Test equipment based on specular reflection for the investigation of a free liquid surface and its layer structure
HU231765B1Active Publication Date: 2026-03-28SEMILAB ZRT
Patent Information
- Authority / Receiving Office
- HU · HU
- Patent Type
- Patents
- Current Assignee / Owner
- SEMILAB ZRT
- Filing Date
- 2022-05-22
- Publication Date
- 2026-03-28
Abstract
The subject of the invention is a specular reflection-based device for testing the surface properties of a liquid sample (8), comprising a base plate (9), a sample holder fixed to the base plate (9) for the placement of the liquid sample (8), a light source (1) for irradiating the surface of the sample (8) in a polarizer branch (P) comprising a polarizer (2) , a detector (6) for detecting the radiation reflected by specular reflection from the surface of the sample (8) in an analyzer branch (A) comprising an analyzer (5), and a control unit (7) for controlling at least one of the light source (1), the polarizer (2), the analyzer (5) and the detector (6), wherein the polarizer branch (P) and the analyzer branch (A) define a plane of incidence (S), and the base plate (9) is supported by a vibration damping structure. The main feature of the device is that the base plate (9) and the vibration damping structure are in contact with each other by at least three non-collinear points, and the vibration damping structure is provided with a level control.
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