Real-time measurement method and device for long-wave infrared pulse spectrum

By constructing a sum-frequency process in the long-wave infrared band and mapping the spectrum to the near-infrared band, and utilizing a non-oxide semiconductor crystal and a narrowband processing unit, the problem of real-time measurement of long-wave infrared pulse spectra was solved, achieving efficient and mechanically scan-free spectral acquisition.

CN122329487APending Publication Date: 2026-07-03SHANGHAI JIAOTONG UNIV
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Patent Information

Application Number
CN202610386188.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-03-27
Publication Date
2026-07-03

AI Technical Summary

Technical Problem

Existing technologies make it difficult to achieve real-time, high-fidelity measurement of long-wave infrared pulse spectra. Fourier transform infrared spectrometers and grating spectrometers suffer from problems such as mechanical interference, high cost, and long scanning time. Traditional upconversion technology is difficult to apply to the long-wave infrared band.

Method used

By constructing an ultra-wideband sum-frequency process, long-wave infrared pulse spectra are mapped to the near-infrared band, detected using a near-infrared real-time spectrometer, and the original spectrum is obtained by inverting the wavelength mapping relationship. Using a non-oxide semiconductor crystal and a narrowband processing unit, real-time measurement without mechanical scanning is achieved.

Benefits of technology

It achieves real-time, mechanical-free, high-fidelity measurement of long-wave infrared pulse spectra, and is suitable for various spectral measurement scenarios, including infrared sample analysis and transient chemical reaction detection.

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Abstract

The invention discloses a long-wave infrared pulse spectrum real-time measurement method and device based on nonlinear frequency upconversion, and the method comprises the steps: employing a non-oxide semiconductor crystal as a nonlinear medium, employing a narrow-band pulse with the central wavelength of 2-2.5 [mu] m as sampling light, and carrying out the sum frequency of the sampling light and a long-wave infrared pulse to be measured, thereby achieving the real-time measurement of the long-wave infrared pulse spectrum. The generated sum frequency pulse is received and detected by the near-infrared real-time spectrometer; the combination of the wavelength of the selected sampling light and the selected crystal can generate an ultra-wide phase matching bandwidth, and the spectrum of the long-wave infrared pulse to be measured can be obtained by inversion of the detected sum-frequency pulse spectrum through the linear mapping relation of the frequency; by analyzing the spectrum obtained by the near-infrared spectrometer in real time, the spectrum of the long-wave infrared pulse to be measured can be directly reconstructed in real time. According to the invention, the limitation of a Fourier transform spectrometer and a traditional grating spectrometer in the aspect of real-time measurement is overcome, the real-time and mechanical-scanning-free measurement of the long-wave infrared pulse spectrum is realized, and the requirement on the repetition frequency of the long-wave infrared pulse is avoided.
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