A space particle environment simulation system and method

Abstract

The application belongs to the technical field of space particle environment simulation, and provides a space particle environment simulation system and method.The system comprises a vacuum cabin body, a multi-beam line incidence unit connected with the vacuum cabin body, a first beam line incidence unit, a second beam line incidence unit, the first beam line incidence unit comprising a first adjusting support assembly and a first beam line incidence cone, the second beam line incidence unit comprising a second adjusting support assembly and a second beam line incidence cone, and a control device used for determining correction amounts of an incidence point of the simulated proton beam line and an incidence point of the simulated electron beam line in a vacuum extraction process of the vacuum cabin body, and correcting positions of the first incidence point of the simulated proton beam line and the second incidence point of the simulated electron beam line by moving operations of the first adjusting support assembly and the second adjusting support assembly.The application improves the convergence accuracy of multiple simulated beam lines and the automatic correction process of the incidence points of the simulated beam lines.

Description

Technical Field

[0001] This application relates to the field of space particle environment simulation technology, and more specifically, to a space particle environment simulation system and method. Background Technology

[0002] Space particles, as high-energy particle streams in space, cause radiation effects that are among the core factors influencing the long-term operation of spacecraft, the safety of astronauts in orbit, and the success of deep space exploration missions. Ground-based simulations of the comprehensive space particle environment require the generation of equivalent particle beamlines via accelerators. After convergence, these beamlines form a radiation field that conforms to the actual radiation characteristics of space, providing crucial experimental conditions for material durability testing and verification of the radiation resistance performance of electronic devices. As the space program expands into deep space exploration and manned lunar landing, stringent requirements are placed on the convergence accuracy (such as beam size and divergence angle control), stability, and environmental adaptability of the simulated beamlines.

[0003] Existing technologies suffer from the following main problems. Most existing systems employ traditional rigid guide rails or simple flexible hinge structures, which are susceptible to internal and external disturbances such as ground vibration, temperature fluctuations, and device parameter drift under radiation conditions. This results in weak anti-disturbance capabilities, making it difficult to achieve high-precision focusing control. Consequently, beam dispersion and uneven radiation dose distribution occur, leading to insufficient beam convergence accuracy and an inability to accurately reproduce the radiation intensity and spatial distribution characteristics of space particles. Furthermore, space particle simulation requires comprehensive scenarios encompassing multiple particle types and a wide energy range. Existing systems' focusing mechanisms lack adaptability to the physical characteristics of different particle beams, further reducing the realism of the simulation. In addition, The calibration process is complex and lacks real-time self-calibration capabilities. Furthermore, existing systems are mostly single-function designs, making them incompatible with integrated environmental simulation cabin effects. This results in a disconnect between beamline transmission and the physical processes of environmental simulation, leading to discrepancies between the simulated scenario and the real space environment. In addition, factors such as beamline component misalignment and sensor noise can easily cause beam loss and increased emittance, further limiting the improvement of simulation accuracy.

[0004] Therefore, it is necessary to provide a space particle environment simulation system and method to solve one of the aforementioned technical problems. Summary of the Invention

[0005] The purpose of this application is to provide a space particle environment simulation system and method that can solve at least one of the technical problems mentioned above. The specific solution is as follows: According to a specific embodiment of this application, this application provides a space particle environment simulation system, comprising: a vacuum chamber for simulating an irradiated space environment formed by the convergence of multiple simulated beamlines under vacuum conditions; a multi-beamline incident unit connected to the vacuum chamber, the multi-beamline incident unit including a first beamline incident unit and a second beamline incident unit, the first beamline incident unit including a first adjustment support assembly and a first beamline incident cone connected to the vacuum chamber, the second beamline incident unit including a second adjustment support assembly and a second beamline incident cone connected to the vacuum chamber; the first beamline incident unit is used to direct simulated proton beamlines through the first beamline incident unit. The second beamline incident unit is used to project the simulated electron beamline through the second beamline incident cone into the beamline convergence point inside the vacuum chamber. A control device, electrically connected to the first and second adjustment support assemblies, is used to determine the correction amount of the incident point of the simulated proton beamline and the incident point of the simulated electron beamline during vacuum extraction within the vacuum chamber. This control device controls the first and second adjustment support assemblies to perform movement operations to correct the position of the first incident point of the simulated proton beamline and the position of the second incident point of the simulated electron beamline.

[0006] According to a specific embodiment of this application, this application also provides a space particle environment simulation method, which utilizes the space particle environment simulation system described in this application, including: determining the installation error parameter limit range before installing the first beamline incident cone and the second beamline incident cone; during the installation process of the first beamline incident cone and the second beamline incident cone, controlling and adjusting the installation position of the midpoint of each simulated beamline that has shifted according to the determined initial installation offset, so as to further determine that the position of the incident point of each simulated beamline meets the installation error parameter limit range; acquiring the vacuum pressure and vacuum deformation during the vacuuming process of the vacuum chamber, performing simulation analysis, fitting a pressure-point position correction curve, and using the pressure-point position correction curve to calculate the correction amount of the incident point of the simulated beamline.

[0007] Compared with the prior art, the above-described solutions of this application have at least the following beneficial effects: This application utilizes multiple beamline incident cones connected to a vacuum chamber to project multiple simulated beamlines into a beamline convergence point within the vacuum chamber. This simulates the irradiation environment formed by the convergence of multiple simulated beamlines under vacuum conditions. A control device determines the correction amounts for the incident points of the simulated proton beamline and the simulated electron beamline during vacuum extraction within the vacuum chamber. This control drives the first and second adjustment support assemblies to move and correct the positions of the first incident point of the simulated proton beamline and the second incident point of the simulated electron beamline. This automates the correction of the simulated beamlines, resulting in more accurate multiple simulated beamlines and improved convergence accuracy. Attached Figure Description

[0008] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application. It is obvious that the drawings described below are merely some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings: Figure 1 This is a schematic diagram of the structure of a space particle environment simulation system according to an embodiment of this application; Figure 2 This is a partial structural schematic diagram of the space particle environment simulation system according to an embodiment of this application, viewed from one angle. Figure 3 This is a schematic diagram of the structure of an example of a space particle environment simulation system according to an embodiment of this application; Figure 4 This is a schematic diagram of the structure of another example of a space particle environment simulation system according to an embodiment of this application; Figure 5 This is an example diagram of the pressure versus point position correction curve in an application example of the space particle environment simulation system of this application embodiment; Figure 6 This is a schematic flowchart of the space particle environment simulation method according to an embodiment of this application; Figure 7 This is a schematic diagram illustrating the principle of system installation deviation in the space particle environment simulation method of this application, as shown in an embodiment of this application. Detailed Implementation

[0009] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0010] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that an article or device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such an article or device. Without further limitation, an element defined by the phrase "comprising one" does not exclude the presence of other identical elements in the article or device that includes said element.

[0011] This application provides a space particle environment simulation system. The system utilizes multiple beamline incident cones connected to a vacuum chamber to project multiple simulated beamlines into a beamline convergence point within the vacuum chamber, simulating an irradiated space environment formed by the convergence of multiple simulated beamlines under vacuum conditions. A control device determines the correction amounts for the incident points of the simulated proton beamline and the simulated electron beamline during vacuum extraction within the vacuum chamber. This control drives the first and second adjustment support assemblies to move and correct the positions of the first incident point of the simulated proton beamline and the second incident point of the simulated electron beamline. This system automates the correction of the simulated beamlines, obtains more accurate multiple simulated beamlines, and thus improves the convergence accuracy of the multiple simulated beamlines.

[0012] It should be noted that the system of this application has a wide range of applications, especially suitable for space particle comprehensive environment simulation experiments, specifically for deep space exploration, manned lunar landing, and high-orbit satellite reliability assurance projects. Specifically, it provides a high-precision self-calibration method to address the particle beamline deviation problem caused by changes in the vacuum environment when simulating space particle irradiation in ground-based space environment simulation systems. For example, it can directly serve experiments such as radiation hardening testing of aerospace-grade chips and screening of long-life materials for spacecraft.

[0013] The following is in conjunction with the appendix Figures 1 to 5 Detailed description of optional embodiments of the system in this application.

[0014] like Figure 1 As shown, the space particle environment simulation system 100 of this application includes a vacuum chamber 110, a multi-beam incident unit 120 connected to the vacuum chamber 110, and a control device 140.

[0015] Specifically, the vacuum chamber 110 is used to simulate the irradiation space environment formed by the convergence of multiple simulated beamlines in a vacuum environment. The simulated beamlines include a simulated proton beamline 300 and a simulated electron beamline 400. The vacuum chamber 110 is hemispherical, and a focusing plane 200 is formed within the vacuum chamber 110. The center point O of this focusing plane 200 is used as the beamline convergence point for the convergence of multiple simulated beamlines. See [link to details] for further information. Figure 2 .

[0016] The multi-beam incident unit 120 is connected to the vacuum chamber 110. The multi-beam incident unit 120 includes a first beam incident unit 121 and a second beam incident unit 122 (see details). Figure 3 The first beamline incident unit 121 includes a first adjusting support assembly 1210 and a first beamline incident cone 1215 connected to the vacuum chamber 110. The second beamline incident unit 122 includes a second adjusting support assembly 1220 and a second beamline incident cone 1225 connected to the vacuum chamber 110. The first beamline incident unit 121 is used to project a simulated proton beamline 300 through the first beamline incident cone 1215 to a beamline convergence point within the vacuum chamber 110. The second beamline incident unit 122 is used to project a simulated electron beamline 400 through the second beamline incident cone 1225 to a beamline convergence point within the vacuum chamber 110. For example, the first beamline incident unit 121 is a proton beamline incident unit, and the second beamline incident unit 122 is an electron beamline incident unit. See [link to relevant documentation] for details. Figure 3 and Figure 4 .

[0017] Therefore, the simulated proton beam 300 and simulated electron beam 400 can be incident into the vacuum chamber 110 through the multi-beam incident unit 120. Specifically, the simulated proton beam passes through the first incident point O1 and the first intermediate point on the first beam incident cone 1215 (specifically located at the connection between the first beam incident cone and the vacuum chamber, see [reference]). Figure 3 Simulated electron beams, via a second incident point O2 and a second intermediate point (specifically located at the connection between the second beam incidence cone and the vacuum chamber) O2' on the second beam incidence cone 1225, enter the vacuum chamber 110 and converge at the beam convergence point. The simulated proton beam 300 and simulated electron beam 400, through their respective incident points O2 and O2', enter the vacuum chamber 110 and converge at the beam convergence point to form an irradiated space environment.

[0018] In one specific embodiment, the system of this application further includes a pressure measuring instrument 131, a laser tracker 132, and a control device 140.

[0019] Specifically, the pressure measuring instrument 131 is used to measure the vacuum pressure data (i.e., the vacuum pressure value during the vacuum extraction process of the vacuum chamber 110) during the vacuum extraction process. The laser tracker 132 is used to measure the position information characterizing the offset of the simulated proton beamline 300 and the simulated electron beamline 400 during the vacuum extraction process of the vacuum chamber 110.

[0020] Furthermore, the positional information characterizing the offset of the simulated proton beamline 300 and the simulated electron beamline 400 includes the positional information of the first incident point O1 and the first intermediate point O1' of the simulated proton beamline 300, and the positional information of the second incident point O2 and the second intermediate point O2' of the simulated electron beamline 400.

[0021] In addition, the laser tracker 132 is also used to measure the incident point corresponding to each simulated beamline during the installation of the multi-beamline incident unit 120 and during the installation and calibration process (e.g., specifically corresponding to...). Figure 3 The first incident point O1 and the second incident point O2 shown), the intermediate point (for example, corresponding to Figure 3 The location information of the first intermediate point O1' and the second intermediate point O2' shown.

[0022] The control device 140 is electrically connected to the pressure measuring instrument 131 and the laser tracker 132, respectively. The control device 140 determines the correction amount of the first incident point O1 of the simulated proton beam 300 and the second incident point O2 of the simulated electron beam 400 during the vacuum extraction process of the vacuum chamber 110 based on the position information characterizing the offset of the simulated proton beam 300 and the simulated electron beam 400. It then controls the first adjustment support assembly 1210 and the second adjustment support assembly 1220 to perform movement operations to correct the position of the first incident point O1 of the simulated proton beam 400 and the position of the second incident point O2 of the simulated electron beam 400.

[0023] It should be noted that there is no particular limitation on the number of the first and second beamline incident cones; there can be three or more, depending on the desired irradiation environment. The above is merely an optional example and should not be construed as a limitation of this application.

[0024] Optionally, the control device 140 is used to determine the initial installation deviation when installing the first beamline incident cone 1215 and the second beamline incident cone 1225, and to control and adjust the installation position of the first intermediate point O1' of the simulated proton beamline 300 and the second intermediate point O2' of the simulated electron beamline 400 based on the maximum deformation obtained by cabin mechanical simulation analysis and the initial installation deviation and the maximum deformation.

[0025] After the first beamline incident cone 1215 and the second beamline incident cone 1225 are installed and under atmospheric conditions, the actual position of the first midpoint O1' of the simulated proton beamline 300 is measured, and the ideal distance is determined by the extension of the line connecting the first midpoint O1' and the beamline convergence point, so as to calculate the position information of the first incident point O1.

[0026] In one specific embodiment, a pressure versus point position correction curve is obtained by fitting the measured vacuum pressure data, the position information of the first incident point O1 of the simulated proton beam, and the position information of the second incident point O2 of the simulated electron beam.

[0027] The control device integrates the pressure and point position correction curves to output the correction amount of the first incident point O1 of the simulated proton beam and the correction amount of the second incident point O2 of the simulated electron beam when the vacuum pressure value is input.

[0028] exist Figure 3 In the example, the measuring device 130 includes a pressure measuring instrument 131 and a laser tracker 132. The laser tracker 132 is used to measure the position information characterizing the offset of the simulated proton beam 300 and the simulated electron beam 400 during the vacuum extraction process of the vacuum chamber 110, and to measure the vacuum pressure data during the vacuum extraction process of the vacuum chamber 110. The laser tracker 132 is also used to measure the position information of the first incident point O1 and the first intermediate point (i.e., the vacuum chamber incident point of the simulated proton beam) O1' of the simulated proton beam under atmospheric conditions, and the position information of the second incident point O2 and the second intermediate point (i.e., the vacuum chamber incident point of the simulated electron beam) O2' of the simulated electron beam, so as to obtain the initial position information of the first incident point O1, the first intermediate point O1', the second incident point O2, and the second intermediate point O2', so as to provide reference position information for subsequent calibration.

[0029] Optionally, when installing the first beamline incident unit 121 and the second beamline incident unit 122, a laser tracker 132 is used to track multiple target points on the bottom surface inside the vacuum chamber 110 to determine the focusing plane 200, and the center point O of the focusing plane 200 is used as the beamline convergence point for multiple simulated beamlines to converge.

[0030] exist Figure 3 In the example, the first beamline incident unit 121 and the second beamline incident unit 122 are respectively connected to the left and right sides of the vacuum chamber 110.

[0031] It should be noted that the multi-beam incident unit may also include a third beam incident unit, a fourth beam incident unit, and so on. In other words, the multi-beam incident unit includes at least one electron beam incident module and at least one proton beam incident module. The above description is only provided as an optional example and should not be construed as limiting the present invention.

[0032] Specifically, the first beamline incident unit 121 includes a first beamline incident cone 1215, a first corrugated pipe 1213, and a first adjusting support assembly 1210. The first corrugated pipe 1213 connects the first beamline incident cone 1215 to the vacuum chamber 110, so that during the vacuuming process of the vacuum chamber, the first beamline incident cone 1215 can flexibly follow the deformation of the vacuum chamber 110, thereby deforming more smoothly without damaging the first beamline incident cone 1215 and the connection between the first beamline incident cone 1215 and the vacuum chamber 110.

[0033] Furthermore, the first adjusting support assembly 1210 includes a first adjusting leg 1211 connected to the first wire incident cone 1215, a first adjusting support 1212 connected to the first adjusting leg 1211, and a plurality of axial adjusting motors mounted on the first adjusting support 1212 (in this example, the plurality of axial adjusting motors are integrated into the first adjusting support 1212, specifically including a first axial adjusting motor 1216, a second axial adjusting motor 1217, and a third axial adjusting motor 1218 corresponding to the X-axis, Y-axis, and Z-axis, respectively; see details). Figure 3 (The right side of the middle section) so that when the first incident point O1 of the simulated proton beam is deviated during the vacuum extraction process of the vacuum chamber 110, the control device 140 can drive the first axial adjustment motor 1216, the second axial adjustment motor 1217, and the third axial adjustment motor 1218 to perform a movement operation to correct the position of the first incident point, and make the beam convergence point O, the deviated first incident point O1, and the first intermediate point O1' collinear.

[0034] Next, the second beamline incident unit 122 includes a second beamline incident cone 1225, a second bellows 1223, and a second adjusting support assembly 1220. The second bellows 1223 connects the second beamline incident cone 1225 to the vacuum chamber 110, so that during the vacuuming process of the vacuum chamber 110, the second beamline incident cone 1225 can flexibly follow the deformation of the vacuum chamber 110, thus deforming more smoothly without damaging the second beamline incident cone 1225 and the connection between the second beamline incident cone 1225 and the vacuum chamber 110. The second adjusting support assembly 1220 includes a second adjusting leg 1221 connected to the second beam incidence cone 1225, a second adjusting support 1222 connected to the second adjusting leg 1221, and a plurality of axial adjusting motors mounted on the second adjusting support 1222 (in this example, the plurality of axial adjusting motors are integrated into the second adjusting support 1222, specifically including a fourth axial adjusting motor 1226, a fifth axial adjusting motor 1227, and a sixth axial adjusting motor 1228 corresponding to the X-axis, Y-axis, and Z-axis, respectively; see details). Figure 3 The left side of the middle section is such that when the second incident point O2 of the simulated proton beam is deviated during the vacuum extraction process of the vacuum chamber 110, the control device 140 can drive the fourth axial adjustment motor 1226, the fifth axial adjustment motor 1227, and the sixth axial adjustment motor 1228 to perform a movement operation to correct the position of the second incident point O2, and make the beam convergence point O, the deviated second incident point O2, and the second intermediate point O2' collinear.

[0035] like Figure 3 and Figure 4 As shown, the simulated proton beamline 300 and the simulated electron beamline 400 are symmetrically pointed at the beamline convergence point inside the vacuum chamber 110 at a specified angle (e.g., 45° to 90°).

[0036] Optionally, the first adjusting leg 1211 of the first adjusting support assembly 1210 is rigidly connected to the first wire incident cone 1215, and the second adjusting leg 1221 of the second adjusting support assembly 1220 is rigidly connected to the second wire incident cone. This allows for more precise correction of the position of the first incident point (e.g., correction to point R on a specified circular area) when the control device 140 drives the first axial adjusting motor 1216, the second axial adjusting motor 1217, and the third axial adjusting motor 1218 to perform a movement operation to correct the position of the first incident point O1, while meeting the installation error parameter limitation range. The installation error parameter limitation range includes the specified circular area and the specified wire length range.

[0037] Specifically, based on the vacuum deformation obtained through cabin mechanical simulation analysis and the obtained vacuum pressure value, a pressure-point position correction curve is fitted. This pressure-point position correction curve represents the correspondence between the vacuum pressure and the correction amount at the first incident point of the simulated proton beam and the correction amount at the second incident point of the simulated electron beam (e.g., ...). Figure 5 The pressure and point position correction curves shown, from top to bottom, are as follows: the first curve represents the first axial correction amount △O1'x along the X-axis, the second curve represents the third axial correction amount △O1'z along the Z-axis, and the third curve represents the second axial correction amount △O1'y along the Y-axis. Specifically, the fitted pressure and point position correction curves are integrated into the control device 140. In this case, the system of this application only needs to input the vacuum pressure value into the control device to obtain the correction amount of the first incident point and the correction amount of the second incident point of the simulated electron beam (including the first axial correction amount △O1'x along the X-axis, the second axial correction amount △O1'y along the Y-axis, and the third axial correction amount △O1'z along the Z-axis). In other words, a laser tracker is not required; the control device 140 can drive the adjustment motors of the first adjustment support assembly and the adjustment motors of the second adjustment support assembly to adjust the corresponding distances according to the changes in vacuum pressure.

[0038] Furthermore, based on the obtained correction amount of the first incident point, the multiple axial adjustment motors of the first adjustment support assembly (specifically including the first axial adjustment motor, the second axial adjustment motor, and the third axial adjustment motor) are driven to move along the corresponding axes to correct the position of the first incident point. And based on the obtained correction amount of the second incident point, the multiple axial adjustment motors of the second adjustment support assembly (specifically including the fourth axial adjustment motor, the fifth axial adjustment motor, and the sixth axial adjustment motor) are driven to move along the corresponding axes to correct the position of the second incident point.

[0039] In the system of this application, each simulated beamline passes through a beamline incident cone and is connected to the vacuum chamber via a first bellows and a second bellows, forming a flexible connection. This allows the first beamline incident cone to move independently relative to the vacuum chamber under the drive of an external adjusting motor, while flexibly following the deformation of the vacuum chamber, thus enabling smoother deformation without damaging the first beamline incident cone, the second beamline incident cone, the connection between the first beamline incident cone and the vacuum chamber, and the connection between the second beamline incident cone and the vacuum chamber. Furthermore, by utilizing high-precision control through multi-dimensional coupling of mechanics, vacuum, and physics—that is, through the collaborative efforts of multiple axial adjusting motors and bellows compensation—more accurate simulations of space particle environments such as cosmic protons and electron irradiation are achieved.

[0040] It should be noted that the above is only an optional example and should not be construed as a limitation of this application.

[0041] Compared with existing technologies, this application utilizes multiple beamline incident cones connected to a vacuum chamber to project multiple simulated beamlines into a beamline convergence point within the vacuum chamber. This simulates the irradiation space environment formed by the convergence of multiple simulated beamlines under vacuum conditions. A control device determines the correction amounts for the incident points of the simulated proton beamline and the simulated electron beamline during vacuum extraction within the vacuum chamber. This control drives the first and second adjustment support assemblies to move and correct the positions of the first incident point of the simulated proton beamline and the second incident point of the simulated electron beamline. This automates the correction of the simulated beamlines, yields more accurate multiple simulated beamlines, and ultimately improves the convergence accuracy of the multiple simulated beamlines.

[0042] Furthermore, this application optimizes the connection between the beamline incident cone and the vacuum chamber of the multi-beamline incident unit into a bellows. Specifically, each simulated beamline passes through a beamline incident cone and is connected to the vacuum chamber through a bellows, forming a flexible connection. This allows the beamline incident cone to move independently relative to the vacuum chamber under the drive of an external adjusting motor. High-precision control is achieved through the multi-dimensional coupling of mechanics, vacuum, and physics. That is, through the collaborative efforts of multiple axial adjusting motors and bellows compensation, more accurate simulation of space environments such as space proton and electron irradiation is realized. The control device with integrated correction method controls the corresponding adjusting motor to perform movement operations to complete the correction process of the simulated beamline, enabling a higher precision automatic correction process.

[0043] The following is in conjunction with the appendix Figure 2 , Figure 3 , Figure 6 , Figure 7 Detailed description of optional embodiments of the method of this application.

[0044] like Figure 6 As shown, this application also provides a space particle environment simulation method, which is executed using the space particle environment simulation system of this application, and specifically includes the following steps.

[0045] First, in step S601, before installing the first beamline incident cone and the second beamline incident cone, the installation error parameter limit range is determined.

[0046] Reference Figure 7 The installation deviation diagram shown provides a detailed explanation of the range of installation error parameters.

[0047] Before installing the first and second beamline incident cones in the space particle environment simulation system, the maximum permissible deviations of the first incident point O1 and the first intermediate point O1' of the simulated proton beamline, and the maximum permissible deviations of the second incident point O2 and the second intermediate point O2' of the simulated electron beamline are determined based on the system deviations.

[0048] The following example illustrates how to determine the maximum permissible deviation between the first incident point O1 and the first intermediate point O1'.

[0049] It should be noted that the determination process for the maximum permissible deviation of the first incident point O1 and the first intermediate point O1' of the simulated proton beam, and the maximum permissible deviation of the second incident point O2 and the second intermediate point O2' of the simulated electron beam is roughly the same, so repeated explanations of the same content are omitted.

[0050] Specifically, the maximum permissible deviation of the first incident point O1 is determined based on the systematic deviation of the simulated beamline, as follows: Figure 7 The specified circular area C with a radius of 3mm (re=3mm) is shown. In other words, as long as the position of the first incident point O1 after the offset is still within the specified circular area C, it can be determined that the current offset of the first incident point O1 meets the installation error parameter limit range.

[0051] Based on the cabin mechanical simulation analysis, the maximum deformation of the first intermediate point O1' is obtained (e.g. Figure 2 As shown, △S represents the distance by which the first intermediate point O1' shifts in the direction T perpendicular to the axis of the first beamline incident cone of the first beamline incident unit, and △S1 represents the distance by which the first intermediate point O1' shifts in the direction T perpendicular to the axis of the first beamline incident cone of the first beamline incident unit when the vacuum chamber is evacuated at a specific evacuation pressure, to determine the initial installation offset, which is the maximum deformation △S of the first intermediate point O1' minus the evacuation deformation △S.

[0052] Based on the initial installation deviation and the maximum deformation, the installation positions of the first midpoint of the simulated proton beamline and the second midpoint of the simulated electron beamline are controlled and adjusted.

[0053] Specifically, the specific vacuum pressure is, for example, in the range of 10 Pa to 100,000 Pa.

[0054] It should be noted that the above is only an optional example and should not be construed as a limitation of this application.

[0055] Next, in step S602, during the installation of the first beamline incident cone and the second beamline incident cone, the installation position of the midpoint of each simulated beamline that has shifted is controlled and adjusted according to the determined initial installation offset, so as to further determine that the position of the incident point of each simulated beamline meets the installation error parameter limit range.

[0056] Specifically, during the installation of the first beamline incident cone and the second beamline incident cone, a laser tracker can be used to control the installation position of the first intermediate point O1' based on the determined initial installation offset (△S2=△S-△S1). The first intermediate point O1' represents the position point after the first beamline incident cone and the second beamline incident cone are installed. Specifically, the actual position of the first intermediate point O1' is between O1'' and U, and O1'' represents the first intermediate point under ideal conditions.

[0057] Alternatively, the maximum deformation of the first intermediate point O1' can also be represented, for example, by the angle α-β formed by the line segment OU formed by the convergence point O of the beamlines and the offset first intermediate point U, and the axis of the first beamline incident cone under atmospheric conditions (see details). Figure 2 ).

[0058] from Figure 7 As can be seen from the above, assuming the actual distance between the first incident point and the beam convergence point during installation is L (for example, L = 5800 ± 3 mm), the maximum angular deviation between the actual center axis and the ideal center axis can be expressed by the following expression: (1) in, The actual center axis represents the maximum angular deviation between the actual and ideal center axes; L represents the actual distance between the first incident point and the beam convergence point during installation; L0 represents the ideal distance between the first incident point and the beam convergence point under ideal conditions; r e Indicates the radius of the specified circular region.

[0059] Therefore, during the installation of the first beam incidence cone and the second beam incidence cone, as long as the following two parameter constraints are met simultaneously, the installation deviation will be within a controllable range.

[0060] (2) Where L represents the actual distance between the first incident point and the convergence point of the simulated proton beam during the installation process; This represents the maximum angular deviation between the actual center axis and the ideal center axis. This represents the angular deviation between the actual central axis and the ideal central axis of the first beam incident cone.

[0061] Regarding the vacuum deformation, by performing multiple vacuum extractions at different vacuum pressures, measuring the position information of the first midpoint of the simulated proton beam and the first midpoint of the simulated electron beam, and using chamber mechanics simulation analysis to obtain the vacuum deformation, the initial installation offset can be accurately determined. Further, based on the initial installation offset, the actual positions of the first and second midpoints where vacuum deformation occurs can be determined. Using the actual positions of the first and second midpoints, and drawing a line connecting the first midpoint and the beam convergence point, extending this line according to the principle that the first incident point, first midpoint, and beam convergence point are collinear yields a more precise position of the first incident point. Similarly, by drawing a line connecting the second midpoint and the beam convergence point, extending this line according to the principle that the second incident point, second midpoint, and beam convergence point are collinear yields a more precise position of the second incident point.

[0062] Furthermore, the actual positions of the first incident point and the second incident point both meet the installation error parameter limit range, that is, within the specified circular range.

[0063] Specifically, after the installation of the first and second beamline incident cones is completed, under atmospheric conditions, a laser tracker is used to establish a measurement coordinate system with the beamline convergence point O as the origin of the three-dimensional coordinate system. The actual position of the first intermediate point O1' is measured (for example, expressed as coordinate values ​​along the X-axis, Y-axis, and Z-axis, corresponding to the initial position information of the first intermediate point O1'). Using the extended line connecting the first intermediate point and the beamline convergence point, and the ideal distance L0 (i.e., the line segment formed by the first incident point and the beamline convergence point under ideal conditions), the coordinate position of the first incident point O1 can be determined. Specifically, by driving the multi-axial adjustment motor of the first adjustment support assembly 1210, the first incident point can be adjusted to an ideal position within a specified circular area.

[0064] It should be noted that in this example, the ideal state is defined as the state in which the first incident point, the first intermediate point, and the beam convergence point are collinear after installation, and the straight line formed by the first incident point, the first intermediate point, and the beam convergence point coincides with the central axis of the first beam incident cone. In the ideal state, the ideal distance formed by the first incident point and the beam convergence point is L0.

[0065] Next, in step S603, the vacuum pressure and vacuum deformation during the vacuuming process of the vacuum chamber are obtained, and simulation analysis is performed to obtain the pressure and point position correction curve. Using the pressure and point position correction curve, the correction amount of the incident point of the simulated beam is calculated.

[0066] Specifically, a laser tracker is used to measure the amount of vacuum deformation during the vacuuming process of the vacuum chamber, and a pressure measuring instrument is used to measure the vacuum pressure value inside the vacuum chamber during the vacuuming process. The laser tracker is also used to measure the initial position information of multiple axial adjustment motors of the first adjustment support assembly and the initial position information of multiple axial adjustment motors of the second adjustment support assembly under atmospheric conditions.

[0067] Using the vacuum deformation and vacuum pressure data (i.e., vacuum pressure values, sometimes simply referred to as pressure values) obtained from the cabin mechanical simulation analysis, a pressure-point position correction curve is fitted. This pressure-point position correction curve characterizes the correspondence between the vacuum pressure and the correction values ​​at the first incident point of the simulated proton beam and the second incident point of the simulated electron beam (e.g., ...). Figure 5 The pressure and point position correction curve shown is used. Specifically, the fitted pressure and point position correction curve is integrated into the control device 140 (see details...). Figure 3 In this case, the system of this application only needs to input the vacuum pressure value into the control device to obtain the correction amount of the first incident point and the correction amount of the second incident point of the simulated electron beam (including the first axial correction amount △O1'x along the X-axis, the second axial correction amount △O1'y along the Y-axis, and the third axial correction amount △O1'z along the Z-axis). In other words, it is not necessary to use a laser tracker; the control device 140 can drive the adjustment motors of the first adjustment support assembly and the adjustment motors of the second adjustment support assembly to adjust the corresponding distances according to the changes in vacuum pressure.

[0068] Specifically, based on the obtained correction amount of the first incident point, the initial position information of the multiple axial adjustment motors of the first adjustment support assembly, and the initial position information of the multiple axial adjustment motors of the second adjustment support assembly, the first axial adjustment motor, the second axial adjustment motor, and the third axial adjustment motor of the first adjustment support assembly are driven to move along the corresponding axes to correct the position of the first incident point. Furthermore, based on the obtained correction amount of the second incident point, the fourth axial adjustment motor, the fifth axial adjustment motor, and the sixth axial adjustment motor of the second adjustment support assembly are driven to move along the corresponding axes to correct the position of the second incident point.

[0069] For example, when the first midpoint O1' contracts inward by 2 mm and shifts slightly downward by 0.5 mm along with the vacuum chamber, if the first incident point O1 remains fixed, the original straight optical path will be forced into a broken line. The simulated beam will directly impact the edge of the first midpoint O1', generating a large amount of secondary radiation interference noise, and may even damage the walls of the vacuum chamber, leading to the failure of the simulation experiment. The method of this application enables precise adjustment of the midpoint of the simulated beamline and automatic correction of the corresponding incident point, thereby obtaining a more accurate incident point for the simulated beamline.

[0070] It should be noted that in other implementations, a combined wavelet transform and Kalman filter denoising algorithm can be used. Wavelet transform eliminates inherent sensor noise, while Kalman filtering suppresses random noise caused by environmental vibrations and electromagnetic interference in real time. Simultaneously, it performs data scaling, outlier removal, and time registration, ensuring the accuracy of the data source for input error modeling. For example, the correction amount can be further optimized by establishing a comprehensive error model that integrates systematic errors, random errors, and coupling errors.

[0071] Compared with existing technologies, this application determines the installation error parameter limit range before installing the beamline incident cone in the space particle environment simulation system. During the installation of the first and second beamline incident cones, the installation position of the midpoint of each simulated beamline that has shifted is controlled and adjusted according to the determined initial installation offset. This further ensures that the position of the incident point of each simulated beamline meets the installation error parameter limit range, enabling the determination of the incident point of each simulated beamline. This results in more accurate simulated beamlines and improves the convergence accuracy of multiple simulated beamlines. By acquiring the vacuum pressure and vacuum deformation during the vacuum chamber's evacuation process, simulation analysis is performed, and a pressure-point position correction curve is fitted. Using this pressure-point position correction curve, a more accurate correction amount for the incident point of the simulated beamlines can be obtained to correct the incident point of each simulated beamline, enabling more accurate simulation of space particle environments such as space proton and electron irradiation.

[0072] Furthermore, this application utilizes high-precision control through multi-dimensional coupling of mechanics, vacuum, and physics. Specifically, it improves the safety of the beamline incident cone by automatically driving multiple axial adjustment motors for movement operation in conjunction with the flexible compensation of the bellows, thereby achieving more accurate simulation of space particle environments such as space proton and electron irradiation.

[0073] Finally, it should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the systems or apparatus disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and relevant parts can be referred to the method section.

[0074] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A space particle environment simulation system, characterized in that, include: Vacuum chamber, used to simulate the irradiated space environment formed by the convergence of multiple simulated beamlines in a vacuum environment; A multi-beam incident unit is connected to a vacuum chamber. The multi-beam incident unit includes a first beam incident unit and a second beam incident unit. The first beam incident unit includes a first adjusting support assembly and a first beam incident cone connected to the vacuum chamber. The second beam incident unit includes a second adjusting support assembly and a second beam incident cone connected to the vacuum chamber. The first beam incident unit is used to project a simulated proton beam through the first beam incident cone to a beam convergence point inside the vacuum chamber. The second beam incident unit is used to project a simulated electron beam through the second beam incident cone to a beam convergence point inside the vacuum chamber. A control device, electrically connected to the first adjustment support assembly and the second adjustment support assembly, is used to determine the correction amount of the incident point of the simulated proton beam and the correction amount of the incident point of the simulated electron beam during the vacuum extraction process of the vacuum chamber, so as to control and drive the first adjustment support assembly and the second adjustment support assembly to perform movement operations to correct the position of the first incident point of the simulated proton beam and the position of the second incident point of the simulated electron beam.

2. The space particle environment simulation system according to claim 1, characterized in that, Further includes: A laser tracker, electrically connected to the control device, is installed outside the vacuum chamber. The laser tracker is used to measure the initial position information of the incident point and intermediate point of each simulated beamline under atmospheric pressure. The laser follower is used to measure the position information of the first incident point and first intermediate point of the simulated proton beamline, and the position information of the second incident point and second intermediate point of the simulated electron beamline during the vacuum extraction process of the vacuum chamber. as well as A pressure measuring instrument, electrically connected to the control device, is used to measure the vacuum pressure data inside the vacuum chamber each time.

3. The space particle environment simulation system according to claim 1 or 2, characterized in that, The first adjusting support assembly includes a first adjusting leg connected to the first beam incident cone, and a first adjusting support connected to the first adjusting leg and located below the first adjusting leg. The first adjusting support is equipped with a plurality of axial adjusting motors. The second adjusting support assembly includes a second adjusting leg connected to the second beam incident cone, and a second adjusting support connected to and located below the second adjusting leg. The second adjusting support is equipped with a plurality of axial adjusting motors.

4. The space particle environment simulation system according to claim 3, characterized in that, Based on the measured vacuum pressure data, the position information of the first incident point of the simulated proton beam and the position information of the second incident point of the simulated electron beam, a pressure-point position correction curve is obtained by fitting. The control device integrates the pressure and point position correction curves to output the correction amount of the first incident point of the simulated proton beam and the correction amount of the second incident point of the simulated electron beam when the vacuum pressure value is input. The control device drives multiple axial adjustment motors of the first adjustment support assembly to move along corresponding axes to correct the position of the first incident point according to the correction amount of the determined first incident point, and drives multiple axial adjustment motors of the second adjustment support assembly to move along corresponding axes to correct the position of the second incident point according to the correction amount of the determined second incident point.

5. The space particle environment simulation system according to claim 4, characterized in that, Based on the measured vacuum pressure and vacuum deformation during the vacuuming process of the vacuum chamber, simulation analysis is performed, and a pressure-point position correction curve is obtained by fitting. The vacuum deformation is determined based on the following position information: the position information of the first midpoint of the simulated proton beam and the position information of the second midpoint of the simulated electron beam.

6. The space particle environment simulation system according to claim 1, characterized in that, The first beamline incident unit also includes a first bellows, which flexibly connects the first beamline incident unit and the vacuum chamber, so that it can flexibly follow the vacuum deformation process during the vacuuming process of the vacuum chamber. The second beam incidence unit also includes a second corrugated tube, which flexibly connects the second beam incidence unit and the vacuum chamber, so that it can flexibly follow the vacuum deformation process during the vacuuming process of the vacuum chamber.

7. The space particle environment simulation system according to claim 2, characterized in that, The control device is used to determine the initial installation deviation when installing the first beamline incident cone and the second beamline incident cone, and to control and adjust the installation position of the first midpoint of the simulated proton beamline and the installation position of the second midpoint of the simulated electron beamline based on the maximum deformation obtained by cabin mechanical simulation analysis and the initial installation deviation and the maximum deformation. After the first and second beamline incident cones are installed and under atmospheric conditions, the actual position of the first midpoint of the simulated proton beamline is measured, and the ideal distance is determined by the extension of the line connecting the first midpoint and the beamline convergence point, so as to calculate the position information of the first incident point.

8. A method for simulating a space particle environment, characterized in that, The space particle environment simulation system utilizing any one of claims 1 to 7 comprises: Before installing the first and second beamline incident cones, determine the installation error parameter limits. During the installation of the first beamline incident cone and the second beamline incident cone, the installation position of the midpoint of each simulated beamline that has shifted is controlled and adjusted according to the determined initial installation offset, so as to further determine that the position of the incident point of each simulated beamline meets the installation error parameter limit range. The vacuum pressure and vacuum deformation during the vacuuming process of the vacuum chamber are obtained, and simulation analysis is performed to obtain a pressure-point position correction curve. Using the pressure-point position correction curve, the correction amount of the incident point of the simulated beam is calculated.

9. The space particle environment simulation method according to claim 8, characterized in that, include: Using the maximum deformation obtained from the cabin mechanical simulation analysis, and based on the initial installation deviation and the maximum deformation, the installation positions of the first midpoint of the simulated proton beam and the second midpoint of the simulated electron beam are controlled and adjusted.

10. The space particle environment simulation method according to claim 8, characterized in that, include: During the installation of the first beamline incident cone and the second beamline incident cone, if the following two parameter constraints are met simultaneously, the installation deviation will be within a controllable range. ， in, This indicates the angular deviation between the actual central axis and the ideal central axis of the first beam incident cone. The value represents the maximum angular deviation between the actual central axis and the ideal central axis of the first beam incidence cone; L represents the actual distance between the first incident point and the convergence point of the simulated proton beam during installation.

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