A stress line birefringence compensation method for an optical current sensor

By employing a nano-ring radial polarization grating and a model-free adaptive iterative learning method, the problem of aliasing between stress line birefringence and Faraday magneto-optical rotation angle in optical current sensors was solved, achieving high-accuracy measurement under temperature and vibration conditions and improving the practical application level of optical current sensors.

CN115808556BActive Publication Date: 2026-07-14STATE GRID CORPORATION OF CHINA +3

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
STATE GRID CORPORATION OF CHINA
Filing Date
2022-12-21
Publication Date
2026-07-14

AI Technical Summary

Technical Problem

In existing optical current sensors, the birefringence of stress lines caused by temperature changes and vibrations, as well as the aliasing of Faraday magneto-optical rotation angles, are difficult to separate and compensate for, resulting in compromised measurement accuracy and stability, which has become a bottleneck for the practical application of optical current sensors.

Method used

A nano-ring radial polarization grating and a model-free adaptive iterative learning method are employed. By determining the zero-crossing time of the alternating current, the Faraday magneto-optical rotation angle and stress line birefringence are separated using the zero-point theorem. An adaptive algorithm is then used for iterative learning to predict and compensate for stress line birefringence.

Benefits of technology

The accuracy of the optical current sensor under temperature and vibration conditions has been improved, meeting the 0.5 accuracy requirement. The influence of stress line birefringence has been effectively eliminated, improving the stability and accuracy of the measurement.

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Abstract

The present application relates to a kind of stress line birefringence compensation method of optical current sensor, the optical current sensor includes laser source, polarizer, magneto-optical film, nanometer ring-shaped radial polarization grating, image beam and CMOS area array camera sequentially arranged in same optical path, the method includes the following steps: utilize laser source to emit light signal, under the action of current to be measured, the output signal of optical current sensor is superposed with Faraday magnetic rotatory angle θ And stress line birefringence δ, form synchronous rotating annular light spot;Determine the zero-crossing moment of the measured alternating current, the rotation angle of corresponding annular light spot is stress line birefringence δ at zero-crossing moment by CMOS area array camera and record;Based on the stress line birefringence δ of record, utilize model-free adaptive iterative learning method to predict the stress line birefringence δ of future time, and according to the prediction result, the output signal of optical current sensor is compensated.
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Description

Technical Field

[0001] This invention relates to a method for stress line birefringence compensation of an optical current sensor, belonging to the field of optical current sensor calibration technology. Background Technology

[0002] Optical current sensors offer advantages such as good insulation, light weight, wide current measurement range, and ease of digitization, and are considered the ultimate direction for high-voltage, high-current measurement technology. However, temperature changes and vibrations induce stress line birefringence in the magneto-optical thin film and transmission optical fiber, which overlaps with the Faraday rotation angle, making separation and compensation difficult. Existing optical current sensors' intensity demodulation modes result in a limited Faraday rotation angle measurement range, increasing the influence of stress line birefringence on the measurement results and even overwhelming effective information, severely compromising the accuracy and stability of optical current sensor measurements. Therefore, the stress line birefringence problem has been a bottleneck restricting the practical application of optical current sensors for many years, and is considered a "world-class problem" in the industry. Summary of the Invention

[0003] To address the problems existing in the prior art, this invention proposes a stress line birefringence compensation method for optical current sensors.

[0004] The technical solution of the present invention is as follows:

[0005] On one hand, this invention proposes a stress line birefringence compensation method for an optical current sensor. The optical current sensor includes a laser source, a polarizer, a magneto-optical thin film, a nano-annular radial polarization grating, an image transmission beam, and a CMOS area array camera, which are sequentially arranged on the same optical path. The method includes the following steps:

[0006] The light signal emitted by the laser source passes sequentially through a polarizer, a magneto-optical thin film, a nano-ring radial polarization grating, and an image transmission beam. The output signal is superimposed with the Faraday magneto-rotation angle. The birefringence δ along the stress line forms a synchronously rotating annular light spot, which is then transmitted to the CMOS area array camera.

[0007] Determine the zero-crossing time of the AC current to be measured, and at the zero-crossing time, obtain and record the rotation angle of the corresponding annular spot as stress line birefringence δ using a CMOS area array camera.

[0008] Based on the recorded stress line birefringence δ, a model-free adaptive iterative learning method is used to predict the stress line birefringence δ at future moments, and the output signal of the optical current sensor is compensated according to the prediction results.

[0009] In a preferred embodiment, the method for determining the zero-crossing time of the AC current to be measured is as follows:

[0010] Collect discrete output data of the optical current sensor

[0011] Judge two adjacent discrete output data and to determine whether the positive and negative signs of the rotation angles are the same, where k < n. If the signs are the same, it is considered that there is no current zero-crossing between the two discrete output data; if the signs are different, it is considered that there is a zero-crossing point between the two discrete output data, and the average value of t

[0014] , ,

[0019] , p , k-1 , k-1 ,

[0018] ,

[0017] ,

[0016] ,

[0015] , , , k , p , , k , , , ,

[0020] , and t k+1 is determined as the zero-crossing moment.

[0012] As a preferred embodiment, the steps of obtaining multiple recorded historical stress line birefringences δ and predicting the stress line birefringence δ at a future moment using a model-free adaptive iterative learning method are specifically as follows:

[0013] Perform model-free iterative learning through the following formula:

[0014] com k (t) = com k-1 (t) + k p δ k-1

[0015] where, com k (t) is the error compensation value at the k-th iteration at time t; k​​​​​​​​​​​​​​​​​​An AC zero-crossing determination module is used to determine the zero-crossing moment of the measured AC current. At the zero-crossing moment, the rotation angle of the corresponding annular light spot is obtained by a CMOS area array camera as the stress line birefringence δ and recorded.

[0021] A compensation module, based on the recorded stress line birefringence δ, uses a model-free adaptive iterative learning method to predict the stress line birefringence δ at a future moment, and compensates the output signal of the optical current sensor according to the prediction result.

[0022] As a preferred embodiment, the AC zero-crossing determination module includes:

[0023] An output data acquisition unit for acquiring the discrete output data of the optical current sensor

[0024]

[0025] A zero-crossing moment determination unit for judging two adjacent discrete output data and whether the positive and negative signs of the rotation angles are the same, where k < n. If the signs are the same, it is considered that there is no current zero-crossing between the two discrete output data; if the signs are different, it is considered that there is a zero-crossing point between the two discrete output data, and the average value of t k and t k+1 is determined as the zero-crossing moment.

[0026] As a preferred embodiment, in the compensation module, the steps of acquiring multiple recorded historical stress line birefringences δ and using a model-free adaptive iterative learning method to predict the stress line birefringence δ at a future moment are specifically as follows:

[0027] Perform model-free iterative learning through the following formula:

[0028] com k (t) = com k-1 (t) + k p δ k-1

[0029] where, com k (t) is the error compensation value at the kth iteration at time t; k p is the learning rate;

[0030] Add an adaptive algorithm, and use the pseudo partial derivative of the adaptive algorithm to replace the learning rate in the above model-free iterative learning;

[0031] Take the average value of the obtained multiple historical stress line birefringences δ as the initial value and put it into the model-free iterative learning with the adaptive algorithm for iterative calculation. After reaching the convergence condition, output the predicted stress line birefringence δ at time t.

[0032] In another aspect, the present invention also proposes an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the stress line birefringence compensation method for an optical current sensor as described in any embodiment of the present invention.

[0033] In another aspect, the present invention also proposes a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the stress line birefringence compensation method for an optical current sensor as described in any embodiment of the present invention.

[0034] The present invention has the following beneficial effects:

[0035] This invention discloses a method for compensating for stress line birefringence in an optical current sensor. The optical current sensor is based on a nano-ring radial polarization grating, which can linearly demodulate the Faraday magnetostrictive angle. The zero-crossing time of the AC current to be measured is determined by the zero-point theorem. Based on the stress line birefringence of the previous several cycles, the stress line birefringence of the next cycle is calculated and compensated using a model-free adaptive iterative learning method, thereby eliminating stress line birefringence. Attached Figure Description

[0036] Figure 1 This is a flowchart of the method according to Embodiment 1 of the present invention;

[0037] Figure 2 This is a schematic diagram illustrating the principle of stress line birefringence compensation in an embodiment of the present invention.

[0038] Figure 3 The simulation result of the ring-shaped light spot output by the optical current sensor is shown in the figure.

[0039] Figure 4 This is a flowchart of a stress line birefringence compensation method based on model-free adaptive iterative learning.

[0040] The attached figures are labeled as follows:

[0041] 1. Laser; 2. Polarizer; 3. Magneto-optical thin film; 4. Nano-ring radial polarization grating; 5. Image beam; 6. CMOS area array camera; 7. Ring spot; 8. Standard ring spot; 9. Error ring spot. Detailed Implementation

[0042] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0043] It should be understood that the step numbers used in the text are for ease of description only and are not intended to limit the order in which the steps are performed.

[0044] It should be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the invention. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0045] The terms “comprising” and “including” indicate the presence of the described feature, whole, step, operation, element and / or component, but do not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or collections thereof.

[0046] The term “and / or” refers to any combination of one or more of the associated listed items, as well as all possible combinations, and includes these combinations.

[0047] Example 1:

[0048] See Figure 1 and Figure 2 This embodiment proposes a stress line birefringence compensation method for an optical current sensor based on a nano-ring radial polarization grating and model-free adaptive iterative learning. The optical current sensor includes a laser source 1, a polarizer 2, a magneto-optical thin film 3, a nano-ring radial polarization grating 4, an image transmission beam 5, and a CMOS area array camera 6, which are sequentially arranged on the same optical path. The compensation method includes the following steps:

[0049] S100. A light signal is emitted using a laser source, and linearly polarized light is obtained through polarizer 2. Under the influence of the magnetic field of the current to be measured, the polarization plane of the linearly polarized light rotates after passing through the magneto-optical thin film 3. The angle of rotation is the Faraday magneto-optical rotation angle. Temperature changes and vibrations generate stress lines and birefringence δ in the magneto-optical thin film 3 and the transmission optical fiber, which are superimposed on the Faraday magneto-optical rotation angle. The above introduces measurement errors. The emitted polarized light passes through a nano-ring radial polarization grating 4, which converts the polarization distribution of the light into a spot intensity distribution and rotates synchronously with the polarization plane. The image transmission beam 5 superimposes the Faraday magnetostrictive angle... The annular light spot 7, which is birefringent along the stress line δ, is transmitted to the CMOS area array camera 6.

[0050] S200. Using the zero-point theorem, determine the zero-crossing time of the AC current to be measured. At the zero-crossing time, the Faraday magnetostrictive rotatory angle is zero. If there is no measurement error, i.e., stress line birefringence δ, then the annular spot at this time is as follows: Figure 2The standard annular spot 8 is shown in the figure. However, due to the measurement error, the output signal of the optical current sensor is stress line birefringence δ, which generates an error annular spot 9. At this time, the rotation angle of the corresponding annular spot is stress line birefringence δ, which is obtained by the CMOS area array camera and recorded.

[0051] S300: Based on the recorded stress line birefringence δ, a model-free adaptive iterative learning method is used to predict the stress line birefringence δ at future times, and the output signal of the optical current sensor is compensated according to the predicted stress line birefringence δ at the corresponding time.

[0052] Based on the above embodiments, the key feature is that the optical current sensor, based on a linear measurement mode, can extract and compensate for stress line birefringence at the zero-crossing moment of the alternating current. The optical current sensor is implemented using a nano-ring radial polarization grating, capable of linearly demodulating the Faraday magneto-optical rotation angle. When stress line birefringence exists, its output is a linear superposition of the Faraday magneto-optical rotation angle and the stress line birefringence. According to the Faraday magneto-optical effect, when the measured alternating current crosses zero, the Faraday magneto-optical rotation angle of the magneto-optical material is also zero; at this time, the output signal of the optical current sensor is the stress line birefringence. The zero-crossing moment of the measured alternating current is determined using the zero-point theorem, and based on the stress line birefringence of the previous several cycles, a model-free adaptive iterative learning method is used to calculate and compensate for the stress line birefringence of the next cycle.

[0053] The implementation principle of this embodiment is as follows:

[0054] like Figure 2 As shown, the transmission axis of the polarizer is located in the x-direction. After the laser light passes through the polarizer, it becomes linearly polarized light with an amplitude of A. The Jones vector of the incident linearly polarized light is E. in for:

[0055]

[0056] Under the influence of the magnetic field of the alternating current to be measured, the polarization plane of the linearly polarized light passing through the magneto-optical thin film rotates, and the rotation angle is the Faraday magneto-rotation angle. The transfer matrix T1 can be represented as:

[0057]

[0058] Assuming the birefringence of the stress lines generated by temperature changes and vibrations in the magneto-optical thin film and transmission optical fiber is δ, then T1 can be rewritten as T2:

[0059]

[0060] The Jones matrix of the nano-ring radial polarization grating is [1] :

[0061]

[0062] in The azimuth angle of the grating ( (gradually changing from 0° to 360°); denoted as the TM wave transmittance of the incident light in the grating.

[0063] The Jones vector E of the outgoing light after the incident linearly polarized light passes through a magneto-optical thin film and a nano-ring radial polarization grating is... out for:

[0064]

[0065] The emitted light intensity distribution is as follows:

[0066]

[0067] It varies between 0° and 360°, when At this time, the output light intensity is 0, corresponding to the center of the dark fringe of the light spot. At this point, θ + δ satisfies a linear relationship:

[0068]

[0069] The intensity distribution of the emitted light after polarization analysis using a nano-ring radial polarization grating was obtained based on Matlab simulation, as shown in the attached figure. Figure 3 As shown, the visible light spot changes with... The light spot rotates synchronously with the changes in its shape, and the rotation angle of the light spot can be measured to achieve [the desired effect]. Direct and linear measurements.

[0070] Therefore, the linear demodulation result of the optical current sensor based on the nanoring radial polarization grating is: The linear superposition with δ is beneficial for separating and compensating for δ. According to the Faraday magneto-optical effect, the measured magnetic field H and... satisfy:

[0071] θ=VHL (8)

[0072] Where V is the Wilder constant, and L is the path length of the light transmitted through the magneto-optical material along the direction of the magnetic field. Therefore, when H = 0... When the alternating current crosses zero, the rotation angle of the ring-shaped light spot output by the optical current sensor is δ. δ can be detected and compensated at this moment.

[0073] In a preferred embodiment of this invention, the method for determining the zero-crossing time of the AC current to be measured in step S200 is specifically as follows:

[0074] S201. Acquire discrete output data from the optical current sensor.

[0075] S202. Determine whether the positive and negative signs of the rotation angles of two adjacent discrete output data and are the same, where k < n. If the signs are the same, it is considered that there is no current zero-crossing between the two discrete output data; if the signs are different, it is considered that there is a zero-crossing point between the two discrete output data, and the average value of t k and t k+1 is determined as the zero-crossing moment.

[0076] As a preferred implementation manner of this embodiment, specifically refer to Figure 4 , the steps of obtaining a plurality of recorded historical stress line birefringences δ and predicting the stress line birefringence δ at a future moment by using a model-free adaptive iterative learning method are specifically as follows:

[0077] Perform model-free iterative learning through the following formula:

[0078] com k (t) = com k-1 (t) + k p δ k-1

[0079] where, com k (t) is the error compensation value at the k-th iteration at the moment t; k p is the learning rate;

[0080] Add an adaptive algorithm, and use the pseudo partial derivative of the adaptive algorithm to replace the learning rate in the above model-free iterative learning;

[0081] Take the average value of the historical stress line birefringences δ of the first 5 cycles obtained as the initial value and put it into the model-free iterative learning with the adaptive algorithm for iterative calculation, and output the predicted stress line birefringence δ at the moment t after reaching the convergence condition.

[0082] In this embodiment, a single-mode laser with a working wavelength of 808 nm, wavelength stability of 0.02 nm, output power of 30 mW, and power stability of 1% was selected as the laser source. The period of the nano-ring radial polarization grating is 200 nm, and the duty cycle is 0.5. The area array camera uses a CamRecord 5000 CMOS sensor, which can achieve a maximum frame rate of 5000 fps at a camera resolution of 512×512, meeting the needs of power frequency image acquisition. A high-low temperature alternating damp heat test chamber was used to provide different temperature environments, with a temperature range of -40℃ to 85℃ and a temperature fluctuation of ±0.5℃. This embodiment also included experiments where the main optical components were placed inside the chamber and subjected to temperature cycling experiments within the range of -40℃ to 85℃. The birefringence of the stress line in each cycle was determined and compensated using the zero-point theorem and a model-free adaptive iterative learning method. Finally, the basic accuracy of the optical current sensor was recorded using a calibrator, as shown in Table 1. Under temperature cycling conditions, the optical current sensor can meet the 0.5-level accuracy requirement.

[0083] Table 1. Basic Accuracy Experimental Data

[0084]

[0085] Example 2:

[0086] This invention also proposes a stress line birefringence compensation system for an optical current sensor. The optical current sensor includes a laser source, a polarizer, a magneto-optical thin film, a nano-annular radial polarization grating, an image transmission beam, and a CMOS area array camera, all arranged sequentially on the same optical path. The system includes:

[0087] The startup module is used to emit light signals using a laser source, which pass sequentially through a polarizer, a magneto-optical thin film, a nano-ring radial polarization grating, and an image transmission beam. The output signal is superimposed with the Faraday magneto-optical rotation angle θ and the stress line birefringence δ to form a synchronously rotating ring light spot, which is then transmitted to the CMOS area array camera. This module is used to implement the function of step S100 in Embodiment 1, and will not be described in detail here.

[0088] The AC zero-crossing determination module is used to determine the zero-crossing time of the AC current to be measured. At the zero-crossing time, the rotation angle of the corresponding annular spot is obtained by the CMOS area array camera as the stress line birefringence δ and recorded. This module is used to implement the function of step S200 in Embodiment 1, which will not be described again here.

[0089] The compensation module, based on the recorded stress line birefringence δ, uses a model-free adaptive iterative learning method to predict the stress line birefringence δ at future moments, and compensates the output signal of the optical current sensor according to the prediction results; this module is used to implement the function of step S300 in Embodiment 1, and will not be described in detail here.

[0090] As a preferred implementation manner of this embodiment, the alternating current zero-crossing determination module includes:

[0091] An output data acquisition unit, configured to acquire discrete output data of an optical current sensor

[0092]

[0093] A zero-crossing moment determination unit, configured to determine whether the positive and negative signs of the rotation angles of two adjacent discrete output data and are the same, where k < n. If the signs are the same, it is considered that there is no current zero-crossing between the two discrete output data; if the signs are different, it is considered that there is a zero-crossing point between the two discrete output data, and the average value of t k and t k+1 is determined as the zero-crossing moment.

[0094] As a preferred implementation manner of this embodiment, in the compensation module, the step of obtaining multiple recorded historical stress line birefringences δ and predicting the stress line birefringence δ at a future moment by using a model-free adaptive iterative learning method is specifically as follows:

[0095] Perform model-free iterative learning through the following formula:

[0096] com k (t) = com k-1 (t) + k p δ <00​​​​​​​​​​​​​​​​​​​​​​​​This embodiment proposes a computer-readable storage medium storing a computer program that, when executed by a processor, implements the stress line birefringence compensation method for an optical current sensor as described in any embodiment of the present invention.

[0104] In this application embodiment, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent the existence of A alone, A and B simultaneously, or B alone. A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one of the following" and similar expressions refer to any combination of these items, including any combination of singular or plural items. For example, at least one of a, b, and c can represent: a, b, c, a and b, a and c, b and c, or a and b and c, where a, b, and c can be single or multiple.

[0105] Those skilled in the art will recognize that the units and algorithm steps described in the embodiments disclosed herein can be implemented using electronic hardware, computer software, or a combination of electronic hardware and software. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0106] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0107] In the several embodiments provided in this application, any function, if implemented as a software functional unit and sold or used as an independent product, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0108] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A method for compensating for birefringence along stress lines in an optical current sensor, characterized in that, The optical current sensor includes a laser source, a polarizer, a magneto-optical thin film, a nano-annular radial polarization grating, an image transmission beam, and a CMOS area array camera, all arranged sequentially on the same optical path. The method includes the following steps: The light signal emitted by the laser source passes sequentially through a polarizer, a magneto-optical thin film, a nano-ring radial polarization grating, and an image transmission beam. The output signal is superimposed with the Faraday magneto-rotation angle. θ Birefringence with stress lines δ It forms a synchronously rotating ring-shaped light spot, which is then transmitted to the CMOS area array camera; Determine the zero-crossing moment of the AC current to be measured, and at the zero-crossing moment, acquire the rotation angle of the corresponding annular spot using a CMOS area array camera, which is the stress line birefringence. δ And record it; Based on recorded stress line birefringence δ A model-free adaptive iterative learning method is used to predict stress line birefringence at future moments. δ And compensate the output signal of the optical current sensor based on the prediction results; Among them, the acquisition and recording of multiple historical stress lines birefringence δ A model-free adaptive iterative learning method is used to predict stress line birefringence at future moments. δ The specific steps are as follows: Model-free iterative learning is performed using the following formula: in, No. iteration Error compensation value at any given time; The learning rate; An adaptive algorithm is added, and the pseudo-partial derivative of the adaptive algorithm is used to replace the learning rate in the above model-free iterative learning. The acquired birefringence of multiple historical stress lines δ The average value is used as the initial value and fed into the model-free iterative learning with adaptive algorithm for iterative calculation. After reaching the convergence condition, the predicted stress line birefringence at time t is output. δ .

2. The stress line birefringence compensation method for an optical current sensor according to claim 1, characterized in that, The method for determining the zero-crossing time of the AC current to be measured is as follows: Acquire discrete output data from an optical current sensor. t 1,( θ 1 +δ 1), ( t 2,( θ 2 +δ 2)), ..., ( t n ,( θ n +δ n )); Determine whether the positive and negative signs of the rotation angles of two adjacent discrete output data( t k ,( θ k +δ k )) and ([[]] t t k+1 ,( θ k+1 +δ k+1 )) are the same, where k < n. If the signs are the same, it is considered that there is no current zero-crossing between the two discrete output data; if the signs are different, it is considered that there is a zero-crossing point between the two discrete output data, and t k and t k+1 The average value of is determined as the zero-crossing moment.

3. A stress line birefringence compensation system for an optical current sensor, characterized in that, The optical current sensor includes a laser source, a polarizer, a magneto-optical thin film, a nano-annular radial polarization grating, an image transmission beam, and a CMOS area array camera, all sequentially arranged on the same optical path. The system includes: The startup module is used to emit light signals from a laser source, which then pass sequentially through a polarizer, a magneto-optical thin film, a nano-ring radial polarization grating, and an image transmission beam. The output signal is superimposed with the Faraday magneto-rotation angle. θ Birefringence with stress lines δ It forms a synchronously rotating ring-shaped light spot, which is then transmitted to the CMOS area array camera; The AC zero-crossing determination module is used to determine the zero-crossing moment of the AC current under test. At the zero-crossing moment, the rotation angle of the corresponding annular spot is acquired by a CMOS area array camera, which is the stress line birefringence. δ And record it; Compensation module, based on recorded stress line birefringence δ A model-free adaptive iterative learning method is used to predict stress line birefringence at future moments. δ And compensate the output signal of the optical current sensor based on the prediction results; In the compensation module, the acquisition and recording of multiple historical stress lines with birefringence... δ A model-free adaptive iterative learning method is used to predict stress line birefringence at future moments. δ The specific steps are as follows: Model-free iterative learning is performed using the following formula: in, No. iteration Error compensation value at any given time; The learning rate; An adaptive algorithm is added, and the pseudo-partial derivative of the adaptive algorithm is used to replace the learning rate in the above model-free iterative learning. The acquired birefringence of multiple historical stress lines δ The average value is used as the initial value and fed into the model-free iterative learning with adaptive algorithm for iterative calculation. After reaching the convergence condition, the predicted stress line birefringence at time t is output. δ .

4. The stress line birefringence compensation system for an optical current sensor according to claim 3, characterized in that, The zero-crossing determination module includes: The output data acquisition unit is used to acquire discrete output data from the optical current sensor. t 1,( θ 1 +δ 1), ( t 2,( θ 2 + δ 2)), ..., ( t n ,( θ n +δ n )); A zero-crossing moment determination unit, configured to determine whether the positive and negative signs of the rotation angles of two adjacent discrete output data ( t k ,( θ k +δ k [[ID=,8])) and (<0)000114> k+1 ,( θ k+1 + δ k+1 )) are the same, where k < n. If the signs are the same, it is considered that there is no current zero-crossing between the two discrete output data; if the signs are different, it is considered that there is a zero-crossing point between the two discrete output data, and the t k and t k+1 average value is determined as the zero-crossing moment.

5. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the stress line birefringence compensation method for the optical current sensor as described in any one of claims 1 to 2.

6. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by the processor, the program implements the stress line birefringence compensation method for the optical current sensor as described in any one of claims 1 to 2.