Circuit structure for solving single particle inversion and method for solving single particle inversion
By modifying the static memory cell to construct an embedded majority voter, the delay and area problems introduced by the external majority voting circuit are solved, high-reliability single-event upset protection is achieved, and the chip design is optimized.
Patent Information
- Application Number
- CN202511066105.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-30
- Publication Date
- 2025-11-18
AI Technical Summary
In the prior art, external majority voting circuits introduce additional signal propagation delays, increase chip area and layout and wiring complexity in integrated circuits, and may also be affected by single-event effects, leading to reliability issues.
The majority voter circuit structure using static memory is constructed by modifying the static memory cells within the chip to build an embedded majority voter. The majority voting logic is implemented using three sets of two-input NAND gates and one three-input NOR gate, reducing the delay and area overhead of external circuits.
Without sacrificing or even improving system performance, it significantly optimizes chip area and design complexity, improves circuit reliability in radiated environments, and effectively shields against the effects of single-event upsets.