Surface impedance testing device for object to be tested

Abstract

The utility model discloses a device for testing the surface impedance of an object to be tested, and the device comprises a detection part which is provided with an accommodation cavity and an end part opening communicated with the accommodation cavity, and the end part, provided with the end part opening, of the detection part is used for abutting against the surface of the object to be tested; the jelly is suitable for being filled into the accommodating cavity and is in contact with the surface of a to-be-detected object through the end opening, so that ions in the jelly and the surface of the to-be-detected object are subjected to primary battery reaction; and the detection assembly comprises a reference electrode, an auxiliary electrode and a working electrode, the reference electrode and the auxiliary electrode are used for extending into the accommodating cavity and being electrically connected with the jelly, and the working electrode is used for being electrically connected with the to-be-detected object, so that the detection assembly detects the impedance of the surface of the to-be-detected object. According to the surface impedance testing device of the object to be tested, impedance testing of a plurality of metals can be easily achieved through the jelly, operation is convenient and fast, and testing efficiency and testing accuracy are high.

Description

Technical Field

[0001] The utility model relates to the technical field of impedance testing, and more specifically, to a device for testing the surface impedance of an object to be tested. Background Art

[0002] Impedance testing of metal surfaces is an important testing technique used to evaluate metal materials' corrosion resistance, coating quality, and interface contact. However, conventional impedance testing devices struggle to perform impedance testing on multiple metals, resulting in low test efficiency and accuracy. Utility Model Content

[0003] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, one object of the present invention is to provide a device for testing the surface impedance of an object to be tested, which can easily perform impedance testing on multiple metals and has high testing efficiency and accuracy.

[0004] According to an embodiment of the utility model, the surface impedance testing device of the object to be tested includes: a detection member, the detection member has a accommodating cavity and an end opening connected to the accommodating cavity, and the detection member is provided with an end of the end opening for abutting against the surface of the object to be tested; a colloid, the colloid is suitable for filling into the accommodating cavity and contacting with the surface of the object to be tested through the end opening, so that the ions in the colloid react with the surface of the object to be tested by a primary battery reaction; a detection component, the detection component includes a reference electrode, an auxiliary electrode and a working electrode, the reference electrode and the auxiliary electrode are used to extend into the accommodating cavity and be electrically connected to the colloid, and the working electrode is used to be electrically connected to the object to be tested, so that the detection component detects the impedance of the surface of the object to be tested.

[0005] According to the surface impedance testing device of the object to be tested in the embodiment of the utility model, the impedance of the surface of the object to be tested is easily detected through the detection piece, the colloid and the detection component, and the impedance test of multiple metals can be easily realized through the colloid. The operation is convenient, and the test efficiency and test accuracy are high.

[0006] In addition, the surface impedance testing device for an object to be tested according to the above embodiment of the present invention may also have the following additional technical features:

[0007] According to some embodiments of the present invention, the detection member is a detection pen and includes a pen body and a pen tip arranged along a set direction, the pen body is cylindrical extending along the set direction, the cross-section of the pen tip perpendicular to the set direction decreases in the direction away from the pen body, and the end of the pen tip away from the pen body is provided with the end opening.

[0008] According to some embodiments of the present invention, the pen body is detachably connected to the pen tip, there are multiple pen tips, and the multiple pen tips are selectively connected to the pen body, and the sizes and / or shapes of the end openings of different pen tips are different.

[0009] According to some embodiments of the present invention, at least two of the pen tips have different numbers of the end openings.

[0010] According to some embodiments of the present invention, at least a portion of the cavity wall of the accommodating cavity is made of a transparent material.

[0011] According to some embodiments of the present invention, the surface impedance testing device for the object to be tested includes a sample table having an installation area for installing the object to be tested. The detection component is arranged on the sample table, and the distance between the detection component and the installation area is adjustable.

[0012] According to some embodiments of the present invention, the surface impedance testing device for the object to be tested includes a locking member, which has a locked state and an unlocked state. In the locked state, the locking member locks the detection member and the sample table so that the distance between the detection member and the installation area is fixed; in the unlocked state, the locking member is unlocked so that the distance between the detection member and the installation area is adjustable.

[0013] According to some embodiments of the present invention, the detection member has a first external thread, the sample platform has a first internal thread matching the first external thread, and the detection member and the sample platform are connected via the first external thread and the first internal thread.

[0014] According to some embodiments of the present invention, the working electrode includes a current collecting net, which is used to collect electrons generated by the galvanic cell reaction between the colloid and the surface of the object to be tested, and the outer contour area of ​​the current collecting net is smaller than the area of ​​the end opening.

[0015] According to some embodiments of the present invention, the number of the end openings is one or more.

[0016] Additional aspects and advantages of the present invention will be given in part in the following description and will become apparent from the following description or learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0018] Figure 1 Schematic diagram of a surface impedance testing device for an object to be tested and an object to be tested according to an embodiment of the present invention;

[0019] Figure 2 is a schematic diagram of multiple pen tips according to an embodiment of the present utility model;

[0020] Figure 3 yes Figure 2 sectional view of

[0021] Figure 4 is a top view of a pen body according to an embodiment of the present utility model;

[0022] Figure 5 yes Figure 4 Cross-sectional view along line AA;

[0023] Figure 6 yes Figure 4 Cross-sectional view along line BB;

[0024] Figure 7 This is a schematic diagram of the test results of the surface impedance testing device for the object to be tested according to an embodiment of the present invention on the surface impedance of anodized aluminum after etching with a laser power parameter of 90%, the surface impedance of anodized aluminum after etching with a laser power parameter of 75%, and the surface impedance of anodized aluminum after etching with a laser power parameter of 60%.

[0025] Reference numerals:

[0026] Surface impedance testing device 100 for an object to be tested; object to be tested 200;

[0027] Detector 10; accommodating cavity 11; end opening 12; pen body 13; pen tip 14; first external thread 15; second external thread 16; second internal thread 17; mounting portion 18; first through hole 181; second through hole 182;

[0028] Detection component 20; electrochemical workstation 21; current collecting network 241; sample table 30. DETAILED DESCRIPTION

[0029] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0030] In the description of the present invention, it should be understood that the terms "length", "up", "down", "inside", "outside", etc. indicating the orientation or position relationship are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0031] In the description of the present invention, "first feature" and "second feature" may include one or more such features, "plurality" means two or more, the first feature "above" or "below" the second feature may include the first and second features being in direct contact, or the first and second features not being in direct contact but being in contact through another feature between them, the first feature "above", "above" and "above" the second feature include the first feature being directly above and diagonally above the second feature, or simply means that the first feature is horizontally higher than the second feature.

[0032] The following describes a device 100 for testing surface impedance of an object to be tested according to an embodiment of the present invention with reference to the accompanying drawings.

[0033] Reference Figure 1-Figure 7 As shown, the surface impedance testing device 100 for an object to be tested according to an embodiment of the present invention may include: a probe 10 , a colloid, and a detection assembly 20 .

[0034] Specifically, the probe 10 has a housing cavity 11 and an end opening 12 communicating with the housing cavity 11. The end of the probe 10 with the end opening 12 is configured to abut against the surface of the object to be tested 200. A colloid can be filled into the housing cavity 11 and contact the surface of the object to be tested 200 through the end opening 12, so that ions in the colloid react with the surface of the object to be tested 200. The detection assembly 20 includes a reference electrode, an auxiliary electrode, and a working electrode. The reference electrode and the auxiliary electrode are configured to extend into the housing cavity 11 and electrically connect to the colloid. The working electrode is configured to electrically connect to the object to be tested 200, allowing the detection assembly 20 to detect the impedance of the surface of the object to be tested 200.

[0035] The colloid may be a conductive gel, which has good conductivity and adhesion. For example, the colloid may be a sodium chloride ion conductive gel with polyacrylamide as the main matrix, a sodium chloride ion conductive gel with gelatin as the main matrix, a sodium chloride ion conductive gel with polyacrylamide and gelatin as the main matrices, a magnesium chloride ion conductive gel with polyacrylamide as the main matrix, or a sodium sulfate ion conductive gel with polyacrylamide as the main matrix.

[0036] The object to be tested 200 may be anodized aluminum (a layer of dense aluminum oxide is plated on the surface of aluminum or aluminum alloy), etc., which can generate a galvanic cell reaction with the colloid.

[0037] The reference electrode, auxiliary electrode, and working electrode are electrodes used in electrochemical analysis. The reference electrode is used to measure the potential difference between the analyte 200 and the reference electrode. The reference electrode can be a silver-silver chloride electrode or a saturated calomel electrode. The auxiliary electrode, also known as the counter electrode, is used to stimulate the test current and can be a platinum electrode.

[0038] The detection assembly 20 may also include an electrochemical workstation 21, which is short for electrochemical measurement system and is a measurement device commonly used in electrochemical research and teaching. The electrochemical workstation 21 can be powered, electrically connected to the colloid via a reference electrode and an auxiliary electrode, and electrically connected to the surface of the test object 200 via a working electrode. This forms a circuit between the electrochemical workstation 21, the colloid, and the test object 200 to measure the impedance value of the test object 200.

[0039] The surface of the object under test 200 may contain various metallic impurities. These impurities form a micro-battery structure with the object under test 200, causing micro-corrosion in the ionic environment of the applied alternating current and the conductive gel. This allows the surface impedance of the object under test 200 to be measured by the surface impedance testing device 100. For example, in some specific embodiments, the gel is a sodium chloride ion-conductive gel with polyacrylamide as its primary matrix, and the object under test 200 is anodized aluminum oxide. The porous micro-corrosion cell structure formed by the anodized aluminum oxide, impurities on the anodized aluminum oxide surface, and the conductive gel acts as a solid-liquid interface electrochemical cell, generating electrons on the anodized aluminum oxide surface.

[0040] In some specific embodiments, the object to be tested 200 is metal. By testing the impedance of the metal surface, the corrosion resistance, surface roughness, coating protection quality and interface contact of the metal material can be evaluated. Here, interface contact can be understood as the ability of metal to contact other substances, such as the ability of the metal contact surface to transmit current, the ability of the metal to transmit signals, etc.

[0041] The probe 10 can be made of a plastic material such as PLA (polylactic acid) or PEFE (polytetrafluoroethylene). The probe 10 can also include silicone. The material of the probe 10 is not limited, as long as the probe 10 does not significantly interfere with the galvanic reaction between the colloid and the object to be tested 200. For example, in some embodiments, the end of the probe 10 with the end opening 12 is made of silicone. The silicone can deform to allow the probe 10 to more closely contact the surface of the object to be tested 200. The deformation of the silicone can control the size of the end opening 12, thereby controlling the rate of colloid leakage and reducing the possibility of excessive colloid outflow. The probe 10 can be manufactured using 3D printing technology, making it easier to obtain.

[0042] In some related technologies, a conductive solution is made to flow to the metal surface, where it reacts with the metal to form a galvanic cell, thereby testing the impedance of the metal surface. However, the conductive solution is a liquid, and it flows easily and quickly. This makes it prone to leakage during movement, making it difficult to move the conductive solution between different metals, making it difficult to perform impedance testing on multiple metals and resulting in low test efficiency. Even if the conductive solution is moved between different metals, it is easy for electrons on the surface of the previous metal to move with the conductive solution to the surface of the next metal, affecting test accuracy.

[0043] In contrast, the present invention allows the colloid to flow onto the surface of the object under test 200, where it reacts with the object under test 200 to form a galvanic cell, thereby testing the impedance of the surface of the object under test 200. The colloid is semi-solid and has low fluidity, allowing it to flow through the end opening 12 onto the surface of the object under test 200 to form a galvanic cell reaction with the object under test 200 while also being less likely to disperse around the surface of the object under test 200. The colloid is easy to move and less likely to leak. After testing the impedance of one metal using the probe 10 and the colloid, the colloid is less likely to fall off when the probe 10 and the colloid are moved to another metal. This makes it easy to inject the colloid into the receiving cavity 11 at once, thus enabling impedance testing of multiple metals. This facilitates convenient operation and high testing efficiency.

[0044] In the process of moving the colloid between different metals, the colloid includes a moving part at the detection part 10 and a part remaining on the surface of the previous metal. The part of the colloid remaining on the surface of the previous metal makes it difficult for electrons on the surface of the previous metal to adhere to the moving part of the colloid at the detection part 10, and makes it difficult for electrons on the surface of the previous metal to move to the next metal with the moving colloid. This makes the colloids at different metals different and the electrons less likely to transfer, and the test accuracy is higher.

[0045] According to the surface impedance testing device 100 of the object to be tested in the embodiment of the present invention, the impedance of the surface of the object to be tested 200 is easily detected through the detection piece 10, the colloid and the detection component 20, and the impedance test of multiple metals can be easily realized through the colloid, the operation is convenient, and the test efficiency and test accuracy are high.

[0046] In some embodiments of the present invention, Figure 1 As shown, the detection member 10 is a detection pen and includes a pen body 13 and a pen tip 14 arranged along a set direction. The pen body 13 is cylindrical and extends along the set direction. The cross-section of the pen tip 14 perpendicular to the set direction decreases in the direction away from the pen body 13. An end opening 12 is provided at the end of the pen tip 14 away from the pen body 13.

[0047] The detection element 10 is a detection pen, which is easy to carry and operate, and can be used for mobile testing. For example, it is convenient for researchers to move the detection pen from one surface of an object to be tested 200 to another surface of an object to be tested 200, for example, it is convenient for researchers to carry the detection pen from one laboratory to another. It is suitable for assembly line testing of different objects to be tested 200 in industrial production, as well as impedance testing of objects to be tested 200 in laboratory and field testing, and has high testing efficiency.

[0048] The setting direction can be the length direction of the probe pen, for example Figure 1 The vertical direction shown, or a direction at a certain angle to the vertical direction, facilitates the downward flow of the colloid under its own gravity to the end opening 12. The columnar shape can be cylindrical, prismatic, or irregular, and the columnar shape of the pen body 13 facilitates the provision of a continuous and spacious receiving chamber 11 to accommodate more colloid when the probe 10 is of a certain size. This facilitates the impedance testing of more test objects 200 by injecting the colloid into the receiving chamber 11 at a time, thereby improving the testing efficiency.

[0049] The cross-section of the pen tip 14 perpendicular to the set direction decreases as it moves away from the pen body 13. This helps guide the colloid within the accommodating chamber 11, causing it to flow in the set direction away from the pen body 13. This allows the colloid to flow more smoothly to the end opening 12 and then contact the surface of the object to be tested 200. Furthermore, the end of the pen tip 14 with the end opening 12 has the smallest cross-section perpendicular to the set direction, which helps gather the colloid and allow it to flow to the surface of the object to be tested 200. This allows researchers to control the contact area of ​​the colloid on the object to be tested 200 by manipulating the end of the pen tip 14 with the end opening 12, reducing the possibility of the colloid flowing outside the object to be tested 200 and improving ease of use.

[0050] In some embodiments, as Figure 1-Figure 3 As shown, the pen body 13 and the pen tip 14 are detachably connected. There are multiple pen tips 14, and the multiple pen tips 14 are selectively connected to the pen body 13. The sizes or shapes of the end openings 12 of different pen tips 14 are different, or the sizes and shapes of the end openings 12 of different pen tips 14 are different.

[0051] The pen body 13 and the pen tip 14 are detachably connected, which is convenient for maintenance and cleaning of the pen body 13 and the pen tip 14. The detachable connection can be a bonding, a clamping or a threaded connection. For example, in some embodiments, Figures 1-6 As shown, the outer circumference of the upper end of the pen tip 14 has a second external thread 16, and the inner circumference of the lower end of the pen body 13 has a second internal thread 17 that matches the second external thread 16. The pen body 13 and the pen tip 14 are connected by the second external thread 16 and the second internal thread 17, which is convenient for disassembly and assembly. After installation, the pen body 13 and the pen tip 14 are not prone to relative shaking, and the connection is firm and stable.

[0052] Different pen tips 14 are advantageous for adapting to the characteristics of different objects to be tested 200. For example, the sizes of the end openings 12 of different pen tips 14 are different, which is advantageous for adapting to objects to be tested 200 with different surface sizes. For example, in some specific embodiments, Figure 2-Figure 3 As shown, the sizes of the end openings 12 of different pen tips 14 gradually increase along the direction F1.

[0053] For example, the shapes of the end openings 12 of different pen tips 14 are different, which is conducive to adapting to the surface shapes of the objects to be tested 200, such as planes, curved surfaces, or specific shapes. For example, the sizes and shapes of the end openings 12 of different pen tips 14 are different, which is conducive to adapting to the surface shapes of the objects to be tested 200.

[0054] By selectively connecting a plurality of different pen tips 14 to the pen body 13 , different pen tips 14 can be easily replaced to adapt to the characteristics of different objects under test 200 , thereby improving the test accuracy of different objects under test 200 .

[0055] In some embodiments, the number of end openings 12 is one or more. Different numbers of end openings 12 are conducive to adapting to the characteristics of different objects to be tested 200, such as surface size and surface shape, so that the colloid can pass through one or more end openings 12 and be more evenly distributed on the surfaces of different objects to be tested 200 and fit better with the surfaces of the objects to be tested 200.

[0056] For example, in some embodiments, at least two pen tips 14 have different numbers of end openings 12, such as one pen tip 14 having one end opening 12 and another pen tip 14 having two end openings 12. By replacing pen tips 14 with different numbers of end openings 12, different objects under test 200 can be tested, which is convenient for operation.

[0057] In some embodiments of the present invention, Figure 1 and Figure 4-Figure 6 As shown, the probe 10 includes a mounting portion 18, which is provided with a first through-hole 181 and a second through-hole 182 that connect the accommodating cavity 11 with the exterior of the probe 10. The first through-hole 181 is used to inject colloid into the accommodating cavity 11, and the second through-hole 182 is used to install the reference electrode and the auxiliary electrode. The first through-hole 181 and the second through-hole 182 of the mounting portion 18 facilitate the installation of the reference electrode and the auxiliary electrode, as well as the injection of colloid into the accommodating cavity 11. This eliminates the need for manual fixation of the reference electrode and the auxiliary electrode, allowing researchers to maintain the reference electrode and the auxiliary electrode connected to the colloid while moving the probe 10, thus facilitating operation.

[0058] The first through hole 181 allows the colloid to be added to the accommodating chamber 11 again after the colloid in the accommodating chamber 11 is consumed. The colloid is continuously injected by its own gravity, that is, the colloid continuously flows toward the surface of the object to be tested 200 .

[0059] There may be two second through holes 182 for installing a reference electrode and an auxiliary electrode respectively.

[0060] In some embodiments of the present invention, at least part of the cavity wall of the accommodating cavity 11 is made of transparent material, which makes it convenient for researchers to observe the internal conditions of the accommodating cavity 11 through the transparent cavity wall, such as whether the accommodating cavity 11 is blocked, whether the colloid in the accommodating cavity 11 has submerged the reference electrode and the auxiliary electrode so that the reference electrode and the auxiliary electrode are electrically connected to the colloid, etc. According to the observation results, it can be chosen to continue injecting the colloid into the accommodating cavity 11 or stop injecting the colloid. The colloid injection operation is more controllable, which is conducive to ensuring the smooth progress of the testing work.

[0061] In some embodiments of the present invention, Figure 1 As shown, the surface impedance testing device 100 includes a sample table 30 having a mounting area for mounting the object to be tested 200 . The probe 10 is disposed on the sample table 30 , and the distance between the probe 10 and the mounting area is adjustable.

[0062] The mounting area can be a mounting slot, with the object under test 200 positioned within the mounting slot. The mounting slot can limit the position of the object under test 200, preventing the object under test 200 from moving relative to the probe 10 during the test, making the test process more stable and facilitating improved test accuracy. The mounting area can also be a conveyor belt with multiple mounting positions, with different objects under test 200 positioned in each mounting position. The probe 10 is positioned on the sample table 30, and the conveyor belt moves relative to the probe 10 so that the objects under test 200 at different mounting positions engage with the probe 10 one by one. This makes impedance testing of different objects under test 200 more convenient, and is suitable for assembly line testing of different objects under test 200 in industrial production, as well as impedance testing of objects under test 200 in laboratory and field testing, with high test efficiency.

[0063] The distance between the probe 10 and the mounting area is adjustable. Increasing the distance between the probe 10 and the mounting area allows the probe 10 to be separated from the object under test 200, making it easier to replace different objects under test 200. Reducing the distance between the probe 10 and the mounting area allows the probe 10 to offset the object under test 200, making it easier to test the impedance of the current object under test 200. Adjusting the distance between the probe 10 and the mounting area facilitates testing of different objects under test 200 and helps adapt to the size of different objects under test 200 between the probe 10 and the mounting area, such as Figure 1 The size of the object to be tested 200 in the vertical direction is relatively practical.

[0064] There are various ways to adjust the distance between the probe 10 and the mounting area. For example, in some embodiments, the surface impedance testing apparatus 100 includes a locking member having a locked state and an unlocked state. In the locked state, the locking member locks the probe 10 and the sample table 30, thereby fixing the distance between the probe 10 and the mounting area. In the unlocked state, the locking member is unlocked, allowing the distance between the probe 10 and the mounting area to be adjusted.

[0065] The locking member can be constructed in any manner. For example, the locking member may include a hook and multiple slots, with the hook being provided on the sample platform 30 and the multiple slots being provided on the probe 10. The hook engaging different slots positions the probe 10 relative to the mounting area. Alternatively, the locking member may include a pin and a hole, with the sample platform 30 having multiple holes and the probe 10 having a single hole. The pin may be inserted into different holes of the sample platform 30 and a single hole of the probe 10, positioning the probe 10 at different positions relative to the mounting area.

[0066] By locking and unlocking the locking member, it is easy to adjust the distance between the probe 10 and the installation area and adapt to the sizes of different objects to be tested 200. The operation is convenient, and in the locked state, the probe 10 is not easy to move relative to the installation area, such as falling. The probe 10 is firmly locked to the installation area, which makes the test stability better.

[0067] In some embodiments, as Figure 1 As shown, the probe 10 has a first external thread 15, and the sample platform 30 has a first internal thread that mates with the first external thread 15. The probe 10 and the sample platform 30 are connected via the first external thread 15 and the first internal thread. By rotating the probe 10 and the sample platform 30 via the first internal thread 15 and the first external thread 15, the distance between the probe 10 and the mounting area can be easily adjusted to accommodate the size of different objects under test 200. Adjustment can be stopped and adjusted at will, with high adjustment precision and a wide adjustment range equal to the extended length of the thread.

[0068] In some embodiments of the present invention, Figure 1 As shown, the working electrode includes a current collecting net 241 , which is used to collect electrons generated by the galvanic cell reaction between the colloid and the surface of the object to be tested 200 . The outer contour area of ​​the current collecting net 241 is smaller than the area of ​​the end opening 12 .

[0069] Compared to the method of connecting to the object to be tested via alligator clips in the related art, the present application can better contact the object to be tested 200 via the current collecting net 241, with a larger and more continuous contact area. The connection between the current collecting net 241 and the object to be tested 200 is tighter, making the electrical connection between the object to be tested 200 and the working electrode more stable. The area of ​​the current collecting net 241 is the effective area of ​​the working electrode contacting the object to be tested 200. The area of ​​the current collecting net 241 is controllable and is less affected by the size of the object to be tested 200. By controlling the area of ​​the current collecting net 241, it is easy to normalize the test results of different objects to be tested 200, which facilitates subsequent processing such as comparing the test results of different objects to be tested 200.

[0070] In addition, the current collecting net 241 is a mesh structure, and the current collecting net 241 can transform the single-point contact between the colloid and the end opening 12 into multiple-point contact between the colloid and the object to be tested 200, thereby improving the test accuracy.

[0071] For example, in some embodiments, the surface impedance testing device 100 is used to test anodized aluminum etched with a laser power parameter of 90%, anodized aluminum etched with a laser power parameter of 75%, and anodized aluminum etched with a laser power parameter of 60%. The impedance test results of the three types of anodized aluminum are normalized and displayed in a graph, as shown in FIG. Figure 7 The strip chart shown is convenient for comparing the test results of the three types of anodized aluminum mentioned above to determine the different effects of etching operations with different laser power parameters on the surface impedance of the anodized aluminum.

[0072] The following describes in detail a device 100 for testing surface impedance of an object to be tested according to a specific embodiment of the present invention with reference to the accompanying drawings. It should be understood that the following description is merely illustrative and should not be construed as limiting the present invention.

[0073] like Figure 1-Figure 7 As shown, a device 100 for testing the surface impedance of an object to be tested according to a specific embodiment of the present invention includes a probe 10 , a colloid, a detection assembly 20 and a sample table 30 .

[0074] The probe 10 is a probe pen comprising a body 13 and a tip 14. The colloid is a sodium chloride ion-conductive gel with gelatin as its primary matrix. The detection assembly 20 includes a reference electrode, an auxiliary electrode, a working electrode, and a research-grade single-channel potentiostat (i.e., an electrochemical workstation 21). The reference electrode is a silver-silver chloride electrode, and the auxiliary electrode is a platinum electrode. The lower ends of the reference and auxiliary electrodes are thicker than their upper ends. The working electrode includes a current collector 241.

[0075] First, insert the reference electrode and auxiliary electrode upward from the lower end of the pen body 13 into the second through-hole 182. Select the pen tip 14 based on the size, shape, and other characteristics of the object under test 200. Connect the pen tip 14 to the pen body 13 by engaging the second internal thread 17 and the second external thread 16. Glue is injected into the accommodating cavity 11 through the first through-hole 181, so that the conductive gel in the accommodating cavity 11 submerges the portions of the reference electrode and auxiliary electrode within the accommodating cavity 11.

[0076] Place the object to be tested 200 in the installation area of ​​the sample table 30, install the pen body 13 on the sample table 30 through the cooperation of the first internal thread and the first external thread 15, and separate the detection component 10 from the object to be tested 200. Place the current collecting net 241 between the lower end of the pen tip 14 and the object to be tested 200, and connect the reference electrode, auxiliary electrode and working electrode to the research-grade single-channel constant potential instrument.

[0077] The distance between the detection member 10 and the object to be tested 200 is adjusted by the first internal thread and the first external thread 15 so that the end opening 12 of the pen tip 14 is against the upper surface of the object to be tested 200. The pen tip 14 is perpendicular to the tested surface of the object to be tested 200, so that the conductive gel in the accommodating cavity 11 flows vertically to the tested surface of the object to be tested 200 through the end opening 12 and the collecting net 241.

[0078] The object under test 200 is a metal with an etched surface. The porous micro-corrosion cell structure formed by the metal, its surface impurities, and the conductive gel forms a solid-liquid interface electrochemical cell. The potential difference between the reference electrode and the working electrode is measured, and the surface impedance value is obtained by normalizing the electrochemical impedance spectroscopy test results.

[0079] Specifically, if Figure 7 As shown, the measured surface area is 1cm 2 The anodized aluminum was etched under the laser at laser power parameters of 90%, 75% and 60%, rinsed with deionized water, wiped with alcohol cotton balls, and dried with cold air.

[0080] The anodized aluminum sheets treated by different processing methods were placed in the installation area of ​​the sample table 30 respectively. The AC frequency of the research-grade single-channel potentiostat was selected from 1Hz to 500MHz. Three sets of data were measured for each anodized aluminum sheet. The measurement results were exported as a txt file. The data processing software was used for normalization and Nyquist and Bode diagrams were drawn. The resistance Rs of the conductive gel, the resistance Rp of the microbattery holes on the surface of the anodized aluminum sheet, the capacitance Cp of the microbattery holes on the surface of the anodized aluminum sheet, the resistance Rb of the barrier layer on the inner surface of the anodized aluminum sheet, and the resistance Cb of the barrier layer on the inner surface of the anodized aluminum sheet were fitted. The test results were exported and normalized, and the impedance results of the sample were drawn in the data processing software for systematic analysis.

[0081] In some related technologies, traditional impedance testing devices are often bulky and heavy, making them difficult to carry and use, and requiring high operator skills. However, the present invention measures the surface impedance of an object under test 200 using a probe 10, a conductive gel, a detection assembly 20, and a sample stand 30. The probe 10 is pen-shaped, lightweight, portable, and easy to operate, while the conductive gel is semi-solid and not prone to leakage, resulting in high test efficiency and accuracy.

[0082] The device for testing the surface impedance of an object to be tested 100 of the present application can be widely used in the field of impedance testing of metal materials, and is not only suitable for assembly line testing in industrial production, but can also be used in laboratories and on-site testing.

[0083] Other structures and operations of the surface impedance testing device 100 of the object to be tested according to the embodiment of the present invention are known to those skilled in the art and will not be described in detail here.

[0084] In the description of this utility model, it should be noted that, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; direct connections, indirect connections through an intermediate medium, and internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0085] Throughout this specification, reference to terms such as "embodiment," "specific embodiment," and "example" means that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0086] Although the embodiments of the present invention have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and purpose of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A device for testing the surface impedance of an object to be tested, characterized in that: include: A probe, wherein the probe has a receiving cavity and an end opening communicating with the receiving cavity, and the end of the probe is provided with the end opening for abutting against the surface of the object to be measured; A colloid, wherein the colloid is suitable for filling the containing cavity and contacting the surface of the object to be tested through the end opening, so that ions in the colloid react with the surface of the object to be tested in a galvanic cell manner; The detection component includes a reference electrode, an auxiliary electrode and a working electrode. The reference electrode and the auxiliary electrode are used to extend into the accommodating cavity and be electrically connected to the colloid. The working electrode is used to be electrically connected to the object to be detected so that the detection component can detect the impedance of the surface of the object to be detected.

2. The surface impedance testing device for an object to be tested according to claim 1, wherein: The detection member is a detection pen and includes a pen body and a pen tip arranged along a set direction. The pen body is cylindrical and extends along the set direction. The cross-section of the pen tip perpendicular to the set direction decreases in the direction away from the pen body. The end of the pen tip away from the pen body is provided with the end opening.

3. The surface impedance testing device for an object to be tested according to claim 2, wherein: The pen body is detachably connected to the pen tip. There are multiple pen tips, and the multiple pen tips are selectively connected to the pen body. The sizes and / or shapes of the end openings of different pen tips are different.

4. The surface impedance testing device for an object to be tested according to claim 3, wherein: At least two of the pen tips have different numbers of the end openings.

5. The surface impedance testing device for an object to be tested according to claim 1, wherein: At least a portion of the cavity wall of the accommodating cavity is made of transparent material.

6. The surface impedance testing device for an object to be tested according to claim 1, wherein: The device comprises a sample table having an installation area for installing the object to be tested. The detection component is arranged on the sample table, and the distance between the detection component and the installation area is adjustable.

7. The surface impedance testing device for an object to be tested according to claim 6, wherein: comprising a locking member, the locking member having a locked state and an unlocked state, wherein in the locked state, the locking member locks the detection member and the sample table so that the distance between the detection member and the mounting area is fixed; In the unlocked state, the locking member is unlocked so that the distance between the detection member and the installation area can be adjusted.

8. The surface impedance testing device for an object to be tested according to claim 6, wherein: The detection member has a first external thread, the sample platform has a first internal thread matched with the first external thread, and the detection member and the sample platform are connected through the first external thread and the first internal thread.

9. The surface impedance testing device for an object to be tested according to claim 1, wherein: The working electrode includes a current collecting net, which is used to collect electrons generated by the galvanic cell reaction between the colloid and the surface of the object to be tested. The outer contour area of ​​the current collecting net is smaller than the area of ​​the end opening.

10. The device for testing surface impedance of an object to be tested according to claim 1, wherein: The number of the end openings is one or more.

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