A method and apparatus for rapidly identifying wheat germination rate

Abstract

This invention relates to a method and apparatus for rapidly identifying wheat germination rate. The method comprises the following steps: S1, collecting wheat grain samples of different varieties; S2, measuring the germination rate of wheat grains of different varieties and storage days; S3, obtaining volatile odor information of wheat grains with different germination rates using a wheat volatile gas detection sensor array; S4, performing dimensionality reduction on the odor information data to extract odor information features of wheat grains of different varieties and germination rates; and S5, training a model of the relationship between odor information feature data and wheat germination rate using a machine learning algorithm. The method uses a metal oxide semiconductor array sensor to detect the response information of wheat volatile organic compounds, and a computer algorithm to predict the wheat germination rate. This method is simple, convenient, and highly operable, with advantages of speed, economy, and practicality, and it does not damage the wheat, thus performing non-destructive testing.

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