A dynamic card detection device and method

Abstract

The present invention relates to the technical field of dynamic card detection, and specifically discloses a dynamic card detection device and method. A dynamic card detection device, the device includes a box body, and a first mounting slot and a second mounting slot arranged on the box body, wherein a plurality of signal output boards are arranged in the first mounting slot, and a plurality of card adapter devices are arranged in the second mounting slot; the output end of the signal output board is electrically connected to the corresponding card adapter device; a sampling and control device is arranged in the box body, which is electrically connected to the signal output board and the card adapter device. The present invention can automatically perform dynamic test on the card, and the card test detection method is simple, convenient and easy to operate, avoiding the tediousness of previous manual operation and measurement and some human errors, and the technical requirements for operators are relatively low, which can greatly improve the reliability detection efficiency of instrumentation and control card parts in nuclear power plants.

Description

Technical Field

[0001] The present invention belongs to the technical field of dynamic card detection equipment, and in particular relates to a dynamic card detection device and method. Background Art

[0002] Safety, reliability and economy are the foundations for the survival and development of nuclear power plants. At present, when a shutdown occurs during the operation of important equipment in a nuclear power plant, it is not detected that the shutdown is caused by a card failure, and the card cannot be tested in advance; in response to this problem, the existing technical solutions have the following problems and shortcomings: first, the detection steps of the card by the detection device used are very cumbersome, requiring multiple devices, multiple detection processes, and manual operation; second, the detection device is fixed in a certain position, and the operator must go to the fixed detection device site to perform the card test operation; finally, the card detection process is complicated, which can easily lead to the user's operation error and fail to detect the state of the card. Summary of the invention

[0003] The object of the present invention is to provide a dynamic card detection device and method to solve the disadvantage of the complicated card detection process in the prior art.

[0004] The technical solution of the present invention is as follows: a dynamic card detection device, which includes a box body, and a first mounting slot and a second mounting slot arranged on the box body, wherein a plurality of signal output boards are arranged in the first mounting slot, and a plurality of card adapter devices are arranged in the second mounting slot; the output end of the signal output board is electrically connected to the corresponding card adapter device; a sampling and control device is arranged in the box body, which is electrically connected to the signal output board and the card adapter device.

[0005] An X86 box is also provided in the box body, and the X86 box is electrically connected to the card adapter device; the X86 box is externally connected to a network connector through a wire, and the network connector is simultaneously connected to the acquisition and control device, and a remote computer is connected to the output end of the network connector through a network data cable.

[0006] A fan is arranged on the inner wall of the box, and the fan is connected with the acquisition and control device through a wire.

[0007] A dehumidifier and a heater are arranged in the box, and the acquisition and control device is electrically connected to the dehumidifier and the heater respectively.

[0008] The output end of the acquisition and control device is respectively connected to a programmable DC power supply and a programmable resistor through wires, and the output ends of the programmable DC power supply and the programmable resistor are both electrically connected to the card adapter device through wires.

[0009] The operating voltage of the signal output board is 0-10 volts, and the operating current is 4-20 milliamperes.

[0010] The card adapter device includes a signal input and output terminal row and an intermediate circuit, and its signal transfer terminal matches the card interface distribution. The intermediate circuit includes a signal processing circuit for isolation, anti-attenuation, and grounding control board power supply to achieve seamless transfer of card signals to the acquisition and control device.

[0011] A dynamic card testing method, the method specifically comprises the following steps:

[0012] Step 1: Select different cards and complete the equipment system construction according to card copying, card simulation or fault diagnosis;

[0013] Step 2: Select the use case below and perform a no-load test of the use case;

[0014] Step 3: On the basis that the no-load test of the use case meets the requirements, a small power supply load test is performed;

[0015] Step 4: After passing the small power load test, conduct a card component test and record and save the experimental data.

[0016] In the step 1 described above, when performing the card copying experiment, different cards are selected to complete the specific steps of setting up the equipment system:

[0017] Step 1.1, select five different types of cards as the copy machine test objects, and wear anti-static gloves to check the appearance of the cards;

[0018] Step 1.2: Determine whether the card connection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality. If the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements.

[0019] Step 1.3: Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the baking machine experiment module, and select the card and slot.

[0020] The specific steps of performing the no-load test of the copy machine use case in step 2 are as follows:

[0021] Step 2.1, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately, otherwise proceed to the next step;

[0022] Step 2.2: Determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and you choose not to ignore it, stop the experiment immediately; otherwise, insert the card to be tested into the corresponding card slot and perform a small power load test.

[0023] The specific steps of performing the small power supply load test in step 3 are as follows:

[0024] Step 3.1: Under the condition of small power supply waiting for load, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately, otherwise proceed to the next step;

[0025] Step 3.2: Determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and you choose not to ignore it, stop the experiment immediately; otherwise, enter the card stress test or stress simulation test, or fault diagnosis test.

[0026] The specific steps of performing the card copying experiment or the card simulation experiment in step 4 are as follows:

[0027] Step 4.1, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately and record the abnormality; otherwise, go to the next step;

[0028] Step 4.2, determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and choose not to ignore, stop the experiment immediately, record the abnormality, and end the experiment; otherwise, record the input and output response signal of the card, end the experiment, and save the experimental data;

[0029] Step 4.3, generate an experimental record report and determine whether there is a warning. If there is no warning, remove the card and restore the experimental equipment; if there is a warning, enter the warning analysis submodule in the data analysis module and perform comparative analysis. At the same time, enter the diagnostic experiment module to perform a diagnostic experiment.

[0030] In the step 1, during the card simulation experiment, different card components are selected to complete the specific steps of building the equipment system:

[0031] Step 1.1. Wear anti-static gloves to check the appearance of the card to determine whether the card connection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality; if the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements;

[0032] Step 1.2: Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the simulation module, and select the card and slot;

[0033] Step 1.3, select and send the simulation case, which includes voltage fluctuation verification, current fluctuation verification, frequency fluctuation verification, temperature fluctuation verification and humidity fluctuation verification, and complete the verification.

[0034] In the step 1 described above, during the fault diagnosis experiment, different card parts are selected to complete the specific steps of setting up the equipment system:

[0035] Step 1.1. Wear anti-static gloves to check the appearance of the card to determine whether the card connection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality; if the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements;

[0036] Step 1.2: Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the simulation module, and select the card and slot;

[0037] Step 1.3, enter manual prediction, divide the possible scope of the fault, and select the use case below based on the judgment result. After the selection is completed, enter the diagnostic use case no-load test.

[0038] The use cases selected and sent in step 1.3 include voltage over-limit alarm, current over-limit alarm, frequency over-limit alarm, phase over-limit alarm and functional failure alarm.

[0039] The specific steps of performing the fault diagnosis experiment in step 4 are as follows:

[0040] Step 4.1, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately and record the abnormality; otherwise, go to the next step;

[0041] Step 4.2, determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and choose not to ignore, stop the experiment immediately, record the abnormality, and end the experiment; otherwise, record the input and output response signal of the card, end the experiment, save the experimental data, and generate an experimental record report;

[0042] Step 4.3, judge the correctness of the experimental conclusion in the experimental record report. If the experimental conclusion is normal, remove the card and restore the experimental equipment; if the experimental conclusion is abnormal, enter the data analysis module to match the case and find the cause of the fault. If there is a matching case, obtain the fault diagnosis conclusion, generate a fault diagnosis report, remove the card, and restore the experimental equipment; if there is no matching case, start the expert diagnosis, and obtain the fault diagnosis conclusion based on the expert diagnosis results, and record it in the case library.

[0043] The significant effect of the present invention is that the present invention can automatically perform dynamic tests on card components, the card component test detection method is simple, convenient and easy to operate, avoiding the tediousness of previous manual operation and measurement and some human errors, and the technical requirements for operators are relatively low, which can greatly improve the reliability detection efficiency of nuclear power plant instrumentation and control card components. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 This is a structural schematic diagram of a dynamic card detection device proposed by the present invention;

[0045] Figure 2 A partial cross-sectional view of a dynamic card detection device proposed by the present invention;

[0046] Figure 3 This is a system block diagram of a dynamic card detection device proposed by the present invention;

[0047] Figure 4 A flow chart of a dynamic baking test in a dynamic card detection method proposed by the present invention;

[0048] Figure 5 A flow chart of a dynamic simulation experiment in a dynamic card detection method proposed by the present invention;

[0049] Figure 6 A flow chart of dynamic fault diagnosis in a dynamic card detection method proposed by the present invention;

[0050] In the figure: 1. Box body; 2. Pulley seat; 3. Pulley; 4. First installation slot; 5. Signal output board; 6. Second installation slot; 7. Card adapter device; 8. Acquisition and control device; 9. Fan; 10. Dehumidifier; 11. Heater; 12. X86 box; 13. Box cover. DETAILED DESCRIPTION

[0051] The present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0052] like Figures 1 to 3 As shown, a dynamic card detection device includes a box body 1, the outer side of the box body 1 is rotatably connected to a box cover 13 through a hinge, the bottom of the box body 1 is rotatably connected to a pulley seat 2 through a rotating shaft, and the inner side of the pulley seat 2 is rotatably connected to a pulley 3 through a pin shaft. The design of the pulley 3 can meet any site, making the experimental operation more flexible and convenient.

[0053] A first mounting slot 4 is provided at the top of the box body 1, and a plurality of signal output boards 5 are connected in the first mounting slot 4. The working voltage of the signal output board 5 is 0-10 volts, and the working current is 4-20 mA; the signal output board 5 is used to provide the input electrical signal of the card during the test; a second mounting slot 6 is provided on one side of the first mounting slot 4, and a plurality of card adapter devices 7 are connected in the second mounting slot 6. The card adapter device 7 includes a signal input and output terminal row and an intermediate circuit. The signal transfer terminal is designed according to the distribution characteristics of the card interface, and the signal processing circuit for isolation, anti-attenuation, grounding and power supply in the control board is designed according to the type and range of the card signal, so as to realize seamless transfer of the card signal to the acquisition and control device.

[0054] The output end of the signal output board 5 is electrically connected to the corresponding card adapter 7 through a wire. A sampling and control device 8 is fixedly installed in the box 1. The signal output board 5 and the card adapter 7 are electrically connected to the sampling and control device 8 through wires; the sampling and control device 8 realizes direct format conversion between software communication messages and hardware response signals by adopting a design method that combines centralized and distributed methods, and realizes the control of the test signal channel and the collection of test signals.

[0055] An X86 box 12 is provided on one side of the acquisition and control device 8. The X86 box 12 is fixedly installed in the box body 1. The X86 box 12 is electrically connected to the card adapter device 7 through a wire. A fan 9 is fixedly installed on the inner wall of the box body 1. The fan 9 is electrically connected to the acquisition and control device 8 through a wire. A dehumidifier 10 is fixedly installed inside the box body 1. The dehumidifier 10 is electrically connected to the acquisition and control device 8 through a wire. A heater 11 is provided on one side of the dehumidifier 10. The heater 11 is fixedly installed in the box body 1. The heater 11 is electrically connected to the acquisition and control device 8 through a wire. The output end of the acquisition and control device 8 is respectively connected to a programmable DC power supply and a programmable resistor through a wire. The output ends of the programmable DC power supply and the programmable resistor are electrically connected to the card adapter device 7 through a wire. The programmable resistor mainly acts according to the requirements of the acquisition and control device and sends out the required test electrical signal. The signal enters the card adapter through the channel controlled by the acquisition and control device to control the action of the relay array and perform corresponding test experiments. The signal output board is used to provide input electrical signals of the card during the test.

[0056] The acquisition and control device 8 is externally connected to a network connector through a wire, the network connector is connected to the X86 box 12 through a network data cable, and the output end of the network connector is connected to a remote computer through a network data cable; the present invention realizes a dynamic closed-loop test function for card components, including dynamic baking test, dynamic simulation test and dynamic fault diagnosis, and the device for dynamically detecting card components can automatically perform dynamic tests on the card components. The card component test detection method is simple, convenient and easy to operate, avoiding the tediousness of previous manual operation and measurement and some human errors, and the technical requirements for operators are relatively low, which can greatly improve the reliability detection efficiency of instrumentation and control card components in nuclear power plants.

[0057] Reference Figure 4-6 , a dynamic card detection method, comprising the following steps;

[0058] Step 1: Dynamic baking test. The specific implementation steps are as follows:

[0059] A. Select five different types of cards as experimental objects, and wear anti-static gloves to inspect the appearance of the cards;

[0060] B. Determine whether the card connection under inspection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality; if the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements;

[0061] C. Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the baking machine experiment module, and select the card and card slot;

[0062] D. Enter the no-load test of the baking machine use case to determine whether the typical value of the input and output reaches the trip value; if it has reached the trip value, stop the experiment immediately; if it has not reached the trip value, continue the experiment and determine whether the typical value of the input and output reaches the warning value; if it has reached the warning value, the system will prompt whether to ignore it; if it is ignored, continue to insert the card to be tested into the corresponding card slot; if it is not ignored, the system will stop the experiment; if the typical value of the input and output does not reach the warning value, continue to insert the card to be tested into the corresponding card slot and continue the small power supply load test;

[0063] E. During the small power supply load test, the system will determine whether the typical value of the input and output reaches the trip value. If it has reached the trip value, the experiment will be stopped immediately. If it has not reached the trip value, the experiment will continue and determine whether the typical value of the input and output reaches the warning value. If it has reached the warning value, the system will prompt whether to ignore it. If you choose to ignore it, the card baking experiment will begin. If you choose not to ignore it, the experiment will be stopped. If it has not reached the warning value, the card baking experiment will continue.

[0064] F. In the card baking experiment, the system will determine whether the typical value of input and output reaches the trip value. If it has reached the trip value, the experiment will be stopped immediately. If it has not reached the trip value, the experiment will continue and determine whether the typical value of input and output reaches the warning value. If it has reached the warning value, the system will prompt whether to ignore it. If you choose to ignore it, the card input and output response signal will be recorded. If you choose not to ignore it, the experiment will be stopped. If the warning value has not been reached, the card input and output response signal will be directly recorded and the experimental data will be saved.

[0065] G. Generate a custom experiment record report and determine whether there is an alarm in the system. If an alarm occurs, enter the data analysis module for comparative analysis and enter the diagnostic experiment module for diagnostic experiments; if there is no alarm, remove the card and restore the experimental equipment;

[0066] Step 2: Dynamic simulation experiment, the specific implementation steps are as follows:

[0067] a. Wear anti-static gloves to check the appearance of the card. If the card is unqualified, stop the experiment and record the abnormality; if the card is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements;

[0068] b. Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the simulation module, and select the card and slot;

[0069] c. Use case selection and delivery, including voltage fluctuation verification, current fluctuation verification, frequency fluctuation verification, temperature fluctuation verification and humidity fluctuation verification. After the verification is completed, the simulation use case no-load test is started;

[0070] d. During the no-load test of the simulation case, the system determines whether the typical value of the input and output reaches the trip value; if it has reached the trip value, the experiment is stopped immediately; if it has not reached the trip value, the experiment is continued, and it is determined whether the typical value of the input and output reaches the warning value; if it has reached the warning value, the system will prompt whether to ignore it; if it is ignored, the card to be tested will continue to be inserted into the corresponding card slot; if it is not ignored, the system will stop the experiment; if the typical value of the input and output does not reach the warning value, the card to be tested will continue to be inserted into the corresponding card slot, and the small power supply load test will continue;

[0071] e. During the small power supply load test, the system will determine whether the typical value of the input and output reaches the trip value. If it has reached the trip value, the experiment will be stopped immediately. If it has not reached the trip value, the experiment will continue and determine whether the typical value of the input and output reaches the warning value. If it has reached the warning value, the system will prompt whether to ignore it. If you choose to ignore it, the card simulation experiment will be entered. If you choose not to ignore it, the experiment will be stopped. If it has not reached the warning value, the card simulation experiment will continue.

[0072] f. During the card simulation experiment, the system will determine whether the typical value of the input and output reaches the trip value. If it has reached the trip value, the experiment will be stopped immediately. If it has not reached the trip value, the experiment will continue and determine whether the typical value of the input and output reaches the warning value. If it has reached the warning value, the system will prompt whether to ignore it. If you choose to ignore it, the card input and output response signal will be recorded. If you choose not to ignore it, the experiment will be stopped. If the warning value has not been reached, the card input and output response signal will be directly recorded and the experimental data will be saved.

[0073] g. Generate a custom experiment record report and determine whether there is an alarm in the system. If an alarm occurs, enter the data analysis module for comparative analysis and enter the diagnostic experiment module for diagnostic experiments; if there is no alarm, remove the card and restore the experimental equipment;

[0074] Step 3: Dynamic fault diagnosis. The specific implementation steps are as follows:

[0075] S1. Wear anti-static gloves to check the appearance of the card. If the card is unqualified, stop the experiment and record the abnormality; if the card is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements;

[0076] S2. Turn on the power switch to ensure that all devices start normally and the communication is reliable. Then start the system, enter the diagnostic experiment module, and select the card and card slot;

[0077] S3, enter manual pre-judgment, divide the possible scope of faults, and select use cases to send based on the judgment results, including voltage over-limit alarm, current over-limit alarm, frequency over-limit alarm, phase over-limit alarm and functional failure alarm. After the selection is completed, enter the diagnostic use case no-load test;

[0078] S4. During the no-load test of the diagnostic use case, the system determines whether the typical value of the input and output reaches the trip value; if it has reached the trip value, the experiment is stopped immediately; if it has not reached the trip value, the experiment is continued, and it is determined whether the typical value of the input and output reaches the warning value; if it has reached the warning value, the system will prompt whether to ignore it; if it is ignored, the card to be tested will continue to be inserted into the corresponding card slot; if it is not ignored, the system will stop the experiment; if the typical value of the input and output does not reach the warning value, the card to be tested will continue to be inserted into the corresponding card slot, and the small power supply load test will continue;

[0079] S5. During the small power supply load test, the system will determine whether the typical value of the input and output reaches the trip value. If it has reached the trip value, the experiment will be stopped immediately. If it has not reached the trip value, the experiment will continue and determine whether the typical value of the input and output reaches the warning value. If it has reached the warning value, the system will prompt whether to ignore it. If you choose to ignore it, the diagnostic experiment will be started. If you choose not to ignore it, the experiment will be stopped. If it has not reached the warning value, the diagnostic experiment will continue.

[0080] S6. Generate a custom experiment record report. The system determines whether the experimental conclusion is normal. If not, enter the data analysis module to match cases and find the cause of the fault. If there is no matching case, start the expert diagnosis, record the expert diagnosis results in the case library, draw a fault diagnosis conclusion, generate a fault diagnosis report, and finally, remove the card and restore the experimental equipment. If the experimental conclusion is normal, directly remove the card and restore the experimental equipment.

[0081] In the dynamic baking test, 5 types of card components are used as test objects to simulate the normal energized working state of the test objects, and adjustable ambient temperature and humidity, analog input signals, switch input signals, etc. are provided. At the same time, the input and output signals and the working state of the test objects are continuously monitored and functionally tested to realize the baking and testing functions of the card components. At the same time, the changing trends of various types of information of the card components in the baking test can be monitored in real time through the remote computer website and displayed in the form of a waveform graph.

[0082] In the dynamic simulation test, the operation of the card under the variable working conditions at the actual work site is simulated, and the reliability and anti-interference ability of the card or device are tested by real-time monitoring of the card output pins and the response signals of sensitive components.

[0083] In the dynamic fault diagnosis experiment, the system fault signal excitation is simulated to detect whether the card function is normal, and the suspected faulty card is tested online. By comparing the card pins and the output waveform of sensitive components with the standard cases in the system case library, it is possible to determine whether the card is faulty and the cause of the fault.

Claims

1. A method for testing a dynamic card using a dynamic card detection device, the method specifically comprising the following steps: Step 1: Select different cards, and complete the equipment system construction according to card copying, card simulation or fault diagnosis; The device comprises a box body (1), and a first mounting groove (4) and a second mounting groove (6) arranged on the box body (1), wherein: A plurality of signal output boards (5) are arranged in the first installation slot (4), and a plurality of card adapter devices (7) are arranged in the second installation slot; the output end of the signal output board (5) is electrically connected to the corresponding card adapter device (7); a collection and control device (8) is arranged in the box (1), and is electrically connected to both the signal output board (5) and the card adapter device (7); an X86 box (12) is also arranged in the box (1), and the X86 box (12) is electrically connected to the card adapter device (7); the X86 box (12) is externally connected to a network connector through a wire, and the network connector is simultaneously connected to the collection and control device (8), and a remote computer is connected to the output end of the network connector through a network data cable; Step 1.1, select five different types of cards as the test objects, and wear anti-static gloves to check the appearance of the cards; Step 1.2: Determine whether the card connection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality. If the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements. Step 1.3, turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the baking machine experiment module, and select the card and slot; Step 2: Select the use case below and perform a no-load test of the use case; Step 2.1, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately, otherwise proceed to the next step; Step 2.2, determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and you choose not to ignore it, stop the experiment immediately; otherwise, insert the card to be tested into the corresponding card slot and perform a small power supply load test; Step 3: On the basis that the no-load test of the use case meets the requirements, a small power supply load test is performed; Step 3.1: Under the condition of small power supply with load, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately, otherwise proceed to the next step; Step 3.2, determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and you choose not to ignore it, stop the experiment immediately; otherwise, enter the card copy machine experiment or copy machine simulation experiment, or fault diagnosis experiment; Step 4: After passing the small power supply load test, conduct a card component test, and record and save the experimental data; Step 4.1, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately and record the abnormality; otherwise, go to the next step; Step 4.2: Determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and it is not ignored, the experiment is stopped immediately, and the abnormality is recorded and the experiment is ended; otherwise, the input and output response signals of the card are recorded, the experiment is ended, and the experimental data is saved; Step 4.3, generate an experimental record report and determine whether there is a warning. If there is no warning, remove the card and restore the experimental equipment; if there is a warning, enter the warning analysis submodule in the data analysis module and perform comparative analysis. At the same time, enter the diagnostic experiment module to perform a diagnostic experiment.

2. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: A fan (9) is provided on the inner wall of the box body (1), and the fan (9) is connected to the acquisition and control device (8) via a wire.

3. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: A dehumidifier (10) and a heater (11) are arranged in the box body (1), and the control device (8) is electrically connected to the dehumidifier (10) and the heater (11), respectively.

4. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: The output end of the acquisition and control device (8) is respectively connected to a programmable DC power supply and a programmable resistor via wires, and the output ends of the programmable DC power supply and the programmable resistor are both electrically connected to the card adapter device (7) via wires.

5. The method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: The operating voltage of the signal output board (5) is 0-10 volts, and the operating current is 4-20 milliamperes.

6. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: The card adapter device (7) comprises a signal input and output terminal block and an intermediate circuit, wherein the signal transfer terminal matches the card interface distribution, and the intermediate circuit comprises a signal processing circuit for isolating, preventing attenuation, and grounding the power supply inside the control board, thereby realizing seamless transfer of the card signal to the acquisition and control device.

7. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: In the step 1, during the card simulation experiment, different card components are selected to complete the specific steps of building the equipment system: Step 1.

1. Wear anti-static gloves to check the appearance of the card to determine whether the card connection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality; if the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements; Step 1.2: Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the simulation module, and select the card and slot; Step 1.3, select and send the simulation case, which includes voltage fluctuation verification, current fluctuation verification, frequency fluctuation verification, temperature fluctuation verification and humidity fluctuation verification, and complete the verification.

8. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: In the step 1 described above, during the fault diagnosis experiment, different card parts are selected to complete the specific steps of setting up the equipment system: Step 1.

1. Wear anti-static gloves to check the appearance of the card to determine whether the card connection is qualified. If the card connection is unqualified, stop the experiment and record the abnormality; if the card connection is qualified, complete the AC adjustable power supply wiring according to the experimental wiring requirements; Step 1.2: Turn on the power switch, ensure that all devices start normally and the communication is reliable, then start the system, enter the simulation module, and select the card and slot; Step 1.3, enter manual prediction, divide the possible scope of the fault, and select the use case below based on the judgment result. After the selection is completed, enter the diagnostic use case no-load test.

9. A method for performing dynamic card testing using a dynamic card detection device according to claim 8, characterized in that: The use cases selected and sent in step 1.3 include voltage over-limit alarm, current over-limit alarm, frequency over-limit alarm, phase over-limit alarm and functional failure alarm.

10. A method for performing dynamic card testing using a dynamic card detection device according to claim 1, characterized in that: The specific steps of performing the fault diagnosis experiment in step 4 are as follows: Step 4.1, determine whether the typical value of input and output reaches the trip value. If it reaches the trip value, stop the experiment immediately and record the abnormality; otherwise, go to the next step; Step 4.2, determine whether the typical value of input and output reaches the warning value. If it reaches the warning value and it is not ignored, the experiment is stopped immediately, and the abnormality is recorded and the experiment is ended; otherwise, the input and output response signals of the card are recorded, the experiment is ended, the experimental data is saved, and an experimental record report is generated; Step 4.3, judge the correctness of the experimental conclusion in the experimental record report. If the experimental conclusion is normal, remove the card and restore the experimental equipment; if the experimental conclusion is abnormal, enter the data analysis module to match the case and find the cause of the fault. If there is a matching case, obtain the fault diagnosis conclusion, generate a fault diagnosis report, remove the card, and restore the experimental equipment; if there is no matching case, start the expert diagnosis, and obtain the fault diagnosis conclusion based on the expert diagnosis results, and record it in the case library.

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