Flash lamp flash leakage test equipment and test method

Abstract

The invention discloses a flash lamp flash leakage test device and a flash lamp flash leakage test method, and relates to the technical field of lamp flash leakage test. The method comprises the following steps: deploying a host end; aligning a first ambient light sensor of the host end to the center of a to-be-tested lamp; spacing a fixed distance between the host end and the to-be-tested lamp, wherein the fixed distance is less than or equal to 1 meter; setting reference parameter calibration; the test data comprises the number of flash missing times, the light intensity value and the running time, the comprehensiveness and accuracy of the test are improved through multi-sensor collection, the misjudgment probability of flash missing is effectively reduced through ambient light interference baseline correction and light intensity value cross validation, and the reliability of the test is improved. Encrypted storage guarantees data security, an intelligent electric quantity management and breakpoint continuous test mechanism guarantees continuity of long-time test, and data loss and test interruption are avoided.

Description

Technical Field

[0001] This invention relates to the field of lamp flicker leakage testing technology, specifically to a flash lamp flicker leakage testing device and testing method. Background Technology

[0002] The standard for flash leakage testing of flash lamps is based on Article 5.11.3 of the "Technical Requirements for Sequential Flash Lamps and Runway Entrance Identification Lights". The flash lamp tube shall meet the requirements of Article 5.10.2 for more than 1000 hours of operation without fault or adjustment under high flash frequency and high light intensity conditions. Its effective light intensity shall not be less than 70% of the specified value, and the leakage shall not exceed 1% and there shall be no continuous leakage.

[0003] Traditional testing methods have many limitations. The range of a single sensor is limited, it is susceptible to interference from ambient light leading to misjudgments, and the data reliability is insufficient. If the host is powered off during the test, test data is easily lost, and the security of data transmission and storage is not guaranteed. It is difficult to meet the requirements of high-precision and long-term testing. In addition, the design of existing equipment in terms of power management and breakpoint continuation testing is imperfect, which affects the continuity and accuracy of testing. Therefore, designing a flash lamp leakage test device and test method is a technical problem that needs to be solved by those skilled in the art. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a flash lamp leakage testing device and method, which solves the problems mentioned in the background section.

[0005] To achieve the above objectives, the present invention provides the following technical solution: a method for testing flash leakage in flashlights, comprising the following steps: Step 1: Deploy the host unit, align the first ambient light sensor on the host unit with the center of the lamp under test, and maintain a fixed distance between the host unit and the lamp under test, which is less than or equal to 1 meter; Step 2: Set the baseline parameter calibration and set the host-side power threshold; Step 3: The host starts to perform the flash leakage test. The host records the test data every 5 flashes. The test data includes the number of flashes, light intensity value and running time. The microcontroller control unit uses a key to encrypt the test data. Step 4: If a power outage occurs on the host before the flicker leakage test is completed, mark the test data as having been lost. Once the host has been restored to power, continue the test from the point marked as lost. Step 5: After the flicker test is completed, the host computer outputs the test results through the OLED display unit, and the operator obtains the test results by connecting to the Bluetooth module of the host computer through a mobile APP.

[0006] Furthermore, setting the reference parameter calibration specifically includes the following steps: Step 201: The operator synchronizes the time on the host, and the high-speed, high-precision active temperature-controlled crystal oscillator transmits the clock signal to the microcontroller control unit; Step 202: The operator operates the lamp under test to flash twice; Step 203: The microcontroller control unit sends a command to the first ambient light sensor to acquire the first ambient light data of the host's location and transmits it to the microcontroller control unit. The first and second ambient light sensors are perpendicular to each other. The first ambient light sensor is aligned with the center of the lamp under test. The microcontroller control unit sets the peak light intensity percentage in the first ambient light data as the reference value and marks the second ambient light data acquired by the second ambient light sensor as the light reference. Subsequent tests with light intensity values ​​exceeding the reference value are recorded as one flash test. The second ambient light data collected by the second ambient light sensor is used for comparison and reference to avoid the influence of ambient light outside the lamp under test on the first ambient light sensor and reduce test errors.

[0007] Furthermore, the specific details of the host-side power threshold setting are as follows: Step 204: The microcontroller control unit obtains the flash interval from the timing and counting unit. The timing and counting unit determines the flash interval based on the time between two flashes of the lamp under test obtained from the first ambient light data. The operator sets the number of flashes using the host terminal. The power management unit obtains the capacity information and current power of the lithium battery and sets the power threshold.

[0008] Furthermore, step 204 is executed before the host starts testing. When the host starts testing, the microcontroller control unit calculates the power consumption of the test based on the number of flashes, the flash interval, and the host's own power consumption. When the current power of the lithium battery minus the power consumption is lower than the power threshold, the microcontroller control unit pushes a power warning to the OLED display unit for the operator to view, promptly reminding the operator that the host's current power is insufficient and the test is interrupted. If the current power of the host is lower than the power threshold, it means that the host is at risk of power failure and loss of test data. The test data is stored on the host to reduce the risk of test data loss.

[0009] Furthermore, the criteria for determining whether the test data has been tampered with are as follows: Step 401: When storing test data on the host side, the microcontroller control unit uses a key to generate a digital signature. The digital signature includes a hash value and a timestamp. When decrypting the test data, the digital signature is verified. If the digital signatures match, it means that the test data has not been tampered with, and no operation is performed. Otherwise, if the digital signatures do not match, it means that the test data has been tampered with, and the next step 402 is executed. Step 402: The host triggers a tampering warning and pushes the warning information to the mobile APP to remind the testers.

[0010] Furthermore, the subsequent testing after a power outage on the host computer specifically includes the following steps: Step 403: During the host-side test, the microcontroller control unit cyclically records and saves the timestamps. After a power failure occurs on the host side, the host side records the test data once at each timestamp. Step 404: After power is restored to the host, continue testing based on the most recent timestamp.

[0011] A flash lamp leakage testing device includes a host unit, which comprises a USB charging and communication unit, a first ambient light sensor, a second ambient light sensor, a power management unit, a microcontroller control unit, an OLED display unit, a high-speed, high-precision active temperature-controlled crystal oscillator, a timing and counting unit, and a Bluetooth module. The ports of the USB charging and communication unit are electrically connected to the ports of the power management unit and the microcontroller control unit, respectively. The port of the first ambient light sensor is electrically connected to the port of the microcontroller control unit. The output terminal of the second ambient light sensor is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the power management unit is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the microcontroller control unit is electrically connected to the input terminal of the OLED display unit. The output terminal of the high-speed, high-precision active temperature-controlled crystal oscillator is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the timing and counting unit is electrically connected to the input terminal of the microcontroller control unit. The port of the Bluetooth module is electrically connected to the port of the microcontroller control unit. The specifications of the host unit include period measurement accuracy, test distance, communication interface, lithium battery specifications, USB specifications, charging head specifications, operating temperature, and shell material. The USB charging and communication unit is used for power input to the host device, providing power to the host device. It connects to an external power source via a USB interface and also handles data transmission. It can be used to connect to computers and other terminals during device debugging to transmit configuration parameters and test data. A 5V / 1A power supply is used to charge and power the flashover tester, ensuring its continuous long-term operation. The USB communication function allows for program downloading and connection to a computer for later parameter display or data backup. The first and second ambient light sensors are used to collect ambient light data at the host device's location, providing raw light signal input for the host device to determine the flash status of the flashlight. The optical illuminance measurement range of the device and the second ambient light sensor is wide. The distance between the main unit's acquisition probe and the center of the light source only needs to be 1 meter. Flashing lights include aviation obstruction lights, sequential flashes, or other flashing lights. Sequential flashes typically use gas discharge tubes, and their flash duration is extremely short, on the order of microseconds. Therefore, a high-speed, high-precision analog ambient light sensor is required to capture the flash duration and number of flashes. Sequential flashes need to be continuously monitored for over 1000 hours, with no more than 1% of missed flashes and no continuous missed flashes. Other types of flashing lights can be tested according to their respective standard requirements. For sequential flashes, the effective light intensity should not be less than 70% of the specified value; therefore, a high-speed, high-precision digital ambient light sensor is used for real-time monitoring. The flash waveform is collected and the effective light intensity is calculated as the basis for its detection. Other types of flashlights can be tested according to their standard requirements. The power management unit is used for the distribution, monitoring and protection of input power to ensure stable power supply to various modules on the host side, such as the microcontroller control unit, sensors, and Bluetooth module. It has battery charging and discharging management. The host side has a built-in lithium battery that can be charged via USB, which can cope with sudden power outages without interrupting the test. The flash leakage tester contains a lithium battery charging and discharging protection management circuit, which can protect the lithium battery from charging and discharging. The main function of the battery management unit is to provide backup power to the instrument to avoid test termination due to short-term power outages or power fluctuations. The microcontroller control unit is used to perform the flash leakage test. The program, as the core control module of the host, receives and processes ambient light data collected by various ambient light sensors, runs the flashover test program, judges flashover events based on changes in light signals, calculates the flashover rate, and coordinates the control of other modules. The microcontroller control unit, as the core unit of the flashover tester, performs functions such as capturing flash pulses, timing and counting, battery power acquisition and calculation, running time, flash frequency, flash count, flashover count, flashover rate calculation, and USB or Bluetooth communication. The OLED display unit is used to display the flashover test data in real time, such as flash frequency, flash count, running time, and light intensity value, allowing on-site operators to intuitively view the test status. The results calculated by the microcontroller control unit are displayed through the OLED.The sequential flash unit includes metrics such as the number of failed effective light intensity tests, the number of missed flashes, the number of consecutive missed flashes, the missed flash rate, remaining battery power, the number of flash triggers, the flash frequency, and the running time. A high-speed, high-precision active-duty temperature-controlled crystal oscillator provides a clock signal to the timing and counting unit and the microcontroller control unit, ensuring high precision and stability. This allows for accurate measurement of the actual flash frequency of the flash unit. As an external clock for the microcontroller control unit, the high-speed, high-precision active-duty temperature-controlled crystal oscillator provides a very stable clock frequency, resulting in minimal timing and counting errors, meeting the detection error requirements for continuous operation exceeding 1000 hours. The timing and counting unit records the host-side running time and the number of flashes based on the clock signal. Based on the clock signal provided by the crystal oscillator, it counts the number of flashes of the flash unit and measures the test running time, such as the cumulative running seconds. The missed flash rate is measured in missed flashes. The number divided by the number of flashes provides data support for determining the test duration of the flash leakage rate, and determines whether the 1000-hour test is met. The timing and counting unit is an internal unit of the microcontroller, using an external high-speed, high-precision temperature-controlled crystal oscillator as the clock source, thus accurately calculating the running time, flash frequency, and number of flashes. The Bluetooth module establishes a wireless communication connection between the host and the mobile APP, realizing bidirectional data transmission, such as real-time synchronization of host test data to the mobile APP display, and receiving control commands sent by the mobile APP, such as start and stop test. All parameters of the OLED display unit can be transmitted to the flash leakage tester APP on the mobile phone via the Bluetooth module. The OLED display unit also serves as a backup display function for the Bluetooth APP. The parameters set by the Bluetooth APP mainly include power on / off, screen on / off, stop test / start test, etc. The OLED display unit displays a start test page and a stop test page. The test start page includes items such as test status, cdF, LF, CLF, SOC, LFR, flash frequency, running time, and flash trigger count. The test status includes Testing, Test Pass, and TestFail. cdF represents the number of light intensity failures, indicating only the number of times the flash intensity has historically fallen below the peak intensity benchmark. It is not a key indicator of test success and is for reference only. LF is the number of missed flashes, the cumulative number of missed flashes in the current system. CLF is the number of consecutive missed flashes, the cumulative number of consecutive missed flashes in the current system; one consecutive missed flash constitutes a test failure. SOC is the remaining charge of the internal lithium battery. LFR is the flash rate, the ratio of missed flashes to flash trigger count; after 1000 hours of testing, the flash rate should be <1%. Flash frequency is the actual flash frequency measured by the current system. Running time is the cumulative test time, displayed in [hours + seconds] format; the test ends after 1000 hours without abnormalities by default. Flash trigger count is the cumulative number of triggers in the current system, displayed every 5 seconds. The items on the stop test page include measurement distance, illuminance integral value, luminous intensity integral value, flash frequency, SOC (State of Charge), measurement level, conversion time, running time, and flash trigger count. The measurement distance indicates that the lamp is placed at a distance of 1 meter. The illuminance integral value is the peak illuminance, the luminous intensity integral value is the peak luminous intensity, the flash frequency is the actual flash frequency measured by the current system, the SOC is the remaining power of the internal lithium battery, the measurement level is a range of 0~117441 lux, the light control cover has a certain attenuation ratio, the conversion time is 0.6ms, and the running time and flash trigger count are displayed in the same way as the items on the start test page.

[0012] The present invention has the following beneficial effects: 1. Multi-sensor acquisition improves the comprehensiveness and accuracy of testing. By correcting the baseline for ambient light interference and cross-validating the light intensity value, the probability of false judgment of flashover is effectively reduced.

[0013] 2. Encrypted storage ensures data security, while intelligent power management and breakpoint resume testing mechanisms ensure the continuity of long-term testing, avoiding data loss and test interruption due to power issues or sudden power outages.

[0014] 3. The high-speed, high-precision hardware and automated process design not only meet the microsecond-level testing requirements of special lighting fixtures such as sequential flashes, but also improves the ease of operation through OLED display and mobile APP interaction, providing an efficient and reliable solution for the compliance testing of flash lighting fixtures.

[0015] Of course, any product implementing this invention does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0016] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a system block diagram of a flash lamp leakage test device according to the present invention; Figure 2 This is a flowchart illustrating Embodiment 2 of the present invention. Detailed Implementation

[0018] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0019] Example 1 Please see Figure 1 This invention provides a technical solution: a method for testing flash leakage in flashlights, comprising the following steps: Step 1: Deploy the host unit, align the first ambient light sensor on the host unit with the center of the lamp under test, and maintain a fixed distance between the host unit and the lamp under test, which is less than or equal to 1 meter; Step 2: Set the baseline parameter calibration and set the host-side power threshold; Step 3: The host starts to perform the flash leakage test. The host records the test data every 5 flashes. The test data includes the number of flashes, light intensity value and running time. The microcontroller control unit uses a key to encrypt the test data. Step 4: If a power outage occurs on the host before the flicker leakage test is completed, mark the test data as having been lost. Once the host has been restored to power, continue the test from the point marked as lost. Step 5: After the flicker test is completed, the host computer outputs the test results through the OLED display unit, and the operator obtains the test results by connecting to the Bluetooth module of the host computer through a mobile APP.

[0020] The calibration process specifically includes the following steps: Step 201: The operator synchronizes the time on the host, and the high-speed, high-precision active temperature-controlled crystal oscillator transmits the clock signal to the microcontroller control unit; Step 202: The operator operates the lamp under test to flash twice; Step 203: The microcontroller control unit sends a command to the first ambient light sensor to obtain the first ambient light data of the host's location and transmits it to the microcontroller control unit. The first ambient light sensor and the second ambient light sensor are perpendicular to each other. The first ambient light sensor is aligned with the center of the lamp under test. The microcontroller control unit sets the peak light intensity in the first ambient light data as a fixed percentage of 70% as the reference value and marks the second ambient light data obtained by the second ambient light sensor as the light reference.

[0021] The specific details of the host-side power threshold setting are as follows: Step 204: The microcontroller control unit obtains the flash interval from the timing and counting unit. The timing and counting unit determines the flash interval based on the time between two flashes of the lamp under test obtained from the first ambient light data. The operator sets the number of flashes using the host terminal. The power management unit obtains the capacity information and current power of the lithium battery and sets the power threshold to 20% of the lithium battery capacity information.

[0022] Step 204 is executed before the host starts testing. When the host starts testing, the microcontroller control unit calculates the power consumption of the test based on the number of flashes, the flash interval, and the host's own power consumption. When the current power of the lithium battery minus the power consumption is lower than the power threshold, the microcontroller control unit pushes a power warning to the OLED display unit for the operator to view, promptly reminding the operator that the host's current power is insufficient and the test is interrupted. If the current power of the host is lower than the power threshold, it means that the host is at risk of power failure and loss of test data. The test data is stored on the host to reduce the risk of test data loss.

[0023] The criteria for determining whether test data has been tampered with are as follows: Step 401: When the host distributes test data, the microcontroller control unit uses a key to generate a digital signature. The digital signature includes a hash value and a timestamp. When decrypting the test data, the digital signature is verified. If the digital signatures match, it means that the test data has not been tampered with, and no operation is performed. Otherwise, if the digital signatures do not match, it means that the test data has been tampered with, and the next step 402 is executed. Step 402: The host triggers a tampering warning and pushes the warning information to the mobile APP to remind the testers.

[0024] The specific steps for post-power-off testing on the host device include: Step 403: During the host-side test, the microcontroller control unit cyclically records and saves the timestamps. After a power failure occurs on the host side, the host side records the test data once at each timestamp. Step 404: After power is restored to the host, continue testing based on the most recent timestamp.

[0025] A flashlight leakage test device, such as Figure 1 As shown, the system includes a host unit, which comprises a USB charging and communication unit, a first ambient light sensor, a second ambient light sensor, a power management unit, a microcontroller control unit, an OLED display unit, a high-speed, high-precision active temperature-controlled crystal oscillator, a timing and counting unit, and a Bluetooth module. The ports of the USB charging and communication unit are electrically connected to the ports of the power management unit and the microcontroller control unit, respectively. The port of the first ambient light sensor is electrically connected to the port of the microcontroller control unit. The output terminal of the second ambient light sensor is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the power management unit is connected to the input terminal of the microcontroller control unit. Electrical connections: the output of the microcontroller control unit is electrically connected to the input of the OLED display unit; the output of the high-speed, high-precision active temperature-controlled crystal oscillator is electrically connected to the input of the microcontroller control unit; the output of the timing and counting unit is electrically connected to the input of the microcontroller control unit; the port of the Bluetooth module is electrically connected to the port of the microcontroller control unit. The specifications of the host include a period measurement accuracy of ±50µs, a test distance of 1 meter, a Bluetooth communication interface, a lithium battery specification of 800mA / 3.7V, a USB specification of Type-A, a charging head specification of 5V / 1A, an operating temperature of 0~40℃, and an aluminum shell material. The USB charging and communication unit is used for power input on the host side, responsible for providing power to the host device. It connects to an external power source via a USB interface for power supply and also handles data transmission. It can be used to connect to computers and other terminals during device debugging to transmit configuration parameters and test data. A 5V / 1A power supply is used to charge and power the flashover tester, ensuring its long-term continuous operation. The USB communication function allows for program downloading and connection to a computer for later parameter display or data backup, ensuring stable power supply and resolving potential power interruptions during testing. It provides a physical transmission channel for device debugging and data backup, improving device maintainability and data traceability. The first ambient light sensor and the second... An ambient light sensor is used to collect ambient light data at the location of the host device, providing the host device with raw light signal input to determine the flash status of the flashing lights. Both the first and second ambient light sensors have wide optical illuminance ranges. The host device's acquisition probe only needs to be 1 meter away from the center of the light source. Flashing lights include aviation obstruction lights, sequential flashes, or other flashing lights. Sequential flashes typically use gas discharge tubes, resulting in very short flash durations, on the order of microseconds. Therefore, a high-speed, high-precision analog ambient light sensor is required to capture the flash duration and number of flashes. Sequential flashes need to be continuously monitored for over 1000 hours, with no more than 1% of flashes missed and no continuous flashes missed. Other types of flashing lights can be tested according to their respective standard requirements. This can be achieved through testing. For sequential flash units, the effective light intensity should not be less than 70% of the specified value. Therefore, a high-speed, high-precision digital ambient light sensor is used to collect flash waveforms in real time and calculate the effective light intensity as the basis for testing. Other types of flash units can be tested according to their standard requirements, such as whether there is a flash leak or whether the light intensity meets the standard. Ambient light is collected from different angles or areas to compensate for the limitations of the range and angle of a single sensor, improving the comprehensiveness of light signal collection and thus improving the accuracy of flash leak judgment and light intensity detection. The power management unit is used for the distribution, monitoring, and protection of input power to ensure stable power supply to various modules on the host side, such as the microcontroller control unit, sensors, and Bluetooth module. It has battery charging and discharging management. The host side has a built-in lithium battery, which is connected via USB. Charge B allows for uninterrupted testing even during sudden power outages. The flashover tester includes a lithium battery charge / discharge protection management circuit to protect the lithium battery during charging and discharging. The battery management unit primarily provides backup power to the instrument, preventing test termination due to short-term power outages or power fluctuations. A stable power supply is fundamental for long-term continuous testing, such as 1000 hours, preventing test interruptions, data loss, or hardware damage due to voltage fluctuations or unstable power supply, ensuring test reliability. The microcontroller control unit executes the flashover test program. As the core control module of the host, it receives and processes ambient light data collected by various ambient light sensors, runs the flashover test program, determines flashover events based on changes in the light signal, and calculates the flashover rate.The microcontroller control unit, serving as the core unit of the flashover tester, coordinates and controls other modules. Its functions include capturing flash pulses, timing and counting, battery power acquisition and calculation, runtime, flash frequency, flash count, flash leakage count, flash leakage rate calculation, and USB or Bluetooth communication. For example, it sends display commands to the OLED display unit and transmits data via Bluetooth, performing data processing and logical judgments. This integrates disparate hardware modules into a complete system with flashover testing capabilities, determining the automated operation of the flashover test process and the output of test results. The OLED display unit displays real-time flashover test data, such as flash frequency, flash leakage count, runtime, and light intensity, allowing on-site operators to intuitively view the test status. The microcontroller... The results calculated by the control unit are displayed on an OLED screen. For sequential flashes, this includes the number of failed effective light intensity tests, the number of missed flashes, the number of consecutive missed flashes, the missed flash rate, remaining battery power, the number of flash triggers, the flash frequency, and the runtime. This allows testers to quickly obtain test data locally on the device without relying on a mobile app, facilitating on-site debugging and troubleshooting, and improving the convenience of test operations. A high-speed, high-precision active-controlled crystal oscillator provides the clock signal, offering high precision and stability to the timing and counting unit and the microcontroller control unit. This allows for accurate measurement of the actual flash frequency of the flash unit. As an external clock for the microcontroller control unit, the high-speed, high-precision active-controlled crystal oscillator provides a very stable clock frequency, enabling the microcontroller to... The timing and counting errors are extremely small, meeting the detection error requirements for continuous operation of over 1000 hours, ensuring the accuracy of timing and counting, such as precise measurement of flash frequency and test running time. The clock signal is the benchmark for timing, counting, and frequency measurement; its high precision and stability directly determine the accuracy of time-related parameters in flash leakage testing, such as 1000 hours of test duration and flash frequency measurement. This is the foundation for accurate calculation of flash leakage rate and compliance judgment of test duration. The timing and counting unit records the host's running time and the number of flashes based on the clock signal. Based on the clock signal provided by the crystal oscillator, it counts the number of flashes of the flash lamp to measure the test running time, such as the cumulative running seconds. The flash leakage rate is the number of flashes divided by the number of flashes. The system provides data support for determining the test duration and whether the 1000-hour test requirement is met. The timing and counting unit, an internal microcontroller unit, uses an external high-speed, high-precision temperature-controlled crystal oscillator as its clock source. This allows for accurate calculation of running time, flash frequency, and flash count, which is a prerequisite for calculating core test indicators such as flash leakage rate and continuous running time. This ensures that the test results meet the industry standard requirements of a flash leakage rate <1% and a test duration of 1000 hours. The Bluetooth module establishes a wireless communication connection between the host device and the mobile app, enabling bidirectional data transmission. For example, it can synchronize test data from the host device to the mobile app in real time and receive control commands from the mobile app, such as starting and stopping the test.All parameters of the OLED display unit can be transmitted to the flicker tester app on a mobile phone via Bluetooth. The OLED display unit also serves as a backup display for the Bluetooth app. The parameters set in the Bluetooth app mainly include power on / off, screen on / off, stop / start test, etc., breaking the limitations of wired connections and allowing testers to remotely monitor the testing process and adjust test parameters using a mobile app. The OLED display unit displays a start test page and a stop test page. The test start page includes items such as test status, cdF, LF, CLF, SOC, LFR, flash frequency, running time, and flash trigger count. Test status includes Testing, Test Pass, and Test Fail. cdF represents the number of light intensity failures, indicating only the number of times the historical light intensity of the flash lamp has fallen below the peak light intensity benchmark. It is not a key indicator of test success and is for reference only. LF is the number of missed flashes, i.e., the cumulative number of missed flashes in the current system. CLF is the number of consecutive missed flashes, the cumulative number of consecutive missed flashes in the current system. One consecutive missed flash indicates test failure. SOC is the remaining power of the internal lithium battery. LFR is the flash rate, the ratio of the number of missed flashes to the number of flash triggers. After 1000 hours of testing, the flash rate should be <1%. Flash frequency is the actual flash frequency measured by the current system. Running time is the cumulative test time of the system, displayed in the format of [hours + seconds]. The default test ends after 1000 hours without any abnormalities. Flash trigger count is the cumulative number of triggers in the current system, displayed every 5 seconds. The stop test page includes items such as measurement distance, illuminance integral value, luminous intensity integral value, flash frequency, SOC (State of Charge), measurement range, conversion time, running time, and flash trigger count. The measurement distance indicates that the light fixture is placed at a distance of 1 meter. The illuminance integral value is the peak illuminance, the luminous intensity integral value is the peak luminous intensity, the flash frequency is the actual flash frequency measured by the current system, the SOC is the remaining power of the internal lithium battery, the measurement range is 0~117441 lux, the light control cover has a certain attenuation ratio, the conversion time is 0.6ms, and the running time and flash trigger count are displayed in the same way as the start test page.

[0026] Example 2 Please see Figure 2 The present invention also provides a technical solution: a method for testing flash leakage in flashlights, comprising the following steps: Step 1: Prepare the light fixture to be tested and install the flicker test app on your mobile phone; Step 2: Connect the USB cable to the charging head and plug it into a power source; Step 3: The host system automatically powers on; Step 4: The Bluetooth module on the host device is enabled and can be searched; Step 5: The mobile phone connects to the host device based on the Bluetooth name; Step 6: Check the test status; Step 7: Confirm parameters and start testing; Step 8: Determine if the test parameters are abnormal. If the parameters are abnormal, stop the test and jump to step 6. If no abnormality is found in the parameters, proceed to the next step 9. Step 9: Check the test results after 1000 hours of continuous testing.

[0027] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A method for testing flash leakage in flashlights, characterized in that: Includes the following steps: Step 1: Deploy the host unit, align the first ambient light sensor on the host unit with the center of the lamp under test, and maintain a fixed distance between the host unit and the lamp under test, which is less than or equal to 1 meter; Step 2: Set the baseline parameter calibration and set the host-side power threshold; Step 3: The host starts to perform the flash leakage test. The host records the test data every fixed number of flashes. The test data includes the number of flashes, light intensity value and running time. The microcontroller control unit uses a key to encrypt the test data. Step 4: If a power outage occurs on the host before the flicker leakage test is completed, mark the test data as having been lost. Once the host has been restored to power, continue the test from the point marked as lost. Step 5: After the flicker test is completed, the host computer outputs the test results through the OLED display unit, and the operator obtains the test results by connecting to the Bluetooth module of the host computer through a mobile APP.

2. The method for testing flash leakage in a flashlight according to claim 1, characterized in that, Setting the reference parameters for calibration specifically includes the following steps: Step 201: The operator synchronizes the time on the host, and the high-speed, high-precision active temperature-controlled crystal oscillator transmits the clock signal to the microcontroller control unit; Step 202: The operator operates the lamp under test to flash twice; Step 203: The microcontroller control unit sends a command to the first ambient light sensor to acquire the first ambient light data and transmits it to the microcontroller control unit. The microcontroller control unit sets the peak light intensity percentage in the first ambient light data as a reference value.

3. The method for testing flash leakage in a flashlight according to claim 1, characterized in that, The specific details of the host terminal and power threshold settings are as follows: Step 204: The microcontroller control unit obtains the flash interval from the timing and counting unit, the operator sets the number of flashes using the host terminal, the power management unit obtains the capacity information and current power of the lithium battery, and sets the power threshold.

4. The method for testing flash leakage in a flashlight according to claim 3, characterized in that, When the host starts testing, the microcontroller control unit calculates the power consumption of the test based on the number of flashes, the flash interval, and the host's own power consumption. When the current power of the lithium battery minus the power consumption is lower than the power threshold, the microcontroller control unit pushes a power warning to the OLED display unit for the operator to view. If the current power of the host is lower than the power threshold, the test data is stored by the host.

5. The method for testing flash leakage in a flashlight according to claim 1, characterized in that, The criteria for determining whether test data has been tampered with are as follows: Step 401: When the host distributes test data, the microcontroller control unit uses a key to generate a digital signature. The digital signature includes a hash value and a timestamp. When decrypting the test data, the digital signature is verified. If the digital signature matches, no operation is performed. Otherwise, if the digital signature does not match, proceed to the next step 402. Step 402: The host triggers a tampering warning and pushes the warning information to the mobile APP to remind the testers.

6. The method for testing flash leakage in a flashlight according to claim 1, characterized in that, The specific steps for post-power-off testing on the host device include: Step 403: During the host-side test, the microcontroller control unit cyclically records and saves the timestamps. After a power failure occurs on the host side, the host side records the test data once at each timestamp. Step 404: After power is restored to the host, continue testing based on the most recent timestamp.

7. A flash lamp leakage testing device, characterized in that... A method for testing flash leakage of a flashlight as described in any one of claims 1-6 includes a host unit. The host unit includes a USB charging and communication unit, a first ambient light sensor, a second ambient light sensor, a power management unit, a microcontroller control unit, an OLED display unit, a high-speed, high-precision active temperature-controlled crystal oscillator, a timing and counting unit, and a Bluetooth module. The ports of the USB charging and communication unit are electrically connected to the ports of the power management unit and the microcontroller control unit, respectively. The port of the first ambient light sensor is electrically connected to the port of the microcontroller control unit. The output terminal of the second ambient light sensor is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the power management unit is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the microcontroller control unit is electrically connected to the input terminal of the OLED display unit. The output terminal of the high-speed, high-precision active temperature-controlled crystal oscillator is electrically connected to the input terminal of the microcontroller control unit. The output terminal of the timing and counting unit is electrically connected to the input terminal of the microcontroller control unit. The port of the Bluetooth module is electrically connected to the port of the microcontroller control unit. The USB charging and communication unit is used for power input to the host device. The first and second ambient light sensors are used to collect ambient light data at the location of the host device. The power management unit is used for power distribution, monitoring, and protection. The microcontroller control unit is used to execute the flicker test program. The OLED display unit is used to display the flicker test data in real time. The high-speed, high-precision active temperature-controlled crystal oscillator is used to provide a clock signal. The timing and counting unit records the host device's running time and the number of flashes based on the clock signal. The Bluetooth module establishes a wireless communication connection between the host device and the mobile app.

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