Backboard testing device and method based on variable adapter plate

By adopting test devices and methods based on variable adapter plates in backplane testing, the problems of inefficiency and high cost in the prior art are solved, and efficient automatic detection and flexible fault detection of backplane are realized.

CN120177990APending Publication Date: 2025-06-20SHANGHAI RAILWAY COMM
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Patent Information

Application Number
CN202311746528.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-12-18
Publication Date
2025-06-20

AI Technical Summary

Technical Problem

The existing backplane testing methods are inefficient, rely on labor, have high error rates, and have high cost of special testing systems, making them not suitable for high-density backplane testing.

Method used

The backplane testing device and method based on variable adapter boards is adopted, including cable tester, adapter board, core board and decoding board. The test point matrix is ​​expanded through the relay matrix, and the 1-to-2 adapter board design is used to realize automatic detection and flexible address configuration.

Benefits of technology

It realizes automatic detection of the backplane, improves detection efficiency, reduces costs, is suitable for high-density backplane detection, and improves fault search efficiency through flexible address configuration tables.

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Abstract

The invention relates to a backboard testing device based on a variable adapter board. The device comprises a cable tester, an adapter board, a core board and a decoding board, wherein the cable tester is connected with one end of the adapter plate through a three-joint connecting line, the other end of the adapter plate is connected with a terminal of a backboard to be tested, the adapter plate internally comprises a core plate and a plurality of decoding plates, and the core plate is connected with the decoding plates. Compared with the prior art, the method has the advantages of better performing matching retrieval on the test result, efficiently searching and detecting the fault and the like.
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Description

Technical Field

[0001] The present invention relates to the field of backplane testing, and in particular to a backplane testing device and method based on a variable adapter plate. Background Art

[0002] The content of the backplane test is not limited to automatic optical inspection, conductivity test, high voltage test, measurement of the corresponding values ​​of resistance, capacitance and inductance on the surface of the backplane, and there are various methods for testing the backplane. Conventional methods include manual visual inspection + multimeter test, development of backplane test system and testing with the help of other commonly used auxiliary equipment. Manual visual inspection + multimeter test is the most common method at present, but it is inefficient, time-consuming, manual-dependent, and has a high error rate. It is usually used for simpler backplanes and is not suitable for high-density backplane detection. A dedicated backplane test system can realize the above-mentioned tests with high accuracy, but it also brings relatively expensive R&D or procurement costs. Therefore, the present invention provides a backplane test device and method based on a variable adapter plate. Summary of the invention

[0003] The purpose of the present invention is to provide a backplane testing device and method based on a variable adapter plate in order to overcome the defects of the prior art.

[0004] The purpose of the present invention can be achieved by the following technical solutions:

[0005] On the one hand, this embodiment provides a backplane testing device based on a variable adapter board, the device includes a cable tester, an adapter board, a core board, and a decoder board; wherein the cable tester is connected to one end of the adapter board through a three-connector connecting line, and the other end of the adapter board is connected to the terminal of the backplane to be tested, the adapter board includes a core board and multiple decoder boards, and the core board is connected to the decoder board.

[0006] Furthermore, the cable tester is internally expanded in the form of a relay matrix.

[0007] Furthermore, the upper limit of the number of test point matrices in a cable tester is 128*128.

[0008] Furthermore, the upper limit of the number of adapter plates that can be matched with a cable tester is 128.

[0009] Furthermore, one adapter board includes a core board and 1 to 8 decoding boards.

[0010] Furthermore, the adapter board adopts a 1-to-2 expansion interface.

[0011] Furthermore, the number of test points for decoding measurement of the decoding board is 128.

[0012] Second aspect, the present invention provides a backplane testing method based on a variable adapter board, which is implemented based on the device described in any one of the above, and the method includes the following steps:

[0013] Step 1, activate the internal relay in the cable tester through an external voltage for functional testing;

[0014] Step 2, find the test point addressing of the adapter board through the core board;

[0015] Step 3, measure the conduction, short circuit, components, external voltage and current of the test points of the adapter board through the decoding board;

[0016] Step 4, edit the address configuration table between the cable tester and the backplane terminals to be tested;

[0017] Step 5, import the address configuration table into the test software in the cable tester, automatically scan the network relationship between each point in the backplane through the cable tester, generate a network report between point to point, and generate a test program for the backplane;

[0018] Step 6, save the test program and use the test program for the test of the backplane to be tested.

[0019] Further, import the address configuration table into the test software in the cable tester to perform conduction test, insulation test and circuit component test on the backplane to be tested.

[0020] Further, the range of the conduction test is within milliohms; the range of the insulation test is within gigaohms; the circuit component test includes resistance, capacitance, inductance and relay tests.

[0021] Compared with the prior art, the present invention has the following beneficial effects:

[0022] 1. The device provided by the present invention can automatically detect the backplane to be tested, has a high detection efficiency, and at the same time, the composition structure of the device is simple, and it has the advantages of low cost and easy implementation.

[0023] 2. The present invention can flexibly edit the address configuration table between the cable tester and the test backplane terminals. When configuring, only the one-to-one correspondence between the cable tester and the backplane terminals needs to be configured. This address configuration table can better match and retrieve the test results and efficiently find the detection faults.

[0024] 3. By adopting a 1-to-2 adapter board design, the present invention can match the tests of different pitch terminals in the backplane, reduce the friction damage during the plugging and unplugging of the adapter board for the irregular terminal pitch and the narrow pitch on the backplane, ensure the fit between the terminals, and minimize the impedance between devices to the greatest extent. Brief Description of the Drawings

[0025] Figure 1 is a schematic structural diagram of the present invention;

[0026] Figure 2 is a schematic diagram of the step flow of the present invention. Detailed Embodiments

[0027] The present invention will be described in detail below with reference to the drawings and specific embodiments. This embodiment is implemented on the premise of the technical solution of the present invention, and gives the detailed implementation manner and specific operation process, but the protection scope of the present invention is not limited to the following embodiments.

[0028] This embodiment provides a backplane test device based on a variable adapter board, as Figure 1 shown. The device includes a cable tester, an adapter board, a core board, and a decoding board. The cable tester is connected to one end of the adapter board through a three-joint connecting wire, and the other end of the adapter board is connected to the terminals of the backplane to be tested. The inside of the adapter board includes a core board and multiple decoding boards, and the core board is connected to the decoding boards.

[0029] Specifically, the cable tester is a test switching unit, which is used to activate the internal relay in the device through an external voltage for functional testing. The cable tester can expand the test point matrix by expanding the internal relay matrix. The upper limit of the number of test point matrices in this embodiment is 128*128, that is, with 128 adapter boards, the cable tester provided in this embodiment can meet the vast majority of backplane tests.

[0030] One end of the adapter board in this embodiment is connected to the terminals in the backplane to be tested, and the other end is connected to the core board, the decoding board, and the cable tester. The adapter board includes 1 core board and 2 decoding boards. For the difficult situation of 1-to-1 adapter boards, the adapter board adopts a 1-to-2 expansion interface.

[0031] By adopting the 1-to-2 adapter board design, it can match the tests of different pitch terminals in the backplane, reduce the friction damage during the plugging and unplugging of the adapter board for the irregular terminal pitch and narrow pitch on the backplane, ensure the fit between the terminals, and minimize the impedance between components to the greatest extent.

[0032] The core board in this embodiment is used to address the test points of the adapter board 4, and can address up to 1024 test points.

[0033] The decoding card measures the conduction, short circuit, components, external voltage and current of the test points of the adapter board. It can adopt a chained method, and each decoding card can decode and measure 128 test points.

[0034] On the other hand, this embodiment provides a backplane testing method based on a variable adapter board, and this method is implemented based on this device. The specific steps are as follows:

[0035] Step 1: Activate the internal relay in the cable tester through an external voltage for functional testing.

[0036] Step 2: Locate the test points of the adapter board through the core board for addressing.

[0037] Step 3: Measure the conduction, short circuit, components, external voltage and current of the test points of the adapter board through the decoding board.

[0038] Step 4: Edit the address configuration table between the cable tester and the backplane terminals to be tested, and configure the one-to-one correspondence between the cable tester and the backplane terminals.

[0039] Step 5: Import the address configuration table into the test program in the cable tester, automatically scan the network relationship between each point in the backplane through the cable tester, generate a network report between point to point, and generate a test program for the backplane.

[0040] In addition, through this test program, it is also possible to provide conduction testing in the milliohm range, insulation testing in the gigaohm range, and testing of components such as resistors, capacitors, inductors, and relays.

[0041] Step 6: Save the test program, click the automatic test button of the test program in the cable tester, and use the test program for testing the backplane to be tested. If the test process is completed normally, save the test program. For test backplanes of the same model, use this test program for testing. It is also possible to verify the test program by replacing the test backplane of the same model. If the test process is still completed normally after verification, the test program can be fixed for subsequent testing of backplanes of the same model.

[0042] For test backplanes of different models, based on the method provided in this embodiment, just configure the corresponding core board, decoding board, and adapter board according to the backplane to be tested, and their connection principles and test program generation are the same.

[0043] The preferred specific embodiments of the present invention have been described in detail above. It should be understood that those of ordinary skill in the art can make many modifications and variations according to the concept of the present invention without creative work. Therefore, all technical solutions that can be obtained by those skilled in the art in the technical field based on the concept of the present invention through logical analysis, reasoning, or limited experiments on the basis of the prior art should be within the protection scope determined by the claims.

Claims

1. A backplane test device based on a variable adapter board, characterized in that, The device includes a cable tester, an adapter board, a core board, and a decoder board; wherein the cable tester is connected to one end of the adapter board via a three-connector connecting line, and the other end of the adapter board is connected to a terminal of a backplane to be tested, and the adapter board includes a core board and multiple decoder boards, and the core board is connected to the decoder board.

2. The backplane test device based on a variable adapter board according to claim 1, characterized in that, The cable tester is internally expanded in the form of a relay matrix.

3. The backplane test device based on a variable adapter board according to claim 1, characterized in that, The upper limit of the number of test point matrices in one of the cable testers is 128*128.

4. The backplane test device based on a variable adapter board according to claim 1, characterized in that, The upper limit of the number of adapter plates that can be matched with one cable tester is 128.

5. The backplane test device based on a variable adapter board according to claim 1, characterized in that, One adapter board includes a core board and 1 to 8 decoding boards.

6. The backplane test device based on a variable adapter board according to claim 5, characterized in that, The adapter board adopts a 1-to-2 expansion interface.

7. The backplane test device based on a variable adapter board according to claim 5, characterized in that, The number of test points for decoding measurement of the decoding board is 128.

8. A backplane test method based on a variable adapter board, characterized in that, The method is implemented based on the device described in any one of claims 1 to 7, and the method comprises the following steps: Step 1: activating an internal relay in the cable tester by an external voltage to perform a functional test; Step 2: Address the test points of the adapter board through the core board; Step 3: Use the decoder board to measure the conduction, short circuit, components, and external voltage and current of the test points of the adapter board; Step 4: Edit the address configuration table between the cable tester and the backplane terminal to be tested; Step 5, importing the address configuration table into the test software in the cable tester, automatically scanning the network relationship between each point in the backplane through the cable tester, generating a point-to-point network report, and generating a test program for the backplane; Step 6: Save the test program and use the test program to test the backplane to be tested.

9. The backplane test method based on a variable adapter board according to claim 8, characterized in that, The address configuration table is imported into the test software in the cable tester to perform a continuity test, an insulation test, and a circuit component test on the backplane to be tested.

10. The backplane test method based on a variable adapter board according to claim 9, characterized in that, The range of the conduction test is within the milliohm range; the range of the insulation test is within the gigaohm range; and the circuit component test includes resistance, capacitance, inductance and relay testing.