An amorphous strip thickness gauge
CN224695228UActive Publication Date: 2026-08-28湖南宏旺新材料科技有限公司
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Patent Information
- Application Number
- CN202522226065.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-21
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-10-21
AI Technical Summary
Technical Problem
[0002]现有的非晶带材测厚仪在使用过程中是通过单射线测测厚法即通过测量射线穿过带材后的衰减程度来反算厚度,而采用方法对非晶带材在测量区域内的跳动非常敏感,生产中的非晶带材会因张力波动、辊筒振动等原因产生上下跳动,导致测量光路长度变化,引入显著的测量误差,无法反映真实厚度,导致其测量精度较低以及使用效果不佳,因此,急需一种非晶带材测厚仪来解决上述问题
Benefits of technology
本实用新型通过设置一组由上X射线发射管、下探测器、下X射线发射以及上探测器组成的双工位上、下对射式同轴测量结构,可将带材的上下跳动同时转化为上、下两个测量模块测量值的变化,并通过数据融合处理,可以直接抵消跳动带来的影响,直接从原理上消除了在线测量的最大误差源,测量精度极高,有效提高装置的测量效果以及使用性能。
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Abstract
This utility model discloses an amorphous strip thickness gauge, including a detection frame with a detection cavity inside. Two sets of lead screws are symmetrically installed vertically within the detection cavity. A guide rod is provided on one side of each lead screw, and a support plate is fitted onto both the guide rod and the lead screw. An upper X-ray emission tube and an upper detector are mounted on the upper support plate. The advantages are: by setting up a dual-station, upper and lower coaxial measurement structure consisting of an upper X-ray emission tube, a lower detector, a lower X-ray emission tube, and an upper detector, this utility model can simultaneously convert the vertical movement of the strip into changes in the measured values of the upper and lower measurement modules. Through data fusion processing, the influence of the vertical movement can be directly offset, eliminating the maximum error source of online measurement in principle. The measurement accuracy is extremely high, effectively improving the measurement effect and performance of the device.
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