Neutral electrode thermal effect test method and system

Abstract

The application provides a neutral electrode thermal effect test method and system, and relates to the field of neutral electrode detection. A neutral electrode thermal effect test method comprises the following steps: making the neutral electrode abut against the contact unit of one or more of a plurality of test modules; making the contact unit conduct with the corresponding direct connection unit; determining at least part of the plurality of test modules as initial effective test modules; obtaining the abutment safety threshold of the neutral electrode, and selecting at least part of all the initial effective test modules as final effective test modules according to the abutment safety threshold; making the contact unit of the final effective test module conduct with the corresponding human skin impedance unit; obtaining the temperature rise temperature data of each final effective test module after continuously applying a first current to the neutral electrode in a first time period, wherein the thermal effect data comprises the temperature rise temperature data.

Description

TECHNICAL FIELD

[0001] The present application mainly relates to the field of neutral electrode detection, and particularly relates to a neutral electrode thermal effect testing method and system. BACKGROUND

[0002] In an electrosurgical operation, when the high-frequency current returns to the high-frequency generator, the high-frequency current is dispersed on the neutral electrode with a certain area. Therefore, the neutral electrode must meet certain thermal effect indicators.

[0003] In the existing thermal effect indicator detection process, the area of the neutral electrode generally needs to be manually cut so that the abutting area between the neutral electrode and the testing device meets the test conditions. However, this method obviously has the problems that the cutting error is easy to cause the test result to have an error, and the cutting process and the debugging process required to meet the test conditions need to spend a lot of time.

[0004] Therefore, there is an urgent need for a testing method and a testing system that can efficiently and reliably obtain thermal effect data of a neutral electrode. SUMMARY

[0005] The technical problem to be solved by the present application is to provide a neutral electrode thermal effect testing method and system, so as to conveniently and accurately obtain thermal effect data of a neutral electrode.

[0006] To solve the above technical problem, the present application provides a neutral electrode thermal effect testing method, which is suitable for obtaining thermal effect data of a neutral electrode through a plurality of test modules. The test module includes a contact unit, a human skin impedance unit, and a direct connection unit. The human skin impedance unit includes a human skin simulation impedance circuit, and the direct connection unit includes a direct connection lead. The testing method includes: making the neutral electrode abut on the contact unit of one or more of the plurality of test modules; making the contact unit conductive with the corresponding direct connection unit; determining at least part of the plurality of test modules as initial effective test modules; obtaining an abutting safety threshold of the neutral electrode, and selecting at least part of the initial effective test modules as final effective test modules according to the abutting safety threshold; making the contact unit of the final effective test module conductive with the corresponding human skin impedance unit; and obtaining the temperature rise data of each final effective test module after continuously applying a first current to the neutral electrode in a first time period, wherein the thermal effect data includes the temperature rise data.

[0007] Optionally, the step of determining at least part of the plurality of test modules as initial effective test modules further includes: obtaining a first temperature of the test module; obtaining a second temperature of the test module after continuously applying a second current to the neutral electrode in a second time period; and taking the test module with a difference between the second temperature and the first temperature not less than a preset temperature threshold as the initial effective test module.

[0008] Optionally, the preset temperature threshold is not less than 0.1℃.

[0009] Optionally, the abutment safety threshold comprises an abutment area percentage, the abutment safety threshold of the neutral electrode is obtained, and the step of selecting at least part of the initial effective test modules as the final effective test modules according to the abutment safety threshold further comprises: determining the number A of the final effective test modules according to the total number of the initial effective test modules and the abutment area percentage; and selecting A initial effective test modules from all the initial effective test modules as the final effective test modules.

[0010] Optionally, in the step of determining the number A of the final effective test modules according to the total number of the initial effective test modules and the abutment area percentage, the calculation expression of the number A is: , wherein A_min% is the abutment area percentage, N is the total number of the initial effective test modules, is a rounding up operation.

[0011] Optionally, the abutment safety threshold comprises a contact impedance threshold, the abutment safety threshold of the neutral electrode is obtained, and the step of selecting at least part of the initial effective test modules as the final effective test modules according to the abutment safety threshold further comprises: step S421, setting each test module other than the initial effective test modules to an open circuit state; step S422, continuously applying a third current to the neutral electrode within a third time period, and obtaining the total impedance of all the initial effective test modules; and step S423, judging whether a difference ratio of the total impedance and the contact impedance threshold is not greater than a difference threshold, if the result of the judgment is yes, each initial effective test module is selected as a final effective test module, and if the result of the judgment is no, at least one initial effective test module is set to an open circuit state, and step S422 is continuously executed.

[0012] Optionally, the calculation expression of the difference ratio is: Z = |Z_1-Z_max| / Z_max, wherein Z is the difference ratio, Z_1 is the total impedance, Z_max is the contact impedance threshold, and | | is an absolute value operation.

[0013] Optionally, step S422 further comprises: obtaining the impedance voltage and the impedance current corresponding to all the initial effective test modules; and calculating the total impedance according to the impedance voltage and the impedance current.

[0014] Optionally, after continuously applying the first current to the neutral electrode within the first time period, the step of obtaining the temperature rise data of each final effective test module further comprises: obtaining reference temperature data of each final effective test module, wherein the thermal effect data further comprises the reference temperature data.

[0015] Optionally, the thermal effect data further comprises a temperature rise value of each final effective test module, the temperature rise value being a difference between the temperature rise data corresponding to the final effective test module and the reference temperature data.

[0016] To solve the above technical problems, the present application provides a neutral electrode thermal effect test system, the test system being suitable for obtaining thermal effect data of a neutral electrode, the test system comprising: an electronic skin device comprising a plurality of test modules; a constant current device, the constant current device being connected to the neutral electrode and the electronic skin device respectively, the constant current device being configured to continuously apply a first current to the neutral electrode in a first time period; and a host computer, the host computer being configured to obtain a skin contact safety threshold of the neutral electrode, wherein the electronic skin device, the constant current device and the host computer are further configured to determine at least part of the plurality of test modules as initial effective test modules, and select at least part of the initial effective test modules as final effective test modules according to the skin contact safety threshold; the test module comprising: a contact unit, the contact unit being suitable for being in contact with the neutral electrode; a human skin impedance unit, the human skin impedance unit comprising a human skin simulation impedance circuit; a direct connection unit, the direct connection unit comprising a direct connection lead; a switching unit, the switching unit being configured to make the contact unit conductive with the human skin impedance unit, or make the contact unit conductive with the direct connection unit, or make the test module in an open circuit state; and a temperature detection unit, the temperature detection unit being connected to the contact unit, the temperature detection unit being configured to obtain temperature rise data of each final effective test module after the constant current device continuously applies the first current to the neutral electrode in the first time period, wherein the thermal effect data comprises the temperature rise data.

[0017] Optionally, the switching unit comprises a first switch, a second switch and a third switch, one end of the first switch being connected to the contact unit, the other end of the first switch being connected to one end of the second switch and one end of the third switch respectively, the other end of the second switch being connected to the human skin impedance unit, and the other end of the third switch being connected to the direct connection unit.

[0018] Optionally, the constant current device is further configured to continuously apply a second current to the neutral electrode in a second time period; the temperature detection unit is further configured to obtain a first temperature of the test module, and obtain a second temperature of the test module after the constant current device continuously applies the second current to the neutral electrode in the second time period; and the host computer is further configured to select the test module whose difference between the second temperature and the first temperature is not less than a preset temperature threshold as the initial effective test module.

[0019] Optionally, the skin contact safety threshold comprises a contact area percentage, and the host computer is further configured to determine a number A of final effective test modules according to a total number of the initial effective test modules and the contact area percentage, and select A initial effective test modules from all the initial effective test modules as the final effective test modules.

[0020] Optionally, the abutting safety threshold comprises a contact impedance threshold, the constant current device is further configured to continuously apply a third current to the neutral electrode in a third time period; the test system further comprises a sampling device connected to the constant current device, the sampling device and the host computer are configured to acquire a total impedance of all the initial effective test modules when the constant current device continuously applies the third current to the neutral electrode in the third time period; the host computer is configured to determine whether a difference ratio of the total impedance and the contact impedance threshold is not greater than a difference threshold, and if the determination result is yes, each initial effective test module is regarded as a final effective test module.

[0021] Optionally, the temperature detection unit is further configured to acquire reference temperature data of each final effective test module, wherein the thermal effect data further comprises the reference temperature data.

[0022] Compared with the prior art, the present application has the following advantages: the initial effective test module is determined through the conduction between the contact unit and the direct connection unit, so that the test module having an effective abutting relationship with the neutral electrode can be accurately and effectively screened from all the test modules; on the basis of the above, the final effective test module is selected from all the initial effective test modules according to the abutting safety threshold for thermal effect test, so that the physical trimming operation on the neutral electrode can be avoided, the integrity of the neutral electrode structure is ensured, the debugging time is shortened, the manual error possibly caused by the physical trimming operation is reduced, and the accuracy and reproducibility of the detection result are improved. BRIEF DESCRIPTION OF DRAWINGS

[0023] The accompanying drawings are included to provide a further understanding of the present application, and they are collected and constitute a part of the present application, which illustrate the embodiments of the present application, and together with the present specification, play a role in explaining the principles of the present application. In the drawings:

[0024] Figure 1 is a structural block diagram of a test module of an embodiment of the present application;

[0025] Figure 2 is a flowchart of a neutral electrode thermal effect test method of an embodiment of the present application;

[0026] Figure 3 is Figure 2 a flowchart of a sub-step of step S3 in the method;

[0027] Figure 4 is Figure 2 a flowchart of a sub-step of step S4 in the method;

[0028] Figure 5 is a flowchart of a sub-step of step S4 of another embodiment of the present application;

[0029] Figure 6 is Figure 5Flow chart of sub-step of step S422;

[0030] Figure 7 Structure block diagram of the neutral electrode thermal effect test system of an embodiment of the present application;

[0031] Figure 8 is Figure 7 Circuit schematic diagram of the test module; and

[0032] Figure 9 is Figure 7 Schematic diagram of the host computer display interface. DETAILED DESCRIPTION

[0033] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some examples or embodiments of the present application, and for those skilled in the art, the present application can also be applied to other similar scenarios without creative labor. Unless the context clearly indicates otherwise or otherwise stated, the same reference numbers in the drawings represent the same structure or operation.

[0034] As shown in the present application and claims, unless the context clearly indicates otherwise or otherwise stated, "one", "a", "an", and / or "the" do not specifically refer to the singular, but can also include the plural. Generally speaking, the terms "comprise" and "include" only indicate the inclusion of the steps and elements explicitly identified, and these steps and elements do not constitute an exclusive list, and the method or device can also include other steps or elements.

[0035] Unless otherwise specifically stated, the relative arrangement of the components and steps, numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present application. At the same time, it should be understood that the sizes of the various parts shown in the drawings are not drawn in accordance with the actual proportional relationship. The technology, methods and devices known to those skilled in the relevant art can not be discussed in detail, but under appropriate circumstances, the technology, methods and devices should be considered as part of the authorized specification. In all examples shown and discussed here, any specific value should be interpreted as merely exemplary, and not as a limitation. Therefore, other examples of exemplary embodiments can have different values. It should be noted that similar reference numbers and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0036] In the description of the application, it needs to be understood that the orientation words such as "front, back, up, down, left, right", "transverse, vertical, perpendicular, horizontal" and "top, bottom" and the like indicated orientation or position relationship is generally based on the orientation or position relationship shown in the drawings, only for the convenience of describing the application and simplifying the description, without making the opposite statement, these orientation words do not indicate and imply that the device or element referred to must have a particular orientation or be constructed and operated in a particular orientation, therefore, it cannot be understood as a limitation on the scope of protection of the application; the orientation words "inner, outer" refer to the inner and outer of the contour of each component itself.

[0037] For the convenience of description, spatial relative terms such as "over", "above", "upper surface", "upper" and the like can be used herein to describe the spatial positional relationship of one device or feature with other devices or features as shown in the drawings. It should be understood that the spatial relative terms are intended to include different orientations in use or operation in addition to the orientation of the device described in the drawings. For example, if the device in the drawing is inverted, the device described as "above" or "over" other devices or structures will be positioned "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below" orientations. The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein are interpreted accordingly.

[0038] In addition, it needs to be explained that the use of "first", "second" and the like to define parts is only for the convenience of distinguishing the corresponding parts, and the above words have no special meaning unless otherwise stated, therefore, it cannot be understood as a limitation on the scope of protection of the application. In addition, although the terms used in the application are selected from the commonly known and used terms, some terms mentioned in the specification of the application may be selected by the applicant according to his or her judgment, and the detailed meaning of each term is explained in the relevant part of the description. In addition, the application is required to be understood not only by the actual terms used, but also by the meaning implied by each term.

[0039] It will be understood that when a component is referred to as being "on" another component, "connected to" another component, "coupled to" another component, or "contacting" another component, it can be directly on, connected, coupled, or contacting the other component or intervening components can be present. In contrast, when a component is referred to as being "directly on," "directly connected to," "directly coupled to," or "directly contacting" another component, there are no intervening components present. Likeaiy, when a first component is referred to as being "electrically in contact with" or "electrically coupled to" a second component, there is an electrical path between the first component and the second component that allows the flow of electrical current. The electrical path can include capacitors, coupled inductors, and / or other components that allow the flow of electrical current, even if there is no direct contact between conductive components.

[0040] Flow diagrams have been used herein to illustrate the operation of systems in accordance with embodiments of the present application. It will be understood that the operations previously or hereafter described do not necessarily have to be performed in the precise order described. Rather, various steps can be handled in reverse order, or simultaneously. Also, other operations can be added to, or removed from, these processes, or one or more steps can be omitted.

[0041] Embodiment One

[0042] The present embodiment proposes a neutral electrode thermal effect testing method, which is suitable for obtaining thermal effect data of a neutral electrode through a plurality of testing modules. As a preferred embodiment, the thermal effect data in the present embodiment includes temperature rising data; and the present embodiment includes 15*15=225 testing modules arranged in a 15*15 array.

[0043] Firstly referring to Figure 1 The testing module used in the neutral electrode thermal effect testing method is described. As shown in Figure 1 The testing module 11 includes a contact unit 111, a human skin impedance unit 112, and a direct connection unit 113. Specifically, the contact unit 111 in the present embodiment preferably includes a contact surface, which is suitable for abutting against a neutral electrode. In the present embodiment, the effective contact area of each contact surface with a neutral electrode is 1 cm 2When the neutral electrode contacts the area corresponding to the effective contact area, the neutral electrode can transmit the current to the contact unit 111 corresponding to the contact surface. In the embodiment, the human skin impedance unit 112 preferably comprises a human skin simulation impedance circuit, which is adapted to simulate the impedance characteristics of the human skin, and one end of the human skin simulation impedance circuit is grounded. Specifically, in the embodiment, the human skin simulation impedance circuit preferably comprises a resistor and a capacitor, so as to effectively simulate the resistance-capacitance characteristics of the human skin tissue, and thus the human skin simulation impedance circuit can simulate the impedance characteristics of the human skin. In the embodiment, the direct connection unit 113 comprises a direct connection wire, and one end of the direct connection wire is grounded. In addition, the other end of the human skin simulation impedance circuit and the other end of the direct connection wire are respectively connected to the contact unit 111. For the above arrangement, the test module 11 is adapted to make the contact unit 111 conductive with the human skin impedance unit 112, so that the current flowing through the neutral electrode continues to flow through the human skin simulation impedance circuit from the contact surface; or make the contact unit 111 conductive with the direct connection unit 113, so that the current flowing through the neutral electrode continues to flow through the direct connection wire from the contact surface; or make the contact unit 111 not conductive with the human skin impedance unit 112 and the direct connection unit 113 respectively, so that the current flowing through the neutral electrode does not continue to flow into the test module 11, i.e. the test module 11 is in an open circuit state.

[0044] The test module 11 has been briefly described above, and the following will be described with reference to Figure 1 and Figure 2 The neutral electrode thermal effect test method 100 (hereinafter referred to as the test method 100) will be described. As shown in Figure 2 , the test method 100 comprises the following steps. Step S1 is to make the neutral electrode abut against the contact unit 111 of one or more of the plurality of test modules 11. Step S2 is to make the contact unit 111 conductive with the corresponding direct connection unit 113. Step S3 is to determine at least part of the plurality of test modules 11 as initial effective test modules. Further referring to Figure 3 , in the embodiment, step S3 preferably comprises the following sub-steps.

[0045] Step S31 is to obtain the first temperature of the test module 11. In the embodiment, the first temperature is the stable temperature of the test module 11 in the current test environment. For example, after the test module 11 is placed in a constant-temperature test environment for a period of time, it is confirmed that the temperature of the test module 11 no longer changes, and then the temperature is the stable temperature. Step S32 is to obtain the second temperature of the test module 11 after the second current is continuously applied to the neutral electrode for a second time period. For example, after the 1500 mA current is applied to the neutral electrode for 10 s in step S32, the current temperature of the test module 11 is obtained as the second temperature. Step S33 is to select the test module 11 whose difference between the second temperature and the first temperature is not less than a preset temperature threshold as an initial effective test module. The preset temperature threshold is not less than 0.1 °C. In the embodiment, the preset temperature threshold is preferably 0.1 °C. In some embodiments, the preset temperature threshold is preferably 0.5 °C, so that each initial effective test module can be reliably confirmed from all test modules based on less test time, that is, the balance between test efficiency and test accuracy can be achieved.

[0046] It should be noted that after the neutral electrode is attached to the plurality of test modules 11, the test personnel cannot identify the electrical contact state between the neutral electrode and each test module 11 by naked eye, that is, whether the neutral electrode can transmit the current to the corresponding covered test module 11. Therefore, in the embodiment, the second current is applied to the neutral electrode through the above steps, and when the test module 11 has effective electrical contact with the neutral electrode, the test module 11 will generate a certain amount of heat due to the flow of the current. Therefore, by detecting whether the temperature difference change before and after the test module 11 is greater than the preset temperature threshold, it can be confirmed whether each test module 11 has effective electrical contact with the neutral electrode, that is, each initial effective test module having effective electrical contact with the neutral electrode can be accurately selected from all test modules 11, which can effectively improve the accuracy of subsequent detection. On this basis, in the embodiment, the current effective attachment area of the neutral electrode can be determined according to the total number of initial effective test modules and the effective contact area of the contact surface with the neutral electrode. For example, the total number of initial effective test modules is 5, and the effective contact area of the contact surface with the neutral electrode is 1 cm 2 , and the current effective attachment area of the neutral electrode is 5 * 1 cm 2 = 5 cm 2 . It can be understood that even if the neutral electrode does not completely cover the entire contact surface of an initial effective test module, since the neutral electrode has effective electrical contact with the initial effective test module, the effective attachment area of the neutral electrode with the initial effective test module is also 1 cm 2In particular, the above-mentioned calculation method of the current effective contact area is applicable to irregularly shaped neutral electrodes, and compared with manual cutting of such neutral electrodes, the embodiment can obtain an accurate current effective contact area or a corresponding effective electrical contact test module, i.e., an initial effective test module, without being disturbed by irregular shapes.

[0047] It should be further noted that, in the process of determining the initial effective test module, i.e., steps S1-S3, in order to eliminate the influence of the resistance-capacitance characteristics of the human skin simulation impedance circuit on the heating effect of the test module 11, the embodiment makes the contact unit 111 conductive with the corresponding direct connection unit 113 and non-conductive with the corresponding human skin impedance unit 112 by performing step S2, so that the input current of the test module 11 directly flows through the direct connection wire without flowing through the human skin simulation impedance circuit, so that the test module 11 has a significant heating response to the input current, thereby effectively screening the initial effective test module.

[0048] Continuing to refer to Figure 2 , step S4 is to obtain a contact safety threshold of the neutral electrode, and select at least part of the initial effective test modules as final effective test modules according to the contact safety threshold. In the embodiment, the contact safety threshold includes a contact area percentage. Further referring to Figure 4 , step S4 in the embodiment preferably includes the following sub-steps. Step S411 is to determine the number A of final effective test modules according to the total number of initial effective test modules and the contact area percentage. In the embodiment, the calculation expression of the number A is as follows: , wherein A_min% is the contact area percentage, N is the total number of initial effective test modules, is the upward rounding. Step S412 is to select A initial effective test modules from all initial effective test modules as final effective test modules. It should be noted that the application does not limit the rounding in the calculation expression of the number A to be upward rounding, and in some embodiments, downward rounding is used for rounding in the calculation expression of the number A. In the embodiment, A initial effective test modules are selected as final effective test modules from the set of all initial effective test modules according to the position distribution of the initial effective test modules in the array, and the center of the set of all initial effective test modules is diffused outward in sequence. It should be noted that the application does not limit the screening method of the final effective test module, and in some embodiments, the initial effective test module at any position can be selected as the final effective test module in sequence at random, and in some embodiments, the first A initial effective test modules in the array from left to right and then from top to bottom can be selected as the final effective test module.

[0049] It should be noted that different manufacturers of the neutral electrode provide different contact safety thresholds, and some neutral electrodes have a clear contact area percentage, i.e., a minimum contact percentage. It can be understood that for the neutral electrode that does not provide a clear contact safety threshold, the corresponding contact safety threshold is set according to the relevant standards or regulations in the embodiment, for example, the contact safety threshold can be set in the range of 70% to 95%. In addition, some neutral electrodes have a clear contact impedance threshold, i.e., a minimum contact impedance, which will be described in detail in subsequent embodiments.

[0050] According to the above, in the thermal effect detection of the neutral electrode, when the test condition includes the contact safety threshold described above, the current effective contact area of the neutral electrode needs to be adjusted to meet the area corresponding to the contact percentage in the embodiment. It can be understood that if the neutral electrode is taken down again after being contacted and the neutral electrode or the detection device is adjusted, the current effective contact area corresponding to the neutral electrode may change, and multiple adjustments may be required, which may take a lot of time. Therefore, in the embodiment, the final effective test module is directly selected from the initial effective test module according to the contact area percentage, so that the effective contact area of the neutral electrode and all the final effective test modules meets the requirement of the contact area percentage described above, which can reduce the adjustment time and ensure the accuracy of the subsequent detection results.

[0051] With reference to Figure 1 and Figure 2 , step S5 is to make the contact unit 111 of the final effective test module conductive with the corresponding human skin impedance unit 112. It can be understood that in step S5, the contact unit 111 of the final effective test module is only conductive with the corresponding human skin impedance unit 112, and is not conductive with the corresponding direct connection unit 113. Step S5 in the embodiment also includes a step of making each test module 11 other than the final effective test module in an open circuit state, so as to ensure that the neutral electrode does not supply power to the test modules 11 other than the final effective test module, and to avoid the influence of other test modules 11 on the detection result.

[0052] With reference to Figure 2S6 is to obtain the temperature rising data of each of the final effective test modules after the first current is continuously applied to the neutral electrode for the first time period. It should be noted that in some embodiments, the thermal effect data further preferably comprises the reference temperature data, and accordingly in these embodiments, the method further comprises a step of obtaining the reference temperature data of each of the final effective test modules before step S6. Further, in some other embodiments, the thermal effect data further preferably comprises a temperature rising value of each of the final effective test modules, wherein the temperature rising value is the difference between the temperature rising data and the reference temperature data of the corresponding final effective test module. For example, when the thermal effect data comprises the temperature rising value, the stable temperature of each of the final effective test modules under the current test environment is obtained as the reference temperature data before the first current is applied to the neutral electrode, and then the real-time temperature of each of the final effective test modules is obtained as the temperature rising data after the first current is applied to the neutral electrode, and the difference between the temperature rising data and the corresponding reference temperature data is the temperature rising value of the corresponding final effective test module.

[0053] Embodiment Two

[0054] The neutral electrode thermal effect test method in this embodiment is also suitable for obtaining the thermal effect data of the neutral electrode through a plurality of test modules. Compared with Embodiment One, the contact impedance threshold is included in the abutment safety threshold in this embodiment, and the rest is the same and will not be repeated.

[0055] With reference to Figure 1 and Figure 5 , the step of obtaining the abutment safety threshold of the neutral electrode and selecting at least part of the initial effective test modules as the final effective test modules according to the abutment safety threshold in this embodiment, i.e. step S4, preferably comprises the following sub-steps. Step S421 is to set each of the test modules 11 other than the initial effective test modules to an open circuit state. Step S422 is to continuously apply a third current to the neutral electrode for a third time period, and to obtain the total impedance of all the initial effective test modules. For example, in step S422, a current of 1500 mA is applied for 10 ms.

[0056] With reference to Figure 5 and Figure 6 , step S422 comprises the following sub-steps. Step S4221 is to obtain the impedance voltage and the impedance current corresponding to each of the initial effective test modules. Step S4222 is to calculate the total impedance according to the impedance voltage and the impedance current. In this embodiment, the total impedance is the impedance voltage divided by the impedance current. It can be understood that the total impedance is the real impedance of the neutral electrode under effective contact.

[0057] With reference to Figure 5, step S423 is to determine whether the difference ratio of the total impedance and the contact impedance threshold is not greater than the difference threshold, if the determination result is yes, each initial effective test module is set as the final effective test module; if the determination result is no, at least one initial effective test module is set to the open circuit state, and step S422 is continued to be executed. In the embodiment, the calculation expression of the difference ratio is: Z = |Z_1-Z_max| / Z_max, wherein Z is the difference ratio, Z_1 is the total impedance, Z_max is the contact impedance threshold, and || is the absolute value operation. In the embodiment, the difference threshold is preferably 5%, that is, to determine whether the total impedance is within the range of 95% of the contact impedance threshold to 105% of the contact impedance threshold.

[0058] It should be noted that, since different neutral resistors can have different contact impedance thresholds, the existing detection method often depends on multiple models of high-frequency generators, and the corresponding high-frequency generator needs to be selected according to the neutral resistor, so as to obtain the accurate total impedance of the neutral resistor. Obviously, multiple high-frequency generators of different models need to be configured during the detection process, and the accurate total impedance can be obtained only after multiple adjustments or tests. In the embodiment, the total impedance is directly calculated according to the impedance voltage and the impedance current of all initial effective test modules under the current, and the total impedance corresponding to the neutral electrode can gradually approach the required contact impedance threshold by setting part of the initial effective test modules to the open circuit state. In addition, since the debugging process is relatively short (for example, the current is applied for only 10 ms), even if multiple initial effective test modules need to be finally set to the open circuit state, it can be completed in a short time. Obviously, compared with the existing method, it has the advantages of convenience and accuracy.

[0059] Embodiment three

[0060] The embodiment also provides a neutral electrode thermal effect test system 200 (hereinafter referred to as test system 200) as shown in Figure 7 The test system 200 is suitable for obtaining thermal effect data of the neutral electrode. In the embodiment, the thermal effect data includes temperature rise data. Referring to Figure 7 , the test system 200 includes an electronic skin device 10, a constant current device 20, a sampling device 30, an upper computer 40, and a power supply device 50. It should be noted that the further expanded description of the same objects in embodiment one in embodiment three is not repeated.

[0061] Continuing to refer to Figure 7 and Figure 8The electronic skin device 10 comprises a plurality of test modules 11. The test module 11 comprises a contact unit 111, a human skin impedance unit 112, a direct connection unit 113, a temperature detection unit 114 and a switching unit 115. The contact unit 111 comprises a contact surface 1111 adapted to abut against the neutral electrode in the present embodiment. The effective contact area of the contact surface 1111 with the neutral electrode is 1 cm 2 The human skin impedance unit 112 preferably comprises a human skin simulation impedance circuit adapted to simulate the impedance characteristics of human skin, and one end of the human skin simulation impedance circuit is grounded in the present embodiment. Specifically, the human skin simulation impedance circuit preferably comprises a resistor and a capacitor in the present embodiment, so as to effectively simulate the resistance-capacitance characteristics of human skin tissue. The direct connection unit 113 comprises a direct connection lead 1131, and one end of the direct connection lead 1131 is grounded in the present embodiment. It should be noted that the ground of the human skin simulation impedance circuit and the direct connection lead 1131 is the ground of the electronic skin device, which is isolated from the system common ground. The temperature detection unit 114 is connected to the contact unit 111 in the present embodiment. Specifically, the temperature detection unit 114 comprises a temperature sensor 1141 connected to the contact surface 1111. Further, the temperature sensor 1141 is preferably a PT100 thin film platinum resistor with excellent response speed in the present embodiment. It should be noted that the present application does not limit the specific type and model of the temperature sensor. In some embodiments, the temperature sensor is a PT1000 thin film platinum resistor, in some embodiments, the temperature sensor is a thermistor, and in some embodiments, the temperature sensor is a MEMS (Micro-Electro-Mechanical Systems) micro temperature sensor.

[0062] With continued reference to Figure 8In the embodiment, the switching unit 115 is configured to connect the contact unit 111 with the human skin impedance unit 112, or connect the contact unit 111 with the direct connection unit 113, or disconnect the test module 11. Specifically, in the embodiment, the switching unit 115 includes a first switch Q1, a second switch Q2 and a third switch Q3. One end of the first switch Q1 is connected with the contact surface 1111 of the contact unit 111, the other end of the first switch Q1 is connected with one end of the second switch Q2 and one end of the third switch Q3 respectively, the other end of the second switch Q2 is connected with the other end of the human skin simulation impedance circuit of the human skin impedance unit 112, and the other end of the third switch Q3 is connected with the other end of the direct connection wire 1131 of the direct connection unit 113. Through the above arrangement, when the first switch Q1 and the second switch Q2 are both turned on and the third switch Q3 is turned off, the contact unit 111 is connected with the human skin impedance unit 112, so that the current flowing through the neutral electrode continues to flow through the human skin simulation impedance circuit from the contact surface 1111; when the first switch Q1 and the third switch Q3 are turned on, the contact unit 111 is connected with the direct connection unit 113, so that the current flowing through the neutral electrode continues to flow through the direct connection wire 1131 from the contact surface 1111; when the first switch Q1 is turned off, the contact unit 111 is not connected with the human skin impedance unit 112 and the direct connection unit 113 respectively, so that the current flowing through the neutral electrode does not continue to flow into the test module 11, that is, the test module 11 is in a disconnected state. In the embodiment, the first switch Q1, the second switch Q2 and the third switch Q3 are all N-channel MOS transistors (NMOS). It should be noted that the application does not limit the arrangement of the switch, in some embodiments, only the second switch and the third switch can be arranged, and the test module is in a disconnected state by turning off the second switch and the third switch at the same time; in some embodiments, the switch can be arranged on the side close to the ground; in some embodiments, a single-pole multi-throw switch can be used instead of multiple switches.

[0063] With reference back to Figure 7 The constant current device 20 is configured to continuously apply a first current to the neutral electrode in a first time period, continuously apply a second current to the neutral electrode in a second time period, and continuously apply a third current to the neutral electrode in a third time period. In the embodiment, the constant current device 20 includes a high-frequency variable constant current source, and the output characteristics of the high-frequency variable constant current source include: continuously adjustable in a frequency range of 200 kHz-1 MHz, with a resolution of 1 kHz; the output current ranges from 0 mA to 1500 mA, and the ripple coefficient is less than 1%. In the embodiment, the output end of the constant current device 20 is connected with the neutral electrode and the electronic skin device ground end of the electronic skin device 10 respectively, so as to form a complete current loop.

[0064] With reference back to Figure 7The sampling device 30 is connected to the constant current device 20. In the embodiment, the sampling device 30 comprises a Hall effect sensor and an isolated differential amplifier. The Hall effect sensor is used for current sampling of the constant current device 20, and the isolated differential amplifier is used for voltage sampling of the constant current device 20. In the embodiment, the power supply device 50 is used for multi-path isolated power supply for the digital circuit, the analog circuit and the MOS tube driver in the electronic skin device 10, the constant current device 20, the sampling device 30 and the host computer 40.

[0065] The above briefly describes the functions of the devices in the test system 200. Next, the functions of the devices in the test system 200 and the cooperation relationship between the devices are further described by the process of acquiring the thermal effect data of the neutral electrode by using the test system 200. It should be noted that in the embodiment, the power supply device 50 only plays a power supply role, and the subsequent description is not repeated.

[0066] The test system 200 performs a pre-detection operation. Specifically, the electronic skin device 10, the constant current device 20 and the host computer 40 determine at least part of the plurality of test modules 11 as initial effective test modules. In this process, the neutral electrode is attached to the contact unit 111 of one or more of the plurality of test modules 11, each temperature detection unit 114 acquires the first temperature of the corresponding test module 11, and the host computer 40 controls the first switch Q1 and the third switch Q3 of each test module 11 to be conductive through a control signal, so that each contact unit 111 is conductive with the corresponding direct connection unit 113. Subsequently, the constant current device 20 continuously applies the second current to the neutral electrode in a second time period. Then, each temperature detection unit 114 acquires the second temperature of the corresponding test module 11. Finally, the host computer 40 determines the test module 11 whose difference between the second temperature and the first temperature is not less than a preset temperature threshold as an initial effective test module.

[0067] The test system 200 performs a matching operation. Specifically, by means of the electronic skin device 10, the constant current device 20 and the host computer 40, at least part of all initial effective test modules is selected as a final effective test module according to the contact safety threshold. When the contact safety threshold input by the operator to the host computer 40 includes a contact area percentage, the corresponding process is as follows: the host computer 40 determines the number A of final effective test modules according to the total number of initial effective test modules and the contact area percentage, and then the host computer 40 selects A initial effective test modules from all initial effective test modules as final effective test modules. When the contact safety threshold input by the operator to the host computer 40 includes a contact impedance threshold, the corresponding process is as follows: first, the constant current device 20 continuously applies a third current to the neutral electrode in a third time period, and the sampling device 30 and the host computer 40 acquire the total impedance of all initial effective test modules during this period. Specifically, the sampling device 30 takes the sampling result of the current sampling as the impedance current of all initial effective test modules, and takes the sampling result of the voltage sampling as the impedance voltage of all initial effective test modules, and the host computer 40 divides the received impedance voltage by the received impedance current to calculate the total impedance. Then, the host computer 40 judges whether the difference ratio of the total impedance and the contact impedance threshold is not greater than the difference threshold, if the judgment result is yes, each initial effective test module is taken as a final effective test module, if the judgment result is no, the host computer 40 sets at least one initial effective test module to an open circuit state through a control signal. By continuously reducing the total number of initial effective test modules, the difference ratio of the total impedance and the contact impedance threshold is not greater than the difference threshold, and then the final effective test module is obtained.

[0068] The test system 200 performs a detection operation. In this process, first, the constant current device 20 continuously applies a first current to the neutral electrode in a first time period. Then, the temperature detection unit acquires the temperature rise data of each final effective test module. Finally, the host computer 40 receives the temperature rise data of each final effective test module, wherein the thermal effect data includes all temperature rise data.

[0069] It should be noted that in some embodiments, the thermal effect data further comprises reference temperature data, and correspondingly, the temperature detection unit of the final effective test module further acquires reference temperature data of the final effective test module before the constant current device continuously applies the first current to the neutral electrode in the first time period. In some embodiments, the thermal effect data further preferably comprises a temperature rise value of each final effective test module, wherein the temperature rise value is the difference between the corresponding temperature rise temperature data and the reference temperature data of the final effective test module. In some embodiments, the thermal effect data comprises average temperature rise data, maximum temperature rise data, and current impedance data. The average temperature rise data is the average of all temperature rise values, the maximum temperature rise data is the maximum value among all temperature rise values, and the current impedance data is the real-time total impedance. In some embodiments, the host computer is further configured to display, through the display interface, each final effective test module in the array of test modules, the average temperature rise data, the maximum temperature rise data, and the current impedance data to an operator. As shown in FIG. 4, the display interface 41 of the host computer comprises a test module array display area 411, an average temperature rise display area 412, a maximum temperature rise display area 413, and a current impedance display area 414. The test module array display area 411 is adapted to display the positions of each final effective test module 4111 and each remaining test module 4112 in the array through square images with different colors, the average temperature rise display area 412 is adapted to display the average temperature rise data, the maximum temperature rise display area 413 is adapted to display the maximum temperature rise data, and the current impedance display area 414 is adapted to display the current impedance data. Figure 9

[0070] The above description has been made to the basic concept, and it is obvious that the above application disclosure is only used as an example and does not constitute a limitation on the application. Although it is not explicitly stated here, those skilled in the art can make various modifications, improvements and corrections to the application. Such modifications, improvements and corrections are suggested in the application, so such modifications, improvements and corrections still belong to the spirit and scope of the exemplary embodiments of the application.

[0071] Meanwhile, specific words are used in the application to describe the embodiments of the application. As "one embodiment", "an embodiment", and / or "some embodiments" means a certain feature, structure or characteristic related to at least one embodiment of the application. Therefore, it should be emphasized and noted that the "an embodiment" or "one embodiment" or "an alternative embodiment" mentioned in different positions in the specification does not necessarily refer to the same embodiment. In addition, some features, structures or characteristics in one or more embodiments of the application can be properly combined.

[0072] ​For simplicity and to help with understanding of one or more embodiments of the application, the description of embodiments of the application above sometimes refers to a combination of features in one embodiment, drawing, or description of an embodiment. This method of disclosure is not to be interpreted as reflecting an intention that the application requires more features than are explicitly mentioned in each claim. Indeed, reference to

[0073] In some embodiments, numbers that describe amounts, quantities, or dimensions are used. It should be understood that such numbers used in the description of embodiments are approximations and can vary. Unless otherwise stated, the numerical values set forth in the specific examples and preferred embodiments are approximations that can vary. In some embodiments, the numbers used in the specification and claims have been determined to the nearest one-hundredth based on one-hundred. In some embodiments, the numerical values set forth in the specific examples and preferred embodiments can vary from the stated values.

[0074] While the application has been described with reference to the currently preferred embodiments, those skilled in the art will recognize that changes can be made within the spirit of the application. For example, but not by way of limitation, the above description has been made with reference to a number of specific embodiments. It is to be understood that no limitation of the scope of the application is intended. It is further understood that the drawings are not intended to limit the concepts described herein to the specific arrangements shown, and that he concepts can be carried out in other ways.

Claims

1. A method of testing the thermal effects of a neutral electrode, characterized by, The test method is suitable for obtaining thermal effect data of a neutral electrode through a plurality of test modules, the test modules including a contact unit, a human skin impedance unit containing a human skin simulation impedance circuit, and a direct connection unit containing a direct connection lead, and the test method comprising: abutting the neutral electrode against the contact unit of one or more of the plurality of test modules; conducting the contact unit and the corresponding direct connection unit; determining at least part of the plurality of test modules as initial effective test modules; obtaining an abutting safety threshold of the neutral electrode, and selecting at least part of the initial effective test modules as final effective test modules according to the abutting safety threshold; conducting the contact unit of the final effective test module and the corresponding human skin impedance unit; after continuously applying a first current to the neutral electrode for a first time period, obtaining temperature rise data of each of the final effective test modules, wherein the thermal effect data includes the temperature rise data.

2. The method of claim 1, wherein the neutral electrode thermal effect test is performed at a temperature of 20°C to 30°C. The step of determining at least part of the plurality of test modules as initial effective test modules further comprises: obtaining a first temperature of the test module; after continuously applying a second current to the neutral electrode for a second time period, obtaining a second temperature of the test module; the test module with a difference between the second temperature and the first temperature not less than a preset temperature threshold is determined as the initial effective test module.

3. The method of claim 2, wherein the neutral electrode thermal effect test is performed by applying a voltage of 1000 volts to the neutral electrode for 10 seconds. The preset temperature threshold is not less than 0.1°C.

4. The method of claim 1, wherein the neutral electrode thermal effect test is performed by applying a voltage of 1000 volts to the neutral electrode for 10 seconds. The abutting safety threshold includes an abutting area percentage, and the step of obtaining the abutting safety threshold of the neutral electrode and selecting at least part of the initial effective test modules as final effective test modules according to the abutting safety threshold further comprises: determining the number A of final effective test modules according to the total number of initial effective test modules and the abutting area percentage; selecting A initial effective test modules from all the initial effective test modules as final effective test modules.

5. The method of claim 4, wherein the neutral electrode thermal effect test is performed by applying a voltage of 1000 volts to the neutral electrode for 10 seconds. In the step of determining the number A of final effective test modules according to the total number of initial effective test modules and the abutting area percentage, the calculation expression of the number A is: ， where A_min% is the percent of the contact area, N is the total number of initial active test modules, is rounded up.

6. The method of claim 1, wherein the neutral electrode thermal effect test is performed by applying a voltage of 1000 volts to the neutral electrode for 10 seconds. The abutting safety threshold includes a contact impedance threshold, and the step of obtaining the abutting safety threshold of the neutral electrode and selecting at least part of the initial effective test modules as final effective test modules according to the abutting safety threshold further comprises: Step S421, setting each of the test modules other than the initial effective test modules to an open circuit state; Step S422, continuously applying a third current to the neutral electrode for a third time period, and obtaining the total impedance of all the initial effective test modules; Step S423, judging whether the difference ratio of the total impedance and the contact impedance threshold is not greater than a difference threshold, if the judgment result is yes, each of the initial effective test modules is set as the final effective test module; if the judgment result is no, at least one of the initial effective test modules is set to be in an open circuit state, and the step S422 is continuously executed.

7. The method of claim 6, wherein the neutral electrode thermal effect test is performed by applying a voltage of 1000 volts to the neutral electrode for 10 seconds. The calculation expression of the difference ratio is: Z = |Z_1-Z_max| / Z_max, In the formula, Z is the difference ratio, Z_1 is the total impedance, Z_max is the contact impedance threshold, and || is an absolute value operation.

8. The neutral electrode thermal effect test method of claim 6, wherein, The step S422 further includes: Obtaining the impedance voltage and the impedance current corresponding to all the initial effective test modules; Calculating the total impedance according to the impedance voltage and the impedance current.

9. The method of claim 1, wherein the neutral electrode thermal effect test is performed at a temperature of 20°C to 30°C. Before the step of obtaining the temperature rise data of each of the final effective test modules after the first current is continuously applied to the neutral electrode in the first time period, the step S422 further includes: Obtaining the reference temperature data of each of the final effective test modules, wherein the thermal effect data further includes the reference temperature data.

10. The method of claim 9, wherein the neutral electrode thermal effect test is performed by applying a voltage of 1000 volts to the neutral electrode for 10 seconds. The thermal effect data further includes the temperature rise value of each of the final effective test modules, and the temperature rise value is the difference between the temperature rise data and the reference temperature data corresponding to the final effective test module.

11. A neutral electrode thermal effect test system, characterized by, The test system is suitable for obtaining thermal effect data of a neutral electrode, and the test system includes: An electronic skin device including a plurality of test modules; A constant current device connected to the neutral electrode and the electronic skin device respectively, and configured to continuously apply a first current to the neutral electrode in a first time period; and A host computer configured to obtain a safe contact threshold of the neutral electrode, Wherein the electronic skin device, the constant current device and the host computer are further configured to determine at least part of the plurality of test modules as initial effective test modules, and select at least part of the initial effective test modules as final effective test modules according to the safe contact threshold; The test module includes: A contact unit suitable for contacting the neutral electrode; A human skin impedance unit including a human skin simulation impedance circuit; A direct connection unit including a direct connection wire; A switching unit configured to make the contact unit conduct with the human skin impedance unit, or make the contact unit conduct with the direct connection unit, or make the test module in an open circuit state; and A temperature detection unit connected to the contact unit, and configured to obtain temperature rise data of each of the final effective test modules after the constant current device continuously applies the first current to the neutral electrode in the first time period, wherein the thermal effect data includes the temperature rise data.

12. The neutral electrode thermal effect test system of claim 11, wherein, The switching unit comprises a first switch, a second switch and a third switch, one end of the first switch is connected with the contact unit, the other end of the first switch is connected with one end of the second switch and one end of the third switch respectively, the other end of the second switch is connected with the human skin impedance unit, and the other end of the third switch is connected with the direct connection unit.

13. The neutral electrode thermal effect test system of claim 11, wherein, The constant current device is further configured to continuously apply a second current to the neutral electrode in a second time period; The temperature detection unit is further configured to obtain a first temperature of the test modules, and obtain a second temperature of the test modules after the constant current device continuously applies the second current to the neutral electrode in the second time period; The host computer is further configured to take the test modules with a difference between the second temperature and the first temperature not less than a preset temperature threshold as the initial effective test modules.

14. The neutral electrode thermal effect test system of claim 11, wherein, The contact security threshold comprises a contact area percentage, and the host computer is further configured to determine a number A of the final effective test modules according to a total number of the initial effective test modules and the contact area percentage, and select A initial effective test modules from all the initial effective test modules as the final effective test modules.

15. The neutral electrode thermal effect test system of claim 11, wherein, The contact security threshold comprises a contact impedance threshold, and the constant current device is further configured to continuously apply a third current to the neutral electrode in a third time period; The test system further comprises a sampling device connected with the constant current device, and the sampling device and the host computer are configured to obtain total impedances of all the initial effective test modules when the constant current device continuously applies the third current to the neutral electrode in the third time period. The host computer is configured to determine whether a difference ratio of the total impedances and the contact impedance threshold is not greater than a difference threshold, and if the determination result is yes, take each of the initial effective test modules as the final effective test module.

16. The neutral electrode thermal effect test system of claim 11, wherein, The temperature detection unit is further configured to obtain reference temperature data of each of the final effective test modules, and the thermal effect data further comprises the reference temperature data. The temperature detection unit is further configured to obtain reference temperature data of each of the final effective test modules, and the thermal effect data further comprises the reference temperature data.

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