A multi-position sample holder adapted for the X / Y axis sample stage of an X-ray diffractometer

Abstract

The present invention relates to a multi-position sample rack adapted to an X / Y axis sample stage of an X-ray diffractometer, comprising a sample tray and a transfer tray, wherein a plurality of through holes are arranged in an array on the sample tray; the sample tray is detachably arranged on the upper surface of the transfer tray, and the transfer tray is detachably connected to the X / Y axis sample stage of the X-ray diffractometer; the multi-position sample rack adapted to the X / Y axis sample stage of the X-ray diffractometer of the present invention, the through-hole penetrating structure can realize reverse loading sample preparation; the protruding step ring can fix the sample carrier on the one hand, and can also further avoid mutual contamination of powders when filling the samples to be tested as a partition on the other hand; the sub-sample tray and the sample tray can cooperate to produce the structural effect of the protruding step ring, which is convenient for processing.

Description

Technical Field

[0001] The invention belongs to the field of multi-position sample racks of X-ray diffractometers, and in particular relates to a multi-position sample rack adapted to an X / Y axis sample stage of an X-ray diffractometer. Background Art

[0002] The application of X-ray diffractometers is increasing, which increases the workload of the testing center laboratories. The huge number of sample tests increases the workload of the testing staff. The commonly used method is to purchase a multi-position injector, but the price of a multi-position injector is relatively high. Since the multi-position injector has its own sample placement drive structure, the operation of its drive structure may touch and endanger the components inside the X-ray diffractometer during the operation of the multi-position injector.

[0003] Currently, X-ray diffractometers are often equipped with an X / Y axis sample stage, which can move freely in two directions, and the movement trajectory of the X / Y axis sample stage can be edited. Summary of the invention

[0004] The purpose of the present invention is to overcome the technical problems existing in the above-mentioned background technology and provide a multi-position sample holder adapted to the X / Y axis sample stage of an X-ray diffractometer.

[0005] In order to achieve the above technical purpose, the present invention adopts the following technical solution:

[0006] A multi-position sample rack adapted to the X / Y axis sample stage of an X-ray diffractometer comprises a sample tray and a transfer tray, wherein a plurality of through holes are arranged in an array on the sample tray; the through-hole structure can realize reverse loading and sample preparation. The sample tray is detachably arranged on the upper surface of the transfer tray, and the transfer tray is detachably connected to the X / Y axis sample stage of the X-ray diffractometer.

[0007] There are two main sample preparation processes for X-ray diffractometer test samples: normal sample preparation and reverse sample preparation. In the normal sample preparation process, the sample tray is placed on the transfer plate, and then the samples to be tested are sequentially filled into each through hole. In the reverse sample preparation process, the sample tray is first placed on the transfer plate, and then the samples to be tested are sequentially filled into each through hole, and then the transfer plate is buckled, and finally the transfer plate and the transfer plate are flipped up and down by hand so that the sample tray is located on the upper surface of the transfer plate.

[0008] After the sample is prepared, the adapter plate holding the sample plate is connected and fixed to the X / Y axis sample stage of the X-ray diffractometer. Through the movement of the X / Y axis sample stage, the arrayed through holes are sequentially moved into the test position.

[0009] In the present multi-position sample rack, the advantage of being able to perform reverse loading sample preparation operation is that, even if slight powder contamination occurs during the process of filling each through hole with the sample to be tested, the sample tray will be flipped in the last step of reverse loading sample preparation, so that the upper surface during the process of filling the sample to be tested becomes the lower surface during the test process, thereby not affecting the test results.

[0010] Preferably, a protruding step ring is provided at the middle position of the inner wall of the through hole. In the reverse sample preparation process, the sample disc is first placed on the transfer plate, and then the samples to be tested are sequentially filled into each through hole, a quartz sample slide is pressed on, and then the transfer plate is buckled, and finally the transfer plate and the transfer plate are turned upside down by hand, so that the sample disc is located on the upper surface of the transfer plate. The transfer plate is preferably made of a soft material plate to ensure the sealing between the sample disc and the transfer plate.

[0011] The sample carrier is placed on the protruding step ring, and the surface of the sample carrier is flush with the sample plate. The pressed sample carrier can prevent powder from contaminating each through hole when the sample to be tested is filled. The protruding step ring can fix the sample carrier on the one hand, and on the other hand, it can also act as a partition to further prevent powder from contaminating each through hole when the sample to be tested is filled.

[0012] Optionally, the sample tray is rectangular, and the upper surface of the adapter tray is provided with a rectangular groove matching the sample tray. The rectangular sample tray allows the sample tray to be installed on the adapter tray without the problem of incorrect angle.

[0013] Optionally, the through hole is a circular hole, which is easy to process.

[0014] Preferably, the sample tray is printed with numbers for the through holes, and the numbers facilitate the sequential recording of the samples to be tested.

[0015] Optionally, the multi-position sample rack also includes a sub-sample tray, on which a plurality of small-sized through holes having shapes consistent with the through holes are arranged in an array; the arrangement positions of the small-sized through holes correspond to the arrangement positions of the through holes on the sample tray, and the area of ​​the small-sized through holes is 0.7-0.9 times smaller than the through holes.

[0016] During the reverse loading sample preparation process, the sub-sample tray is first placed on the transfer plate, and the sample tray is covered on the upper surface of the sub-sample tray. Then, the samples to be tested are respectively loaded into the cavities formed by each through hole and the small-sized through hole, and a quartz sample slide is pressed into the through hole. Then, the adapter tray is buckled, and finally, the transfer plate and the adapter tray are turned upside down by hand so that the sub-sample tray is at the top and the sample tray is located below the sub-sample tray.

[0017] Since the material of the X-ray diffractometer sample plate is quartz, it is very difficult to process the protruding step ring. Using a sub-sample plate in conjunction with the sample plate can produce a structural effect of a protruding step ring, which is easy to process.

[0018] The multi-position sample rack adapted to the X / Y axis sample stage of an X-ray diffractometer provided by the present invention has a through-hole structure capable of realizing reverse loading sample preparation; the protruding step ring fixes the sample carrier on the one hand, and on the other hand, can further prevent powder from contaminating each other when filling the samples to be tested as a partition; the sub-sample tray and the sample tray cooperate to produce a structural effect of the protruding step ring, which is easy to process. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a schematic diagram of the cooperation between the sample plate and the transfer plate in Example 1 of the present invention;

[0020] Figure 2 This is a schematic diagram of a transfer plate according to Embodiment 1 of the present invention;

[0021] Figure 3 This is a schematic diagram of a sample tray according to Example 1 of the present invention;

[0022] Figure 4 This is a schematic diagram of the sample flipping process of Example 1 of the present invention;

[0023] Figure 5 This is a schematic diagram of a sample tray in Example 2 of the present invention;

[0024] Figure 6 It is a partial longitudinal section schematic diagram of the flip-chip sample process of Example 2 of the present invention;

[0025] Figure 7 This is a schematic diagram of a sample tray and a sub-sample tray according to Example 3 of the present invention;

[0026] Figure 8 This is a schematic diagram of matching the sample tray and the sub-sample tray in Example 3 of the present invention;

[0027] Fig. 9 This is a schematic diagram of matching the sample tray, sub-sample tray and transfer tray in Example 3 of the present invention;

[0028] Fig.10 This is a schematic diagram of the sample flipping process of Example 3 of the present invention;

[0029] Fig.11 It is a partial longitudinal section schematic diagram of the flip-chip sample process of Example 3 of the present invention;

[0030] Reference numerals: sample plate (1), through hole (11), protruding step ring (111), adapter plate (2), sub-sample plate (3), small-sized through hole (31), transfer plate (4), sample carrier (5). DETAILED DESCRIPTION

[0031] The technical solution of the present invention is described in detail below with reference to the accompanying drawings and specific embodiments.

[0032] Example 1

[0033] like Figure 1-4 As shown, a multi-position sample rack adapted to the X / Y axis sample stage of an X-ray diffractometer comprises a sample tray 1 and a transfer tray 2. The sample tray 1 is provided with 21 through holes 11 arranged in an array; the through structure of the through holes 11 can realize reverse loading and sample preparation. The sample tray 1 is detachably arranged on the upper surface of the transfer tray 2, and the transfer tray 2 is detachably connected to the X / Y axis sample stage of the X-ray diffractometer.

[0034] There are two main sample preparation processes for X-ray diffractometer test samples: positive sample preparation and reverse sample preparation. Figure 1 As shown, during the sample preparation process, the sample tray 1 is placed on the transfer tray 2, and then the samples to be tested are sequentially filled into each through hole 11. Figure 4 As shown, during the reverse sample preparation process, the sample tray 1 is first placed on the transfer plate 4, and then the samples to be tested are sequentially filled into the through holes 11, and then the adapter tray 2 is buckled on, and finally the transfer plate 4 and the adapter tray 2 are turned upside down by hand so that the sample tray 1 is located on the upper surface of the adapter tray 2.

[0035] After the sample preparation is completed, the adapter plate 2 holding the sample plate 1 is connected and fixed to the X / Y axis sample stage of the X-ray diffractometer. Through the movement of the X / Y axis sample stage, the arrayed through holes 11 are sequentially moved into the test positions.

[0036] In the present multi-position sample rack, the advantage of being able to perform reverse loading sample preparation operation is that, even if slight powder contamination occurs during the process of filling each through hole 11 with the sample to be tested, the sample tray 1 will be flipped over in the last step of reverse loading sample preparation, so that the upper surface during the process of filling the sample to be tested becomes the lower surface during the test process, thereby not affecting the test results.

[0037] The through hole 11 is a round hole, and the round through hole 11 is easy to process.

[0038] The sample tray 1 is printed with numbers for the through holes 11, which facilitate the sequential recording of the samples to be tested.

[0039] Example 2

[0040] like Figure 5-6 As shown, the difference between Example 2 and Example 1 is that a protruding step ring 111 is provided at the middle position of the inner wall of the through hole 11. In the reverse sample preparation process, the sample disc 1 is first placed on the transfer plate 4, and then the samples to be tested are sequentially filled into each through hole 11, and then a quartz sample slide 5 is pressed on, and then the transfer plate 2 is buckled, and finally the transfer plate 4 and the transfer plate 2 are turned upside down by hand, so that the sample disc 1 is located on the upper surface of the transfer plate 2. The transfer plate 4 is preferably made of a soft material plate to ensure the sealing between the sample disc 1 and the transfer plate 4.

[0041] Among them, Figure 6As shown, the sample carrier 5 is placed on the protruding step ring 111, and the surface of the sample carrier 5 is flush with the sample tray 1. The pressed sample carrier 5 can prevent powder from being contaminated when filling the through holes 11 with the samples to be tested. The protruding step ring 111 can fix the sample carrier 5 on the one hand, and on the other hand, it can also serve as a partition to further prevent powder from being contaminated when filling the samples to be tested.

[0042] Example 3

[0043] like Figure 7-11 As shown, the difference between Example 3 and Example 1 is that the multi-position sample rack further includes a sub-sample tray 3, on which 21 small-sized through holes 31 having the same shape as the through holes 11 are arranged in an array; the arrangement positions of the small-sized through holes 31 correspond to the arrangement positions of the through holes 11 on the sample tray 1, and the area of ​​the small-sized through holes 31 is 0.81 times smaller than the through holes 11. At this time, the diameter of the small-sized through holes 31 is 0.9 times the diameter of the through holes 11.

[0044] like Figure 10-11 As shown, during the reverse sample preparation process, the sub-sample tray 3 is first placed on the transfer plate 4, and the sample tray 1 is covered on the upper surface of the sub-sample tray 3. Then, after the samples to be tested are respectively loaded into the cavities formed by the through holes 11 and the small-sized through holes 31, a quartz sample slide 5 is pressed into the through holes 11, and then the adapter tray 2 is buckled. Finally, the transfer plate 4 and the adapter tray 2 are held and turned upside down so that the sub-sample tray 3 is at the top and the sample tray 1 is located below the sub-sample tray 3.

[0045] Since the material of the X-ray diffractometer sample tray 1 is quartz, it is quite difficult to process the protruding step ring 111 in Example 2. Using the sub-sample tray 3 in conjunction with the sample tray 1 can produce the structural effect of the protruding step ring 111, which is easy to process.

[0046] The words "first", "second" and similar words used in the specification and claims do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "one", "an" or "the" do not indicate a quantitative limitation, but rather indicate the presence of at least one. Words such as "include" or "comprise" and similar words mean that the elements or objects appearing before "include" or "comprises" include the elements or objects listed after "include" or "comprises" and their equivalents, and do not exclude other elements or objects. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0047] The embodiment is only a single implementation method of the present invention. For ordinary technicians in this field, other embodiments can be obtained according to the drawings without creative work, which are also within the protection scope of the present invention.

Claims

1. A multi-position sample holder adapted for an X-ray diffractometer X / Y-axis sample stage, characterized in that: It includes a sample plate and a transfer plate, wherein a plurality of through holes are arranged in an array on the sample plate; the sample plate is detachably arranged on the upper surface of the transfer plate, and the transfer plate is detachably connected to the X / Y axis sample stage of the X-ray diffractometer; It also includes a sub-sample plate, on which a plurality of small-sized through holes having the same shape as the through holes are arranged in an array; the arrangement positions of the small-sized through holes on the sub-sample plate correspond to the arrangement positions of the through holes on the sample plate, and the area of ​​the small-sized through holes is 0.7-0.9 times that of the through holes; The sub-sample tray cooperates with the sample tray to produce a protruding step circle; A sample carrier is detachably provided corresponding to the protruding step ring, wherein when the sample carrier is combined with the protruding step ring, the surface of the sample carrier is flush with the sample tray; Among them, in the reverse loading sample preparation process, the sub-sample tray is first placed on the transfer plate, and the sample tray is covered on the upper surface of the sub-sample tray. Then, the samples to be tested are respectively loaded into the cavities formed by the through holes and the small-sized through holes, and then the sample carrier is pressed into the through holes, and then the adapter tray is buckled. Finally, the transfer plate and the adapter tray are held and turned upside down so that the sub-sample tray is at the top and the sample tray is located below the sub-sample tray.

2. The multi-position sample holder adapted for the X / Y axis sample stage of an X-ray diffractometer according to claim 1, characterized in that: The sample tray is rectangular, and the upper surface of the adapter tray is provided with a rectangular groove matching the sample tray.

3. The multi-position sample holder adapted for the X / Y axis sample stage of an X-ray diffractometer according to claim 1, characterized in that: The through hole is a round hole.

4. The multi-position sample holder adapted for the X / Y axis sample stage of an X-ray diffractometer according to claim 1, characterized in that: The sample disc is printed with labels for the through holes.

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