Hard disk aging test method

Abstract

The invention discloses a hard disk aging test method. According to the method, a multi-hard-disk parallel access configuration technology is applied, a computer mainboard expansion interface is connected with a plurality of hard disks through a high-speed adapter plate, and meanwhile, an independent external power supply network is constructed to guarantee power stability. Complex working conditions are simulated through a multi-task synchronous test driving and dynamic load balancing algorithm, task allocation is optimized, and the accuracy of test data is improved. A multi-level fault response mechanism is adopted to process faults in time, and fault diffusion is prevented. The test result is quantitatively evaluated based on the preset multi-dimensional evaluation model, and a scientific basis is provided for hard disk reliability grading. The method effectively solves the problems of low efficiency, poor stability, inaccurate result and the like of a traditional test, and has a wide application prospect in the fields of hard disk production, maintenance, quality inspection and the like.

Description

Technical Field

[0001] The present invention relates to the field of hardware monitoring, and in particular to a hard disk aging testing method. Background Art

[0002] Existing hard drive burn-in testing techniques typically rely on a single computer connected directly to a single hard drive for independent testing, with the computer's power supply providing power and data transmission. With the increasing demand for mass production testing of hard drives, some solutions have attempted to connect multiple drives in parallel, but these approaches still suffer from significant drawbacks. First, regarding data transmission, uneven bandwidth distribution and signal attenuation on the motherboard interface can lead to data transmission conflicts and large latency fluctuations, making it difficult to ensure the synchronous execution of test instructions. Second, regarding the power supply system, reliance on a centralized computer power supply is susceptible to host power supply noise, resulting in large voltage fluctuations (e.g., ripple exceeding 200mV). The load of multiple drives can also lead to power supply overload, impacting test stability. Third, regarding test process control, there is a lack of dynamic load balancing mechanisms, resulting in overall test data deviations caused by individual drive performance differences. Furthermore, fault handling methods are limited, making it difficult to quickly isolate abnormal drives, and overall testing is often interrupted by a single drive failure. Fourth, regarding result evaluation, traditional methods only provide a binary "pass / fail" judgment, lacking quantitative analysis of multi-dimensional indicators such as drive performance retention, error stability, and power consumption consistency, making it difficult to accurately assess drive reliability. The above problems result in the existing technology being unable to meet the testing needs of large-scale production in terms of test efficiency, stability and result accuracy. Summary of the Invention

[0003] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a hard disk aging test method.

[0004] The object of the present invention is achieved through the following technical solutions:

[0005] A hard disk aging test method includes the following steps:

[0006] Multiple hard drive parallel access configuration: The expansion interface of the computer motherboard (such as the PCIe interface) is divided into multiple sub-interfaces through a high-speed adapter board. Each sub-interface corresponds to the data interface of a hard drive (such as the SATA / M.2 interface), forming a star-shaped data transmission network. This enables a single computer to simultaneously identify and drive at least two or more hard drives to be tested.

[0007] Simultaneously deploy an external power supply network independent of the computer power supply, and use the power distribution module to convert the external input power into a voltage suitable for the hard drive (such as 3.3V / 5V / 12V).

[0008] Provide an independent power channel for each hard drive in the form of a parallel circuit to ensure that the power supply status of each hard drive does not interfere with each other and perform tests, and perform graded analysis and processing on the test results.

[0009] Furthermore, the high-speed adapter board has a built-in signal equalization circuit to compensate for signal attenuation during parallel transmission of multiple hard disks. The bandwidth of the motherboard interface is dynamically allocated to each sub-interface through time division multiplexing technology, so that the data read and write instructions of each hard disk can be independently addressed and executed synchronously, avoiding data transmission conflicts.

[0010] Furthermore, the external power supply network includes:

[0011] Isolated power adapter: Converts AC power to high-voltage DC power (e.g., 12V) and uses electromagnetic isolation technology to cut off the ground loop with the computer power supply, thus preventing power supply noise interference.

[0012] Distributed voltage regulation module: An independent DC-DC converter is installed on each hard drive power supply branch to monitor and adjust the output voltage to the target value in real time (with an accuracy of ±1%), ensuring that each hard drive receives a stable and compliant power supply during testing.

[0013] Furthermore, the implementation process of this method also includes: multi-task synchronous test drive: the test software running on the computer side identifies all connected hard disks through the hardware abstraction layer interface and generates independent test threads matching the number of hard disks; each thread sends cyclic read and write tasks to the corresponding hard disk through a standardized instruction set (such as the ATA command set extension protocol). The tasks include continuous high-load data blocks (such as all-0 / all-1 data filling), random address access and error checking instructions, simulating the operation status of the hard disk under long-term complex working conditions.

[0014] Furthermore, the test software has a built-in dynamic load balancing algorithm to monitor the IO response time of each hard disk in real time. When the read and write delay of a hard disk exceeds the baseline value by 15%, the task interval period of the thread is automatically adjusted to ensure that the load intensity of all hard disks remains consistent, avoiding test data deviations caused by performance differences of individual hard disks.

[0015] Furthermore, the implementation process of this method also includes a multi-level fault response mechanism, specifically including:

[0016] Real-time status acquisition: Use hard drive self-monitoring technology (such as the SMART protocol) to obtain each hard drive's sector error count, temperature sensor data, and power input status in real time;

[0017] Fault classification processing: Level 1 warning (such as temporary read error): triggers the automatic retry mechanism, re-executes the failed instruction within 3 cycles, records the exception log but does not interrupt the test;

[0018] Level 2 failure (e.g., five consecutive data verification failures): The software driver disconnects the data link layer connection of the hard drive and marks it as "pending recheck." The test continues on other hard drives.

[0019] Level 3 protection (if hardware overheating exceeds the threshold): The power supply circuit of the hard drive is simultaneously cut off, and an independent report containing a fault code is generated to prevent the fault from spreading to other devices.

[0020] Furthermore, in the fault classification process, the power supply circuit is disconnected by a solid-state relay (SSR) with a response time of ≤100 microseconds, ensuring the physical isolation of the faulty hard disk from the test system while not affecting the power supply stability of other hard disks.

[0021] Furthermore, in the implementation of this method, the test results are quantitatively evaluated: after the test is completed, the data of each hard disk is analyzed based on a preset multi-dimensional evaluation model, which includes:

[0022] Performance retention: Calculates the decay rate of read and write speeds before and after the test, with a weight of 40%;

[0023] Error stability: This counts the frequency of unrecoverable errors (UREs) per unit time, with a weight of 30%;

[0024] Power Consistency: This test monitors the voltage fluctuation amplitude and average current value during operation, with a weight of 30%. This test generates a test report containing scores for each dimension and a comprehensive judgment, which serves as the basis for hard drive reliability grading.

[0025] The beneficial effects of the present invention are:

[0026] (1) Through the multi-hard disk parallel access configuration technology and independent external power supply network technology, the computer motherboard expansion interface is connected to multiple hard disks in a branch manner, and isolated power adapters and distributed voltage regulation modules are deployed to improve test efficiency and enhance test stability. It can not only allow a single computer to drive multiple hard disks for aging testing at the same time, but also avoid power supply noise interference and provide stable and adaptive power for each hard disk;

[0027] (2) By using multi-task synchronous test drive and dynamic load balancing algorithm technology, the complex working conditions of the hard disk are simulated and the task interval is automatically adjusted according to the hard disk performance, which can ensure the accuracy of the test data and effectively reduce the data deviation caused by individual differences of the hard disk;

[0028] (3) Utilize multi-level fault response mechanism technology and preset multi-dimensional evaluation model to quantitatively evaluate test results, collect hard disk status in real time for grading, cooperate with solid-state relays to cut off the power supply circuit of the faulty hard disk, and comprehensively analyze various factors of hard disk performance. This can timely discover and isolate faults, ensure the normal test process, and comprehensively and accurately evaluate hard disk performance, providing a scientific basis for hard disk reliability grading. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 The figure is a flowchart of the steps of a hard disk aging test method. DETAILED DESCRIPTION

[0030] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work shall fall within the scope of protection of the present invention.

[0031] Example 1

[0032] See Figure 1 , provides a hard disk aging test method, the steps comprising:

[0033] Multiple hard drive parallel access configuration: The expansion interface of the computer motherboard is divided into multiple sub-interfaces through a high-speed adapter board. Each sub-interface is connected to the data interface of a hard drive, forming a star-shaped data transmission network. This enables a single computer to simultaneously identify and drive at least two or more hard drives to be tested.

[0034] Simultaneously deploy an external power supply network independent of the computer power supply, and convert the external input power into a voltage suitable for the hard drive through the power distribution module;

[0035] Provide an independent power channel for each hard disk in the form of a parallel circuit to ensure that the power supply status of each hard disk does not interfere with each other and perform tests, and analyze and process the test results.

[0036] The high-speed adapter board has a built-in signal equalization circuit to compensate for signal attenuation when multiple hard drives are transmitting in parallel. It dynamically allocates the bandwidth of the motherboard interface to each sub-interface through time-division multiplexing technology, so that the data read and write instructions of each hard drive can be independently addressed and executed synchronously, avoiding data transmission conflicts.

[0037] The external power supply network includes:

[0038] Isolated power adapter: Converts AC power to high-voltage DC power, and uses electromagnetic isolation technology to cut off the ground loop with the computer power supply to avoid power supply noise interference;

[0039] Distributed voltage regulation module: An independent DC-DC converter is installed on each hard drive power supply branch to monitor and adjust the output voltage to the target value in real time, ensuring that each hard drive receives a stable and compliant power supply during testing.

[0040] The implementation of this method also includes multi-task synchronous test driving: the test software running on the computer side identifies all connected hard drives through the hardware abstraction layer interface and generates independent test threads that match the number of hard drives; each thread sends cyclic read and write tasks to the corresponding hard drive through a standardized instruction set. The tasks include continuous high-load data blocks, random address access and error checking instructions, simulating the operating status of the hard drive under long-term and complex working conditions.

[0041] The test software has a built-in dynamic load balancing algorithm that monitors the IO response time of each hard drive in real time. When the read and write delay of a hard drive exceeds 15% of the baseline value, the task interval period of the thread is automatically adjusted to ensure that the load intensity of all hard drives remains consistent, avoiding test data deviations caused by performance differences of individual hard drives.

[0042] The implementation of this method also includes a multi-level fault response mechanism, including:

[0043] Real-time status collection: Through hard drive self-monitoring, the sector error count, temperature sensor data and power input status of each hard drive are obtained in real time;

[0044] Fault classification processing: Level 1 warning: triggers the automatic retry mechanism, re-executes the failed instruction within the cycle, records the abnormality log but does not interrupt the test;

[0045] Level 2 failure: The data link layer connection of the hard drive is disconnected through software driver, and the hard drive is marked as "pending retest". Other hard drives continue to be tested.

[0046] Level 3 protection: The power supply circuit of the hard drive is simultaneously cut off and an independent report containing a fault code is generated to prevent the fault from spreading to other devices.

[0047] During fault classification processing, the power supply circuit is disconnected through a solid-state relay with a response time of ≤100 microseconds, ensuring the physical isolation of the faulty hard drive from the test system without affecting the power supply stability of other hard drives.

[0048] The implementation of this method also includes:

[0049] Quantitative evaluation of test results: After the test, each hard drive data is analyzed based on a pre-set multi-dimensional evaluation model. The model includes:

[0050] Performance retention: Calculates the decay rate of read and write speeds before and after the test, with a weight of 40%;

[0051] Error stability: This is the frequency of unrecoverable errors within a given unit of time, with a weight of 30%.

[0052] Power Consistency: This test monitors the voltage fluctuation amplitude and average current value during operation, with a weight of 30%. This test generates a test report containing scores for each dimension and a comprehensive judgment, which serves as the basis for hard drive reliability grading.

[0053] Example 2

[0054] This embodiment provides a burn-in test system and method that supports parallel testing of multiple hard drives. Through independent data transmission and power supply design at the hardware level, intelligent task scheduling at the software level, and a multi-level fault response mechanism, efficient and stable batch burn-in testing is achieved. The following details the hardware architecture, software system, test process, and data processing.

[0055] (1) Taking the parallel test of 12 hard disks as an example, the core hardware components include:

[0056] Host system: Utilizes a high-performance industrial-grade motherboard (such as the ASUS Pro WS W480-ACE) equipped with three PCIe 4.0 x8 high-speed interfaces, supporting simultaneous connection of three PCIe adapter boards. Paired with an Intel Xeon W-1270 processor and 32GB of DDR4 memory, this ensures high-speed and stable multi-drive data processing, meeting the computing resource requirements for simultaneous data transmission from 12 hard drives.

[0057] High-speed adapter module: This proprietary PCIe to SATA adapter board (a single card supports 1-to-4 port expansion) is based on a PCIe 4.0 x4 bus design. Each adapter card integrates a TIDS25BR10 signal relay chip, which compensates for signal attenuation during parallel transmission from multiple devices (attenuation is controlled within 3dB), achieving a stable data transfer rate of 4GB / s per interface. By connecting three adapter boards in parallel, the motherboard's three PCIe ports are expanded into 12 SATA 3.0 ports, supporting high-speed data access for 2.5-inch SATA hard drives.

[0058] Independent power supply system: Power adapter: uses an isolated AC220V to DC12V / 50A power supply, and achieves electrical isolation between the mains power and low-voltage DC through a high-frequency transformer (isolation withstand voltage 2.5kV), effectively cutting off the ground loop with the host power supply, eliminating the interference of switching power supply noise on the hard disk, and controlling the output ripple below 50mV.

[0059] Distributed voltage regulation module: Each hard drive power supply branch independently deploys an LM2596S-5.0 DC-DC converter to stably convert the 12V input voltage into a 5V / 4A output (with an accuracy of ±1%). The current in each branch is balanced through current-sharing resistors to ensure that each hard drive receives independent and stable power supply.

[0060] Fault protection components: Each branch is equipped with a 2A fuse and a G3MB-202P solid-state relay (SSR). The SSR response time is ≤50μs and supports zero-crossing trigger protection. When an abnormality is detected, it can quickly cut off the power supply circuit of the faulty hard drive to avoid affecting other devices.

[0061] The test equipment housing is made of acrylic and features a vertical layout of 2 rows and 6 columns of SATA interfaces. It is compatible with 7mm and 9.5mm thick 2.5-inch hard drives and supports hot-swappable operation. The housing is internally EMI-shielded (copper plating thickness ≥ 5μm) to reduce the impact of electromagnetic interference on test data.

[0062] Hardware connection logic: Mains power is converted to 12V DC via an isolated power adapter, then stepped down to 5V by a DC-DC converter in each branch. This voltage is then delivered to the corresponding hard drives via solid-state relays, forming an independent power supply network. The host computer distributes high-speed data signals to the 12 hard drives via a PCIe adapter board, completely decoupling the data transmission and power supply systems, ensuring they do not interfere with each other.

[0063] (2) Software system architecture includes:

[0064] Device management module: This module is used for automatic identification, configuration and real-time status monitoring.

[0065] Automatic Identification and Configuration: Using the operating system's underlying drivers (such as Linux's udev rules), the system scans connected hard drives in real time, automatically analyzing basic information such as manufacturer, model, and capacity, and verifying support for the SMART self-monitoring protocol. Upon connection, a self-test is triggered to check each hard drive's power supply voltage (requires 4.95-5.05V) and data link connectivity (using short packet read and write tests with a response time of ≤10ms and a bit error rate of ≤10^-12) to ensure proper hardware status.

[0066] Real-time status monitoring: The voltage sensor on the adapter board and the hard drive's built-in temperature sensor collect real-time data on each hard drive's supply voltage and surface temperature (sampling frequency 1 time / second). Abnormal data (such as voltage deviation of ±1% or temperature >70°C) immediately triggers an early warning mechanism.

[0067] Task scheduling module: This module is used to drive multi-threaded parallel operations and run dynamic load balancing algorithms.

[0068] Multi-threaded parallel driver: A multi-threaded engine built on the Python concurrency framework creates an independent test thread for each drive (supporting up to 12 threads running simultaneously). The threads issue test tasks using the standard ATA instruction set, including sequential read and write (128KB block size), random read and write (4KB block size), and error checking instructions, simulating the actual operation of the drive under high load.

[0069] Dynamic load balancing algorithm: The I / O response time of each drive is collected every 200ms (obtained using the iostat tool), with the median value used as the baseline. If a drive's response time exceeds the baseline by 15%, the algorithm automatically reduces the number of concurrent tasks in that thread (for example, by reducing the queue depth from 32 to 16). If the response time falls 15% below the baseline, the algorithm increases the task density (for example, by increasing the read / write block size from 64KB to 128KB). This adaptive adjustment ensures that the load balance across the 12 drives remains above 90% (balance is defined as the ratio of minimum IOPS to maximum IOPS).

[0070] Fault handling module: includes a three-level fault classification mechanism, including:

[0071] Level 1 warning (temporary exception): When a temporary error such as a single sector read timeout occurs on the hard drive, the automatic retry mechanism is triggered (up to 3 retries). The exception log is recorded but the test is not interrupted to ensure that accidental failures do not affect the overall process.

[0072] Level 2 failure (functional anomaly): If data verification fails five times in a row (such as a CRC error), the software layer immediately disconnects the data link of the hard drive (resetting the device using the hdparm command), marks it as "pending retest", and generates a detailed log containing the fault code and timestamp. Testing of other hard drives continues.

[0073] Level 3 fault (hardware-level abnormality): When the temperature exceeds 70°C or the voltage fluctuation exceeds ±5%, the hardware layer triggers the solid-state relay through the GPIO signal to disconnect the power supply circuit of the hard disk. The response time is ≤ 100μs, achieving physical isolation and preventing the fault from spreading to other devices or the host system.

[0074] Result Analysis Module: After the test is completed, it is used to perform quantitative analysis on each hard drive data based on the preset multi-dimensional evaluation model.

[0075] Performance Retention: Calculates the read and write speed decay rate before and after the test, with a weight of 40%, reflecting the performance stability of the hard drive under long-term load.

[0076] Error stability: This indicator measures the frequency of unrecoverable errors (UREs) per unit time, converts them into parts per million (ppm), and uses a weight of 30% to assess the reliability of hard drive data transmission.

[0077] Power Consistency: This monitors power supply voltage fluctuations, accounting for 30% of the total score, to ensure the hard drive operates in a stable power supply environment. A score of 80 or higher is considered acceptable, 60-79 requires re-inspection, and <60 is considered unacceptable. This provides a scientific basis for hard drive quality grading.

[0078] (3) Testing process:

[0079] The following is the implementation process of the test (24-hour aging test):

[0080] 3.1 Initialization phase (0-0.5 hours):

[0081] Hardware connection and self-test: Vertically insert 12 hard drives to be tested into the SATA ports on the device panel, ensuring they are fully engaged. Connect the isolated power adapter and observe the indicator lights to confirm proper power supply. Run the system self-test to verify that the host recognizes all 12 hard drives (the corresponding disk devices appear in the device manager). Check the power supply voltage and data link connectivity of each hard drive. Reseat or replace any abnormal devices.

[0082] Test parameter settings, configure the test parameters through the software interface:

[0083] Workload type: A mixed load mode is used, including 70% sequential writes (simulating continuous data storage), 20% random reads (simulating high-frequency data access), and 10% idle state cycles, fully simulating the actual working scenario of the hard drive.

[0084] Duration: Set to run continuously for 24 hours, covering the standard aging time of the hard drive factory test.

[0085] Environmental conditions: The device casing is designed with heat dissipation holes. Combined with room temperature control (25±5°C), the measured hard drive surface temperature is stable below 50°C (monitored in real time by a thermocouple sensor).

[0086] 3.2 Test execution phase (0.5-24 hours):

[0087] Task distribution and real-time monitoring:

[0088] Launch the test software, and 12 test threads simultaneously send ATA commands, driving the hard drives to perform cyclic read and write tasks. The software displays real-time data curves for each drive (read and write speed, error count, temperature, etc.) and color-codes abnormal conditions (red for level 3 failure, yellow for level 2 failure, and blue for normal).

[0089] Dynamic adjustment and fault response:

[0090] When the IOPS fluctuation of a hard disk exceeds 20%, the system automatically adjusts its task parameters (such as queue depth and block size) to ensure that the load intensity of all hard disks is consistent.

[0091] If hard disk HDD07 triggers a level 2 fault (five consecutive write failures), the software immediately highlights the device on the interface, disconnects its data connection, and records the fault log. Other hard disks are not affected and continue testing. If the temperature of HDD12 rises to 75°C (triggering a level 3 fault), the solid-state relay automatically cuts off its power supply circuit, and an alarm prompt pops up on the interface to facilitate quick manual troubleshooting.

[0092] 3.3 Result processing stage (within 24-24.5 hours):

[0093] Data Aggregation and Analysis: After stopping the test, the software automatically generates a raw log file (each drive can be stored independently). The log file contains key parameters such as timestamp, read / write speed, error count, voltage, and temperature. Based on a multi-dimensional evaluation model, the software calculates a comprehensive score for each drive and generates visual performance curves (such as a comparison of read / write speeds before and after the test, and error rate trends).

[0094] Qualification determination and report output: Hard drives are graded based on comprehensive scores:

[0095] Qualified products: no record of level 3 failure and score ≥80 points, can enter the next production stage.

[0096] Products awaiting re-inspection: Scores between 60-79 or ≤ 3 Level 1 warnings, requiring manual review or re-testing.

[0097] Unqualified products with scores less than 60 or triggering a Level 2 or higher failure are marked as scrapped and the cause of the failure is recorded. A PDF test report is generated, including an overall test overview (number of qualified products, failure distribution), detailed data for each drive, and evaluation conclusions, providing data support for quality control.

[0098] The technical advantages of this embodiment include:

[0099] High efficiency: A single device can test 12 hard drives in a single batch, which is 12 times more efficient than traditional single-drive testing and significantly shortens batch testing time. Stability: An independent power supply system combined with signal balancing technology controls power supply ripple below 50mV and data transmission delay fluctuation ≤5%, ensuring a stable and reliable testing process. Intelligent: A dynamic load balancing algorithm automatically adapts to hard drive performance differences, a three-level fault response mechanism enables rapid isolation and precise location of faults, and a multi-dimensional evaluation model provides a quantitative basis for quality judgment.

[0100] It is also compatible and expandable. For example, in terms of hard drive type adaptation, in addition to 2.5-inch SATA hard drives, M.2 NVMe hard drives can be supported by replacing the adapter module (adding NVMe-to-PCIe adapter components), meeting the testing requirements of hard drives with different interface types.

[0101] In automated integration, it can be linked with the robotic arms and sorting systems on the production line to achieve full process automation of "loading-testing-sorting". The test volume in a single shift (8 hours) can reach 36, making it suitable for large-scale hard disk production and testing scenarios.

[0102] This embodiment utilizes a systematic design combining hardware decoupling, intelligent scheduling, and multi-level protection to construct an efficient and stable multi-drive burn-in testing solution. This solution overcomes the limitations of traditional testing methods, achieving comprehensive improvements in test efficiency, stability, and result accuracy. Developed based on mature hardware and standardized protocols, it possesses significant engineering application value and patent protection prospects, and can be widely used in hard drive production, maintenance, and quality inspection.

[0103] This method uses multi-hard drive parallel access configuration technology and independent external power supply network technology to realize the branch connection of multiple hard drives through the computer motherboard expansion interface, deploy isolated power adapters and distributed voltage regulation modules, and achieve the effect of improving test efficiency and enhancing test stability. It can not only enable a single computer to drive multiple hard drives simultaneously for aging testing, but also avoid power supply noise interference and provide stable and adaptive power for each hard drive.

[0104] With the help of multi-task synchronous test drive and dynamic load balancing algorithm technology, complex hard drive working conditions are simulated and task intervals are automatically adjusted according to hard drive performance, which can ensure the accuracy of test data and effectively reduce data deviations caused by individual hard drive differences.

[0105] The test results are quantitatively evaluated by utilizing multi-level fault response mechanism technology and preset multi-dimensional evaluation models. The hard drive status is collected and graded in real time. The power supply circuit of the faulty hard drive is cut off in conjunction with a solid-state relay. Comprehensive analysis of various factors affecting hard drive performance enables timely detection and isolation of faults, ensuring the normal testing process. Furthermore, the system can comprehensively and accurately evaluate hard drive performance, providing a scientific basis for hard drive reliability grading.

[0106] The foregoing description is merely a preferred embodiment of the present invention. It should be understood that the present invention is not limited to the form disclosed herein and should not be construed as excluding other embodiments. Rather, the present invention can be used in various other combinations, modifications, and environments and can be modified within the scope of the concept described herein through the above teachings or techniques or knowledge in the relevant field. Modifications and variations made by those skilled in the art that do not depart from the spirit and scope of the present invention are intended to be protected by the appended claims.

Claims

1. A hard disk aging test method, characterized in that: The following steps are involved: Multiple hard drive parallel access configuration: The expansion interface of the computer motherboard is divided into multiple sub-interfaces through a high-speed adapter board. Each sub-interface is connected to the data interface of a hard drive, forming a star-shaped data transmission network. This enables a single computer to simultaneously identify and drive at least two or more hard drives to be tested. Simultaneously deploy an external power supply network independent of the computer power supply, and convert the external input power into a voltage suitable for the hard drive through the power distribution module; Provide an independent power channel for each hard disk in the form of a parallel circuit to ensure that the power supply status of each hard disk does not interfere with each other and perform tests, and analyze and process the test results.

2. The hard disk aging test method according to claim 1, wherein: The high-speed adapter board has a built-in signal equalization circuit to compensate for signal attenuation during parallel transmission of multiple hard drives. The bandwidth of the motherboard interface is dynamically allocated to each sub-interface through time division multiplexing technology, so that the data read and write instructions of each hard drive can be independently addressed and executed synchronously, avoiding data transmission conflicts.

3. The hard disk aging test method according to claim 1, wherein: The external power supply network includes: Isolated power adapter: Converts AC power to high-voltage DC power, and uses electromagnetic isolation technology to cut off the ground loop with the computer power supply to avoid power supply noise interference; Distributed voltage regulation module: An independent DC-DC converter is installed on each hard drive power supply branch to monitor and adjust the output voltage to the target value in real time, ensuring that each hard drive receives a stable and compliant power supply during testing.

4. A hard disk aging test method according to claim 1, characterized in that: Also includes: Multi-task synchronous test drive: The test software running on the computer identifies all connected hard drives through the hardware abstraction layer interface and generates independent test threads that match the number of hard drives. Each thread sends cyclic read and write tasks to the corresponding hard drive using a standardized instruction set. The tasks include continuous high-load data blocks, random address access, and error checking instructions, simulating the operation of the hard drive under long-term and complex working conditions.

5. The hard disk aging test method according to claim 4, characterized in that: The test software has a built-in dynamic load balancing algorithm that monitors the IO response time of each hard drive in real time. When the read and write delay of a hard drive exceeds the baseline value by 15%, the task interval period of the thread is automatically adjusted to ensure that the load intensity of all hard drives remains consistent, avoiding test data deviations caused by performance differences of individual hard drives.

6. A hard disk aging test method according to claim 1, characterized in that: It also includes a multi-level fault response mechanism, including: Real-time status collection: Through hard drive self-monitoring, the sector error count, temperature sensor data and power input status of each hard drive are obtained in real time; Fault classification processing: Level 1 warning: triggers the automatic retry mechanism, re-executes the failed instruction within the cycle, records the abnormality log but does not interrupt the test; Level 2 failure: The data link layer connection of the hard drive is disconnected through software driver, and the hard drive is marked as "pending retest". Other hard drives continue to be tested. Level 3 protection: The power supply circuit of the hard drive is simultaneously cut off and an independent report containing a fault code is generated to prevent the fault from spreading to other devices.

7. The hard disk aging test method according to claim 6, characterized in that: In the fault classification process, the power supply circuit is cut off by a solid-state relay with a response time of ≤100 microseconds, ensuring the physical isolation of the faulty hard disk from the test system without affecting the power supply stability of other hard disks.

8. A hard disk aging test method according to claim 7, characterized in that: Also includes: Quantitative evaluation of test results: After the test, each hard drive data is analyzed based on a pre-set multi-dimensional evaluation model. The model includes: Performance retention: Calculates the decay rate of read and write speeds before and after the test, with a weight of 40%; Error stability: This is the frequency of unrecoverable errors within a given unit of time, with a weight of 30%. Power Consistency: This test monitors the voltage fluctuation amplitude and average current value during operation, with a weight of 30%. This test generates a test report containing scores for each dimension and a comprehensive judgment, which serves as the basis for hard drive reliability grading.

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