Circuit evaluation method, optimization method, device and system, terminal and computer storage medium
By constructing process angles and performing simulations, combined with optimization and adjustment, the problem of inaccurate RSFQ circuit evaluation is solved, and accurate evaluation of circuit performance and design reliability is achieved.
Patent Information
- Application Number
- CN202510482338.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-17
- Publication Date
- 2025-08-05
AI Technical Summary
In the prior art, RSFQ circuits are evaluated based on constant parameter values, which cannot accurately reflect the circuit situation in actual production, resulting in inaccurate evaluation results.
By obtaining the fluctuation parameter range and simulation parameter values of the circuit under the current production process, constructing process angles and simulating them, obtaining simulation data of each process angle. If the circuit work requirements are met, the evaluation will be passed, otherwise it will not be passed, and optimization and adjustment will be carried out when the evaluation fails.
It realizes accurate evaluation of circuit performance, improves the reliability of circuit design and product yield, and reduces evaluation costs and development cycles.
Smart Images
Figure CN120430252A_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the field of superconducting devices and relates to a fast single-flux quantum technology, and in particular to a circuit evaluation method, optimization method, device, system, terminal and computer storage medium. Background Art
[0002] RSFQ (Rapid Single Flux Quantum) circuits are ultra-high-speed digital integrated circuits based on superconducting Josephson junctions, offering the advantages of ultra-low power consumption and high efficiency. However, performance evaluation is required to ensure that RSFQ circuits using current production processes meet design requirements before mass production.
[0003] Currently, performance evaluation of RSFQ circuits primarily relies on simulation analysis based on parameter values obtained during pilot production to predict circuit performance. However, since parameter values often fluctuate within a certain range during actual production, simulations based on fixed parameters cannot accurately reflect actual production results. In particular, the design and manufacture of RSFQ circuits require extremely high process precision. Even small parameter fluctuations can lead to significant changes in circuit performance. Therefore, evaluation methods based on constant parameter values cannot accurately reflect the circuit's actual production performance, resulting in significant discrepancies between simulation results and measured performance, which in turn affects the reliability and yield of the circuit design.
[0004] Therefore, how to improve the performance evaluation method of RSFQ circuits so that it can fully consider the impact of parameter fluctuations and thus more accurately predict the circuit performance in actual production is a key technical problem that needs to be urgently solved by those skilled in the art. Summary of the Invention
[0005] The purpose of this application is to provide a circuit evaluation method, optimization method, device, system, terminal and computer storage medium, which are used to solve the problem in the prior art that the RSFQ circuit is evaluated based on constant parameter values, which cannot accurately reflect the circuit conditions in actual production, resulting in inaccurate evaluation results.
[0006] In the first aspect, the present application provides a circuit evaluation method, including: obtaining the fluctuation parameter ranges and simulation parameter values of the circuit under the current production process; based on each of the fluctuation parameter ranges, combined with a preset process angle parameter framework, obtaining each process angle; for each of the process angles, respectively combining each of the simulation parameter values to perform simulation, and obtaining simulation data of each of the process angles; if the simulation data corresponding to each of the process angles meets the circuit working requirements, the evaluation result of the circuit is passed; otherwise, the evaluation result of the circuit is failed; wherein, the circuit working requirements are used to characterize the simulation conditions of each process angle of a qualified circuit.
[0007] In one embodiment of the present application, the simulation data of each of the process angles includes a bias current percentage range, and the circuit operation requirements are: the range of the bias current percentage range corresponding to each of the process angles is greater than a preset range threshold, and the bias current percentage range corresponding to each of the process angles has at least partial overlap.
[0008] In one embodiment of the present application, the method for obtaining the range of each of the fluctuation parameters includes: performing tape-out testing based on the trial production circuit under the current production process to obtain the test maximum value and test minimum value corresponding to each fluctuation parameter; based on the test maximum value and test minimum value corresponding to each of the fluctuation parameters, obtaining the range of each of the fluctuation parameters.
[0009] In one embodiment of the present application, the method for obtaining any of the simulation parameter values includes: performing tape-out testing based on the trial production circuit under the current production process to obtain the test values of the current simulation parameters; and taking the average value based on the test values of the current simulation parameters as the corresponding simulation parameter value.
[0010] In a second aspect, the present application provides a circuit optimization and evaluation method, comprising: based on the circuit evaluation method as described above, obtaining the evaluation result of the circuit under the current production process; if the evaluation result is failed, optimizing and adjusting the circuit, and re-executing the circuit evaluation method based on the optimized and adjusted circuit until the evaluation result of the circuit is passed.
[0011] In one embodiment of the present application, the circuit evaluation method is evaluated based on the simulation data of each process corner of the circuit, and the optimization and adjustment of the circuit includes: obtaining the process corners in the circuit that fail the evaluation as the process corners to be optimized; based on the process corners to be optimized, adjusting the various simulation parameters of the circuit to optimize the circuit.
[0012] In a third aspect, the present application provides a circuit evaluation device, comprising a parameter acquisition module, a process angle acquisition module, a simulation module and an evaluation module; the parameter acquisition module is used to obtain the fluctuation parameter ranges and simulation parameter values of the circuit under the current production process; the process angle acquisition module is used to obtain each process angle based on the fluctuation parameter ranges and in combination with a preset process angle parameter framework; the simulation module is used to simulate each process angle in combination with each simulation parameter value to obtain simulation data of each process angle; the evaluation module is used to evaluate the circuit as passed if the simulation data corresponding to each process angle meets the circuit working requirements; otherwise, the evaluation result of the circuit is failed; wherein, the circuit working requirements are used to characterize the simulation conditions of each process angle of a qualified circuit.
[0013] In a fourth aspect, the present application provides a circuit optimization system, comprising a circuit evaluation device and an optimization device; the circuit evaluation device is used to obtain an evaluation result of the circuit under the current production process based on the circuit evaluation method as described above; the optimization device is used to optimize and adjust the circuit if the evaluation result is not passed, and re-execute the circuit evaluation method based on the optimized and adjusted circuit until the evaluation result of the circuit is passed.
[0014] In a fifth aspect, the present application provides a terminal, comprising: a processor and a memory, wherein the memory is communicatively connected to the processor;
[0015] The memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory, so that the terminal performs the circuit evaluation method or circuit optimization method as described above.
[0016] In a sixth aspect, the present application provides a computer storage medium storing a computer program, which, when executed by a processor, implements the circuit evaluation method or circuit optimization method as described above.
[0017] As described above, this application provides a circuit evaluation method, optimization method, device, system, terminal, and computer storage medium. By constructing various process corners and performing simulations, the simulation results fully cover the fluctuations of various fluctuating parameters, preventing performance changes caused by parameter fluctuations from affecting the accuracy of the evaluation results, thereby achieving good circuit evaluation results. At the same time, this application also optimizes and adjusts the circuit based on the evaluation results to ensure that the circuit meets design requirements and effectively improves the reliability of the circuit design. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 Shown is a flow chart of a circuit evaluation method described in an embodiment of the present application.
[0019] Figure 2 Shown is a flow chart of a method for obtaining a fluctuation parameter range described in an embodiment of the present application.
[0020] Figure 3 Shown is a flow chart of a method for obtaining simulation parameter values described in an embodiment of the present application.
[0021] Figure 4 Shown is a schematic diagram of a process angle parameter framework described in an embodiment of the present application.
[0022] Figure 5 Shown is a schematic diagram of the values of various process angle fluctuation parameters and simulation parameters described in an embodiment of the present application.
[0023] Figure 6Shown is a schematic diagram of a circuit simulation result described in an embodiment of the present application.
[0024] Figure 7 Shown is a flow chart of a circuit optimization method described in an embodiment of the present application.
[0025] Figure 8 Shown is a schematic diagram of a flow chart of circuit optimization and adjustment according to an embodiment of the present application.
[0026] Figure 9 Shown is a schematic diagram of simulation results after circuit optimization and adjustment according to an embodiment of the present application.
[0027] Figure 10 Shown is a structural schematic diagram of a circuit evaluation device according to an embodiment of the present application.
[0028] Figure 11 Shown is a structural schematic diagram of a circuit optimization system described in an embodiment of the present application.
[0029] Figure 12 Shown is a structural schematic diagram of a terminal described in an embodiment of the present application.
[0030] Description of Reference Numerals
[0031] 50: Circuit evaluation device; 51: Parameter acquisition module; 52: Process angle acquisition module; 53: Simulation module; 54: Evaluation module; 60: Optimization device; 70: Terminal; 71: Processor; 72: Memory; 721: Operating system; 722: Application; 73: User interface; 74: Network interface; 75: Bus system. DETAILED DESCRIPTION
[0032] The following describes the embodiments of the present application through specific examples. Those skilled in the art can easily understand other advantages and effects of the present application from the content disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments. The details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other unless they conflict.
[0033] It should be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present application. Therefore, the illustrations only show components related to the present application and are not drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout type may also be more complicated.
[0034] Existing circuit evaluation methods often rely on obtaining circuit parameter values during trial production for simulation analysis, thereby evaluating circuit performance based on the simulation results. However, due to fluctuations in circuit parameters during actual production, there is a certain deviation between the actual circuit parameter values and the parameter values used for simulation, which in turn leads to inaccurate circuit evaluation results. This is particularly true for RSFQ circuits, where even minor parameter fluctuations can significantly alter the performance of the RSFQ circuit. Therefore, the evaluation results of this circuit evaluation method for RSFQ circuits deviate significantly from the measured results, resulting in poor evaluation results.
[0035] In response to the technical problems existing in the prior art, the following embodiments of the present application provide a circuit evaluation method, optimization method, device, system, terminal and computer storage medium, which construct each process angle through the fluctuation range of the parameters, and perform simulation simulation based on each process angle to obtain simulation data corresponding to each process angle, so as to evaluate the performance of the circuit based on each simulation data, thereby obtaining the evaluation results of the circuit, so as to accurately predict the circuit performance in actual production, thereby effectively improving the circuit design reliability and product yield.
[0036] The following embodiments of the present application provide a circuit evaluation method, optimization method, device, system, terminal, and computer storage medium, including but not limited to performance evaluation of RSFQ circuits. The following description will take the performance evaluation of RSFQ circuits as an example.
[0037] It should be noted that the circuit evaluation method, optimization method, device, system, terminal and computer storage medium described in this application can also be applied to the performance evaluation of other circuits to achieve accurate prediction of circuit performance. Specifically, those skilled in the art can implement the application according to actual needs, and this application does not make specific restrictions here.
[0038] The technical solutions in the embodiments of the present application will be described in detail below with reference to the accompanying drawings in the embodiments of the present application.
[0039] like Figure 1 As shown, this embodiment provides a circuit evaluation method, including:
[0040] S100, obtaining the fluctuation parameter ranges and simulation parameter values of the circuit under the current production process.
[0041] Among them, the fluctuation parameter range is used to characterize the variation interval of the fluctuation parameter value under the current production process. The fluctuation parameter is a parameter that is correlated with the performance to be evaluated of the circuit, that is, when the fluctuation parameter fluctuates, the performance to be evaluated of the circuit will change accordingly.
[0042] The simulation parameter value is used to characterize the numerical value of the simulation parameter under the current production process. The simulation parameter is used for simulation of the circuit, and when the simulation parameter fluctuates, the performance to be evaluated of the circuit remains relatively stable, that is, the performance to be evaluated of the circuit does not change or changes slightly.
[0043] Exemplarily, various parameters of the circuit are obtained through tape-out testing of a pilot production circuit to obtain the fluctuation parameter ranges and the simulation parameter values. The pilot production circuit refers to a circuit obtained through small-scale pilot production based on the current production process. Tape-out testing of the pilot production circuit refers to experimental testing of the pilot production circuit to obtain the fluctuation parameter ranges and the simulation parameter values.
[0044] In some optional embodiments, such as Figure 2 As shown, the method for obtaining the range of each fluctuation parameter includes:
[0045] S111 , performing a tape-out test on the trial production circuit under the current production process, and obtaining a test maximum value and a test minimum value corresponding to each of the fluctuation parameters.
[0046] It should be noted that in order to ensure the accuracy of the obtained fluctuation parameter range, before conducting tape-out testing, the trial production circuits with manufacturing defects are screened and eliminated, and tape-out testing is performed based on the remaining trial production circuits to avoid errors in the manufacturing process affecting the results of the tape-out test, thereby causing the obtained fluctuation parameter range to be inaccurate.
[0047] S112: Obtain the range of each fluctuation parameter based on the test maximum value and the test minimum value corresponding to each fluctuation parameter.
[0048] Specifically, the maximum value of the test is used as the upper bound of the fluctuation parameter range, and the minimum value of the test is used as the lower bound of the fluctuation parameter range, so as to obtain the variation interval of the test value as the fluctuation parameter range.
[0049] Similarly, in some optional embodiments, such as Figure 3 As shown, any of the methods for obtaining simulation parameter values includes:
[0050] S121, performing a tape-out test based on the trial production circuit under the current production process to obtain various test values of the current simulation parameters.
[0051] Similar to step S111, before performing tape-out testing, trial production circuits with manufacturing defects are screened and eliminated, and tape-out testing is performed based on the remaining trial production circuits to improve the accuracy of the obtained simulation parameter values.
[0052] S122: Taking an average value based on each test value of the current simulation parameter as the corresponding simulation parameter value.
[0053] Specifically, the overall performance of the simulation parameter under the current production process is represented by the average value of each test value, that is, the average value of each test value of the current simulation parameter is used as the simulation parameter value.
[0054] Exemplarily, when the circuit is an RSFQ circuit, the performance to be evaluated is the bias current range of the RSFQ circuit under the current production process, so that the bias current range reflects the operating range of the RSFQ circuit, and the critical current density is used as the first fluctuation parameter, the graphic deviation of the Josephson junction size is used as the second fluctuation parameter, the square resistance of the molybdenum film is used as the first simulation parameter, the graphic deviation of the resistance is used as the second simulation parameter, and the inductance is used as the third simulation parameter to perform performance evaluation of the RSFQ circuit.
[0055] Based on the RSFQ circuit obtained from the trial production, a tape-out test is performed to obtain a first fluctuation parameter range corresponding to the first fluctuation parameter, a second fluctuation parameter range corresponding to the second fluctuation parameter, a first simulation parameter value corresponding to the first simulation parameter, a second simulation parameter value corresponding to the second simulation parameter, and a third simulation parameter value corresponding to the third simulation parameter, so as to obtain the bias current range of the RSFQ circuit under the current production process.
[0056] S200 , obtaining each process angle based on each of the fluctuation parameter ranges and in combination with a preset process angle parameter framework.
[0057] For example, Figure 4 As shown, the preset process angle parameter framework constructs four process angles based on two fluctuation parameters. These four process angles are: both fluctuation parameters take their maximum value, one fluctuation parameter takes its minimum value, another fluctuation parameter takes its maximum value, and both fluctuation parameters take their minimum value. Based on this, the parameter fluctuations of the circuit under the current production process can be characterized by each process angle, allowing simulation to obtain the actual performance of the circuit under the current production process.
[0058] It should be noted that when the number of fluctuation parameters corresponding to the circuit's performance to be evaluated exceeds two, the corresponding fluctuation parameters are combined in pairs to form process corners for circuit performance evaluation. Alternatively, the preset process corner parameter framework is constructed based on multiple fluctuation parameters, where the fluctuation parameters corresponding to any process corner are maximized or minimized to construct each process corner. Specifically, as long as each process corner can characterize the parameter fluctuation of the circuit under the current production process, this embodiment is not specifically limited here.
[0059] In some optional implementations, when the circuit is an RSFQ circuit, four process corners are constructed based on the first fluctuation parameter range and the second fluctuation parameter range. Specifically, Figure 4 As shown, the first process angle is the maximum value of the first fluctuation parameter and the second fluctuation parameter within their corresponding fluctuation parameter ranges; the second process angle is the minimum value of the first fluctuation parameter and the second fluctuation parameter within their corresponding fluctuation parameter ranges; the third process angle is the maximum value of the first fluctuation parameter within its corresponding fluctuation parameter range, and the second fluctuation parameter takes the minimum value within its corresponding fluctuation parameter range; the fourth process angle is the minimum value of the first fluctuation parameter within its corresponding fluctuation parameter range, and the second fluctuation parameter takes the maximum value within its corresponding fluctuation parameter range.
[0060] Based on this, the parameter fluctuation of the RSFQ circuit under the current production process is characterized by the first process angle, the second process angle, the third process angle and the fourth process angle, so as to obtain the actual performance of the RSFQ circuit under the current production process through simulation.
[0061] S300 , performing simulation on each of the process angles in combination with each of the simulation parameter values to obtain simulation data for each of the process angles.
[0062] The simulation data is used to characterize the performance of the circuit in actual use using a computer model. Specifically, each process angle is simulated using simulation software such as LTspice XVII, Proteus, Cadence PSpice, Electronic Workbench, COMSOL Multiphysics, etc. to obtain simulation data corresponding to each process angle.
[0063] For example, when the circuit is an RSFQ circuit, simulation is performed based on each process angle to obtain corresponding simulation data. Specifically, Figure 5 As described above, for the first process angle, based on Figure 5 The simulation is performed on the first set of data in , that is, the first fluctuation parameter and the second fluctuation parameter are both taken as the maximum value within the corresponding fluctuation parameter range, and the first simulation parameter, the second simulation parameter, and the third simulation parameter are all taken as the corresponding simulation parameter values, that is, the average value of the corresponding test values obtained through the tape-out test; similarly, for the second process angle, based on Figure 5The simulation is performed on the second set of data in , that is, the first fluctuation parameter and the second fluctuation parameter both take the minimum value within the corresponding fluctuation parameter range, and the first simulation parameter, the second simulation parameter, and the third simulation parameter all take the corresponding simulation parameter values; for the third process angle, based on Figure 5 The simulation is performed on the third set of data in the , that is, the first fluctuation parameter takes the maximum value within the corresponding fluctuation parameter range, the first fluctuation parameter takes the minimum value within the corresponding fluctuation parameter range, the first simulation parameter, the second simulation parameter, and the third simulation parameter all take corresponding simulation parameter values; for the fourth process angle, based on Figure 5 The fourth set of data in the simulation is simulated, that is, the first fluctuation parameter takes the minimum value within the corresponding fluctuation parameter range, the first fluctuation parameter takes the maximum value within the corresponding fluctuation parameter range, and the first simulation parameter, the second simulation parameter, and the third simulation parameter all take corresponding simulation parameter values.
[0064] Furthermore, to evaluate the bias current range of the RSFQ circuit, the simulation data illustratively includes a bias current percentage range, where the bias current percentage range refers to a range of bias current percentages representing a percentage increase in the bias current of the RSFQ circuit during actual operation relative to a circuit design value. Based on the bias current percentage range, the bias current range of the RSFQ circuit can be evaluated to assess the operating range of the RSFQ circuit.
[0065] like Figure 6 As shown, the simulation data of each process angle of the RSFQ circuit are given as an example, wherein the simulation value corresponding to the number 1 is used to represent the percentage range of the bias current corresponding to the first process angle, that is, based on Figure 5 The bias current percentage range obtained by simulating the first set of data in ; similarly, the simulation value corresponding to the number 2 is used to characterize the bias current percentage range corresponding to the second process angle, the simulation value corresponding to the number 3 is used to characterize the bias current percentage range corresponding to the third process angle, and the simulation value corresponding to the number 4 is used to characterize the bias current percentage range corresponding to the fourth process angle.
[0066] S400: If the simulation data corresponding to each process corner meets the circuit operation requirement, the evaluation result of the circuit is passed; otherwise, the evaluation result of the circuit is failed.
[0067] The circuit operating requirements are used to characterize the simulation conditions of each process corner of a qualified circuit, that is, if the circuit under the current production process meets the normal operating requirements, then the simulation data of the circuit meets the circuit operating requirements.
[0068] Exemplarily, when the circuit is an RSFQ circuit, the circuit operation requirements are: the range of the bias current percentage range corresponding to each process angle is greater than a preset range threshold, and the bias current percentage range corresponding to each process angle has at least partial overlap.
[0069] Among them, the extreme difference threshold is used to characterize the minimum value of the bias current percentage range when the RSFQ circuit meets the design requirements. The bias current percentage range is used to characterize the bias current range of the RSFQ circuit, that is, the working range of the RSFQ circuit. It should be noted that in order to ensure that the RSFQ circuit has a better use effect, it is required to have a larger working range, that is, the working range of the RSFQ circuit exceeds the minimum working range that meets the design requirements, that is, the bias current percentage range of the RSFQ circuit exceeds the extreme difference threshold. Based on this, in order to ensure that each of the process angles has a better use effect, the extreme difference of the bias current percentage range corresponding to each process angle, that is, the difference between the maximum and minimum values of the bias current percentage corresponding to each process angle, is greater than the extreme difference threshold. Exemplarily, the extreme difference threshold is 40%.
[0070] Furthermore, to ensure that the RSFQ circuit using the current production process can operate normally within a specific operating range, the bias current percentage ranges corresponding to the process corners at least partially overlap, wherein all RSFQ circuits using the current production process can operate within the overlapping portion. In other words, the overlapping portion constitutes the specific operating range, ensuring that all RSFQ circuits manufactured using the current production process can operate normally.
[0071] Based on this, if the simulation data corresponding to each of the process angles meets the circuit working requirements, then each of the process angles has a working range that meets the normal design requirements, and each of the process angles can work normally within a specific working range, and the evaluation result of the RSFQ circuit is passed; otherwise, the evaluation result of the RSFQ circuit is failed.
[0072] In order to facilitate those skilled in the art to understand the circuit evaluation results described in this embodiment, the following Figure 6 Taking the simulation results in as an example, the evaluation results of the RSFQ circuit are explained in detail.
[0073] Specifically, if Figure 6As shown, the bias current percentage range corresponding to the first process angle is 40%, the bias current percentage range corresponding to the second process angle is 42%, the bias current percentage range corresponding to the third process angle is 62%, and the bias current percentage range corresponding to the fourth process angle is 63%. If the extreme value threshold is 40%, the bias current percentage range corresponding to the first process angle is no greater than the extreme value threshold. Meanwhile, the bias current percentage ranges corresponding to the second, third, and fourth process angles overlap, but the bias current percentage ranges corresponding to the first and second process angles do not overlap. Based on this, the RSEQ circuit evaluation under the current production process fails.
[0074] Based on this, this embodiment constructs each process angle through the fluctuation range of the fluctuation parameter, and performs simulation based on each process angle to obtain the evaluation result of the circuit, so that the evaluation result can fit the actual performance of the circuit, thereby realizing accurate evaluation of the circuit.
[0075] It should be noted that in order to obtain a circuit with better performance, after evaluating the circuit, it is also necessary to optimize and adjust the circuit based on the evaluation results. Based on this, the present application also provides a circuit optimization method, such as Figure 7 As shown, including:
[0076] S10, based on the circuit evaluation method, obtaining an evaluation result of the circuit under the current production process.
[0077] Specifically, please refer to the aforementioned content for the circuit evaluation method, which will not be described in detail in this embodiment.
[0078] S20: If the evaluation result is a failure, the circuit is optimized and adjusted, and the circuit evaluation method is re-executed based on the optimized and adjusted circuit until the evaluation result of the circuit is a pass.
[0079] Specifically, various parameters of the circuit are adjusted to achieve optimization of the circuit. It should be noted that those skilled in the art should be aware of the method for adjusting various parameters of the circuit, which will not be explained in detail in this embodiment.
[0080] In some optional embodiments, such as Figure 8 As shown, the optimization adjustment method for the circuit includes:
[0081] S21, obtaining the process corners in the circuit that fail the evaluation as the process corners to be optimized.
[0082] Specifically, based on the evaluation results of the circuit, optimization is performed on process corners that fail the evaluation, so as to reduce test costs and shorten the development cycle.
[0083] For example, in order to facilitate those skilled in the art to understand the circuit optimization method described in this embodiment, the following is an exemplary description of the method for determining the process angle to be optimized. Figure 6 As shown, since the bias current percentage range corresponding to the first process angle is 40%, which is not greater than the extreme value threshold, and the bias current percentage ranges corresponding to the first process angle and the second process angle have no overlapping parts, that is, the first process angle is the process angle that fails the evaluation in the RSFQ circuit, and the first process angle is used as the process angle to be optimized.
[0084] S22: Based on the process angle to be optimized, adjust various simulation parameters of the circuit to optimize the circuit.
[0085] Specifically, since the fluctuation parameter value corresponding to the process angle to be optimized cannot meet the normal working requirements of the circuit, the corresponding simulation parameters are adjusted to change the circuit condition of the process angle to be optimized, thereby optimizing the circuit.
[0086] For example, Figure 6 As shown, when the first process angle is the process angle to be optimized, the first fluctuation parameter range and the second fluctuation parameter range are kept unchanged, and the first simulation value, the second simulation value, and the third simulation value are adjusted to optimize the RSFQ circuit.
[0087] Furthermore, if Figure 9 The figure shows simulation data after optimizing the simulation parameters based on the first process angle. The simulation value corresponding to the number 1 represents the simulation data corresponding to the optimized first process angle, with a bias current percentage range of 67%; the simulation value corresponding to the number 2 represents the simulation data corresponding to the optimized second process angle, with a bias current percentage range of 45%; the simulation value corresponding to the number 3 represents the simulation data corresponding to the optimized third process angle, with a bias current percentage range of 75%; and the simulation value corresponding to the number 4 represents the simulation data corresponding to the optimized fourth process angle, with a bias current percentage range of 64%. When the extreme value threshold is 40%, the bias current percentage range corresponding to each process angle is greater than the extreme value threshold, and the bias current percentage ranges corresponding to the first, second, third, and fourth process angles overlap, indicating that the simulation data corresponding to each process angle meets the circuit operating requirements and the evaluation result is passed.
[0088] Based on this, after completing the evaluation of the circuit, this embodiment further optimizes and adjusts the circuit to ensure that the circuit can meet normal working requirements, thereby effectively improving the circuit design reliability and product yield.
[0089] like Figure 10 As shown, a circuit evaluation device 50 provided in this embodiment includes a parameter acquisition module 51 , a process angle acquisition module 52 , a simulation module 53 and an evaluation module 54 .
[0090] The parameter acquisition module 51 is used to obtain the range of each fluctuation parameter of the circuit and the value of each simulation parameter under the current production process.
[0091] The process angle acquisition module 52 is used to acquire each process angle based on each fluctuation parameter range and in combination with a preset process angle parameter framework.
[0092] The simulation module 53 is used to perform simulation on each of the process angles in combination with each of the simulation parameter values to obtain simulation data of each of the process angles.
[0093] The evaluation module 54 is configured to evaluate the circuit as passed if the simulation data corresponding to each process corner meets the circuit operation requirement; otherwise, the evaluation result of the circuit is failed.
[0094] like Figure 11 As shown, this embodiment further provides a circuit optimization system, which includes a circuit evaluation device 50 and an optimization device 60.
[0095] The circuit evaluation device 50 is used to obtain the evaluation result of the circuit under the current production process based on the circuit evaluation method as described above.
[0096] The optimization device 60 is configured to optimize and adjust the circuit if the evaluation result is a failure, and re-execute the circuit evaluation method based on the optimized and adjusted circuit until the evaluation result of the circuit is a pass.
[0097] Based on the same technical concept, the circuit evaluation method or the circuit optimization method provided in the embodiment of the present invention can be implemented on the terminal side or the server side.
[0098] like Figure 12FIG2 shows an optional hardware structure diagram of a terminal provided in an embodiment of the present invention. Terminal 70 can be a mobile phone, a computer, a tablet device, a personal digital assistant, a factory backend processing device, or the like. Terminal 70 includes at least one processor 71, a memory 72, at least one network interface 74, and a user interface 73. The various components in the device are coupled together via a bus system 75. It will be appreciated that bus system 75 is used to enable communication between these components. In addition to a data bus, bus system 75 also includes a power bus, a control bus, and a status signal bus.
[0099] The user interface 73 may include a display, a keyboard, a mouse, a trackball, a click gun, keys, buttons, a touch pad or a touch screen.
[0100] It will be appreciated that the memory 72 may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. The non-volatile memory may be a read-only memory (ROM) or a programmable read-only memory (PROM), which is used as an external cache. By way of example and not limitation, many forms of RAM are available, such as static random access memory (SRAM) and synchronous static random access memory (SSRAM). The memories represented by the embodiments of the present invention are intended to include, but are not limited to, these and any other suitable types of memories.
[0101] The memory 72 in the embodiment of the present invention is used to store various categories of data to support the operation of the terminal. Examples of these data include: any executable program for operating on the terminal 70, such as an operating system 721 and an application 722; the operating system 721 includes various system programs, such as a framework layer, a core library layer, a driver layer, etc., for implementing various basic services and processing hardware-based tasks. The application 722 can include various applications, such as a media player (MediaPlayer), a browser (Browser), etc., for implementing various application services. The circuit evaluation method or the circuit optimization method provided by the embodiment of the present invention can be included in the application 722.
[0102] The method disclosed in the above embodiment of the present invention can be applied to the processor 71 or implemented by the processor 71. The processor 71 may be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method can be completed by the hardware integrated logic circuit in the processor 71 or by instructions in the form of software. The above processor may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The processor 71 can implement or execute the various methods, steps and logic block diagrams disclosed in the embodiment of the present invention. The processor 71 may be a microprocessor or any conventional processor, etc. The steps of the accessory optimization method provided in the embodiment of the present invention can be directly embodied as being executed by a hardware decoding processor, or can be executed by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium, which is located in a memory. The processor reads the information in the memory and completes the steps of the above method in combination with its hardware.
[0103] In an exemplary embodiment, the terminal 70 may be configured to execute the aforementioned method by one or more application specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), or complex programmable logic devices (CPLDs).
[0104] An embodiment of the present invention further provides a computer-readable storage medium storing a computer program, which, when called by a processor, implements the circuit evaluation method or the circuit optimization method provided by the present invention.
[0105] Among them, a computer-readable storage medium can be a tangible device that can hold and store instructions used by an instruction execution device. The computer-readable storage medium can be, for example, (but not limited to) an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, and a mechanical encoding device.
[0106] The computer-readable program characterized herein can be downloaded from a computer-readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device via a network, such as the Internet, a local area network, a wide area network, and / or a wireless network. A network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in a computer-readable storage medium in each computing / processing device.
[0107] In summary, this application constructs each process angle based on the fluctuation parameter range, and performs simulations based on each process angle, so that the obtained simulation data can accurately reflect the actual performance of the circuit, thereby ensuring that the evaluation data obtained based on the simulation data is highly reliable. At the same time, based on the evaluation results, the circuit is optimized and adjusted, effectively improving the reliability of the circuit design and saving costs, which has high industrial application value.
[0108] The descriptions of the processes or structures corresponding to the above figures have different emphases. For parts that are not described in detail in a certain process or structure, please refer to the relevant descriptions of other processes or structures.
[0109] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical concepts disclosed in this application shall be covered by the claims of this application.
Claims
1. A circuit evaluation method comprising: Obtain the fluctuation parameter ranges and simulation parameter values of the circuit under the current production process; Based on the fluctuation parameter ranges, and in combination with a preset process angle parameter framework, each process angle is obtained; For each of the process angles, simulation is performed in combination with each of the simulation parameter values to obtain simulation data for each of the process angles; If the simulation data corresponding to each process corner meets the circuit operation requirements, the evaluation result of the circuit is passed; otherwise, the evaluation result of the circuit is failed; The circuit operation requirements are used to characterize the simulation conditions of each process corner of a qualified circuit.
2. The circuit evaluation method according to claim 1, wherein: The simulation data of each process angle includes a bias current percentage range, and the circuit operation requirements are: the range of the bias current percentage range corresponding to each process angle is greater than a preset range threshold, and the bias current percentage range corresponding to each process angle has at least partial overlap.
3. The circuit evaluation method according to claim 1, wherein: The method for obtaining each of the fluctuation parameter ranges includes: Conduct tape-out testing based on the trial production circuit under the current production process to obtain the maximum and minimum test values corresponding to each fluctuation parameter; Based on the test maximum value and the test minimum value corresponding to each of the fluctuation parameters, the range of each of the fluctuation parameters is obtained.
4. The circuit evaluation method according to claim 1, wherein: Any method for obtaining a simulation parameter value includes: Conduct tape-out testing based on the trial production circuit under the current production process to obtain the test values of the current simulation parameters; An average value is taken based on each test value of the current simulation parameter to serve as the corresponding simulation parameter value.
5. A circuit optimization method, comprising: Based on the circuit evaluation method according to any one of claims 1 to 4, obtaining an evaluation result of the circuit under the current production process; If the evaluation result is a failure, the circuit is optimized and adjusted, and the circuit evaluation method is re-executed based on the optimized and adjusted circuit until the evaluation result of the circuit is a pass.
6. The circuit optimization method according to claim 5, characterized in that: The circuit evaluation method is based on the simulation data of each process corner of the circuit for evaluation, and the circuit optimization and adjustment includes: Obtaining the process corners that fail the evaluation in the circuit as the process corners to be optimized; Based on the process angle to be optimized, various simulation parameters of the circuit are adjusted to optimize the circuit.
7. A circuit evaluation device, characterized in that It includes parameter acquisition module, process angle acquisition module, simulation module and evaluation module; The parameter acquisition module is used to obtain the fluctuation parameter ranges and simulation parameter values of the circuit under the current production process; The process angle acquisition module is configured to acquire each process angle based on each fluctuation parameter range and in combination with a preset process angle parameter framework; The simulation module is used to simulate each process angle in combination with each simulation parameter value to obtain simulation data of each process angle; The evaluation module is configured to determine that if the simulation data corresponding to each process corner meets the circuit operation requirements, the evaluation result of the circuit is passed; otherwise, the evaluation result of the circuit is failed; The circuit operation requirements are used to characterize the simulation conditions of each process corner of a qualified circuit.
8. A circuit optimization system, characterized in that: including a circuit evaluation device and an optimization device; The circuit evaluation device is configured to obtain an evaluation result of the circuit under the current production process based on the circuit evaluation method according to any one of claims 1 to 4; The optimization device is used to optimize and adjust the circuit if the evaluation result is not passed, and re-execute the circuit evaluation method based on the optimized and adjusted circuit until the evaluation result of the circuit is passed.
9. A terminal, characterized in that: include: A processor and a memory, wherein the memory is communicatively connected to the processor; The memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory, so that the terminal performs the circuit evaluation method according to any one of claims 1 to 4, or performs the circuit optimization method according to any one of claims 5 to 6.
10. A computer storage medium storing a computer program, wherein: When the computer program is executed by a processor, the circuit evaluation method according to any one of claims 1 to 4 is implemented, or the circuit optimization method according to any one of claims 5 to 6 is implemented.