An arrangement (100), a method and a
computer program product for
system-integrated calibration of
facet mirrors (18, 19) of a microlithographic illumination
system (20). Beam paths (103) between a
radiation source (101) and a
radiation detector (102) are created by the
facet mirrors (18, 19), with respectively only one pivotable micromirror (18″, 19″) of each
facet mirror (18, 19) affecting said beam path. By methodically pivoting one of the micromirrors (18″, 19″) affecting the beam path (10), it is possible, based on the
radiation detector (102), to find a specific optimal pivot position, the underlying orientation of the micromirror (18″, 19″) of which can also be calculated geometrically. By comparing the calculated orientation with the orientation ascertained by a
tilt sensor on the micromirror (18″, 19″), it is possible to calibrate the
tilt sensor or micromirror (18″, 19″) of the facet mirror (18, 19).