 2 is calibrated by a standard light source to eliminate measurement errors.

[0014] The resolution of the A / D conversion circuit in Step 3 is not less than 16 bits, and the sampling frequency of the A / D conversion circuit is not less than 1 kHz.

[0015] The normalization process in Step 4 uses a dynamic calibration algorithm based on the sensor linear response curve.

[0016] The method for calculating the irradiation intensity value of each test area in Step 4 is as follows:

[0017]

[0018] where E i＝1…n is the irradiation intensity value of the i-th test area, is the average irradiation intensity value of all test areas, and n is the total number of test areas.

[0019] The graphical interface of the host computer control system in Step 5 supports multi-dimensional data analysis, including the synchronous display of heat maps, curve graphs, and statistical tables.

[0020] The generation method of the irradiation intensity distribution map in Step 5 includes a spatial interpolation algorithm for compensating for the physical interval error of the sensor array.

[0021] The test report in Step 5 contains the light source aging assessment results, fitting an attenuation model through long-term irradiation intensity data and predicting the service life.

[0022] Compared with the prior art, the beneficial effects of the present invention are:

[0023] The present invention combines high-density sensor array partition detection with a dynamic calibration algorithm to achieve a measurement accuracy of ±1.5%, which is 3 times higher than the resolution of the traditional dot scanning method. The spatial interpolation algorithm of the present invention controls the physical spacing error to an equivalent accuracy of 0.2mm, ensuring the detectability of small irradiation differences. In addition, by establishing an irradiation intensity attenuation model, the present invention can predict the error range of the light source life within ±5%, which is 3 times higher than the accuracy of the traditional empirical estimation method. Long-term monitoring data can generate an 8-dimensional aging assessment report, covering key parameters such as light decay curves and failure warnings. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the implementation methods of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for the implementation methods or the description of the prior art. Obviously, the drawings in the following description are only exemplary, and for ordinary technicians in this field, other implementation drawings can be derived from the provided drawings without creative work.

[0025] The structures, proportions, sizes, etc. illustrated in this specification are only used to match the contents disclosed in the specification so as to facilitate understanding and reading by persons familiar with the technology. They are not used to limit the conditions under which the present invention can be implemented, and therefore have no substantial technical significance. Any structural modification, change in proportion or adjustment of size shall still fall within the scope of the technical contents disclosed in the present invention without affecting the effects and purposes that can be achieved by the present invention.

[0026] Figure 1 It is a flow chart of the steps of the present invention. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. These descriptions are only to further illustrate the features and advantages of the present invention, rather than to limit the claims of the present invention. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0028] The specific implementation of the present invention is further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0029] This embodiment provides a method for testing the irradiance intensity of a surface light source device. Figure 1As shown in the figure, the light-emitting surface of the surface light source device is divided into multiple test areas, and each area is numbered in the order of 1, 2... i... n; according to the size of the light-emitting area of the surface light source device, it is divided into 400 test areas of 20×20. Each test area has the same area. Each test area is numbered in the order of 1, 2... i... 400, and the number of each test area and its corresponding position coordinates are recorded.

[0030] The irradiation intensity of each test area is collected in real time by using a high-precision light sensor array, which includes 400 sensors. Each light sensor corresponds to a test area. The light sensor array is placed 0 cm above the light-emitting surface of the surface light source device, so that each light sensor exactly corresponds to a test area. The surface light source device is turned on to emit light, and the light sensor array collects the irradiation intensity of each test area in real time.

[0031] After all areas are collected, the collected analog signals are converted into digital signals through an A / D conversion circuit and transmitted to the data processing unit. The A / D conversion circuit converts the collected analog signals into 16-bit digital signals and transmits the digital signals to the data processing unit through a UART communication interface. The data processing unit receives the digital signals and performs quadratic curve calibration and normalization processing on them.

[0032] The data processing unit calculates the irradiation intensity value of each test area and analyzes the uniformity and consistency of the overall irradiation intensity distribution. According to the processed digital signals, it calculates the irradiation intensity value of each test area; calculates the minimum irradiation intensity value E min , the maximum irradiation intensity value E max , and calculates the average irradiation intensity value E avg of all test areas;

[0033] According to the formula calculates the uniformity of the irradiation intensity distribution; where: E i＝1…n is the irradiation intensity value of the i-th test area, is the average irradiation intensity value of all test areas, and n is the total number of test areas, which is 400.

[0034] The test results are displayed through the host computer control system, and an irradiation intensity distribution map is generated. The change trend of the irradiation intensity of the surface light source device is monitored and recorded in real time, and a test report is generated. According to the long-term monitored irradiation intensity change data, the aging performance and light source attenuation characteristics of the surface light source device are analyzed.

[0035] The above only elaborates in detail on the preferred embodiments of the present invention. However, the present invention is not limited to the above embodiments. Within the scope of knowledge possessed by those of ordinary skill in the art, various changes can be made without departing from the gist of the present invention, and all such changes should be included within the protection scope of the present invention.

Claims

1. A method for testing the irradiance intensity of a surface light source device, characterized in that: The following steps are involved: Step 1: Divide the light-emitting surface of the surface light source device into n test areas, and number each area in sequence as 1, 2, ..., i, ..., n; Step 2: Use a high-precision light sensor array to collect the irradiance intensity of each test area in real time, where each light sensor corresponds to one test area; Step 3: convert the collected analog signal into a digital signal through an A / D conversion circuit, and transmit it to a data processing unit through a UART communication interface; Step 4: The data processing unit filters, calibrates and normalizes the digital signal to calculate the radiation intensity value of each test area; Step 5: Display the test results through the host computer control system, including the irradiation intensity value of each test area, irradiation intensity distribution diagram, uniformity and consistency analysis results, and generate a test report.

2. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: In the step 2, each light sensor of the high-precision light sensor array is calibrated by a standard light source to eliminate measurement errors.

3. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: The resolution of the A / D conversion circuit in step three is not less than 16 bits, and the sampling frequency of the A / D conversion circuit is not less than 1 kHz.

4. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: The normalization process in step 4 adopts a dynamic calibration algorithm based on the linear response curve of the sensor.

5. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: The method for calculating the irradiance value of each test area in step 4 is: Among them, E i＝1…n is the irradiance value of the i-th test area, is the average irradiance value of all test areas, and n is the total number of test areas.

6. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: The graphical interface of the host computer control system in step 5 supports multi-dimensional data analysis, including the simultaneous display of thermal maps, curve graphs and statistical tables.

7. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: The method for generating the irradiance intensity distribution diagram in step five includes a spatial interpolation algorithm for compensating for the physical spacing error of the sensor array.

8. The method for testing the irradiance intensity of a surface light source device according to claim 1, characterized in that: The test report in step 5 includes the light source aging assessment results, and the attenuation model is fitted through long-term irradiation intensity data to predict the service life.

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