Test method and system

Abstract

The invention relates to a test method and system, and a terminal device in the system is used for sending first instruction data to a charging management unit of a to-be-tested device through a first USB-to-TTL device, so that the charging management unit sends the first instruction data to a second USB-to-TTL device through a data transmission channel between a TRX pin and a VIN pin; the second USB-to-TTL device is used for sending the first instruction data to the terminal equipment; the terminal equipment is also used for sending second instruction data to the charging management unit through the second USB-to-TTL device, so that the charging management unit sends the second instruction data to the first USB-to-TTL device through the data transmission channel; the first USB to TTL device is used for sending the second instruction data to the terminal equipment; and the terminal equipment is used for comparing the sent first instruction data with the received first instruction data, comparing the sent second instruction data with the received second instruction data, and determining a test result of the to-be-tested equipment.

Description

Technical Field

[0001] Embodiments of the present disclosure relate to the technical field of device testing, and more particularly, to a testing method and system. Background Art

[0002] In the production process of electronic devices such as earphone cases, traditional testing methods usually rely on the main control MCU of the device to complete communication testing. However, this method has the following problems: low testing efficiency, the participation of the MCU will increase the complexity of testing and extend the testing time; strong dependence, if the MCU fails or is not correctly initialized, the testing cannot be carried out; resource occupation, the MCU needs to occupy certain resources during testing, which may affect the testing of other functions; poor flexibility, traditional methods are difficult to adapt to different testing scenarios and requirements. Therefore, it is necessary to develop a system that can complete communication testing without the participation of the MCU. Summary of the Invention

[0003] An object of the present disclosure is to provide a new technical solution for a testing system.

[0004] According to a first aspect of the present disclosure, there is provided a testing system, including: a terminal device, a first USB to TTL device, and a second USB to TTL device, wherein, The terminal device is configured to, when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is open, send first instruction data to the charging management unit through the first USB to TTL device, so that the charging management unit sends the received first instruction data to the second USB to TTL device through the data transmission channel; The second USB to TTL device is configured to send the received first instruction data to the terminal device; The terminal device is further configured to send second instruction data to the charging management unit through the second USB to TTL device, so that the charging management unit sends the received second instruction data to the first USB to TTL device through the data transmission channel; The first USB to TTL device is configured to send the received second instruction data to the terminal device; The terminal device is configured to compare the sent first instruction data with the received first instruction data, and compare the sent second instruction data with the received second instruction data to determine the test result of the device under test.

[0005] Optionally, the testing system further includes a private protocol conversion device, wherein, The terminal device is used to send a first target instruction to the private protocol conversion device, where the first target instruction is used to indicate to turn on the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device is used to convert the format of the first target instruction into a format recognizable by the charge management unit, and send the first target instruction after format conversion to the charge management unit, so that the charge management unit turns on the data transmission channel between the TRX pin and the VIN pin.

[0006] Optionally, the terminal device is further used to send a second target instruction to the private protocol conversion device when the test of the device under test is completed, where the second target instruction is used to indicate to disconnect the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device is used to convert the format of the second target instruction into a format recognizable by the charge management unit, and send the second target instruction after format conversion to the charge management unit, so that the charge management unit disconnects the data transmission channel between the TRX pin and the VIN pin.

[0007] Optionally, the test system further includes a switching switch, where one end of the switching switch is connected to the TRX pin of the charge management unit, The terminal device is used to control the other end of the switching switch to switch to be connected to the RX pin of the second USB to TTL device when the second USB to TTL device is used to transmit the first instruction data; The terminal device is used to control the other end of the switching switch to switch to be connected to the TX pin of the second USB to TTL device when the second USB to TTL device is used to transmit the second instruction data.

[0008] Optionally, the test system further includes a first pull-up resistor and a second pull-up resistor, where, One end of the first pull-up resistor is connected to the TX pin of the second USB to TTL device, and the other end of the first pull-up resistor is connected to the VCC pin of the second USB to TTL device, One end of the second pull-up resistor is connected to the RX pin of the second USB to TTL device, and the other end of the second pull-up resistor is connected to the VCC pin of the second USB to TTL device, The resistance value of the first pull-up resistor is less than the resistance value of the second pull-up resistor.

[0009] Optionally, both the TX pin and the RX pin of the first USB to TTL device are connected to the VIN pin of the charge management unit.

[0010] Optionally, the terminal device is further configured to determine that the test result of the device under test is unqualified when it is determined that the first instruction data sent and the first instruction data received are inconsistent, and / or the second instruction data sent and the second instruction data received are inconsistent.

[0011] According to a second aspect of the present disclosure, there is provided a testing method applied to a testing system, the testing system including: a terminal device, a first USB-to-TTL device, and a second USB-to-TTL device, where The method includes: when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is open, the terminal device sends first instruction data to the charging management unit through the first USB-to-TTL device, so that the charging management unit sends the received first instruction data to the second USB-to-TTL device through the data transmission channel; The second USB-to-TTL device sends the received first instruction data to the terminal device; The terminal device sends second instruction data to the charging management unit through the second USB-to-TTL device, so that the charging management unit sends the received second instruction data to the first USB-to-TTL device through the data transmission channel; The first USB-to-TTL device sends the received second instruction data to the terminal device; The terminal device compares the first instruction data sent with the first instruction data received, and compares the second instruction data sent with the second instruction data received, to determine the test result of the device under test.

[0012] Optionally, the testing system further includes a private protocol conversion device, where The method further includes: the terminal device sends a first target instruction to the private protocol conversion device, where the first target instruction is used to indicate to open the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device converts the format of the first target instruction into a format recognizable by the charging management unit, and sends the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

[0013] Optionally, the testing system further includes a switch, one end of the switch is connected to the TRX pin of the charging management unit, where The method further includes: when the second USB to TTL device is used to transmit the first instruction data, the terminal device controls the other end of the switch to switch to be connected to the RX pin of the second USB to TTL device; When the second USB to TTL device is used to transmit the second instruction data, the terminal device controls the other end of the switch to switch to be connected to the TX pin of the second USB to TTL device.

[0014] When testing the device under test, the test system provided by the present disclosure only needs to use the charging management unit of the device under test to complete the test of the device under test, without the participation of the control unit of the device under test, and no longer occupies the resources of the control unit.

[0015] Through the following detailed description of the exemplary embodiments of the present specification with reference to the accompanying drawings, the features and advantages of the embodiments of the present specification will become clear. Description of the Drawings

[0016] The drawings incorporated in the specification and constituting a part of the specification illustrate the embodiments of the present specification, and together with the description are used to explain the principles of the embodiments of the present specification.

[0017] Figure 1 It is a structural block diagram of a test system according to an embodiment of the present invention.

[0018] Figure 2 It is a structural block diagram of a test system according to an embodiment of the present invention.

[0019] Figure 3 It is a circuit schematic diagram of a test system according to an embodiment of the present invention.

[0020] Figure 4 It is a processing flow chart of a test method according to an embodiment of the present invention. Detailed Embodiments

[0021] Now, various exemplary embodiments of the present specification will be described in detail with reference to the accompanying drawings.

[0022] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended as a limitation on the embodiments of the present specification, their applications, or their use.

[0023] It should be noted that: similar reference numerals and letters denote similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0024] To solve the above technical problems, an embodiment of the present disclosure provides a test system. When testing a device under test, the test of the device under test can be completed only by using the charge management unit of the device under test, without the participation of the control unit of the device under test, and the resources of the control unit are no longer occupied.

[0025] An embodiment of the present invention provides a test system. According to Figure 1 As shown, the test system 100 includes: a terminal device 110, a first USB to TTL device 120, and a second USB to TTL device 130.

[0026] Figure 1 The device under test 200 is also shown. The device under test 200 includes a charge management unit 210. The device under test also includes a control unit ( Figure 1 not shown). The control unit can be an MCU.

[0027] The test of the device under test includes the test of SMT (Surface Mount Technology), that is, the communication test of the assembled MCU and the charge management unit. The device under test is, for example, a headphone case.

[0028] According to Figure 1 As shown, the terminal device 110 is used to send first instruction data to the charge management unit 210 through the first USB to TTL device 120 when the data transmission channel between the TRX pin and the VIN pin of the charge management unit 210 of the device under test 200 is opened, so that the charge management unit 210 sends the received first instruction data to the second USB to TTL device 130 through the data transmission channel. The second USB to TTL device 130 is used to send the received first instruction data to the terminal device 110.

[0029] When the charge management unit 210 opens the data transmission channel between the TRX pin and the VIN pin, the charge management unit 210 enters the TRX mode. The TRX mode means that the charge management unit can communicate with other devices to realize data exchange, so that the charge management unit can not only realize the charging function, but also realize the data transmission function.

[0030] The first instruction data received by the first USB to TTL device 120 is a USB signal. The first USB to TTL device 120 is used to convert the USB signal corresponding to the first instruction data into a TTL signal, and then send the TTL signal corresponding to the first instruction data to the charging management unit 210. The charging management unit 210 sends the TTL signal corresponding to the received first instruction data to the second USB to TTL device 130 through the data transmission channel. The first instruction data received by the second USB to TTL device 130 is a TTL signal. The second USB to TTL device 130 is used to convert the TTL signal corresponding to the first instruction data into a USB signal, and then send the USB signal corresponding to the first instruction data to the terminal device 110.

[0031] Both the TX pin and the RX pin of the first USB to TTL device 120 are connected to the VIN pin of the charging management unit 210. Through the connection between the TX pin of the first USB to TTL device and the VIN pin of the charging management unit, the transmission of the first instruction data is realized.

[0032] The terminal device 110 is further used to send second instruction data to the charging management unit 210 through the second USB to TTL device 130, so that the charging management unit 210 sends the received second instruction data to the first USB to TTL device 120 through the data transmission channel. The first USB to TTL device 120 is used to send the received second instruction data to the terminal device 110.

[0033] The second instruction data received by the second USB to TTL device 130 is a USB signal. The second USB to TTL device 130 is used to convert the USB signal corresponding to the second instruction data into a TTL signal, and then send the TTL signal corresponding to the second instruction data to the charging management unit 210. The charging management unit 210 sends the TTL signal corresponding to the received second instruction data to the first USB to TTL device 120 through the data transmission channel. The first instruction data received by the first USB to TTL device 120 is a TTL signal. The first USB to TTL device 120 is used to convert the TTL signal corresponding to the second instruction data into a USB signal, and then send the USB signal corresponding to the second instruction data to the terminal device 110.

[0034] Through the connection between the RX pin of the first USB to TTL device 120 and the VIN pin of the charging management unit, the transmission of the second instruction data is realized.

[0035] Both the first USB to TTL device 120 and the second USB to TTL device 130 can convert USB signals into TTL signals and can also convert TTL signals into USB signals.

[0036] The first instruction data and the second instruction data can be the same or different.

[0037] The terminal device 110 is used to compare the first instruction data sent with the first instruction data received, and compare the second instruction data sent with the second instruction data received, to determine the test result of the device under test.

[0038] In some embodiments, the terminal device 110 is further used to determine that the test result of the device under test is unqualified when it is determined that the first instruction data sent is inconsistent with the first instruction data received, and / or the second instruction data sent is inconsistent with the second instruction data received. That is to say, regardless of whether the instruction data sent by the terminal device is sent to the first USB to TTL device or the second USB to TTL device, as long as there is an inconsistency between the instruction data sent by the terminal device and the instruction data received by the terminal device, it is determined that the test result of the device under test is unqualified.

[0039] In some embodiments, according to Figure 2 As shown, the test system 100 further includes a private protocol conversion device 140.

[0040] The terminal device 110 is used to send a first target instruction to the private protocol conversion device 140. The first target instruction is used to instruct to open the data transmission channel between the TRX pin and the VIN pin. The private protocol conversion device 140 is used to convert the format of the first target instruction into a format recognizable by the charge management unit 210, and send the first target instruction after format conversion to the charge management unit 210, so that the charge management unit 210 opens the data transmission channel between the TRX pin and the VIN pin.

[0041] The first target instruction received by the private protocol conversion device 140 is a USB signal. The private protocol conversion device 140 is used to convert the USB signal corresponding to the first target instruction into a TTL signal, and then convert the TTL signal into a signal corresponding to the format recognizable by the charge management unit 210.

[0042] The terminal device 110 is further used to send a second target instruction to the private protocol conversion device 140 when the test of the device under test is completed. The second target instruction is used to instruct to disconnect the data transmission channel between the TRX pin and the VIN pin. The private protocol conversion device 140 is used to convert the format of the second target instruction into a format recognizable by the charge management unit 210, and send the second target instruction after format conversion to the charge management unit 210, so that the charge management unit 210 disconnects the data transmission channel between the TRX pin and the VIN pin.

[0043] The second target instruction received by the private protocol conversion device 140 is a USB signal. The private protocol conversion device 140 is used to convert the USB signal corresponding to the second target instruction into a TTL signal, and then convert the TTL signal into a signal corresponding to the recognizable format of the charge management unit 210.

[0044] In this way, the opening and disconnection of the data transmission channel between the TRX pin and the VIN pin in the charge management unit can be completed through the test system without the participation of the control unit in the device under test.

[0045] In some embodiments, according to Figure 2 As shown, the test system further includes a switching switch 150. The switching switch 150 is, for example, a relay. The terminal device 110 is connected to the switching switch 150.

[0046] One end of the switching switch is connected to the TRX pin of the charge management unit. The terminal device is used to control the other end of the switching switch to switch to be connected to the RX pin of the second USB to TTL device when the second USB to TTL device is used to transmit the first instruction data. The terminal device is used to control the other end of the switching switch to switch to be connected to the TX pin of the second USB to TTL device when the second USB to TTL device is used to transmit the second instruction data.

[0047] In this embodiment, the test system further includes a first pull-up resistor and a second pull-up resistor. One end of the first pull-up resistor is connected to the TX pin of the second USB to TTL device, and the other end of the first pull-up resistor is connected to the VCC pin of the second USB to TTL device. One end of the second pull-up resistor is connected to the RX pin of the second USB to TTL device, and the other end of the second pull-up resistor is connected to the VCC pin of the second USB to TTL device.

[0048] The resistance value of the first pull-up resistor is less than that of the second pull-up resistor. For example, the first pull-up resistor is a resistor with a resistance value less than or equal to 1K, and the second pull-up resistor is a resistor with a resistance value greater than or equal to 20K.

[0049] In this way, the level requirements for the charge management unit to transmit the first instruction data and the second instruction data in the TRX mode can be met.

[0050] Figure 3 is a circuit schematic diagram of a test system according to an embodiment of the present invention. According to Figure 3 As shown, the test system 100 includes a terminal device 110, a first USB to TTL device 120, a second USB to TTL device 130, a private protocol conversion device 140, a relay 150, a first pull-up resistor 160, and a second pull-up resistor 170.

[0051] Figure 3The device under test 200 is also shown. The device under test 200 includes a charging management unit 210 and a control unit 220). The control unit 220 can be an MCU. The control unit 220 communicates with the charging management unit 210 through an I 2 C interface.

[0052] In this embodiment, when testing the device under test, the control unit 220 is not required to participate.

[0053] According to Figure 3 As shown, the terminal device 110 is connected to the private protocol conversion device 140. The CMD pin of the private protocol conversion device 140 is connected to the VIN pin of the charging management unit 210. Through the connection between the CMD pin of the private protocol conversion device 140 and the VIN pin of the charging management unit 210, the transmission of the first target instruction and the second target instruction is realized, and further the opening or disconnection of the data transmission channel between the TRX pin and the VIN pin of the charging management unit 210 is realized.

[0054] According to Figure 3 As shown, the terminal device 110 is connected to both the first USB-to-TTL device 120 and the second USB-to-TTL device 130.

[0055] According to Figure 3 As shown, both the TX pin and the RX pin of the first USB-to-TTL device 120 are connected to the VIN pin of the charging management unit 210. The GND pin of the first USB-to-TTL device 120 is connected to the GND pin of the charging management unit 210.

[0056] According to Figure 3 As shown, the terminal device 110 is connected to the relay 150. The TRX pin of the first USB-to-TTL device 120 is connected to the COM pin of the relay 150. The COM1 pin of the relay 150 is connected to the TX pin of the second USB-to-TTL device 130. The COM2 pin of the relay 150 is connected to the RX pin of the second USB-to-TTL device 130.

[0057] The terminal device 110 is configured to control the connection between the COM pin and the COM2 pin of the relay when the second USB-to-TTL device 130 is used to transmit the first instruction data.

[0058] The terminal device 110 is configured to control the connection between the COM pin and the COM1 pin of the relay when the second USB-to-TTL device 130 is used to transmit the second instruction data.

[0059] According to Figure 3As shown, one end of the first pull-up resistor 160 is connected to the TX pin of the second USB-to-TTL device 130, and the other end of the first pull-up resistor 160 is connected to the VCC pin of the second USB-to-TTL device 130. One end of the second pull-up resistor 170 is connected to the RX pin of the second USB-to-TTL device 130, and the other end of the second pull-up resistor 170 is connected to the VCC pin of the second USB-to-TTL device 130. The resistance value of the first pull-up resistor 160 is 1K. The resistance value of the second pull-up resistor 170 is 20K.

[0060] An embodiment of the present invention provides a test method. The method is applied to a test system. The test system includes: a terminal device, a first USB-to-TTL device, and a second USB-to-TTL device.

[0061] According to Figure 4 As shown, the test method includes step S410 to step S450.

[0062] Step S410, when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is enabled, the terminal device sends first instruction data to the charging management unit through the first USB-to-TTL device, so that the charging management unit sends the received first instruction data to the second USB-to-TTL device through the data transmission channel.

[0063] Step S420, the second USB-to-TTL device sends the received first instruction data to the terminal device.

[0064] Step S430, the terminal device sends second instruction data to the charging management unit through the second USB-to-TTL device, so that the charging management unit sends the received second instruction data to the first USB-to-TTL device through the data transmission channel.

[0065] Step S440, the first USB-to-TTL device sends the received second instruction data to the terminal device.

[0066] Step S450, the terminal device compares the sent first instruction data with the received first instruction data, and compares the sent second instruction data with the received second instruction data to determine the test result of the device under test.

[0067] In some embodiments, the test system further includes a private protocol conversion device.

[0068] In this embodiment, the method further includes: the terminal device sends a first target instruction to the private protocol conversion device, where the first target instruction is used to indicate to turn on the data transmission channel between the TRX pin and the VIN pin; the private protocol conversion device converts the format of the first target instruction into a format recognizable by the charge management unit, and sends the first target instruction after format conversion to the charge management unit, so that the charge management unit turns on the data transmission channel between the TRX pin and the VIN pin.

[0069] In this embodiment, the method further includes: the terminal device is further configured to, when the test of the device under test is completed, send a second target instruction to the private protocol conversion device, where the second target instruction is used to indicate to disconnect the data transmission channel between the TRX pin and the VIN pin; the private protocol conversion device is configured to convert the format of the second target instruction into a format recognizable by the charge management unit, and send the second target instruction after format conversion to the charge management unit, so that the charge management unit disconnects the data transmission channel between the TRX pin and the VIN pin.

[0070] In some embodiments, the test system further includes a switching switch. One end of the switching switch is connected to the TRX pin of the charge management unit.

[0071] In this embodiment, the method further includes: when the second USB to TTL device is used to transmit the first instruction data, the terminal device controls the other end of the switching switch to switch to be connected to the RX pin of the second USB to TTL device; when the second USB to TTL device is used to transmit the second instruction data, the terminal device controls the other end of the switching switch to switch to be connected to the TX pin of the second USB to TTL device.

[0072] Each embodiment in this specification is described in a progressive manner, and the same or similar parts among the embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments. For the device embodiments, the relevant parts can refer to the descriptions of the method embodiments.

[0073] The specific embodiments of this specification are described above. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be executed in a different order than in the embodiments and still achieve the desired result. Additionally, the processes depicted in the figures do not necessarily require the specific order or sequential order shown to achieve the desired result. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0074] Embodiments of this specification may be systems, methods, and / or computer program products. A computer program product may include a computer-readable storage medium having computer instructions thereon for causing a processor to implement various aspects of the embodiments of this specification.

[0075] A computer-readable storage medium may be a tangible device that can retain and store computer instructions for use by a computer instruction execution device. A computer-readable storage medium may be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), a static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disc (DVD), a memory stick, a floppy disk, a mechanically encoded device such as a punch card or raised structures in a groove having computer instructions stored thereon, and any suitable combination of the foregoing. The computer-readable storage medium as used herein is not construed as an instantaneous signal itself, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., an optical pulse through an optical fiber cable), or an electrical signal transmitted through a wire.

[0076] The computer instructions described herein may be downloaded from the computer-readable storage medium to various computing / processing devices, or downloaded to an external computer or external storage device through a network layer, such as the Internet, a local area network, a wide area network, and / or a wireless network. The network layer may include copper transmission cables, optical fiber transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. A network layer adapter card or network layer interface in each computing / processing device receives the computer instructions from the network layer and forwards the computer instructions for storage in the computer-readable storage medium in each computing / processing device.

[0077] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present specification. In this regard, each block in the flowchart or block diagram may represent a module, a segment of a program, or a portion of computer instructions, which contains one or more executable computer instructions for implementing the specified logical function. In some alternative implementations, the functions noted in the blocks may occur in a different order than noted in the accompanying drawings. For example, two consecutive blocks may actually be executed substantially in parallel, or they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented by a dedicated hardware-based system that performs the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions. As is well known to those skilled in the art, implementation through hardware, implementation through software, and implementation through a combination of software and hardware are equivalent.

[0078] The embodiments of the present specification have been described above. The above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments. Many modifications and variations are obvious to those of ordinary skill in the art in the technical field without departing from the scope of the described embodiments. The choice of terms used herein is intended to best explain the principles of the embodiments, the practical application, or the improvement of the technology in the market, or to enable other ordinary skilled persons in the technical field to understand the embodiments disclosed herein.

Claims

1. A test system, characterized in that, Including: A terminal device, a first USB-to-TTL device, and a second USB-to-TTL device. Among them, The terminal device is configured to send first instruction data to the charging management unit through the first USB-to-TTL device when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is open, so that the charging management unit sends the received first instruction data to the second USB-to-TTL device through the data transmission channel; The second USB-to-TTL device is configured to send the received first instruction data to the terminal device; The terminal device is further configured to send second instruction data to the charging management unit through the second USB-to-TTL device, so that the charging management unit sends the received second instruction data to the first USB-to-TTL device through the data transmission channel; The first USB-to-TTL device is configured to send the received second instruction data to the terminal device; The terminal device is configured to compare the sent first instruction data with the received first instruction data, and compare the sent second instruction data with the received second instruction data to determine the test result of the device under test.

2. The test system according to claim 1, wherein The test system further includes a private protocol conversion device. Among them, The terminal device is configured to send a first target instruction to the private protocol conversion device, where the first target instruction is used to instruct to open the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device is configured to convert the format of the first target instruction into a format recognizable by the charging management unit, and send the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

3. The test system according to claim 2, characterized in that, The terminal device is further configured to send a second target instruction to the private protocol conversion device when the test of the device under test is completed, where the second target instruction is used to instruct to disconnect the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device is configured to convert the format of the second target instruction into a format recognizable by the charging management unit, and send the second target instruction after format conversion to the charging management unit, so that the charging management unit disconnects the data transmission channel between the TRX pin and the VIN pin.

4. The test system according to claim 1, wherein The test system further includes a switch. One end of the switch is connected to the TRX pin of the charging management unit, The terminal device is configured to control the other end of the switch to switch to be connected to the RX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the first instruction data; The terminal device is configured to control the other end of the switch to switch to be connected to the TX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the second instruction data.

5. The test system according to claim 4, wherein The test system further includes a first pull-up resistor and a second pull-up resistor, where, One end of the first pull-up resistor is connected to the TX pin of the second USB-to-TTL device, and the other end of the first pull-up resistor is connected to the VCC pin of the second USB-to-TTL device. One end of the second pull-up resistor is connected to the RX pin of the second USB-to-TTL device, and the other end of the second pull-up resistor is connected to the VCC pin of the second USB-to-TTL device. The resistance value of the first pull-up resistor is less than that of the second pull-up resistor.

6. The test system according to claim 1, wherein Both the TX pin and the RX pin of the first USB-to-TTL device are connected to the VIN pin of the charging management unit.

7. The test system according to any one of claims 1-6, characterized in that, The terminal device is further configured to determine that the test result of the device under test is unqualified when it is determined that the first instruction data sent and the first instruction data received are inconsistent, and / or the second instruction data sent and the second instruction data received are inconsistent.

8. A testing method, characterized in that, Applied to a test system, the test system includes: a terminal device, a first USB-to-TTL device, and a second USB-to-TTL device, where, The method includes: when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is open, the terminal device sends first instruction data to the charging management unit through the first USB-to-TTL device, so that the charging management unit sends the received first instruction data to the second USB-to-TTL device through the data transmission channel; The second USB-to-TTL device sends the received first instruction data to the terminal device; The terminal device sends second instruction data to the charging management unit through the second USB-to-TTL device, so that the charging management unit sends the received second instruction data to the first USB-to-TTL device through the data transmission channel; The first USB-to-TTL device sends the received second instruction data to the terminal device; The terminal device compares the first instruction data sent with the first instruction data received, and compares the second instruction data sent with the second instruction data received, to determine the test result of the device under test.

9. The method according to claim 8, wherein The test system further includes a private protocol conversion device, where, The method further includes: the terminal device sends a first target instruction to the private protocol conversion device, where the first target instruction is used to indicate to open the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device converts the format of the first target instruction into a format recognizable by the charging management unit, and sends the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

10. The method according to claim 8, wherein The test system further includes a switch, one end of the switch is connected to the TRX pin of the charging management unit, where, The method further includes: when the second USB to TTL device is used to transmit the first instruction data, the terminal device controls the other end of the switching switch to switch to be connected to the RX pin of the second USB to TTL device; When the second USB to TTL device is used to transmit the second instruction data, the terminal device controls the other end of the switching switch to switch to be connected to the TX pin of the second USB to TTL device.

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