Configuration for processing a material sample

Abstract

A method (100) for configuring a device (1) for processing (180) a material sample (20) with at least one computing unit (2) and at least one processing unit (6) is provided, the method comprising: acquiring (110) by the computing unit (2) via a data acquisition unit (11) input data about the material sample (20) to be processed; determining (150) by a first machine learning system (3) of the computing unit (2) suitable configuration parameters for the at least one processing unit (6) of the device (1) based on the acquired input data; configuring (170) by the computing unit (2) the device (1) with the determined configuration parameters; and processing (180) the material sample (20) based on the determined configuration parameters.