Probe row for laser shock strengthening and testing of solar cell

Abstract

The utility model belongs to the technical field of laser shock strengthening and testing of solar cell panels, and particularly relates to a probe row for laser shock strengthening and testing of solar cells. The probe row for the laser shock peening and testing of the solar cell comprises a bracket on which a plurality of probes are arranged; the conductive wire is arranged below the probe; the tensioning device is used for tensioning the conductive wire; when the plurality of probes press down the conductive wire, the conductive wire can move on the lower end faces of at least part of the probes. In other words, the conductive wire is installed below the multiple probes through the tensioning device, when the downward pressing heights of the probes are different, the conductive wire can move on the lower end faces of the probes for compensation, it can be guaranteed that the conductive wire can be pressed on each grid line by the probes, and therefore all the grid lines are conducted through the conductive wire.

Description

TECHNICAL FIELD

[0001] The utility model belongs to solar cell panel laser impact strengthening, test technical field, concretely relates to a kind of probe array for solar cell laser impact strengthening, test. BACKGROUND

[0002] The main grid-free solar cell is a cell structure without main grid lines on the front side and only with fine grid lines. The cell greatly reduces the consumption of silver paste, so that the cost of the main grid-free solar cell per watt is reduced. At the same time, the main grid-free solar cell reduces the shading area on the front side, which improves the current and conversion efficiency of the cell.

[0003] Laser strengthening impact is to quickly scan the solar cell by high-intensity laser. After the semiconductor material absorbs light energy, a large number of carriers flow to the grid lines under the action of an external deflection voltage. In the places where the Ohmic contact between the grid lines and the cell is not good, resistance heating occurs, which reduces the contact resistance between the grid lines and the semiconductor, and improves the performance of the solar cell as a whole. During laser strengthening, the fine grids need to be electrically connected.

[0004] The existing solar cell panel laser impact strengthening or IV testing device is used for multi-main grid cells. The upper and lower probe arrays with inserted probes are pressed on the main grid of the cell. However, for the main grid-free solar cell, the number of fine grids reaches hundreds, and the spacing between the fine grids is very small. The existing laser impact strengthening or IV testing device cannot completely press the probes onto the fine grids due to the large spacing between the probes.

[0005] The existing technology provides some probe arrays for main grid-free IV testing, which can also be applied to solar cell panel laser impact strengthening. For example, the patent CN216902805U provides a probe array for testing 0BB solar cells. In the case that there is no main grid line on the surface of the solar cell, the upper and lower metal strips are in contact with each fine grid line on the surface of the solar cell.

[0006] The inventor found in the research that due to the machining reasons, the surface of the jig for carrying the cell piece is not an absolute plane, and the cell piece has local height differences. In order to effectively connect each fine grid line by the metal strip, the height of each probe pressing the metal strip is different, which requires the metal strip to adapt to different pressing heights. However, the metal strip of the probe array in the above-mentioned existing technology is welded with each probe, and the metal strip cannot adapt to different pressing heights, which causes the metal strip to be unable to effectively connect each fine grid line. UTILITY MODEL CONTENTS

[0007] The utility model aims to provide a probe array for solar cell laser impact strengthening and testing to solve the technical problem that the metal strip in the existing technology cannot effectively connect each fine grid line.

[0008] The application provides a probe array for laser shock peening and testing of solar cells. The probe array comprises a support provided with a plurality of probes;

[0009] a conductive wire arranged below the probes; and

[0010] a tensioning device for tensioning the conductive wire; wherein

[0011] the conductive wire can move on the lower end surface of at least some of the probes when the probes are pressed down.

[0012] In an embodiment of the application, the lower end surface of the probes is provided with a groove for accommodating the conductive wire.

[0013] In an embodiment of the application, the depth of the groove is less than the diameter of the conductive wire.

[0014] In an embodiment of the application, the tensioning device comprises at least one ratchet assembly arranged at the end of the support.

[0015] In an embodiment of the application, the ratchet assembly comprises:

[0016] a reel rotatably arranged at the end of the support for winding the conductive wire;

[0017] a ratchet fixed to one end of the reel; and

[0018] a detent pawl arranged at one side of the ratchet for preventing the ratchet from rotating in the direction of unwinding the conductive wire from the reel.

[0019] In an embodiment of the application, the tensioning device comprises at least one spring.

[0020] One end of the spring is fixed to the end of the support, and the other end is connected to the end of the conductive wire.

[0021] In an embodiment of the application, the number of springs is two, and the springs are arranged at the two ends of the support, respectively.

[0022] In an embodiment of the application, support columns are further arranged at the two sides of the support, respectively.

[0023] The lower end surface of the support column is provided with a guide groove for accommodating the conductive wire.

[0024] In an embodiment of the application, the lower end surface of the support column is flush with the lower end surface of the probes.

[0025] In an embodiment of the application, the conductive wire is an elastic conductive wire.

[0026] The utility model discloses beneficial effect is:

[0027] Different from prior art, the application provides a kind of solar cell laser shock peening, probe row for testing, it includes: support, multiple probes are arranged on it;Conductive wire, it is arranged below probe;And tensioning device, for tensioning conductive wire;Wherein the multiple probes lower press conductive wire, the conductive wire can move on the lower end surface of at least part probe.For another, conductive wire is installed below multiple probes by tensioning device, when the height of probe is pressed is different, conductive wire can move on the lower end surface of probe and compensate, it can guarantee that conductive wire can be pressed on each grid line by probe, so that all grid lines are conducted through conductive wire.

[0028] The other features and advantages of the utility model will be described in the subsequent specification, and part becomes obvious from the specification, or is understood by implementing the utility model.The purpose and other advantages of the utility model are realized and obtained in the structure specially pointed out in the specification and drawings.

[0029] In order to make the above purpose, features and advantages of the utility model more obvious and easy to understand, the following preferred embodiments are described in detail, and the accompanying drawings are described as follows. BRIEF DESCRIPTION OF DRAWINGS

[0030] In order to more clearly illustrate the specific embodiment of the utility model or the technical scheme in prior art, the following will briefly introduce the drawings needed to be used in specific embodiment or prior art description, obviously, the drawings in the following description are some embodiments of the utility model, and for those skilled in the art, other drawings can also be obtained without creative labor according to these drawings.

[0031] Figure 1 It is the schematic diagram of the probe row for solar cell laser shock peening and testing of a preferred embodiment of the utility model;

[0032] Figure 2 It is the schematic diagram of the probe row for solar cell laser shock peening and testing of another preferred embodiment of the utility model;

[0033] Figure 3 It is the installation schematic diagram of spring of a preferred embodiment of the utility model;

[0034] Figure 4 It is the schematic diagram of ratchet assembly of a preferred embodiment of the utility model.

[0035] In the drawing:

[0036] Support 1, probe 11, groove 111, support column 12, guide slot 121, conductive wire 2, tensioning device 3, ratchet assembly 31, reel 311, ratchet 312, detent pawl 313, spring 32. DETAILED DESCRIPTION

[0037] In order to make the purpose, technical scheme and advantages of the embodiments of the present application more clear, the technical scheme of the present application will be described clearly and completely below with reference to the drawings. Obviously, the described embodiments are some embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0038] The present application provides a kind of solar cell laser shock peening, test probe array, which will be described in detail below.It should be noted that the description order of the following embodiments is not as the preferred order of the embodiments of the present application.The description of each embodiment in the following embodiments has its own emphasis, and the parts not described in detail in a certain embodiment can be referred to the related description of other embodiments.

[0039] Reference Figure 1 And Figure 2 In an embodiment, the solar cell laser shock peening, test probe array includes: a support 1, which is provided with a plurality of probes 11; a conductive wire 2, which is arranged below the probes 11; and a tensioning device 3, which is used to tension the conductive wire 2; wherein when the plurality of probes 11 press down the conductive wire 2, the conductive wire 2 can move on the lower end surface of at least part of the probes 11.

[0040] In the present embodiment, the conductive wire 2 is installed below the plurality of probes 11 by the tensioning device 3, and when the pressing height of the probes 11 is different, the conductive wire 2 can move on the lower end surface of the probes 11 to compensate, so as to ensure that the conductive wire 2 can be pressed tightly on each fine grid line by the probes 11, thereby conducting all the grid lines through the conductive wire 2.

[0041] Optionally, referring to Figure 3 , the lower end surface of the probe 11 is provided with a groove 111 for accommodating the conductive wire 2, which can guide the conductive wire 2 when it moves to prevent the conductive wire 2 from leaving the lower end surface of the probe 11. The probe 11 is a telescopic probe, and a return spring can be arranged inside the probe 11.

[0042] Further, the depth of the groove 111 is less than the diameter of the conductive wire 2. That is, the conductive wire 2 is at least partially exposed to the groove 111 to effectively contact the grid line.

[0043] Reference Figure 1 And Figure 4As an optional embodiment of the tensioning device 3, the tensioning device 3 comprises at least one ratchet assembly 31 arranged at the end of the support 1.

[0044] Specifically, referring to Figure 4 The ratchet assembly 31 comprises a reel 311 rotatably arranged at the end of the support 1 for winding the conductive wire 2, a ratchet 312 fixed at one end of the reel 311, and a detent pawl 313 arranged at one side of the ratchet 312 for preventing the ratchet 312 from rotating in the unwinding direction of the reel 311.

[0045] In this embodiment, the ratchet assembly 31 can be two, respectively located at both ends of the support 1.

[0046] In this embodiment, the ratchet assembly 31 can be used to tension the conductive wire 2 so that the conductive wire 2 is accommodated in the groove 111 of the probe 11.

[0047] In this embodiment, the conductive wire 2 can be some conductive metal wires such as gold wires, copper wires, etc. It should be noted that after the ratchet assembly 31 is tensioned, the deformation of the jig will not be too large, so the elasticity and ductility of the overall length of the conductive metal wire are sufficient to compensate for the deformation.

[0048] In some embodiments, the conductive wire 2 can also be some elastic conductive wires with greater elasticity, such as conductive silicone materials, etc.

[0049] Referring to Figure 2 and Figure 3 As another optional embodiment of the tensioning device 3, the tensioning device 3 comprises at least one spring 32; one end of the spring 32 is fixed at the end of the support 1, and the other end is connected with the end of the conductive wire 2.

[0050] In this embodiment, preferably, the number of springs 32 is two, respectively arranged at both ends of the support 1.

[0051] In this embodiment, the spring 32 is used for tensioning, which is convenient and simple in structure, and on the other hand can effectively reset the deformed conductive wire 2.

[0052] Referring to Figure 3 Preferably, the support 1 is further provided with a support column 12 on both sides of the plurality of probes 11; the lower end surface of the support column 12 is provided with a guide groove 121 for accommodating the conductive wire 2.

[0053] Further, the lower end surface of the support column 12 is flush with the lower end surface of the probe 11, which can maintain the conductive wire 2 in the groove 111 of the probe 11 before the probe 11 is pressed down.

[0054] In conclusion, the electric wire 2 of the probe row for laser shock peening and testing of the solar cell is installed below the multiple probes 11 through the tensioning device 3, the electric wire 2 can move on the lower end face of the probe 11 to compensate when the pressing height of the probe 11 is different, and the electric wire 2 can be pressed on each fine grid line by the probe 11, so that all the grid lines are conducted through the electric wire 2.

[0055] It should be noted that each device (components without specific structure) selected in the present application is a general standard component or a component known to those skilled in the art, and its structure and principle can be known by the technical personnel through the technical manual or through the conventional experimental method.

[0056] In the description of the embodiments of the present application, unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connecting" should be understood in a broad sense, for example, it can be fixed connection, or detachable connection, or integrally connected, it can be mechanical connection, or electrical connection, it can be directly connected, or indirectly connected through an intermediate medium, it can be the communication inside two elements. For ordinary skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0057] In the description of the present application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, therefore it cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.

[0058] Based on the above ideal embodiments according to the present application, through the above description, relevant personnel can make various changes and modifications without deviating from the technical idea of the present application. The technical scope of the present application is not limited to the contents in the specification, and the technical scope must be determined according to the scope of claims.

Claims

1. A probe array for laser shock peening and testing of solar cells, characterized in that: include: A support (1) having a plurality of probes (11) disposed thereon; A conductive wire (2) is arranged below the probe (11); as well as The tensioning device (3) is used to tension the conductive wire (2); wherein When the plurality of probes (11) press down the conductive wire (2), the conductive wire (2) can move on the lower end surface of at least part of the probes (11).

2. The probe array for laser shock peening and testing of solar cells according to claim 1, characterized in that: The lower end surface of the probe (11) is provided with a groove (111) for accommodating the conductive wire (2).

3. The probe array for laser shock peening and testing of solar cells according to claim 2, characterized in that: The depth of the groove (111) is smaller than the diameter of the conductive wire (2).

4. The probe array for laser shock peening and testing of solar cells according to claim 1, characterized in that: The tensioning device (3) comprises at least one ratchet assembly (31) which is arranged at the end of the bracket (1).

5. The probe array for laser shock peening and testing of solar cells according to claim 4, characterized in that: The ratchet assembly (31) comprises: A reel (311) is rotatably disposed at the end of the bracket (1) and is used for winding the conductive wire (2); a ratchet (312) fixed to one end of the reel (311); and The braking pawl (313) is arranged on one side of the ratchet (312) and is used to prevent the ratchet (312) from rotating along the unwinding direction of the reel (311).

6. The probe array for laser shock peening and testing of solar cells according to claim 1, characterized in that: The tensioning device (3) comprises at least one spring (32); One end of the spring (32) is fixed to the end of the bracket (1), and the other end is connected to the end of the conductive wire (2).

7. The probe array for laser shock peening and testing of solar cells according to claim 6, characterized in that: There are two springs (32), which are respectively arranged at two ends of the bracket (1).

8. The probe array for laser shock peening and testing of solar cells according to any one of claims 1 to 7, characterized in that: The bracket (1) is located on both sides of the plurality of probes (11) and is also provided with support columns (12) respectively; The lower end surface of the support column (12) is provided with a guide groove (121) for accommodating the conductive wire (2).

9. The probe array for laser shock peening and testing of solar cells according to claim 8, characterized in that: The lower end surface of the support column (12) is flush with the lower end surface of the probe (11).

10. The probe array for laser shock peening and testing of solar cells according to claim 1, characterized in that: The conductive thread (2) is an elastic conductive thread.

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