Flexible printed circuit board electrical testing station

Abstract

The utility model relates to circuit board electric property test technical field discloses a kind of flexible printed circuit board electric property test platform, including bottom plate, the top of bottom plate is equipped with pedestal, the top end of pedestal is engaged and is equipped with the probe board electrically connected with pedestal, the surface of probe board is equipped with multiple through mounting holes, the inside of mounting hole is equipped with silica gel column, the bottom of silica gel column is equipped with buffer spring, and the top of silica gel column is equipped with probe;The mushroom type design of the probe top is cooperated with its laterally deformable elastic property and is realized by silica gel column and buffer spring, can be automatically compensated when profiling carrier plate is pressed, the slight deformation of flexible circuit board itself, placement error or position offset, probe not only can be vertically compressed to provide basic contact pressure, more can produce adaptive lateral contact force, so that the metal contact of probe end can accurately, stably " track " and adhere to test point on circuit board.

Description

Technical Field

[0001] This utility model relates to the field of electrical testing technology for circuit boards, specifically a flexible printed circuit board electrical testing station. Background Technology

[0002] Flexible printed circuit boards (FPCs) are widely used in modern electronic products, especially in consumer electronics, medical devices, and automotive electronics, due to their advantages such as flexibility, light weight, and small size. In the production process, electrical performance testing (E-test) of FPCs is a key step to ensure their quality and functional reliability.

[0003] Currently, common FPC electrical test benches typically employ a rigid, fixed structure. The FPC under test usually needs to be placed on a test fixture or carrier plate, and a test module with probes is pressed down to make the probes contact the test points on the FPC for continuity or performance testing. However, this traditional testing method has the following problems when applied to FPCs: insufficient positioning accuracy and compensation. FPCs themselves are soft and easily deformed, and slight offsets, twists, or unevenness (warping) are easily generated during placement and clamping, making it difficult to accurately align and stably contact the tiny test points on the FPC. Small misalignments or uneven contact pressure between the probe and the test point can easily lead to poor contact, unstable test signals, or even misjudgments, seriously affecting the accuracy and reliability of the test. Poor contact pressure control is also a challenge. Good electrical contact requires the probe to apply a certain contact pressure; however, FPCs are thin and fragile, and excessive pressure may damage test points, detach pads, or damage the FPC body; insufficient pressure may result in excessive contact resistance or unstable contact. Traditional spring probes often only provide elastic force in a single axial (vertical) direction, which is difficult to adapt to local unevenness or slight deformation of the FPC, and cannot provide uniform and adaptive contact pressure. Fixing and flattening FPCs is difficult. Before testing, the soft FPC needs to be accurately positioned and flattened and fixed on the carrier plate to avoid any warping or wrinkles, otherwise it will aggravate the problems of test point misalignment and poor contact. Common mechanical clamping methods may introduce stress or cause local deformation, making it difficult to ensure that the FPC is fully bonded and in an ideal stress-free flattened state. Utility Model Content

[0004] The purpose of this invention is to provide a flexible printed circuit board electrical testing station with high-precision adaptive contact and tracking, reliable flattening and non-destructive fixing.

[0005] The above-mentioned technical objective of this utility model is achieved through the following technical solution: a flexible printed circuit board electrical testing platform, including a base plate, a base capable of horizontal and vertical movement above the base plate, a probe plate electrically connected to the base plate being engaged at the top of the base, a plurality of through mounting holes on the surface of the probe plate, a silicone pillar being installed inside the mounting holes, a buffer spring being sleeved at the bottom of the silicone pillar, and a probe being provided at the top of the silicone pillar, a contouring carrier plate capable of vertical movement above the probe plate, a contouring positioning groove corresponding to the shape of the flexible printed circuit board to be tested being provided on the bottom surface of the contouring carrier plate, a plurality of adsorption holes being provided at the top of the contouring positioning groove, and a locking mechanism being provided above the contouring carrier plate.

[0006] A further feature of this invention is that: two symmetrical transverse slide rails are fixedly provided at the top of the base plate, a damping transverse slide block is slidably provided on the surface of the transverse slide rails, and a support plate is fixedly provided at the top of the transverse slide block.

[0007] A further feature of this invention is that a longitudinal slide rail is fixedly provided at the top of the support plate, and a damping longitudinal slide block is slidably provided on the surface of the longitudinal slide rail, and the longitudinal slide block is fixedly installed at the bottom of the base.

[0008] A further feature of this invention is that: both ends of the transverse slide rail and both ends of the longitudinal slide rail are fixedly provided with limiting baffles, and the bottom end of the base plate is fixedly provided with a rubber shock-absorbing pad, which is made of nitrile rubber.

[0009] A further feature of this invention is that: a positioning slot is provided on the top of the base, a conductive ring is embedded on the surface of the positioning slot, a wire electrically connected to the conductive ring is provided on one side of the base, and a metal plate is fixedly provided at the bottom of the probe plate to engage with the positioning slot.

[0010] A further feature of this invention is that: a mounting plate is fixedly provided at the bottom of the silicone column, the top end of the buffer spring is connected to the bottom end of the mounting plate, the bottom end of the buffer spring is connected to the top end of the metal plate, and the bottom end of the silicone column is connected to the top end of the metal plate.

[0011] A further feature of this invention is that the top of the contour positioning groove is provided with a plurality of adsorption holes communicating with the adsorption cavity, and a negative pressure pipe communicating with the adsorption cavity is fixedly provided on one side of the contour carrier plate. The negative pressure pipe is a flexible hose, and the end of the negative pressure pipe is connected to an external negative pressure device.

[0012] A further feature of this invention is that a guide post is fixedly provided at the top corner of the probe plate, a limiting plate is fixedly provided at the top of the guide post, guide seats are fixedly provided on both sides of the contour plate, the surface of the guide seat is provided with a guide hole that slides with the guide post, and a support spring sleeved on the outside of the guide post is installed between the limiting plate and the guide seat.

[0013] A further feature of this invention is that the locking mechanism includes a mounting bracket, a rotating shaft, and an eccentric cam. The mounting bracket is L-shaped and has two members, which are respectively fixedly installed on the front and back of the base. The rotating shaft is rotatably connected to the top of the mounting bracket, and the eccentric cam is fixedly installed in the middle of the rotating shaft.

[0014] A further feature of this invention is that: a limiting frame is fixedly provided at the top of the mounting bracket, and a through hole corresponding to the rotating shaft is provided at the bottom of the limiting frame so that the rotating shaft can pass through; a rotating wheel is fixedly provided at both ends of the rotating shaft; an external thread is provided on the surface of the rotating shaft at the corresponding position of the limiting frame; and locking nuts that are threadedly connected to the external thread are provided on both sides of the limiting frame on the surface of the rotating shaft.

[0015] In summary, this utility model has the following beneficial effects: High-precision adaptive contact and tracking. The mushroom-shaped design of the probe tip, combined with its laterally deformable elastic properties (achieved through silicone pillars and buffer springs), automatically compensates for minor deformations, placement errors, or positional shifts of the flexible circuit board itself when the contour carrier is pressed down. The probe can not only be vertically compressed to provide basic contact pressure but also generate adaptive lateral contact force, enabling the metal contact at the probe tip to accurately and stably "track" and adhere to the test point on the circuit board. This effectively solves the problem of poor contact caused by deformation of the flexible circuit board, significantly improving test accuracy and reliability. Reliable flattening and non-destructive fixing are also achieved; the bottom surface of the contour carrier is equipped with a contact surface with the flexible circuit board under test. The precisely matched contoured positioning groove ensures that the circuit board can naturally flatten after being embedded, eliminating initial warping. Combined with the vacuum adsorption system (through adsorption holes and adsorption chambers), the flexible circuit board is tightly and evenly adsorbed and fixed in the contoured positioning groove using negative pressure. This avoids stress concentration, local deformation, or damage that may be caused by traditional mechanical clamping, providing a flat and stress-free reference surface for testing. Stable floating guidance and shock absorption: the base can float within a small range in the horizontal plane through the double damping sliding cooperation of the transverse slide and transverse slide rail, and the longitudinal slide and longitudinal slide rail. This design allows the probe plate to be finely adjusted according to the actual position of the circuit board during testing. Together with the self-adaptive capability of the probe itself, this ensures the accuracy of contact. Attached Figure Description

[0016] Figure 1 This is one of the three-dimensional structural schematic diagrams of this utility model;

[0017] Figure 2 This is the second three-dimensional structural schematic diagram of the present invention;

[0018] Figure 3 This is a cross-sectional structural diagram of the present invention;

[0019] Figure 4 This is a schematic diagram of the exploded structure of this utility model;

[0020] Figure 5 This is a schematic diagram of the structure of the silicone column and probe of this utility model;

[0021] Figure 6 This is a schematic diagram of the conformal carrier plate of this utility model;

[0022] Figure 7 This is a schematic diagram of the structure of the base of this utility model;

[0023] Figure 8 This is a schematic diagram of the probe plate of this utility model.

[0024] In the diagram: 1. Base plate; 101. Rubber shock-absorbing pad; 102. Transverse slide rail; 2. Support plate; 201. Transverse slide block; 202. Longitudinal slide rail; 3. Base; 301. Longitudinal slide block; 302. Positioning slot; 303. Conductive ring; 304. Wire; 4. Probe plate; 401. Metal plate; 402. Mounting hole; 403. Silicone pillar; 404. Probe; 405. Mounting plate; 406. Buffer spring; 407. Guide post; 408. Limiting plate; 5. Contouring carrier plate; 501. Contouring positioning groove; 502. Adsorption chamber; 503. Adsorption hole; 504. Negative pressure pipe; 505. Guide seat; 506. Support spring; 6. Mounting bracket; 601. Rotating shaft; 602. Rotating wheel; 603. Eccentric cam; 604. Locking nut; 605. Limiting bracket. Detailed Implementation

[0025] The present invention will be further described below with reference to the accompanying drawings of the embodiments thereof.

[0026] Please see Figures 1-8In this embodiment of the present invention, a flexible printed circuit board electrical testing platform includes a base plate 1. A base 3 capable of horizontal and vertical movement is provided above the base plate 1, allowing the base 3 to float in a horizontal plane. A probe plate 4 electrically connected to the base 3 is engaged at the top of the base 3. The surface of the probe plate 4 has multiple through mounting holes 402. Silicone pillars 403 are installed inside the mounting holes 402. A buffer spring 406 is fitted at the bottom of each silicone pillar 403, and a probe 404 is provided at the top of each silicone pillar 403. The position of the probe 404 corresponds to the test point position on the flexible printed circuit board. The probe 404 is made of conductive material, with a mushroom-shaped top and a metal contact at its end. When the plate 5 is pressed down, the probe 404 is compressed, and the metal contact can contact the test point of the flexible printed circuit board. At the same time, the probe 404 can compensate the flexible printed circuit board through the lateral deformation of the elastic element, generating adaptive contact pressure, so that the probe 404 can automatically track the test point. Above the probe plate 4, there is a contouring carrier plate 5 that can move up and down. The bottom surface of the contouring carrier plate 5 is provided with a contouring positioning groove 501 that corresponds to the shape of the flexible printed circuit board to be tested, so that the flexible printed circuit board can be naturally flattened without warping after being embedded. The top of the contouring positioning groove 501 is provided with multiple adsorption holes 503, which can vacuum adsorb the flexible printed circuit board into the interior of the contouring positioning groove 501. The top of the contouring carrier plate 5 is provided with a locking mechanism, which limits its position when the contouring carrier plate 5 is lowered to the bottom.

[0027] In this embodiment, preferably, two symmetrical transverse slide rails 102 are fixedly provided at the top of the base plate 1. A damping transverse slide block 201 is slidably provided on the surface of the transverse slide rail 102. A support plate 2 is fixedly provided at the top of the transverse slide block 201. The sliding cooperation between the transverse slide block 201 and the transverse slide rail 102 allows the base 3 to float laterally. A longitudinal slide rail 202 is fixedly provided at the top of the support plate 2. A damping longitudinal slide block 3 is slidably provided on the surface of the longitudinal slide rail 202. 01. The longitudinal slide block 301 is fixedly installed at the bottom end of the base 3. The sliding cooperation between the longitudinal slide block 301 and the longitudinal slide rail 202 allows the base 3 to float longitudinally. Both ends of the transverse slide rail 102 and both ends of the longitudinal slide rail 202 are fixedly provided with limiting baffles. The limiting baffles can limit the movement of the base 3 and prevent it from falling off the track. The bottom end of the base plate 1 is fixedly provided with a rubber shock-absorbing pad 101. The rubber shock-absorbing pad 101 is made of nitrile rubber and provides shock absorption.

[0028] In this embodiment, preferably, the top of the base 3 is provided with a positioning slot 302, the surface of the positioning slot 302 is embedded with a conductive ring 303, one side of the base 3 is provided with a wire 304 electrically connected to the conductive ring 303, and the bottom end of the probe plate 4 is fixedly provided with a metal plate 401 that engages with the positioning slot 302. When the metal plate 401 is engaged and installed in the positioning slot 302, the metal plate 401 contacts the conductive ring 303, thereby realizing an electrical connection.

[0029] In this embodiment, preferably, the bottom of the silicone pillar 403 is fixedly provided with a mounting plate 405, the top end of the buffer spring 406 is connected to the bottom end of the mounting plate 405, the bottom end of the buffer spring 406 is connected to the top end of the metal plate 401, and the bottom end of the silicone pillar 403 is connected to the top end of the metal plate 401. The buffer spring 406 and the silicone pillar 403 can provide basic contact pressure and can also serve as a current channel to conduct electricity with the silicone pillar 403. At the same time, the probe 404 can compensate the flexible printed circuit board through the lateral deformation of the elastic element to generate adaptive contact pressure, so that the probe 404 can automatically track the test point.

[0030] In this embodiment, preferably, the top of the contour positioning groove 501 is provided with a plurality of adsorption holes 503 communicating with the adsorption cavity 502, and a negative pressure pipe 504 communicating with the adsorption cavity 502 is fixedly provided on one side of the contour carrier plate 5. The negative pressure pipe 504 is a flexible tube, and the end of the negative pressure pipe 504 is connected to an external negative pressure device. The negative pressure device is used to extract the air in the adsorption cavity 502, so that the flexible printed circuit board can be tightly attached to the inside of the contour positioning groove 501, making the flexible printed circuit board less prone to deformation.

[0031] In this embodiment, preferably, a guide post 407 is fixedly provided at the top corner of the probe plate 4, a limiting plate 408 is fixedly provided at the top of the guide post 407, and guide seats 505 are fixedly provided on both sides of the contouring plate 5. The surface of the guide seat 505 is provided with guide holes that slide with the guide post 407, and a support spring 506 is installed between the limiting plate 408 and the guide seat 505 and sleeved on the outside of the guide post 407. The spring force of the support spring 506 can support the initial state of the contouring plate 5, and the sliding cooperation between the guide post 407 and the guide seat 505 can guide and limit the movement of the contouring plate 5.

[0032] In this embodiment, preferably, the locking mechanism includes a mounting bracket 6, a rotating shaft 601, and an eccentric cam 603. The mounting bracket 6 is L-shaped, and two brackets are provided, respectively fixedly installed on the front and back of the base 3. The rotating shaft 601 is rotatably connected to the top of the mounting bracket 6. The eccentric cam 603 is fixedly installed in the middle of the rotating shaft 601. When the rotating shaft 601 rotates, it drives the eccentric cam 603 in the middle to rotate, using the eccentric part of the eccentric cam 603 to press down on the contour plate 5, causing the contour plate 5 to move downward. A limiting frame 605 is fixedly provided at the top of the mounting bracket 6. The bottom of 05 is provided with a through hole corresponding to the rotating shaft 601, allowing the rotating shaft 601 to pass through. Both ends of the rotating shaft 601 are fixed with a rotating wheel 602, which can drive the rotating shaft 601 to rotate. The surface of the rotating shaft 601 is provided with an external thread at the corresponding position of the limiting frame 605. On both sides of the limiting frame 605, the surface of the rotating shaft 601 is provided with a locking nut 604 that is threadedly connected to the external thread. The threaded engagement between the locking nut 604 and the external thread on the surface of the rotating shaft 601 can lock the position of the rotating shaft 601, thereby preventing the rotating shaft 601 from rotating on its own and playing a limiting role.

[0033] In use, firstly, the flexible printed circuit board to be tested is placed in the contour positioning groove 501 on the bottom surface of the contour carrier 5, with the test points of the flexible printed circuit board facing downwards. Because the shape of the contour positioning groove 501 precisely matches the shape of the circuit board, the circuit board can be naturally embedded and flattened, eliminating initial warping. Then, the external negative pressure device is activated, and the air in the adsorption chamber 502 inside the contour carrier 5 is drawn in through the negative pressure pipe 504, so that the negative pressure acts on the back of the circuit board through the adsorption hole 503, tightly and evenly vacuum adsorbing and fixing it in the contour positioning groove 501, ensuring that the circuit board is flat and without deformation. The operator rotates the rotating wheel 602 of the locking mechanism, which drives the rotating shaft 601 and the eccentric cam 603 on it to rotate. When the protruding part of the eccentric cam 603 rotates to the bottom, it begins to press down. The contouring carrier 5 overcomes the elastic force of the support spring 506 and moves downward along the guide post 407 (the guide seat 505 slides on the guide post 407). As the contouring carrier 5 descends, the flexible circuit board that is adsorbed and fixed also moves downward, and the test point on its bottom surface gradually approaches the probe 404 on the probe plate 4. When the circuit board continues to be pressed down, its test point contacts the mushroom-shaped structure on the top of the probe 404. The probe 404 is subjected to vertical pressure and begins to move downward, compressing the buffer spring 406 at its bottom. At the same time, the silicone pillar 403 undergoes elastic deformation. The elastic properties of the mushroom-shaped structure on the top of the probe 404 and the silicone pillar 403 allow the probe 404 to be compressed not only in the vertical direction (Z-axis) but also to produce small lateral deformation in the horizontal plane (X / Y-axis). This lateral deformation capability allows the probe 404 to automatically track and adapt to minor positional deviations or local unevenness of the circuit board test points, thereby generating adaptive contact pressure. The metal contact at the end of the probe 404 ultimately forms a stable and reliable electrical contact with the circuit board test points. The test signal received by the probe 404 is transmitted to the metal plate 401 through the conductive silicone pillar 403, mounting plate 405, and buffer spring 406. The metal plate 401 is in close contact with the conductive ring 303 in the positioning slot 302 of the base 3, and the signal is then transmitted to the external test equipment through the wire 304. During the process of the probe 404 contacting the circuit board and generating lateral force, or due to minor overall offset of the circuit board installation, the entire probe plate 4 and its base 3 can float in a small range of lateral and longitudinal directions in the horizontal plane through the damped sliding of the transverse slide 201 on the transverse slide rail 102 and the damped sliding of the longitudinal slide 301 on the longitudinal slide rail 202.This floating capability further assists the probe 404 in more accurately aligning and tracking the test point, compensating for the overall placement error of the circuit board; at the same time, the rubber shock-absorbing pad 101 at the bottom of the base plate 1 effectively absorbs external vibration interference; after the contour carrier plate 5 is pressed into place, tighten the locking nuts 604 at both ends of the rotating shaft 601 to make it press against the limiting frame 605, and firmly lock the position of the rotating shaft 601 and the eccentric cam 603, preventing the contour carrier plate 5 from accidentally lifting or shaking during the test, and ensuring the high stability of the test state; at this time, the external test equipment can be connected through the wire 304 and the conductive ring 30 3. The circuit consisting of metal plate 401, buffer spring 406 / silicone pillar 403, and probe 404 performs accurate and reliable electrical performance testing on the flexible circuit board fixed on the contour carrier plate 5. After the test is completed, the locking nut 604 is loosened, and the rotating wheel 602 is rotated in the opposite direction, so that the protruding part of the eccentric cam 603 moves away from the bottom. Under the elastic force of the support spring 506, the contour carrier plate 5 carries the circuit board and automatically and smoothly rises and resets. The probe 404 also returns to its original position under the elastic force of the buffer spring 406 and silicone pillar 403. The negative pressure is then turned off, and the tested circuit board can be removed.

[0034] The above description is only a preferred embodiment of the present utility model. Therefore, all equivalent changes or modifications made to the structure, features and principles described in the claims of the present utility model patent application are included in the scope of the present utility model patent application.

Claims

1. A flexible printed circuit board electrical testing platform, comprising a base plate (1), characterized in that, A base (3) capable of moving laterally and longitudinally is provided above the base plate (1). A probe plate (4) electrically connected to the base (3) is engaged at the top of the base (3). The surface of the probe plate (4) is provided with multiple through mounting holes (402). A silicone column (403) is installed inside the mounting hole (402). A buffer spring (406) is sleeved at the bottom of the silicone column (403). A probe (404) is provided at the top of the silicone column (403). A contouring carrier plate (5) capable of moving up and down is provided above the probe plate (4). The bottom surface of the contouring carrier plate (5) is provided with a contouring positioning groove (501) corresponding to the shape of the flexible printed circuit board to be tested. The top of the contouring positioning groove (501) is provided with multiple adsorption holes (503). A locking mechanism is provided above the contouring carrier plate (5).

2. The flexible printed circuit board electrical testing station according to claim 1, characterized in that: The top of the base plate (1) is fixedly provided with two symmetrical transverse slide rails (102), and the surface of the transverse slide rails (102) is slidably provided with a damping transverse slide block (201), and the top of the transverse slide block (201) is fixedly provided with a support plate (2).

3. The flexible printed circuit board electrical testing station according to claim 2, characterized in that: The top of the support plate (2) is fixedly provided with a longitudinal slide rail (202), and the surface of the longitudinal slide rail (202) is slidably provided with a damping longitudinal slide block (301), and the longitudinal slide block (301) is fixedly installed at the bottom of the base (3).

4. The flexible printed circuit board electrical testing station according to claim 3, characterized in that: Limiting baffles are fixedly provided at both ends of the transverse slide rail (102) and both ends of the longitudinal slide rail (202). A rubber shock-absorbing pad (101) is fixedly provided at the bottom end of the base plate (1). The rubber shock-absorbing pad (101) is made of nitrile rubber.

5. The flexible printed circuit board electrical testing station according to claim 1, characterized in that: The base (3) has a positioning slot (302) on its top, and a conductive ring (303) is embedded on the surface of the positioning slot (302). A wire (304) electrically connected to the conductive ring (303) is provided on one side of the base (3). A metal plate (401) is fixedly provided at the bottom of the probe plate (4) and engaged with the positioning slot (302).

6. The flexible printed circuit board electrical testing station according to claim 5, characterized in that: The bottom of the silicone column (403) is fixedly provided with an installation plate (405), the top end of the buffer spring (406) is connected to the bottom end of the installation plate (405), the bottom end of the buffer spring (406) is connected to the top end of the metal plate (401), and the bottom end of the silicone column (403) is connected to the top end of the metal plate (401).

7. The flexible printed circuit board electrical testing station according to claim 1, characterized in that: The top of the contour positioning groove (501) is provided with a plurality of adsorption holes (503) communicating with the adsorption chamber (502). A negative pressure pipe (504) communicating with the adsorption chamber (502) is fixedly provided on one side of the contour carrier plate (5). The negative pressure pipe (504) is a flexible hose, and the end of the negative pressure pipe (504) is connected to an external negative pressure device.

8. The flexible printed circuit board electrical testing station according to claim 1, characterized in that: The top of the probe plate (4) is fixedly provided with a guide post (407) at the corner position. The top of the guide post (407) is fixedly provided with a limiting plate (408). The two sides of the contour plate (5) are fixedly provided with guide seats (505). The surface of the guide seat (505) is provided with a guide hole that slides with the guide post (407). A support spring (506) is installed between the limiting plate (408) and the guide seat (505) and sleeved on the outside of the guide post (407).

9. The flexible printed circuit board electrical testing station according to claim 1, characterized in that: The locking mechanism includes a mounting bracket (6), a rotating shaft (601), and an eccentric cam (603). The mounting bracket (6) is L-shaped and there are two of them, which are fixedly installed on the front and back of the base (3) respectively. The rotating shaft (601) is rotatably connected to the top of the mounting bracket (6), and the eccentric cam (603) is fixedly installed in the middle of the rotating shaft (601).

10. The flexible printed circuit board electrical testing station according to claim 9, characterized in that: The top of the mounting bracket (6) is fixedly provided with a limiting bracket (605). The bottom of the limiting bracket (605) is provided with a through hole corresponding to the rotating shaft (601) so that the rotating shaft (601) can pass through. Both ends of the rotating shaft (601) are fixedly provided with a rotating wheel (602). The surface of the rotating shaft (601) and the corresponding position of the limiting bracket (605) are provided with external threads. The surface of the rotating shaft (601) on both sides of the limiting bracket (605) is provided with locking nuts (604) that are threadedly connected to the external threads.

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