Test method, test system, device and equipment of energy storage control system and storage medium

Abstract

The invention relates to a test method, a test system, a device and equipment for an energy storage control system and a storage medium. The method comprises the following steps: receiving test indication information, simulating associated equipment connected with equipment to be tested in the energy storage control system according to the test indication information, and determining simulation associated parameters; and testing the to-be-tested equipment according to the simulation correlation parameters and the test indication information, and receiving a test result of the to-be-tested equipment. In the test method, the test device can simulate any device associated with the device to be tested in the energy storage control system, specifically, the test device can simulate interface implementation and function execution logic implementation of any device, and the simulated interface implementation or function implementation is realized by simulating the associated parameters. Therefore, the test process is not limited to test the to-be-tested equipment of a specific type, various types of tests can be realized, and the applicability of the test method is improved to a certain extent.

Description

Technical Field

[0001] The present application relates to the technical field of flexible DC energy storage valve testing, and particularly to a testing method, testing system, device, equipment and storage medium for an energy storage control system. Background Art

[0002] As the "brain" of the energy storage valve product, the flexible DC energy storage valve control and protection system plays a key role in the power conversion between the flexible DC system and the battery control system. This control and protection system cooperates with multiple systems such as the flexible DC control system, valve cooling system, fire protection system, battery control system, and sub-module control system to achieve functions such as starting, charge and discharge control, and protection of the energy storage valve.

[0003] In related technologies, the testing system of the energy storage valve control system usually uses a relay protection tester to verify some interface functions, and most of the tests can only be completed in the scenario of shutdown state, partial control, and some control and protection functions being withdrawn. However, the above relay protection tester is difficult to meet the testing requirements of the control and protection system of the energy storage valve control. Summary of the Invention

[0004] Based on this, it is necessary to provide a testing method, testing system, device, equipment and storage medium for an energy storage control system, which can efficiently test the control and protection system of the energy storage valve control according to the testing requirements.

[0005] In a first aspect, the present application provides a testing method for an energy storage control system. The testing method is applied to a testing device and includes:

[0006] Receiving test instruction information;

[0007] According to the test instruction information, simulating associated devices connected to the device under test in the energy storage control system to determine simulated associated parameters; the simulated associated parameters include simulated interface parameters or simulated function parameters;

[0008] According to the simulated associated parameters and the test instruction information, testing the device under test and receiving the test result of the device under test.

[0009] The test method of the energy storage control system described in the embodiments of the present application receives test instruction information, simulates the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determines the simulated association parameters; tests the device under test according to the simulated association parameters and the test instruction information, and receives the test results of the device under test. In the above test method, the test device can simulate any device associated with the device under test in the energy storage control system, specifically, it can simulate the interface implementation and function execution logic implementation of any device, and realizes the above-mentioned simulated interface implementation or function implementation through the simulated association parameters, so that the above test method can complete the test by performing data interaction with the device under test through the simulated interface implementation or function logic implementation. Therefore, the test process is not limited to testing specific types of devices under test, and can implement various types of tests, such as interface testing of the device under test or function testing of the device under test, which improves the applicability of the test method to a certain extent.

[0010] In one embodiment, the step of simulating the associated devices connected to the device under test in the energy storage control system according to the test instruction information and determining the simulated association parameters includes:

[0011] Obtain a preset point allocation table;

[0012] Simulate the associated devices according to the preset point allocation table and the test type indicated by the test instruction information, and determine the simulated association parameters.

[0013] The method described in the embodiments of the present application can configure the associated devices through a preset point allocation table, thereby simulating the associated devices of any type of device under test on the local machine, and realizing various types of tests by switching the test modules implemented by any type of simulated association parameters to perform information interaction with the device under test. This test process does not require testing based on the device under test and actual associated devices, which simplifies the physical machines required for testing to a certain extent, especially when performing various types of tests. Moreover, the test device itself occupies a small space, that is, it does not require a large-area layout of physical machines and is not restricted by any environment, which improves the applicability of the method to a certain extent.

[0014] In one embodiment, the simulated association parameters include simulated interface parameters. The step of simulating the associated devices according to the preset point allocation table and the test type indicated by the test instruction information to obtain the simulated association parameters includes:

[0015] If the test type indicated by the test instruction information is interface testing, extract the interface configuration information from the preset point allocation table;

[0016] Configure the relevant interfaces of each type in the associated devices according to the interface configuration information to obtain the simulated interface parameters.

[0017] In the method described in the embodiment of the present application, by configuring various types of relevant interfaces in the associated device through a preset point allocation table, it is possible to simulate any type of interface on the local machine, and to implement information interaction between the test interface and the corresponding interface in the device under test by switching the simulation interface parameters of any type, so as to achieve various types of interface tests. This test process does not require testing based on the actual interfaces of the device under test and the associated device, which improves the applicability of this method to a certain extent.

[0018] In one embodiment, the simulated association parameters include simulated function parameters. The step of simulating the associated device connected to the device under test in the energy storage control system according to the preset point allocation table and the test type indicated by the test indication information to obtain the simulated association parameters includes:

[0019] If the test type indicated by the test indication information is a function test, extract the test logics of each function module in the associated device from the preset point allocation table;

[0020] Perform logic circuit configuration according to the test logics of each function module in the associated device to generate the simulated function parameters.

[0021] In the method described in the embodiment of the present application, by configuring each function module in the associated device through a preset point allocation table, it is possible to simulate the test logics of each function on the local machine, that is, to configure a test module on the local machine to implement the corresponding functions of the simulated associated device, and to implement information interaction between the function module implemented by the simulated function parameters and the device under test to achieve the corresponding function test. This test method can test the correctness of the execution logics of each function implemented on the device under test, that is, it can test the software process.

[0022] In one embodiment, the step of obtaining the preset point allocation table includes:

[0023] Receive the preset point allocation table; the preset point allocation table includes interface configuration information of at least one type of relevant interface and function configuration information of at least one type of function module; each piece of interface configuration information includes the operating parameters of the corresponding interface, and each piece of function configuration information includes the test logic of the corresponding function module.

[0024] The method described in the embodiment of the present application can receive the preset point allocation table to configure the test module on the local machine, which can achieve rapid configuration and thus improve the test efficiency.

[0025] In one embodiment, the step of testing the device under test according to the simulated association parameters and the test indication information and receiving the test result of the device under test includes:

[0026] Parse the test indication information to obtain a first test task;

[0027] Configure the test module of the local device according to the simulation association parameters, and drive the configured test module to execute the first test task to test the device under test, and receive the test results obtained by the device under test after testing based on the first test task.

[0028] The test method provided by the embodiments of the present application only needs to issue test indication information to the test device, and the test device can automatically parse the test task according to the test indication information and automatically simulate any associated device to complete the test, that is, a fully automatic test method for the energy storage control system is realized.

[0029] In one embodiment, the simulation association parameters include simulation function parameters, the test module includes a function module, and driving the configured test module to execute the first test task to test the device under test and receiving the test results obtained by the device under test after testing based on the first test task includes:

[0030] Drive the configured function module to generate exception information according to the test parameters in the first test task; the simulation function parameters include any one of input function parameters, network communication function parameters, optical fiber communication function parameters, and output function parameters;

[0031] Send the exception information to the device under test for testing, and receive the test results obtained by the device under test after testing based on the first test task.

[0032] The method described in the embodiments of the present application realizes a short-time fault insertion test function, and through simulation to generate exception information for testing, the test can be refined to abnormal simulations such as cyclic redundancy check and frame loss of high-level communication interfaces, and various faults with a duration of microseconds can also be simulated.

[0033] In one embodiment, the exception information includes an exception message, and sending the exception information to the device under test for testing and receiving the test results obtained by the device under test after testing based on the first test task includes:

[0034] Send the exception message to the device under test for testing according to a preset sending period, and receive the test results obtained by the device under test after testing based on the first test task.

[0035] The method described in the embodiments of the present application realizes a short-time fault insertion test function, and through simulation to generate exception message for testing, the test can be refined to abnormal simulations such as cyclic redundancy check and frame loss of high-level communication interfaces, and various faults with a duration of microseconds can also be simulated.

[0036] In one embodiment, the simulation correlation parameter includes a simulation interface parameter. The configured test module drives the execution of the first test task to test the device under test, and receives the test result obtained after the device under test is tested based on the first test task, including:

[0037] Generate an abnormal signal according to the test parameter in the first test task and the type of the simulation interface parameter;

[0038] Drive the configured test module to send the abnormal signal to the device under test for testing, and receive the test result obtained after the device under test is tested based on the first test task.

[0039] The method described in the embodiments of the present application realizes another fault injection test function, and through the simulation generation of abnormal signals for testing, the test can be refined to the abnormal simulation such as cyclic redundancy check and frame loss of a high-level communication interface.

[0040] In one embodiment, the first test task includes multiple test subtasks. The configured test module drives the execution of the first test task to test the device under test, and receives the test result obtained after the device under test is tested based on the first test task, including:

[0041] Determine the first test parameter according to the first test subtask in the first test task;

[0042] Drive the configured test module to generate the first operating parameter according to the first test parameter;

[0043] Send the first operating parameter to the device under test for testing, and receive the first test result obtained after the device under test is tested based on the first operating parameter;

[0044] In the case that the first test result indicates that the device under test is in a normal working state, determine a new first test parameter and a new first operating parameter according to the next test subtask, and return to execute the step of driving the configured test module to generate the first operating parameter according to the first test parameter until all the test subtasks are completed.

[0045] The method described in the embodiments of the present application implements a continuous state testing method or a continuous logic testing method, that is, the test is completed by simulating the interaction mode among the battery controller, the sub-module controller, and the valve control protection system, which can improve the test efficiency. In addition, the testing method provided by the embodiments of the present application performs tests by parsing multiple test subtasks, implementing a fully automatic testing method, and can also test complex logical relationships by editing the logical relationships among multiple test subtasks.

[0046] In one embodiment, the method further includes:

[0047] Establish a communication connection between the configured test module and the device under test;

[0048] Send the second operating parameter to the device under test, and receive the second test result obtained by the device under test after testing based on the second operating parameter;

[0049] When the second test result indicates that the device under test is in a fault clearing state, execute the step of parsing the test indication information to obtain the first test task.

[0050] The embodiments of the present application implement a fault detection method, that is, fault detection can be completed based on multiple interaction steps, that is, an automatic fault detection method is implemented.

[0051] In one embodiment, the establishing a communication connection between the configured test module and the device under test includes:

[0052] Extract communication protocol information from a preset point allocation table;

[0053] Establish a communication connection between the configured test module and the device under test according to the communication protocol information.

[0054] In the embodiments of the present application, a communication connection between the configured test module and the device under test is established through a preset point allocation table. Since the preset point allocation table is a tree structure, the communication connection can be quickly established based on the preset point allocation table, which can improve the test efficiency.

[0055] In one embodiment, the method further includes:

[0056] Report the test result to the host computer.

[0057] In the method described in the embodiments of the present application, the test device can report the test result of each test subtask or test task to the host computer, so that the user of the host computer can view the test result in time, or update or modify the test parameters according to the test result, and then send a new test indication information for testing.

[0058] Second aspect, the present application provides a test system for energy storage valve control. The test system includes a host computer, a test device, and an energy storage control system; the energy storage control system at least includes a sub-module controller, a main control chassis, and an expansion device;

[0059] The test device is configured to receive the test instruction information sent by the host computer, simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, determine the simulated association parameters, test the device under test according to the simulated association parameters and the test instruction information, and receive the test results of the device under test; the simulated association parameters include simulated interface parameters or simulated function parameters.

[0060] Third aspect, the present application provides a test device for an energy storage control system. The test device includes:

[0061] A receiving module, configured to receive test instruction information;

[0062] A simulation module, configured to simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determine the simulated association parameters; the simulated association parameters include simulated interface parameters or simulated function parameters;

[0063] A test module, configured to test the device under test according to the simulated association parameters and the test instruction information, and receive the test results of the device under test.

[0064] Fourth aspect, the present application provides a test device for an energy storage control system. The test device includes:

[0065] A sending module, configured to send test instruction information to the test device;

[0066] A receiving module, configured to receive the test results returned by the test device after testing the device under test according to the test instruction information by simulating the associated devices connected to the device under test in the energy storage control system to obtain the simulated association parameters; the simulated association parameters include simulated interface parameters or simulated function parameters.

[0067] Fifth aspect, the present application further provides a computer device. The computer device includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the method described in the first aspect or the second aspect above is implemented.

[0068] Sixth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, and when the computer program is executed by a processor, the method described in the first aspect or the second aspect above is implemented.

[0069] The above description is only an overview of the technical solution of this application. In order to understand the technical means of this application more clearly, it can be implemented in accordance with the content of the specification. And in order to make the above and other purposes, features and advantages of this application more obvious and understandable, the following specific embodiments of this application are specifically given. BRIEF DESCRIPTION OF THE DRAWINGS

[0070] By reading the following detailed description of the preferred embodiments, various other advantages and benefits will become clear to those of ordinary skill in the art. The drawings are only for the purpose of showing the preferred embodiments and are not considered to be a limitation of this application. Moreover, in all the drawings, the same reference numerals are used to represent the same components. In the drawings:

[0071] Figure 1 It is a schematic structural diagram of a test system in one embodiment;

[0072] Figure 2 It is a schematic flowchart of a test method for an energy storage control system in one embodiment;

[0073] Figure 3 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0074] Figure 4 It is a schematic diagram of a preset point allocation table in one embodiment;

[0075] Figure 5 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0076] Figure 6 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0077] Figure 7 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0078] Figure 8 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0079] Figure 9 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0080] Figure 10 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0081] Figure 11 It is a schematic flowchart of a test method for an energy storage control system in another embodiment;

[0082] Figure 12Schematic flowchart of the test method for the energy storage control system in another embodiment;

[0083] Figure 13 Schematic flowchart of the test method for the energy storage control system in another embodiment;

[0084] Figure 14 Schematic flowchart of the test method for the energy storage control system in another embodiment;

[0085] Figure 15 Schematic flowchart of the test method for the energy storage control system in another embodiment;

[0086] Figure 16 Schematic flowchart of the test method for the energy storage control system in another embodiment;

[0087] Figure 17 Schematic structural diagram of the test device for the energy storage control system in one embodiment;

[0088] Figure 18 Internal structure diagram of a computer device in one embodiment. Detailed implementation manners

[0089] In order to make the objectives, technical solutions and advantages of the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0090] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above drawings are intended to cover non-exclusive inclusion.

[0091] In the description of the embodiments of this application, technical terms such as "first" and "second" are only used to distinguish different objects and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity, specific order or primary-secondary relationship of the indicated technical features. In the description of the embodiments of this application, "a plurality of" means two or more unless otherwise specifically defined.

[0092] References to "embodiments" in this specification mean that specific features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0093] As the "brain" of the flexible DC energy storage valve control, the control and protection system plays a key role in the power conversion between the flexible DC system and the battery control system. This control and protection system cooperates with multiple systems such as the flexible DC control system, valve cooling system, fire protection system, battery control system, and sub-module control system, and realizes functions such as starting, charge and discharge control, and protection of the energy storage valve.

[0094] However, at present, the control and protection system of the energy storage valve control lacks a static test system and method like that of relay protection products. The static test of the control and protection system often also relies on a relay protection tester to verify some interface functions. For example, it is difficult to test different forms of optical fiber communication such as Gigabit Ethernet, FT3, and Aurora. At the same time, the control and protection system of the energy storage valve control lacks an effective test system, resulting in a situation where when the system is in a shutdown state and some control and protection functions are withdrawn, it is difficult to test or verify some test requirements such as electromagnetic compatibility (EMC) tests, climate environment tests, and mechanical performance tests using the above relay protection tester. In addition, the system using a relay protection tester for testing or verification requires a large number of physical objects, the entire test platform is heavy and occupies a large area, making it difficult to move and set up, not suitable for EMC, climate environment, mechanical performance, etc. tests, and the above test system cannot achieve automated testing. In view of the above problems, the embodiments of the present application provide a test method and a test system for energy storage valve control. The following embodiments will specifically illustrate the test method and test system described in the embodiments of the present application.

[0095] The test method for energy storage control and protection provided by the embodiments of the present application can be applied to, for example Figure 1In the shown test system 1. The test system includes a host computer 102, a test device 104, and an energy storage valve control protection system 106. The test device 104 is respectively connected to the host computer 102 and the energy storage valve control protection system 106. Among them, the host computer 102 can communicate with the test device 104 in a wired or wireless manner. The test device 104 can communicate with the energy storage valve control protection system 106 in a wired or wireless manner. The host computer 102 can be, but is not limited to, various personal computers, laptop computers, smart phones, tablet computers, Internet of Things devices, and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart in-vehicle devices, etc. The portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. Optionally, the host computer 102 can also be implemented by an independent server or a server cluster composed of multiple servers. The test device 104 can be used to simulate any device or apparatus in the energy storage valve control protection system 106, and it can be, but is not limited to, various personal computers, laptop computers, smart phones, tablet computers, servers, etc. The energy storage valve control protection system 106 at least includes a sub-module controller 1061, a main control chassis 1062, and an expansion device 1063.

[0096] Those skilled in the art can understand that Figure 1 the test system shown in is only a block diagram of part of the structure related to the solution of this application, and does not constitute a limitation on the test system to which the solution of this application is applied. The specific test system may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0097] In one embodiment, as Figure 2 shown, a test method for energy storage control and protection is provided. Taking the test device in Figure 1 as an example for description, it includes the following steps:

[0098] S201, receive test instruction information.

[0099] Among them, the test instruction information may include test cases, test scripts, status sequences, test parameters, operation parameters, instruction information, etc. The instruction information therein is used to indicate the test type. For example, the instruction information can be used to indicate that the test type is an interface test, that is, it is used to indicate the communication or interaction function test of the interface in the energy storage control system; the instruction information can also be used to indicate that the test type is a function test, that is, it is used to indicate the test of the function logic in the energy storage control system, such as judging and testing the logic for implementing each function.

[0100] Optionally, the test device can receive test instruction information sent by the host computer. The host computer is installed with host computer test software and can interact with the test device through the TCP / IP protocol. The host computer is used for tasks such as monitoring the test device, developing and executing test scripts, and generating test reports. A human-computer interaction interface, an automatic test debugging interface, and a configuration interface for the point allocation table can be set on the host computer. The user can select a test object, edit a test task, or modify test parameters based on the human-computer interaction interface; the user can also send test instruction information for testing based on the automatic test debugging interface; the user can also construct a preset point allocation table based on the configuration interface of the point allocation table. Test instruction

[0101] Among them, the test device is used to simulate various external devices or systems (i.e., associated devices) that communicate with any device in the energy storage control system. For example, the test device can simulate various external systems or devices that communicate with the master control device, including the merging unit, the vehicle stability control (VSC) of the energy storage valve control, the fire protection system, the valve cooling system, etc.; or, the test device can also simulate various external systems or devices that communicate with the expansion chassis, including the sub-module system, etc.; or, the test device can also simulate various external systems or devices that communicate with the sub-module controller, including the energy storage valve control system, the battery control system, the disconnector, the bypass switch, the insulated-gate bipolar transistor (IGBT), etc. The test device is installed with test software, which has configuration processing functions, including supporting configuration file parsing and distribution functions, including the point allocation table for communication between the test device and the host computer, and the configuration information of each hardware board and interface at the bottom layer of the test device. Optionally, the test device includes a test task execution engine for parsing the status sequence included in the test instructions sent by the host computer and executing each parsed test task, and the jump conditions between each test task are judged by the test device. Optionally, a program for communicating with the test software of the host computer is set on the test device, including single and multiple data reading and writing, test task sending, file transfer, exception message, exception signal generation, etc. Optionally, the test software on the test device also has an event recording function, which will detect the signals marked as events in the point allocation table in real time and record the signals that have changed positions.

[0102] In an embodiment of the present application, when it is necessary to test any device in the energy storage control system, the host computer or other devices can send test instruction information to the test device by issuing a test script, or a test case, or a status sequence, or indication information, and the test device can receive the test instruction information. Optionally, the above test script, or test case, or status sequence, or indication information can be pre-stored in the host computer or other devices, and when the host computer or other devices trigger a test, the host computer or other devices directly retrieve the above test script, or test case, or status sequence, or indication information to generate a test instruction for issuing. Optionally, the user can generate test instruction information by online editing of the above test script, or test case, or status sequence, or indication information for issuing.

[0103] S202, simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determine the simulation association parameters, where the simulation association parameters include simulation interface parameters or simulation function parameters.

[0104] The energy storage control system includes a sub-module controller, a main control chassis, an expansion device, a battery controller, an isolating switch circuit, a bypass switch circuit, an energy storage valve control protection system, etc. The test result includes the test result of testing any device in the energy storage control system. The test of the energy storage control system includes fault testing, status testing, or logical function testing of components or interfaces (or hardware or software). The simulation interface parameters are the implementation parameters of the hardware interface or software interface corresponding to each interface in the energy storage control system implemented by software or hardware on the test device; the simulation function parameters are the implementation parameters of the logic circuit module, or software module, or program module corresponding to each function module or each function item in the energy storage control system implemented by software or hardware on the test device. That is, the corresponding test module on the local machine can be configured through the simulation interface parameters to obtain a simulation interface with a similar interface implementation, and the corresponding test module on the local machine can be configured through the simulation function parameters to obtain a simulation function module with a similar interface implementation.

[0105] The device under test can be any device or any number of devices in the energy storage control system. Correspondingly, the associated devices of the device under test can be each external device or system that communicates with the device under test; for example, when the device under test is the main control device, the corresponding associated devices can be the merging unit, the VSC control protection system, the fire protection system, the valve cooling system, etc.; or when the device under test is the expansion chassis, the corresponding associated devices can be the sub-module system, etc.; or when the device under test is the sub-module controller, the corresponding associated devices can be the energy storage valve control system, the battery control system, the isolating switch, the bypass switch, the IGBT, etc.

[0106] In an embodiment of the present application, after receiving the test instruction information, the test device can further interpret the test instruction information, and interpret the instruction information, test task, test parameters, test cases, test scripts, status sequences, operation parameters, etc. from the test instruction information, and determine the test type according to the instruction of the instruction information therein, and determine the device under test in the energy storage control system that needs to be tested according to the instruction of the instruction information therein. Specifically, the test device can extract the device identifier from the instruction information to identify the device under test; correspondingly, determine its associated device according to the determined device under test. Optionally, after the test device determines the device under test, it can send a data request to the device under test to request the configuration information or configuration file of the device under test, and the device under test feeds back its own configuration information or configuration file to the test device, and the test device can then find the associated device connected to the device under test and the configuration information of the associated device from the configuration information or configuration file according to the type or device identifier of the device under test, and then the test device can determine the simulated association parameters according to the configuration information of the associated device; Optionally, after the test device determines the device under test, the test device can also obtain the preset point allocation table sent by the upper computer or other devices, and find the associated device connected to the device under test and the configuration information of the associated device from the preset point allocation table according to the device identifier of the device under test, and then the test device can determine the simulated association parameters according to the configuration information of the associated device. Optionally, the test instruction information further includes the configuration information of the associated device by the user, that is, the user side can pre-determine the configuration information of the associated device associated with the device under test according to the test requirements and the configuration information of the device under test, and carry the configuration information of the associated device in the test instruction information and send it to the test device. After receiving the test instruction information, the test device can directly simulate the associated device connected to the device under test based on the configuration information of the associated device contained in the test instruction information to determine the simulated association parameters.

[0107] S203. Test the device under test according to the simulated association parameters and the test instruction information, and receive the test result of the device under test.

[0108] In the embodiments of the present application, a test software is installed on the test device. The test software has the function of simulating any device in the energy storage control system. For example, a logic control software can be installed on the test device. By using this logic control software, any function of any device in the energy storage control system can be realized through program code. Thus, by executing the program code, communication or data interaction between the simulated device and the device under test can be achieved to complete the function test. For another example, an interface configuration software can be installed on the test device. By using this interface configuration software, any interface of any device in the energy storage control system can be realized through program code. Thus, by executing the program code, communication or data interaction between the simulated device and the device under test can be achieved to complete the interface test. During specific testing, the test device parses the test instruction information, and parses out the test task, or test case, or test script, or status sequence, or test parameter, or operation parameter, or instruction information from the test instruction information. Then, according to the indication of the instruction information, the device under test and the associated device are determined, and some configuration parameters and implementation parameters for simulating the associated device are determined. That is, after determining the simulated association parameters, communication can be carried out between the device simulated according to the simulated association parameters and the device under test, so as to realize test data interaction to complete the test. During this test process, if the interface type test is to be realized, the test parameters are transmitted between the interface simulated by the simulated interface parameters and the corresponding interface of the device under test to achieve the test; if the function type test is to be realized, the operation parameters are transmitted between the function module simulated by the simulated function parameters and the device under test to achieve the test. It should be noted that if the simulated association parameters are simulated interface parameters, various test modules for realizing the interface functions of the test device support the custom configuration of the interface implementation. The general and private protocols such as the high-speed serial communication protocol, Ethernet protocol, and Aurora protocol can be set through the host computer software or the test software on the test device. If the simulated association parameters are simulated function parameters, various test modules for realizing the functions of the test device support the custom configuration of the function implementation, and at the same time, the test logic for custom editing or modifying the function is available. After the test device completes the test on the device under test, the device under test will feedback the test result to the test device, and the test device can receive the test result.

[0109] Optionally, after receiving the test result, the test device can directly report the test result to the host computer to instruct the host computer to display the test result to the user for analysis, or to instruct the host computer to perform statistical analysis on the test result. Optionally, after receiving the test result, the test device can also analyze the test result to determine whether other task tests need to be continued, and in the case of determining that other task tests are required, continue to trigger the test, that is, communicate with the energy storage control system according to the indication of the test instruction information until all tests are completed, realizing a fully automatic multi-task test.

[0110] The test method of the energy storage valve control according to the embodiment of the present application receives test instruction information, simulates the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determines the simulated association parameters; tests the device under test according to the simulated association parameters and the test instruction information, and receives the test results of the device under test. In the above test method, the test device can simulate any device associated with the device under test in the energy storage control system, specifically, it can simulate the interface implementation and function execution logic implementation of any device, and realizes the above-mentioned simulated interface implementation or function implementation through the simulated association parameters, so that the above test method can complete the test by performing data interaction with the device under test through the simulated interface implementation or function logic implementation. Therefore, the test process is not limited to testing specific types of devices under test, and can implement various types of tests, such as interface tests or function tests of the device under test, which improves the applicability of the test method to a certain extent.

[0111] In one embodiment, a method for performing a test according to a test instruction is provided. That is, when the test device executes the above S202 "simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information to obtain the simulated association parameters", as Figure 3 shown, the specific implementation steps are as follows:

[0112] S301, obtain a preset point allocation table.

[0113] Among them, the preset point allocation table includes the actual interaction data of the hardware interface, the internal parameters of each test module, the configuration information of each test module, the interface parameters of each test module, the test parameters of each test task, the test logic of each functional module, the configuration information of each functional module, etc. Specifically, the preset point allocation table may include the monitoring data, control data, configuration parameters, version information, interaction data, test parameters, functional configuration parameters, test logic, test code, etc. of the test device. Among them, the functional configuration parameters include the relevant functional parameters of optical fiber communication, the relevant functional parameters of input functions, the relevant functional parameters of network communication, and the relevant functional parameters of output functions. The test logic includes the test logic of the relevant functions of pipeline limit communication, the test logic of the relevant functions of input functions, the test logic of the relevant functions of network communication, and the test logic of the relevant functions of output functions. The preset point allocation table can be obtained by the upper computer configuring the point table; alternatively, the preset point allocation table can be a tree structure (see Figure 4In the schematic diagram described above, the root node is the IED, which can be connected to multiple test modules simultaneously. For example, Device1, Device2, etc. Under one test module, there can be two types of groups. One type of group is the actual interaction data group of the hardware interface, which can be divided into multiple groups according to the number of hardware interfaces. For example, for group1 and group2 interfaces, this type of group generally includes configuration information such as board card numbers, channel numbers, and communication rates. The other type of group for test parameters is fixed as cfg, and its child nodes are all internal parameters of the test module, related to the test task and also related to the test logic of the functional module. Each group contains service interaction data, such as Data1 and Data2. The transmitted data is the corresponding reference in the preset point allocation table, and these references are used to identify the path information of the tree-shaped information. For example, Device1.group1.Data1 represents Data1 of group1 of test module 1.

[0114] Optionally, the test device can receive the preset point allocation table sent by the host computer or other devices. The preset point allocation table includes interface configuration information of at least one type of related interface and function configuration information of at least one type of functional module. Each interface configuration information includes the operating parameters of the corresponding interface, and each function configuration information includes the test logic of the corresponding functional module.

[0115] In the embodiment of the present application, the host computer or other devices can configure the point table to obtain the preset point allocation table. After the point allocation table is configured, it can be directly transmitted to the test device through the configuration software on the host computer or other devices to ensure the consistency of the configuration file. After receiving the preset point allocation table, the test device can store it. When the test device receives a test instruction, it can extract the preset point allocation table from the storage space to find the configuration information of the associated device of the device under test. Then, the test device can determine the simulated association parameters based on the configuration information of the associated device, and configure the test module on it according to the simulated association parameters, so that the test module can achieve the same function as the associated device, and further facilitate the later communication test with the device under test based on the test module. For example, the test device can parse the configuration information of the associated device, and configure each group information under the corresponding test module in the point allocation table into each board card hardware of the test device to realize the binding of service information data and registers. During the configuration process, if it is found that the information in the preset point allocation table does not correspond to the actual hardware, the configuration of the test module according to the configuration information in the preset point allocation table will be stopped, and the host computer will be sent a fault code so that the tester can find the cause of the problem according to the fault code. Through the point allocation table, the embodiment of the present application can obtain the configuration information of the associated device, realize rapid configuration, and thus improve the test efficiency.

[0116] S302, simulate the associated device according to the test type indicated by the preset point allocation table and the test indication information, and determine the simulated association parameters.

[0117] In the embodiments of the present application, after receiving the test instruction information, the test device can further interpret the test instruction information, and interpret the instruction information, test tasks, test parameters, test cases, test scripts, status sequences, operation parameters, etc. from the test instruction information, and determine the test type according to the instruction of the instruction information therein, and determine the device under test in the energy storage control system that needs to be tested according to the instruction of the instruction information therein. Specifically, the test device can extract the device identifier from the instruction information to identify the device under test; correspondingly, find its associated device according to the determined device under test; optionally, the test device can also find the associated device for communication connection with the device under test from the preset point allocation table according to the device identifier of the device under test. Optionally, after the test device determines the associated device, it can further extract the configuration information related to the associated device from the preset point allocation table, and determine the simulated association parameters based on the configuration information, and configure the test module on the local machine based on the simulated association parameters, so as to enable the test module to simulate various interface implementations or function implementations of the associated device of the device under test.

[0118] In the method described in the embodiments of the present application, by configuring the associated device through the preset point allocation table, it is possible to simulate the associated device of any type of device under test on the local machine, and realize information interaction between the test module and the device under test through switching any type of simulated association parameters to achieve various types of tests. This test process does not require testing based on the device under test and the actual associated device, which simplifies the physical machine required for testing to a certain extent, especially when performing multiple types of tests. Moreover, the test device itself occupies a small space, that is, it does not require a large-area layout of physical machines and is not restricted by any environment, which improves the applicability of this method to a certain extent.

[0119] In one embodiment, when the above simulated association parameter is a simulated interface parameter, an implementation method for determining the simulated interface parameter of the simulated association parameter is provided, as Figure 5 shown, the method includes:

[0120] S401, if the test type indicated by the test instruction information is an interface test, extract the interface configuration information from the preset point allocation table.

[0121] S402, configure the relevant interfaces of various types in the associated device according to the interface configuration information, and determine the simulated interface parameters.

[0122] Among them, the preset point allocation table includes the interface configuration information and interface configuration parameters of various types of interfaces on any device in the energy storage control system.

[0123] The embodiments of the present application relate to the situation where the simulated correlation parameters are the simulated interface parameters. Based on this, when the test device receives the test indication information, it can extract the indication information therefrom and determine the test type according to the indication information. If the test type is an interface test, it means that the relevant interfaces of the device under test need to be tested. At this time, the test device obtains the preset point allocation table and searches for the associated device connected to the device under test therein. After determining the associated device, it can further determine the various types of relevant interfaces on the associated device that are docked with the device under test, and then extract the interface configuration information and interface configuration parameters of the various types of relevant interfaces docked with the device under test from the preset point allocation table, and determine the simulated interface parameters according to the interface configuration information and interface configuration parameters of each type of interface, and configure the corresponding implementation interface on the local machine based on the simulated interface parameters (that is, configure the corresponding test module to implement any type of interface).

[0124] For the method described in the embodiments of the present application, by configuring the various types of relevant interfaces in the associated device through the preset point allocation table, it is possible to simulate any type of interface on the local machine, and realize information interaction between the test interface implemented by switching the simulated interface parameters of any type and the corresponding interface in the device under test to achieve various types of interface tests. This test process does not require testing based on the actual interfaces of the device under test and the associated device, which improves the applicability of the method to a certain extent.

[0125] In one embodiment, in the case where the above-mentioned simulated correlation parameters are simulated function parameters, an implementation method of the simulated correlation parameters is provided, as Figure 6 shown. The method includes:

[0126] S501, if the test type indicated by the test indication information is a function test, then extract the test logics of the various function modules in the associated device from the preset point allocation table.

[0127] S502, perform logic circuit configuration according to the test logics of the various function modules in the associated device to generate simulated function parameters.

[0128] Among them, the preset point allocation table includes the function configuration information, function configuration parameters (i.e., operating parameters), and test logics of any device in the energy storage control system to implement various functions.

[0129] Embodiments of the present application relate to the case where the analog correlation parameters are analog function parameters. Based on this, when the test device receives test indication information, it can extract the indication information therefrom and determine the test type according to the indication information. If the test type is a function test, it means that the functions of the device under test or the implementation logic of each function need to be tested. At this time, the test device obtains a preset point allocation table and searches for the associated devices connected to the device under test therein. After determining the associated devices, it can further determine the function modules or function logics of various functions implemented by docking with the device under test on the associated devices, and then extract the test logics, function configuration information, and function configuration parameters of various function modules implemented by docking with the device under test from the preset point allocation table, and determine the analog function parameters according to the test logics, function configuration information, and function configuration parameters of various function modules, and configure the corresponding function modules on the local machine based on the analog function parameters (that is, configure the corresponding test modules to implement any type of function module).

[0130] For the method described in the embodiments of the present application, by configuring each function module in the associated device through a preset point allocation table, the test logic of each function can be simulated on the local machine, that is, configure a test module on the local machine to implement the corresponding function implementation of the simulated associated device, and the function module implemented through the analog function parameters interacts with the device under test to achieve the corresponding function test. This test method can achieve a test on the correctness of the execution logic of each function implemented on the device under test, that is, achieve a test on the software process.

[0131] In one embodiment, multiple test modules are provided on the test device, and the test modules can be configured according to the analog correlation parameters determined according to the configuration information of the associated device, so that the configured test modules can implement functions similar to those of the associated device. After that, the configured test modules can be used to test the device under test according to the test indication information to obtain a test result.

[0132] Among them, different test modules can implement different functions through configuration. For example, a test module can implement the function of a battery management controller, a test module can also implement the function of a sub-module controller, and a test module can also implement the functions of various interfaces in a valve control protection system.

[0133] In an embodiment of the present application, when the test device determines the associated device of the device under test, it can further obtain the configuration information of the associated device from the point allocation table or the configuration table, generate simulated association parameters according to the configuration information of the associated device, and configure the test module on the test device according to the simulated association parameters. Optionally, when the associated device is one device, a corresponding test module on the test device can be configured; optionally, when the associated device is multiple devices, a corresponding number of test modules on the test device can be configured, so that one or more configured test modules can simulate the associated device of the device under test to perform communication testing with the device under test. During specific testing, the configured test module can communicate with the device under test in the energy storage valve control protection system according to the indication of the test task or according to the test parameters, so as to realize test data interaction to complete the test. Among them, various communication interfaces of the test module on the device under test support custom configuration, and general and private protocols such as high-speed serial communication protocol, Ethernet protocol, and Aurora protocol can be set through corresponding software.

[0134] In the test method described in the embodiment of the present application, the test device simulates the associated devices of different devices under test by configuring different test modules to realize communication testing with various devices under test, that is, realizes the testing of any device and any test item in the energy storage control system, which improves the comprehensiveness of the test to a certain extent.

[0135] In one embodiment, an implementation manner of the above S203 is provided, that is, the above S203 "test the device under test according to the simulated association parameters and the test indication information, and receive the test result of the device under test" is as Figure 7 shown, including:

[0136] S601, parse the test indication information to obtain the first test task.

[0137] Among them, the first test task can be a fault test task, an interface function test task, or a status detection task. The first test task includes test cases, test parameters, operating parameters, test logic, etc.

[0138] In the embodiment of the present application, after receiving the test indication information, the test device can further parse the test indication information and parse out the first test task from the test indication information. The first test task can be a test task corresponding to a test item or multiple test subtasks corresponding to a test item. When there are multiple test subtasks, specifically, they can be continuously executed test subtasks or discontinuously executed test subtasks. For example, multiple test subtasks can be consecutive tasks of fault testing, consecutive tasks of interface function testing, or consecutive tasks of status detection.

[0139] S602. Configure the simulation association parameters according to the test module of the local device, drive the configured test module to execute the first test task to test the device under test, and receive the test result obtained by the device under test after testing based on the first test task.

[0140] In the embodiment of the present application, when the test device determines the simulation association parameters, since the simulation association parameters include the implementation parameters of various types of interfaces corresponding to the device under test on some associated devices and the implementation parameters of various types of functions corresponding to the device under test on the associated devices, the test device can configure any test module of the local device according to the simulation association parameters, so that the configured test module can implement various types of interfaces or various types of functions.

[0141] In the embodiment of the present application, after the test device parses the first test task, it can establish a communication connection with the device under test according to the indication of the first test task, and realize the test of the device under test by transmitting test parameters between the configured test module and the device under test, so as to obtain the test result corresponding to the first test task. When the first test task includes multiple test subtasks, specifically during the test, the test device can test the device under test according to the multiple test subtasks in sequence, that is, transmit the test parameters in different test subtasks between the configured test module and the device under test multiple times to realize the test of the device under test, and obtain the test results corresponding to the respective test subtasks; optionally, the test device can also test the device under test according to each test subtask at the same time to obtain the test results corresponding to the respective test subtasks.

[0142] The test method provided in the embodiment of the present application only needs to issue test instruction information to the test device, and the test device can automatically parse the test task according to the test instruction information and automatically simulate any associated device to complete the test, that is, a fully automatic test method for the energy storage control system is realized.

[0143] In one embodiment, when the simulation association parameters include simulation function parameters and the corresponding test module includes a function module, that is, when the test device executes the above S602 "drive the configured test module to execute the first test task to test the device under test, and receive the test result obtained by the device under test after testing based on the first test task", as Figure 8 shown, the specific execution steps are:

[0144] S701. Drive the configured function module to generate abnormal information according to the test parameters in the first test task; the simulation function parameters include any one of the input function parameters, network communication function parameters, optical fiber communication function parameters, and output function parameters.

[0145] Among them, the abnormal information may include an abnormal message. The type of the abnormal information is determined according to the type of the simulation function parameter. For example, if the simulation function parameter is an input function parameter, the abnormal information can be determined as abnormal input information; if the simulation function parameter is an output function parameter, the abnormal information can be determined as abnormal output information; if the simulation function parameter is a network communication function parameter, the abnormal information can be determined as abnormal network information; if the simulation function parameter is an optical fiber communication function parameter, the abnormal information can be determined as abnormal optical fiber information.

[0146] In the embodiment of the present application, when the test device determines that the simulation correlation parameter is a simulation function parameter and extracts the first test task from the test indication information, it can further extract test cases, test parameters, operation parameters, test logic, etc. from the first test task, and directly execute the first test task based on these extracted parameters, or test cases, or test logic, and generate abnormal information corresponding to the simulation function parameter in combination with the type of the simulation function parameter.

[0147] S702, send the abnormal information to the device under test for testing, and receive the test result obtained after the device under test performs the test based on the first test task.

[0148] In the embodiment of the present application, after the test device generates the abnormal information, it can start the configured function module to send the abnormal information to the device under test. The device under test verifies or validates the content of the abnormal information, or verifies or validates the operation logic of the abnormal information, and obtains the test result according to the verification result or validation result, and feeds back the test result to the test device.

[0149] Optionally, when the abnormal information includes an abnormal message, a test for implementing a short-time fault insertion test function can be realized. That is, when the test device specifically executes the steps of S701 above, the specific execution steps are: sending the abnormal message to the device under test for testing according to a preset sending period, and receiving the test result obtained after the device under test performs the test based on the first test task. Among them, the preset sending period can be set in advance, which can be 1 communication cycle or 2 communication cycles.

[0150] In the embodiment of the present application, when the test module executes the first test task and generates an abnormal message, for example, an abnormal message with an incorrect message start character can be generated. Optionally, the test module can drive a Field Programmable Gate Array (FPGA) to generate the abnormal message. Before the specific test, some simple test programs can be developed in the FPGA in advance, and the logic is controlled through the internal parameters of the test device, and the upper computer can control the execution of the test program by modifying the internal parameters of the test device.

[0151] In the embodiments of the present application, when the test device generates an abnormal message, the abnormal message can be sent according to a preset sending period, and a recovery time is set. For example, after sending the abnormal message continuously for 1 communication cycle, it is recovered. When the device under test receives the abnormal message, it can check whether the sending logic of its own message is consistent with the preset sending period and recovery time of the abnormal message set by the test module. If they are consistent, the test passes; if not, the test fails, and the test result can be obtained, and then the test result can be returned to the test device. It should be noted that after the FPGA can be driven to generate an abnormal message, the abnormal message can be sent to the device under test according to the preset sending period and recovery time. Since the FPGA can reach the sending speed at the microsecond level, generating and sending the abnormal message through the FPGA can achieve the fault test at the microsecond level. It should be noted that the device under test in this embodiment can be a sub-module controller.

[0152] The method described in the embodiments of the present application realizes a short-time fault insertion test function. And through the simulation to generate abnormal messages for testing, the test can be refined to the abnormal simulation such as the cyclic redundancy check (CRC) and frame loss of the high-speed communication interface, and various faults with a duration of microseconds can also be simulated.

[0153] In one embodiment, when the simulation correlation parameters include simulation interface parameters, that is, when the test device executes the above S602 "drive the configured test module to execute the first test task to test the device under test and receive the test result obtained after the device under test is tested based on the first test task", as Figure 9 shown, the specific execution steps are:

[0154] S801, generate an abnormal signal according to the test parameters in the first test task and the type of the simulation interface parameters.

[0155] Among them, the type of the abnormal signal is determined according to the type of the simulation interface parameters. For example, if the simulation interface parameter is an optical fiber interface parameter, the abnormal signal can be determined as an abnormal optical fiber signal; if the simulation interface parameter is a network interface parameter, the abnormal signal can be determined as an abnormal network signal.

[0156] In the embodiments of the present application, when the test device determines that the analog association parameter is an analog interface parameter and extracts the first test task from the test indication information, it can further extract test cases, test parameters, operation parameters, test logics, etc. from the first test task, and directly execute the first test task based on these extracted parameters, or test cases, or test logics, and generate an abnormal signal corresponding to the analog interface parameter in combination with the types of the test parameters and the analog interface parameter in the first test task. For example, if an optical drive signal is determined according to the type of the analog interface parameter, the implementation method of the optical drive signal can be set according to the test parameters in the first test task. For example, if the test parameter is the signal strength value, the signal strength of the optical drive signal is set according to the signal strength value indicated by the test parameter.

[0157] Optionally, when the test device generates an abnormal signal, for example, it can generate an IGBT1 drive board feedback signal with a light-off length exceeding 800 us, which corresponds to the IGBT1 test interface. Optionally, the test device can simulate that the IGBT1 drive board feedback signal exceeds 800 us. It should be noted that the abnormal signal can be determined according to the test parameters in the preset point allocation table, or can be determined by the tester editing and sending it down by the lower computer.

[0158] S802, the configured test module drives the abnormal signal to be sent to the device under test for testing, and receives the test result obtained after the device under test performs the test based on the first test task.

[0159] In the embodiments of the present application, after the test device generates an abnormal signal, the abnormal signal can be sent to the corresponding interface of the device under test through the configured test module. The device under test detects, or verifies, or validates the abnormal signal, or verifies or validates the sending logic of the abnormal signal, and obtains the test result according to the detection result, verification result, or validation result, and feeds back the test result to the test device.

[0160] Optionally, in the embodiments of the present application, when the test device generates an abnormal signal, the abnormal signal can be sent to the device under test. When the device under test receives the abnormal signal, it can generate a fault signal according to the abnormal signal to obtain the test result; for example, if the abnormal signal is an IGBT1 drive board feedback signal with a light-off length exceeding 800 us, the corresponding fault signal is a valve control protection system VBC IGBT1 drive voltage secondary side fault signal. And the test result is returned to the test device. When the test device receives the test result, it can report the test result to the upper computer to display the fault status of the device under test to the tester, so that the tester can check whether the fault information is reported normally, and if so, the test passes. It should be noted that the device under test in this embodiment can be a sub-module controller.

[0161] Another implementation of the above test method can be specifically described as follows: The host computer issues a fault status test instruction message; when the test device receives this fault status test instruction message, it immediately simulates that the light-off length of the IGBT1 driver board feedback signal exceeds 800 us, and sends this abnormal signal to the device under test; after receiving this abnormal signal, the device under test conducts a test and reports a VBC IGBT1 drive voltage secondary side fault signal through the VBC interface; the test device receives the fault signal sent by the device under test and reports this fault signal to the host computer; the host computer displays the fault status of the device under test, and if the tester views the fault information and reports it correctly, the test passes.

[0162] The method described in the embodiments of the present application realizes another fault insertion test function, and through simulating and generating abnormal signals for testing, the test can be refined to abnormal simulations such as cyclic redundancy check and frame loss of a high-level communication interface.

[0163] In one embodiment, a test method for a test device to execute multiple test subtasks is provided, that is, the first test task includes multiple test subtasks. When the test device executes the above S602 "After the drive configuration, the test module executes the first test task to test the device under test and receives the test result obtained by the device under test after testing based on the first test task", as Figure 10 shown, the specific execution steps are:

[0164] S901, according to the first test subtask in the first test task, determine the first test parameter.

[0165] Among them, the multiple test subtasks in the first test task can be multiple test subtasks determined in the order of execution time.

[0166] In the embodiments of the present application, after receiving the test instruction message, the test device can further parse the test instruction message and parse out multiple test subtasks from the test instruction message. These multiple test subtasks can be multiple test subtasks corresponding to a test item, and specifically can be consecutive tasks or non-consecutive tasks. For example, the multiple test subtasks can be consecutive tasks for fault testing, or consecutive tasks for interface function testing, or consecutive tasks for status detection, or consecutive tasks for function testing. When the test device parses out multiple test subtasks, it can first execute the first test subtask and extract the first test parameter from the first test subtask, so as to conduct the test of this test subtask according to the first test parameter later.

[0167] S902, the test module after drive configuration generates the first operating parameter according to the first test parameter.

[0168] Among them, the first operating parameter can be a signal or information set according to the first test parameter; the first operating parameter can be a signal or information transmitted between the configured test module and the device under test.

[0169] In the embodiment of the present application, after the test device extracts the first test parameter, it can drive or start the configured test module to generate the first operating parameter according to the first test parameter. For example, if the simulated correlation parameter is a simulated interface parameter and the first test parameter is the performance parameter of the signal sent by the configured test module, such as signal strength, signal period, etc., then the first operating parameter corresponding to the configured test module can be generated according to the first test parameter.

[0170] S903. Send the first operating parameter to the device under test for testing, and receive the first test result obtained after the device under test performs the test based on the first operating parameter.

[0171] In the embodiment of the present application, after the test device generates the first operating parameter, it can start the configured test module to send the first operating parameter to the device under test. When the device under test receives the first operating parameter, it can verify or validate the first operating parameter, or verify or validate the operation logic of the first operating parameter, or execute the corresponding interface or function module according to the first operating parameter, and obtain the test result according to the verification result, or validation result, or execution result, and feedback the test result to the test device.

[0172] S904. When the first test result indicates that the device under test is in a normal working state, determine a new first test parameter and a new first operating parameter according to the next test subtask, and return to execute the step of driving the configured test module to generate the first operating parameter according to the first test parameter until all test subtasks are executed.

[0173] The embodiment of the present application relates to a loop test process, that is, according to the execution order of each test subtask, the methods of S902 and S903 are repeatedly executed. For example, the first test subtask, the second test subtask, the second test subtask... the Nth test subtask are executed in sequence until all test subtasks are executed. Optionally, a loop termination condition can also be set to end the loop test, such as setting the number of loops, or the test result corresponding to each test subtask indicates that the device under test is in an abnormal state. It should be noted that the device under test can be a sub-module controller.

[0174] The method described in the embodiment of the present application realizes a continuous state test method or a continuous logic test method, that is, the test is completed by simulating the interaction mode between the battery controller, the sub-module controller and the valve control protection system, which can improve the test efficiency.

[0175] In one embodiment, before the test device executes the first test task, as Figure 11 shown, the following steps also need to be executed:

[0176] S1001. Establish a communication connection between the configured test module and the device under test.

[0177] In the embodiment of the present application, the test device can configure the test module on the local machine with the configuration parameters in the preset point allocation table, so that the test module can simulate the functions of the associated devices of the device under test or can implement the functions of the associated devices of the device under test, and then establish a communication connection with the device under test for subsequent testing of the device under test. The preset point allocation table includes configuration parameters, interaction data of various types of associated devices, and function configuration parameters of each communication module (see Figure 4 the optical fiber communication parameters, network communication parameters, input function parameters, and output function parameters in it). Therefore, the test device determines the device under test, further determines the function configuration parameters of each communication module of the associated devices related to the device under test, and determines the simulation association parameters according to these function configuration parameters, and configures the simulated associated devices in the device under test based on the simulation association parameters, so as to establish a normal communication connection between the configured test module and the device under test.

[0178] Optionally, when the test device establishes a communication connection between the configured test module and the device under test, the following steps can be specifically executed: extract the communication protocol information from the preset point allocation table; establish a communication connection between the configured test module and the device under test according to the communication protocol information. The preset point allocation table can include various types of communication protocols. The test device can extract the corresponding communication protocol information from the preset point allocation table according to the communication type or communication method of the configured test module and the device under test, and perform communication configuration on the configured test module and the device under test based on the communication protocol information to establish a communication connection between the configured test module and the device under test.

[0179] S1002. Send the second operating parameter to the device under test and receive the second test result obtained after the device under test performs a test based on the second operating parameter.

[0180] Among them, the second test result is used to indicate that the device under test is in a normal working state or is used to indicate that the device under test is in an abnormal working state.

[0181] In the embodiment of the present application, after the configured test module establishes a communication connection with the device under test, the configured test module or the test device can further generate second operating parameters according to the default test parameters in the preset point allocation table, and send the second operating parameters to the device under test. When the device under test receives the second operating parameters, it can perform a fault clearing operation according to the second operating parameters, that is, clear all faults and alarms of the device itself, so that the device under test is in a normal working state. After the device under test finishes the fault clearing operation, detect the current working state of the device under test. If the device under test is in a normal working state, return a second test result indicating that the device under test is in a normal working state; if the device under test is in an abnormal working state, return a second test result indicating that the device under test is in an abnormal working state. In addition, when the test module receives the second test result, it can also report the second test result to the host computer, and then the host computer displays the second test result, so that the personnel of the host computer can view the second test result in real time.

[0182] Another implementation manner of the above test method can be specifically described as follows: the host computer issues test instruction information; after the test device receives the test instruction information, it communicates with the device under test according to the default parameters in the preset point allocation table, and issues second operating parameters; when the device under test receives the second operating parameters, it performs a fault and alarm clearing operation and returns a second test result; after the test device receives the second test result, it reports it; the host computer displays the second test result sent by the device under test.

[0183] S1003, in the case where the second test result indicates that the device under test is in a fault clearing state, perform the step of parsing the test instruction information to obtain the first test task.

[0184] In the embodiment of the present application, when the test device receives the second test result returned by the device under test, if the second test result indicates that the device under test is in a normal working state, the test device can continue to execute the first test task. Specifically, it can update the test parameters in the preset point allocation table, send new test parameters to the device under test for testing the device under test, and receive the first test result returned by the device under test. Among them, the new test parameters can be some parameters required for various fault detections, and can be pre-configured in the preset point allocation table, or can be set according to the test requirements of different types of devices under test during the fault test. In addition, when the test device receives the second test result, it can also report the second test result to the host computer, and then the host computer displays the second test result, so that the personnel of the host computer can view the second test result corresponding to the second test task in real time.

[0185] The embodiment of the present application realizes a fault detection method, that is, the fault detection can be completed based on multiple interaction steps, that is, an automatic fault detection method is realized.

[0186] Optionally, based on the test method described in the above embodiments, the process of the above method is exemplarily described as follows. Figure 12 As shown, the process includes: S1, establishing a network connection. S2, sending down test indication information (selecting test cases, starting the test, status sequence, simulating associated parameters, etc.). S3, parsing the test indication information into a second test task and a first test task for execution. S4, executing the second test task to generate second operation parameters. S5, sending the second operation parameters. S6, clearing the faults of the sub-module controller. S7, returning the second test result. S8, reading the interface data (second test result). S9, reporting the second test result. S10, configuring the test module according to the simulated associated parameters, executing the first test task, and triggering the test program of the configured test module. S11, generating an exception message. S12, sending the exception message at a preset period. S13, performing a test according to the exception message to obtain a first test result. S14, returning the first test result. S15, reading the interface data (first test result). S16, reporting the first test result.

[0187] Another implementation manner of the above test method can be specifically described as follows: sending down fault test indication information through the fault status interface of the host computer; after receiving the test indication information, the test device immediately generates an exception message with an error in the message start symbol, and simulates the way of sending messages by the valve control system (sending in a way that resumes after 1 communication cycle); when the device under test receives the exception message, it returns a fault test result; the test device receives the fault test result and reports the test result to the host computer; the host computer displays the fault status of the device under test, and if the tester checks that there is no fault reported, the test passes.

[0188] In one embodiment, the first test task may include two test subtasks, namely a first test subtask and a second test subtask. When the test device specifically executes the first test subtask, it may specifically execute the steps of: establishing a communication connection with the device under test according to the first test subtask, sending the first test parameters to the device under test, and receiving the first test result returned by the device under test; the first test result is the result returned by the device under test after performing a fault clearing operation based on the first test parameters; in the case where the first test result indicates that the device under test is in a normal working state, testing the device under test according to the second test subtask to obtain a second test result corresponding to the second test subtask. The embodiment of the present application realizes a fault detection method, that is, a fault detection can be completed based on two test tasks, that is, an automatic fault detection method is realized.

[0189] Optionally, when the test device executes the step of "testing the device under test according to the second test subtask to obtain a second test result corresponding to the second test subtask", the specific execution steps are as follows: generating an exception message according to the second test subtask; sending the exception message to the device under test for testing at a preset sending period to obtain a second test result corresponding to the second test subtask.

[0190] Optionally, the test device can also execute the steps of: generating an exception signal according to the second test subtask; sending the exception signal to the device under test for testing to obtain a second test result corresponding to the second test subtask. The method described in the embodiments of the present application realizes another fault insertion test function, and through the simulation of generating an exception signal for testing, the test can be refined to the abnormal simulation such as cyclic redundancy check and frame loss of a high-speed communication interface.

[0191] Optionally, the test device can also execute the steps of: generating a battery voltage signal according to the second test subtask; sending the battery voltage signal to the device under test for testing through a first interface, and receiving a second test result corresponding to the second test subtask returned by the device under test through a second interface.

[0192] In the embodiments of the present application, when the test module executes the second test subtask and determines that the second test subtask indicates a pass-through state test, a battery voltage signal can be generated. For example, a "system voltage" of 1000V of a battery management controller (BMC) can be generated. Optionally, the battery voltage signal can be determined by updating the test parameters in the point allocation table by the test module, or can be determined by the tester editing and sending it by the lower computer.

[0193] Among them, the first interface and the second interface are interfaces of different modules. For example, the first interface is a BMC interface simulated by the test module, and the second interface is a VBC interface on the device under test. The device under test in this embodiment can be a sub-module controller.

[0194] In the embodiment of the present application, when the test device generates a battery voltage signal, the battery voltage signal can be sent to the device under test through the first interface (an interface implemented by analog interface parameters). The device under test can receive the battery voltage signal through an interface of the same type as the first interface (an interface implemented by analog interface parameters). For example, if the first interface is a BMC interface, the device under test receives the battery voltage signal through the BMC interface, and then immediately forwards the battery voltage signal to the second interface (for example, a VBC interface). Then, the second interface returns the battery voltage signal to the test device. The test device can receive the battery voltage signal through the second interface (an interface implemented by analog interface parameters) (for example, a VBC interface), and can further determine whether the received battery voltage signal is consistent with the configured battery voltage signal. If they are consistent, the test passes; if not, the test fails. Optionally, the test device can also report the received battery voltage signal to the host computer to display the battery voltage signal to the test personnel. The host computer can display the battery voltage signal so that the test personnel can compare and determine the test result.

[0195] Another implementation manner of the above test method can be specifically described as follows: Modify the test parameters through the host computer fault status interface. For example, modify the "system voltage" of the test parameter BMC to 1000V and send it to the test device; the test device sends a signal with a "system voltage" of 1000V to the device under test through the BMC interface; the device under test immediately forwards it to the VBC interface after receiving it through the BMC interface; the test device receives the "system voltage" of 1000V sent by the device under test through the VBC interface and reports it to the host computer; the host computer displays "system voltage" of 1000V on the display interface of the VBC. If the test personnel compare and find them consistent, the test passes.

[0196] The method described in the embodiment of the present application realizes a test of the through - transmission function of different interfaces, that is, the test is realized by simulating the interfaces of the battery controller and the valve control protection system, and the test is completed by simulating the associated devices (battery controller and valve control protection system) of the sub - module controller, which can improve the test efficiency.

[0197] Based on the above embodiments, a continuous state testing method or a continuous logic testing method is further provided. That is, this testing method requires multiple test subtasks to be implemented. That is, the above-mentioned second test subtask includes multiple test subtasks. When the testing device executes the above step of "testing the device under test according to the second test subtask to obtain the second test result corresponding to the second test subtask", the specific execution steps are as follows: Determine the second test parameter according to the first test subtask in the second test subtask. Send the second test parameter to the device under test to obtain a third test result. The third test result is used to indicate that the device under test is in a normal working state or is in an abnormal working state. In the case where the third test result indicates that the device under test is in a normal working state, determine a new second test parameter according to the next test subtask, and return to execute the step of sending the second test parameter to the device under test until all test subtasks are completed.

[0198] In the embodiments of the present application, the testing device can update the test parameters in the point distribution table to generate the second test parameter. The second test parameter can be some parameters required for various state detections or continuous logic detections, and can be pre-configured in the point distribution table, or can be set according to the test requirements of different types of devices under test during various state tests or continuous logic tests.

[0199] In the embodiments of the present application, after the testing module determines the second test parameter, the testing module can send the second test parameter to the device under test. When the device under test receives the second test parameter, it can perform corresponding state detection or continuous logic detection according to the second test parameter, so that the device under test works according to the preset logic or normal working process. After the device under test completes the state detection or continuous logic detection, detect the current working state of the device under test. If the device under test is in a normal working state, that is, it conforms to the preset logic or normal working process, return the third test result indicating that the device under test is in a normal working state; if the device under test is in an abnormal working state, that is, it does not conform to the preset logic or does not conform to the normal working process, return the third test result indicating that the device under test is in an abnormal working state. In addition, when the testing module receives the third test result, it can also report the third test result to the upper computer, and then the upper computer displays the third test result, so that the personnel of the upper computer can view the first test result corresponding to the first test subtask in real time.

[0200] The embodiments of the present application relate to a loop test process, that is, according to the execution order of each test subtask, the test steps are repeatedly executed. For example, the first test subtask, the second test subtask, the second test subtask... the Nth test subtask are executed in sequence until all test subtasks are completed. Optionally, a loop termination condition can also be set to end the loop test, such as setting the number of loops, or the test result corresponding to each test subtask indicates that the device under test is in an abnormal state. It should be noted that the device under test can be a sub-module controller.

[0201] The method described in the embodiments of the present application implements a continuous state test method or a continuous logic test method, that is, the test is completed by simulating the interaction mode between the battery controller, the sub-module controller, and the valve control protection system, which can improve the test efficiency.

[0202] In one embodiment, another method for state detection or continuous logic detection is provided. That is, when the second test subtask includes the third test subtask, the fourth test subtask, and the fifth test subtask, when the test device executes the step "test the device under test according to the second test subtask to obtain the second test result corresponding to the second test subtask", the following steps are specifically executed:

[0203] K1: Generate battery fault parameters according to the third test subtask;

[0204] Among them, the battery fault parameters can represent the battery fault level. For example, the battery fault parameter is "battery module 5-level fault".

[0205] In the embodiments of the present application, when the test device executes the first test subtask and determines that the first test subtask indicates a battery fault state test or a battery operation logic detection, battery fault parameters can be generated. For example, "battery module 5-level fault" of the BMC can be generated.

[0206] K2: Send the battery fault parameters to the device under test to obtain the fourth test result corresponding to the third test subtask;

[0207] In the embodiments of the present application, when the test device generates battery fault parameters, the battery fault parameters can be sent to the device under test. After receiving the battery fault parameters, the device under test can perform different interface transparent transmissions on the battery fault parameters to obtain the fourth test result, and return the fourth test result to the test module. The fourth test result includes the transparently transmitted battery fault parameters. In addition, the test device can also report the fourth test result to the host computer so that the tester can view the fourth test result corresponding to the first test subtask.

[0208] K3: When the fourth test result indicates that the device under test is in a normal working state, a bypass instruction is sent to the device under test according to the fourth test subtask to obtain a fifth test result corresponding to the fourth test subtask;

[0209] In the embodiment of the present application, when the test device receives the fourth test result and determines that the fourth test result indicates that the device under test is in a normal working state, a bypass instruction can be generated according to the instruction of the second test subtask, and the bypass instruction can be sent to the device under test. After the device under test receives the bypass instruction, it can further perform a corresponding bypass detection operation according to the bypass instruction to obtain a fifth test result, and return the fifth test result to the test module. In addition, the test module can also report the fifth test result to the host computer so that the tester can view the fifth test result corresponding to the second test subtask.

[0210] K4: When the fifth test result indicates that the device under test is in a normal working state, a switch closing signal is sent to the device under test according to the fifth test subtask to obtain a sixth test result corresponding to the fifth test subtask.

[0211] In the embodiment of the present application, when the test device receives the fifth test result and determines that the fifth test result indicates that the device under test is in a normal working state, a switch closing signal can be generated according to the instruction of the third test subtask, and the switch closing signal can be sent to the device under test. After the device under test receives the switch closing signal, it can further perform a corresponding switch closing detection operation according to the switch closing signal to obtain a sixth test result, and return the sixth test result to the test module. In addition, the test device can also report the sixth test result to the host computer so that the tester can view the sixth test result corresponding to the third test subtask.

[0212] The method described in the embodiment of the present application completes the test by issuing multiple test subtasks, which can realize a continuous state test or a continuous logic test, thereby realizing functional testing of complex logic when various devices interact in the valve-controlled protection system, thereby expanding the application scope of the above-mentioned test method.

[0213] Based on the test method described in the above embodiment, the process of the above method is exemplified as follows: Figure 13 As shown, the process includes: L1, establishing a network connection; L2, issuing test instruction information (selecting a use case, starting a test, state sequence, simulation related parameters, etc.); L3, parsing the test instruction information into the first test

[0214] The first test task and the second test task are executed. The second test task includes multiple test subtasks; L4, execute the first test task to generate the first test parameter; L5, send the first test parameter; L6, clear the fault of the sub-module controller; L7, return the first test result; SL8, read the interface data (the first test result); SL9, report the first test result; L10, configure the test module according to the analog correlation parameter, execute the first test subtask, and trigger the test program of the configured test module; L11, generate the second test parameter; L12, send the second test parameter; S13, perform a test according to the second test parameter to obtain the second test result; L14, return the second test result; L15, read the interface data (the second test result); L16, report the second test result; L17, determine whether the loop end condition is met; L18, execute the second test subtask and trigger the test program; L19, generate the third test parameter; L20, send the third test parameter; S21, perform a test according to the third test parameter to obtain the third test result; L22, return the third test result; L23, read the interface data (the third test result); L24, report the third test result;.... LX, execute the Nth test subtask and trigger the test program; LX + 1, send the Nth test parameter; SX + 2, perform a test according to the Nth test parameter to obtain the Nth test result; LX + 3, return the Nth test result; LX + 4, read the interface data (the third test result); LX + 5, report the Nth test result; LX + 6, determine whether the loop end condition is met (in the case of satisfaction); LX + 7, report all test results.

[0215] Another implementation method of the above test method can be briefly described as follows: The test parameters can be modified through the upper computer fault status interface, that is, modify the "5-level fault of the battery module" of the test parameter BMC and send it to the test equipment; the test equipment sends the "5-level fault of the battery module" to the device under test (for example, the sub-module controller) through the BMC interface; the device under test immediately forwards it to the VBC interface after receiving it through the BMC interface; the test equipment receives the signal of the "5-level fault of the battery module" sent by the device under test through the VBC interface and immediately sends a bypass instruction to the device under test; the device under test immediately sends a signal to close the bypass switch after receiving the bypass instruction through the VBC interface; the test equipment immediately feeds back the position signal of the bypass switch closed position signal after receiving the bypass instruction of the device under test; the device under test immediately forwards it to the VBC interface after receiving the bypass switch closed position signal; the test equipment receives the bypass switch closed position signal through the VBC interface and reports this signal to the upper computer; the upper computer displays "5-level fault of the battery module" on the display interface of the VBC, the bypass switch is in the closed position, and if the test personnel check that the fault display is correct ("5-level fault of the battery module") and the protection action result (bypass switch closing) is correct, it passes.

[0216] In one embodiment, for the method described in any of the foregoing embodiments, after the test device obtains the test result, the test result corresponding to each test task or each test subtask may also be reported to the host computer.

[0217] For the method described in the embodiments of the present application, the test device may report the test result of each test subtask or test task to the host computer, so that the user of the host computer can view the test result in a timely manner, or update or modify the test parameters according to the test result, and then send a new test instruction message for testing. A one-key test function may also be set on the host computer, that is, a one-key test control is set. When the user clicks or triggers the one-key test control on the test interface, the host computer sends a test instruction message to the test device, and the test device performs a test based on the test instruction message. When the test instruction message indicates to test multiple test subtasks, one-key testing can be achieved, realizing a fully automatic test.

[0218] In one embodiment, a test method for an energy storage control system on the host computer side is further provided. This test method is applied to Figure 1 the host computer in Figure 14 as shown in

[0219] S1101, sending a test instruction message to the test device; the test instruction message is used to instruct the test device to test the energy storage control system to obtain a test result.

[0220] S1102, receiving the simulated associated parameters obtained by the test device according to the test instruction message by simulating the associated devices connected to the device under test in the energy storage control system, and the test result returned after testing the device under test according to the simulated associated parameters and the test instruction message; the simulated associated parameters include simulated interface parameters or simulated function parameters.

[0221] The method described in the embodiments of the present application corresponds to the method described in the foregoing Figure 2 embodiments. The descriptions of each step are all introduced in the foregoing content. For detailed content, please refer to the foregoing description, and will not be repeated here.

[0222] In one embodiment, Figure 14 the method described in Figure 15 as shown in

[0223] S1103, displaying the test result returned by the test device.

[0224] The method described in the embodiments of the present application corresponds to the method described in the foregoing embodiments. The descriptions of each step are all introduced in the foregoing content. For detailed content, please refer to the foregoing description, and will not be repeated here.

[0225] In one embodiment, Figure 14 the method described inFigure 16 As shown, it further includes:

[0226] S1104, constructing a preset point allocation table according to the configuration parameters of various types of relevant interfaces in the energy storage control system and the test logic of each functional module in the energy storage control system.

[0227] S1105, sending the preset point allocation table to the test device to instruct the test device to test the energy storage control system according to the preset point allocation table.

[0228] The method described in the embodiments of the present application corresponds to the method described in the foregoing embodiments. The descriptions of each step are introduced in the foregoing content. For detailed content, please refer to the foregoing description and will not be elaborated here.

[0229] In one embodiment, a test system for energy storage valve control is further provided. The test system includes a host computer, a test device, and an energy storage control system; the energy storage control system at least includes a sub-module controller, a main control chassis, and an expansion device; the test device is configured to receive the test instruction information sent by the host computer, simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, determine the simulated association parameters, and test the device under test according to the simulated association parameters and the test instruction information, and receive the test results of the device under test; the simulated association parameters include simulated interface parameters or simulated function parameters. The composition of this test system is the same as that of Figure 1 the test system shown, and the detailed structure can be referred to Figure 1 the test system shown, and the test device can execute the test method described in any of the above Figures 2 - 16 embodiments and will not be elaborated here.

[0230] It should be understood that although the steps in the flowcharts involved in the above-mentioned embodiments are sequentially shown according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or steps or stages in other steps.

[0231] Based on the same inventive concept, an embodiment of the present application further provides a test device for an energy storage control and protection for implementing the test method of the energy storage control and protection involved above. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the test device for the energy storage control and protection provided below can refer to the limitations on the test method of the energy storage control and protection in the above text, and will not be repeated here.

[0232] In one embodiment, as Figure 17 shown, a test device for an energy storage control system is provided, including:

[0233] A receiving module 10, configured to receive a test instruction;

[0234] A simulation module 11, configured to simulate associated devices in an energy storage valve control protection system according to the test instruction, and determine simulation associated parameters, where the simulation associated parameters include simulation interface parameters or simulation function parameters;

[0235] A test module 12, configured to test the device under test according to the simulation associated parameters and the test indication information, and receive the test result of the device under test.

[0236] Each module in the above test device for the energy storage control and protection can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in the processor in the computer device in hardware form or be independent of it, or can be stored in the memory in the computer device in software form, so as to facilitate the processor to call and execute the operations corresponding to the above respective modules.

[0237] In one embodiment, a computer device is provided. This computer device can be a server, and its internal structure diagram can be as Figure 18 shown. This computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected through a system bus. Among them, the processor of this computer device is used to provide computing and control capabilities. The memory of this computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of this computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it realizes a test method for an energy storage control and protection. The display screen of this computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of this computer device can be a touch layer covering the display screen, or can be a button, a trackball, or a touchpad provided on the housing of the computer device, or can also be an external keyboard, a touchpad, or a mouse, etc.

[0238] Those skilled in the art can understand that Figure 18 the structure shown in

[0239] is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have a different component layout.

[0240] Receive test indication information;

[0241] Simulate the associated device connected to the device under test in the energy storage control system according to the test indication information to obtain simulated association parameters; the simulated association parameters include simulated interface parameters or simulated function parameters;

[0242] Test the device under test according to the simulated association parameters and the test indication information, and receive the test result of the device under test.

[0243] For the computer device provided in the above embodiment, its implementation principle and technical effect are similar to those of the above method embodiment, and will not be elaborated here.

[0244] In one embodiment, a computer device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the following steps are implemented:

[0245] Receive test indication information;

[0246] Simulate the associated device connected to the device under test in the energy storage control system according to the test indication information to obtain simulated association parameters; the simulated association parameters include simulated interface parameters or simulated function parameters;

[0247] Test the device under test according to the simulated association parameters and the test indication information, and receive the test result of the device under test.

[0248] For the computer-readable storage medium provided in the above embodiment, its implementation principle and technical effect are similar to those of the above method embodiment, and will not be elaborated here.

[0249] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processors, graphics processors, digital signal processors, programmable logic devices, data processing logics based on quantum computing, etc., without limitation.

[0250] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0251] The above-described embodiments merely represent several implementation manners of the present application. Their descriptions are relatively specific and detailed, but they should not be construed as limiting the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A test method for an energy storage control system, characterized in that, The described test method includes: Receiving test indication information; Simulating associated devices connected to the device under test in an energy storage control system according to the test indication information, and determining simulated association parameters; the simulated association parameters include simulated interface parameters or simulated function parameters; Testing the device under test according to the simulated association parameters and the test indication information, and receiving the test result of the device under test.

2. The method according to claim 1, characterized in that, The simulating associated devices connected to the device under test in an energy storage control system according to the test indication information and determining simulated association parameters includes: Obtaining a preset point allocation table; Simulating the associated devices according to the preset point allocation table and the test type indicated by the test indication information, and determining simulated association parameters.

3. The method according to claim 2, characterized in that, The simulated association parameters include simulated interface parameters. The simulating the associated devices according to the preset point allocation table and the test type indicated by the test indication information and determining simulated association parameters includes: If the test type indicated by the test indication information is an interface test, extracting interface configuration information from the preset point allocation table; Configuring relevant interfaces of various types in the associated devices according to the interface configuration information, and determining the simulated interface parameters.

4. The method according to claim 2, characterized in that, The simulated association parameters include simulated function parameters. The simulating associated devices connected to the device under test in an energy storage control system according to the preset point allocation table and the test type indicated by the test indication information and determining simulated association parameters includes: If the test type indicated by the test indication information is a function test, extracting the test logic of each functional module in the associated device from the preset point allocation table; Performing logic circuit configuration according to the test logic of each functional module in the associated device, and generating the simulated function parameters.

5. The method according to any one of claims 1-4, characterized in that, The obtaining a preset point allocation table includes: Receiving a preset point allocation table; the preset point allocation table includes interface configuration information of at least one type of relevant interface and functional configuration information of at least one type of functional module; each interface configuration information includes operating parameters of the corresponding interface, and each functional configuration information includes test logic of the corresponding functional module.

6. The method according to claim 1, characterized in that, The testing the device under test according to the simulated association parameters and the test indication information and receiving the test result of the device under test includes: Parsing the test indication information to obtain a first test task; Configuring the test module of the local machine according to the simulated association parameters, and driving the configured test module to execute the first test task to test the device under test, and receiving the test result obtained after the device under test is tested based on the first test task.

7. The method according to claim 6, characterized in that, The simulated association parameters include simulated function parameters, the test module includes a functional module, and the driving the configured test module to execute the first test task to test the device under test and receiving the test result obtained after the device under test is tested based on the first test task includes: Driving the configured functional module to generate exception information according to the test parameters in the first test task; the simulated function parameters include any one of input function parameters, network communication function parameters, optical fiber communication function parameters, and output function parameters. Send the abnormal information to the device under test for testing, and receive the test result obtained after the device under test performs the test based on the first test task.

8. The method according to claim 7, characterized in that, The abnormal information includes an abnormal message. The step of sending the abnormal information to the device under test for testing and receiving the test result obtained after the device under test performs the test based on the first test task includes: Send the abnormal message to the device under test for testing according to a preset sending period, and receive the test result obtained after the device under test performs the test based on the first test task.

9. The method according to claim 6, characterized in that, The simulated correlation parameters include simulated interface parameters. The step of driving the configured test module to execute the first test task to test the device under test and receiving the test result obtained after the device under test performs the test based on the first test task includes: Generate an abnormal signal according to the test parameters in the first test task and the type of the simulated interface parameters; Drive the configured test module to send the abnormal signal to the device under test for testing, and receive the test result obtained after the device under test performs the test based on the first test task.

10. The method according to claim 6, characterized in that, The first test task includes multiple test subtasks. The step of driving the configured test module to execute the first test task to test the device under test and receiving the test result obtained after the device under test performs the test based on the first test task includes: Determine the first test parameters according to the first test subtask in the first test task; Drive the configured test module to generate the first operating parameters according to the first test parameters; Send the first operating parameters to the device under test for testing, and receive the first test result obtained after the device under test performs the test based on the first operating parameters; When the first test result indicates that the device under test is in a normal working state, determine new first test parameters and new first operating parameters according to the next test subtask, and return to execute the step of driving the configured test module to generate the first operating parameters according to the first test parameters until all the test subtasks are completed.

11. The method according to claim 6, characterized in that, The method further includes: Establish a communication connection between the configured test module and the device under test; Send second operating parameters to the device under test, and receive the second test result obtained after the device under test performs the test based on the second operating parameters; When the second test result indicates that the device under test is in a fault clearing state, execute the step of parsing the test indication information to obtain the first test task.

12. The method according to claim 11, characterized in that, The step of establishing a communication connection between the configured test module and the device under test includes: Extract communication protocol information from a preset point allocation table; Establish a communication connection between the configured test module and the device under test according to the communication protocol information.

13. The method according to claim 1, characterized in that, The method further includes: Report the test result to the host computer.

14. A test system for an energy storage valve control, characterized in that, The test system includes a host computer, a test device, and an energy storage control system; the energy storage control system at least includes a sub-module controller, a main control chassis, and an expansion device; The test device is configured to receive the test instruction information sent by the host computer, simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, determine the simulated association parameters, test the device under test according to the simulated association parameters and the test instruction information, and receive the test results of the device under test; the simulated association parameters include simulated interface parameters or simulated function parameters.

15. A test device for an energy storage control system, characterized in that, The test device includes: a receiving module, configured to receive the test instruction information; a simulation module, configured to simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determine the simulated association parameters; the simulated association parameters include simulated interface parameters or simulated function parameters; a testing module, configured to test the device under test according to the simulated association parameters and the test instruction information, and receive the test results of the device under test.

16. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, the steps of the method according to any one of claims 1 to 13 are implemented.

17. A computer-readable storage medium, having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 13 are implemented.

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