Method and system for positioning rechecking target identified by microscopic scanning analyzer

Abstract

The invention provides a method and a system for positioning a recheck target identified by a microscopic scanning analyzer. The method for positioning the rechecking target identified by the microscopic scanning analyzer comprises the following steps: scanning and identifying a target sample on a sample glass slide through the microscopic scanning analyzer to obtain an identification result of the rechecking target needing to be rechecked in the target sample, wherein the identification result comprises first coordinate information of a rechecking target in a coordinate system of the sample glass slide; obtaining a shot image of the sample glass slide through a re-checking microscope, wherein the sample glass slide is placed on an objective table of the re-checking microscope; comparing the shot image with the reference image to obtain a coordinate conversion relation between a coordinate system of the sample glass slide and a coordinate system of the objective table; converting the first coordinate information into second coordinate information in a coordinate system of the objective table based on a coordinate conversion relation; and based on the second coordinate information, positioning a rechecking target in the sample glass slide placed on the objective table.

Description

Technical Field

[0001] The present disclosure relates to a method and system for locating a verification target identified by a microscopic scanning analyzer. Background Art

[0002] To reduce detection difficulty and improve accuracy, intelligent microscopic scanning analyzers are increasingly being used in microscopic applications such as biomedicine and materials science. While they offer rapid testing speeds and high detection rates, this comes with increased verification requirements and complexity. Intelligent microscopic scanning analyzers are unable to flexibly handle questionable identification results and can only store images for secondary examination under a manual microscope.

[0003] Furthermore, existing cross-platform verification methods automatically scan stored images to identify structures with typical features, then locate these structures using a manual microscope and verify the relationship between the two. For example, this is disclosed in Chinese patent publication No. CN103430077B. However, due to the diversity of samples, finding structures with typical features in the scan results is challenging, making this approach difficult to implement. Summary of the Invention

[0004] The present disclosure provides a method and system for locating a verification target identified by a microscopic scanning analyzer.

[0005] According to one aspect of the present disclosure, a method for positioning a review target identified by a microscopic scanning analyzer is provided, comprising: scanning and identifying a target sample on a sample slide by the microscopic scanning analyzer to obtain an identification result of a review target to be reviewed in the target sample, wherein the identification result includes first coordinate information of the review target in the coordinate system of the sample slide; obtaining a captured image of the sample slide by a review microscope, wherein the sample slide is placed on the stage of the review microscope; comparing the captured image with a reference image to obtain a coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the stage; based on the coordinate conversion relationship, converting the first coordinate information into second coordinate information in the coordinate system of the stage; and positioning the review target in the sample slide placed on the stage based on the second coordinate information.

[0006] According to one aspect of the technical solution, the first coordinate information of the verification target identified by the microscopic scanning analyzer can be accurately converted into second coordinate information in the coordinate system of the verification microscope stage by calculating the coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the verification microscope stage. Combined with the comparison and analysis of the captured image and the reference image, the verification target on the sample slide can be quickly and accurately located based on the second coordinate information, solving the problem of rapid and accurate verification target location during sample verification and significantly improving the efficiency and accuracy of the verification work.

[0007] The target sample on the sample slide is scanned and identified with high precision by a microscopic scanning analyzer, accurately obtaining the first coordinate information of the verification target in the coordinate system of the sample slide. The sample slide image is captured by a verification microscope, and by comparing the captured image with the reference image, the coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the verification microscope stage is accurately calculated to solve the problem of cross-platform coordinate system differences. Based on the coordinate conversion relationship, the first coordinate information originally in the coordinate system of the slide is converted into second coordinate information in the coordinate system suitable for the stage. Based on the second coordinate information, the position of the verification target in the sample slide is accurately located on the stage. There is no need to rely on special structures in the target sample to locate the verification target, and the production requirements are low. It is suitable for various types of samples such as thin and stacked samples, greatly reducing the difficulty of verification of sparse samples and further improving the detection efficiency and accuracy of verification.

[0008] According to at least one embodiment of the present disclosure, a method for positioning a verification target identified by a microscopic scanning analyzer is provided, in which the verification target in the sample slide placed on the stage is positioned based on the second coordinate information, comprising: marking the second coordinate information of the verification target on a global sample map to obtain a discrete point map, wherein the global sample map includes a plurality of local scanning areas of the target sample on the sample slide, and the local scanning areas contain the verification target; and positioning the verification target according to the discrete point map.

[0009] According to the technical solution of this embodiment, the distribution of the verification target in each local scanning area can be intuitively presented, and the target can be located more quickly.

[0010] According to at least one embodiment of the present disclosure, the method for positioning a review target identified by a microscopic scanning analyzer further includes: when the review target is selected, displaying the second coordinate information of the selected review target in the sample global map; and reviewing the review target based on the second coordinate information of the selected review target.

[0011] According to the technical solution of this embodiment, accurate positioning guidance can be provided, and the target can be quickly positioned and reviewed according to the coordinates.

[0012] According to at least one embodiment of the present disclosure, a method for positioning a review target identified by a microscopic scanning analyzer is provided, wherein the captured image and the reference image are compared to obtain a coordinate transformation relationship between the coordinate system of the sample slide and the coordinate system of the stage, including: determining an offset and a rotation between the coordinate system of the sample slide and the coordinate system of the stage based on first identification posture information of the sample slide in the captured image and second identification posture information of the reference slide in the reference image; and determining a coordinate transformation relationship between the coordinate system of the sample slide and the coordinate system of the stage based on the offset and the rotation.

[0013] According to the technical solution of this embodiment, the offset and rotation between the two coordinate systems can be accurately calculated and a coordinate conversion relationship can be established, breaking through the traditional verification's reliance on the sample's own characteristics, and completing cross-device coordinate mapping only through the position difference of the slide.

[0014] According to at least one embodiment of the present disclosure, a method for positioning a verification target identified by a microscopic scanning analyzer is provided, which determines an offset and a rotation between a coordinate system of the sample slide and a coordinate system of the stage based on first identification posture information of the sample slide in the captured image and second identification posture information of the reference slide in the reference image, including: determining, for the identification pattern of the sample slide in the captured image, a linear equation of a straight line in the identification pattern of the sample slide in the coordinate system of the sample slide; determining, based on the linear equation of the straight line in the identification pattern of the sample slide, the coordinates of a feature point in the identification pattern of the sample slide; determining, based on the coordinates of the feature point in the identification pattern of the sample slide and the coordinates of the feature point in the identification pattern of the reference slide in the reference image, the offset between the coordinate system of the sample slide and the coordinate system of the stage; and determining, based on the linear equation of the straight line in the identification pattern of the sample slide and the linear equation of the corresponding straight line in the identification pattern of the reference slide.

[0015] According to the technical solution of this embodiment, by accurately calculating the straight line equation and feature point coordinates of the sample slide identification pattern in the captured image, combined with comparison and analysis with the reference image, the offset and rotation amounts between the coordinate systems are determined in sequence, and finally a coordinate transformation relationship is constructed, thereby achieving accurate transformation between the coordinate system of the sample slide and the coordinate system of the review microscope stage.

[0016] According to at least one embodiment of the present disclosure, a method for positioning a review target identified by a microscopic scanning analyzer determines a straight line equation of a straight line in an identification pattern of the sample slide in a coordinate system of the sample slide, including: performing edge detection on the straight line in the identification pattern of the sample slide in the captured image to determine edge points of the straight line in the identification pattern of the sample slide; and performing Hough line fitting based on the edge points to determine a straight line equation of the straight line in the identification pattern of the sample slide in the coordinate system of the sample slide.

[0017] According to the technical solution of this embodiment, the key features of the identification pattern can be accurately extracted, providing reliable basic data for the subsequent calculation of the offset and rotation amount, thereby achieving high-precision coordinate transformation and target positioning.

[0018] According to at least one embodiment of the present disclosure, a method for positioning a review target identified by a microscopic scanning analyzer determines the coordinates of a feature point in the identification pattern of the sample slide based on the linear equation of the straight line in the identification pattern of the sample slide, including: determining the coordinates of the intersection of multiple straight lines in the identification pattern of the sample slide based on the linear equations of the multiple straight lines; determining the coordinates of the feature point in the identification pattern of the sample slide based on the coordinates of the intersection of multiple straight lines in the identification pattern of the sample slide.

[0019] According to the technical solution of this embodiment, the intersection points between multiple straight lines in the identification pattern are used as feature points, and the coordinates of the feature points are determined, thereby improving the precision and accuracy of the analysis of the identification pattern.

[0020] According to at least one embodiment of the present disclosure, a method for positioning a verification target identified by a microscopic scanning analyzer determines the amount of rotation between the coordinate system of the sample slide and the coordinate system of the stage based on the linear equation of the straight line in the identification pattern of the sample slide and the linear equation of the corresponding straight line in the identification pattern of the reference slide, including: determining the amount of rotation between the coordinate system of the sample slide and the coordinate system of the stage based on the angle between the straight line in the identification pattern of the sample slide and the reference direction, and the angle between the corresponding straight line in the identification pattern of the reference slide and the reference direction.

[0021] According to the technical solution of this embodiment, the rotation difference between the two coordinate systems can be accurately quantified, providing key parameters for accurate conversion of cross-device coordinates, and effectively eliminating the positioning deviation caused by the placement angle of the slide.

[0022] According to at least one embodiment of the present disclosure, a method for positioning a review target identified by a microscopic scanning analyzer is provided, wherein the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage are determined based on the first identification posture information of the sample slide in the captured image and the second identification posture information of the reference slide in the reference image, including: determining the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage based on the position information of two adjacent edges of the sample slide in the captured image and the position information of two corresponding edges of the reference slide in the reference image.

[0023] According to the technical solution of this embodiment, a high-precision coordinate conversion relationship can be provided based on the sample slide, ensuring that the verification target can be quickly and accurately positioned and verified.

[0024] According to at least one embodiment of the present disclosure, a method for positioning a verification target identified by a microscopic scanning analyzer is provided, wherein the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage are determined based on the position information of the two adjacent edges of the sample slide in the captured image and the position information of the two corresponding edges of the reference slide in the reference image, including: determining the linear equations of the first and second edges of the sample slide in the captured image in the coordinate system of the sample slide by Hough linear fitting, wherein the first and second edges are adjacent edges of the sample slide. two sides; determining the coordinates of the intersection between the first side and the second side according to the straight line equations of the first side and the second side; determining the offset between the coordinate system of the sample slide and the coordinate system of the stage according to the coordinates of the intersection between the first side and the second side and the coordinates of the intersection between the two corresponding sides of the reference slide in the reference image; determining the rotation amount between the coordinate system of the sample slide and the coordinate system of the stage according to the angle between the first side or the second side and the reference direction, and the angle between the corresponding side of the reference slide and the reference direction.

[0025] According to the technical solution of this embodiment, the review target can be located more quickly and accurately, which significantly improves the efficiency and accuracy of the sample review process.

[0026] According to the method for locating a verification target identified by a microscopic scanning analyzer according to at least one embodiment of the present disclosure, the captured image and the reference image are HSV images.

[0027] According to the technical solution of this embodiment, the separation characteristics of brightness and hue in the color space can be utilized to more accurately identify the characteristics of the slide identification pattern.

[0028] According to another aspect of the present disclosure, a positioning system for a review target identified by a microscopic scanning analyzer is provided, comprising: a microscopic scanning analyzer for scanning and analyzing a sample slide, and outputting an identification result of a target sample in the sample slide; a processor for executing the positioning method for a review target identified by a microscopic scanning analyzer according to any embodiment of the present disclosure; a display for displaying the identification result; and a review microscope for reviewing the identification result. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The accompanying drawings illustrate exemplary embodiments of the present disclosure and together with the description serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0030] Figure 1 FIG. 1 is a schematic diagram of a positioning system for reviewing targets identified by a microscopic scanning analyzer according to an embodiment of the present disclosure.

[0031] Figure 2 It is a schematic diagram of the overall process of a method for locating a verification target identified by a microscopic scanning analyzer according to an embodiment of the present disclosure.

[0032] Figure 3 1 is a flow chart of a method for verifying target positioning on a sample slide according to one embodiment of the present disclosure.

[0033] Figure 4 It is a flowchart of a method for locating a verification target identified by a microscopic scanning analyzer according to another embodiment of the present disclosure.

[0034] Figure 5 It is a flowchart of a method for obtaining a coordinate transformation relationship in one embodiment of the present disclosure.

[0035] Figure 6 It is a flowchart of a method for obtaining a coordinate transformation relationship in another embodiment of the present disclosure.

[0036] Figure 7 is a schematic diagram of a coordinate system of a specimen slide according to one embodiment of the present disclosure.

[0037] Figure 8 is a schematic diagram of a captured image according to one embodiment of the present disclosure.

[0038] Figure 9 is a schematic diagram of a reference image according to one embodiment of the present disclosure.

[0039] Figure 10 is a schematic diagram of a scattered point diagram according to one embodiment of the present disclosure.

[0040] Figure 11 Schematic diagram of the stage coordinates of a verification target according to one embodiment of the present disclosure. DETAILED DESCRIPTION

[0041] The present disclosure is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific examples described herein are intended only to illustrate the relevant content and are not intended to limit the present disclosure. It should also be noted that, for ease of description, only the portions relevant to the present disclosure are shown in the accompanying drawings.

[0042] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments in the present disclosure can be combined with each other. The technical solution of the present disclosure will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0043] After a suspicious object is identified within a target sample on a slide using a microscopic scanning analyzer, it is difficult to accurately and quickly locate the suspicious object within the microscope's field of view using a review microscope (e.g., a manual microscope) using the naked eye combined with traditional methods. Existing techniques rely on the presence of specific structures within the suspicious object to establish a coordinate transformation relationship between two coordinate systems. This approach is challenging to implement with highly diverse, sparse, or stacked samples.

[0044] To this end, the present disclosure proposes a method for positioning a review target identified by a microscopic scanning analyzer, wherein in this technical solution, the first coordinate information of the review target identified by the microscopic scanning analyzer is calculated through the coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the review microscope stage, and accurately converted into second coordinate information in the coordinate system of the stage. Combined with the comparison and analysis of the captured image and the reference image, the review microscope can quickly and accurately locate the review target in the sample slide based on the second coordinate information, solving the problems of difficult cross-platform coordinate conversion and low target positioning efficiency during manual review, and significantly improving the accuracy and efficiency of the review work.

[0045] Figure 1 FIG is a schematic diagram of a positioning system for a verification target identified by a microscopic scanning analyzer according to one embodiment of the present disclosure. Figure 1 As shown, the system includes an intelligent microscopic scanning analyzer, a processor, a display, and a review microscope. The intelligent microscopic scanning analyzer is used to scan and analyze a sample slide and output an identification result of a target sample on the sample slide. The processor is used to execute the positioning method for the review target identified by the microscopic scanning analyzer according to any embodiment of the present disclosure, converting the identification result into coordinate information in the coordinate system of the review microscope stage. The display is used to display the identification result. The review microscope is used to review the identification result.

[0046] Based on this system, the intelligent microscopic scanning analyzer first scans the sample and outputs the identification results and location information of the target sample. The processor is responsible for converting these identification results into coordinate information suitable for the verification microscope stage coordinate system, thereby achieving fast and precise positioning. The display shows the identification results, providing intuitive navigation for the user. The verification microscope uses the coordinate information of the identification results to enable the user to efficiently and in detail review the selected verification target. This significantly improves the efficiency and accuracy of sample analysis and verification, and reduces the difficulty of manual operation.

[0047] Figure 2 FIG. 1 shows a schematic diagram of the overall process of a method M200 for locating a verification target identified by a microscopic scanning analyzer according to an embodiment of the present disclosure. Figure 2 The method shown includes steps S210 to S250. The method can be implemented on a computer (a desktop computer or a portable computer, etc.).

[0048] In step S210, the target sample on the sample slide is scanned and identified by a microscopic scanning analyzer to obtain an identification result of a review target in the target sample that needs to be reviewed, wherein the identification result includes first coordinate information of the review target in the coordinate system of the sample slide.

[0049] The above-mentioned microscopic scanning analyzer is an intelligent device used for automatic scanning of sample slides, image acquisition and target recognition.

[0050] The sample slide is a thin, flat piece of glass or other transparent material used to carry and display a sample to be observed or analyzed.

[0051] Specifically, the microscopic scanning analyzer scans the sample to be tested according to the scanning requirements to obtain a scanned image. The analyzer identifies a target of a specified type in the scanned image and obtains an identification result for the target of the specified type. The identification results for the target of the specified type are stored per sample. Targets with unclear image information and / or inaccurate characterization in the identification results are designated as review targets requiring review. The sample to be tested of the review target serves as the target sample, and the identification result for the review target requiring review is determined.

[0052] The above scanning requirements are determined based on the sample type and sample characteristics of the target sample to ensure that high-quality images suitable for subsequent analysis can be obtained. Preferably, the scanning requirements include: objective lens magnification, image resolution, scanning range and / or scanning path.

[0053] In step S220 , a photographic image of the sample slide is obtained through a review microscope, wherein the sample slide is placed on a stage of the review microscope.

[0054] Specifically, a sample slide is placed on the stage of the review microscope, the stage is adjusted to the reference coordinate point position, the objective lens of the review microscope is focused, and the image captured by the review microscope in the current field of view is determined.

[0055] Preferably, the objective lens is a 10X objective lens.

[0056] Preferably, a blank slide of the same type as the sample slide is used as a reference slide, and the review microscope is calibrated using the reference slide.

[0057] Preferably, the position of the reference coordinate point is determined by a reference image.

[0058] In step S230 , the captured image is compared with the reference image to obtain a coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the stage.

[0059] The above-mentioned reference image is an image of a selected position in the reference slide located at the center of the objective field of the review microscope after the review microscope is calibrated.

[0060] The above-mentioned coordinate transformation relationship can be obtained by performing image feature matching between the captured image and the reference image, or can be obtained through a geometric transformation model.

[0061] Preferably, the captured image and the reference image are HSV images.

[0062] In step S240 , based on the coordinate conversion relationship, the first coordinate information is converted into second coordinate information in the coordinate system of the stage.

[0063] In step S250 , the verification target on the sample slide placed on the stage is positioned based on the second coordinate information.

[0064] Furthermore, this embodiment provides a method for locating a verification target identified by a microscopic scanning analyzer, achieving efficient verification of the identification results of the microscopic scanning analyzer through cross-device coordinate mapping. By comparing the slide image with a reference image, the coordinate transformation is simplified without relying on specific structures in the sample. Whether thin or stacked samples, the method of this embodiment can be used for efficient verification of location, expanding the scope of application of the technology.

[0065] Regarding step S250, in some embodiments of the present disclosure, it may include the following Figure 3 Steps S2501 and S2502 are shown.

[0066] In step S2501, the second coordinate information of the verification target is marked on the sample global map to obtain a discrete point map, wherein the sample global map includes multiple local scanning areas of the target sample on the sample slide, and the local scanning areas include the verification target.

[0067] Preferably, when the microscopic analysis scanner performs analysis and identification on the sample slide, the local scanning area is determined according to the predetermined partitions.

[0068] In step S2502, the review target is located according to the scattered point map.

[0069] In a specific embodiment, when a review target is selected, the second coordinate information of the selected review target is displayed in the sample global map, and the review target is reviewed according to the second coordinate information of the selected review target.

[0070] Since the magnification difference between the global image of the target sample and the microscopic image of the verification target is significant, it is impossible to fully display all the verification targets on the global map of the sample. Therefore, the present disclosure adopts a scanning area division strategy: if there is a verification target in a certain local scanning area, the area and the second coordinate information of the verification target in the area are marked on the global image of the sample to generate a simple identification map, i.e., a discrete point map, to achieve interactive guidance from global overview to precise positioning.

[0071] Figure 4 FIG. 1 is a flow chart of a method for locating a verification target identified by a microscopic scanning analyzer according to an embodiment of the present disclosure. Figure 4 As shown, the method M400 for locating a verification target identified by a microscopic scanning analyzer in this embodiment includes steps S410 to S450.

[0072] In step S410, the target sample on the sample slide is scanned and identified by a microscopic scanning analyzer to obtain an identification result of a review target in the target sample that needs to be reviewed, wherein the identification result includes first coordinate information of the review target in the coordinate system of the sample slide.

[0073] In step S420 , a photographic image of the sample slide is obtained through a review microscope, wherein the sample slide is placed on a stage of the review microscope.

[0074] In step S430, the first identification posture information of the sample slide in the captured image is compared with the second identification posture information of the reference slide in the reference image to obtain a coordinate transformation relationship between the coordinate system of the sample slide and the coordinate system of the stage, wherein the coordinate transformation relationship is determined by the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage.

[0075] In step S440, based on the coordinate conversion relationship, the first coordinate information is converted into second coordinate information in the coordinate system of the stage.

[0076] In step S450 , the verification target on the sample slide placed on the stage is positioned based on the second coordinate information.

[0077] In this embodiment, by comparing the identification position information of the slide in the captured image and the reference image, the offset and rotation between the two coordinate systems are accurately calculated and a coordinate transformation relationship is established, breaking through the traditional verification's reliance on the sample's own characteristics, and completing cross-device coordinate mapping only through the difference in the slide's identification position.

[0078] Regarding step S430, in some embodiments of the present disclosure, it may include the following: Figure 5 Steps S501 to S505 are shown.

[0079] In step S501 , for the identification pattern of the specimen slide in the captured image, a straight line equation of a straight line in the identification pattern of the specimen slide in the coordinate system of the specimen slide is determined.

[0080] In a specific embodiment, edge detection is performed on straight lines within the sample slide's identification pattern in a captured image to determine edge points of the straight lines within the sample slide's identification pattern. Hough line fitting is performed based on the edge points to determine the equation of the straight lines within the sample slide's identification pattern within the sample slide's coordinate system. This embodiment accurately extracts key features of the identification pattern, providing reliable basic data for subsequent calculation of offset and rotation values, thereby achieving high-precision coordinate transformation and target positioning.

[0081] In step S502 , the coordinates of the feature points in the identification pattern of the specimen slide are determined according to the straight line equation of the straight line in the identification pattern of the specimen slide.

[0082] In a specific embodiment, the coordinates of the intersections of the multiple straight lines in the identification pattern on the specimen slide are determined based on their equations. The coordinates of the intersections of the multiple straight lines in the identification pattern on the specimen slide are then used to determine the coordinates of characteristic points in the identification pattern on the specimen slide. This embodiment uses the intersections of the multiple straight lines in the identification pattern as characteristic points to determine the coordinates of the characteristic points, thereby improving the accuracy of the identification pattern analysis.

[0083] In step S503 , the offset between the coordinate system of the specimen slide and the coordinate system of the stage is determined based on the coordinates of the feature points in the identification pattern of the specimen slide and the coordinates of the feature points in the identification pattern of the reference slide in the reference image.

[0084] In step S504, the rotation amount between the coordinate system of the specimen slide and the coordinate system of the stage is determined based on the linear equation of the straight line in the identification pattern of the specimen slide and the linear equation of the corresponding straight line in the identification pattern of the reference slide.

[0085] In a specific embodiment, the rotation between the coordinate system of the specimen slide and the coordinate system of the stage is determined based on the angle between a straight line in the specimen slide's identification pattern and a reference direction, as well as the angle between a corresponding straight line in the reference slide's identification pattern and the reference direction. This accurately captures the rotational changes of the specimen slide as it is placed on the stage.

[0086] The above reference direction may be a horizontal direction or a vertical direction.

[0087] In step S505 , the coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the stage is determined according to the offset and the rotation amount.

[0088] In this implementation, by accurately calculating the linear equations and feature point coordinates of the specimen slide's marking pattern in the captured image, combined with comparative analysis with a reference image, the offset and rotation between the coordinate systems are determined, ultimately establishing a coordinate transformation relationship. This enables precise transformation between the specimen slide's coordinate system and the review microscope stage's coordinate system.

[0089] Regarding step S430, in some other embodiments of the present disclosure, the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage can be determined based on the position information of two adjacent edges of the sample slide in the captured image and the position information of two corresponding edges of the reference slide in the reference image, including the following: Figure 6 Steps S601 to S605 are shown as follows: In step S601 , the straight line equations of the first and second sides of the sample slide in the captured image in the coordinate system of the sample slide are determined by Hough line fitting, wherein the first and second sides are two adjacent sides of the sample slide.

[0090] In step S602 , the coordinates of the intersection point between the first side and the second side are determined according to the straight line equations of the first side and the second side.

[0091] In step S603, the offset between the coordinate system of the sample slide and the coordinate system of the stage is determined based on the coordinates of the intersection between the first side and the second side and the coordinates of the intersection between two sides corresponding to the reference slide in the reference image.

[0092] In step S604, the rotation amount between the coordinate system of the sample slide and the coordinate system of the stage is determined based on the angle between the first side or the second side and the reference direction, and the angle between the corresponding side of the reference slide and the reference direction.

[0093] In step S605 , the coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the stage is determined based on the offset and the rotation amount.

[0094] In this embodiment, Hough linear fitting is used to determine the equations of the lines between two adjacent sides of the sample slide in the captured image, and the coordinates of the intersection of these two sides are calculated. The coordinates of the corresponding intersection points in the reference image are then compared to determine the offset of the sample slide coordinate system relative to the microscope stage coordinate system. The amount of rotation is then determined by comparing the angles between the corresponding sides of the sample and reference slides and the reference direction. A transformation relationship is established between the two coordinate systems based on the offset and rotation. This ensures high-precision coordinate transformation, enabling faster and more accurate positioning of verification targets, significantly improving the efficiency and accuracy of the sample verification process.

[0095] In one specific embodiment, a slide with a colored "P-shaped" silkscreen printed on the slide head is selected as the sample slide, and a blank slide of the same type is used as the reference slide. The review microscope is calibrated using the reference slide. The stage coordinates and image of the center point of the colored "P-shaped" silkscreen printed on the reference slide's waveguide head are recorded when it is at the center of the review microscope's 10X objective field of view. The stage coordinates are used as the reference coordinate position, and the image is used as the reference image.

[0096] The target sample is loaded into the intelligent microscopic scanning analyzer for scanning, and the target to be reviewed is found, and the recognition result of the target is derived. The recognition result includes the coordinate information of the target in the coordinate system of the sample slide. The coordinate system of the sample slide is as follows: Figure 7 As shown in the figure, a coordinate system for the specimen slide is established with a selected corner point at the slide head as the origin, the short side adjacent to the corner point as the vertical axis, and the long side as the horizontal axis. The specimen slide includes a marking pattern at the slide head and a specimen area. The specimen area contains the recognition result of the verification target, which includes the coordinates (x, y) of the verification target in the specimen slide's coordinate system.

[0097] Load the sample slide into the review microscope, move the stage to the reference coordinate position, switch to the 10X objective lens and focus, and obtain the image of the reference coordinate position. Save the image to the specified location, where the image is as follows: Figure 8 shown.

[0098] Convert the captured image into an HSV image. HSV images can use the separation characteristics of brightness and hue in the color space to more accurately identify the color characteristics of the slide identification pattern, thereby improving the noise resistance and accuracy of edge detection and line fitting.

[0099] Get the reference coordinates (x0, x0,) of the reference image and the reference angle α0 of each line in the reference image. Figure 9 shown.

[0100] Identify the areas of different straight lines in the captured image based on their colors, perform edge detection on the color areas of different straight lines, and obtain the edge points of the straight lines. Perform Hough line fitting on the edge points to determine the equations of multiple straight lines. Determine the coordinates of the intersection point (x1…x n ,y1…y n ), the mean value of all intersection coordinates in the captured image is taken as the coordinate of the feature point of the captured image, that is, x 拍摄图像 =(x1+…x n ) / n,y 拍摄图像 =(y1+…y n ) / n. The coordinates of the feature points of the captured image are subtracted from the coordinates of the feature points of the reference image, that is, the reference coordinates, to obtain the offset between the coordinate system of the sample slide and the coordinate system of the stage, that is, x 偏移量 =x 拍摄图像 - x0,,y 偏移量 = y 拍摄图像 - x0, Select a color line in the captured image and calculate the angle α1 between it and the horizontal. Calculate the angular offset between this angle and the reference angle α0 of the same color line in the reference image: angle offset = α1 - α0. Use this angular offset as the rotation between the coordinate systems of the specimen slide and the stage.

[0101] The coordinate transformation relationship between the coordinate system of the sample slide and the coordinate system of the stage is calculated through the offset and the rotation.

[0102] The first coordinate information of the verification target is converted into the second coordinate information in the coordinate system of the stage through the coordinate transformation relationship, and an identification map, i.e. a discrete point map, is formed on the global image of the sample. When the user selects the area to be verified in the identification map, the guide coordinates will be displayed near the area to be verified. Figure 10 As shown, select the verification target in the lower left corner of the recognition map. The second coordinate information of the verification target (136.7mm, 22.6mm) is displayed synchronously on the recognition map. Now, move the stage coordinates of the verification microscope to the second coordinate information to quickly locate the verification target for verification.

[0103] In addition, the feasibility of this embodiment is verified by moving the stage of the review microscope to the reference coordinate position multiple times and repeating the film loading and unloading operations. It can be obtained that there are certain offsets and rotations of the crosshair marks in the captured images relative to the crosshair marks in the reference image each time, but the variation range is small. When the picture resolution is 4096*2048, the offset is usually about 800*200 pixels, the overall change is small, and most of the crosshair centers are within the captured images, so the coordinate conversion relationship between the currently placed sample slide and the reference slide can be quickly determined. When the review microscope used in this embodiment is equipped with a manual stage, the coordinates of the stage are also easy to locate. For example, the scale position of (136.7mm, 22.6mm) of the second coordinate information of the above review target is as Figure 11 shown.

[0104] The present disclosure has strong applicability and is not affected by the quality of the sample itself. All samples analyzed by the intelligent microscopic scanning analyzer, whether thin or stacked samples, can be located and reviewed by the method of the present disclosure. It is possible to separately establish the coordinate system of the sample slide, convert the review target in the recognition result of the intelligent microscopic scanning analyzer into a recognition diagram, and convert the coordinates of the review target in the coordinate system of the sample slide into the coordinates of the stage of the review microscope. When using the review microscope to review the sample, the review worker can combine the recognition diagram, freely select the review target, and quickly locate the review target based on the stage coordinates of the review target, which reduces the workload of the review worker and improves the work efficiency.

[0105] The present disclosure is described with reference to the flowcharts and / or block diagrams of the method and system according to the present disclosure. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate a device for implementing the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks.

[0106] These computer program instructions can also be stored in a computer-readable memory that can guide a computer or other programmable data processing devices to work in a specific manner, so that the instructions stored in the computer-readable memory generate a manufactured product including an instruction device, and the instruction device implements the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks.

[0107] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0108] In the description of this specification, the description with reference to the terms "one embodiment / method", "some embodiments / methods", "example", "specific example", or "some examples" means that the specific features, structures, or characteristics described in conjunction with the embodiment / method or example are included in at least one embodiment / method or example of the present disclosure. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment / method or example. Moreover, the specific features, structures, or characteristics described may be combined in a suitable manner in any one or more embodiments / methods or examples. In addition, those skilled in the art may combine and combine different embodiments / methods or examples described in this specification and the features of different embodiments / methods or examples, unless they are contradictory.

[0109] Those skilled in the art will appreciate that the above embodiments are merely intended to clearly illustrate the present disclosure and are not intended to limit the scope of the present disclosure. Other changes or modifications may be made based on the above disclosure, and such changes or modifications are still within the scope of the present disclosure.

Claims

1. A method for locating a verification target identified by a microscopic scanning analyzer, characterized in that: include: Scanning and identifying the target sample on the sample slide by the microscopic scanning analyzer to obtain an identification result of a verification target that needs to be reviewed in the target sample, wherein the identification result includes first coordinate information of the verification target in the coordinate system of the sample slide; obtaining a photographic image of the sample slide through a review microscope, wherein the sample slide is placed on a stage of the review microscope; comparing the captured image with a reference image to obtain a coordinate conversion relationship between a coordinate system of the sample slide and a coordinate system of the stage; Based on the coordinate conversion relationship, converting the first coordinate information into second coordinate information in the coordinate system of the stage; as well as The verification target in the sample slide placed on the stage is positioned based on the second coordinate information.

2. The method according to claim 1, wherein Positioning the verification target on the sample slide placed on the stage based on the second coordinate information includes: Marking the second coordinate information of the verification target on the sample global map to obtain a discrete point map, wherein the sample global map includes multiple local scanning areas of the target sample on the sample slide, and the local scanning areas include the verification target; The verification target is located according to the scattered point map.

3. The method according to claim 2, wherein Also includes: When the review target is selected, displaying the second coordinate information of the selected review target in the sample global map; The review target is reviewed according to the second coordinate information of the selected review target.

4. The method according to claim 1, wherein Comparing the captured image with a reference image to obtain a coordinate conversion relationship between a coordinate system of the sample slide and a coordinate system of the stage includes: determining an offset and a rotation between a coordinate system of the specimen slide and a coordinate system of the stage based on first identification position information of the specimen slide in the captured image and second identification position information of the reference slide in the reference image; A coordinate conversion relationship between the coordinate system of the sample slide and the coordinate system of the stage is determined according to the offset and the rotation.

5. The method according to claim 4, wherein Determining an offset and a rotation between a coordinate system of the specimen slide and a coordinate system of the stage based on first identification position information of the specimen slide in the captured image and second identification position information of the reference slide in the reference image includes: determining, for the identification pattern of the sample slide in the captured image, a straight line equation of a straight line in the identification pattern of the sample slide in a coordinate system of the sample slide; determining the coordinates of a feature point in the identification pattern of the sample slide according to a straight line equation of the straight line in the identification pattern of the sample slide; determining an offset between a coordinate system of the specimen slide and a coordinate system of the stage based on coordinates of characteristic points in the identification pattern of the specimen slide and coordinates of characteristic points in the identification pattern of the reference slide in the reference image; The rotation amount between the coordinate system of the sample slide and the coordinate system of the stage is determined based on the linear equation of the straight line in the identification pattern of the sample slide and the linear equation of the corresponding straight line in the identification pattern of the reference slide.

6. The method according to claim 5, wherein Determining a straight line equation of a straight line in the identification pattern of the sample slide in a coordinate system of the sample slide includes: performing edge detection on a straight line in the identification pattern of the sample slide in the captured image to determine edge points of the straight line in the identification pattern of the sample slide; Hough line fitting is performed based on the edge points to determine a straight line equation of the straight line in the identification pattern of the sample slide in the coordinate system of the sample slide.

7. The method according to claim 5, wherein Determining the coordinates of a feature point in the identification pattern of the sample slide according to a straight line equation of the straight line in the identification pattern of the sample slide includes: determining coordinates of intersections between the plurality of straight lines according to straight line equations of the plurality of straight lines in the identification pattern of the sample slide; The coordinates of the characteristic points in the identification pattern of the sample slide are determined according to the coordinates of the intersections of the plurality of straight lines in the identification pattern of the sample slide.

8. The method according to claim 5, wherein Determining a rotation amount between a coordinate system of the sample slide and a coordinate system of the stage according to a linear equation of a straight line in the identification pattern of the sample slide and a linear equation of a corresponding straight line in the identification pattern of the reference slide, comprising: The rotation amount between the coordinate system of the sample slide and the coordinate system of the stage is determined based on the angle between the straight line in the identification pattern of the sample slide and the reference direction, and the angle between the corresponding straight line in the identification pattern of the reference slide and the reference direction.

9. The method according to claim 4, wherein Optionally, determining an offset and a rotation between a coordinate system of the specimen slide and a coordinate system of the stage based on first identification position information of the specimen slide in the captured image and second identification position information of the reference slide in the reference image includes: Determine the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage based on the position information of two adjacent edges of the sample slide in the captured image and the position information of two corresponding edges of the reference slide in the reference image, Optionally, determining the offset and rotation between the coordinate system of the sample slide and the coordinate system of the stage based on the position information of two adjacent sides of the sample slide in the captured image and the position information of two sides corresponding to the reference slide in the reference image includes: determining the straight line equations of a first side and a second side of the sample slide in the captured image in the coordinate system of the sample slide by Hough straight line fitting, wherein the first side and the second side are two adjacent sides of the sample slide; determining the coordinates of the intersection between the first side and the second side based on the straight line equations of the first side and the second side; determining the offset between the coordinate system of the sample slide and the coordinate system of the stage based on the coordinates of the intersection between the first side and the second side and the coordinates of the intersection between the two sides corresponding to the reference slide in the reference image; and determining the rotation between the coordinate system of the sample slide and the coordinate system of the stage based on the angle between the first side or the second side and a reference direction and the angle between the side corresponding to the reference slide and the reference direction. Optionally, the captured image and the reference image are HSV images.

10. A positioning system for a verification target identified by a microscopic scanning analyzer, characterized in that: include: A microscopic scanning analyzer, configured to scan and analyze the sample slide and output an identification result of the target sample in the sample slide; A processor for executing the method for locating a verification target identified by a microscopic scanning analyzer according to any one of claims 1 to 9; A display, configured to display the recognition result; A review microscope is used to review the recognition result.

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