234results about "Lens position determination" patented technology

The invention relates to a method for measuring optical lenses (10) using a device (1) comprising: a detection device (11) arranged on a first side (10a) of the lens (10) with respect to a plane of extension of the lens (10); one or more first radiation sources (12) with which the position of the lens (10) in space is determined; and / or a second radiation source (13) with which a planar refractive power distribution of the lens (10) over the surface is determined. According to the invention, a planar, moving pattern extending through the lens (10) is generated by the second or a further radiation source (13), which is detected by the detection device (11) through the lens (10), and one or more defects (15) on the surface of the lens (10) are detected by the computer unit (14).

In certain embodiments, ophthalmic laser system includes an auxiliary light system, laser system, imaging system, and computer. The auxiliary light system directs auxiliary light towards a test target according to a planned test pattern to yield one or more actual auxiliary spots of an actual test pattern on the test target. The planned test pattern indicates one or more planned auxiliary spots located relative to a planned laser spot in a predetermined manner. The laser system directs a laser beam to yield an actual laser spot of the actual test pattern on the test target. The imaging system generates a digital image of the actual test pattern. The computer analyzes the digital image to compare the actual to the planned test pattern, detect a deviation of the actual from the planned test pattern, identify an issue indicated by the deviation, and provide output in response to the issue.

An apparatus includes a first light source for illuminating a chart including an index surface on which an index is provided, an objective lens for guiding index light emitted from the chart to an optical system, a first element for receiving the index light reflected on an optical surface in the optical system, an interferometer configured to include a second light source and a second element, and acquire a wavefront of measurement light, the measurement light being test light reflected on the target surface, and a reduction unit for reducing an intensity of a signal of light reflected on an optical surface other than the target surface, of the test light reflected on the plurality of optical surfaces and received by the second element.

An eccentricity measurement method includes: obtaining optical surface measurement data by measuring, with use of a probe, an optical surface of an object that is a measurement target object; calculating an optical axis center position of the object from the optical surface measurement data; obtaining outline measurement data by measuring, with use of a camera, an outline of the object; calculating an outline center position of the object from the outline measurement data; and calculating an eccentricity that is an amount of deviation between the optical axis center position and the outline center position.

In certain embodiments, an ophthalmic laser system includes a laser system, imaging system, and computer. The laser system accesses a planned test pattern of planned laser spots and directs a laser beam towards a test target located at a target plane according to the planned test pattern to yield an actual test pattern of actual laser spots on the test target. The actual laser spots correspond to the planned laser spots. The imaging system has a digital camera that generates a digital image of the actual test pattern. The computer analyzes the digital image to: compare the actual test pattern to the planned test pattern; detect a deviation of the actual from the planned test pattern; identify an issue indicated by the deviation; and provide output in response to the identified issue.

The invention discloses a frequency response testing device and method for a high-frequency working deformable mirror, and relates to the technical field of adaptive optics, and the device comprises a pulse signal generator which generates a pulse signal of a first frequency and a pulse signal of a second frequency, the first frequency is equal to the working frequency of the deformable mirror, and the second frequency is equal to the working frequency of the deformable mirror; the second frequency is equal to the sampling frequency of the Shack-Hartmann wavefront sensor, the laser generating part emits parallel light beams to the deformable mirror, the action driver works based on a pulse signal of the first frequency and drives the deformable mirror, and the Shack-Hartmann wavefront sensor works based on a pulse signal of the second frequency and drives the deformable mirror to rotate. And collecting and imaging the reflected light beam of the deformable mirror to obtain a light spot array image, processing the light spot array image by the processor to obtain a reconstructed wavefront image, and continuously adjusting the working frequency of the deformable mirror to complete the frequency response test of the deformable mirror. The cost for testing the frequency response of the high-frequency working deformable mirror can be greatly reduced.

The invention provides a lens optical axis consistency inspection device and a detection method thereof, and relates to the technical field of lens optical axis consistency, and the lens optical axis consistency inspection device comprises an optical platform as an installation reference, a target plate structural member which is fixed on the platform and is provided with a first cross mark, and a fixed seat structural member which is spaced from a target plate by a preset distance and is used for installing a to-be-detected lens module. The method is characterized in that the lens optical axis consistency is evaluated by comparing the position deviation between a target plate mark image acquired by a lens module and a second mark generated by a sensor. According to the invention, a simple mechanical structure is used for replacing a traditional expensive and complex instrument, and through a unique double-label comparison principle, not only can rapid qualitative screening be realized, but also accurate quantitative calculation can be carried out. The device has the outstanding advantages of low cost, simplicity and convenience in operation and high detection efficiency. The design effectively solves the problem of rapid detection of the consistency of the batch lens centers of the production line, significantly reduces the detection threshold and cost, and is of great significance to the improvement of the product quality control level.

It is made possible to satisfactorily determine whether or not the light diameter of collimated light is within a defined range in a double mode.A light intensity distribution of collimated light including components of a fundamental mode and a first-order mode is acquired by a light intensity distribution acquisition section. A light intensity line corresponding to a predetermined light intensity lower than a maximum intensity of light intensity is acquired by a light intensity line acquisition section in reference to the light intensity distribution. The ratio of inclusion of the light intensity line in an annular region between a first circle and a second circle larger than the first circle with an optical axis of the collimated light in a center in an entire circular region centered on the optical axis of the collimated light is calculated by a ratio calculation section. Further, it is determined by a determination section whether or not the light diameter of the collimated light is within a defined range, in reference to the ratio.

The invention provides a spherical prism optical axis deflection angle detection device which is provided with a base and a supporting structure and comprises a transmission-type coaxial eccentric detection light path and a transmission-type non-coaxial eccentric detection light path. Wherein the transmission-type coaxial eccentric detection light path comprises a collimator, an objective table and a photoelectric centering instrument; the transmission-type non-coaxial eccentric detection light path comprises a photoelectric autocollimator, an objective table and a photoelectric centering instrument; and the two detection light paths share the objective table and the photoelectric centering instrument. The invention also provides a spherical prism optical axis deflection angle detection method, which comprises the following steps of: firstly, selecting a detection light path, then calibrating and calibrating the detection light path, and finally finishing the detection work by using the selected detection light path. The system is designed to be a double-light-path detection system, and detection of the deflection angle of the optical axis of the spherical prism is achieved.

The invention belongs to the technical field of optical adjustment of large-aperture telescopes, and particularly relates to a device and a method for in-situ measurement of optical axis errors of a large-aperture telescope in an external field. The method comprises the following steps: S1, roughly adjusting the four-dimensional adjusting base to enable the auto-collimation light pipe to be aligned with the center of a pitch axis of a to-be-measured piece; s2, rotating the pitch axis of the to-be-measured piece, and adjusting the angle inclination adjusting mechanism to enable the reflecting surface of the plane mirror to be perpendicular to the optical axis of the auto-collimation light pipe, and at the moment, enabling the optical axis of the auto-collimation light pipe to coincide with the pitch axis of the to-be-measured piece; s3, using the to-be-detected piece to track a natural star, when the natural star is located at the center of the detector target surface of the to-be-detected piece, rotating the rotatable pentaprism mechanism to enable the third window to be aligned with the natural star, and enabling the natural star to be imaged on the detector target surface of the auto-collimation light pipe and the detector target surface of the to-be-detected piece at the same time; and S4, calculating a visual axis error of the to-be-measured piece based on the imaging track of the natural star. According to the invention, the process can be simplified, the efficiency can be improved, and the large-aperture telescope optical axis difference can be measured in real time in an out-field on-site manner.

Provided are an eccentricity measurement method and a measurement system with which eccentricity of an object to be measured can be measured with high accuracy. The eccentricity measurement method includes: a step (S13) for acquiring optical surface measurement data by measuring an optical surface of an object to be measured by a probe (11); a step (S14) for calculating the optical axis center position of the object to be measured on the basis of the optical surface measurement data; a step (S15) for acquiring outer shape measurement data by measuring the outer shape of the object to be measured by the camera (21); a step (S16) for calculating the center position of the outer shape of the object to be measured on the basis of the outer shape measurement data; and a step (S17) for calculating eccentricity, which is the amount of deviation between the center position of the optical axis and the center position of the outer shape.

The invention belongs to the technical field of optical system aberration analysis, and discloses an experimental device for measuring and correcting image distortion of an optical imaging system, which comprises an optical axis testing device and an optical distortion testing platform, and the optical distortion test platform is used for testing optical distortion of the optical imaging system to be tested and integrating optical distortion data with optical axis deviation to obtain an image distortion fitting coefficient and a distortion correction model of the optical imaging system. According to the invention, the image distortion of the optical imaging device can be measured, the image distortion can be corrected, the imaging device can correct the deviation between the optical axis and the center of the target surface when the system is installed and adjusted, the optical distortion of the whole optical system can be corrected, and the method has guiding significance for the application of detecting and identifying the accurate position of a target by using the optical system.

The invention relates to the technical field of ultra-wide-angle lenses, and discloses an ultra-wide-angle lens optical axis detection calibration method, which comprises the following steps: firstly, selecting a standard wide-angle lens and an image, establishing a camera coordinate system and an image coordinate system, obtaining an image a, obtaining an image b by using a to-be-detected wide-angle lens, comparing the image a with the image b, and calibrating the optical axis of the ultra-wide-angle lens. According to a conversion relation between a camera coordinate system and an image coordinate system, calculating an image edge correction coordinate corresponding to each detection edge point, determining an image correction range of the detection target, establishing a distortion model, according to a preset distortion algorithm of the distortion model, calculating to obtain a distortion coordinate of each image point after distortion, and correcting each distortion point on the distortion coordinate to the image correction coordinate position according to the distortion model, and adjusting lens distortion correction setting or other related parameters of the camera according to an image calibration result. According to the invention, the distortion image is calibrated by setting the coordinate system, so that the calibration of the optical axis is assisted, and the efficiency and the precision are higher.

The invention relates to the field of optical axis parallelism measurement, and provides an optical axis parallelism measurement method, which comprises the following steps of: adjusting a collimator so that the center of a cross cursor of the collimator is aligned with the center of a cross cursor of a test card; a reflecting prism is placed on the mounting surface of the adjustable workbench, and the reflecting surface of the reflecting prism is perpendicular to the mounting surface; the adjustable workbench is adjusted, so that the reflecting prism reflects the test light path of the collimator back to the center of the test hole of the collimator, and the mounting surface is calibrated to a first state parallel to the reference line; taking away the reflecting prism from the mounting surface and replacing the reflecting prism with the optical device; the adjustable workbench is adjusted, so that the center of a cross cursor of the test card shot by the optical device coincides with the cross center of a monitoring display picture of the optical device, and the mounting surface is in a second state parallel to the optical axis of the optical device; the optical device is taken away from the mounting surface and replaced with the reflecting prism, and the deviation measured by the collimator is the optical axis parallelism of the optical device. The measurement is simple, rapid and accurate.

A measuring device (10) for measuring a telecentricity (68) of an optical imaging system (12) comprises an illumination device (22) configured to radiate a measuring radiation (32) onto an object plane (14) of the optical imaging system, an intensity detector (28) having a plurality of non-overlapping detection sections, arranged offset from an image plane (16) of the optical imaging system, and configured to detect angle-resolved intensity distributions (50) present at the field points for at least two field points (18-1, 18-2) in the image plane with a respective one of the detection sections (42-1, 42-2) of the intensity detector, a movement device (30) configured to set different measurement positions (54) by changing a relative position of the intensity detector to the optical imaging system in at least one rigid body degree of freedom,that the intensity distribution (50-2) of at least one of the field points before and after the relative position change can be detected with two different non-overlapping detection sections (42-2, 42-1) of the intensity detector, and an evaluation device (48) which is configured to determine the telecentricity (68) of the optical imaging system at each of the at least two field points on the basis of angle-resolved intensity distributions (50-1, 50-2) recorded at the different measuring positions (54).

Systems capable of in situ position detection, thickness and refractive index measurement, and / or focus control, are provided. The systems may include a first laser emitting device, a first lens, a first beam splitter and a second lens respectively forming an optical path. The second lens, the first beam splitter, a third lens, and an image detection and processing module (that includes a sensor, such as a photodiode) may form an optical return path. The second lens may be configured to continuously oscillate, as a function of time, a focal position of a laser from the first laser emitting device. The image detection and processing module may be configured to receive a reflected beam, send information related to the received beam to processing units(s), which may be configured to receive the information and determine one or more surface positions based on a temporal response of the information.

The invention discloses a composite MLA detection method and device for an LED array, the LED array comprises a microlens array, the microlens array comprises a plurality of sub-lenses arranged in an array, and the detection method comprises the steps: obtaining a plurality of light spot images corresponding to each sub-lens; processing the light spot image to determine a consistency detection result of the sub-lens; wherein the consistency detection result comprises at least one of a PSF consistency detection result, an MTF consistency detection result and a position consistency detection result; and based on the consistency detection result of the sub-lenses, determining a composite MLA detection result of the micro-lens array. The composite MLA detection method provided by the invention can detect the sub-lens position of the MLA and the consistency of the PSF and the MTF, and is used for feeding back the production process, adjusting the product in production in time, improving the yield and reducing the quality risk.

The purpose of the present invention is to provide an information processing device, an information processing method, and a program which make it possible to appropriately identify a lens from an image indicating a cross section of the lens.　In the present invention, a processor detects a presence region of a lens in a target image indicating a cross section of a part including the lens in target equipment provided with the lens. By means of an identification model constructed by machine learning using a plurality of images that are for learning and that indicate cross sections of lenses, the processor identifies the lens of the target equipment, present in a presence region, on the basis of a feature quantity of the presence region.

The present invention relates to a laser device, which includes a laser oscillator, a mirror frame assembly, a corrector, a diagnostic module, a calculation module and a controller. The diagnostic module re-diagnoses whether the optical path distortion occurs by re-calculating the optical path difference between the processing optical path changed by the drive motor according to the target drive speed and the target drive time and the reference processing optical path. When the re-calculated optical path difference is greater than the reference optical path difference, the calculation module re-calculates the target drive speed and the target drive time based on the re-calculated optical path difference, and the controller re-drives the drive motor according to the re-calculated target drive speed and the target drive time.

A method of determining an angle of repose of a contact lens on an eye of a user of the contact lens, the method comprising, at a computing device 100: obtaining data indicative of a refractive error

Provided are methods for active alignment of an optical assembly with intrinsic calibration. Some methods described include performing a first active alignment using a multi-collimator assembly, determining a principal point of the camera assembly using a diffractive optical element (DOE) intrinsic calibration module, and adjusting the relative position of one or more of the lens and the image sensor to align the principal point of the camera assembly with an image center of the image sensor and to perform a second active alignment. Systems and computer program products are also provided.

The invention discloses a device and a method for synchronously detecting the focal length and the surface topography of a micro-lens array, which can realize synchronous detection on the focal length and the surface topography of the micro-lens array through a set of system, realize mutual matching between two parts of results and greatly shorten the detection time. The device comprises a first monochromatic laser light source (1), a first collimating lens (2), an attenuation sheet (3), a reflector (4), a microlens array sample (5), a microscope objective (6), a barrel lens (7), a first quarter-wave plate (8), an area array detector (9), a first monochromatic optical filter (10), a second monochromatic laser light source (11), a second collimating lens (12), a linear polarizer (13), a beam splitter prism (14), a polarization beam splitter prism (15), a second quarter-wave plate (16) and a reference lens (17). A third quarter-wave plate (18), a second monochromatic optical filter (19) and a polarization camera (20).

An apparatus includes a first light source for illuminating a panel including an index surface on which an index is provided, an objective lens for guiding index light emitted from the panel to an optical system, a first element for receiving the index light reflected on an optical surface in the optical system, an interferometer configured to include a second light source and a second element and to detect a wavefront of measurement light, the measurement light being test light reflected on the target surface, and a reduction unit for reducing an intensity of a signal of light reflected on an optical surface other than the target surface of the test light reflected on the plurality of optical surfaces and received by the second element.

The invention provides an inspection system, an inspection method and a computer readable storage medium. The inspection system is used for inspecting a lens module to be inspected. The inspection system comprises an annular identification assembly and a processing unit. The annular identification assembly is configured to surround the to-be-detected lens module and is located in a visual angle of the to-be-detected lens module. The annular identification assembly comprises a first area and a second area which are connected. The first area and the second area are different in color and can be distinguished. The processing unit is electrically connected with the to-be-tested lens module, and is used for obtaining a picture of the annular identification assembly through the to-be-tested lens module to obtain a to-be-analyzed image, generating a plurality of to-be-analyzed sub-images according to the to-be-analyzed image, and respectively obtaining a plurality of test signals according to the plurality of to-be-analyzed sub-images.

Described is camera focusing including lens centration estimation using variable focal length phased metalenses. Camera modular alignment and test (CMAT) equipment checks the modular transfer function (MTF) performance of lenses and an image sensor. The CMAT equipment positions a variable focal length phased metalens between the lenses and the image sensor. The metalens includes multiple segments that provide a variable focus depending on distance and angle from boresight of the image sensor. By measuring optical characteristics of the lenses at two opposing segments of the metalens, defocusing effects and a lens centration tilt vector can be computed. Repositioning the lenses to align the centration tilt vector with the boresight of the image sensor improves the MTF performance. A final camera assembly with lenses in precise alignment with the image sensor can be produced, which may improve production output by increasing pass rate at an end of line tester.

To provide an interferometric measuring device and measuring method for measuring a surface or a profile of an optical element with two opposing surfaces.SOLUTION: A measuring method includes the steps of: defining at least three measurement points 31, 32, 33 on one of surfaces 11 of an optical element 10; measuring the position of each measurement point by directing a measurement beam 61 from a measurement head 60 onto the measurement point and detecting a measurement beam portion 62 reflected at the measurement point 31; and determining at least one of decenter and tilt of a measurement surface 11 relative to a reference axis 51 on the basis of at least three measured positions.SELECTED DRAWING: Figure 7

A system can perform a method to identify when one or more lenses are the wrong prescription for the user. In some embodiments, the system notifies the user to switch prescription lenses or initiates an enrollment process for the lenses. In some embodiments, the system can identify the prescription of a lens and compare the identified prescription to one or more enrolled prescriptions for the user (e.g., previously defined in user settings associated with user profile). When the identified prescription of the lens does not match an expected enrolled prescription for the user), the system can notify the user to switch prescription lenses. When there are no enrolled prescriptions for the user, the device can prompt the user to enroll the lens.

In a method for measuring an optical lens surface, a measuring beam (26, 27, 28) is generated using a light source (21) having a certain size, collimated via an optical arrangement (23) and detected by an optical detector (25) after reflection at the lens surface to be measured. Between the light source (21) and the optical detector (25), an aperture (24) is used to limit the measuring beam (26, 27, 28), which acts as a field stop causing vignetting. The field stop is blurred and imaged as a first light spot (26a) on the optical detector (25) by the measurement (beam 26, 27, 28) after reflection at a first lens surface. At least one second light spot (27a) obtained by reflection of the measuring beam (26, 27, 28) at a second lens surface of the optical lens arrangement (10) is also detected simultaneously by the optical detector (25). From the intensity distribution of both light spots (26a, 27a), the angle of each lens surface relative to the optical axis of the measurement beam (26, 27, 28) can be determined simultaneously for both lens surfaces, thereby providing a method for measuring lens surfaces of an optical lens system that allows for rapid measurement of the lens surfaces without the need for complex optical setups.

Disclosed is a method and apparatus for determining information about an alignment of one or more optical components of a multi-component assembly involving: detecting an optical interference pattern produced from a combination of at least three optical wave fronts including at least two optical wave fronts caused by reflections from at least two surfaces of the one or more optical components; and computationally processing information derived from the detected optical interference pattern with at least one simulated optical wave front derived from a model of at least one selected optical surface of the at least two surfaces to computationally isolate information corresponding to an alignment of the selected optical surface.