Nonlinear excitation spin wave resonance linewidth test system and method based on vertical parametric pumping of microstrip lines

Through the nonlinear excitation spin wave resonance linewidth test method under pumping based on vertical parameter microstrip lines, the problems of limited test frequency and large power demand in the prior art are solved, and high-precision and low-cost spin wave resonance linewidth measurement is achieved, which is suitable for high-power performance evaluation of microwave ferrite devices.

CN120178125BActive Publication Date: 2025-07-25LANZHOU UNIV
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Patent Information

Application Number
CN202510654908.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-05-21
Publication Date
2025-07-25
Estimated Expiration
2045-05-21

AI Technical Summary

Technical Problem

When measuring the spin wave resonance line width of microwave ferrite materials, the method is single, the test results under parallel parameters are inaccurate, and the use of high-power microwave sources and resonant cavity is large in size, making it difficult to distinguish the distortion starting point, and the test frequency is limited.

Method used

The nonlinear excitation spin wave resonance linewidth test method based on vertical parameter pump based on microstrip lines is adopted. The test system consisting of microwave source, power amplifier, microstrip line, electromagnet, power attenuator, detector diode and phase locked amplifier is used, and the signal is collected in real time and the spin wave resonance linewidth is calculated in real time.

Benefits of technology

It has achieved spin wave resonance linewidth test of 0.01-40 GHz ultra-wide band spin wave resonance linewidth test, nonlinear spin wave excitation at low power, high test accuracy, low cost, simple test steps, better characterize the high power performance of the device, and clear distortion judgment.

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Abstract

The present invention provides a test system and method for measuring the linewidth of non-linear excited spin-wave resonance under vertical parametric pumping based on a microstrip line. The test system is as follows: A microwave source is connected to a power amplifier; the power amplifier is connected to one end of the microstrip line; a sample to be tested is placed on the microstrip line, and an external magnetic field is applied to the sample by an electromagnet, with the magnetic field direction perpendicular to the long axis direction of the microstrip line; the other end of the microstrip line is sequentially connected to a power attenuator, a detection diode, and a lock-in amplifier; and a computer terminal is connected. The test program is based on a LabVIEW control program, which regulates the magnetic field intensity of the electromagnet, real-time collects the amplitude of the output signal of the lock-in amplifier, and dynamically plots the voltage-magnetic field intensity relationship curve; when the microwave power is increased until the waveform undergoes non-linear distortion, the spin-wave resonance linewidth is calculated using a formula according to the critical microwave power and the threshold radio frequency magnetic field amplitude. Advantages: It realizes the measurement of the non-linear spin-wave resonance linewidth in an ultra-wide frequency band and with low power detection, improving the detection accuracy and operation efficiency.
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