Inspection system, inspection method, and calculator-readable storage medium

Abstract

The invention provides an inspection system, an inspection method and a computer readable storage medium. The inspection system is used for inspecting a lens module to be inspected. The inspection system comprises an annular identification assembly and a processing unit. The annular identification assembly is configured to surround the to-be-detected lens module and is located in a visual angle of the to-be-detected lens module. The annular identification assembly comprises a first area and a second area which are connected. The first area and the second area are different in color and can be distinguished. The processing unit is electrically connected with the to-be-tested lens module, and is used for obtaining a picture of the annular identification assembly through the to-be-tested lens module to obtain a to-be-analyzed image, generating a plurality of to-be-analyzed sub-images according to the to-be-analyzed image, and respectively obtaining a plurality of test signals according to the plurality of to-be-analyzed sub-images.

Description

Technical Field

[0001] The present invention relates to an inspection system, an inspection method and a computer-readable storage medium, and in particular to an inspection system, an inspection method and a computer-readable storage medium for inspecting wide-angle lenses. Background Art

[0002] Typically, when a single wide-angle lens module is used in a surround-view application, the image projected onto the sensor from the wide-angle lens's high field of view serves as the surround-view sampling area. However, during assembly of the fisheye lens at the module factory, the lens's optical axis may not be parallel to the sensor's normal, resulting in lens deflection. This can cause the focal length of two specific areas to be off-plane from the sensor, blurring some areas and causing the surround-view image to appear partially sharp and blurred at certain angles.

[0003] Therefore, how to speed up the testing speed of the lens module and reduce the testing cost of the lens module is one of the goals that the field is striving for. Summary of the Invention

[0004] The present invention is directed to an inspection system, an inspection method and a computer-readable storage medium, which can effectively reduce inspection costs.

[0005] The present disclosure provides an inspection system for inspecting a lens module to be tested. The inspection system includes an annular recognition component and a processing unit. The annular recognition component is configured to surround the lens module to be tested and is located within the field of view of the lens module to be tested. The annular recognition component includes a first area and a second area that are connected. The first area and the second area have different and distinguishable colors. The processing unit is electrically connected to the lens module to be tested, and is used to obtain an image of the annular recognition component through the lens module to be tested to obtain an image to be analyzed, to generate multiple sub-images to be analyzed based on the image to be analyzed, and to obtain multiple inspection signals based on the multiple sub-images to be analyzed.

[0006] In one embodiment of the present disclosure, the first region and the second region are both annular regions.

[0007] In one embodiment of the present disclosure, the colors of the first area and the second area are white and black respectively.

[0008] In one embodiment of the present disclosure, the aforementioned inspection system further includes a bracket configured to carry the ring-shaped identification component.

[0009] In one embodiment of the present disclosure, each of the sub-images to be analyzed includes a boundary line partially formed by connecting the first area and the second area.

[0010] In one embodiment of the present disclosure, each of the aforementioned inspection signals is a sharpness value of a boundary line in each corresponding sub-image to be analyzed.

[0011] The present disclosure further provides an inspection method for inspecting a lens module under test. The inspection method includes providing an annular recognition component surrounding the lens module under test and located within the viewing angle of the lens module under test, the annular recognition component including a first region and a second region connected to each other, the first region and the second region having different and distinguishable colors; capturing an image of the annular recognition component through the lens module under test to obtain an image to be analyzed; generating a plurality of sub-images to be analyzed based on the image to be analyzed; obtaining a plurality of inspection signals based on each of the plurality of sub-images to be analyzed; and generating an inspection result based on the plurality of inspection signals.

[0012] In one embodiment of the present disclosure, the method for generating multiple sub-images to be analyzed based on the image to be analyzed includes obtaining center information and radius information of a ring recognition component based on the image to be analyzed; and determining areas of the multiple sub-images to be analyzed based on the center information and radius information.

[0013] In one embodiment of the present disclosure, the method of obtaining multiple inspection signals based on multiple sub-images to be analyzed includes analyzing boundary lines in the multiple sub-images to be analyzed to obtain sharpness values ​​of the multiple sub-images to be analyzed, where the boundary lines are formed by connecting the first area and the second area.

[0014] In one embodiment of the present disclosure, the method of obtaining a plurality of inspection signals according to a plurality of sub-images to be analyzed further comprises rotating the plurality of sub-images to be analyzed to be tilted 5 degrees about a horizontal axis.

[0015] In one embodiment of the present disclosure, the method for generating test results based on multiple test signals further includes setting an abnormal default value; determining a relative relationship between the multiple test signals and the abnormal default value to mark multiple abnormal test signals; and marking corresponding angles of the lens module to be tested based on the multiple abnormal test signals.

[0016] In one embodiment of the present disclosure, the above-mentioned inspection method further includes determining the direction in which the lens module to be tested deviates from the optical axis according to the inspection result.

[0017] The present disclosure further provides a computer-readable storage medium comprising a computer program. The computer program is configured to load the computer and execute the following steps: acquiring an image of a ring recognition component through a lens module under test to obtain an image to be analyzed; generating a plurality of sub-images to be analyzed based on the image to be analyzed; obtaining a plurality of test signals based on the plurality of sub-images to be analyzed; and generating a test result based on the plurality of test signals.

[0018] Based on the above, the inspection system, inspection method, and computer-readable storage medium disclosed herein utilize a ring-shaped recognition component captured by the lens module under test to obtain an image of the ring-shaped recognition component to be analyzed. This image then generates multiple sub-images to be analyzed, which are then analyzed to generate multiple inspection signals. Inspection results are then generated based on these multiple inspection signals. This allows for determining whether the lens module under test is abnormal by analyzing images from different angles, effectively reducing inspection costs.

[0019] To make the above features and advantages of the present disclosure more clearly understood, embodiments are given below with reference to the accompanying drawings for detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The accompanying drawings are included to provide a further understanding of the present invention and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the present invention and together with the description serve to explain the principles of the present invention.

[0021] Figure 1 is a schematic diagram of an inspection system according to an embodiment of the present disclosure;

[0022] Figure 2 is a schematic diagram of an image to be analyzed according to an embodiment of the present disclosure;

[0023] Figure 3 is a schematic diagram of a plurality of sub-images to be analyzed according to an embodiment of the present disclosure;

[0024] Figure 4A and Figure 4B Schematic diagrams of multiple inspection signals obtained according to multiple sub-images to be analyzed in different embodiments;

[0025] Figure 5 A schematic diagram of a lens module under test deviating from the optical axis according to an embodiment of the present disclosure;

[0026] Figure 6 This is a flowchart of the steps of the inspection method according to one embodiment of the present disclosure;

[0027] 7A to 7D Schematic diagrams of programming languages ​​in different steps of a computer program according to an embodiment of the present disclosure are shown respectively.

[0028] Explanation of the accompanying figures;

[0029] 10: Lens module to be tested;

[0030] 100: Inspection system;

[0031] 110: Ring recognition component;

[0032] 112: Optical components;

[0033] 114: Photosensitive component;

[0034] 120: processing unit;

[0035] A1: first area;

[0036] A2: Second area;

[0037] B: junction line;

[0038] C: image to be analyzed;

[0039] D: sub-image to be analyzed;

[0040] E1, E2: line segments;

[0041] F: abnormal point;

[0042] G0: preset optical axis;

[0043] G1: optical axis;

[0044] H: off-axis angle;

[0045] S200~S204: steps. DETAILED DESCRIPTION

[0046] Reference will now be made in detail to exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Whenever possible, the same reference numerals are used in the drawings and the description to refer to the same or like parts.

[0047] Figure 1 This is a schematic diagram of an inspection system according to an embodiment of the present disclosure. Figure 1 . The present embodiment provides an inspection system 100, including a ring recognition component 110 and a processing unit 120, for inspecting a lens module 10 to be tested, so as to determine whether the lens module 10 to be tested is abnormal. The lens module 10 to be tested is, for example, a wide-angle lens, an ultra wide-angle lens, or a fisheye lens, and includes at least one optical lens and a sensing component. The sensing component is, for example, a charge coupled device (CCD) or a complementary metal oxide semiconductor transistor (CMOS) or other photosensitive component, but the present disclosure is not limited thereto. In the present embodiment, the inspection system 100 can be built into a large-scale equipment used for manufacturing, assembly, or composite testing, but the present disclosure is not limited thereto.

[0048] The annular recognition component 110 is configured to surround the lens module 10 to be tested and is located within the field of view of the lens module 10 to be tested. In other words, when the lens module 10 to be tested performs image acquisition, the image generated by the annular recognition component 110 can be acquired. The annular recognition component 110 includes a first area A1 and a second area A2 connected to each other, wherein the first area A1 and the second area A2 have different colors and can be distinguished. For example, in the present embodiment, the first area A1 is a white annular area, the second area A2 is a black annular area, and the first area A1 and the second area A2 are connected to form a boundary line B between the first area A1 and the second area A2, and parallel to the long side of the annular recognition component 110. In some embodiments, the inspection system 100 may also be designed to include a bracket (not shown) configured to carry the annular recognition component 110, but the present disclosure is not limited to this.

[0049] Figure 2 FIG. 1 is a schematic diagram of an image to be analyzed according to an embodiment of the present disclosure. Figure 3 This is a schematic diagram of multiple sub-images to be analyzed according to an embodiment of the present disclosure. Figures 1 to 3 . The processing unit 120 is electrically connected to the lens module to be tested 10, and is used to obtain the image of the ring recognition component 110 through the lens module to be tested 10 to obtain the image to be analyzed C, and to generate a plurality of sub-images D to be analyzed based on the image to be analyzed C. In detail, the image to be analyzed C is the image screen of the ring recognition component 110, and the plurality of sub-images to be analyzed D are partial image screens of the image to be analyzed obtained at different angles. In detail, each sub-image to be analyzed D includes a first area A1 and a second area A2 of corresponding angle areas, and a boundary line B connecting the first area A1 and the second area A2. The processing unit 120 is, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose microprocessor (Microprocessor), digital signal processor (DSP), programmable controller, application specific integrated circuit (ASIC) or other similar components or a combination of the above components, but the present disclosure is not limited thereto.

[0050] Figure 4A and Figure 4B Schematic diagrams of multiple test signals obtained based on multiple sub-images to be analyzed in different embodiments. Figure 3 and Figure 4A. The processing unit 120 is further used to obtain a plurality of test signals respectively according to the plurality of sub-images D to be analyzed. For example, since the boundary line B has obvious color contrast, each test signal may be the sharpness value of the boundary line B formed by connecting the first area A1 and the second area A2 in each corresponding sub-image D to be analyzed. In other words, the processing unit 120 is used to obtain a plurality of corresponding sharpness values ​​respectively according to the plurality of sub-images D to be analyzed. In one embodiment, if the plurality of sharpness values ​​(such as line segment E1) corresponding to the plurality of sub-images D to be analyzed are all greater than the preset reference value (such as line segment E0), as Figure 4A If the image C to be analyzed is displayed, it means that the resolution of the image to be analyzed meets the expected standard and the lens module 10 to be tested has not produced any abnormality. In another embodiment, if the sharpness values ​​(such as line segment E2) corresponding to the plurality of sub-images D to be analyzed are not all greater than the preset reference value, for example, the sharpness values ​​of the sub-images D to be analyzed in a certain angle range are lower than the reference value, such as Figure 4B The displayed abnormal point F indicates that the resolution of the image C to be analyzed does not meet the expected standard, and the lens module 10 to be tested has an abnormality. In this way, the abnormality of the lens module 10 to be tested can be determined by analyzing images at different angles, thereby effectively reducing inspection costs.

[0051] Figure 5 This is a schematic diagram of a lens module under test deviating from the optical axis according to an embodiment of the present disclosure. Figure 5 For the convenience of explanation, Figure 5 The optical component 112 and photosensitive component 114 of the ring recognition component 110 are shown. In this embodiment, the processing unit 120 can further perform calculations and analysis on the multiple test signals obtained based on the multiple sub-images D to be analyzed, thereby determining the direction and degree of deviation of the optical axis G1 of the lens module 10 under test from the preset optical axis G0 (i.e., the direction of the optical axis without abnormalities). In some embodiments, the deviation direction and deviation angle H between the optical axis G1 of the lens module 10 under test and the preset optical axis G0 can be calculated algorithmically.

[0052] Figure 6 This is a flow chart of the steps of the inspection method of an embodiment of the present disclosure. This embodiment provides an inspection method that can be applied to at least Figure 1 The inspection system 100 is shown, so the following description uses this as an example. Figure 1 and Figure 6In the inspection method of this embodiment, step S200 is first performed to provide an annular identification component 110 surrounding the lens module 10 under test and within the viewing angle of the lens module 10 under test. The annular identification component 110 includes a first area A1 and a second area A2 connected to each other. The first area A1 and the second area A2 have different and distinguishable colors. Therefore, the connected first area A1 and the second area A2 form a boundary line B with a high degree of color contrast, which facilitates image analysis.

[0053] Please refer to Figure 1 、 Figure 2 and Figure 6 Then, after the above steps, step S201 is executed to obtain the image of the ring recognition component 110 through the lens module 10 to be tested to obtain the image C to be analyzed. Specifically, the processing unit 120 is used to control the lens module 10 to be tested to obtain the image of the ring recognition component 110. Since the shape of the ring recognition component 110 is ring-shaped, the ring recognition component 110 appears as a circular image in the image C to be analyzed, such as Figure 2 In one embodiment, step S201 may be included in a computer program in a storage medium readable by a computer and loaded and executed by the computer, such as a computer program built into a large-scale device for manufacturing, assembly, or complex testing, but the present disclosure is not limited thereto.

[0054] Please refer to Figure 2 、 Figure 3 、 Figure 6 and Figure 7A . Then, after the above steps, step S202 is executed to generate a plurality of sub-images D to be analyzed based on the image C to be analyzed. In detail, this step also includes the step of obtaining the center information and radius information of the annular recognition component 110 based on the image C to be analyzed, and the step of determining the areas of the plurality of sub-images D to be analyzed based on the center information and radius information. In other words, in this step, the center and radius information can be detected first, and then the boundary blocks can be taken out along the peripheral positions based on the center information and radius information to generate a plurality of distinguishable sub-images D to be analyzed for subsequent image analysis. Similarly, in one embodiment, step S202 may be included in a computer program in a storage medium readable by a computer and loaded and executed in the computer, but the present disclosure is not limited thereto. For example, the computer program is written in a programming language such as Figure 7A However, those skilled in the art will appreciate that the following program code is for illustrative purposes only and is not intended to limit the implementation of the present invention. Any product or implementation that complies with the spirit of the patent application should fall within the scope of this application.

[0055] Please refer to Figure 3 、 Figure 4B 、 Figure 6 、 Figure 7B and Figure 7C Then, after the above steps, step S203 is executed to obtain multiple test signals according to the multiple sub-images D to be analyzed. Specifically, this step also includes the step of analyzing the boundary lines B in the multiple sub-images D to be analyzed to obtain the sharpness values ​​of the multiple sub-images D to be analyzed. Specifically, the processing unit 120 is used to perform image analysis on the multiple sub-images D to be analyzed to obtain the sharpness values ​​at various angles, such as Figure 4B Similarly, in one embodiment, step S203 may be included in a computer program in a storage medium readable by the computer and loaded and executed by the computer, but the present disclosure is not limited thereto. For example, the computer program is written in a programming language such as Figure 7C is displayed.

[0056] In this embodiment, the method of obtaining multiple test signals based on multiple sub-images D to be analyzed may further include rotating the multiple sub-images D to be analyzed to tilt the horizontal axis by 5 degrees. In other words, before analyzing the sharpness value, all sub-images D to be analyzed may be rotated so that the extension direction of the intersection lines B in the sub-images D to be analyzed is consistent, thereby improving the analysis quality. This step may be included in a computer program stored in a storage medium readable by the computer and loaded and executed by the computer, but the present disclosure is not limited thereto. For example, the computer program is written in a programming language such as Figure 7B is displayed.

[0057] Those skilled in the art will appreciate that the aforementioned rotation of the sub-image to be analyzed by tilting it 5 degrees about the horizontal axis is intended to facilitate the use of the spatial frequency response algorithm. However, other algorithms may also be used in this embodiment. In other words, the sub-image to be analyzed does not necessarily need to be rotated 5 degrees about the horizontal axis; it can be rotated at other angles, or even not rotated at all.

[0058] Please refer to Figure 2 、 Figure 4B 、 Figure 5 、 Figure 6 and Figure 7D Then, after the above steps, step S204 is executed to generate a test result based on a plurality of test signals. Specifically, this step also includes the step of setting an abnormal default value. For example, Figure 4B The displayed line segment E0 can be set to a default sharpness value lower than the normal sharpness value, so as to facilitate the subsequent determination of the relative size of the line segment E2 formed by the detection signal and the line segment E0. In addition, after the above steps, the step of determining the relative relationship between multiple test signals and abnormal default values ​​and marking multiple abnormal test signals is also included. For example, if Figure 4BAs shown, the line segment E2 formed by the detection signal is lower than the value of the line segment E0 at two different positions, so this can be used to mark the abnormal phenomenon for subsequent analysis or processing. In addition, after the above steps, the corresponding step of marking the angle of the lens module to be tested based on the abnormal multiple detection signals is also included. For example, if Figure 2 and Figure 4B As shown, through Figure 4B The relative relationship shown can be further calculated to determine the abnormal position corresponding to Figure 2 The angle position of the displayed image C to be analyzed. Through the above method, the position information of the abnormality (and the sharpness value lower than the default value) of the lens module 10 to be tested can be obtained. This step can be included in a computer program in a storage medium readable by the computer and loaded and executed by the computer, but the present disclosure is not limited to this. For example, the computer program is written in a programming language such as Figure 7D In this way, it is possible to determine whether the lens module 10 to be tested is abnormal by performing image analysis on images at different angles, thereby effectively reducing the inspection cost.

[0059] Please refer to Figure 5 and Figure 6 It is worth noting that after step S204 is completed, a further step may be included to determine the direction in which the lens module 10 under test deviates from the optical axis G0 based on the inspection results. Specifically, the processing unit 120 may further algorithmically determine the multiple inspection signals obtained from the multiple sub-images D to be analyzed, thereby determining the deflection direction and deflection angle H between the optical axis G1 of the lens module 10 under test and the preset optical axis G0.

[0060] In summary, the inspection system, inspection method, and computer-readable storage medium disclosed herein utilize a ring-shaped recognition component captured by the lens module under test to obtain an image of the ring-shaped recognition component to be analyzed. This image then generates multiple sub-images to be analyzed, which are then analyzed to generate multiple inspection signals. Inspection results are then generated based on these multiple inspection signals. This allows for determining whether the lens module under test is abnormal by analyzing images from different angles, effectively reducing inspection costs.

[0061] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A testing system for testing a lens module to be tested, characterized in that: The inspection system comprises: an annular identification component configured to surround the lens module to be tested and located within the viewing angle of the lens module to be tested, the annular identification component comprising a first area and a second area connected to each other, the first area and the second area having different and distinguishable colors; and A processing unit is electrically connected to the lens module to be tested, configured to acquire an image of the annular recognition component through the lens module to be tested to obtain an image to be analyzed, to generate a plurality of sub-images to be analyzed based on the image to be analyzed, and to obtain a plurality of test signals based on each of the plurality of sub-images to be analyzed.

2. The inspection system according to claim 1, characterized in that Both the first region and the second region are annular regions.

3. The inspection system according to claim 1, wherein: The colors of the first area and the second area are white and black respectively.

4. The inspection system according to claim 1, wherein: The inspection system further comprises: The bracket is configured to carry the annular identification component.

5. The inspection system according to claim 1, wherein: Each of the plurality of sub-images to be analyzed includes a boundary line partially formed by connecting the first area and the second area.

6. The inspection system according to claim 5, characterized in that Each of the plurality of inspection signals is a sharpness value of the boundary line in the corresponding plurality of sub-images to be analyzed.

7. A testing method for testing a lens module to be tested, characterized in that: The inspection method comprises: Providing an annular identification component to surround the lens module to be tested and be located within the viewing angle of the lens module to be tested, the annular identification component comprising a first area and a second area connected to each other, the first area and the second area having different and distinguishable colors; Acquiring a picture of the annular recognition component through the lens module to be tested to obtain an image to be analyzed; generating a plurality of sub-images to be analyzed according to the image to be analyzed; obtaining a plurality of test signals respectively according to the plurality of sub-images to be analyzed; and A test result is generated according to the plurality of test signals.

8. The inspection method according to claim 7, characterized in that: The method of generating the plurality of sub-images to be analyzed according to the image to be analyzed includes: Obtaining the center information and radius information of the annular recognition component according to the image to be analyzed; and The regions of the plurality of sub-images to be analyzed are determined according to the circle center information and the radius information.

9. The inspection method according to claim 7, characterized in that: The method of respectively obtaining the plurality of inspection signals according to the plurality of sub-images to be analyzed includes: Boundary lines in the plurality of sub-images to be analyzed are analyzed to respectively obtain sharpness values ​​of the plurality of sub-images to be analyzed, wherein the boundary line is formed by connecting the first area and the second area.

10. The inspection method according to claim 9, characterized in that: The method of respectively obtaining the plurality of test signals according to the plurality of sub-images to be analyzed further includes: The plurality of sub-images to be analyzed are rotated to be tilted 5 degrees about the horizontal axis.

11. The inspection method according to claim 7, characterized in that: The method of generating the test result according to the plurality of test signals further includes: Set exception default values; Determining the relative relationship between the plurality of test signals and the abnormal default value and marking the plurality of test signals as abnormal; and The corresponding angles of the lens module to be tested are marked according to the multiple abnormal inspection signals.

12. The inspection method according to claim 7, characterized in that: The inspection method further comprises: The direction in which the lens module to be tested deviates from the optical axis is determined according to the inspection result.

13. A computer-readable storage medium containing a computer program, characterized in that: The computer program is used to load and execute the following steps in the computer: The image to be analyzed is obtained by acquiring a picture of the ring recognition component through the lens module to be tested; generating a plurality of sub-images to be analyzed according to the image to be analyzed; obtaining a plurality of inspection signals respectively according to the plurality of sub-images to be analyzed; as well as A test result is generated according to the plurality of test signals.

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