Laser tube testing device

Abstract

The multi-channel laser tube testing device provided by the invention can have efficient aging and parameter testing functions at the same time, a single testing device can load multiple laser tubes at the same time, a driving circuit is matched to independently control the single laser tube, the whole testing device has an active temperature control function, and a heater and a refrigeration sheet are arranged in the device, so that the testing efficiency is improved. Low-temperature and high-temperature aging environments can be provided for the laser tube, and different working temperatures can be set under the condition of photoelectric characteristic parameter measurement.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor lasers, and in particular to a testing device for a laser tube. Background Art

[0002] With the rapid development of semiconductor laser technology, laser tubes using Chip-on-Submount (CoS) packaging have been widely used in laser welding, laser cutting, medical equipment, and consumer electronics due to their small size (e.g., 1.0mm×1.3mm×0.2mm), high power output (a single module can reach over 100W), and excellent beam quality (slow-axis divergence angle as low as 10-12°). Multi-channel synchronous testing has become a key requirement in the research and development, production, and quality control of CoS laser tubes. The production of CoS laser tubes requires multiple rounds of testing, aging, and retesting. Traditional single-channel testing equipment is inefficient and cannot meet the production capacity requirements of large-scale mass production. In addition, for mass-produced products, multiple laser tubes must be tested simultaneously under the same operating conditions to verify the consistency of parameters such as output power, wavelength, and divergence angle, ensuring the performance stability of module-level products.

[0003] In the prior art, for example, a patent application (patent number: CN113492367A) discloses a multi-channel laser tube aging device. Its main structure includes a water-cooled plate, a connecting plate, a workpiece bracket, and a quick clamp. It can clamp 12 lasers at a time, compact them by the quick clamp, and use the water-cooled plate to dissipate heat, thus realizing the multi-channel laser tube aging function. However, the device relies on the water-cooled plate for heat dissipation, but does not provide protection against corrosion resistance, thermal conductivity stability, or electrolyte drying after long-term use of the water-cooled plate material. Similar to the problem of increased ripple caused by aging of electrolytic capacitors in switching power supplies, if the water-cooled plate lacks regular maintenance or the material ages, it may cause a decrease in heat dissipation efficiency, leading to overheating and damage to the laser tube. The device can clamp 12 lasers at a time. If the heat distribution between channels is uneven, it may cause inconsistent aging test conditions for some lasers, affecting the accuracy of the test results. Summary of the Invention

[0004] In view of the deficiencies in the prior art, the present invention provides a test base for a laser tube.

[0005] To achieve the above-mentioned object, the present invention provides a laser tube testing device, comprising the following:

[0006] A base, wherein a heating plate and a TEC cooling plate are arranged in the base; a heat conducting heat sink is arranged on the base;

[0007] A probe assembly includes a probe card base, a probe card detachably mounted on the probe card base, and a plurality of probes arrayed on the probe card;

[0008] The flip mechanism comprises a rotating shaft fixedly connected to the probe card base and a flip handle, wherein the flip handle is pivotally connected to the probe card base via the rotating shaft;

[0009] The flip handle has switchable loading mode and unloading mode: when flipped upward, the probe plate is driven downward to make the probe and the laser tube electrode form electrical contact; when flipped downward, the probe plate is driven upward to separate the probe and the laser tube electrode.

[0010] Preferably, the TEC cooling sheet is embedded in the groove on the top surface of the heat dissipation base, the top surface of the TEC cooling sheet is connected to the bottom surface of the thermal conductive heat sink, the hot surface is in contact with the base, and the cold surface is in contact with the thermal conductive heat sink, so that the heat of the thermal conductive heat sink can be transferred to the base through the TEC cooling sheet.

[0011] Preferably, the heating plate is embedded in the middle groove in the base, and can heat the base.

[0012] Preferably, the probe card is fixed to the probe card base by screw locking, and rotation limit blocks coaxially connected to the rotating shaft are provided on both sides of the probe card base.

[0013] Preferably, the testing device further comprises a temperature sensor, which is arranged on the surface of the heat sink and / or the base, and is used to monitor and provide feedback on the operating temperature of the heat sink and / or the base.

[0014] Preferably, the probe board is provided with a plurality of probe arrays corresponding to the number of laser tube chips.

[0015] Preferably, the base is made of copper or aluminum alloy, and a radial heat dissipation fin structure is provided on the bottom.

[0016] Preferably, a non-slip rubber grip is provided at the end of the flip handle, and both ends of the rotating shaft are rotatably connected to the device bracket through rolling bearings.

[0017] Preferably, the probe board is provided with an output flexible cable, and the flexible cable is connected to the output board of the device to achieve connection to the multi-channel driving circuit.

[0018] Preferably, the probe card further includes a multi-channel electrostatic protection circuit to improve the safety of the laser tube during aging and testing.

[0019] The multi-channel laser tube test device of the present invention can simultaneously perform efficient aging and parameter testing functions. A single test device can simultaneously load multiple laser tubes and, in conjunction with a drive circuit, can independently control a single laser tube. The entire test device has an active temperature control function, with built-in heaters and cooling fins, which can provide low-temperature and high-temperature aging environments for the laser tube. In addition, different operating temperatures can be set when measuring photoelectric characteristic parameters. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] FIG1( a ) is a side view of a laser tube testing device provided by the present invention;

[0021] FIG1( b ) is another side view of a laser tube testing device provided by the present invention. DETAILED DESCRIPTION

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0023] Example 1

[0024] FIG1 (a) is a side view of a laser tube test device provided by the present invention, and FIG1 (b) is another side view of a laser tube test device provided by the present invention. As shown in FIG1 (a) and FIG1 (b), the device includes: a base 101, a heating plate 102, a TEC cooling plate 103, a thermal conductive heat sink 104, a probe plate 105, a probe 106, a flip handle 107, a rotating shaft 108, a probe plate base 109, and an output plate 110.

[0025] The base 101 serves as the fixed foundation for the entire base. Mounting slots are provided on the sides of the base 101. Made of copper or aluminum alloy, the base 101 features a radiating heat sink structure at its bottom. A heating plate and a TEC cooling plate are located within the base 101. The heating plate 102 is embedded in a central groove within the base, heating the base 101 and providing a high-temperature aging environment. The TEC cooling plate 103 is embedded in a groove on the top surface of the base. The top surface of the TEC cooling plate 103 is connected to the bottom surface of the heat sink 104. The hot surface of the TEC cooling plate 103 contacts the base 101, while the cold surface of the TEC cooling plate 103 contacts the heat sink 104, allowing heat from the heat sink 104 to be transferred to the base 101 via the TEC cooling plate 103.

[0026] The heat sink 104 is disposed on the base 101 .

[0027] The probe assembly includes a probe plate base 109, a probe plate 105 detachably mounted on the probe plate base 109, and a plurality of probes 106 arranged in an array on the probe plate 105. The position of the probe 106 on the probe plate 105 corresponds one-to-one to the position of the laser tube sink on the thermal heat sink 104, and can accurately contact the laser tube electrode. The probe plate base 109 is mounted on the thermal heat sink 104 to provide mounting structural support for the probe plate 105. The probe 106 is welded to the probe plate 105, and the lead-out length of the probe 106 just presses the laser tube. The probe plate base 109 is fixedly connected to the rotating shaft 108, and the probe plate 105 is locked to the probe plate base 109 by screws. Rotary limit blocks coaxially connected to the rotating shaft are provided on both sides of the probe plate base 109, which also serve as a limit structure when flipping to avoid damage to the laser tube due to improper force applied by the operator during testing.

[0028] The flip mechanism includes a rotating shaft 108 fixedly connected to the probe card base 109 and a flip handle 107. The flip handle 107 is pivotally connected to the probe card base 109 via the rotating shaft 108. The end of the flip handle 107 is provided with a non-slip rubber grip. The ends of the rotating shaft 108 are rotatably connected to the device bracket via rolling bearings. The flip handle 107 has a switchable loading mode and unloading mode: when flipped upward, it drives the probe card 105 downward to establish electrical contact between the probes 106 and the laser tube electrodes. When flipped downward, it drives the probe card 105 upward to separate the probes 106 from the laser tube electrodes.

[0029] The testing device further includes a temperature sensor (not shown) disposed on the surface of the heat sink and / or the base for monitoring and providing feedback on the operating temperature of the heat sink and / or the base.

[0030] The probe card 105 is provided with an output flexible cable, which is connected to the output board 110 of the device to achieve connection to the multi-channel driving circuit.

[0031] The probe card 105 further includes a multi-channel electrostatic protection circuit (not shown) to improve the safety of the laser tube during the test process.

[0032] The multi-channel laser tube test device of the present invention can simultaneously perform efficient aging and parameter testing functions. A single test device can simultaneously load multiple laser tubes and, in conjunction with a drive circuit, independently control each laser tube. The entire test device has an active temperature control function, with built-in heaters and cooling fins to provide low-temperature and high-temperature aging environments for the laser tube. Furthermore, different operating temperatures can be set when measuring photoelectric characteristic parameters. Conventional test or aging bases that only have heat dissipation functions cannot provide this type of function.

[0033] It should be noted that the technical features in the above embodiments can be combined in any way, and the technical solutions formed by the combination all fall within the scope of protection of this application. In this article, terms such as "including", "comprising" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements includes not only those elements, but also includes other elements that are not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "including a..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0034] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.

Claims

1. A laser tube testing device, characterized in that: include: A base, wherein a heating plate and a TEC cooling plate are arranged in the base; a heat conducting heat sink is arranged on the base; A probe assembly includes a probe card base, a probe card detachably mounted on the probe card base, and a plurality of probes arrayed on the probe card; The flip mechanism comprises a rotating shaft fixedly connected to the probe card base and a flip handle, wherein the flip handle is pivotally connected to the probe card base via the rotating shaft; The flip handle has a switchable loading mode and unloading mode: when flipped upward, the probe plate is driven downward to make the probe electrically contact with the laser tube electrode; when flipped downward, the probe plate is driven upward to separate the probe from the laser tube electrode.

2. The testing device according to claim 1, wherein: The TEC cooling sheet is embedded in the groove on the top surface of the heat dissipation base. The top surface of the TEC cooling sheet is connected to the bottom surface of the thermal conductive heat sink. The hot surface contacts the base, and the cold surface contacts the thermal conductive heat sink, so that the heat of the thermal conductive heat sink can be transferred to the base through the TEC cooling sheet.

3. The testing device according to claim 1, wherein: The heating plate is embedded in the middle groove of the base and can heat the base.

4. The testing device according to claim 1, wherein: The probe plate is fixed to the probe plate base by screw locking, and rotation limit blocks coaxially connected to the rotating shaft are provided on both sides of the probe plate base.

5. The testing device according to claim 1, wherein: The testing device further comprises a temperature sensor, which is arranged on the surface of the heat sink and / or the base and is used to monitor and provide feedback on the operating temperature of the heat sink and / or the base.

6. The testing device according to claim 1, wherein: The probe board is provided with a plurality of probe arrays corresponding to the number of laser tube chips.

7. The testing device according to claim 1, characterized in that The base is made of copper material or aluminum alloy material, and a radiating heat dissipation fin structure is provided at the bottom thereof.

8. The testing device according to claim 1, wherein: The end of the flip handle is provided with a non-slip rubber grip, and both ends of the rotating shaft are rotatably connected to the device bracket through rolling bearings.

9. The testing device according to claim 1, wherein: The probe board is provided with an output flexible cable, which is connected to the output board of the device to achieve connection to the multi-channel driving circuit.

10. The testing device according to claim 1, wherein: The probe board also includes a multi-channel electrostatic protection circuit to improve the safety of the laser tube during the test process.

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