Aging tooling for a plasma surgical device

Abstract

The application provides an aging tool for a plasma surgical device, wherein a multi-channel temperature sampling interface is connected with a plurality of temperature measuring components, the temperature measuring components measure temperature values of specified positions of the plasma surgical device; a microcontroller is connected with a foot control interface, a load interface and the multi-channel temperature sampling interface, wherein the microcontroller controls the start and stop of cutting and / or coagulation of the plasma surgical device through the foot control interface; the microcontroller controls power output through the load interface; the microcontroller obtains the temperature values measured by the temperature measuring components through the multi-channel temperature sampling interface, judges whether there is an over-temperature safety risk in the aging test according to whether the temperature values exceed a set threshold, and issues an alarm prompt. The application can realize automatic testing and real-time monitoring of the temperature of key positions, is beneficial to the analysis of bad temperature data, and effectively guarantees the quality of the device.

Description

Technical Field

[0001] This application relates to the field of automated tooling technology for medical devices, specifically to a conventional tooling for a plasma surgical device. Background Technology

[0002] Plasma surgical equipment (often called plasma scalpels or low-temperature plasma surgical systems) is a surgical tool that uses radio frequency energy to excite an electrolyte solution to form a thin plasma layer, thereby achieving precise tissue cutting, ablation, hemostasis, and shrinkage. To ensure product quality, aging testing of plasma surgical equipment is an indispensable part of the research and development and production process. Aging testing refers to testing the product under long-term operation to simulate various environmental and operating conditions throughout its service life. It helps determine whether the product can operate normally after long-term use, whether there is performance degradation or lifespan reduction, and allows for the early detection of potential faults and defects, thereby improving product quality and reliability.

[0003] To ensure aging quality, repeated start-stop cutting or coagulation operations are required to replace the foot switch function in high-frequency surgical systems. Traditional aging testing fixtures generally lack automated aging testing capabilities, resulting in low testing efficiency. In recent years, some aging testing systems for high-frequency surgical systems have been reported, such as the Chinese utility model patent CN212568975U, which detects and processes the current in the circuit containing the load to determine if a fault has occurred and issues an alarm via circuitry. However, to date, no fixture has been found capable of real-time monitoring of temperatures at critical locations and automating the aging test. Summary of the Invention

[0004] In view of the deficiencies in the prior art, the purpose of this application is to provide an aging apparatus for a plasma surgical device that can achieve automatic aging testing while simultaneously monitoring the temperature at key locations in real time.

[0005] To achieve the above objectives, this application provides a aging apparatus for a plasma surgical device, comprising: a foot pedal control interface, a load interface, a multi-channel temperature sampling interface, and a microcontroller, wherein:

[0006] The foot pedal control interface is connected to the foot pedal interface of the plasma surgery device, and the load interface is connected to the electrode interface and load resistor of the plasma surgery device.

[0007] The multiple temperature sampling interfaces are connected to multiple temperature measuring components, which measure the temperature value of a designated part of the plasma surgical device.

[0008] The microcontroller is connected to the foot pedal control interface, the load interface, and the multiple temperature sampling interfaces via circuitry. The microcontroller controls the start and stop of cutting and / or coagulation of the plasma surgical device through the foot pedal control interface; the microcontroller controls the power output through the load interface; the microcontroller obtains the temperature value measured by the temperature measuring component through the multiple temperature sampling interfaces, and determines whether there is an over-temperature safety risk in the aging test based on whether the temperature value exceeds a set threshold, and issues an alarm.

[0009] Optionally, the temperature measuring component is a thermocouple, one of the thermocouples measures the temperature value of a designated part of the plasma surgical device, and the microcontroller acquires the temperature values ​​of multiple thermocouples through a serial peripheral interface bus.

[0010] Optionally, the temperature measuring component includes three K-type thermocouples, which are respectively installed at three key locations in the plasma surgical device: the heat sink, the low-voltage power supply, and the transformer, to measure the temperature at these three key locations.

[0011] Optionally, each of the K-type thermocouples is connected to a MAX6675 chip. The MAX6675 chip includes a compensation circuit and an analog-to-digital converter circuit connected in series. The analog-to-digital converter circuit is connected to a microcontroller. The compensation circuit performs cold junction compensation on the temperature values ​​of the three K-type thermocouples, and then performs analog-to-digital conversion through the analog-to-digital converter circuit to convert the analog signal into a digital signal, which is then output to the microcontroller via a serial peripheral interface bus.

[0012] Optionally, when the load resistor includes multiple load resistors with different levels, the microcontroller controls the switching of the load resistors with different levels through the load interface, and the resistance values ​​of the load resistors with different levels correspond to different levels of cutting and / or coagulation in the aging test.

[0013] Optionally, the microcontroller is a single-chip microcomputer, which is connected to a power supply circuit, a reset circuit, a clock circuit, and a debug interface circuit. The power supply circuit provides a stable power supply to the single-chip microcomputer, the reset circuit performs a stable reset, the clock circuit provides a clock function, and the debug interface circuit is connected to a debug line to receive input debug signals. More preferably, the single-chip microcomputer is an STM32F103C8T6 chip.

[0014] Optionally, the aging apparatus of the plasma surgical device also includes a display screen, which is connected to the microcontroller via a display screen interface circuit for displaying aging test results and setting aging test parameters.

[0015] Optionally, the aging apparatus of the plasma surgical device also includes a start-stop control circuit. One end of the start-stop control circuit is connected to the microcontroller, and the other end is connected to the foot pedal control interface. The start-stop control circuit controls the foot pedal switch through electrical signals to simulate the cutting and / or coagulation start-stop states of the foot pedal switch.

[0016] Optionally, the aging tooling of the plasma surgical equipment also includes a tooling power supply circuit, the input of which is connected to a 12-volt DC power supply to power the entire tooling.

[0017] The aging apparatus for the plasma surgical equipment provided in this application, based on the foot pedal interface and electrode interface for cutting and / or coagulation aging tests of the plasma surgical equipment, adopts a multi-channel temperature sampling interface in conjunction with a temperature measuring component. This enables real-time monitoring of the temperature at key locations while achieving automatic aging tests, which is beneficial for analyzing adverse temperature data and effectively ensuring the quality of the equipment.

[0018] Other technical effects resulting from the additional features will be further illustrated in the corresponding embodiments. Attached Figure Description

[0019] Other features, objects, and advantages of this application will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0020] Figure 1 This is a structural diagram of the appearance of a refurbished surgical apparatus for a plasma surgical device according to an exemplary embodiment.

[0021] Figure 2 This is an overall circuit diagram of the old chemical apparatus of a plasma surgical device according to an exemplary embodiment;

[0022] Figure 3 A circuit connection diagram of the power supply circuit of an old chemical apparatus for a plasma surgical device, according to an exemplary embodiment;

[0023] Figure 4 This is a circuit connection diagram for temperature sampling of a aging chemical apparatus for a plasma surgical device, according to an exemplary embodiment.

[0024] Figure 5 A microcontroller and related circuit connection diagram of a aging chemical apparatus for a plasma surgical device, according to an exemplary embodiment;

[0025] Figure 6 This is a load switching circuit connection diagram of an old chemical apparatus for a plasma surgical device according to an exemplary embodiment;

[0026] Figure 7This is a circuit connection diagram of the start-stop control circuit of an old chemical apparatus for a plasma surgical device, according to an exemplary embodiment.

[0027] Figure 8 This is a circuit connection diagram of the touch screen interface circuit of the old chemical apparatus of a plasma surgical device according to an exemplary embodiment.

[0028] In the diagram: 1 is the foot pedal control interface, 2 is the load interface, 3 is the foot pedal interface, 4 is the electrode interface, 5 is the temperature sampling interface, 6 is the display screen, 7 is the microcontroller, 8 is the load switching circuit, 9 is the start / stop control circuit, 10 is the tooling power supply circuit, and 11 is the temperature sampling circuit. Detailed Implementation

[0029] The present application will now be described in detail with reference to specific embodiments. These embodiments will help those skilled in the art to further understand the present application, but do not limit the present application in any way. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present application, and these all fall within the protection scope of the present application. Parts not described in detail in the following embodiments can be implemented using existing technology.

[0030] Existing aging tooling for plasma surgical equipment typically uses a 12V power supply and a foot pedal control interface 1 to replace the foot switch in the actual equipment, simulating the use of the plasma surgical device for aging tests. However, current tooling cannot monitor the temperature of components (especially critical locations) in real time during aging tests, making it impossible to analyze adverse temperature data. This hinders the research and development and production of plasma surgical equipment and fails to guarantee equipment quality.

[0031] To address the aforementioned problems, this application provides a aging apparatus for a plasma surgical device, which can solve the problems described above.

[0032] Reference Figure 1 , Figure 2 As shown in one embodiment of this application, a aging apparatus for a plasma surgical device is provided, comprising: a foot pedal control interface 1, a load interface 2, a multi-channel temperature sampling interface 5, and a microcontroller 7. The foot pedal control interface 1 is connected to the foot pedal interface 3 of the plasma surgical device, and the load interface 2 is connected to the electrode interface 4 and the load resistor of the plasma surgical device. The multi-channel temperature sampling interface 5 is connected to multiple temperature measuring components, which measure the temperature value of a designated part of the plasma surgical device.

[0033] In this embodiment, the microcontroller 7 is connected to the foot pedal control interface 1, the load interface 2, and the multi-channel temperature sampling interface 5 via circuitry. The microcontroller 7 is the control component for the entire tooling test. Specifically, the microcontroller 7 controls the start and stop of cutting and / or coagulation of the plasma surgical equipment through the foot pedal control interface 1; the microcontroller 7 controls the power output through the load interface 2; and the microcontroller 7 obtains the temperature value measured by the temperature measuring component through the multi-channel temperature sampling interface 5. Based on whether the temperature value exceeds the set threshold, it determines whether there is an over-temperature safety risk in the aging test and can issue an alarm.

[0034] Specifically, in this embodiment, the foot pedal control interface 1 of the aging suit is connected to the foot pedal interface 3 of the plasma surgical device, and the electrode interface 4 of the plasma surgical device is connected to the load interface 2 of the aging suit. The load interface 2 is connected to a load resistor of a certain resistance value (e.g., 500 ohms, 1000 ohms, etc.) as the aging load. During the aging test, the load interface 2 of the aging suit is connected to the electrode interface 4 for power output. The microcontroller 7 controls the load resistor to consume power to simulate cutting, coagulation, and other operations. The simulated cutting or coagulation operations are repeatedly started and stopped to perform the aging test, realizing the aging test of the cutting and coagulation operations of the plasma surgical device. At the same time, during the aging test of the cutting and coagulation operations, the temperature at a specified location in the plasma surgical device is collected using a multi-channel temperature sampling interface 5. The microcontroller 7 determines whether there is an overheating safety risk in the aging test based on whether the temperature value exceeds a set threshold and issues an alarm.

[0035] In the above embodiments of this application, by cooperating with the multi-channel temperature sampling interface 5 and the microcontroller 7, the aging test of the cutting and coagulation operations of the plasma surgical equipment can be carried out, while the temperature of the key positions of the plasma surgical equipment can be monitored in real time. This avoids equipment quality problems caused by the influence of working temperature and can effectively ensure equipment quality.

[0036] It should be noted that the plasma surgical device in the above embodiments of this application can be a conventional plasma surgical device, and is not limited to a specific plasma surgical device.

[0037] In order to monitor the temperature at a designated location of the plasma surgical device, in some embodiments of this application, the temperature measuring component can be a thermocouple. One thermocouple measures the temperature value of a designated part of the plasma surgical device, and the microcontroller 7 obtains the temperature values ​​of multiple thermocouples through a serial peripheral interface bus.

[0038] During the use of plasma surgical equipment, temperatures can rise. Excessive temperatures can disrupt the stable plasma flow, accelerate the aging of electronic components, and lead to equipment malfunctions. These issues can ultimately affect surgical precision, increase the frequency of equipment maintenance, drastically increase consumable costs, and pose potential safety hazards. Therefore, monitoring the temperature at certain locations during the actual research and testing of plasma surgical equipment for cutting and coagulation procedures can help avoid these problems.

[0039] According to the inventors' research, the heat sink, low-voltage power supply, and transformer in typical plasma surgical equipment are critical locations for temperature rise. Therefore, in some preferred embodiments of this application, temperature monitoring is performed on these three locations to avoid most of the risks caused by temperature increases. Specifically, refer to... Figure 2 As shown, the temperature measuring component includes three K-type thermocouples. These three K-type thermocouples are respectively installed at three key locations in the plasma surgical equipment: the heat sink, the low-voltage power supply, and the transformer, to measure the temperature at these three key locations. During installation, the temperature measuring points of the K-type thermocouple connection wires are placed at the key locations of the plasma equipment to be aged.

[0040] In the preferred embodiment described above, temperature monitoring at these three key locations allows for the identification of data exceeding the normal temperature range. For example, a temperature threshold can be set, and the measured temperature values ​​can be compared. If the measured values ​​exceed the threshold, the data is considered defective. Furthermore, an alarm can be triggered for values ​​exceeding the preset threshold.

[0041] Temperature monitoring at the heatsink ensures good heat dissipation for the MOSFETs, preventing damage from overheating. Temperature monitoring at the low-voltage power supply ensures the power supply operates within its normal temperature range. Overheating in the transformer can affect the heat dissipation of its internal windings; temperature monitoring at this point can resolve this issue. By measuring the temperature of critical components, abnormal temperature data can be analyzed, effectively ensuring equipment quality.

[0042] Of course, in other embodiments, the monitoring position of the temperature measuring component can be selected according to the needs and the structural settings of the plasma surgical device, and is not limited to the temperature monitoring of the three key positions mentioned above.

[0043] In order to obtain more accurate temperature monitoring results, in some preferred embodiments of this application, each K-type thermocouple is connected to a MAX6675 chip. The MAX6675 chip includes a compensation circuit and an analog-to-digital converter circuit connected in series. The analog-to-digital converter circuit is connected to the microcontroller 7. The compensation circuit performs cold junction compensation on the temperature values ​​of the three K-type thermocouples, and then performs analog-to-digital conversion through the analog-to-digital converter circuit to convert the analog signal into a digital signal, and then outputs it to the microcontroller 7 through the serial peripheral interface bus.

[0044] The MAX6675 chip is a K-type thermocouple to digital converter with integrated cold junction compensation. Its core function is to convert the minute voltage signal generated by the thermocouple into a digital temperature value. Simultaneously, it uses built-in compensation circuitry to eliminate the influence of ambient temperature, improving measurement accuracy. The specific internal circuitry of the MAX6675 chip is existing technology and will not be detailed here.

[0045] The above-mentioned multi-channel temperature sampling interface 5, 3 thermocouples, and 3 MAX6675 chips constitute the temperature sampling circuit 11, and transmit the 3 collected temperature values ​​to the microcontroller 7 to form temperature monitoring.

[0046] Existing aging test systems typically use a fixed load for testing. However, in the use of plasma surgical equipment, cutting and coagulation operations may involve different power levels, resulting in aging tests that do not fully reflect the actual usage of the plasma surgical equipment. To address this issue, in some embodiments of this application, the load resistor can provide multiple load resistors with different power levels, allowing for free switching between load resistors to perform aging tests at different power levels. When the load resistor includes multiple load resistors with different power levels, the microcontroller 7 controls the switching of different load resistors through the load interface 2. The resistance values ​​of the different load resistors correspond to different power levels for cutting and / or coagulation in the aging test. In a specific embodiment, two different power levels of load resistors can be set. During actual aging test operations, one power level of resistor is selected each time, and then cutting and coagulation operations are alternated according to the aging parameters. For example, a 500-ohm resistor is used for cutting power 7 and coagulation power 1, and a 1000-ohm resistor is used for cutting power 9 and coagulation power 2. In addition, the switching of the load resistor can be automatically controlled by a load switching circuit 8 mainly composed of relays connected to the microcontroller 7.

[0047] In the above embodiments of this application, the microcontroller 7 can be implemented using a single-chip microcomputer, which is connected to related peripheral circuits. For example, the single-chip microcomputer is connected to a power supply circuit, a reset circuit, a clock circuit, and a debug interface circuit. The power supply circuit provides a stable power supply to the single-chip microcomputer, the reset circuit implements a stable reset, the clock circuit provides a clock function, and the debug interface circuit connects to debug lines to receive input debug signals. More preferably, the single-chip microcomputer can be directly selected from the STM32F103C8T6 chip. The STM32F103C8T6 chip is a very classic microcontroller 7 in the embedded field and currently has a very wide range of applications. It is a microcontroller 7 based on the ARM Cortex-M3 core.

[0048] In addition, in the aging test conducted in the above embodiments of this application, in order to better understand the process and results, refer to Figure 1As shown, the aging apparatus for the plasma surgical device can further include a display screen 6. The display screen 6 is connected to the microcontroller 7 via a display interface circuit to display the aging test results. Of course, the display screen 6 can also be a touchscreen (see [reference]). Figure 2 As shown, aging test parameters can be directly set via the touchscreen, further facilitating test operations. For example, the cutting or coagulation working time of the test can be set via the touchscreen (e.g., 2 hours). This parameter is then output to the microcontroller 7 via the display screen 6 interface circuit. The microcontroller 7 controls the test and simulates the cutting or coagulation state of the foot switch via the foot control interface 1 based on the received setting of the cutting or coagulation working time.

[0049] To better control the aging test of the foot switch, refer to Figure 2 As shown, in some embodiments of this application, the aging equipment of the plasma surgical device also includes a start-stop control circuit 9. One end of the start-stop control circuit 9 is connected to the microcontroller 7, and the other end is connected to the foot pedal control interface 1. It controls the foot pedal switch through electrical signals to simulate the cutting and / or coagulation start-stop states of the foot pedal switch.

[0050] Of course, refer to Figure 2 As shown, the aging tooling of the plasma surgical equipment also includes a tooling power supply circuit 10. The input terminal of the tooling power supply circuit 10 is connected to a 12-volt DC power supply to power the entire tooling, including the aforementioned microcontroller 7 and other circuit modules.

[0051] The preferred features in the above embodiments can be used individually in any embodiment, or in any combination thereof, provided they do not conflict with each other. Furthermore, parts not described in detail in the embodiments can be implemented using existing technologies.

[0052] To better understand the specific implementation of this application, the following describes the specific implementation circuit of the old chemical apparatus for plasma surgical equipment in conjunction with the technical description of the above embodiments. Of course, the specific implementation of the circuit is only one embodiment of this application. In other embodiments, there may be other circuit options, and it is not limited to the following description.

[0053] In this embodiment, refer to Figure 2 As shown, examples are given of the specific design and implementation of the tooling power supply circuit 10, temperature sampling circuit (multi-channel temperature sampling), microcontroller 7 circuit (the control part of the entire old tooling), start-stop control circuit 9, load switching circuit 8 (for switching when there are multiple load resistors), and touch screen interface circuit (connecting the microprocessor and the touch screen).

[0054] In this embodiment, the aging equipment is connected to the foot switch interface of the plasma surgery device to control the start and stop of cutting and coagulation, and is connected to the electrode interface 4 for power output. At the same time, the temperature of key positions is monitored in real time through multi-channel temperature sampling, and the aging test parameters are set on the touch screen to configure aging.

[0055] For tooling power supply circuit 10, a 12V power input is used to provide power to the entire old tooling. For details, refer to... Figure 3 As shown, the tooling power supply circuit 10 converts the input voltage of 12V into the voltage required by other modules, wherein:

[0056] Figure 3 The leftmost circuit is the 12V input section, including connector J4, diode D1, and capacitor C15. Connector J4 has four pins (pins 1-4). Pin 1 is the 12V power input point (12V_IN), pins 2 and 3 are directly connected for a more stable input, and pin 4 is grounded (GND). Diode D1 (SMAJ33A-13-F) has its negative terminal connected to the 12V input line (connected to pin 1 of J4), and its positive terminal grounded (GND). Since the negative terminal of diode D1 is connected to the power supply and the positive terminal is grounded, it acts as a voltage regulator. That is, when the voltage across diode D1 exceeds its voltage regulation value, the diode will break down and conduct, thus regulating the voltage. Capacitor C15 has its positive terminal connected to the 12V input line (at the same potential as the negative terminal of D1), and its negative terminal grounded (GND). It is used for filtering, making the 12V input voltage smoother and reducing voltage fluctuations.

[0057] Figure 3 The intermediate circuit is the 12V to 5V conversion section, including the voltage regulator chip U9 and capacitors C1-C4. The voltage regulator chip U9 (CJ7805) has three pins: pin 1 connects to the 12V input (derived from the 12V input circuit on the left, sharing a common point with C1 and C2), pin 2 is grounded (GND), and pin 3 outputs 5V. Capacitor C1 (47uF) has one end connected to the 12V input (the front end of pin 1 of U9) and the other end grounded, further filtering the 12V input. Capacitor C2 (470nF) is connected in parallel with C1 (also with one end connected to the 12V input and the other end grounded) to filter out high-frequency noise, making the voltage input to U9 cleaner. Capacitor C3 (47uF) has one end connected to pin 3 of U9 (the 5V output terminal) and the other end grounded, filtering the output 5V voltage and smoothing the waveform. Capacitors C4 (470nF) and C3 are connected in parallel (one end connected to the 5V output and the other end grounded) to help filter out high-frequency interference and improve the quality of the 5V output.

[0058] Figure 3The rightmost circuit is the 5V to 3.3V conversion section, including the voltage regulator chip U8 and capacitors C5-C7. The voltage regulator chip U8 (SPX1117M3-3.3 / TR) has three pins: pin 1 (“ADJ”) and pin 2 (“VOUT”) output 3.3V, and pin 3 (“VIN”) connects to the 5V input (derived from the middle 5V circuit). Capacitor C5 (100nF) is connected to the 5V input (the front end of pin 3 of U8) on one end and grounded on the other, filtering the 5V input to reduce noise. Capacitor C6 (47uF) is connected to pin 2 of U8 (the 3.3V output) on one end and grounded on the other, filtering the 3.3V output for greater voltage stability. Capacitor C7 (470nF) is connected in parallel with C6 (one end connected to the 3.3V output and the other end grounded) to further filter high-frequency noise and optimize the 3.3V output.

[0059] Therefore, in the aforementioned tooling power supply circuit 10: the input 12V voltage is first introduced through J4, filtered by D1 for reverse connection protection and C15, and then stepped down to 5V by U9. The 5V is then stepped down to 3.3V by U8. Each step uses capacitor filtering to make the voltage purer, meeting the power supply requirements of different circuits (12V, 5V, 3.3V). The parameter values ​​of each component in the specific circuit have been determined, such as... Figure 3 As shown in the image.

[0060] Figure 4 This is a circuit diagram illustrating the multi-channel sampling section (temperature sampling) of the aging apparatus of a plasma surgical device according to an exemplary embodiment. In this embodiment, a temperature sampling circuit is used to acquire temperature data of key parts during the aging test. Three K-type thermocouples and a MAX6675 chip are used. The microprocessor reads data from multiple thermocouples via the SPI bus. If the operating temperature exceeds a set threshold during the entire aging test, the microcontroller determines that there is an over-temperature safety risk in the aging test, stops outputting, and issues an alarm.

[0061] Reference Figure 4 As shown, the core of the temperature sampling circuit consists of three MAX6675 temperature sensor chips (U14, U15, U16) and a temperature sampling interface circuit. This circuit is responsible for temperature acquisition, signal processing, and signal conversion. More specifically, the circuitry for each MAX6675 temperature sensor chip (U14, U15, U16) mainly handles power supply and filtering, signal processing, and connection to the temperature probe (e.g., a K-type thermocouple). Since the circuit connections for U14, U15, and U16 are basically the same, the following explanation uses U14 as an example to illustrate the connection method of the circuit components.

[0062] See attached document Figure 4In the MAX6675 temperature sensor chip U14, the power supply and filtering circuit connections are as follows: pin 4 (VCC) of U14 is connected to +5V power supply, and pin 1 (GND) is connected to GND (ground). One end of capacitor C23 (100nF) is connected to +5V (at the same potential as pin 4), and the other end is connected to GND to filter the power supply of U14 and make the power supply more stable.

[0063] The circuit connection for signal processing of U14 is as follows: Pin 5 (SCK) of U14 is connected to the CLK signal, which controls the data transmission rhythm via the clock line; Pin 6 (CS#) is connected to the CS1 signal (chip select); Pin 7 (SO) is connected to the MISO signal for data output, transmitting temperature data to microcontroller 7. Resistor R16 (649Ω) is connected to +5V at one end and to the MISO line (on the same path as pin 7) at the other end, acting as a pull-up resistor to stabilize the MISO signal and prevent signal drift.

[0064] The circuit connection of the temperature probe of U14 is as follows: pin 2 (T1-) and pin 3 (T1+) of U14 are connected to T1- and T1+ of temperature sampling interface 5J6 (corresponding to pins 1 and 2 of J6) to connect the thermocouple probe and collect temperature signals.

[0065] Continue to refer to Figure 4 The diagram further illustrates the circuit connection of temperature sampling interface 5 (J6), where J6 has 6 pins in total, in the following order:

[0066] Pin 1: T1-connects to T1- (pin 2) of U14

[0067] Pin 2: T1+ connects to T1+ of U14 (pin 3)

[0068] Pin 3: T2-connects to T2-(pin 2) of U15

[0069] Pin 4: T2+ connects to T2+ (pin 3) of U15.

[0070] Pin 5: T3-connects to T3-(pin 2) of U16

[0071] Pin 6: T3+ connects to T3+ (pin 3) of U16.

[0072] In the circuit described above, each of the three MAX6675 chips (U14 / U15 / U16) independently acquires one temperature signal (connected to a thermocouple via J6). Each chip is powered by +5V and filtered by a 100nF capacitor. It communicates with the microcontroller 7 via SCK / CS# / MISO (clock, chip select, data output). Pull-up resistors stabilize the MISO signal, and finally, the three temperature signals are converted into digital values ​​and transmitted to the microcontroller 7.

[0073] Figure 5This diagram illustrates the microcontroller 7 and related circuit connections of an aging chemical apparatus for a plasma surgical device according to an exemplary embodiment. The diagram details the relevant circuit connections of the microcontroller 7 in one embodiment of this application. Specifically, the microcontroller 7 uses an STM32F103C8T6 microcontroller chip. The STM32F103C8T6 chip is divided into two parts, U1.1 and U1.2, according to the principle of functional implementation. The circuit mainly includes the power supply for the microcontroller 7, a crystal oscillator, and a debugging interface, etc. The following is a detailed explanation... Figure 5 The specific connections and descriptions of the microprocessor and its related circuits in this embodiment are described in detail according to their functions and modules.

[0074] Reference Figure 5 As shown in the diagram, the debug interface circuit (top right corner) uses a 4-pin connector J5. Pin 1 is connected to GND (ground), pin 2 to SWCLK (debug clock), pin 3 to SWDIO (debug data), and pin 4 to +3.3V (power supply). Resistor R3 is connected to +3.3V at one end and to pin 3 (SWDIO) of J5 at the other end; resistor R4 is connected to +3.3V at one end and to pin 2 (SWCLK) of J5 at the other end, acting as a pull-up resistor to ensure stable debug signals. Both resistors R3 and R4 are 10kΩ.

[0075] Reference Figure 5 As shown, the crystal oscillator circuit uses crystal oscillator X1 (8MHz) as the core device. X1 is a 2-pin device. The OSC_IN pin (left side) is connected to GND through capacitor C16 (20pF), and the OSC_OUT pin (right side) is connected to GND through capacitor C17 (20pF). The two ends of crystal oscillator X1 are connected to the clock input pins of microcontroller 7 to provide the system clock.

[0076] Reference Figure 5 As shown, the power supply circuit of microcontroller 7 (surrounding U1.1 and U1.2) includes a voltage regulator U1.2, which is a multi-pin power chip. The VIN pins (such as VBAT, VDD_1, etc.) are connected to a +3.3V input, and the VSS pin (ground) is connected to GND. The output is connected to GND through filter capacitors C8 (1.0uF) and C9-C12 (100nF), providing a stable 3.3V power supply to U1.1 of microcontroller 7. U1.1 is the core control part of microcontroller 7. The main control functions mentioned above regarding the tooling aging test are all implemented by U1.1. The power supply pins (such as VDD) are connected to the output of U2, the VSS pin is connected to GND, and the filter capacitors C8-C12 are connected in parallel between the power supply and ground to filter out power supply noise.

[0077] in addition, Figure 5The circuit also includes reset and auxiliary circuitry, including resistors R1, R2, R5, and capacitor C3. Resistor R5 (10kΩ) is connected to +3.3V at one end and to the microcontroller 7 reset-related pins (such as NRST) at the other end, acting as a pull-up resistor to ensure a stable reset level. Capacitor C3 (10nF) is connected to the reset pin at one end and to GND at the other, forming a reset filter circuit with R5 to enhance anti-interference capabilities. Resistor R1 (10kΩ) is connected to +3.3V at one end and to BOOT0 and other pins at the other end to configure the startup mode; resistor R2 (10kΩ) is connected to GND at one end and to a relevant function pin at the other end, acting as a pull-down / matching resistor.

[0078] pass Figure 5 As can be seen, in the microcontroller 7 and its supporting circuits, the debugging interface circuit uses J5 pull-up resistor to connect the debugging line; the crystal oscillator X1 is equipped with two 20pF capacitors to provide the clock; the voltage regulator U1.2 supplies power to U1.1 through the filter capacitor; the reset circuit uses R5 and C3 to achieve stable reset, and R1 and R2 to assist in configuration functions.

[0079] Figure 6 This is a connection diagram of the load switching circuit 8 of a aging procedure for a plasma surgical device, according to an exemplary embodiment. The purpose of the load switching circuit 8 is to switch the corresponding load resistor for power output at different settings. (Refer to...) Figure 6 As shown, the load switching circuit 8 includes two load control circuits (K2 and K3 relays) with similar structures, which are used to switch the load power supply according to the control signal. The connection of each component is described below (taking the K3 circuit as an example, and the same applies to K2).

[0080] The K3 relay control circuit includes relay K3 (G2RL-1A-E-DC12), transistor Q4 (S8050), resistor R22 (11kΩ), and diode D10 (1N4148WT). The input signal EN is connected to the base of transistor Q4 (S8050) via resistor R21 (2.2kΩ). The emitter of Q4 is connected to GND (ground), and the collector is connected to one end of the relay K3 coil. One end of resistor R22 (11kΩ) is connected to a +12V power supply, and the other end is connected to the collector of transistor Q4 (and also to the relay K3 coil pin), providing a power supply path for the relay coil. The cathode of diode D10 (1N4148WT) is connected to +12V, and its anode is connected to the relay K3 coil pin and shares a common point with the collector of Q4 and R22. Its function is freewheeling protection; when the relay coil is de-energized, the reverse electromotive force is released through D10, preventing damage to the transistor. One end of the coil of relay K3 (G2RL-1A-E-DC12) is connected to the collector of Q4, and the other end is connected to GND. One end of the relay K3 contact outputs an OUT_1 signal and connects to electrode interface 4CN1 or the load. The load and the interface OUT_1 signal are connected to electrode interface 4CN1 (pin 2), and pin 1 of CN1 is grounded to GND to realize the load power supply output.

[0081] Similar to the K3 relay control circuit, the K2 relay control circuit includes relay K2, transistor Q3, resistor R20, diode D9, etc. The control signal EN is connected to the base of transistor Q3 (S8050) via resistor R19, with the emitter connected to GND and the collector connected to one end of the relay K2 coil. Resistor R20 (11kΩ) has one end connected to +12V and the other end connected to the collector of Q3 and the relay K2 coil, supplying power to the coil. Diode D9 (1N4148WT) has its negative terminal connected to +12V and its positive terminal connected to the K2 coil pin, sharing a common point with the collector of Q3 and R20, providing freewheeling protection for the transistor. One end of the relay K2 (G2RL-1A-E-DC12) coil is connected to the collector of Q3, and the other end is connected to GND. One end of the contact outputs OUT_1, which is connected to the load. The load interface 2P2 (4 pins) contains multiple GND and signal inputs, used to connect external loads and receive the OUT_ control signal.

[0082] In this embodiment, taking K3 as an example, the logic of the relay control circuit is as follows: when the microcontroller 7 outputs a load switching control signal, and the relay control circuit signal EN is high, transistor Q4 conducts, the relay K3 coil is energized, the contacts close, and the OUT_1 signal is output, supplying power to the load; diode D10 protects the transistor from damage due to reverse voltage when the coil is de-energized. The K2 circuit works similarly, independently controlled by the control signal EN. The two outputs can be connected to electrode interface 4CN1 or load interface 2P2 to achieve load switching, i.e., turning on the relay as needed to supply power to different loads.

[0083] As can be seen, the load switching circuit 8 in this embodiment has two paths: each path uses a transistor as a switch to control the on and off of the relay, with diode freewheeling protection, and the relay contacts output control signals to the load interface 2, realizing the switching function of "giving the corresponding relay signal to the load that needs to work, so that it can be energized and powered".

[0084] Figure 7 This is a circuit connection diagram of the start / stop control circuit 9 of the old chemical apparatus of a plasma surgical device according to an exemplary embodiment. The start / stop control circuit 9 is used to simulate the cutting and coagulation start / stop states of a foot switch. Here, the start / stop state refers to starting cutting / coagulation and stopping cutting / coagulation. It can be controlled by the microprocessor 7 outputting high and low level signals as control signals, with low level representing start and high level representing stop.

[0085] Reference Figure 7 As shown, the start / stop control circuit 9 includes two relay control circuits with similar structures (controlling "FOOTCUT" and "FOOTCOAG"), which are used to control the foot switch related functions through electrical signals, and also includes the circuit connection related to the foot control interface 1.

[0086] Specifically, Figure 7 In the middle section, the "FOOTCUT" control circuit on the left side of the relay control circuit is used to control the start and stop of the cutting. It includes transistor Q1, resistor R13, diode D7, and relay RELAY1. The base (middle pin) of transistor Q1 (S8050) is connected to the input signal EN_CUT through resistor R12 (2.2kΩ). EN_CUT is an external control signal (output by microprocessor 7) that determines whether to trigger the circuit. The emitter is grounded, and the collector is connected to one end of the relay RELAY1 coil, i.e., pin 2 of RELAY1. One end of resistor R13 (5.1kΩ) is connected to a +5V power supply, and the other end is connected to the collector of transistor Q1 and also to pin 2 of RELAY1, providing a power supply path for the relay coil. The cathode of diode D7 (1N4148WT) is connected to +5V, and the anode is connected to pin 2 of RELAY1, sharing a common point with the collector of Q1 and R13. Its function is freewheeling protection; when the relay coil is de-energized, the generated reverse electromotive force is released through D7, preventing damage to the transistor. Pins 2 and 5 of the relay RELAY1 (G5V-1-DC5) are coil pins, with pin 2 connected to the collector of Q1 and pin 5 grounded; pins 1 and 9 are contacts, with pin 1 connected to +5V, and the current path after diode D7 freewheeling. Pin 9 outputs the FOOT_CUT signal, which is connected to the foot pedal control interface J7.

[0087] Figure 7In the circuit, the "FOOTCOAG" control circuit on the right side of the relay control circuit is used to control the start and stop of coagulation. It includes relay RELAY2, transistor Q2, resistor R15, and diode D8. The base of transistor Q2 (S8050) is connected to the input signal EN_COAG through resistor R14 (2.2kΩ). EN_COAG is an external control signal (output by microprocessor 7). Its emitter is connected to GND, and its collector is connected to one end of the coil of relay RELAY2, i.e., pin 2 of RELAY2. Resistor R15 (5.1kΩ) is connected to +5V at one end and to the collector of transistor Q2, and also to pin 2 of RELAY2, supplying power to the relay coil. Diode D8 (1N4148WT) has its cathode connected to +5V and its anode connected to pin 2 of RELAY2, sharing a common point with the collector of Q2 and R15. This also serves as freewheeling protection, releasing the reverse electromotive force of the coil. Pins 2 and 5 of the relay RELAY2 (G5V-1-DC5) are coil pins. Pin 2 is connected to the collector of Q2, and pin 5 is connected to GND. Pins 1 and 9 are contacts. Pin 1 is connected to +5V and then the current flows through D8. Pin 9 outputs the FOOT_COAG signal, which is connected to the foot pedal control interface J7.

[0088] Figure 8 In the middle, the foot pedal control interface J7 has a total of 5 pins, of which pin 3 is unused. Pin 1 is grounded, pin 2 (FOOT_CUT) is connected to pin 9 of RELAY1 (output control signal); pin 4 (FOOT_COAG) is connected to pin 9 of RELAY2 (output control signal); pin 5 is grounded, at the same potential as pin 1, to enhance grounding stability.

[0089] In this embodiment, as can be seen from the circuit connection described above, the logic of the start / stop control circuit 9 is as follows: when the EN_CUT signal output by the microprocessor 7 is high, transistor Q1 is turned on, the coil of relay RELAY1 is energized, the contacts close, and the FOOT_CUT signal is output (for foot pedal control); similarly, when the EN_COAG signal output by the microprocessor 7 is high, Q2 is turned on, relay RELAY2 closes, and the FOOT_COAG signal is output. Diodes D7 and D8 protect the transistors, preventing reverse voltage damage to the components when the relays are de-energized. The two relays are independently controlled and connected to the foot pedal device through the foot pedal control interface J7 to realize the start / stop of the "CUT" (cutting) and "COAG" (coagulation) functions.

[0090] Figure 8This is a circuit connection diagram of the touchscreen interface circuit for the aging apparatus of a plasma surgical device, according to an exemplary embodiment. The touchscreen interface circuit is mainly used to connect the microprocessor and the touchscreen. The touchscreen can set parameters for the aging test, such as setting the cutting or coagulation working time, setting the interval between cutting or coagulation operations, setting the temperature threshold and displaying the current temperature, switching the load resistance, and issuing commands to start and stop the aging test. The touchscreen also has alarm prompts. In this embodiment, reference is made to... Figure 8 The touch screen interface circuit mainly includes interface J2 (LCD interface), power supply and filtering, TVS diode, signal transmission and other functions.

[0091] Specifically, interface J2 has 5 pins. Pin 1 is connected to the 12V power supply, pin 2 is DWIN_TXD, which is the touch screen's transmit signal, transmitting data from the touch screen to the outside, pin 3 is DWIN_RXD, which is the touch screen's receive signal (external data is sent to the touch screen), and pins 4 and 5 are grounded and connected to the circuit ground.

[0092] Figure 8 In the circuit, the power supply and filtering connections include: capacitor C14 (47uF) with its positive terminal connected to the +12V power supply and its negative terminal grounded. Its function is filtering, making the 12V voltage input to the touchscreen smoother and reducing voltage fluctuation interference. The 12V power supply powers the touchscreen; after being filtered by capacitor C14, it is connected to the circuit and indirectly connected to the TVS diode and pin J2.

[0093] ​ In the circuit, the three TVS diodes (transient voltage suppressor diodes) are connected in parallel: the negative terminals of the TVS diodes are all connected to the 12V line and connected to the positive terminal of C14 and the power supply terminal of J2, while the positive terminals are all grounded. When a momentary high voltage (such as a surge or static electricity) occurs in the circuit, the TVS diodes will quickly conduct, conducting the high voltage to ground and protecting the touch screen from being damaged by the high voltage.

[0094] Pins J222 and J223 are the transmit and receive signal lines for the touchscreen, directly connected to the microcontroller 7 (such as a microcontroller) for transmitting touch commands and display data. Pin J225 is directly connected to GND, providing a ground reference for the touchscreen.

[0095] As can be seen, in this embodiment, the connection logic of the touchscreen interface circuit is as follows: the LCD interface J2 connects the DWIN_TXD / RXD signals, GND ground, and external circuits through 5 pins; the 12V power supply, after being filtered by C14 and protected against overvoltage by TVS diodes, powers the touchscreen. Three TVS diodes are connected in parallel between the 12V and ground, conducting to ground when encountering high voltage to protect the touchscreen; capacitor C14 keeps the 12V clean, and the signal pins are responsible for data transmission, enabling communication and power supply between the touchscreen and external devices.

[0096] The embodiments described above enable real-time temperature measurement, focusing on critical components. Analysis of abnormal temperature data effectively ensures equipment quality. Furthermore, the system allows for free switching of load resistance, enabling selection of appropriate load resistances for aging tests at different settings, closely aligning with actual needs. Additionally, the design of the microcontroller 7, along with other related circuits, allows for test parameter settings via a touchscreen, facilitating automated testing. This simplifies operation, reduces manual intervention, and offers good versatility, eliminating the need for constant monitoring of the equipment.

[0097] Of course, the circuits described above are examples of preferred embodiments of this application and are not limited to the circuit selections described above. In other cases, other devices and circuits may also be used, as long as they can achieve the functions required by this application.

[0098] In the description of the embodiments in this application, "multiple" means two or more, unless otherwise explicitly specified. In this application, unless otherwise explicitly specified and limited, the terms "installed," "connected," "linked," "fixed," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0099] The terms "comprising" and "having," and any variations thereof, in the embodiments of this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the steps or units listed, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to such processes, methods, products, or devices.

[0100] The foregoing has described some specific embodiments of this application. It should be understood that this application is not limited to the specific embodiments described above, and those skilled in the art can make various modifications or variations within the scope of the claims, which do not affect the substantive content of this application. The above-described preferred features can be used in any combination without conflict.

Claims

1. A aging apparatus for a plasma surgical device, comprising a foot pedal control interface and a load interface, wherein the foot pedal control interface is connected to the foot pedal interface of the plasma surgical device, and the load interface is connected to the electrode interface and load resistor of the plasma surgical device, characterized in that, Also includes: A multi-channel temperature sampling interface is provided, which is connected to multiple temperature measuring components, which measure the temperature value of a designated part of the plasma surgical device. The microcontroller is connected to the foot pedal control interface, the load interface, and the multiple temperature sampling interfaces via circuitry. The microcontroller controls the start and stop of cutting and / or coagulation of the plasma surgical device through the foot pedal control interface; the microcontroller controls the power output through the load interface; and the microcontroller obtains the temperature value measured by the temperature measuring component through the multiple temperature sampling interfaces, and determines whether there is an overheating safety risk in the aging test based on whether the temperature value exceeds a set threshold.

2. The aging equipment for the plasma surgical device according to claim 1, characterized in that, The temperature measuring component is a thermocouple. One thermocouple measures the temperature value of a designated part of the plasma surgical device. The microcontroller acquires the temperature values ​​of multiple thermocouples through a serial peripheral interface bus.

3. The aging equipment for the plasma surgical device according to claim 2, characterized in that, The temperature measuring component includes three K-type thermocouples, which are respectively installed at three key locations in the plasma surgical device: the heat sink, the low-voltage power supply, and the transformer, to measure the temperature at these three key locations.

4. The aging equipment for the plasma surgical device according to claim 3, characterized in that, Each of the K-type thermocouples is connected to a MAX6675 chip. The MAX6675 chip includes a compensation circuit and an analog-to-digital converter circuit connected in series. The analog-to-digital converter circuit is connected to a microcontroller. The compensation circuit performs cold junction compensation on the temperature values ​​of the three K-type thermocouples. Then, the analog-to-digital converter circuit performs analog-to-digital conversion to convert the analog signal into a digital signal, which is then output to the microcontroller via a serial peripheral interface bus.

5. The aging equipment for the plasma surgical device according to claim 1, characterized in that, When the load resistor includes multiple load resistors with different levels, the microcontroller controls the switching of the load resistors with different levels through the load interface. The resistance values ​​of the load resistors with different levels correspond to different levels of cutting and / or coagulation in the aging test.

6. The aging equipment for the plasma surgical device according to claim 1, characterized in that, The microcontroller is a single-chip microcomputer, which is connected to a power supply circuit, a reset circuit, a clock circuit, and a debug interface circuit. The power supply circuit provides a stable power supply to the single-chip microcomputer, the reset circuit realizes stable reset, the clock circuit provides clock function, and the debug interface circuit is connected to a debug line to receive input debug signals.

7. The aging equipment for the plasma surgical device according to claim 6, characterized in that, The microcontroller used is an STM32F103C8T6 chip.

8. The aging equipment for the plasma surgical device according to claim 1, characterized in that, It also includes a display screen, which is connected to the microcontroller via a display screen interface circuit, for displaying aging test results and setting aging test parameters.

9. The aging equipment for the plasma surgical device according to any one of claims 1-8, characterized in that, It also includes a start-stop control circuit, one end of which is connected to the microcontroller and the other end is connected to the foot pedal control interface. The start-stop control circuit controls the foot pedal switch through electrical signals to simulate the cutting and / or coagulation start-stop states of the foot pedal switch.

10. The aging equipment for the plasma surgical device according to any one of claims 1-8, characterized in that, It also includes a tooling power supply circuit, whose input is connected to a 12-volt DC power supply to power the entire tooling.

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