Test method, test equipment and readable storage medium
By importing the test table to generate a test program set, controlling the communication between the test equipment and the electronic equipment, acquiring and displaying the test data in real time, and automatically generating the test report, the problem of low automation level in electronic equipment testing is solved and the test efficiency is improved.
Patent Information
- Application Number
- CN202510625663.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-15
- Publication Date
- 2025-09-26
AI Technical Summary
During the manufacturing process of electronic equipment, the testing requirements for electronic products of different specifications and models are different, resulting in a low degree of test automation and low efficiency.
Generate test program sets by importing test tables, control communication between test equipment and electronic equipment, acquire and display test data in real time, and automatically generate test reports to improve the degree of automation.
It has achieved a higher degree of automation in electronic equipment testing, significantly improved test efficiency, and can quickly generate operation results and test reports.
Smart Images

Figure CN120705031A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of detection technology, and in particular to a testing method, testing equipment and a readable storage medium. Background Art
[0002] Nowadays, various electronic devices have penetrated into people's lives. During the production and manufacturing process of various electronic devices, it is necessary to test the operation of the electronic devices to determine whether the electronic devices meet the factory usage standards.
[0003] However, due to the wide variety of electronic devices and the differences between electronic products of different specifications and models, the testing requirements for each electronic device are also different, resulting in a low degree of automation in the testing process of electronic products and low efficiency of the entire testing process. Summary of the Invention
[0004] In view of the defects in the prior art, the present invention provides a testing method that can effectively improve the degree of automation in the testing process and improve the testing efficiency.
[0005] The present application provides a testing method, which is applied to a testing device used to test electronic equipment. The testing method includes:
[0006] Importing a test table into the test device, and generating a test program set based on the test table;
[0007] Sending the test program set to an electronic device, wherein the electronic device runs according to the test program set to generate an operation result, and feeds the operation result back to the test device;
[0008] The test device is controlled to complete the test of the electronic device according to the operation result and automatically generate a test report.
[0009] In one aspect, the test device includes a power output port, and the electronic device includes a power interface;
[0010] After the step of generating a test program set based on the test table, the method includes:
[0011] Controlling the power output port to energize the power interface;
[0012] Detect the power consumption of the electronic device and generate a power consumption curve report.
[0013] In one aspect, the step of sending the test program set to an electronic device comprises:
[0014] Controlling the test device to simulate the formation of a storage medium;
[0015] The test program set is sent to the electronic device based on the storage medium.
[0016] In one aspect, the testing device is provided with a display screen;
[0017] After the step of sending the test program set to the electronic device, the method further comprises:
[0018] Acquire detection data from the electronic device and display the detection data on the display screen in real time.
[0019] In one aspect, the step of acquiring detection data from the electronic device and displaying the detection data on the display screen in real time includes:
[0020] Acquiring detection data of the electronic device at preset time intervals;
[0021] The detection data is simulated to form an operation curve or an operation progress bar, and the operation curve or the operation progress bar is presented on the display screen.
[0022] In one aspect, the step of controlling the test device to complete the detection of the electronic device according to the operation result includes:
[0023] Comparing the operating result with a preset standard and outputting the comparison result;
[0024] The comparison result is output to a test report.
[0025] In one aspect, the step of generating a test program set based on the test table includes:
[0026] Selecting required test cases from a pre-stored program library according to the test table;
[0027] The test program set is generated based on the selected test cases.
[0028] In order to solve the above problem, the present application further provides a testing method, which is used for an electronic device, wherein the electronic device is tested by a testing device, and the testing method includes:
[0029] Controlling the electronic device to obtain a test program set from the test device and generate an operation result based on the test program set, wherein a test table is imported into the test device and the test program set is generated based on the test table;
[0030] The operation result is fed back to the test device, so that the test device completes the test of the electronic device according to the operation result and automatically generates a test report.
[0031] In order to solve the above problems, the present application further provides a testing device, which includes:
[0032] A generating module, the generating module being configured to receive an imported test table and generate a test program set based on the test table;
[0033] a loading module, the loading module being used to send the test program set to an electronic device, wherein the electronic device runs according to the test program set and generates an operation result, and the operation result is fed back to the test device through the loading module;
[0034] A test module is used to complete the test of the electronic device according to the operation result and automatically generate a test report.
[0035] In order to solve the above problem, the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method described above is implemented.
[0036] In order to solve the above problems, the present application also provides a data acquisition system, which includes an analysis terminal and the test method as described above. The test method transmits the collected data to the analysis terminal, and the analysis terminal analyzes the collected data.
[0037] The beneficial effects of the present invention are reflected in the following aspects: the test table includes various test requirements, and the test program set generated based on the test table includes various corresponding test programs. It can be seen that the required test programs can be automatically generated through the test table, and these programs constitute the test program set. The test program set is automatically generated and has a higher degree of automation. After the test program set is sent to the electronic device under test, the electronic device can run according to the test program set and quickly generate the operation results. After receiving the operation results, the test equipment automatically generates a test report, which further improves the degree of automation and improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0038] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following briefly describes the drawings required for the specific embodiments or the description of the prior art. Similar elements or parts are generally identified by similar reference numerals throughout the drawings. Elements or parts in the drawings are not necessarily drawn to scale.
[0039] Figure 1 A schematic diagram of the process steps of the test method of this application running on the test equipment;
[0040] Figure 2 A schematic diagram of the steps in forming a power consumption curve report in the test method of this application;
[0041] Figure 3 A schematic diagram of the process steps for sending a test program set in the test method of this application;
[0042] Figure 4 A schematic diagram of the process steps for displaying the operating status of an electronic device in real time in the test method of this application;
[0043] Figure 5 This is a schematic diagram of the specific process steps for displaying the operating status of an electronic device in real time in the test method of this application;
[0044] Figure 6 A schematic diagram of the process steps for generating a test report in the test method of this application;
[0045] Figure 7 A schematic diagram of the process steps for generating a test program set in the test method of this application;
[0046] Figure 8 A schematic diagram of the process steps for running the test method of this application on an electronic device;
[0047] Figure 9 Schematic diagram of the functional modules of the test equipment and electronic equipment.
[0048] In the accompanying drawings, 100 is an electronic device; 200 is a testing device;
[0049] 210, generation module; 220, loading module; 230, testing module; 240, power consumption management module; 250, detection module. DETAILED DESCRIPTION
[0050] The following embodiments of the technical solution of the present invention will be described in detail with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention and are therefore only examples and are not intended to limit the scope of protection of the present invention.
[0051] It should be noted that, unless otherwise specified, the technical or scientific terms used in this application should have the common meanings understood by those skilled in the art to which the present invention belongs.
[0052] See Figure 1 As shown, the present application provides a testing method, which is applied to a testing device, and the testing device is used to test electronic equipment. The electronic equipment in the present application mainly refers to a product equipped with a CPU (Central Processing Unit) and an operating system installed, such as Windows, macOS, Linux or Hongmeng system.
[0053] Test methods include:
[0054] Step S10: Import a test table into the test equipment and generate a test program set based on the test table. The test table is primarily used to record test requirements and can be stored in a spreadsheet, such as an Excel spreadsheet. During testing, the test table is directly imported into the test equipment. Within the test equipment, the required test programs are selected based on the test requirements recorded in the test table. These test programs are then assembled into a test program set. Test operations can be performed sequentially according to the test programs in the test program set, or several test programs can be performed simultaneously.
[0055] In step S20, the test program set is sent to the electronic device, wherein the electronic device runs according to the test program set, generates an operation result, and feeds back the operation result to the test device; after the test program set is generated, the test device sends the test program set to the electronic device, and at one end of the electronic device, after the electronic device receives the test program set, it starts to execute the test program according to the records in the test program set to detect the operation status of the electronic device, such as the communication rate of various interfaces, the stability of communication, etc.
[0056] The electronic device can automatically run after receiving the test program set, which can improve the test efficiency. When the safety level of the electronic device is high, the test program set can also be manually controlled to run.
[0057] In step S30, the test equipment is controlled to complete the test of the electronic device based on the operating results and automatically generate a test report. After receiving the operating results from the electronic device, the test equipment can determine the operating status of the electronic device. The generated test report can specifically reflect the operating status of the electronic device and provide a pass or fail judgment for test items that meet or do not meet the requirements.
[0058] In this embodiment, the test table includes various test requirements, and the test program set generated based on the test table includes various corresponding test programs. As can be seen, the test table can automatically generate the required test programs, which constitute the test program set. The test program set is automatically generated, which has a higher degree of automation. After the test program set is sent to the electronic device under test, the electronic device can run according to the test program set and quickly generate the operation results. After receiving the operation results, the test equipment automatically generates a test report, which further improves the degree of automation and improves testing efficiency.
[0059] See Figure 2 As shown, in one embodiment of the present application, the testing device includes a power output port, and the electronic device includes a power interface;
[0060] After the steps to generate a test set based on the test table, include:
[0061] Step S21: Control the power output port to power the power interface. Before powering on, connect the power interface of the electronic device to the power output port of the test device 200. After receiving the test start command, the test device 200 powers on the power interface through the power output port.
[0062] Step S22: Detect the power consumption of the electronic device 100 and generate a power consumption curve report. While supplying power to the electronic device 100, the test device 200 can record the power supply status, such as the power supply size and power supply fluctuations.
[0063] The electronic device 100 consumes electrical energy, but a portion of this energy is used for normal operation and generally remains constant. The remaining energy is dissipated as heat, such as through heat dissipation on the motherboard. The power consumption curve report can directly reflect the heat dissipation status of the electronic device 100. For example, excessive power consumption may indicate a heat dissipation problem; or large fluctuations in power consumption indicate large fluctuations in heat dissipation, also indicating a heat dissipation problem.
[0064] See Figure 3 As shown, in one embodiment of the present application, the step of sending the test program set to the electronic device 100 includes:
[0065] Step S210: Controlling the test device 200 to simulate the formation of a storage medium. The test device 200 is provided with a first communication port, and the electronic device 100 is provided with a second communication port. The first communication port and the second communication port are connected to ensure smooth transmission of the test program set and the running results. The first communication port and the second communication port can both be USB interfaces, connected together via a data cable.
[0066] Step S220: Send the test program set to the electronic device 100 based on the storage medium. By simulating the test device 200 as a storage medium, the test set independently provides data to the electronic device 100, reducing transmission rate limitations and increasing the speed at which the test device 200 can send the test program set to the electronic device 100. The storage medium can be understood as a device that independently stores data, such as a USB flash drive, a mobile hard drive, or an optical disk.
[0067] See Figure 4 As shown, in one embodiment of the present application, the testing device 200 is provided with a display screen; the display screen can display images and can also display numbers.
[0068] After the step of sending the test program set to the electronic device 100, the following steps are included:
[0069] Step S23: Acquire detection data from the electronic device 100. Acquiring detection data from the electronic device 100 is also done through the first communication port and the second communication port. That is, data can be transmitted from the first communication port to the second communication port, or from the second communication port to the first communication port.
[0070] In step S24, the detection data is displayed in real time on the display screen. By presenting the detection data on the display screen, the operating status of the electronic device 100 can be constantly reflected. Furthermore, the display screen configuration allows the operating status of the electronic device 100 to be more directly displayed, allowing a clearer understanding of the operating status of the electronic device 100. For example, changes in the detection data can be displayed using a curve or progress bar.
[0071] See Figure 5 As shown, in one embodiment of the present application, the steps of acquiring detection data from the electronic device 100 and displaying the detection data on the display screen in real time include:
[0072] Step S201: Acquire test data from the electronic device 100 at preset time intervals. Acquiring test data at preset time intervals can reduce the amount of data acquired. Sampling can be performed at different preset time intervals for different test programs. Of course, to more accurately reflect the operating conditions of the electronic device 100, the preset time interval can be reduced to increase the frequency of test data acquisition.
[0073] Step S202 simulates the test data to form an operation curve or an operation progress bar, and displays the operation curve or operation progress bar on the display screen. The acquired test data can be connected into a line to form an operation curve, and the direction and fluctuations of the operation curve can be observed on the display screen. The fluctuations of the operation curve can also be displayed on the display screen simultaneously. Alternatively, the acquired test data can be accumulated to reflect the test progress of the test program, i.e., the operation progress bar.
[0074] See Figure 6 As shown, in one embodiment of the present application, the steps of controlling the test device 200 to complete the test of the electronic device 100 according to the operation results and automatically generate a test report include:
[0075] Step S310: Compare the running results with the preset standards and output the comparison results. After comparison, if the results do not meet the standards, the test report will show NG, i.e., failed. If the results meet the standards, the test report will show OK, i.e., passed.
[0076] Step S320: Output the comparison results to a test report. The test report can be presented in electronic form or in paper form. It can also be transmitted wirelessly to the tester over long distances. It should be noted that different test programs generally have different preset standards, and electronic products of different specifications also have different preset standards. Preset standards can be pre-set for different test programs. The preset standards can be attached to the test program set, and the comparison and judgment can be automatically completed as the test process proceeds.
[0077] In addition, some test program items require human judgment, or they can be judged independently by artificial intelligence software.
[0078] See Figure 7 As shown, in one embodiment of the present application, the step of generating a test program set based on the test table includes:
[0079] Step S110 selects the required test case from the pre-stored program library based on the test table. A test case can be understood as a collection of various test programs. After determining the test table, the required test program (i.e., test case) can be automatically selected from the collection of test programs. To enhance automation, each test case in the program library has a unique number. After obtaining the test table, the test program in the test table has a matching number corresponding to the test case. By matching the matching number with the test case number, the required test program can be quickly determined and retrieved.
[0080] Step S120: Generate a test program set based on the selected test case. Collect the required test programs together to form a test program set, and complete the test process through the test program set.
[0081] See Figure 8 As shown, the present application further provides a testing method, which is used for an electronic device 100. The electronic device 100 is tested by a testing device 200. For the electronic device 100, the testing method includes:
[0082] Step S1 controls the electronic device 100 to obtain a test program set from the test device 200 and generate an operation result based on the test program set. A test table is imported into the test device 200, and a test program set is generated based on the test table. The test table is primarily used to record test requirements and can be in the form of a spreadsheet, such as an Excel spreadsheet. During testing, the test table is directly imported into the test device 200. The test device 200 selects the required test programs based on the test requirements recorded in the test table, and these test programs are assembled to form a test program set. The electronic device 100 can be controlled to perform test operations sequentially according to the test programs in the test program set, or several test programs can be performed simultaneously.
[0083] In step S2, the operation result is fed back to the test device 200 so that the test device 200 completes the detection of the electronic device 100 according to the operation result and automatically generates a detection report. After the electronic device 100 receives the test program set, it starts to execute the test program according to the records in the test program set to detect the operation status of the electronic device 100, such as the communication rate of various interfaces, the stability of communication, etc. After the test device 200 receives the operation result fed back by the electronic device 100, it can judge the operation status of the electronic device 100. The generated detection report can specifically reflect the operation status of the electronic device 100, and give judgment opinions on the test items that meet the requirements and those that do not meet the requirements, respectively, whether to pass or fail.
[0084] In this embodiment, the test table includes various test requirements, and the test program set generated based on the test table includes various corresponding test programs. As can be seen, the required test programs can be automatically generated through the test table. These programs constitute the test program set. The test program set is automatically generated, which has a higher degree of automation. After the test program set is sent to the electronic device 100 under test, the electronic device 100 can run according to the test program set and quickly generate an operation result. After receiving the operation result, the test device 200 automatically generates a test report, which further improves the degree of automation and improves test efficiency.
[0085] The present application further provides a testing device 200 , which includes: a generating module 210 , a loading module 220 and a testing module 230 .
[0086] The generating module 210 is used to receive the imported test table and generate a test program set based on the test table;
[0087] The loading module 220 is used to send the test program set to the electronic device 100, wherein the electronic device 100 runs according to the test program set and generates an operation result, and feeds the operation result back to the test device 200 through the loading module 220;
[0088] The testing module 230 is used to complete the test of the electronic device 100 according to the operation result and automatically generate a test report.
[0089] The test device 200 of this embodiment generates a test program set based on the test table through the generation module 210, and the test program set includes corresponding various test programs. The test program automatically generated by the generation module 210 has a higher degree of automation because the test program set is automatically generated. After the test program set is sent to the electronic device 100 under test through the loading module 220, the electronic device 100 can run according to the test program set and quickly generate an operation result. After the test device 200 receives the operation result through the test module 230, it automatically generates a test report, which can also improve the degree of automation and improve test efficiency.
[0090] The test device 200 also has various test interfaces, such as 485 interface, 422 interface, 232 interface, network interface, IO interface, relay switch, and CAN bus interface, which are connected to the interface under test of the electronic device 100 through the test interface.
[0091] The testing device 200 also includes a control mainboard, which is connected to the power consumption management module 240, the loading module 220, the testing module 230, and the detection module 250. The detection module 250 is configured to obtain detection data from the electronic device 100 at preset time intervals, simulate the detection data to form an operating curve or an operating progress bar, and display the operating curve or operating progress bar on the display screen.
[0092] The present application also provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the method described above is implemented. When the processor executes the computer program, the steps in each embodiment of the above-mentioned test method are implemented, such as Figure 1 S10 to S30 shown.
[0093] The computer program can be divided into one or more modules, one or more of which are stored in a memory and executed by a processor to complete the present application. One or more modules can be a series of computer program instruction segments that can perform specific functions, and the instruction segments are used to describe the execution process of the computer program in the intelligent terminal. For example, the computer program can be divided into a reading module, a judgment module, and a startup module, and the specific functions of each module are as described above.
[0094] The specific embodiments and beneficial effects of the computer-readable storage medium in this application can be found in the above-mentioned testing method, which will not be described in detail here.
[0095] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or make equivalent replacements for some or all of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present invention, and they should all be included in the scope of the claims and description of the present invention.
Claims
1. A testing method, characterized in that: The test method is applied to a test device, which is used to test electronic equipment. The test method includes: Importing a test table into the test device, and generating a test program set based on the test table; Sending the test program set to an electronic device, wherein the electronic device runs according to the test program set to generate an operation result, and feeds the operation result back to the test device; The test device is controlled to complete the test of the electronic device according to the operation result and automatically generate a test report.
2. The testing method according to claim 1, wherein: The test device includes a power output port, and the electronic device includes a power interface; After the step of generating a test program set based on the test table, the method includes: Controlling the power output port to energize the power interface; Detect the power consumption of the electronic device and generate a power consumption curve report.
3. The testing method according to claim 1, wherein: The step of sending the test program set to the electronic device comprises: Controlling the test device to simulate the formation of a storage medium; The test program set is sent to the electronic device based on the storage medium.
4. The testing method according to claim 3, wherein: The testing device is provided with a display screen; After the step of sending the test program set to the electronic device, the method further comprises: Acquire detection data from the electronic device and display the detection data on the display screen in real time.
5. The testing method according to claim 4, characterized in that: The step of acquiring detection data from the electronic device and displaying the detection data on the display screen in real time includes: Acquiring detection data of the electronic device at preset time intervals; The detection data is simulated to form an operation curve or an operation progress bar, and the operation curve or the operation progress bar is presented on the display screen.
6. The testing method according to claim 1, wherein: The step of controlling the test device to complete the test of the electronic device according to the operation result and automatically generating a test report includes: Comparing the operating result with a preset standard and outputting the comparison result; The comparison result is output to a test report.
7. The testing method according to any one of claims 1 to 6, characterized in that: The step of generating a test program set based on the test table includes: Selecting required test cases from a pre-stored program library according to the test table; The test program set is generated based on the selected test cases.
8. A testing method, characterized in that: The testing method is used for an electronic device, the electronic device is tested by a testing device, and the testing method includes: Controlling the electronic device to obtain a test program set from the test device and generate an operation result based on the test program set, wherein a test table is imported into the test device and the test program set is generated based on the test table; The operation result is fed back to the test device, so that the test device completes the test of the electronic device according to the operation result and automatically generates a test report.
9. A testing device, characterized in that: The testing equipment includes: A generating module, the generating module being configured to receive an imported test table and generate a test program set based on the test table; a loading module, the loading module being used to send the test program set to an electronic device, wherein the electronic device runs according to the test program set and generates an operation result, and the operation result is fed back to the test device through the loading module; A test module is used to complete the test of the electronic device according to the operation result and automatically generate a test report.
10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.