Spectrometer wavelength calibration method, device, equipment and medium

Abstract

The invention provides a spectrograph wavelength calibration method, device and equipment and a medium, and the method comprises the steps: obtaining the spectral data of a spectrograph at different temperatures, and obtaining the spectral data of the spectrograph at different temperatures according to the pixel positions of a characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at a preset reference temperature; determining the pixel position offset of the characteristic wavelength point at different temperatures, and calibrating the wavelength of the spectrograph according to the pixel position offset of the characteristic wavelength point at different temperatures; in the process of calibrating the wavelength of the spectrograph, the wavelength drift caused by the pixel position offset of the characteristic wavelength point at different temperatures is fully considered, the output error of the wavelength of the spectrograph is reduced, and the wavelength output accuracy of the spectrograph is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of signal detection and processing, and particularly relates to a spectrometer wavelength calibration method, device, equipment and medium. BACKGROUND

[0002] In use, a spectrometer is affected by environmental temperature changes, so that optical devices are deformed due to thermal expansion and contraction, and the spectrum is changed due to the deformation of the optical devices, that is, the spectrum has temperature drift, so that the correspondence between the spectrum wavelength and the detector pixel position is inaccurate, which affects the use and detection accuracy of the spectrometer.

[0003] The spectrometer wavelength calibration method in the related art only calibrates the relationship between the spectrum wavelength at a certain temperature and the detector pixel position, without considering the influence of temperature changes on wavelength drift, so that the wavelength accuracy error is large when used at different environmental temperatures, which affects the accuracy of the wavelength output of the spectrometer.

[0004] Therefore, it is necessary to improve the spectrometer wavelength calibration method in the related art. SUMMARY

[0005] In view of the above-mentioned defects of the prior art, the present application provides a spectrometer wavelength calibration method, device, equipment and medium to solve the technical problem of large wavelength accuracy error and affecting the accuracy of the output wavelength of the spectrometer.

[0006] According to an aspect of an embodiment of the present application, a spectrometer wavelength calibration method is provided, the method comprising: obtaining spectrum data formed by a spectrometer at different temperatures; the spectrum data comprising: a characteristic wavelength point, a pixel position of the characteristic wavelength point at different temperatures; determining a pixel position offset of the characteristic wavelength point at different temperatures according to the pixel position of the characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at a preset reference temperature; and calibrating the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures.

[0007] In an embodiment of the present application, the process of determining the pixel position offset of the characteristic wavelength point at different temperatures according to the pixel position of the characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at a preset reference temperature comprises: selecting a temperature value as a target temperature value in turn; and taking the difference between the pixel position of the characteristic wavelength point at each target temperature value and the pixel position of the characteristic wavelength point at a preset reference temperature as the pixel position offset of the characteristic wavelength point at different temperature values.

[0008] In an embodiment of the present application, the process of calibrating the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures comprises: determining a functional relationship between the temperature variable and the pixel position offset variable based on the pixel position offset of the characteristic wavelength point at different temperatures; correcting a first preset conversion relationship between the pixel position variable and the spectral wavelength according to the functional relationship to obtain a revised conversion relationship, so as to output the calibration wavelength of the spectrometer when the real-time temperature value and the real-time pixel position are input into the revised conversion relationship.

[0009] In an embodiment of the present application, the expression of the revised conversion relationship comprises: λ(x, T) = a0 + a1*(x - b0(T) - b1(T)*x) + a2*(x - b0(T) - b1(T)*x) 2 + a3*(x - b0(T) - b1(T)*x) 3 wherein λ(x, T) represents the calibration wavelength variable, a0,..., a3 represent the wavelength calibration coefficients at the preset reference temperature, b0(T) represents the constant term coefficient of the pixel position offset, b1(T) represents the first term coefficient of the pixel position offset, T represents the temperature variable, and x represents the pixel position variable.

[0010] In an embodiment of the present application, the process of determining the functional relationship between the temperature variable and the pixel position offset variable based on the pixel position offset of the characteristic wavelength point at different temperatures comprises: obtaining a second preset conversion relationship between the temperature variable and the pixel position offset variable, and selecting a preset number of characteristic wavelength points as target wavelength points; fitting the pixel position offset of the target wavelength points at different temperatures to obtain a fitting relationship between the target wavelength points and the temperature variable and the pixel position offset variable; and solving the coefficients in the second preset conversion relationship according to the fitting relationship between the target wavelength points and the temperature variable and the pixel position offset variable to obtain the functional relationship.

[0011] In an embodiment of the present application, the expression of the fitting relationship is as follows: Δx(T) = m0 + m1*ΔT + m2*ΔT 2 wherein Δx(T) represents the pixel position offset variable of the target wavelength point, m0 represents the constant term fitting coefficient, m1 represents the first term fitting coefficient, m2 represents the second term fitting coefficient, ΔT represents the time interval, and T represents the temperature variable.

[0012] In an embodiment of the present application, before the spectral data formed by the spectrometer at different temperatures is acquired, the method further comprises: placing the spectrometer in an experimental environment, the initial temperature of the experimental environment being the preset reference temperature; controlling the spectrometer to work at the preset reference temperature to obtain spectral power distribution data of the spectrometer; the spectral power distribution data comprising: pixel positions of the characteristic wavelength points at the preset reference temperature; adjusting the temperature of the experimental environment according to a preset growth threshold, and controlling the spectrometer to work at different temperatures, and recording the characteristic wavelength points and the pixel positions of the characteristic wavelength points at different temperatures; taking the characteristic wavelength points and the pixel positions of the characteristic wavelength points at different temperatures as the spectral data.

[0013] According to an aspect of an embodiment of the present application, a spectrometer wavelength calibration device is provided, comprising: a data acquisition module configured to acquire spectral data formed by a spectrometer at different temperatures; the spectral data comprising: characteristic wavelength points and pixel positions of the characteristic wavelength points at different temperatures; an offset determination module configured to determine pixel position offsets of the characteristic wavelength points at different temperatures according to the pixel positions of the characteristic wavelength points at different temperatures and pixel positions of the characteristic wavelength points at a preset reference temperature; and a wavelength calibration module configured to calibrate wavelengths of the spectrometer according to the pixel position offsets of the characteristic wavelength points at different temperatures.

[0014] According to an aspect of an embodiment of the present application, an electronic device is provided, comprising: one or more processors; a storage device configured to store one or more programs, which, when executed by the one or more processors, cause the electronic device to implement the spectrometer wavelength calibration method as described above.

[0015] According to an aspect of an embodiment of the present application, a readable storage medium having computer readable instructions stored thereon is provided, which, when executed by a processor of a computer, cause the computer to execute the spectrometer wavelength calibration method as described above.

[0016] The present application has the following beneficial effects: the present application acquires spectral data formed by a spectrometer at different temperatures, determines pixel position offsets of characteristic wavelength points at different temperatures according to the pixel positions of the characteristic wavelength points at different temperatures and pixel positions of the characteristic wavelength points at a preset reference temperature, and calibrates wavelengths of the spectrometer according to the pixel position offsets of the characteristic wavelength points at different temperatures. In the process of calibrating the wavelengths of the spectrometer, the wavelength drift caused by the pixel position offsets of the characteristic wavelength points at different temperatures is fully considered, the output error of the wavelengths of the spectrometer is reduced, and the accuracy of the wavelength output of the spectrometer is improved.

[0017] It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application, as claimed. BRIEF DESCRIPTION OF DRAWINGS

[0018] The accompanying drawings, which are incorporated herein and form a part of the specification, illustrate embodiments consistent with the present application and, together with the description, further serve to explain the principles of the application. It is to be understood that the drawings are designed solely for purposes of illustration to be used in conjunction with the following detailed description.

[0019] Figure 1 is a schematic diagram of an exemplary system architecture according to an exemplary embodiment of the present application;

[0020] Figure 2 is a flowchart of a method of wavelength calibration of a spectrometer according to an exemplary embodiment of the present application;

[0021] Figure 3 is a flowchart of a method of wavelength calibration of a spectrometer according to another exemplary embodiment of the present application;

[0022] Figure 4 is a schematic diagram of temperature drift of a spectral curve according to an exemplary embodiment of the present application;

[0023] Figure 5 is a block diagram of a wavelength calibration device of a spectrometer according to an exemplary embodiment of the present application;

[0024] Figure 6 is a schematic diagram of a computer system of an electronic device according to an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0025] Those skilled in the art will readily observe that the application described herein with respect to the following illustrative examples can be applied to other situations without departing from the spirit or scope of the application. The present application can also be embodied in other specific forms without departing from its spirit or essential characteristics. The described implementations are to be considered in all respects only as illustrative and not restrictive and the scope of the application to be indicated by the appended claims rather than by the foregoing description. All combinations of the features described herein can be implemented without departing from the scope of the application.

[0026] It is also noted that the functional blocks and modules in the following embodiments are merely schematic and are not intended to limit the scope of the application. The actual implementation of the functional blocks and modules can vary significantly depending on the specific design.

[0027] In the following description, numerous specific details are discussed in order to provide a thorough explanation of the embodiments of the present application. However, it will be apparent to one of ordinary skill in the art that the embodiments of the present application can be practiced without these specific details. In other instances, well-known structures and devices are not described in detail in order to avoid obscuring the embodiments of the present application.

[0028] Figure 1 is a schematic diagram of an exemplary system architecture shown by an exemplary embodiment of the present application.

[0029] Referring to Figure 1 As shown in the figure, the system architecture can include a storage device 101 and a computer device 102. The computer device 102 can be at least one of a desktop graphic processing unit (GPU) computer, a GPU computing cluster, a neural network computer, etc. The computer device 102 can be used by a person skilled in the art to obtain spectral data formed by a spectrometer at different temperatures, determine a pixel position offset of a characteristic wavelength point at different temperatures according to a pixel position of the characteristic wavelength point at different temperatures and a pixel position of the characteristic wavelength point at a preset reference temperature, and calibrate a wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures. The storage device 101 is configured to store the spectral data formed by the spectrometer at different temperatures and provide the spectral data to the computer device 102 for processing.

[0030] Illustratively, after obtaining the spectral data in the storage device 101, the computer device 102 determines the pixel position offset of the characteristic wavelength point at different temperatures according to the pixel position of the characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at the preset reference temperature, and calibrates the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures. In the process of calibrating the wavelength of the spectrometer, the wavelength drift caused by the pixel position offset of the characteristic wavelength point at different temperatures is fully considered, the output error of the wavelength of the spectrometer is reduced, and the accuracy of the wavelength output of the spectrometer is improved.

[0031] It should be noted that the spectrometer wavelength calibration method provided by the embodiments of the present application is generally executed by the computer device 102, and accordingly, the spectrometer wavelength calibration apparatus is generally provided in the computer device 102.

[0032] The implementation details of the technical solutions of the embodiments of the present application are described in detail as follows:

[0033] Figure 2is a flowchart of a spectrometer wavelength calibration method shown in an example embodiment of the present application, which can be executed by a computing processing device, which can be the computer device 102 shown in Figure 2 FIG. 1. Referring to FIG. 2 shown, Figure 2 The spectrometer wavelength calibration method includes at least steps S210 to S230, which are described in detail as follows:

[0034] In step S210, spectral data formed by the spectrometer at different temperatures is acquired. In an embodiment of the present application, the spectral data includes characteristic wavelength points and pixel positions of the characteristic wavelength points at different temperatures. After the spectral data is obtained, the spectral data is displayed in the form of a spectral curve, so as to facilitate selection of the characteristic wavelength points from the spectral curve and acquisition of the pixel positions of the characteristic wavelength points at different temperatures.

[0035] In step S220, pixel position offsets of the characteristic wavelength points at different temperatures are determined according to the pixel positions of the characteristic wavelength points at different temperatures and the pixel position of the characteristic wavelength points at a preset reference temperature. In an embodiment of the present application, the process of determining the pixel position offsets of the characteristic wavelength points at different temperatures according to the pixel positions of the characteristic wavelength points at different temperatures and the pixel position of the characteristic wavelength points at a preset reference temperature includes: selecting a temperature value as a target temperature value in sequence; and taking a difference between the pixel position of the characteristic wavelength points at each target temperature value and the pixel position of the characteristic wavelength points at the preset reference temperature as the pixel position offset of the characteristic wavelength points at the different temperature value.

[0036] In step S230, the wavelength of the spectrometer is calibrated according to the pixel position offsets of the characteristic wavelength points at different temperatures. In an embodiment of the present application, in the process of calibrating the wavelength of the spectrometer, the wavelength drift caused by the pixel position offsets of the characteristic wavelength points at different temperatures is fully considered, so as to reduce the output error of the wavelength of the spectrometer and improve the accuracy of the wavelength output of the spectrometer.

[0037] In an embodiment of the present application, the process of determining the pixel position offsets of the characteristic wavelength points at different temperatures according to the pixel positions of the characteristic wavelength points at different temperatures and the pixel position of the characteristic wavelength points at a preset reference temperature includes:

[0038] selecting a temperature value as a target temperature value in sequence. In an embodiment of the present application, the temperature range in which the spectrometer works is [T L , T H ], and a preset growth threshold is taken as a temperature interval to determine different temperature values in which the spectrometer works, that is, the calculation formula of the temperature value is as follows:

[0039] T=T L+ ΔT*k Equation (1)

[0040] wherein T represents a temperature variable, T L represents a minimum value of a temperature range, ΔT represents a temperature interval, and k represents a positive integer, for example, 1, 2, 3,..., T H represents a maximum value of a temperature range.

[0041] The difference between the pixel position of the characteristic wavelength point at each target temperature value and the pixel position of the characteristic wavelength point at the preset reference temperature is taken as the pixel position offset of the characteristic wavelength point at different temperature values. In an embodiment of the present application, the calculation formula of the pixel position offset is as follows:

[0042] Δx(λ i ,T)=x(λ i ,T)-x(λ i ,T L ) Equation (2)

[0043] wherein Δx(λ i ,T1) represents the pixel position offset of the characteristic wavelength point λ i at the temperature variable T1, x(λ i ,T) represents the pixel position of the characteristic wavelength point λ i at the temperature variable T, and x(λ i ,T L ) represents the pixel position of the characteristic wavelength point λ i at the temperature variable T.

[0044] In an embodiment of the present application, the process of calibrating the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures includes:

[0045] Based on the pixel position offset of the characteristic wavelength point at different temperatures, a function relationship between the temperature variable and the pixel position offset variable is determined. In an embodiment of the present application, the process of determining the function relationship between the temperature variable and the pixel position offset variable based on the pixel position offset of the characteristic wavelength point at different temperatures includes: obtaining a second preset conversion relationship between the temperature variable and the pixel position offset variable, and selecting a preset number of characteristic wavelength points as target wavelength points; fitting the pixel position offset of the target wavelength points at different temperatures to obtain a fitting relationship between the target wavelength points and the temperature variable and the pixel position offset variable; and solving the coefficients in the second preset conversion relationship according to the fitting relationship between the target wavelength points and the temperature variable and the pixel position offset variable to obtain the function relationship.

[0046] According to the functional relationship, the first preset conversion relationship between the pixel position variable and the spectral wavelength is modified to obtain a revised conversion relationship. When the real-time temperature value and the real-time pixel position are input into the revised conversion relationship, the calibration wavelength of the spectrometer is output. In one embodiment of the present application, the expression of the first preset conversion relationship is as follows:

[0047] λ(x)=a0+a1*x+...+a n *x n Formula (3)

[0048] Among them, λ(x) represents the spectral wavelength, x represents the pixel position variable, a0,...,a n Represents the wavelength calibration coefficient at the preset reference temperature, where n is a positive integer.

[0049] In this embodiment, the expression of the functional relationship is as follows:

[0050] Δx(x,T)=b0(T)+b1(T)*x Formula (4)

[0051] Among them, Δx(x,T) represents the pixel position offset variable, T represents the temperature variable, x represents the pixel position variable, b0(T) represents the constant term coefficient of the pixel position offset, and b1(T) represents the linear term coefficient of the pixel position offset.

[0052] In one embodiment of the present application, taking into account the pixel position offset caused by temperature change, the output wavelength of the spectrometer is calibrated by adding the pixel position offset in formula (3), and a revised conversion relationship is obtained. The expression of the revised conversion relationship is as follows:

[0053] λ(x,T)=a0+a1*(x-b0(T)-b1(T)*x)+a2*(x-b0(T)-b1(T)*x) 2 +a3*(x-b0(T)-b1(T)*x) 3

[0054] Formula (5)

[0055] Where λ(x,T) represents the calibration wavelength variable, a0, ..., a3 represent the wavelength calibration coefficients at the preset reference temperature, b0(T) represents the constant term coefficient of the pixel position offset, b1(T) represents the linear term coefficient of the pixel position offset, T represents the temperature variable, and x represents the pixel position variable.

[0056] In one embodiment of the present application, the process of determining the functional relationship between the temperature variable and the pixel position offset variable based on the pixel position offset of the characteristic wavelength point at different temperatures includes:

[0057] obtaining a second preset conversion relationship between the temperature variable and the pixel position offset variable, and selecting a preset number of characteristic wavelength points as target wavelength points. In an embodiment of the present application, the second preset conversion relationship is a first order polynomial with respect to the pixel position offset variable, and the constant term coefficient and the first order term coefficient in the second preset conversion relationship are both unknown numbers.

[0058] fitting the pixel position offset of the target wavelength point at different temperatures to obtain a fitting relationship between the temperature variable and the pixel position offset variable of the target wavelength point. In an embodiment of the present application, if the target wavelength point is the leftmost peak point (i.e. the first characteristic wavelength point) in the middle spectral curve temperature drift schematic diagram, the fitting relationship between the temperature variable and the pixel position offset variable of the target wavelength point is as follows: Figure 4

[0059] Δx0(T)=m 01 +m 11 *ΔT+m 21 *ΔT 2 Equation (6)

[0060] wherein Δx0(T) represents the pixel position offset of the first characteristic wavelength point, m 01 represents the first constant term fitting coefficient, m 11 represents the first first order term fitting coefficient, m 21 represents the first second order term fitting coefficient, ΔT represents the time interval, and T represents the temperature variable.

[0061] if the target wavelength point is the rightmost peak point (i.e. the last characteristic wavelength point) in the middle spectral curve temperature drift schematic diagram, the fitting relationship between the temperature variable and the pixel position offset variable of the target wavelength point is as follows: Figure 4

[0062] Δx1(T)=m 02 +m 12 *ΔT+m 22 *ΔT 2 Equation (7)

[0063] wherein Δx1(T) represents the pixel position offset of the last characteristic wavelength point, m 02 represents the second constant term fitting coefficient, m 12 represents the second first order term fitting coefficient, m 22 represents the second second order term fitting coefficient, ΔT represents the time interval, and T represents the temperature variable.

[0064] ​​According to the fitting relationship between the target wavelength point and the temperature variable and the pixel position offset variable, the coefficient in the second preset conversion relationship is solved to obtain a function relationship. In an embodiment of the present application, the process of solving the coefficient in the second preset conversion relationship includes: inputting the pixel position of the first characteristic wavelength point and the pixel position offset into formula (4) to obtain the following formula:

[0065] Δx0(T) = b0(T) + b1(T) * x0 Formula (8)

[0066] Wherein, Δx0(T) represents the pixel position offset of the first characteristic wavelength point, b0(T) represents the constant term coefficient of the pixel position offset, b1(T) represents the first order coefficient of the pixel position offset, T represents the temperature variable, and x0 represents the pixel position of the first characteristic wavelength point.

[0067] Inputting the pixel position of the last characteristic wavelength point and the pixel position offset into formula (4) to obtain the following formula:

[0068] Δx1(T) = b0(T) + b1(T) * x1 Formula (9)

[0069] Wherein, Δx1(T) represents the pixel position offset of the last characteristic wavelength point, b0(T) represents the constant term coefficient of the pixel position offset, b1(T) represents the first order coefficient of the pixel position offset, T represents the temperature variable, and x1 represents the pixel position of the last characteristic wavelength point.

[0070] In the present embodiment, the first order coefficient of the pixel position offset is solved in combination with formulas (6)-(9), and the expression of the first order coefficient of the pixel position offset is as follows:

[0071] b1(T) = [Δx0(T) - Δx1(T)] / (x0 - x1) = (m 01 +m 11 *ΔT+m 21 *ΔT 2 -m 02 -m 12 *ΔT-m 22 ΔT 2 ) / (x0-x1)

[0072] Formula (10)

[0073] Wherein, b1(T) represents the first order coefficient of the pixel position offset, Δx0(T) represents the pixel position offset of the first characteristic wavelength point, Δx1(T) represents the pixel position offset of the first characteristic wavelength point, x0 represents the pixel position of the first characteristic wavelength point, x1 represents the pixel position of the first characteristic wavelength point, m 01represents a first constant term fitting coefficient, m 11 represents a first linear term fitting coefficient, m 21 represents a first quadratic term fitting coefficient, ΔT represents a time interval, and T represents a temperature variable. 02 represents a second constant term fitting coefficient, m 12 represents a second linear term fitting coefficient, m 22 represents a second quadratic term fitting coefficient, and ΔT represents a time interval.

[0074] In this embodiment, the constant term coefficient of the pixel position offset is solved in combination with formulas (6)-(9), and an expression of the constant term coefficient of the pixel position offset is as follows:

[0075] b0(T) = Δx0(T) - b1(T) * x0 = m 01 + m 11 * ΔT + m 21 * ΔT 2 - b1(T) * x0 Equation (11)

[0076] wherein b0(T) represents the constant term coefficient of the pixel position offset, b1(T) represents the linear term coefficient of the pixel position offset, Δx0(T) represents the pixel position offset amount of the first characteristic wavelength point, x0 represents the pixel position of the first characteristic wavelength point, m 01 represents a first constant term fitting coefficient, m 11 represents a first linear term fitting coefficient, m 21 represents a first quadratic term fitting coefficient, and ΔT represents a time interval.

[0077] In this embodiment, after the linear term coefficient b1(T) of the pixel position offset is obtained, the linear term coefficient b1(T) of the pixel position offset is input into formula (11), so that the constant term coefficient b0(T) of the pixel position offset is obtained. After the linear term coefficient b1(T) of the pixel position offset and the constant term coefficient b0(T) of the pixel position offset are obtained, the linear term coefficient b1(T) of the pixel position offset and the constant term coefficient b0(T) of the pixel position offset are input into formula (4), so that the first preset conversion relationship is obtained.

[0078] In an embodiment of the present application, before the spectral data formed by the spectrometer at different temperatures is acquired, the wavelength calibration method of the spectrometer further comprises:

[0079] The spectrometer is placed in an experimental environment, and the initial temperature of the experimental environment is a preset reference temperature. In an embodiment of the present application, the experimental environment is a thermostat, an experimental box or the like capable of maintaining a constant temperature. The preset reference temperature can be set as the minimum value T L of the temperature range of the working environment of the spectrometer, or can be other temperature values.

[0080] The spectrometer is controlled to work at a preset reference temperature to obtain spectral power distribution data of the spectrometer. In an embodiment of the present application, the spectral power distribution data includes: a characteristic wavelength point and a pixel position of the characteristic wavelength point at the preset reference temperature. After the spectral power distribution data is obtained, the characteristic wavelength point and the pixel position of the characteristic wavelength point at the preset reference temperature are formed into a spectral curve, so as to facilitate selection of the characteristic wavelength point and observation of the pixel position as needed.

[0081] The temperature of the experimental environment is adjusted according to a preset growth threshold, and the spectrometer is controlled to work at different temperatures, and the characteristic wavelength point and the pixel position of the characteristic wavelength point at different temperatures are recorded. In an embodiment of the present application, the preset growth threshold is set according to actual conditions.

[0082] The characteristic wavelength point and the pixel position of the characteristic wavelength point at different temperatures are taken as spectral data. In an embodiment of the present application, the pixel position is used to represent the pixel position of a different wavelength peak point at different temperatures.

[0083] Figure 3 is a flowchart of a spectrometer wavelength calibration method according to another exemplary embodiment of the present application, in which Figure 3 the spectrometer wavelength calibration method includes: (1) placing the spectrometer in an experimental environment (for example, an incubator, an experimental box, etc.), which can ensure a constant temperature environment for the spectrometer to work, adjusting the temperature of the constant temperature environment with a temperature interval of ΔT in a temperature range of [T L ,T H ], so that the spectrometer works at different temperatures to obtain spectral data; (2) selecting a characteristic wavelength point from the spectral data and reading a pixel position of the characteristic wavelength point at different temperatures; (3) taking a minimum value T L of the temperature range as a preset reference temperature, taking the pixel position of the characteristic wavelength point at the preset reference temperature as a reference pixel position of the characteristic wavelength point, and calculating a difference between the pixel position of the characteristic wavelength point at different temperatures and the reference pixel position of the characteristic wavelength point as a pixel position offset of the characteristic wavelength point at different temperatures; (4) determining a functional relationship between a temperature variable and a pixel position offset variable based on the pixel position offset of the characteristic wavelength point at different temperatures; (5) correcting a first preset conversion relationship between the pixel position variable and the spectral wavelength according to the functional relationship to obtain a revised conversion relationship, so as to output a calibrated wavelength of the spectrometer when a real-time temperature value and a real-time pixel position are input into the revised conversion relationship.

[0084] Figure 4 is a schematic diagram of spectral curve temperature drift according to an exemplary embodiment of the present application, in which Figure 4The spectrum curve of the spectrometer at 10 degrees Celsius, the spectrum curve of the spectrometer at 30 degrees Celsius, and the spectrum curve of the spectrometer at 50 degrees Celsius, wherein the abscissa of the spectrum curve represents a spectrum pixel point, the ordinate of the spectrum curve represents a spectrum light intensity, and the peak point in the spectrum curve represents a characteristic wavelength point, the first characteristic wavelength point is the leftmost wavelength point in each spectrum curve, and the last characteristic wavelength point is the rightmost wavelength point in each spectrum curve.

[0085] The device embodiment of the present application is described below, which can be used to execute the spectrometer wavelength calibration method in the above-mentioned embodiments of the present application. For details not disclosed in the device embodiment of the present application, refer to the above-mentioned embodiments of the spectrometer wavelength calibration method.

[0086] Figure 5 is a block diagram of a spectrometer wavelength calibration device according to an example embodiment of the present application. The device can be applied to the example environment shown in Figure 1 and specifically configured in the computer device 102. The device can also be applied to other example implementation environments and specifically configured in other devices, and the present embodiment does not limit the implementation environment to which the device is applied.

[0087] As shown in Figure 5 , the example spectrometer wavelength calibration device 500 includes:

[0088] The data acquisition module 501 is configured to acquire spectrum data formed by the spectrometer at different temperatures.

[0089] The offset determination module 502 is configured to determine the pixel position offset of the characteristic wavelength point at different temperatures according to the pixel position of the characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at the preset reference temperature.

[0090] The wavelength calibration module 503 is configured to calibrate the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures.

[0091] In an embodiment of the present application, the spectrum data includes the characteristic wavelength point and the pixel position of the characteristic wavelength point at different temperatures. After obtaining the spectrum data, the spectrum data is displayed in the form of a spectrum curve, which facilitates the selection of the characteristic wavelength point from the spectrum curve and the acquisition of the pixel position of the characteristic wavelength point at different temperatures.

[0092] In an embodiment of the present application, the process of determining the pixel position offset of the characteristic wavelength point at different temperatures according to the pixel position of the characteristic wavelength point at different temperatures, and the pixel position of the characteristic wavelength point at the preset reference temperature comprises: selecting a temperature value as a target temperature value in sequence; and taking the difference between the pixel position of the characteristic wavelength point at each target temperature value and the pixel position of the characteristic wavelength point at the preset reference temperature as the pixel position offset of the characteristic wavelength point at different temperature values.

[0093] In an embodiment of the present application, in the process of calibrating the wavelength of the spectrometer, the wavelength drift caused by the pixel position offset of the characteristic wavelength point at different temperatures is fully considered, the output error of the wavelength of the spectrometer is reduced, and the accuracy of the wavelength output of the spectrometer is improved.

[0094] It should be noted that the spectrometer wavelength calibration device provided in the above embodiments and the spectrometer wavelength calibration method provided in the above embodiments belong to the same concept, wherein the specific manner in which each module and unit performs operations has been described in detail in the method embodiments, and will not be described here. The spectrometer wavelength calibration device provided in the above embodiments can be used in actual applications, and the above functions can be completed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above, and this is not limited herein.

[0095] Embodiments of the present application also provide an electronic device, comprising: one or more processors; a storage device for storing one or more programs, when the one or more programs are executed by the one or more processors, the electronic device implements the spectrometer wavelength calibration method provided in each of the above embodiments.

[0096] Figure 6 is a structural schematic diagram of a computer system of an electronic device shown in an exemplary embodiment of the present application. It should be noted that, Figure 6 The computer system 600 of the electronic device shown is only an example, and should not limit the functions and use range of the embodiments of the present application.

[0097] As Figure 6As shown, the computer system 600 includes a central processing unit (CPU) 601 which can perform various suitable actions and processes in accordance with programs stored in a read-only memory (ROM) 602 or loaded from the storage section 608 into a random access memory (RAM) 603, such as performing the methods in the above-described embodiments. Various programs and data required for the operation of the system are also stored in the RAM 603. The CPU 601, the ROM 602, and the RAM 603 are connected to each other through a bus 604. An input / output (I / O) interface 605 is also connected to the bus 604.

[0098] Connected to the I / O interface 605 are an input section 606 including a keyboard, a mouse, etc.; an output section 607 including a display such as a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker, etc.; a storage section 608 including a hard disk, etc.; and a communication section 609 including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication section 609 performs communication processing via a network such as the Internet. A drive 610 is also connected to the I / O interface 605 as necessary. A removable recording medium 611 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc. is attached to the drive 610 as necessary, so that a computer program read therefrom is installed into the storage section 608 as necessary.

[0099] In particular, in accordance with embodiments of the present application, the processes described above with reference to the flowcharts can be implemented as a computer software program. For example, embodiments of the present application include a computer program product comprising a computer program carried on a computer readable medium, the computer program containing computer programs for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via the communication section 609, and / or installed from the removable recording medium 611. When the computer program is executed by the central processing unit (CPU) 601, various functions defined in the system of the present application are performed.

[0100] Another aspect of the present application also provides a computer readable storage medium having computer readable instructions stored thereon, which, when executed by a processor of a computer, cause the computer to perform the spectrometer wavelength calibration method provided in each of the above embodiments. The computer readable storage medium can be included in the electronic device described in the above embodiments, or can exist separately and not be assembled into the electronic device.

[0101] It should be noted that the computer readable medium shown in the embodiments of the present application can be a computer readable signal medium or a computer readable storage medium or any combination of the two. The computer readable storage medium may, for example, be an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or apparatus, or any combination of the above. More specific examples of the computer readable storage medium can include, but are not limited to, an electrical connection having one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, an optical fiber, a portable compact disk read-only memory (Compact Disc Read-Only Memory, CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In the present application, the computer readable signal medium can include a data signal carried in a baseband or as a part of a carrier wave, which carries computer readable computer programs. Such a propagated data signal can take on many forms, including but not limited to an electromagnetic signal, an optical signal, or any suitable combination of the above. The computer readable signal medium can also be any computer readable medium other than the computer readable storage medium, which can send, propagate or transmit programs for use by or in connection with an instruction execution system, apparatus or device. The computer programs contained on the computer readable medium can be transmitted by any suitable medium, including but not limited to wireless, wired, or the like, or any suitable combination of the above.

[0102] The above embodiments only exemplarily illustrate the principles and effects of the present application, and are not intended to limit the present application. Any person skilled in the art can modify or change the above embodiments without departing from the spirit and scope of the present application. Therefore, all equivalent modifications or changes made by those skilled in the art without departing from the spirit and technical ideas disclosed in the present application should be covered by the claims of the present application.

Claims

1. A spectrometer wavelength calibration method, characterized in that: The method comprises: Acquire spectral data formed by a spectrometer at different temperatures; the spectral data includes: characteristic wavelength points and pixel positions of the characteristic wavelength points at different temperatures; Determining pixel position offsets of the characteristic wavelength point at different temperatures according to the pixel positions of the characteristic wavelength point at different temperatures and the pixel positions of the characteristic wavelength point at a preset reference temperature; The wavelength of the spectrometer is calibrated according to the pixel position offset of the characteristic wavelength point at different temperatures.

2. The spectrometer wavelength calibration method according to claim 1, wherein: The process of determining the pixel position offset of the characteristic wavelength point at different temperatures according to the pixel position of the characteristic wavelength point at different temperatures and the pixel position of the characteristic wavelength point at a preset reference temperature includes: Select one temperature value as the target temperature value in turn; The difference between the pixel position of the characteristic wavelength point at each target temperature value and the pixel position of the characteristic wavelength point at a preset reference temperature is used as the pixel position offset of the characteristic wavelength point at different temperature values.

3. The spectrometer wavelength calibration method according to claim 1, wherein: The process of calibrating the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures includes: Determining a functional relationship between a temperature variable and a pixel position offset variable based on pixel position offsets of the characteristic wavelength point at different temperatures; According to the functional relationship, the first preset conversion relationship between the pixel position variable and the spectral wavelength is corrected to obtain a revised conversion relationship, so as to output the calibration wavelength of the spectrometer when the real-time temperature value and the real-time pixel position are input into the revised conversion relationship.

4. The spectrometer wavelength calibration method according to claim 3, wherein: The expressions of the revised conversion relational expressions include: λ(x,T)=a0+a1*(x-b0(T)-b1(T)*x)+a2*(x-b0(T)-b1(T)*x) 2 +a3*(x-b0(T)-b1(T)*x) 3 , Wherein, λ(x,T) represents the calibration wavelength variable, a0, ..., a3 represent the wavelength calibration coefficients at the preset reference temperature, b0(T) represents the constant term coefficient of the pixel position offset, b1(T) represents the linear term coefficient of the pixel position offset, T represents the temperature variable, and x represents the pixel position variable.

5. The spectrometer wavelength calibration method according to claim 3, wherein: The process of determining the functional relationship between the temperature variable and the pixel position offset variable based on the pixel position offset of the characteristic wavelength point at different temperatures includes: Obtaining a second preset conversion relationship between the temperature variable and the pixel position offset variable, and selecting a preset number of characteristic wavelength points as target wavelength points; Fitting the pixel position offset of the target wavelength point at different temperatures to obtain a fitting relationship between the temperature variable and the pixel position offset variable of the target wavelength point; According to the fitting relationship between the temperature variable and the pixel position offset variable at the target wavelength point, the coefficients in the second preset conversion relationship are solved to obtain the functional relationship.

6. The spectrometer wavelength calibration method according to claim 5, characterized in that: The expression of the fitting relationship is as follows: Δx(T)=m0+m1*ΔT+m2*ΔT 2 , Wherein, Δx(T) represents the pixel position offset variable of the target wavelength point, m0 represents the constant term fitting coefficient, m1 represents the linear term fitting coefficient, m2 represents the quadratic term fitting coefficient, ΔT represents the time interval, and T represents the temperature variable.

7. The spectrometer wavelength calibration method according to any one of claims 1 to 6, characterized in that: Before acquiring spectral data formed by the spectrometer at different temperatures, the method further includes: Placing the spectrometer in an experimental environment, wherein the initial temperature of the experimental environment is the preset reference temperature; Controlling the spectrometer to operate at the preset reference temperature to obtain spectral power distribution data of the spectrometer; the spectral power distribution data includes: pixel positions of the characteristic wavelength points at the preset reference temperature; According to a preset growth threshold, the temperature of the experimental environment is adjusted, and the spectrometer is controlled to operate at different temperatures, and characteristic wavelength points and pixel positions of the characteristic wavelength points at different temperatures are recorded; The characteristic wavelength points and the pixel positions of the characteristic wavelength points at different temperatures are used as the spectral data.

8. A spectrometer wavelength calibration device, characterized in that: include: A data acquisition module is used to obtain spectral data formed by the spectrometer at different temperatures; the spectral data includes: characteristic wavelength points and pixel positions of the characteristic wavelength points at different temperatures; an offset determination module, configured to determine the pixel position offsets of the characteristic wavelength point at different temperatures based on the pixel positions of the characteristic wavelength point at different temperatures and the pixel positions of the characteristic wavelength point at a preset reference temperature; The wavelength calibration module is used to calibrate the wavelength of the spectrometer according to the pixel position offset of the characteristic wavelength point at different temperatures.

9. An electronic device, characterized in that: include: one or more processors; A storage device for storing one or more programs, which, when executed by the one or more processors, enables the electronic device to implement the spectrometer wavelength calibration method according to any one of claims 1 to 7.

10. A readable storage medium, characterized in that: Computer-readable instructions are stored thereon, and when the computer-readable instructions are executed by a processor of a computer, the computer is caused to execute the spectrometer wavelength calibration method according to any one of claims 1 to 7.

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