Test equipment based on specular reflection for the investigation of a free liquid surface and its layer structure

HU231765B1Active Publication Date: 2026-03-28SEMILAB ZRT
2 Cites 0 Cited by

Patent Information

Authority / Receiving Office
HU · HU
Patent Type
Patents
Current Assignee / Owner
SEMILAB ZRT
Filing Date
2022-05-22
Publication Date
2026-03-28
Patent Text Reader

Abstract

The subject of the invention is a specular reflection-based device for testing the surface properties of a liquid sample (8), comprising a base plate (9), a sample holder fixed to the base plate (9) for the placement of the liquid sample (8), a light source (1) for irradiating the surface of the sample (8) in a polarizer branch (P) comprising a polarizer (2) , a detector (6) for detecting the radiation reflected by specular reflection from the surface of the sample (8) in an analyzer branch (A) comprising an analyzer (5), and a control unit (7) for controlling at least one of the light source (1), the polarizer (2), the analyzer (5) and the detector (6), wherein the polarizer branch (P) and the analyzer branch (A) define a plane of incidence (S), and the base plate (9) is supported by a vibration damping structure. The main feature of the device is that the base plate (9) and the vibration damping structure are in contact with each other by at least three non-collinear points, and the vibration damping structure is provided with a level control.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Apparatus for maintaining horizontality provided with a disturbance control plate

    KR1020100100013A

  • Automated Sample Positioning System For Ellipsometers

    US20130021604A1