Targeted sampling micro-nano robot mechanical test method and system

Abstract

The invention discloses a targeted sampling micro-nano robot mechanical test method and system, the method adopts a template method to prepare a substrate provided with a soft silica gel micro-column, and by characterizing the bending degree of the micro-column in contact with the cutting edge of a micro-nano robot, the mechanical scraping force generated during sampling is quantitatively calculated. According to the invention, the super-resolution effect of the video in the complex motion scene is improved, and the quality and visual effect of the video are enhanced. According to the invention, an important basis is provided for the realization of a targeted sampling function of a micro-nano robot by constructing a mechanical test method of an in-situ integrated micro-nano level structure with dynamic adaptability and environmental compatibility.

Description

Technical Field

[0001] The present invention belongs to the technical field of medical devices, and in particular relates to a targeted sampling micro-nano robot mechanical testing method and system. Background Art

[0002] A targeted sampling micro-nano robot is a device capable of sampling lesions in complex biological environments. The robot, described in this invention, applies mechanical scraping force to lesion cell populations through a cutting edge structure, enabling controlled sampling of tissue samples such as mucus, cell fragments, and whole cells. Enabling the micro-nano robot to exert sufficient force on its surroundings at the micro-nano scale determines its sampling success rate and efficiency. Therefore, developing a mechanical testing method for micro-nanoscale sampling structures provides an important theoretical basis for realizing the targeted sampling capabilities of micro-nanorobots.

[0003] Targeted sampling by micro-nanorobotics in the biomedical field requires precise control of micro- and nanoscale mechanical forces to ensure sampling success and sample integrity. However, traditional mechanical property testing methods and instruments are primarily designed for conventional specimens ranging from millimeters to centimeters. The force sensor resolution and motion control accuracy of these instruments are difficult to adapt to micro- and nanoscale structures. This leads to problems such as the inability to observe the dynamic mechanical behavior of micro- and nanorobots in simulated biological environments in real time, large errors in sampling force measurements due to insufficient resolution, and difficulty in achieving in-situ mechanical feedback.

[0004] Currently, mainstream micro-nanomechanical testing technologies include indentation testing, electrostatic preloading, and amplification transfer. The indentation testing method applies a nanoscale indentation load via a diamond indenter and indirectly calculates parameters such as elastic modulus and hardness based on the deformation curve. However, this requires a fixed specimen and cannot dynamically track a moving sampling robot. The electrostatic preloading method uses a comb-like electrostatic structure to generate a micro-newton preload, compressing the cantilever beam structure to amplify the deformation signal. However, this method relies on high-precision electric field control and has difficulty operating stably in media such as biological mucus. The amplification transfer method uses multi-stage mechanical levers to amplify micro-nano deformations to a range detectable by optical sensors. However, the inertial effect of its mechanical transmission chain introduces response delays, making it difficult to meet the dynamic requirements of high-speed micro-nanorobotics. Summary of the Invention

[0005] In response to the above problems, the present invention provides a mechanical testing method and system for a targeted sampling micro-nano robot, aiming to construct a mechanical testing method for micro-nano structures with dynamic adaptability, environmental compatibility and in-situ integration, which is of great significance for promoting the clinical application of targeted sampling robots.

[0006] According to a first aspect of an embodiment of the present disclosure, a targeted sampling micro-nano robot mechanical testing method is provided. The method adopts a template method to prepare a substrate provided with soft silicone micro-pillars, and quantitatively calculates the mechanical scraping force generated during sampling by characterizing the degree of bending of the micro-pillars contacted by the cutting edge of the micro-nano robot.

[0007] In some embodiments, a template method is used to prepare a substrate having soft silicone micropillars, specifically comprising:

[0008] Design a mold containing a cylindrical channel structure with a micron-scale diameter and print it using a UV stereolithography printer and its supporting resin to serve as a mold template for the microcolumns;

[0009] A high-temperature heating method is used to deposit a perfluorinated hydrophobic coating on the mold surface;

[0010] Using silicone as the micropillar material, liquid silicone is poured into a coated mold and vacuum degassed to eliminate air from the liquid silicone and ensure it is completely immersed in the micropores. After curing in a high-temperature oven and demolding, a substrate with soft silicone micropillars is obtained.

[0011] In some embodiments, under the recording of a high-speed lens, the sampling micro-nano robot rolls and samples under the action of a rotating magnetic field. The edge structure of the sampling micro-nano robot interacts with a single micro-pillar, causing the deflection of the tip of the micro-pillar, i.e., the cantilever beam. Based on the Euler cantilever beam structural mechanics, the force exerted by the sampling micro-nano robot on the cantilever beam is obtained, which is the mechanical scraping force.

[0012] In some embodiments, the specific expression of Euler cantilever beam structural mechanics is: where θ B represents the end section rotation angle, ω B represents the maximum deflection, F represents the force exerted by the sampling micro-nano robot on the cantilever beam, E represents the Young's modulus of the cantilever beam, I represents the moment of inertia of the cantilever beam section, a represents the position where the force is exerted on the cantilever beam, and l represents the length of the cantilever beam.

[0013] According to a second aspect of an embodiment of the present disclosure, a targeted sampling micro-nano robot mechanical testing system is provided, wherein the system comprises a substrate provided with soft silicone micro-pillars and a mechanical scraping force acquisition module, wherein the substrate provided with soft silicone micro-pillars is prepared by a template method, and the mechanical scraping force acquisition module is used to quantitatively calculate the mechanical scraping force generated during sampling by characterizing the degree of bending of the micro-pillars contacted by the cutting edge of the micro-nano robot.

[0014] In some embodiments, the substrate provided with soft silicone microcolumns is prepared using a template method, specifically comprising:

[0015] Design a mold containing a cylindrical channel structure with a micron-scale diameter and print it using a UV stereolithography printer and its supporting resin to serve as a mold template for the microcolumns;

[0016] A high-temperature heating method is used to deposit a perfluorinated hydrophobic coating on the mold surface;

[0017] Using silicone as the micropillar material, liquid silicone is poured into a coated mold and vacuum degassed to eliminate air from the liquid silicone and ensure it is completely immersed in the micropores. After curing in a high-temperature oven and demolding, a substrate with soft silicone micropillars is obtained.

[0018] In some embodiments, the mechanical scraping force acquisition module is implemented by rolling the sampling micro-nano robot under the action of a rotating magnetic field under the recording of a high-speed lens. The edge structure of the sampling micro-nano robot interacts with a single micro-pillar, causing the tip of the micro-pillar, i.e., the cantilever beam, to deflect. Based on the Euler cantilever beam structural mechanics, the force exerted by the sampling micro-nano robot on the cantilever beam is obtained, which is the mechanical scraping force.

[0019] In some embodiments, the Euler cantilever beam structural mechanics in the mechanical scraping force acquisition module is specifically expressed as: where θ B represents the end section rotation angle, ω B represents the maximum deflection, F represents the force exerted by the sampling micro-nano robot on the cantilever beam, E represents the Young's modulus of the cantilever beam, I represents the moment of inertia of the cantilever beam section, a represents the position where the force is exerted on the cantilever beam, and l represents the length of the cantilever beam.

[0020] The embodiments of the present disclosure provide a mechanical testing method and system for a targeted sampling micro-nano robot. The method adopts a template method to prepare a substrate provided with soft silicone micro-pillars. By characterizing the degree of curvature of the micro-pillars contacted by the cutting edge of the micro-nano robot, the mechanical scraping force generated during sampling is quantitatively calculated. The present invention provides an important basis for realizing the targeted sampling function of the micro-nano robot by constructing a mechanical testing method for a micro-nano structure with dynamic adaptability, environmental compatibility and in-situ integration.

[0021] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present invention and, together with the description, serve to explain the principles of the present invention.

[0023] Figure 1 Schematic diagram of a substrate structure provided with soft silicone microcolumns in an embodiment of the present invention;

[0024] Figure 2 (a) is a view of the sampling micro-nano robot before applying force to the cantilever beam in the embodiment of the present invention. Figure 2 (b) is a view of the sampling micro-nano robot after applying force to the cantilever beam in an embodiment of the present invention;

[0025] Figure 3 This is a schematic diagram of the cantilever beam structure mechanics in an embodiment of the present invention;

[0026] Figure 4 This is a side view of an end section of an ecoflex cantilever beam measured in an embodiment of the present invention. DETAILED DESCRIPTION

[0027] The present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are intended only to illustrate the present invention and are not intended to limit the present invention. It should also be noted that, for ease of description, the accompanying drawings only illustrate portions relevant to the present invention, not all structures.

[0028] Before discussing the exemplary embodiments in more detail, it should be mentioned that some exemplary embodiments are described as processes or methods depicted as flow charts. Although the flow charts describe the steps as sequential processes, many of the steps can be implemented in parallel, concurrently, or simultaneously. In addition, the order of the steps can be rearranged. The process can be terminated when its operation is completed, but can also have additional steps not included in the accompanying drawings. The process can correspond to a method, function, procedure, subroutine, subprogram, etc.

[0029] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0030] In the present invention, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection; direct connection, or indirect connection through an intermediate medium; internal communication between two components, or interaction between two components, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0031] In the present invention, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediary. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0032] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only implementation methods.

[0033] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0034] In an embodiment, a targeted sampling micro-nano robot mechanical testing method is provided, in which a template method is used to prepare a substrate provided with soft silicone micro-pillars. By characterizing the degree of curvature of the micro-pillars contacted by the cutting edge of the micro-nano robot, the mechanical scraping force generated during sampling is quantitatively calculated, and the sampling performance of the sampling structure is evaluated thereby.

[0035] The template method is used to prepare a substrate with soft silicone microcolumns, which specifically includes: designing a mold with a cylindrical pore structure with a micron-scale diameter, and printing it out using a nanoArch S130 UV stereolithography printer and its supporting resin as a reverse mold template for the microcolumns; in order to facilitate demolding, a high-temperature heating method is used to deposit a perfluorohydrophobic coating on the mold surface; smooth-on ecoflex-30 silicone is used as the microcolumn material, and the liquid silicone is poured into the coated mold for vacuum degassing to eliminate the air in the liquid silicone and ensure that the liquid silicone is completely immersed in the microchannels. After curing and demolding in a high-temperature oven, a substrate with soft silicone microcolumns is obtained. It can be cut and bonded as needed. Figure 1 As shown, a substrate 1 is provided with soft silicone micro-pillars 2.

[0036] like Figure 2 As shown in the figure, under the recording of high-speed camera, the sampling micro-nano robot rolls forward to sample under the action of rotating magnetic field. The cutting edge structure of the sampling micro-nano robot interacts with a single micro-pillar, causing the tip of the micro-pillar, i.e., the cantilever beam, to deflect. Based on the Euler cantilever beam structural mechanics, the force exerted by the sampling micro-nano robot on the cantilever beam is obtained, which is the mechanical scraping force. Figure 2 (a) is the view before force is applied, Figure 2 (b) is the view after force is applied, from which it can be seen that the tip of the micropillar, i.e., the cantilever beam, deflects after force is applied.

[0037] like Figure 3 As shown in Figure 2, the specific expression of Euler cantilever beam structural mechanics is: where θ B represents the end section rotation angle, ω B represents the maximum deflection, F represents the force exerted by the sampling micro-nano robot on the cantilever beam, E represents the Young's modulus of the cantilever beam, I represents the moment of inertia of the cantilever beam section, a represents the position where the force is exerted on the cantilever beam, and l represents the length of the cantilever beam.

[0038] In the specific implementation process, Figure 4 As shown in the figure, the end section rotation angle of the ecoflex (a special material launched by BASF, Germany) cantilever beam is measured in the side view. Using the known values of the length, Young's modulus and section moment of inertia of the micro cantilever beam, the force exerted by the sampling structure on the micro cantilever beam can be determined, thereby quantitatively characterizing the sampling performance of the sampling structure.

[0039] In one example, the maximum deflection ω is measured B The cantilever beam has a length of 49 μm, the position a where the force is applied to the cantilever beam is 1330 μm, the cantilever beam length l is 1475 μm, the cantilever beam diameter d is 325 μm, and the moment of inertia of the cantilever beam section is I = πd 4 / 64, the Young's modulus E of the cantilever beam is 135kPa, substitute into the formula It can be calculated that the force F exerted by the sampling microrobot on the cantilever beam is 3.97 μN.

[0040] In another example, the end section rotation angle is measured to be 3°. It is known that the position where the force is applied to the cantilever beam is 1350 μm, the Young's modulus of the cantilever beam is 135 kPa, the diameter of the cantilever beam is 325 μm, and the moment of inertia of the cantilever beam section is I = πd 4 / 64, substitute into the formula It can be calculated that the force F exerted by the sampling microrobot on the cantilever beam is 4.24 μN.

[0041] Another embodiment is used to illustrate a targeted sampling micro-nano robot mechanical testing system, the system includes a substrate with soft silicone micro-pillars and a mechanical scraping force acquisition module, the substrate with soft silicone micro-pillars is as follows: Figure 1 As shown, it is prepared by a template method, and the mechanical scraping force acquisition module is used to quantitatively calculate the mechanical scraping force generated during sampling by characterizing the degree of curvature of the micro-pillar contacted by the cutting edge of the micro-nano robot.

[0042] The substrate with soft silicone micropillars is prepared by a template method, which specifically includes:

[0043] A mold with a cylindrical pore structure with a micrometer-scale diameter was designed and printed using a nanoArch S130 UV stereolithography printer and its supporting resin to serve as a mold template for the microcolumns.

[0044] A high-temperature heating method is used to deposit a perfluorinated hydrophobic coating on the mold surface;

[0045] Smooth-On's Ecoflex-30 silicone was used as the microcolumn material. The liquid silicone was poured into a coated mold and vacuum-degassed to eliminate air from the liquid silicone and ensure complete immersion in the micropores. After curing in a high-temperature oven and demolding, the resulting substrate was equipped with soft silicone microcolumns.

[0046] The mechanical scraping force acquisition module records the sampling micro-nano robot by rolling and sampling under the action of a rotating magnetic field under the recording of a high-speed lens. The edge structure of the sampling micro-nano robot interacts with a single micro-pillar, causing the tip of the micro-pillar, i.e., the cantilever beam, to deflect. Based on the Euler cantilever beam structural mechanics, the force exerted by the sampling micro-nano robot on the cantilever beam is obtained, which is the mechanical scraping force.

[0047] The specific expression of Euler cantilever beam structural mechanics in the mechanical scraping force acquisition module is: where θ B represents the end section rotation angle, ω Brepresents the maximum deflection, F represents the force exerted by the sampling micro-nano robot on the cantilever beam, E represents the Young's modulus of the cantilever beam, I represents the moment of inertia of the cantilever beam section, a represents the position where the force is exerted on the cantilever beam, and l represents the length of the cantilever beam.

[0048] In addition to the above modules, the targeted sampling micro-nano robot mechanical testing system may also include other components. However, since these components are irrelevant to the content of the embodiments of the present disclosure, their illustration and description are omitted here.

[0049] The other specific working processes of the targeted sampling micro-nano robot mechanical testing system refer to the description of the above-mentioned targeted sampling micro-nano robot mechanical testing method embodiment and will not be repeated here.

[0050] In summary, the technical solutions provided in the above embodiments are summarized. The embodiments of the present disclosure provide a targeted sampling micro-nano robot mechanical testing method and system. The method adopts a template method to prepare a substrate provided with soft silicone micro-pillars. By characterizing the degree of bending of the micro-pillars contacted by the cutting edge of the micro-nano robot, the mechanical scraping force generated during sampling is quantitatively calculated. The method of the present invention provides an important basis for the realization of the targeted sampling function of the micro-nano robot by constructing a mechanical testing method for a micro-nano structure with dynamic adaptability, environmental compatibility and in-situ integration.

[0051] In this document, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a step or method that comprises a series of elements includes not only those elements, but also includes other elements not expressly listed, or also includes elements inherent to such step or method.

[0052] The above is a further detailed description of the present invention in conjunction with specific preferred embodiments, and the specific implementation of the present invention should not be considered to be limited to these descriptions. For those skilled in the art of the present invention, without departing from the concept of the present invention, several simple deductions or substitutions can be made, which should be considered to fall within the scope of protection of the present invention.

Claims

1. A targeted sampling micro-nano robot mechanical testing method, characterized in that: The method adopts a template method to prepare a substrate provided with soft silicone micro-pillars, and quantitatively calculates the mechanical scraping force generated during sampling by characterizing the bending degree of the micro-pillars contacted by the cutting edge of the micro-nano robot.

2. The targeted sampling micro-nano robot mechanical testing method according to claim 1, characterized in that: A template method is used to prepare a substrate provided with soft silica micropillars, specifically comprising: Design a mold containing a cylindrical channel structure with a micron-scale diameter and print it using a UV stereolithography printer and its supporting resin to serve as a mold template for the microcolumns; A high-temperature heating method is used to deposit a perfluorinated hydrophobic coating on the mold surface; Using silicone as the micropillar material, liquid silicone is poured into a coated mold and vacuum degassed to eliminate air from the liquid silicone and ensure it is completely immersed in the micropores. After curing in a high-temperature oven and demolding, a substrate with soft silicone micropillars is obtained.

3. The targeted sampling micro-nano robot mechanical testing method according to claim 1, characterized in that: Under the recording of high-speed camera, the sampling micro-nano robot rolls and samples under the action of rotating magnetic field. The edge structure of the sampling micro-nano robot interacts with a single micro-pillar, causing the deflection of the tip of the micro-pillar, i.e., the cantilever beam. Based on the Euler cantilever beam structural mechanics, the force exerted by the sampling micro-nano robot on the cantilever beam is obtained, which is the mechanical scraping force.

4. The targeted sampling micro-nano robot mechanical testing method according to claim 3, characterized in that: The specific expression of Euler cantilever beam structural mechanics is: where θ B represents the end section rotation angle, ω B represents the maximum deflection, F represents the force exerted by the sampling micro-nano robot on the cantilever beam, E represents the Young's modulus of the cantilever beam, I represents the moment of inertia of the cantilever beam section, a represents the position where the force is exerted on the cantilever beam, and l represents the length of the cantilever beam.

5. A targeted sampling micro-nano robot mechanical testing system, characterized in that: The system includes a substrate with soft silicone micropillars and a mechanical scraping force acquisition module. The substrate with soft silicone micropillars is prepared using a template method. The mechanical scraping force acquisition module is used to quantitatively calculate the mechanical scraping force generated during sampling by characterizing the degree of curvature of the micropillars contacted by the cutting edge of the micro-nano robot.

6. The targeted sampling micro-nano robot mechanical testing system according to claim 5, characterized in that: The substrate provided with soft silica gel microcolumns is prepared by a template method, which specifically includes: Design a mold containing a cylindrical channel structure with a micron-scale diameter and print it using a UV stereolithography printer and its supporting resin to serve as a mold template for the microcolumns; A high-temperature heating method is used to deposit a perfluorinated hydrophobic coating on the mold surface; Using silicone as the micropillar material, liquid silicone is poured into a coated mold and vacuum degassed to eliminate air from the liquid silicone and ensure it is completely immersed in the micropores. After curing in a high-temperature oven and demolding, a substrate with soft silicone micropillars is obtained.

7. The targeted sampling micro-nano robot mechanical testing system according to claim 5, characterized in that: The mechanical scraping force acquisition module is recorded by a high-speed lens, in which the sampling micro-nano robot rolls and samples under the action of a rotating magnetic field. The edge structure of the sampling micro-nano robot interacts with a single micro-pillar, causing the tip of the micro-pillar, i.e., the cantilever beam, to deflect. Based on the Euler cantilever beam structural mechanics, the force exerted by the sampling micro-nano robot on the cantilever beam is obtained, which is the mechanical scraping force.

8. The targeted sampling micro-nano robot mechanical testing system according to claim 7, characterized in that: The specific expression of Euler cantilever beam structural mechanics in the mechanical scraping force acquisition module is: where θ B represents the end section rotation angle, ω B represents the maximum deflection, F represents the force exerted by the sampling micro-nano robot on the cantilever beam, E represents the Young's modulus of the cantilever beam, I represents the moment of inertia of the cantilever beam section, a represents the position where the force is exerted on the cantilever beam, and l represents the length of the cantilever beam.

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