Multilayer imaging method for terahertz near-field system tomography

By adjusting the signal bias value of the terahertz near-field system to form an arithmetic sequence, the problem of unclear depth in terahertz near-field imaging is solved, enabling multi-layer three-dimensional imaging of the internal structure of samples and improving the accuracy of biomedical and materials testing.

CN121453716APending Publication Date: 2026-02-03INST OF ENERGY HEFEI COMPREHENSIVE NAT SCI CENT (ANHUI ENERGY LAB)
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Patent Information

Application Number
CN202511629112.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-11-07
Publication Date
2026-02-03

AI Technical Summary

Technical Problem

Existing terahertz near-field imaging technology cannot accurately determine the specific internal depth corresponding to each order of signal, making it difficult to achieve three-dimensional tomographic reconstruction and limiting its application in biomedical diagnosis and materials testing.

Method used

By adjusting the signal bias value through multiple scans, an arithmetic sequence is formed, and signal data representing different linear depths within the interior are collected to construct a multi-layer three-dimensional tomographic image.

Benefits of technology

It enables in-depth quantitative imaging of the internal structure of samples, improves the information dimension and practicality of three-dimensional tomographic images, and can accurately locate the depth of the internal structure of biological cells and micro-defects in materials.

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Abstract

The invention discloses a multilayer imaging method for terahertz near-field system tomography, and belongs to the technical field of terahertz near-field imaging. Aiming at the problem that internal depth quantitative calibration is difficult to realize in existing terahertz near-field three-dimensional imaging, the method proposes that a signal with deepest internal imaging is determined through primary scanning, then multiple data processing is carried out through secondary or multiple scanning, bias voltages of different acquired signals are respectively adjusted under the same magnification times, and the internal depth quantitative calibration is realized in the terahertz near-field three-dimensional imaging. The offset values are arranged in an arithmetic progression, thereby obtaining imaging data representing different linear depths. According to the method, multilayer imaging of internal depth calibration can be realized, a three-dimensional tomographic image with quantitative depth information is formed, and the method is suitable for observation of internal structures of biological cells and nondestructive testing of internal defects of materials.
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