CF / PEEK milling surface roughness modeling method based on L1-LSSVR algorithm
The CF/PEEK milling surface roughness model is established through the L1-LSSVR algorithm, which solves the problem that traditional methods are difficult to describe nonlinear characteristics, and realizes accurate modeling of the three-dimensional surface roughness of CF/PEEK material milling. It is suitable for high-end manufacturing fields such as aerospace, medical devices and automobiles.
Patent Information
- Application Number
- CN202510918567.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-04
- Publication Date
- 2025-10-17
AI Technical Summary
Traditional methods are difficult to accurately describe the nonlinear characteristics of CF/PEEK material milling, resulting in complex surface roughness control and reduced machining performance.
The L1-LSSVR algorithm is used to learn from processing data, explore the complex relationship between process parameters and processing results, and establish an accurate surface roughness model. This includes static milling process parameter design, dynamic signal acquisition, feature extraction and feature selection. The Pearson correlation coefficient and L1 norm regularization are used for feature screening, and the multi-kernel function and Osprey optimization algorithm are combined to optimize the hyperparameters.
It achieves accurate modeling of the three-dimensional surface roughness of CF/PEEK material milling, improves the stability and accuracy of the processing results, and is suitable for key components in high-end manufacturing fields such as aerospace, medical devices and automobiles.