Online precision calibration method for laser line module in high and low temperature environment

By analyzing the laser emitter temperature and spot offset, and calculating the compensation adjustment factor to calibrate the high and low temperature environment of the laser line module, it solves the problem of inaccurate offset compensation of the laser line module in high and low temperature environments, and improves projection accuracy and stability.

CN120576802AActive Publication Date: 2025-09-02XIAN TIANHE LASER INSTR CO LTD

Patent Information

Application Number
CN202511053357.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-07-30
Publication Date
2025-09-02
Estimated Expiration
2045-07-30

AI Technical Summary

Technical Problem

The prior art does not fully consider the interference influence of the spot offset of the laser line module in high and low temperature environments, resulting in the offset compensation being prone to under-compensation or over-compensation, which affects the projection calibration accuracy.

Method used

By analyzing the temperature change and spot offset of the laser emitter position, obtain the sequence of high and low temperature changes and the offset interference, calculate the compensation adjustment factor, and perform correction calibration of horizontal and vertical offsets.

Benefits of technology

The accuracy of projection accuracy of the laser line module in high and low temperature environments is improved, and the problem of insufficient or excessive compensation of offset compensation is avoided, ensuring the stability and accuracy of the spot.

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Abstract

The invention relates to the technical field of optical measurement and metering equipment, in particular to an on-line precision calibration method for a laser line module in a high-low temperature environment, which comprises the following steps: acquiring horizontal and vertical offsets of a projection light spot of the laser line module, and collecting the temperature of the position of a laser transmitter; respectively calculating a horizontal offset interference degree and a vertical offset interference degree at each acquisition moment, and further obtaining a horizontal interference ratio and a vertical interference ratio; according to the change trend of the horizontal offset interference degree and the vertical offset interference degree within the preset duration before each acquisition moment, the horizontal and vertical interference variation of each acquisition moment is obtained, and then the compensation regulation factors of the horizontal offset and the vertical offset of each acquisition moment are obtained, and the horizontal offset and the vertical offset are compensated. And compensation correction values of the horizontal offset and the vertical offset are obtained, so that the projection precision of the laser line module is calibrated. According to the invention, the precision of projection calibration of the laser line module can be improved.
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Description

Technical Field

[0001] The present application relates to the technical field of optical measurement and metrology equipment, and in particular to an online precision calibration method for a laser line module in high and low temperature environments. Background Art

[0002] Because laser line modules are affected by high and low temperature fluctuations in the environment, the optical power of the laser emitter in the laser line module will fluctuate to a certain extent, which can easily affect the accuracy and stability of the laser line module's projected light spot, thereby affecting the construction quality during the construction process. Therefore, to ensure the accuracy and stability of the laser line module's projected light spot, it is often necessary to calibrate it using a laser calibrator to avoid adverse effects on the quality of the construction.

[0003] In the prior art, a four-quadrant photodetector is used to measure the horizontal and vertical offsets of the laser line module's projected spot in real time. Based on these offsets, the module's horizontal and vertical offset compensations are determined, thereby calibrating the laser line module's projection accuracy. However, because high and low temperature fluctuations in the laser line emission environment can affect the stability of the laser line module's projection performance, the prior art does not fully account for the interference these fluctuations have on the spot offset. This can easily lead to under-compensation or over-compensation in the offset compensation of the laser line module in different directions, compromising the accuracy of the laser line module's projection calibration. Summary of the Invention

[0004] In order to solve the above technical problems, the present application provides an online precision calibration method for a laser line module in high and low temperature environments to solve the existing problems.

[0005] The online precision calibration method of the laser line module in high and low temperature environments of this application adopts the following technical solutions: One embodiment of the present application provides an online precision calibration method for a laser line module in a high and low temperature environment, comprising the following steps: Obtain the horizontal and vertical offsets of the laser line module projected spot and collect the temperature at the laser emitter location; By analyzing the temperature changes at the laser transmitter position at each acquisition moment, the high and low temperature change sequences at each acquisition moment are obtained. The horizontal and vertical residual sequences at each acquisition moment are extracted based on the horizontal and vertical offsets of the light spot at each acquisition moment. The horizontal offset interference degree and vertical offset interference degree at each acquisition moment are obtained through the correlation between the high and low temperature change sequences and the horizontal and vertical residual sequences, and then the horizontal interference ratio and vertical interference ratio are obtained. Calculating the horizontal and vertical interference changes at each acquisition moment based on the change trends of the horizontal and vertical offset interference degrees within a preset time period before each acquisition moment, and combining the horizontal interference ratio and the vertical interference ratio to obtain the compensation adjustment factors for the horizontal and vertical offsets at each acquisition moment, respectively, to compensate and correct the horizontal and vertical offsets and obtain the compensation correction values ​​for the horizontal and vertical offsets; The projection accuracy of the laser line module is calibrated according to the horizontal and vertical offsets of the laser line module projection spot after compensation correction.

[0006] Preferably, the method for acquiring the high and low temperature change sequence at each acquisition moment is: Normalize the temperatures within a preset time period before each acquisition moment and arrange them in time sequence to obtain a temperature sequence at each acquisition moment. Fit the temperature sequence, and arrange the fitting slopes of all temperatures in time sequence to obtain a temperature gradient sequence at each acquisition moment. The elements at the same position in the temperature sequence and temperature gradient sequence at each acquisition moment are multiplied and normalized. The normalized results obtained at all positions constitute the high and low temperature change sequence at each acquisition moment.

[0007] Preferably, the extracting of the horizontal and vertical residual sequences at each acquisition moment further includes: normalizing the horizontal offset and vertical offset within a preset time length before each acquisition moment, arranging the normalized data in time series to obtain the horizontal offset sequence and vertical offset sequence at each acquisition moment, and performing time series decomposition on the horizontal offset sequence and vertical offset sequence at each acquisition moment to obtain the horizontal residual sequence at each acquisition moment.

[0008] Preferably, the method for calculating the horizontal offset interference degree at each acquisition moment is: ; Where, is the horizontal offset interference degree at the t-th acquisition moment, is the number of elements in the horizontal residual sequence at the t-th acquisition moment, is the correlation between the horizontal residual sequence at the t-th acquisition moment and the high and low temperature change sequence, and They are respectively the i-th and i-1-th elements in the horizontal residual sequence at the t-th acquisition moment.

[0009] Preferably, the method for obtaining the horizontal interference ratio and the vertical interference ratio is: The sum of the horizontal offset interference degree and the vertical offset interference degree at each acquisition moment is calculated, and the ratios of the horizontal offset interference degree and the vertical offset interference degree to the sum are respectively used as the horizontal interference ratio and the vertical interference ratio at each acquisition moment.

[0010] Preferably, the method for calculating the horizontal interference change at the current collection moment is: ; Where F is the horizontal interference change at the current acquisition moment, is the number of elements in the horizontal interference sequence at the current acquisition moment, and They are respectively the j-th and j-1-th elements in the horizontal interference sequence at the current acquisition moment.

[0011] Preferably, the method for acquiring the horizontal interference sequence at the current acquisition moment further comprises: arranging the horizontal offset interference degrees of all acquisition moments within a preset time period before the current acquisition moment in time sequence to obtain the horizontal interference sequence at the current acquisition moment.

[0012] Preferably, the calculation method of the compensation adjustment factor of the horizontal offset at the current acquisition moment is: Where, is the compensation adjustment factor of the horizontal offset at the current acquisition moment, is the adjustment ratio, F is the change in horizontal interference at the current acquisition moment, is the proportion of horizontal interference at the current collection moment.

[0013] Preferably, the calculation method of the compensation correction value of the horizontal offset at the current acquisition moment is: Where, is the compensation correction value of the horizontal offset at the current acquisition moment, is the compensation adjustment factor of the horizontal offset at the current acquisition moment, It is the horizontal offset of the current acquisition moment.

[0014] Preferably, the calibration of the projection accuracy of the laser line module further includes: using the compensation correction values ​​of the horizontal offset and the vertical offset at the current moment as the horizontal offset compensation amount and the vertical offset compensation amount of the laser calibrator, respectively, obtaining the direction of the horizontal offset and the vertical offset calibration through the positive and negative values ​​of the horizontal offset compensation amount and the vertical offset compensation amount, and using the absolute value of the horizontal offset compensation amount and the absolute value of the vertical offset compensation amount to obtain the calibration strength of the horizontal offset and the vertical offset, respectively.

[0015] This application has at least the following beneficial effects: This application takes into account that the existing technology has not fully analyzed the interference effect of high and low temperature changes in the laser line emission environment on the spot offset, which makes the offset compensation of the laser line module in different directions prone to undercompensation or overcompensation, affecting the accuracy of the laser line module projection calibration; therefore, this application analyzes the high and low temperature changes in the laser emission environment by the size of the temperature and its temperature gradient, more accurately reflecting the characteristics of the high and low temperature changes in the laser line emission environment, which is conducive to more accurately identifying the interference effect of the high and low temperature changes in the laser emission environment on the spot offset; Furthermore, the present application accurately measures the interference characteristics of the light spot offset in different projection directions by considering the relationship between the random interference error changes of the light spot offset in different directions and the high and low temperature variation characteristics in the laser line emission environment. It also obtains the offset interference ratio in different projection directions, which is used to more accurately compensate for the offset errors in different directions in the future. At the same time, this application fully takes into account the interference effect of high and low temperature changes in the laser line emission environment on the light spot offset, and combines the offset interference ratio in different projection directions and the trend changes of offset interference in different directions to set the compensation adjustment factor in the horizontal direction, and compensate and correct the horizontal offset and vertical offset to solve the problem of under-compensation or over-compensation in the offset compensation of the laser line module in different directions, thereby improving the accuracy of the laser line module projection calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present application or the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0017] Figure 1 This is a flowchart of the steps of the online precision calibration method of the laser line module in high and low temperature environments provided by this application. DETAILED DESCRIPTION

[0018] To further illustrate the technical means and effectiveness of this application to achieve its intended purpose, the following, in conjunction with the accompanying drawings and preferred embodiments, details the specific implementation, structure, features, and effectiveness of the online precision calibration method for a laser line module in high and low temperature environments proposed in this application. In the following description, references to different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. Furthermore, specific features, structures, or characteristics of one or more embodiments may be combined in any suitable manner.

[0019] Unless otherwise defined, terms such as "comprises," "comprising," or any other variants thereof are intended to encompass non-exclusive inclusion, such that a circuit structure, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such article or device. In the absence of further restrictions, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the article or device comprising the element. In addition, the term "and\or" as used herein includes any and all combinations of one or more related listed items. All technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application pertains.

[0020] The specific scheme of the online precision calibration method of the laser line module in high and low temperature environments provided by this application is described in detail below with reference to the accompanying drawings.

[0021] An embodiment of the present application provides an online precision calibration method for a laser line module in a high and low temperature environment. For details, please refer to Figure 1 , including the following steps: Step 1: Obtain the horizontal and vertical offsets of the laser line module's projected spot and collect the temperature at the laser emitter location.

[0022] When using a laser line projector for construction, the projection accuracy of the laser line module within the laser line projector must be calibrated to ensure construction quality. The laser line module, as the laser emitting part, includes a laser emitter, laser calibrator, temperature sensor, mechanical structure, and drive circuit.

[0023] At the same time, a laser receiving part is set up through a four-quadrant detector. The photosensitive surface of the laser receiving part is a rectangular photosensitive surface. The light spot projected on the rectangular photosensitive surface by the laser emitting part is used to collect the horizontal offset and vertical offset of the projected light spot in real time using the four-quadrant detector; at the same time, the temperature data at the position of the laser emitter is collected in real time through the temperature sensor to analyze the interference effect of high and low temperature changes in the environment on the light spot offset. The data acquisition frequency is 10Hz, and the implementer can adaptively set the acquisition frequency according to the actual situation.

[0024] Furthermore, to facilitate subsequent accurate analysis of the impact of high and low temperature variations in the laser line emission environment on the spot offset, the horizontal offset, vertical offset, and temperature data within a preset time period before each acquisition moment are normalized to their ranges. The normalized data are then arranged in chronological order to obtain a horizontal offset sequence, a vertical offset sequence, and a temperature sequence for each acquisition moment. Preferably, in this embodiment, the preset time period is 1 minute.

[0025] Step 2: Analyze the temperature changes at the laser transmitter position at each acquisition moment to obtain the high and low temperature change sequence at each acquisition moment. Extract the horizontal and vertical residual sequences at each acquisition moment based on the horizontal and vertical offsets of the light spot at each acquisition moment. Through the correlation between the high and low temperature change sequence at each acquisition moment and the horizontal and vertical residual sequences, obtain the horizontal offset interference degree and vertical offset interference degree at each acquisition moment, and then obtain the horizontal interference ratio and vertical interference ratio.

[0026] Because the laser beam's spot offset is affected by ambient temperature fluctuations, this can affect the accuracy of the laser beam projected by the module. Therefore, to more accurately determine the laser beam's horizontal and vertical offset compensations, and thereby calibrate the module's spot projection accuracy, it's important to fully consider the impact of ambient temperature fluctuations on the beam offset.

[0027] In order to analyze the high and low temperature changes in the laser line emission environment, the temperature sequence at each acquisition moment is used as the input of the least squares fitting algorithm. The least squares fitting algorithm is used to obtain the fitting function of the temperature sequence, and the fitting slope of all data points in the temperature sequence is obtained by taking the first-order function derivative of the fitting function. The fitting slopes are arranged in chronological order to obtain the temperature gradient sequence at each acquisition moment. Among them, the least squares fitting algorithm and the calculation of the fitting slope are well-known technologies and will not be described in detail.

[0028] Generally speaking, the higher the temperature in the laser line emission environment and the greater the temperature gradient, the more it reflects the phenomenon of increasing temperature in the laser line emission environment, and the less conducive it is to maintaining the stability of the laser line module's spot projection. Therefore, the temperature sequence and the elements corresponding to the same position in the temperature gradient sequence at each acquisition moment are multiplied and normalized. The normalized results obtained at all positions are combined to form a high and low temperature variation sequence at each acquisition moment. This reflects the characteristics of the high and low temperature variations in the laser line emission environment, thereby more accurately identifying the interference effects of high and low temperature variations in the laser emission environment on the spot offset.

[0029] Since high and low temperature changes in the laser line emission environment will cause different degrees of interference on the horizontal and vertical offsets of the light spot, the higher the degree of offset interference in a certain direction, the more necessary it is to compensate for the offset in that direction.

[0030] Therefore, the horizontal offset sequence and vertical offset sequence at each acquisition moment are respectively used as the input of STL time series decomposition (Seasonal and Trend decomposition using Loess). The horizontal residual sequence and vertical residual sequence at each acquisition moment are respectively obtained by STL time series decomposition. Among them, STL time series decomposition is a well-known technology and is not described in detail.

[0031] Among them, the horizontal residual sequence and the vertical residual sequence reflect the random interference errors in the horizontal and vertical directions when affected by the high and low temperature changes in the laser emission environment. If the correlation between the random interference error change and the high and low temperature changes in the laser emission environment is higher, and the random interference error is more unstable, it can better reflect the interference characteristics of the impact of the high and low temperature changes in the laser emission environment on the projection spot position.

[0032] Through the above analysis, according to the correlation between the horizontal residual sequence and the high and low temperature change sequence at each acquisition moment, combined with the data difference within the horizontal residual sequence at each acquisition moment, the horizontal offset interference degree at the tth acquisition moment is calculated. In this embodiment, the specific calculation formula is: ; Where, is the horizontal offset interference degree at the t-th acquisition moment, is the number of elements in the horizontal residual sequence at the t-th acquisition moment, is the correlation between the horizontal residual sequence at the t-th acquisition moment and the high and low temperature change sequence, and They are respectively the i-th and i-1-th elements in the horizontal residual sequence at the t-th acquisition moment.

[0033] The correlation degree may be measured by mutual information, covariance, or Pearson correlation coefficient. In this embodiment, mutual information is used to measure the correlation degree.

[0034] It can be understood that the horizontal offset interference reflects the interference effect of high and low temperature changes in the laser emission environment on the horizontal offset of the light spot. The larger the horizontal offset interference, the stronger the interference effect of high and low temperature changes in the laser emission environment on the horizontal offset of the light spot, and the greater the need for error compensation for the offset in this direction.

[0035] Similarly, the calculation method of horizontal offset interference is adopted. According to the vertical residual sequence and high and low temperature change sequence at each acquisition moment, the vertical offset interference at each acquisition moment is calculated, which reflects the interference effect of high and low temperature changes in the laser emission environment on the vertical offset of the light spot.

[0036] Furthermore, the sum of the horizontal offset interference degree and the vertical offset interference degree at each acquisition moment is calculated, and the ratios of the horizontal offset interference degree and the vertical offset interference degree to the sum are respectively used as the horizontal interference ratio and the vertical interference ratio at each acquisition moment. The larger the offset interference ratio in a certain direction, the greater the interference effect of high and low temperature changes in the laser line emission environment on the light spot in this direction, and the more inclined to error compensation for the offset in this direction should be, so as to avoid under-compensation or over-compensation of the offset compensation.

[0037] Step 3: Based on the changing trends of the horizontal offset interference degree and the vertical offset interference degree within the preset time period before each acquisition moment, the horizontal and vertical interference changes at each acquisition moment are obtained, and combined with the horizontal interference ratio and the vertical interference ratio, the compensation adjustment factors of the horizontal offset and the vertical offset at each acquisition moment are obtained respectively, so as to compensate and correct the horizontal and vertical offsets and obtain the compensation correction values ​​of the horizontal offset and the vertical offset.

[0038] In order to avoid under-compensation or over-compensation of the offset compensation in different directions of the laser line module, in addition to considering the proportion of offset interference in different directions, it is also necessary to consider the trend change of offset interference in different directions. If the offset interference characteristics in a certain direction show an upward trend, the stronger the change, the higher the temperature change in the laser emission environment will seriously interfere with the change of the spot offset. At this time, it is necessary to increase the intensity of spot offset compensation.

[0039] Therefore, for the current acquisition moment, the horizontal offset interference degrees and vertical offset interference degrees of all acquisition moments within the preset time length before the current acquisition moment are arranged in chronological order to obtain the horizontal interference sequence and vertical interference sequence of the current acquisition moment respectively. Preferably, in this embodiment, the preset time length is 1 minute.

[0040] Through the above analysis, according to the change trend of the elements in the horizontal interference sequence and vertical interference sequence at the current acquisition moment, the horizontal interference change at the current acquisition moment is calculated. In this embodiment, the specific calculation formula is: ; Where F is the change in horizontal interference at the current acquisition moment, is the number of elements in the horizontal interference sequence at the current acquisition moment, and They are respectively the j-th and j-1-th elements in the horizontal interference sequence at the current acquisition moment.

[0041] The horizontal interference change reflects the trend change of the horizontal offset interference in the short period before the current moment. The larger the horizontal interference change, the more serious the horizontal interference of the laser line module projected light spot, and the more it is necessary to increase the intensity of the horizontal offset compensation of the light spot.

[0042] Accordingly, the above method of this embodiment is repeated to obtain the vertical interference variation at the current acquisition moment.

[0043] Furthermore, the compensation adjustment factor in the horizontal direction is set according to the horizontal interference change and the horizontal interference ratio at the current acquisition moment, and the compensation correction value of the adjusted horizontal offset is calculated to avoid under-compensation or over-compensation of the offset compensation in different directions of the laser line module.

[0044] Therefore, according to the horizontal interference variation, combined with the horizontal interference ratio at the current acquisition moment, the compensation adjustment factor of the horizontal offset at the current acquisition moment is obtained. Preferably, the calculation formula in this embodiment is: ; Where, is the compensation adjustment factor of the horizontal offset at the current acquisition moment, To adjust the ratio, it is used to avoid the spot offset compensation being too large or too small, and to control the range of the compensation adjustment factor. In this embodiment, the value is 0.5. F is the horizontal interference change at the current acquisition moment. is the proportion of horizontal interference at the current acquisition moment.

[0045] Furthermore, according to the compensation adjustment factor, combined with the horizontal offset at the current acquisition time, the compensation correction value of the horizontal offset at the current acquisition time is calculated. In this embodiment, the specific calculation formula is: ; Where, is the compensation correction value of the horizontal offset at the current acquisition moment, is the compensation adjustment factor of the horizontal offset at the current acquisition moment, It is the horizontal offset of the current acquisition moment.

[0046] Accordingly, by repeating the above method of this embodiment, the vertical interference change at the current acquisition moment can be obtained based on the vertical interference sequence at the current acquisition moment and the method for calculating the horizontal interference change. By using the vertical interference change at the current acquisition moment, the vertical interference ratio and the vertical offset, the compensation correction value calculation method can be used to obtain the compensation correction value of the vertical offset at the current acquisition moment.

[0047] In this embodiment, full consideration is given to the interference effect of high and low temperature changes in the laser line emission environment on the light spot offset. The compensation adjustment factors of the horizontal offset and the vertical offset are set according to the offset interference ratio and the interference change in different directions. The offset compensation in different directions is corrected by the compensation adjustment factors of the horizontal offset and the vertical offset, thereby avoiding the problem of under-compensation or over-compensation in the offset compensation in different directions, and improving the accuracy of subsequent laser line module projection calibration.

[0048] Step 4: Calibrate the projection accuracy of the laser line module based on the horizontal and vertical offsets of the laser line module's projection spot after compensation and correction.

[0049] Furthermore, in order to perform online calibration on the projection accuracy of the laser line module, the compensation correction values ​​of the horizontal offset and vertical offset at the current moment are used as the horizontal offset compensation amount and vertical offset compensation amount of the laser calibrator respectively, and the projection accuracy of the laser line module is calibrated by the laser calibrator in the laser line module. Specifically, the direction of the horizontal offset and vertical offset calibration is determined according to the positive and negative values ​​of the horizontal offset compensation amount and the vertical offset compensation amount, and the calibration force of the horizontal offset and vertical offset is obtained according to the absolute values ​​of the horizontal offset compensation amount and the vertical offset compensation amount, thereby realizing online precision calibration of the laser line module. Among them, the projection precision calibration of the laser calibrator is a well-known technology and will not be elaborated on.

[0050] It is understood that references to "one embodiment" or "some embodiments" in the present specification mean that one or more embodiments of the present application include a particular feature, structure, or characteristic described in conjunction with that embodiment. Thus, if "in one embodiment," "in some embodiments," "in other embodiments," or "in other embodiments" appear in different places in this specification, they do not necessarily refer to the same embodiment, but rather mean "one or more but not all embodiments," unless otherwise specifically emphasized. The terms "including," "comprising," "having," and their variations all mean "including but not limited to," unless otherwise specifically emphasized.

[0051] It should be noted that the above-mentioned sequence of the embodiments of the present application is for description only and does not represent the advantages and disadvantages of the embodiments. The above description is of a specific embodiment of this specification. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multi-tasking and parallel processing are also possible or may be advantageous. At the same time, the size of the sequence number of each step in the embodiment does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments in this specification.

[0052] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. The online precision calibration method of the laser line module in high and low temperature environments is characterized by: The following steps are involved: Obtain the horizontal and vertical offsets of the laser line module projected spot and collect the temperature at the laser emitter location; By analyzing the temperature changes at the laser transmitter position at each acquisition moment, the high and low temperature change sequences at each acquisition moment are obtained. The horizontal and vertical residual sequences at each acquisition moment are extracted based on the horizontal and vertical offsets of the light spot at each acquisition moment. The horizontal offset interference degree and vertical offset interference degree at each acquisition moment are obtained through the correlation between the high and low temperature change sequences and the horizontal and vertical residual sequences, and then the horizontal interference ratio and vertical interference ratio are obtained. Calculating the horizontal and vertical interference changes at each acquisition moment based on the change trends of the horizontal and vertical offset interference degrees within a preset time period before each acquisition moment, and combining the horizontal interference ratio and the vertical interference ratio to obtain the compensation adjustment factors for the horizontal and vertical offsets at each acquisition moment, respectively, to compensate and correct the horizontal and vertical offsets and obtain the compensation correction values ​​for the horizontal and vertical offsets; The projection accuracy of the laser line module is calibrated according to the horizontal and vertical offsets of the laser line module projection spot after compensation correction.

2. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The method for obtaining the high and low temperature change sequence at each acquisition moment is: Normalize the temperatures within a preset time period before each acquisition moment and arrange them in time sequence to obtain a temperature sequence at each acquisition moment. Fit the temperature sequence, and arrange the fitting slopes of all temperatures in time sequence to obtain a temperature gradient sequence at each acquisition moment. The elements at the same position in the temperature sequence and temperature gradient sequence at each acquisition moment are multiplied and normalized. The normalized results obtained at all positions constitute the high and low temperature change sequence at each acquisition moment.

3. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The extracting of the horizontal and vertical residual sequences at each acquisition moment further includes: normalizing the horizontal offset and the vertical offset within a preset time length before each acquisition moment, arranging the normalized data in time sequence to obtain the horizontal offset sequence and the vertical offset sequence at each acquisition moment, and performing time sequence decomposition on the horizontal offset sequence and the vertical offset sequence at each acquisition moment to obtain the horizontal residual sequence at each acquisition moment.

4. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The calculation method of the horizontal offset interference degree at each acquisition moment is: ; Where, is the horizontal offset interference degree at the t-th acquisition moment, is the number of elements in the horizontal residual sequence at the t-th acquisition moment, is the correlation between the horizontal residual sequence at the t-th acquisition moment and the high and low temperature change sequence, and They are respectively the i-th and i-1-th elements in the horizontal residual sequence at the t-th acquisition moment.

5. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The method for obtaining the horizontal interference ratio and the vertical interference ratio is: The sum of the horizontal offset interference degree and the vertical offset interference degree at each acquisition moment is calculated, and the ratios of the horizontal offset interference degree and the vertical offset interference degree to the sum are respectively used as the horizontal interference ratio and the vertical interference ratio at each acquisition moment.

6. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The calculation method of the horizontal interference change at the current acquisition moment is: ; Where F is the horizontal interference change at the current acquisition moment, is the number of elements in the horizontal interference sequence at the current acquisition moment, and They are respectively the j-th and j-1-th elements in the horizontal interference sequence at the current acquisition moment.

7. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 6, characterized in that: The method for acquiring the horizontal interference sequence at the current acquisition moment further includes: arranging the horizontal offset interference degrees of all acquisition moments within a preset time period before the current acquisition moment in time sequence to obtain the horizontal interference sequence at the current acquisition moment.

8. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The calculation method of the compensation adjustment factor of the horizontal offset at the current acquisition moment is: Where, is the compensation adjustment factor of the horizontal offset at the current acquisition moment, is the adjustment ratio, F is the change in horizontal interference at the current acquisition moment, is the proportion of horizontal interference at the current collection moment.

9. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The calculation method of the compensation correction value of the horizontal offset at the current acquisition moment is: Where, is the compensation correction value of the horizontal offset at the current acquisition moment, is the compensation adjustment factor of the horizontal offset at the current acquisition moment, It is the horizontal offset of the current acquisition moment.

10. The online precision calibration method for a laser line module in a high and low temperature environment according to claim 1, characterized in that: The calibrating the projection accuracy of the laser line module further includes: using the compensation correction values ​​of the horizontal offset and the vertical offset at the current moment as the horizontal offset compensation amount and the vertical offset compensation amount of the laser calibrator, respectively, obtaining the direction of the horizontal offset and the vertical offset calibration through the positive and negative values ​​of the horizontal offset compensation amount and the vertical offset compensation amount, and using the absolute value of the horizontal offset compensation amount and the absolute value of the vertical offset compensation amount to obtain the calibration strength of the horizontal offset and the vertical offset, respectively.

Citation Information

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