Transistor array substrate

By designing an electrical measurement pin connection on the transistor array substrate with the same width of the electrical measurement element as the electrode bridge, the signal transmission problem caused by the broken electrode bridge is solved, and the timely and accurate measurement of the electrical properties of the thin film transistor and the monitoring of the production status are realized. .

CN102226992AInactive Publication Date: 2011-10-26AU OPTRONICS CORP
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
AU OPTRONICS CORP
Filing Date
2011-03-23
Publication Date
2011-10-26
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

⚠Technical Problem

In low-temperature polysilicon technology thin-film transistor liquid crystal displays, the electrode bridges are easily broken or peeled off due to expansion stress, resulting in signals being unable to be written into the pixel electrodes and failing to reflect the electrical status of the thin-film transistors in a timely manner, affecting the display effect.

⚗Method used

Design a transistor array substrate. The width of the electrical measuring element is the same as the width of the electrode bridge. They are connected through the electrical measuring pins to ensure that the electrical measuring element simultaneously responds to the fracture status of the electrode bridge and ensures the accuracy of the measurement results.

🎯Benefits of technology

It achieves timely and accurate confirmation of the electrical status of thin film transistors, avoids screen leakage, and ensures the normality of production conditions and display effects.

✦ Generated by Eureka AI based on patent content.
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Abstract

The invention provides a transistor array substrate, comprising a thin film transistor, an insulating layer, a flat layer, two electrical testing pins, electrical measuring elements and pixel electrodes, wherein the thin film transistor is arranged on the transistor array substrate; the insulating layer is arranged at the lowest layer of the transistor array substrate; the flat layer is arranged above the insulating layer; the pixel electrodes are distributed above the flat layer; each pixel electrode comprises an upper pixel electrode, a lower pixel electrode and an electrode bridge for connecting the upper pixel electrode with the lower pixel electrode; the electrical measuring elements are arranged at the periphery of the transistor array substrate; the width of parts of electrical measuring elements is same as that of the electrode bridge; and the two electrical testing pins are arranged on the flat layer and connected with two ends of each electrical measuring element respectively. The transistor array substrate can confirm the electrical property of thin film transistor units accurately in time and guide the production condition quickly when any abnormity occurs.
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