High and low temperature test chamber, high and low temperature test device and control method thereof

Abstract

This application belongs to the technical field of environmental test devices, and particularly relates to a high and low temperature test chamber, a high and low temperature test device, and a control method thereof. The high and low temperature test chamber adopts a multi-chamber structure, including a high temperature chamber, a first cooling chamber, a second cooling chamber, a low temperature chamber, a first heating chamber, and a second heating chamber. The test object moves cyclically in different chambers of the high and low temperature test chamber, and can provide a high and low temperature alternating environment for the test object. Since the temperatures of the high temperature chamber and the low temperature chamber are stable, the heat capacity does not generate additional energy consumption; the cooling process is divided into two stages, the first cooling chamber and the second cooling chamber, and the heating process is divided into two stages, the first heating chamber and the second heating chamber. Therefore, the temperature change of the heat capacity of the cooling chamber and the heating chamber is reduced, which helps to reduce the additional energy consumption caused by its heat capacity and reduce the equipment operation cost. In the high and low temperature test device and its control method, due to the adoption of the above-mentioned high and low temperature test chamber, the additional energy consumption caused by its heat capacity can also be reduced, and the equipment operation cost can be reduced.

Description

Technical Field

[0001] This application belongs to the technical field of environmental test devices, and particularly relates to a high and low temperature test chamber, a high and low temperature test device, and a control method thereof. Background Art

[0002] High and low temperature test devices are necessary test devices for many products during the R & D process. Usually, during testing, high temperature and low temperature need to be maintained for a long time, while the cooling section from high temperature to low temperature or the heating section from low temperature to high temperature takes a shorter time. Many test objects only require heating in the high temperature section and the low temperature section, and some require heating throughout the entire test cycle. Currently, in conventional high and low temperature test devices, the heat capacity of the device will generate additional energy consumption, resulting in high operating costs of the device. Summary of the Invention

[0003] The purpose of the embodiments of this application is to provide a high and low temperature test chamber, a high and low temperature test device, and a control method thereof, so as to solve the technical problem that the heat capacity of the existing high and low temperature test device will generate additional energy consumption.

[0004] The embodiments of this application provide a high and low temperature test chamber, including:

[0005] A high temperature chamber, used to accommodate a test object and heat or cool it. The high temperature chamber includes a high temperature chamber box body and a high temperature chamber door provided on the high temperature chamber box body;

[0006] A first cooling chamber, used to accommodate the test object from the high temperature chamber and cool it;

[0007] A second cooling chamber, used to accommodate the test object from the first cooling chamber and cool it. The second cooling chamber is arranged adjacent to the first cooling chamber;

[0008] A low temperature chamber, used to accommodate the test object from the second cooling chamber and heat or cool it. The low temperature chamber includes a low temperature chamber box body and a low temperature chamber door provided on the low temperature chamber box body;

[0009] A first heating chamber, used to accommodate the test object from the low temperature chamber and heat it;

[0010] A second heating chamber, used to accommodate the test object from the first heating chamber and heat it. The second heating chamber is arranged adjacent to the first heating chamber; and

[0011] A control device, used to control the temperatures of the high temperature chamber, the first cooling chamber, the second cooling chamber, the low temperature chamber, the first heating chamber, and the second heating chamber to change according to a set change curve.

[0012] Optionally, the high-temperature chamber further includes a high-temperature chamber fan for providing air flow inside the high-temperature chamber box body, a high-temperature chamber electric heater disposed inside the high-temperature chamber box body, and a high-temperature chamber temperature sensor for detecting the temperature of the high-temperature chamber box body;

[0013] And / or, the first cooling chamber includes a first cooling chamber box body, a first cooling chamber fan for providing air flow inside the first cooling chamber box body, and a first cooling chamber temperature sensor for detecting the temperature of the first cooling chamber box body;

[0014] And / or, the second cooling chamber includes a second cooling chamber box body, a second cooling chamber fan for providing air flow inside the second cooling chamber box body, and a second cooling chamber temperature sensor for detecting the temperature of the second cooling chamber box body;

[0015] And / or, the low-temperature chamber further includes a low-temperature chamber fan for providing air flow inside the low-temperature chamber box body, a low-temperature chamber electric heater disposed inside the low-temperature chamber box body, and a low-temperature chamber temperature sensor for detecting the temperature of the low-temperature chamber box body;

[0016] And / or, the first warming chamber includes a first warming chamber box body, a first warming chamber fan for providing air flow inside the first warming chamber box body, and a first warming chamber temperature sensor for detecting the temperature of the first warming chamber box body;

[0017] And / or, the second warming chamber includes a second warming chamber box body, a second warming chamber fan for providing air flow inside the second warming chamber box body, a second warming chamber electric heater disposed inside the second warming chamber box body, and a second warming chamber temperature sensor for detecting the temperature of the second warming chamber box body.

[0018] Optionally, the opening of the high-temperature chamber faces the entrance of the first cooling chamber, the exit of the first cooling chamber is connected to the entrance of the second cooling chamber, and the exit of the second cooling chamber faces the opening of the low-temperature chamber;

[0019] And / or, the opening of the low-temperature chamber faces the entrance of the first warming chamber, the exit of the first warming chamber is connected to the entrance of the second warming chamber, and the exit of the second warming chamber faces the opening of the high-temperature chamber.

[0020] Optionally, at least one auxiliary cooling chamber is provided between the second cooling chamber and the low-temperature chamber, and the control device is further configured to control the temperature of the auxiliary cooling chamber to change according to a set change curve;

[0021] And / or, at least one auxiliary warming chamber is provided between the second warming chamber and the high-temperature chamber, and the control device is further configured to control the temperature of the auxiliary warming chamber to change according to a set change curve.

[0022] Optionally, the high and low temperature test chamber further includes a driving mechanism configured to drive the test object to stay in the high temperature chamber, the first cooling chamber, the second cooling chamber, the low temperature chamber, the first heating chamber, and the second heating chamber for their respective set times in sequence, and then return to the high temperature chamber for cyclic movement.

[0023] An embodiment of the present application provides a high and low temperature test device, including a refrigeration device having a subcooler, a cold storage and cold release circuit having an ice storage water tank, and the above-mentioned high and low temperature test chamber; the refrigeration device is configured to supply cold to the low temperature chamber, the second cooling chamber, and the ice storage water tank; the cold storage and cold release circuit is configured to store cold and supply cold to the subcooler, the first cooling chamber, and the high temperature chamber.

[0024] Optionally, the ice storage water tank has an ice storage pipeline and a cold release pipeline that perform heat exchange with each other. The two ends of the ice storage pipeline are respectively an ice storage inlet and an ice storage outlet, and the two ends of the cold release pipeline are respectively a cold release inlet and a cold release outlet;

[0025] The refrigeration device includes a compressor and a condenser connected in sequence, a low temperature chamber evaporator disposed in the low temperature chamber box body, and a second cooling chamber evaporator configured to supply cold to the second cooling chamber; an output end of the condenser is connected to an input end of the subcooler, and an output end of the subcooler is connected with a first refrigeration pipeline, a second refrigeration pipeline, and a third refrigeration pipeline;

[0026] A first solenoid valve and a first thermostatic expansion valve are provided on the first refrigeration pipeline. An end of the first refrigeration pipeline is connected to an input end of the low temperature chamber evaporator, and an output end of the low temperature chamber evaporator is connected to an input end of the compressor;

[0027] A second solenoid valve and a second thermostatic expansion valve are provided on the second refrigeration pipeline. An end of the second refrigeration pipeline is connected to an input end of the second cooling chamber evaporator, and an output end of the second cooling chamber evaporator is connected to an input end of the compressor;

[0028] A third solenoid valve and a third thermostatic expansion valve are provided on the third refrigeration pipeline. An end of the third refrigeration pipeline is connected to the ice storage inlet of the ice storage water tank, and the ice storage outlet of the ice storage water tank is connected to an input end of the compressor.

[0029] Optionally, the subcooler has a first heat exchange pipeline and a subcooling pipeline that perform heat exchange with each other. The two ends of the subcooling pipeline are respectively a subcooling inlet and a subcooling outlet;

[0030] The cold storage and cold release circuit includes a cold release water pump connected to the cold release outlet of the ice storage tank, a first cold release cooler for cooling the first temperature reduction chamber, and a high-temperature chamber cold release cooler for cooling the high-temperature chamber; the output end of the cold release water pump is connected with a first cold release pipeline, a second cold release pipeline and a third cold release pipeline;

[0031] A fourth solenoid valve and a first flow regulating valve are arranged on the first cold release pipeline, the end of the first cold release pipeline is connected to the subcooling inlet of the subcooler, and the subcooling outlet of the subcooler is connected to the cold release inlet of the ice storage tank;

[0032] A fifth solenoid valve and a second flow regulating valve are arranged on the second cold release pipeline, the end of the second cold release pipeline is connected to the input end of the first temperature reduction chamber cold release cooler, and the output end of the first temperature reduction chamber cold release cooler is connected to the cold release inlet of the ice storage tank;

[0033] A sixth solenoid valve and a third flow regulating valve are arranged on the third cold release pipeline, the end of the third cold release pipeline is connected to the input end of the high-temperature chamber cold release cooler, and the output end of the high-temperature chamber cold release cooler is connected to the cold release inlet of the ice storage tank.

[0034] Optionally, a heat recovery device is connected between the compressor and the condenser; the high and low temperature test device further includes a heat recovery circuit for recovering the exhaust heat of the compressor and heating the first temperature increase chamber;

[0035] The heat recovery device has a second heat exchange pipeline and a heat recovery pipeline for heat exchange with each other, and the two ends of the heat recovery pipeline are respectively a heat recovery inlet and a heat recovery outlet;

[0036] The heat recovery circuit includes a hot water tank, a heat release water pump, a seventh solenoid valve, a fourth flow regulating valve and a heat release device connected in sequence, the heat release device is used for heating the first temperature increase chamber, the output end of the heat release device is connected to the heat recovery inlet of the heat recovery device, and the heat recovery outlet of the heat recovery device is connected to the input end of the hot water tank.

[0037] The embodiment of the present application provides a control method for a high and low temperature test device, including the following steps:

[0038] When the test object is in the high-temperature chamber, close the high-temperature chamber door and the low-temperature chamber door, and control the temperature of the high-temperature chamber to change according to the set high-temperature chamber temperature change curve within the set high-temperature chamber residence time;

[0039] After the residence time of the test object in the high-temperature chamber reaches the set value, open the high-temperature chamber door, move the test object into the first cooling chamber, close the high-temperature chamber door, and control the temperature of the first cooling chamber to change according to the set temperature change curve within the set residence time of the first cooling chamber;

[0040] After the residence time of the test object in the first cooling chamber reaches the set value, move the test object into the second cooling chamber, and control the temperature of the second cooling chamber to change according to the set temperature change curve within the set residence time of the second cooling chamber;

[0041] After the residence time of the test object in the second cooling chamber reaches the set value, open the low-temperature chamber door, move the test object into the low-temperature chamber, close the low-temperature chamber door, and control the temperature of the low-temperature chamber to change according to the set low-temperature chamber temperature change curve within the set residence time of the low-temperature chamber;

[0042] After the residence time of the test object in the low-temperature chamber reaches the set value, open the low-temperature chamber door, move the test object into the first warming chamber, close the low-temperature chamber door, and control the temperature of the first warming chamber to change according to the set temperature change curve within the set residence time of the first warming chamber;

[0043] After the residence time of the test object in the first warming chamber reaches the set value, move the test object into the second warming chamber, and control the second warming chamber to change according to the set temperature change curve within the set residence time of the second warming chamber;

[0044] After the residence time of the test object in the second warming chamber reaches the set value, open the high-temperature chamber door, move the test object into the high-temperature chamber, and close the high-temperature chamber door.

[0045] One or more of the above technical solutions provided by the embodiments of the present application have at least the following technical effects: The high and low temperature test chamber adopts a multi-chamber structure, including a high-temperature chamber, a first cooling chamber, a second cooling chamber, a low-temperature chamber, a first warming chamber and a second warming chamber. The test object circulates and moves in different chambers of the high and low temperature test chamber, and can provide a high and low temperature alternating environment for the test object. Since the temperatures of the high-temperature chamber and the low-temperature chamber are stable, there is no additional energy consumption due to heat capacity; the cooling process is divided into two stages of the first cooling chamber and the second cooling chamber, and the heating process is divided into two stages of the first warming chamber and the second warming chamber. Therefore, the temperature change of the heat capacity of the cooling chamber and the warming chamber is reduced, which helps to reduce the additional energy consumption caused by its heat capacity and reduce the equipment operation cost.

[0046] In the high and low temperature test device and its control method, due to the use of the above-mentioned high and low temperature test chamber, the additional energy consumption caused by its heat capacity can also be reduced. In addition, the refrigeration device is used in combination with the cold storage and cold release circuit to improve energy efficiency and reduce the operation cost of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0048] Figure 1 Schematic diagram of the main components of the high and low temperature test device provided by the embodiment of the present application;

[0049] Figure 2 Schematic diagram of the process of the high and low temperature test device provided by the embodiment of the present application;

[0050] Figure 3 Schematic diagram of the high temperature chamber of the high and low temperature test device provided by the embodiment of the present application;

[0051] Figure 4 Schematic diagram of the first cooling chamber of the high and low temperature test device provided by the embodiment of the present application;

[0052] Figure 5 Schematic diagram of the second cooling chamber of the high and low temperature test device provided by the embodiment of the present application;

[0053] Figure 6 Schematic diagram of the low temperature chamber of the high and low temperature test device provided by the embodiment of the present application;

[0054] Figure 7 Schematic diagram of the first heating chamber of the high and low temperature test device provided by the embodiment of the present application;

[0055] Figure 8 Schematic diagram of the second heating chamber of the high and low temperature test device provided by the embodiment of the present application;

[0056] Figure 9 Schematic diagram of the high and low temperature test chamber provided by another embodiment of the present application;

[0057] Figure 10 For Figure 9 Schematic diagram of the auxiliary cooling chamber applied in the high and low temperature test chamber;

[0058] Figure 11 For Figure 9 Schematic diagram of the auxiliary heating chamber applied in the high and low temperature test chamber. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0059] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0060] In the description of the embodiments of the present application, it should be understood that the orientation or positional relationship indicated by the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the embodiments of the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the embodiments of the present application.

[0061] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present application, "a plurality" means two or more, unless otherwise specifically defined.

[0062] In the embodiments of the present application, unless otherwise clearly specified and limited, the terms "installation", "connection", "connection", "fixation", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0063] At present, in conventional high and low temperature test devices, the test object remains stationary, and the entire temperature alternating process is realized in the same space. Therefore, during the cooling or heating process, due to the relatively large heat capacity of the device, more additional energy consumption will be generated. When the heat generation of the test object is relatively large, the heat capacity of the device mainly causes additional energy consumption of the refrigerator. That is, for the dynamic process, the heat capacity other than the test object is harmful heat capacity.

[0064] Please refer to Figure 2 , the embodiments of the present application provide a high and low temperature test chamber 104 for providing a high and low temperature alternating environment for the test object. High temperature and low temperature are relative. For example, the temperature range can be -60°C to 150°C, and the specific range is not limited.

[0065] The high and low temperature test chamber 104 includes a high temperature chamber 28, a first cooling chamber 29, a second cooling chamber 30, a low temperature chamber 31, a first heating chamber 32, a second heating chamber 33 and a control device 100. Referring also to Figure 3 , the high temperature chamber 28 is used to accommodate the test object 105 and heat or cool it. The high temperature chamber 28 includes a high temperature chamber box body 301 and a high temperature chamber door 302 provided on the high temperature chamber box body 301. Referring to Figure 2 , the first cooling chamber 29 is used to accommodate the test object 105 from the high temperature chamber 28 and cool it. The second cooling chamber 30 is used to accommodate the test object 105 from the first cooling chamber 29 and cool it. The second cooling chamber 30 is arranged adjacent to the first cooling chamber 29. Referring also to Figure 6 , the low temperature chamber 31 is used to accommodate the test object 105 from the second cooling chamber 30 and heat or cool it. The low temperature chamber 31 includes a low temperature chamber box body 601 and a low temperature chamber door 602 provided on the low temperature chamber box body 601. Referring to Figure 2 , the first heating chamber 32 is used to accommodate the test object 105 from the low temperature chamber 31 and heat it. The second heating chamber 33 is used to accommodate the test object 105 from the first heating chamber 32 and heat it. The second heating chamber 33 is arranged adjacent to the first heating chamber 32. The control device 100 is used to control the temperatures of the high temperature chamber 28, the first cooling chamber 29, the second cooling chamber 30, the low temperature chamber 31, the first heating chamber 32 and the second heating chamber 33 to change according to a set change curve.

[0066] Compared with the prior art, the high and low temperature test chamber 104 provided by the present application adopts a multi-chamber structure, including a high temperature chamber 28, a first cooling chamber 29, a second cooling chamber 30, a low temperature chamber 31, a first heating chamber 32 and a second heating chamber 33. The test object 105 circulates and moves in different chambers of the high and low temperature test chamber 104, and can provide a high and low temperature alternating environment for the test object 105. Since the temperatures of the high temperature chamber 28 and the low temperature chamber 31 are stable and the heat capacity does not generate additional energy consumption; the cooling process is divided into two stages of the first cooling chamber 29 and the second cooling chamber 30, and the heating process is divided into two stages of the first heating chamber 32 and the second heating chamber 33. Therefore, the temperature change of the heat capacity of the cooling chamber and the heating chamber is reduced, which helps to reduce the additional energy consumption caused by its heat capacity and reduce the equipment operation cost.

[0067] In another embodiment of the present application, referring to Figure 3 , the high temperature chamber door 302 is swingably mounted on the high temperature chamber box body 301, and the high temperature chamber door 302 can control the opening and closing of the opening of the high temperature chamber box body 301 through a motor (not shown in the figure). Referring to Figure 6, the low-temperature chamber door 602 is swingably mounted on the low-temperature chamber body 601, and the low-temperature chamber door 602 can control the opening and closing of the opening of the low-temperature chamber body 601 through a motor (not shown in the figure). The above-mentioned motor is electrically connected to the control device 100, and the control device 100 controls the motor to realize the opening and closing of the door body.

[0068] Please refer to Figure 2 , Figure 3 , in another embodiment of the present application, the high-temperature chamber 28 further includes a high-temperature chamber fan 303 for providing air flow inside the high-temperature chamber body 301, a high-temperature chamber electric heater 304 provided in the high-temperature chamber body 301, and a high-temperature chamber temperature sensor 305 for detecting the temperature of the high-temperature chamber body 301. A high-temperature chamber cold release device 22 is also provided inside the high-temperature chamber body 301 for cooling the high-temperature chamber body 301. When the test object 105 is in the high-temperature chamber 28, the control device 100 controls the high-temperature chamber door 302 and the low-temperature chamber door 602 to close to avoid heat loss and improve energy efficiency; by adjusting the air volume of the high-temperature chamber fan 303, the power of the high-temperature chamber electric heater 304, the flow rate of the following chilled water pump 14 and the opening degree of the third flow regulating valve 21, the temperature of the high-temperature chamber 28 is controlled to change according to the set high-temperature chamber temperature change curve within the set high-temperature chamber residence time. The control device 100 performs corresponding control according to the data measured by the high-temperature chamber temperature sensor 305.

[0069] Please refer to Figure 2 , Figure 4 , in another embodiment of the present application, the first cooling chamber 29 includes a first cooling chamber body 401, a first cooling chamber fan 402 for providing air flow inside the first cooling chamber body 401, and a first cooling chamber temperature sensor 503 for detecting the temperature of the first cooling chamber body 401. A first cooling chamber cold release device 19 is also provided inside the first cooling chamber body 401 for cooling the first cooling chamber body 401. When the test object 105 is moved into the first cooling chamber 29, the high-temperature chamber door 302 is closed, and by adjusting the air volume of the first cooling chamber fan 402 and the opening degree of the following second flow regulating valve 18, the temperature of the first cooling chamber 29 is controlled to change according to the set temperature change curve within the set first cooling chamber residence time. The control device 100 performs corresponding control according to the data measured by the first cooling chamber temperature sensor 503.

[0070] Please refer to Figure 2 , Figure 5, in another embodiment of the present application, the second cooling chamber 30 includes a second cooling chamber box body 501, a second cooling chamber fan 502 for providing air flow inside the second cooling chamber box body 501, and a second cooling chamber temperature sensor 503 for detecting the temperature of the second cooling chamber box body 501. A second cooling chamber evaporator 10 is further arranged inside the second cooling chamber box body 501 for cooling the second cooling chamber box body 501. When the test object 105 is moved into the second cooling chamber 30, the temperature of the second cooling chamber 30 is controlled to change according to a set temperature change curve within a set residence time of the second cooling chamber by adjusting the air volume of the second cooling chamber fan 502 and the opening degree of the following second thermal expansion valve 9. The control device 100 performs corresponding control according to the data measured by the second cooling chamber temperature sensor 503.

[0071] Please refer to Figure 2 , Figure 6 , in another embodiment of the present application, the low-temperature chamber 31 further includes a low-temperature chamber fan 603 for providing air flow inside the low-temperature chamber box body 601, a low-temperature chamber electric heater 604 arranged inside the low-temperature chamber box body 601, and a low-temperature chamber temperature sensor 605 for detecting the temperature of the low-temperature chamber box body 601. A low-temperature chamber evaporator 7 is further arranged inside the low-temperature chamber box body 601 for cooling the low-temperature chamber box body 601. When the test object 105 is moved into the low-temperature chamber 31, the low-temperature chamber door 602 is closed, and the temperature of the low-temperature chamber 31 is controlled to change according to a set temperature change curve within a set residence time of the low-temperature chamber by adjusting the air volume of the low-temperature chamber fan 603, the power of the low-temperature chamber electric heater 604, and the opening degree of the following first thermal expansion valve 6. The control device 100 performs corresponding control according to the data measured by the low-temperature chamber temperature sensor 605.

[0072] Please refer to Figure 2 , Figure 7 , in another embodiment of the present application, the first warming chamber 32 includes a first warming chamber box body 701, a first warming chamber fan 702 for providing air flow inside the first warming chamber box body 701, and a first warming chamber temperature sensor 703 for detecting the temperature of the first warming chamber box body 701. A heat release device 27 is further arranged inside the first warming chamber 32 for heating the first warming chamber box body 701. When the test object 105 is moved into the first warming chamber 32 and the low-temperature chamber door 602 is closed, the temperature of the first warming chamber 32 is controlled to change according to a set temperature change curve within the residence time of the first warming chamber by adjusting the air volume of the first warming chamber fan 702, the flow rate of the following heat release water pump 24, and the opening degree of the fourth flow regulating valve 26. The control device 100 performs corresponding control according to the data measured by the first warming chamber temperature sensor 703.

[0073] Please refer to Figure 2 , Figure 8, in another embodiment of the present application, the second warming chamber 33 includes a second warming chamber box body 801, a second warming chamber fan 802 for providing air flow inside the second warming chamber box body 801, a second warming chamber electric heater 803 disposed inside the second warming chamber box body 801, and a second warming chamber temperature sensor 804 for detecting the temperature of the second warming chamber box body 801. When the test object 105 is moved into the second warming chamber 33, the temperature change curve is controlled to change according to the set value during the residence time in the second warming chamber by adjusting the air volume of the second warming chamber fan 802 and the power of the second warming chamber electric heater 803. The control device 100 performs corresponding control according to the data measured by the second warming chamber temperature sensor 804.

[0074] Please refer to Figure 2 , in another embodiment of the present application, the opening of the high-temperature chamber 28 faces the entrance of the first cooling chamber 29, the outlet of the first cooling chamber 29 is connected to the entrance of the second cooling chamber 30, and the outlet of the second cooling chamber 30 faces the opening of the low-temperature chamber 31. With this solution, it is convenient to quickly move the test object 105 from the high-temperature chamber 28 into the first cooling chamber 29, from the first cooling chamber 29 into the second cooling chamber 30, and from the second cooling chamber 30 into the low-temperature chamber 31.

[0075] The opening of the low-temperature chamber 31 faces the entrance of the first warming chamber 32, the outlet of the first warming chamber 32 is connected to the entrance of the second warming chamber 33, and the outlet of the second warming chamber 33 faces the opening of the high-temperature chamber 28. With this solution, it is convenient to quickly move the test object 105 from the low-temperature chamber 31 into the first warming chamber 32, from the first warming chamber 32 into the second warming chamber, and from the second warming chamber 33 into the high-temperature chamber 28. With the above two solutions, the overall structure is compact, occupies a small space, and can reduce the energy consumption loss when transferring the test object 105.

[0076] Please refer to Figure 9 , in another embodiment of the present application, at least one auxiliary cooling chamber 40 is provided between the second cooling chamber 30 and the low-temperature chamber 31, and the control device 100 is further configured to control the temperature of the auxiliary cooling chamber 40 to change according to a set change curve; at least one auxiliary warming chamber 41 is provided between the second warming chamber 33 and the high-temperature chamber 28, and the control device 100 is further configured to control the temperature of the auxiliary warming chamber 41 to change according to a set change curve. By expanding more auxiliary cooling chambers 40 or auxiliary warming chambers 41, the test object 105 circulates and moves in different chambers of the high and low temperature test chamber 104, and can provide the test object 105 with a high and low temperature alternating environment in more sections to meet higher test requirements.

[0077] Specifically, refer to Figure 5 , Figure 10, the auxiliary cooling chamber 40 is similar to the second cooling chamber 30. The auxiliary cooling chamber 40 includes an auxiliary cooling chamber box body 1001, an auxiliary cooling chamber fan 1002, an auxiliary cooling chamber evaporator 1003 and an auxiliary cooling chamber temperature sensor 1004. The auxiliary cooling chamber evaporator 1003 is cooled by the subcooler 4. The control device controls the temperature of the auxiliary cooling chamber 40 to change according to a set temperature change curve within a set residence time of the auxiliary cooling chamber.

[0078] Refer to Figure 8 , Figure 11 , the auxiliary heating chamber 41 is similar to the second heating chamber 33. The auxiliary heating chamber 41 includes an auxiliary heating chamber box body 2001, an auxiliary heating chamber fan 2002, an auxiliary heating chamber electric heater 2003 and an auxiliary heating chamber temperature sensor 2004. The auxiliary heating chamber heater 2003 supplies heat to the inside of the auxiliary heating chamber box body 2001. The control device controls the temperature of the auxiliary heating chamber 41 to change according to a set temperature change curve within a set residence time of the auxiliary heating chamber.

[0079] Please refer to Figure 2 , in another embodiment of the present application, the high and low temperature test chamber 104 further includes a driving mechanism (not shown in the figure) for driving the test object 105 to stay in the high temperature chamber 28, the first cooling chamber 29, the second cooling chamber 30, the low temperature chamber 31, the first heating chamber 32 and the second heating chamber 33 for their respective set times, and then return to the high temperature chamber 28 for cyclic movement. The driving mechanism can enable the test object 105 to move cyclically in different chambers. Specifically, the driving mechanism can be a plurality of conveyor belts driven by a motor. The first conveyor belt is arranged inside along the extending direction of the first cooling chamber 29 and the second cooling chamber 30. The second conveyor belt is arranged inside along the extending direction of the first heating chamber 32 and the second heating chamber 33. The third conveyor belt is arranged in the high temperature chamber 28 and is connected to the front end of the first conveyor belt and the end of the second conveyor belt. The fourth conveyor belt is arranged in the cold temperature chamber and is connected to the end of the first conveyor belt and the front end of the second conveyor belt. It can be understood that the driving mechanism can also be other transmission mechanisms.

[0080] Please refer to Figure 1 , Figure 2 , in another embodiment of the present application, a high and low temperature test device is provided, including a refrigeration device 101 having a subcooler 4, a cold storage and cold release circuit 102 having an ice storage water tank 13, and the above-mentioned high and low temperature test chamber 104; the refrigeration device 101 is used to supply cold to the low temperature chamber 31, the second cooling chamber 30 and the ice storage water tank 13; the cold storage and cold release circuit 102 is used to store cold and supply cold to the subcooler 4, the first cooling chamber 29 and the high temperature chamber 28.

[0081] The high and low temperature test chamber 104 adopts a multi-chamber structure, including a high temperature chamber 28, a first cooling chamber 29, a second cooling chamber 30, a low temperature chamber 31, a first heating chamber 32 and a second heating chamber 33. The test object 105 moves cyclically in different chambers of the high and low temperature test chamber 104, and can provide a high and low temperature alternating environment for the test object 105. Since the temperatures of the high temperature chamber 28 and the low temperature chamber 31 are stable and the heat capacity does not generate additional energy consumption; the cooling process is divided into two sections of the first cooling chamber 29 and the second cooling chamber 30, and the heating process is divided into two sections of the first heating chamber 32 and the second heating chamber 33. Therefore, the temperature change of the heat capacity of the cooling chamber and the heating chamber is reduced, which helps to reduce the additional energy consumption caused by its heat capacity and reduce the equipment operation cost. In the high and low temperature test device, due to the adoption of the above-mentioned high and low temperature test chamber 104, the additional energy consumption caused by its heat capacity can also be reduced. In addition, the refrigeration device 101 and the cold storage and cold release circuit 102 are used in cooperation to improve energy efficiency and reduce the equipment operation cost.

[0082] Please refer to Figure 2 , in another embodiment of the present application, the ice storage water tank 13 has an ice storage pipeline and a cold release pipeline that exchange heat with each other. The two ends of the ice storage pipeline are respectively an ice storage inlet 13a and an ice storage outlet 13b, and the two ends of the cold release pipeline are respectively a cold release inlet 13c and a cold release outlet 13d; the refrigeration device 101 includes a compressor 1, a condenser 3, a low temperature chamber evaporator 7 disposed in the low temperature chamber box body 601, and a second cooling chamber evaporator 10 for supplying cold to the second cooling chamber 30, which are connected in sequence; the output end of the condenser 3 is connected to the input end 4a of the subcooler 4, and the output end 4b of the subcooler 4 is connected with a first refrigeration pipeline, a second refrigeration pipeline and a third refrigeration pipeline;

[0083] A first solenoid valve 5 and a first thermostatic expansion valve 6 are provided on the first refrigeration pipeline. The end of the first refrigeration pipeline is connected to the input end of the low temperature chamber evaporator 7, and the output end of the low temperature chamber evaporator 7 is connected to the input end of the compressor 1. Open the first solenoid valve 5 and adjust the opening of the first thermostatic expansion valve 6 to control the cold quantity provided by the low temperature chamber evaporator 7.

[0084] A second solenoid valve 8 and a second thermostatic expansion valve 9 are provided on the second refrigeration pipeline. The end of the second refrigeration pipeline is connected to the input end of the second cooling chamber evaporator 10, and the output end of the second cooling chamber evaporator 10 is connected to the input end of the compressor 1. Open the second solenoid valve 8 and adjust the opening of the second thermostatic expansion valve 9 to control the cold quantity provided by the second cooling chamber evaporator 10.

[0085] A third solenoid valve 11 and a third thermostatic expansion valve 12 are provided on the third refrigeration pipeline. The end of the third refrigeration pipeline is connected to the ice storage inlet 13a of the ice storage water tank 13, and the ice storage outlet 13b of the ice storage water tank 13 is connected to the input end of the compressor 1. Open the third solenoid valve 11 and adjust the opening of the third thermostatic expansion valve 12 to control the cold quantity provided to the ice storage water tank 13.

[0086] Please refer to Figure 2 In another embodiment of the present application, the subcooler 4 has a first heat exchange pipeline and a subcooling pipeline that exchange heat with each other. The two ends of the subcooling pipeline are respectively a subcooling inlet 4c and a subcooling outlet 4d; the cold storage and cold release loop 102 includes a cold release water pump 14 connected to the cold release outlet 13d of the ice storage tank 13, a first cold release cooler 19 for cooling the first cooling chamber 29, and a high-temperature chamber cold release cooler 22 for cooling the high-temperature chamber 28; the output end of the cold release water pump 14 is connected with a first cold release pipeline, a second cold release pipeline and a third cold release pipeline;

[0087] A fourth solenoid valve 15 and a first flow regulating valve 16 are provided on the first cold release pipeline. The end of the first cold release pipeline is connected to the subcooling inlet 4c of the subcooler 4, and the subcooling outlet 4d of the subcooler 4 is connected to the cold release inlet 13c of the ice storage tank 13. Open the fourth solenoid valve 15 and adjust the opening of the first flow regulating valve 16 to adjust the flow rate of the subcooling pipeline entering the subcooler 4.

[0088] A fifth solenoid valve 17 and a second flow regulating valve 18 are provided on the second cold release pipeline. At the same time, refer to Figure 4 The end of the second cold release pipeline is connected to the input end of the first cold release cooler 19 for the first cooling chamber, and the output end of the first cold release cooler 19 for the first cooling chamber is connected to the cold release inlet 13c of the ice storage tank 13. Open the fifth solenoid valve 17 and adjust the opening of the second flow regulating valve 18 to adjust the flow rate entering the first cold release cooler 19 for the first cooling chamber.

[0089] A sixth solenoid valve 20 and a third flow regulating valve 21 are provided on the third cold release pipeline. At the same time, refer to Figure 3 The end of the third cold release pipeline is connected to the input end of the high-temperature chamber cold release cooler 22, and the output end of the high-temperature chamber cold release cooler 22 is connected to the cold release inlet 13c of the ice storage tank 13. Open the sixth solenoid valve 20 and adjust the opening of the third flow regulating valve 21 to adjust the flow rate entering the high-temperature chamber cold release cooler 22.

[0090] Please refer to Figure 2 In another embodiment of the present application, a heat recovery device 2 is connected between the compressor 1 and the condenser 3; the high and low temperature test device further includes a heat recovery loop 103 for recovering the exhaust heat of the compressor 1 and supplying heat to the first temperature rising chamber 32. By setting the heat recovery loop 103, the exhaust heat of the compressor 1 can be recovered and utilized, thereby improving energy efficiency.

[0091] Please refer to Figure 2 and Figure 7, in another embodiment of the present application, the heat recovery device 2 has a second heat exchange pipeline and a heat recovery pipeline that exchange heat with each other. The two ends of the heat recovery pipeline are respectively a heat recovery inlet 2a and a heat recovery outlet 2b; the heat recovery loop 103 includes a hot water tank 23, a heat release water pump 24, a seventh solenoid valve 25, a fourth flow regulating valve 26, and a heat release device 27 connected in sequence. The heat release device 27 is used to supply heat to the first temperature raising chamber 32. The output end of the heat release device 27 is connected to the heat recovery inlet 2a of the heat recovery device 2, and the heat recovery outlet 2b of the heat recovery device 2 is connected to the input end of the hot water tank 23. Open the seventh solenoid valve 25 and adjust the opening degree of the fourth flow regulating valve 26 to adjust the flow rate of the heat release device 27 entering the first temperature raising chamber 32.

[0092] In another embodiment of the present application, when the high and low temperature test device is operating normally, the control device 100 controls the first solenoid valve 5, the second solenoid valve 8, the third solenoid valve 11, the fourth solenoid valve 15, the fifth solenoid valve 17, the sixth solenoid valve 20, and the seventh solenoid valve 25 to be in the open state. Through different solenoid valves, the on-off switching of different paths is realized.

[0093] Please refer to Figures 2 to 8 , in another embodiment of the present application, a control method for a high and low temperature test device is provided, including the following steps:

[0094] When the test object 105 is in the high temperature chamber 28, close the high temperature chamber door 302 and the low temperature chamber door 602, and control the temperature of the high temperature chamber 28 to change according to the set high temperature chamber temperature change curve within the set high temperature chamber residence time;

[0095] After the residence time of the test object 105 in the high temperature chamber reaches the set value, open the high temperature chamber door 302, move the test object 105 into the first cooling chamber 29, close the high temperature chamber door 302, and control the temperature of the first cooling chamber 29 to change according to the set temperature change curve within the set first cooling chamber residence time. Specifically, control the temperature change of the high temperature chamber 28 by adjusting the air volume of the high temperature chamber fan 303, the power of the high temperature chamber electric heater 304, the flow rate of the heat release cold water pump 14, and the opening degree of the third flow regulating valve 21.

[0096] After the residence time of the test object 105 in the first cooling chamber reaches the set value, move the test object 105 into the second cooling chamber 30, and control the temperature of the second cooling chamber 30 to change according to the set temperature change curve within the set second cooling chamber 30 residence time. Specifically, control the temperature change of the first cooling chamber 29 by adjusting the air volume of the first cooling chamber fan 402 and the opening degree of the second flow regulating valve 18.

[0097] After the residence time of the test object 105 in the second cooling chamber 30 reaches the set value, the low-temperature chamber door 602 is opened, the test object 105 is moved into the low-temperature chamber 31, the low-temperature chamber door 602 is closed, and the temperature of the low-temperature chamber 31 is controlled to change according to the set temperature change curve of the low-temperature chamber within the set residence time of the low-temperature chamber. Specifically, the temperature change of the second cooling chamber 30 is controlled by adjusting the air volume of the second cooling chamber fan 502 and the opening degree of the second thermostatic expansion valve 9.

[0098] After the residence time of the test object 105 in the low-temperature chamber reaches the set value, the low-temperature chamber door 602 is opened, the test object 105 is moved into the first warming chamber 32, the low-temperature chamber door 602 is closed, and the temperature of the first warming chamber 32 is controlled to change according to the set temperature change curve within the set residence time of the first warming chamber. Specifically, the temperature change of the first warming chamber 32 is controlled by adjusting the air volume of the first warming chamber fan 702, the flow rate of the hot water release pump 24, and the opening degree of the fourth flow regulating valve 26.

[0099] After the residence time of the test object 105 in the closed first warming chamber reaches the set value, the test object 105 is moved into the second warming chamber 33, and the second warming chamber 33 is controlled to change according to the set temperature change curve within the set residence time of the second warming chamber. Specifically, the temperature change in the second warming chamber 33 is controlled by adjusting the air volume of the second warming chamber fan 802 and the power of the second warming chamber electric heater 803.

[0100] After the residence time of the test object 105 in the second warming chamber reaches the set value, the high-temperature chamber door 302 is opened, the test object 105 is moved into the high-temperature chamber 28, and the high-temperature chamber door 302 is closed.

[0101] Since the control method of this high and low temperature test device adopts all the technical solutions of the above all embodiments, it also has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be elaborated one by one here.

[0102] In another embodiment of the present application, it is assumed that the alternating temperature control is used for 60°C and -20°C, the set high-temperature constant temperature time and low-temperature constant temperature time are both 2h, the cooling and heating time are both 10min, the cooling and heating processes are both linearly changed, the ice storage water tank 13 uses ice as the cold storage agent and water as the secondary refrigerant. The test object 105 only generates heat during the high-temperature constant temperature time and the low-temperature constant temperature time.

[0103] In this embodiment, the residence time of the test object 105 in the high-temperature chamber 28 is the same as the high-temperature constant temperature time, that is, it is a high-temperature constant temperature process in the high-temperature chamber 28; the total residence time in the first cooling chamber 29 and the second cooling chamber 30 is the same as the cooling time; the residence time in the low-temperature chamber 31 is the same as the low-temperature constant temperature time, that is, it is a low-temperature constant temperature process in the low-temperature chamber 31; the total residence time in the first warming chamber 32 and the second warming chamber 33 is the same as the heating time.

[0104] Suppose the test object 105 is first placed in the high-temperature chamber 28, and the starting zero moment is set. The control device 100 controls the residence time of the test object 105 in the high-temperature chamber 28 to be 2 h.

[0105] When the time reaches 2 h, the high-temperature chamber door 302 is opened, the test object 105 is moved into the first cooling chamber 29, the high-temperature chamber door 302 is closed, and the test object 105 stays in the first cooling chamber 29 for 5 min.

[0106] When the time reaches 2 h 5 min, the test object 105 is moved into the second cooling chamber 30 and stays for 5 min.

[0107] When the time reaches 2 h 10 min, the low-temperature chamber door 602 is opened, the test object 105 is moved into the low-temperature chamber 31, the low-temperature chamber door 602 is closed, and the test object 105 stays in the low-temperature chamber 31 for 2 h.

[0108] When the time reaches 4 h 10 min, the low-temperature chamber door 602 is opened, the test object 105 is moved into the first heating chamber 32, the low-temperature chamber door 602 is closed, and the test object 105 stays in the first heating chamber 32 for 5 min.

[0109] When the time reaches 4 h 15 min, the test object 105 is moved into the second heating chamber 33 and stays for 5 min.

[0110] When the time reaches 4 h 20 min, the high-temperature chamber door 302 is opened, the test object 105 is moved into the high-temperature chamber 28, the high-temperature chamber door 302 is closed, and one test cycle is completed.

[0111] Repeat the foregoing cycle until it stops when the total test time is reached. The temperature control method is as before.

[0112] In another embodiment of the present application, it is assumed that the temperature is alternately controlled between 60 °C and -20 °C. The high-temperature constant-temperature time and the low-temperature constant-temperature time are both set to 2 h, the cooling time and the heating time are both 10 min, and the cooling and heating processes are both linearly changed. The ice storage water tank 13 uses ice as the cold storage agent and water as the secondary coolant. The test object 105 generates heat only during the high-temperature constant-temperature time and the low-temperature constant-temperature time.

[0113] In this embodiment, the residence time of the test object 105 in the high-temperature chamber 28 is different from the high-temperature constant-temperature time, that is, it is not completely a high-temperature constant-temperature process in the high-temperature chamber 28; the total residence time of the test object 105 in the first cooling chamber 29 and the second cooling chamber 30 is different from the cooling time; the residence time of the test object 105 in the low-temperature chamber 31 is different from the low-temperature constant-temperature time, that is, it is not completely a low-temperature constant-temperature process in the low-temperature chamber 31; the total residence time of the test object 105 in the first heating chamber 32 and the second heating chamber 33 is different from the heating time.

[0114] Suppose the test object 105 is first placed in the high-temperature chamber 28, and the starting zero moment is set. The control device 100 controls the residence time of the test object 105 in the high-temperature chamber 28 to be 2 h 9 min 50 s.

[0115] When the time reaches 2 h 9 min 50 s, the high-temperature chamber door 302 is opened, and the test object 105 is moved into the first cooling chamber 29. The high-temperature chamber door 302 is closed, and the test object 105 stays in the first cooling chamber 29 for 5 s.

[0116] When the time reaches 2 h 9 min 55 s, the test object 105 is moved into the second cooling chamber 30 and stays for 5 s.

[0117] When the time reaches 2 h 10 min, the low-temperature chamber door 602 is opened, and the test object 105 is moved into the low-temperature chamber 31. The low-temperature chamber door 602 is closed, and the test object 105 stays in the low-temperature chamber 31 for 2 h 9 min 50 s.

[0118] When the time reaches 4 h 19 min 50 s, the low-temperature chamber door 602 is opened, and the test object 105 is moved into the first heating chamber 32. The low-temperature chamber door 602 is closed, and the test object 105 stays in the first heating chamber 32 for 5 s.

[0119] When the time reaches 4 h 19 min 55 s, the test object 105 is moved into the second heating chamber 33 and stays for 5 s.

[0120] When the time reaches 4 h 20 min, the high-temperature chamber door 302 is opened, and the test object 105 is moved into the high-temperature chamber 28. The high-temperature chamber door 302 is closed, and one test cycle is completed.

[0121] Repeat the foregoing cycle until the total test time is reached and then stop. The temperature control method is as before.

[0122] In another embodiment of the present application, an extreme working condition is provided: the total residence time in the first cooling chamber 29 and the second cooling chamber 30 is much less than the cooling time, and the total residence time in the first heating chamber 32 and the second heating chamber 33 is much less than the heating time. Under this extreme working condition, the first cooling chamber 29, the second cooling chamber 30, the first heating chamber 32, and the second heating chamber 33 act as fast moving channels for the test object 105.

[0123] In another embodiment of the present application, one test object 105 is extended to two identical test objects 105 with the same test requirements. At the initial zero moment, one test object 105 is placed in the high-temperature chamber 28, and the other test object 105 is placed in the low-temperature chamber 31. The high and low temperature test chamber 104 of the present application can still be used for testing.

[0124] The above are only the preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included within the protection scope of the present application.

Claims

1. A high and low temperature test device, characterized in that, it includes a refrigeration device with a subcooler, a cold storage and cold release circuit with an ice storage water tank, and a high and low temperature test chamber; the high and low temperature test chamber includes: a high temperature chamber for accommodating a test object and heating or cooling it, the high temperature chamber includes a high temperature chamber box body and a high temperature chamber door provided on the high temperature chamber box body; the high temperature chamber door is swingably installed on the high temperature chamber box body; a first cooling chamber for accommodating the test object from the high temperature chamber and cooling it; a second cooling chamber for accommodating the test object from the first cooling chamber and cooling it, the second cooling chamber is arranged adjacent to the first cooling chamber; a low temperature chamber for accommodating the test object from the second cooling chamber and heating or cooling it, the low temperature chamber includes a low temperature chamber box body and a low temperature chamber door provided on the low temperature chamber box body; a first heating chamber for accommodating the test object from the low temperature chamber and heating it; a second heating chamber for accommodating the test object from the first heating chamber and heating it, the second heating chamber is arranged adjacent to the first heating chamber; and a control device for controlling the temperatures of the high temperature chamber, the first cooling chamber, the second cooling chamber, the low temperature chamber, the first heating chamber and the second heating chamber to change according to a set change curve; the refrigeration device is used to supply cold to the low temperature chamber, the second cooling chamber and the ice storage water tank; the cold storage and cold release circuit is used to store cold and supply cold to the subcooler, the first cooling chamber and the high temperature chamber; the ice storage water tank has an ice storage pipeline and a cold release pipeline for heat exchange with each other, the two ends of the ice storage pipeline are respectively an ice storage inlet and an ice storage outlet, and the two ends of the cold release pipeline are respectively a cold release inlet and a cold release outlet; the refrigeration device includes a compressor and a condenser connected in sequence, a low temperature chamber evaporator provided in the low temperature chamber box body, and a second cooling chamber evaporator for supplying cold to the second cooling chamber; the output end of the condenser is connected to the input end of the subcooler, and the output end of the subcooler is connected with a first refrigeration pipeline, a second refrigeration pipeline and a third refrigeration pipeline; a first solenoid valve and a first thermostatic expansion valve are provided on the first refrigeration pipeline, the end of the first refrigeration pipeline is connected to the input end of the low temperature chamber evaporator, and the output end of the low temperature chamber evaporator is connected to the input end of the compressor; a second solenoid valve and a second thermostatic expansion valve are provided on the second refrigeration pipeline, the end of the second refrigeration pipeline is connected to the input end of the second cooling chamber evaporator, and the output end of the second cooling chamber evaporator is connected to the input end of the compressor; a third solenoid valve and a third thermostatic expansion valve are provided on the third refrigeration pipeline, the end of the third refrigeration pipeline is connected to the ice storage inlet of the ice storage water tank, and the ice storage outlet of the ice storage water tank is connected to the input end of the compressor.

2. The high and low temperature test device according to claim 1, characterized in that, The high-temperature chamber further includes a high-temperature chamber fan for providing air flow inside the high-temperature chamber box body, a high-temperature chamber electric heater disposed inside the high-temperature chamber box body, and a high-temperature chamber temperature sensor for detecting the temperature of the high-temperature chamber box body; And / or, the first cooling chamber includes a first cooling chamber box body, a first cooling chamber fan for providing air flow inside the first cooling chamber box body, and a first cooling chamber temperature sensor for detecting the temperature of the first cooling chamber box body; And / or, the second cooling chamber includes a second cooling chamber box body, a second cooling chamber fan for providing air flow inside the second cooling chamber box body, and a second cooling chamber temperature sensor for detecting the temperature of the second cooling chamber box body; And / or, the low-temperature chamber further includes a low-temperature chamber fan for providing air flow inside the low-temperature chamber box body, a low-temperature chamber electric heater disposed inside the low-temperature chamber box body, and a low-temperature chamber temperature sensor for detecting the temperature of the low-temperature chamber box body; And / or, the first warming chamber includes a first warming chamber box body, a first warming chamber fan for providing air flow inside the first warming chamber box body, and a first warming chamber temperature sensor for detecting the temperature of the first warming chamber box body; And / or, the second warming chamber includes a second warming chamber box body, a second warming chamber fan for providing air flow inside the second warming chamber box body, a second warming chamber electric heater disposed inside the second warming chamber box body, and a second warming chamber temperature sensor for detecting the temperature of the second warming chamber box body.

3. The high and low temperature test device according to claim 1, characterized in that, The opening of the high-temperature chamber faces the entrance of the first cooling chamber, the outlet of the first cooling chamber is communicated with the entrance of the second cooling chamber, and the outlet of the second cooling chamber faces the opening of the low-temperature chamber; And / or, the opening of the low-temperature chamber faces the entrance of the first warming chamber, the outlet of the first warming chamber is communicated with the entrance of the second warming chamber, and the outlet of the second warming chamber faces the opening of the high-temperature chamber.

4. The high and low temperature test device according to any one of claims 1 to 3, characterized in that, At least one auxiliary cooling chamber is provided between the second cooling chamber and the low-temperature chamber, and the control device is further configured to control the temperature of the auxiliary cooling chamber to change according to a set change curve; And / or, at least one auxiliary warming chamber is provided between the second warming chamber and the high-temperature chamber, and the control device is further configured to control the temperature of the auxiliary warming chamber to change according to a set change curve.

5. The high and low temperature test device according to any one of claims 1 to 3, characterized in that, The high and low temperature test chamber further includes a driving mechanism for driving the test object to stay in the high-temperature chamber, the first cooling chamber, the second cooling chamber, the low-temperature chamber, the first warming chamber and the second warming chamber for their respective set times in sequence, and then return to the high-temperature chamber for cyclic movement.

6. The high and low temperature test device according to any one of claims 1 to 3, characterized in that, The subcooler has a first heat exchange pipeline and a subcooling pipeline that exchange heat with each other. The two ends of the subcooling pipeline are respectively a subcooling inlet and a subcooling outlet; The cold storage and cold release loop includes a cold release water pump connected to the cold release outlet of the ice storage tank, a first cooling chamber cold release device for cooling the first cooling chamber, and a high-temperature chamber cold release device for cooling the high-temperature chamber; the output end of the cold release water pump is connected with a first cold release pipeline, a second cold release pipeline and a third cold release pipeline; A fourth solenoid valve and a first flow regulating valve are arranged on the first cold release pipeline. The end of the first cold release pipeline is connected to the subcooling inlet of the subcooler, and the subcooling outlet of the subcooler is connected to the cold release inlet of the ice storage tank; A fifth solenoid valve and a second flow regulating valve are arranged on the second cold release pipeline. The end of the second cold release pipeline is connected to the input end of the first cooling chamber cold release device, and the output end of the first cooling chamber cold release device is connected to the cold release inlet of the ice storage tank; A sixth solenoid valve and a third flow regulating valve are arranged on the third cold release pipeline. The end of the third cold release pipeline is connected to the input end of the high-temperature chamber cold release device, and the output end of the high-temperature chamber cold release device is connected to the cold release inlet of the ice storage tank.

7. The high and low temperature test device according to any one of claims 1 to 3, characterized in that, A heat recovery device is connected between the compressor and the condenser; the high and low temperature test device further includes a heat recovery loop for recovering the exhaust heat of the compressor and heating the first warming chamber; The heat recovery device has a second heat exchange pipeline and a heat recovery pipeline that exchange heat with each other. The two ends of the heat recovery pipeline are respectively a heat recovery inlet and a heat recovery outlet; The heat recovery loop includes a hot water tank, a hot water release pump, a seventh solenoid valve, a fourth flow regulating valve and a heat release device connected in sequence. The heat release device is used to heat the first warming chamber. The output end of the heat release device is connected to the heat recovery inlet of the heat recovery device, and the heat recovery outlet of the heat recovery device is connected to the input end of the hot water tank.

8. The control method of the high and low temperature test device according to any one of claims 1 to 7, characterized in that, comprises the following steps: When the test object is in the high-temperature chamber, close the high-temperature chamber door and the low-temperature chamber door, and control the temperature of the high-temperature chamber to change according to the set high-temperature chamber temperature change curve within the set high-temperature chamber residence time; After the residence time of the test object in the high-temperature chamber reaches the set value, open the high-temperature chamber door, move the test object into the first cooling chamber, close the high-temperature chamber door, and control the temperature of the first cooling chamber to change according to the set temperature change curve within the set first cooling chamber residence time; After the residence time of the test object in the first cooling chamber reaches the set value, move the test object into the second cooling chamber, and control the temperature of the second cooling chamber to change according to the set temperature change curve within the set second cooling chamber residence time; After the residence time of the test object in the second cooling chamber reaches the set value, open the low-temperature chamber door, move the test object into the low-temperature chamber, close the low-temperature chamber door, and control the temperature of the low-temperature chamber to change according to the set low-temperature chamber temperature change curve within the set low-temperature chamber residence time; After the residence time of the test object in the low-temperature chamber reaches the set value, open the low-temperature chamber door, move the test object into the first warming chamber, close the low-temperature chamber door, and control the temperature of the first warming chamber to change according to the set temperature change curve within the set residence time of the first warming chamber; After the residence time of the test object in the closed first warming chamber reaches the set value, move the test object into the second warming chamber, and control the second warming chamber to change according to the set temperature change curve within the set residence time of the second warming chamber; After the residence time of the test object in the second warming chamber reaches the set value, open the high-temperature chamber door, move the test object into the high-temperature chamber, and close the high-temperature chamber door.

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