Verification method for digital circuit design of large-area-array infrared image sensor

Abstract

The invention discloses a verification method for a digital circuit design of a large-area-array infrared image sensor, and the method comprises the steps: carrying out the analysis of a to-be-verified digital circuit design feature, and obtaining an analysis result; classifying each module in the digital circuit design to obtain a plurality of to-be-modeled modules; modeling input, output and functions of the to-be-modeled module according to an analysis result to form a plurality of universal verification modules; a plurality of universal verification modules are connected with a digital circuit to be verified according to connection requirements, a complete circuit is established, and a verification platform is formed; executing simulation based on the verification platform to obtain a simulation result; and optimizing the digital circuit design according to a simulation result. And the effect of quickly and accurately positioning the design problem is achieved.

Description

Technical Field

[0001] This invention relates to a verification method for the digital circuit design of a large-area infrared image sensor, belonging to the technical field of image sensor digital circuit design verification. Background Technology

[0002] Large-area infrared image sensors, with their large field of view and high spatial resolution, have wide applications in many fields such as aerospace, space exploration, and security monitoring, including near-Earth asteroid monitoring, astronomical observation, and satellite remote sensing. Their readout digital circuitry has the following characteristics: 1) Large data volume and high data rate: At high resolution, digital circuits need to process several gigabits per second of data. High-speed data transmission (such as LVDS interface) has strict requirements for timing convergence and signal integrity. 2) Multiple image modes: It needs to support multiple working modes such as high and low gain switching, windowed imaging, and test data. 3) The circuit is relatively complex: it outputs multiple readout timings and has timing edge adjustment functions; 4) Good low-temperature performance: Infrared image sensors usually require cooling during operation, so they have the ability to operate stably and normally in low-temperature environments, and the performance of the image sensor is almost unaffected. 5) Good radiation resistance: In aerospace applications, it is necessary to cope with the severe radiation environment of space. High-energy particles in space can easily induce problems such as single-event effect and total dose effect in digital circuits. Special readout circuit design can effectively prevent circuit failures and other malfunctions caused by cosmic radiation.

[0003] Since large-area infrared image sensors are mostly used in low-temperature, long-term, and continuous operating environments, higher requirements are placed on the effectiveness, reliability, and even service life of digital circuits. In particular, in aerospace applications, image sensors operate in the extreme environment of space for extended periods, facing severe challenges. If a circuit fails, the difficulty and cost of repair and maintenance are extremely high. Therefore, more scientific and reliable digital circuit verification methods are needed to conduct thorough and accurate simulation verification under various operating conditions to ensure the long-term stable and normal operation of the image sensor circuit.

[0004] Traditional chip digital circuit verification mainly includes: decomposing design feature points, analyzing verification points, formulating verification plans, writing stimuli according to the plans, and observing whether the design output meets expectations.

[0005] When using the aforementioned methods for digital circuit simulation and verification of large-area infrared image sensors, several problems often arise. Firstly, due to the large volume and high speed of data, traditional verification methods struggle to comprehensively cover all possible data scenarios, resulting in verification blind spots. Furthermore, when comparing and verifying output results with large amounts of image data, omissions are prone to occur. In addition, traditional verification methods lack targeted verification of chip characteristics, often failing to reproduce the chip's true operating condition and reducing the reliability of verification results. Secondly, for circuits with multiple modes and complex functions, traditional verification methods generally lack systematization, universality, and portability, resulting in low verification efficiency and difficulty in reusing them across different projects, thus affecting design progress. These shortcomings may extend or delay the design and development cycle of digital circuits; more importantly, they may introduce potential design flaws, leading to cost losses. Summary of the Invention

[0006] The technical problem solved by this invention is to overcome the shortcomings of the prior art and provide a verification method for the digital circuit design of a large-area infrared image sensor, which achieves the effect of quickly and accurately locating design problems.

[0007] The technical solution of this invention is: This invention discloses a verification method for the digital circuit design of a large-area infrared image sensor, comprising: The characteristics of the digital circuit design to be verified are analyzed, and the analysis results are obtained. The modules in digital circuit design are classified to obtain several modules to be modeled. Based on the analysis results, the inputs, outputs, and functions of the module to be modeled are modeled to form several general verification modules; Several general verification modules are interconnected with the digital circuit to be verified according to the connection requirements to establish a complete circuit and form a verification platform. Based on the verification platform, simulations were performed and simulation results were obtained; Based on the simulation results, the digital circuit design is optimized.

[0008] Furthermore, in the above method, the analysis of digital circuit design features to obtain analysis results specifically includes: The image size, image mode types, windowing methods, timing signal types, and special functional characteristics of digital circuit designs are organized to obtain a feature list; Based on the feature list, the similarities and differences between the digital circuit design and most of the verified large-area infrared image sensors in terms of function and characteristics are compared and analyzed to obtain the design characteristics. The design characteristics are quantified and parameterized to obtain the analysis results.

[0009] Furthermore, in the above method, the general verification module includes a register configuration unit verification module, a readout circuit timing generation unit verification module, a data processing unit verification module, and a special function module verification module; The register configuration unit verification module is used to verify the effectiveness of the read and write functions of all configuration registers of the large-area infrared image sensor and the accuracy of the refresh time. The readout circuit timing generation unit verification module is used to verify whether the readout circuit of the large-area infrared image sensor can output and control the timing signals required by the image sensor in different modes. The data processing unit verification module is used to verify whether the data processing unit circuit of the large-area infrared image sensor can achieve the expected image processing effect and whether the output image data is complete and accurate. The special function module verification module is used to verify whether other circuit modules with special functions of the large-area infrared image sensor can achieve the expected design functions and work normally.

[0010] Furthermore, in the above method, the register configuration unit modeling module includes: The communication protocol excitation generation module is used to configure commonly used communication protocols, generate excitation input signals, and output them to the module to be verified. The refresh control synchronization signal generation module is used to randomly generate the configuration address, data and refresh time, and send them to the configuration unit reference module. The configuration unit reference module establishes different types of register reference models based on the refresh time, generates the expected register configuration results at different times, and sends them to the comparison and verification module. The comparison and verification module automatically compares the refresh time and configuration values ​​based on the expected register configuration results and the actual simulated register configuration results, locates registers with inconsistent comparison results, and generates a register configuration problem report.

[0011] Furthermore, in the above method, the readout circuit timing generation unit verification module includes: The excitation generation module assigns different types of timing signal control methods to each control signal; assigns different boundary conditions according to the type of timing signal control method; and generates excitation signals according to the timing signal control method and boundary conditions. The timing generation unit reference module is used to classify and establish reference models according to the timing signal control method, and generate the desired results; The comparison and verification module uses high-frequency sampling to sample and output the timing simulation results generated by the excitation signal input to the module under test and the expected results of the reference model, thereby realizing automated comparison and verification and generating a timing problem location report.

[0012] Furthermore, in the above method, the data processing unit verification module includes: An automated image data stimulus generation module has configurable image size and image features, generates image data stimulus, and outputs it to the module to be verified. The data processing unit reference module configures the array size, image mode, and number of output channels, and generates a reference image signal, which is then sent to the report generation module. The report generation module uses a clock signal to sample the simulation result image data output by the module to be verified, and outputs serial image data; it compares the serial image data with the reference image signal to generate a verification report; the verification report includes the problems and data locations; based on the problems and data locations and the given image specifications, it locates the row and column where the pixel problem is located.

[0013] Furthermore, in the above method, the step of performing simulation based on the verification platform to obtain simulation results specifically includes: Based on the design goals of the digital circuit for the large-area infrared image sensor, a verification plan and verification objectives were formulated, and verification points were extracted and analyzed. According to the verification plan, the simulation verification platform was built from the bottom up, module by module, covering all verification points; Using simulation tools, a simulation verification platform was run to apply stimuli to the digital circuit design of the image sensor and record the response; By comparing the response of the tested design with the expected results, we can check whether the tested design has achieved the expected design goals, perform simulation coverage analysis, and finally obtain the simulation results.

[0014] The advantages of this invention over the prior art are as follows: (1) The present invention adopts a scheme of MATLAB-assisted excitation generation and automatic comparison of simulation results, which improves the simulation verification efficiency of digital circuits of large-area infrared image sensors, achieves the effect of rapid and accurate positioning of design problems, and solves the problem that existing traditional verification methods cannot efficiently and reliably verify large-scale designs.

[0015] (2) The present invention adopts a scheme of adding a parameter configuration interface for a large-area infrared image sensor to the simulation verification platform, which improves the portability of the simulation verification platform and makes the simulation verification platform applicable to digital circuits of large-area infrared image sensors of various specifications and types, thus solving the problem of lack of universality in existing image sensor digital circuit verification methods.

[0016] (3) The present invention adopts a back-end simulation scheme under various low-temperature conditions, which realizes the effect of restoring the most common low-temperature working environment of large-area infrared image sensors, ensuring the reliability of digital circuits at low temperatures, and solving the problem that existing verification methods ignore the impact of low-temperature environment on the performance of digital circuits.

[0017] (4) The present invention adopts a scheme of introducing an error injection mechanism in the simulation verification platform, which realizes the effect of simulating the single-event effect caused by radiation in the cosmic environment. It can effectively avoid the irreversible failure caused by radiation in the digital circuit of the image sensor during aerospace application, and solve the problem of lack of radiation-resistant targeted design in the existing verification method.

[0018] (5) This invention automatically compares the expected output and simulation output of a large amount of image data, which can quickly, accurately and efficiently locate design problems. The verification platform simulates a variety of special working environments of large-area infrared image sensors, such as space and low-temperature environments, to achieve targeted verification. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the digital circuit verification process of the present invention; Figure 2 This is a schematic diagram of the digital circuit verification platform architecture of the present invention. Detailed Implementation

[0020] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0021] This invention discloses a verification method for the digital circuit design of a large-area infrared image sensor, comprising: The characteristics of the digital circuit design to be verified are analyzed, and the analysis results are obtained. The modules in digital circuit design are classified to obtain several modules to be modeled. Based on the analysis results, the inputs, outputs, and functions of the module to be modeled are modeled to form several general verification modules; Several general verification modules are interconnected with the digital circuit to be verified according to the connection requirements to establish a complete circuit and form a verification platform. Based on the verification platform, simulations were performed and simulation results were obtained; Based on the simulation results, the digital circuit design is optimized.

[0022] Preferably, the analysis of digital circuit design features to obtain analysis results specifically includes: The image size, image mode types, windowing methods, timing signal types, and special functional characteristics of digital circuit designs are organized to obtain a feature list; Based on the feature list, the similarities and differences between the digital circuit design and most of the verified large-area infrared image sensors in terms of function and characteristics are compared and analyzed to obtain the design characteristics. The design characteristics are quantified and parameterized to obtain the analysis results.

[0023] Preferably, the general verification module includes a register configuration unit verification module, a readout circuit timing generation unit verification module, a data processing unit verification module, and a special function module verification module; The register configuration unit verification module is used to verify the effectiveness of the read and write functions of all configuration registers of the large-area infrared image sensor and the accuracy of the refresh time. The readout circuit timing generation unit verification module is used to verify whether the readout circuit of the large-area infrared image sensor can output and control the timing signals required by the image sensor in different modes. The data processing unit verification module is used to verify whether the data processing unit circuit of the large-area infrared image sensor can achieve the expected image processing effect and whether the output image data is complete and accurate. The special function module verification module is used to verify whether other circuit modules with special functions of the large-area infrared image sensor can achieve the expected design functions and work normally.

[0024] Preferably, the register configuration unit modeling module includes: The communication protocol excitation generation module is used to configure commonly used communication protocols, generate excitation input signals, and output them to the module to be verified. The refresh control synchronization signal generation module is used to randomly generate the configuration address, data and refresh time, and send them to the configuration unit reference module. The configuration unit reference module establishes different types of register reference models based on the refresh time, generates the expected register configuration results at different times, and sends them to the comparison and verification module. The comparison and verification module automatically compares the refresh time and configuration values ​​based on the expected register configuration results and the actual simulated register configuration results, locates registers with inconsistent comparison results, and generates a register configuration problem report.

[0025] Preferably, the readout circuit timing generation unit verification module includes: The excitation generation module assigns different types of timing signal control methods to each control signal; assigns different boundary conditions according to the type of timing signal control method; and generates excitation signals according to the timing signal control method and boundary conditions. The timing generation unit reference module is used to classify and establish reference models according to the timing signal control method, and generate the desired results; The comparison and verification module uses high-frequency sampling to sample and output the timing simulation results generated by the excitation signal input to the module under test and the expected results of the reference model, thereby realizing automated comparison and verification and generating a timing problem location report.

[0026] Preferably, the data processing unit verification module includes: An automated image data stimulus generation module has configurable image size and image features, generates image data stimulus, and outputs it to the module to be verified. The data processing unit reference module configures the array size, image mode, and number of output channels, and generates a reference image signal, which is then sent to the report generation module. The report generation module uses a clock signal to sample the simulation result image data output by the module to be verified, and outputs serial image data; it compares the serial image data with the reference image signal to generate a verification report; the verification report includes the problems and data locations; based on the problems and data locations and the given image specifications, it locates the row and column where the pixel problem is located.

[0027] Preferably, the step of performing simulation based on the verification platform to obtain simulation results specifically includes: Based on the design goals of the digital circuit for the large-area infrared image sensor, a verification plan and verification objectives were formulated, and verification points were extracted and analyzed. According to the verification plan, the simulation verification platform was built from the bottom up, module by module, covering all verification points; Using simulation tools, a simulation verification platform was run to apply stimuli to the digital circuit design of the image sensor and record the response; By comparing the response of the tested design with the expected results, we can check whether the tested design has achieved the expected design goals, perform simulation coverage analysis, and finally obtain the simulation results.

[0028] Example like Figure 1 As shown, this embodiment provides a verification method for the digital circuit design of a large-area infrared image sensor, which includes the following steps: This invention primarily introduces a verification method suitable for the digital circuit design of large-area infrared image sensors. It includes steps such as design feature analysis, verification platform establishment, front-end RTL functional simulation, back-end functional simulation, and FPGA simulation. Establishing the verification platform mainly includes steps such as stimulus generation, reference model establishment, and automated comparative verification. The specific process is as follows: Figure 1 As shown, the platform architecture is as follows Figure 2 As shown.

[0029] 1) Design Feature Analysis Step 1: Organize and summarize the characteristics of the design, such as image size, image mode types, windowing methods, timing signal types, and special functions; Step 2: Compare and analyze the similarities and differences between this digital circuit design and most of the large-area infrared image sensors that have been verified, and quantify and parameterize the design characteristics; Step 3: Based on the analysis results, summarize specific, measurable, and actionable verification points, determine verification strategies and methods based on the characteristics of the verification points, define coverage and acceptance criteria based on the verification points and image sensor functional indicators, and formulate a verification plan; in addition, key functions and risk points should be identified, key verification items should be marked, the types and number of incentives should be appropriately increased, the number of iterations should be increased, and more specific and targeted verification plans should be developed.

[0030] 2) Verification platform establishment Step 1: For different modules of digital circuit design (SPI register configuration unit, readout circuit timing generation unit, data processing unit, etc.), analyze the characteristics of each module and summarize them to ensure targeted verification with high coverage. Step 2: Based on the similarities, differences, and validation plan obtained in Step 1), a hierarchical validation platform for each module unit is established using Verilog and MATLAB (modularizing similarities and parameterizing differences). An example is provided below: (1) Register configuration unit: Module features: This module features a standardized communication protocol and specific requirements for register refresh timing.

[0031] Incentive generation: Establish a configurable stimulus generation module for commonly used communication protocols (such as I2C, SPI, etc.). Establish a configurable refresh control synchronization signal generation module for common types; For register read and write operations, the configuration address, data, and refresh time must be randomly generated. In particular, it is essential to ensure that each bit of the register is flipped.

[0032] Reference model establishment: Implement standard read / write functions for common communication protocols, such as SPI and I2C; establish different types of register reference models based on refresh times, such as: refresh registers at frame start time, refresh registers at refresh redundancy time, and refresh registers at arbitrary times, to obtain the desired register configuration results at different times.

[0033] Automated comparison and verification: The system automatically stores the simulation results of each register configuration, combines them with the expected configuration results, automatically compares the register configuration values ​​at different times, locates registers with inconsistent configuration values, and generates a register configuration simulation problem report.

[0034] (2) Readout circuit timing generation unit: Module features: This module features a large number of various control signals and strict requirements on the timing of output signals.

[0035] Incentive generation: For control signals, control methods are mainly divided into edge timing control, level length control, pulse timing control, and relative delay control. Different types of control methods have different boundary conditions. Therefore, excitation generation modules can be established according to the control method classification, and different configurable excitation constraint strategies can be adopted to generate as many excitations as possible in the boundary conditions of their respective verification focuses, thereby improving the reliability of verification.

[0036] Reference model establishment: Reference models are established according to the timing signal control method.

[0037] Automated comparison and verification: Since the timing of the output signal must strictly meet the requirements, a high-frequency sampling method is used to sample and output the timing simulation results and the expected results of the reference model, so as to realize automated comparison and verification and generate a report to locate timing problems at a certain moment; for signals of key interest, manual waveform phase comparison can be performed to ensure the accuracy of verification.

[0038] (3) Data processing unit: Module features: This module features large image data volume, multiple modes, and multiple channels.

[0039] Incentive generation: Leveraging MATLAB's strength in handling large matrix data, an automated image data excitation generation module was established. This module features configurable image size and image feature generation. Regarding image size, the width and height of the image can be configured to accommodate different project scales. For image features, numerical characteristics such as brightness, contrast, and noise level can be adjusted, generating more excitations for images of interest based on project requirements. Furthermore, regarding image modes, corresponding control signal excitations can be configured based on the number and method of image windowing, image preprocessing types, and test type, allowing for extensive permutation and combination of these modes and verification of all possible modes.

[0040] Reference model establishment: A reference model with configurable array size, image mode, and number of output channels is established based on MATLAB, and binary serial image data is output.

[0041] Automated comparison and verification: Imitating a real image acquisition system, the module uses the clock signal output to sample the data signal and output serial image data. It automatically compares the image data and generates a report. Based on the problem, data location, and given image specifications, it locates the pixel output problem in a certain row or column.

[0042] (4) For other modules with special functions: Without altering the existing verification platform framework, perform targeted verification of its functionality: For example, in aerospace applications, under the influence of single-event effects, the configuration registers in a chip may experience abnormal situations such as bit flipping. In this case, radiation-hardened design of the digital circuit is required, such as triple-modular redundancy. To verify the reliability of this function, an error injection mechanism was introduced into the simulation model based on Verilog to simulate the effects of single-event effects. The data in the registers was changed irregularly, randomly, and unpredictably at random times. This was used to verify whether the circuit could resume normal operation under such circumstances, thereby verifying the radiation resistance performance of the image sensor.

[0043] Step 3: Connect the modules according to their connection relationships to build a complete circuit, generate top-level excitation, and focus on verifying the configuration of the interconnection signals of each module.

[0044] Step 4: Under normal circumstances, the above-mentioned excitation constraints are within the normal range given by the design. However, it is also necessary to introduce an abnormal situation excitation generation function to generate excitations outside the normal situation constraints, record the output results under abnormal situations, and simulate and analyze whether the design can recover normal operation under subsequent normal conditions. This can avoid irreversible failures of image sensors under conditions such as configuration errors or environmental influences.

[0045] 3) Front-end RTL functional simulation Step 1: According to the verification plan, run the above simulation verification platform using the VCS simulation tool to obtain the simulation result reports generated by each module; Step 2: Observe the simulation results report, focusing on the parts where the simulation results are inconsistent with the expected results due to design problems and their locations, and find the code segment where the design problem occurs based on the location of each module; Step 3: Feed back the design problems and related code segments to the digital circuit designers for problem analysis and design updates and iterations. After the design is changed, re-simulate and verify it to find new design problems. Repeat this process multiple times to improve the design. Step 4: Use the VCS tool to perform simulation coverage analysis. If it is less than 99%, the excitation generation module needs to be adjusted to add more excitations until the theoretical maximum coverage of more than 99% is achieved. In particular, for image signal excitation, it is necessary to analyze whether the excitation image fully covers the points of interest based on the design features such as the special points of interest of the image sensor.

[0046] 4) Backend Function Simulation Step 1: After sufficient front-end verification, use the VCS tool to reverse-annotate the SDF file generated by the back-end circuit design into the design, and introduce delay information under various operating conditions; Step 2: Similar to step 3), use the simulation verification platform to perform functional verification of the design with delay information under various operating conditions. If the requirements are not met, analysis is required, and feedback is given to the front-end or back-end design for iteration. In particular, it is necessary to focus on verifying the function and performance of digital circuits under low-temperature operating conditions such as the space environment to simulate the operating environment of infrared image sensors, compare and evaluate various operating conditions, and analyze the fault risk points. Step 3: In particular, pay close attention to the phase relationship of the timing-generated waveform and the LVDS image output, such as the maximum delay difference between different image data channels. If the requirements are not met, feedback should be given to the backend design for iteration.

[0047] 5) FPGA simulation Step 1: To eliminate the difference between simulation and actual circuit, the design can be mapped to an FPGA for synthesis and testing. Virtual I / O interfaces can be reserved for the input items within the module for configuration. Step 2: Select some typical stimuli for testing and verification. Observe the test results intuitively through the image acquisition system and oscilloscope. If necessary, save the received images and use MATLAB to perform specific analysis on the images. Step 3: Analyze the observed non-compliance issues and provide feedback to the design team.

[0048] In terms of hardware modeling, the simulation verification platform uses the high-level hardware description language Verilog to accurately model the readout digital circuit of the large-area infrared image sensor. This modeling covers the entire digital circuit chain from pixel-level data acquisition to final data output, including various modules such as register configuration units, readout timing generation units, and data processing units, simulating the circuit structure under real-world conditions as closely as possible.

[0049] In terms of verification platform construction, a hierarchical and generalized simulation verification platform was built, including an stimulus generation module, a monitoring module, a reference model, and a result comparison module. It was improved and maintained in a hierarchical manner, which reduced the maintenance cost of the verification platform.

[0050] In terms of automation, the combination of Verilog and MATLAB languages ​​enables automated generation of stimuli, result comparison, and report generation, effectively improving verification efficiency. Specifically, in large-area infrared image sensors, the readout timing generation unit is characterized by containing a large number of various control signals and having strict requirements for the timing of output signals. To address these characteristics, a method of generating random stimuli by classifying different types of signals is adopted, and more stimuli are generated in the stimuli constraint intervals where problems are likely to occur (such as constraint boundary conditions). The data processing unit is characterized by a large amount of data and many modes. To address these characteristics, MATLAB-based automated generation of image signals with adjustable modes, desired signal output, and result comparison and analysis functions are implemented, enabling rapid and accurate problem location in massive amounts of data.

[0051] In terms of portability design, the similarities in function and characteristics of most large-area infrared image sensors are summarized, such as large-scale matrix data processing, periodic time-series generation, and similar windowing patterns. Common differences between projects are also summarized, such as image specifications, image modes, and types of time-series signals. A hierarchical verification module is designed for the similarities, exhibiting high versatility across different projects. For the differences, a parameterized configuration interface is implemented to minimize platform modifications and ensure cross-project reusability.

[0052] In terms of targeted design, the differences between large-area infrared image sensors and other image sensor digital circuits in terms of circuit structure, functional characteristics, and application scenarios were compared, such as larger data volume, low temperature working environment, and aerospace working environment. Based on these characteristics, the verification platform was adapted to these characteristics, such as automated data comparison and positioning, adding back-end simulation under various low temperature conditions, and error injection simulation simulating irradiation environment, so as to restore the real working state as much as possible, so as to achieve more targeted simulation verification and further reduce the failure risk in the design.

[0053] The verification process includes: pre-simulation, which is functional verification based on RTL code, generating test cases with the highest possible coverage to verify the correctness of the logic; post-simulation, which introduces gate-level netlists and delay information to verify whether the circuit timing meets the design specifications; and FPGA simulation, which maps the design to FPGA hardware, using image acquisition systems and oscilloscopes to collect and compare output data in real time to verify the actual hardware behavior. Each verification step requires iterative adjustments to the design to address any issues, thoroughly investigating and resolving problems before proceeding to the next step. A unified data interface ensures consistency of results at each stage, achieving a comprehensive and systematic verification process that guarantees thorough and accurate verification.

[0054] Although the present invention has been described in detail through the preferred embodiments above, it should be understood that the above description should not be considered as a limitation of the present invention. Various modifications and substitutions to the present invention will be apparent to those skilled in the art after reading the above description. Therefore, the scope of protection of the present invention should be defined by the appended claims.

[0055] The contents not described in detail in this specification are common knowledge to those skilled in the art.

Claims

1. A verification method for the digital circuit design of a large-area infrared image sensor, characterized in that, include: The characteristics of the digital circuit design to be verified are analyzed, and the analysis results are obtained. The modules in digital circuit design are classified to obtain several modules to be modeled. Based on the analysis results, the inputs, outputs, and functions of the module to be modeled are modeled to form several general verification modules; Several general verification modules are interconnected with the digital circuit to be verified according to the connection requirements to establish a complete circuit and form a verification platform. Based on the verification platform, simulations were performed and simulation results were obtained; Based on the simulation results, the digital circuit design is optimized.

2. The verification method for the digital circuit design of a large-area infrared image sensor according to claim 1, characterized in that, The analysis of digital circuit design features yields the following results: The image size, image mode types, windowing methods, timing signal types, and special functional characteristics of digital circuit designs are organized to obtain a feature list; Based on the feature list, the similarities and differences between the digital circuit design and most of the verified large-area infrared image sensors in terms of function and characteristics are compared and analyzed to obtain the design characteristics. The design characteristics are quantified and parameterized to obtain the analysis results.

3. The verification method for the digital circuit design of a large-area infrared image sensor according to claim 1, characterized in that, The general verification module includes a register configuration unit verification module, a readout circuit timing generation unit verification module, a data processing unit verification module, and a special function module verification module. The register configuration unit verification module is used to verify the effectiveness of the read and write functions of all configuration registers of the large-area infrared image sensor and the accuracy of the refresh time. The readout circuit timing generation unit verification module is used to verify whether the readout circuit of the large-area infrared image sensor can output and control the timing signals required by the image sensor in different modes. The data processing unit verification module is used to verify whether the data processing unit circuit of the large-area infrared image sensor can achieve the expected image processing effect and whether the output image data is complete and accurate. The special function module verification module is used to verify whether other circuit modules with special functions of the large-area infrared image sensor can achieve the expected design functions and work normally.

4. The verification method for the digital circuit design of a large-area infrared image sensor according to claim 3, characterized in that, The register configuration unit modeling module includes: The communication protocol excitation generation module is used to configure commonly used communication protocols, generate excitation input signals, and output them to the module to be verified. The refresh control synchronization signal generation module is used to randomly generate the configuration address, data and refresh time, and send them to the configuration unit reference module. The configuration unit reference module establishes different types of register reference models based on the refresh time, generates the expected register configuration results at different times, and sends them to the comparison and verification module. The comparison and verification module automatically compares the refresh time and configuration values ​​based on the expected register configuration results and the actual simulated register configuration results, locates registers with inconsistent comparison results, and generates a register configuration problem report.

5. The verification method for the digital circuit design of a large-area infrared image sensor according to claim 3, characterized in that, The readout circuit timing generation unit verification module includes: The excitation generation module assigns different types of timing signal control methods to each control signal; assigns different boundary conditions according to the type of timing signal control method; and generates excitation signals according to the timing signal control method and boundary conditions. The timing generation unit reference module is used to classify and establish reference models according to the timing signal control method, and generate the desired results; The comparison and verification module uses high-frequency sampling to sample and output the timing simulation results generated by the excitation signal input to the module under test and the expected results of the reference model, thereby realizing automated comparison and verification and generating a timing problem location report.

6. The verification method for the digital circuit design of a large-area infrared image sensor according to claim 3, characterized in that, The data processing unit verification module includes: An automated image data stimulus generation module has configurable image size and image features, generates image data stimulus, and outputs it to the module to be verified. The data processing unit reference module configures the array size, image mode, and number of output channels, and generates a reference image signal, which is then sent to the report generation module. The report generation module uses a clock signal to sample the simulation result image data output by the module to be verified, and outputs serial image data; it compares the serial image data with the reference image signal to generate a verification report; the verification report includes the problems and data locations; based on the problems and data locations and the given image specifications, it locates the row and column where the pixel problem is located.

7. The verification method for the digital circuit design of a large-area infrared image sensor according to claim 1, characterized in that, The simulation, based on the verification platform, is performed to obtain the simulation results, specifically as follows: Based on the design goals of the digital circuit for the large-area infrared image sensor, a verification plan and verification objectives were formulated, and verification points were extracted and analyzed. According to the verification plan, the simulation verification platform was built from the bottom up, module by module, covering all verification points; Using simulation tools, a simulation verification platform was run to apply stimuli to the digital circuit design of the image sensor and record the response; By comparing the response of the tested design with the expected results, we can check whether the tested design has achieved the expected design goals, perform simulation coverage analysis, and finally obtain the simulation results.

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