A test machine and a chip test method

Abstract

The present application provides a test machine and a chip testing method, which relate to the field of chip testing technology. The test machine includes: a machine housing; a PCB board arranged inside the machine housing; a light source device fixedly installed inside the machine housing, the installation direction of the light source device is at a first preset angle with the first surface of the machine housing; the first surface is a light emitting surface, and a light outlet is arranged on the light emitting surface, and the light emitted by the light source device is transmitted from the light outlet. The test machine provided by the present application integrates the light source device required for the test, with high integration, and because a space for the light source structure is specially reserved in the machine, the light source itself can be made larger, which is conducive to placing a light source with better light quality in the machine. Compared with the external small light source in the prior art, the quality of the optical signal is improved, and at the same time, it can also reduce the test time and improve the test efficiency.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and more specifically, to a testing machine and a chip testing method. Background Art

[0002] CIS (CMOS Image Sensor) chip is a key component of the camera. CIS chip converts light signals into digital electrical signals to capture image information. As the core chip of camera products, it determines the imaging quality of the camera. Testing of CIS chips is an important part of CIS chip production. The existing test machine for testing CIS chips generally uses an external light source, which is placed in a space of less than 10 cm between the PCB board and the machine. Due to this limitation, the external light source used is usually small and short, and the light diameter is also small, which will directly lead to problems such as poor signal quality of the light source and poor uniformity of the light source, and it is impossible to effectively test high-pixel CIS chips. Summary of the invention

[0003] The purpose of the embodiments of the present application is to provide a testing machine and a chip testing method to improve the problem of poor light source signal quality in the prior art.

[0004] In a first aspect, an embodiment of the present application provides a test machine, including:

[0005] Machine housing;

[0006] A PCB board disposed inside the machine housing;

[0007] A light source device is fixedly installed inside the machine housing, and the installation direction of the light source device forms a first preset angle with the first surface of the machine housing; the first surface is a light emitting surface, and a light outlet is provided on the light emitting surface, and the light emitted by the light source device is transmitted through the light outlet.

[0008] In the above technical solution, the light source device required for the test is integrated in the test machine, with high integration. Since the space for the light source structure is reserved in the machine, the light source itself can be made larger, which is conducive to placing a light source with better light quality in the machine. Compared with the small external light source in the prior art, the quality of the optical signal is improved. At the same time, a larger light source will bring a larger output light spot area, which increases the number of chips that can be tested at a single time, effectively reducing the test time and improving the test efficiency.

[0009] In a possible implementation, a slot is further provided inside the machine housing, wherein an extension direction of the slot body forms a second preset angle with the first surface of the machine housing, and the slot is used to plug in the PCB board. In the above technical solution, a slot is provided inside the test machine to facilitate flexible installation of the PCB board.

[0010] In a possible embodiment, the slot includes a first slot and a second slot, the first slot and the second slot are respectively fixedly installed on both sides of the light source device, and a first fixing member and a second fixing member are also provided inside the machine housing, the first fixing member abuts against one end of the light source device, and the second fixing member abuts against the other end of the light source device, the first end of the first fixing member and the first end of the second fixing member are fixed to the first slot, and the second end of the first fixing member and the second end of the second fixing member are fixed to the second slot.

[0011] In the above technical solution, the extension directions of the two fixing members are perpendicular to the first slot and the second slot, and the two ends of the light source device can be firmly fixed by using the first slot, the second slot, the first fixing member and the second fixing member.

[0012] In a possible implementation manner, the first end of the first fixing member and the first end of the second fixing member are fixed to the first slot by screws, and the second end of the first fixing member and the second end of the second fixing member are fixed to the second slot by screws.

[0013] In a possible implementation, the light source device includes: a light source and a light source controller, wherein the light source controller is electrically connected to the light source, and is used to control the light source to emit light.

[0014] In a possible implementation, the test machine further includes: a cover plate, which is disposed on a side of the light outlet away from the machine housing, and is used to cover the light outlet. The cover plate can be displaced relative to the first surface, and when the test machine is not testing, the light outlet can be covered by the cover plate to prevent dust and dirt; before the test machine is testing, the cover plate is removed from above the light outlet to allow light emitted by the light source device to pass through, so as to complete the test.

[0015] In a possible implementation, the cover plate is detachably connected to the first surface of the machine housing, for example, the cover plate can be installed and removed by screws.

[0016] In a possible implementation, the cover plate is movably connected to the first surface of the machine housing. The manner of the movably connected connection includes but is not limited to sliding, rotating, folding, and the like.

[0017] In a possible implementation, at least one ventilation fan is respectively disposed on the second surface and the third surface opposite to the second surface of the machine housing, and the second surface and the third surface are connected to the first surface. When the test machine is running, the ventilation fans disposed on the two opposite surfaces can promote air circulation inside the machine, achieve the effect of heat dissipation and ventilation, and ensure the stable operation of the test machine.

[0018] In a second aspect, an embodiment of the present application provides a chip testing method, which is applied to a chip testing system, wherein the system comprises: a test terminal, a signal processing device, and a test machine as described in the first aspect, wherein the test terminal is connected to the signal processing device and the test machine, respectively, and the signal processing device is connected to the test machine; the test terminal is used to send a test instruction to the test machine so that the light source device in the test machine emits light; the test machine is used to receive a digital signal returned by a connected chip to be tested, and send the digital signal to the signal processing device, wherein the digital signal is generated by the chip to be tested based on the light; the signal processing device is used to perform parameter calculations on the digital signal, and send the calculation results to the test terminal; the test terminal is used to test the chip to be tested according to the calculation results.

[0019] In order to make the above-mentioned objectives, features and advantages to be achieved by the embodiments of the present application more obvious and understandable, the following specifically cites preferred embodiments and describes them in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 A schematic diagram of the internal structure of a test machine provided in an embodiment of the present application;

[0022] Figure 2 A schematic diagram of a viewing angle structure of a test machine provided in an embodiment of the present application;

[0023] Figure 3 A schematic diagram of another viewing angle structure of a test machine provided in an embodiment of the present application;

[0024] Figure 4 This is a schematic diagram of a light source device in an embodiment of the present application;

[0025] Figure 5This is a flowchart of chip testing in an embodiment of the present application.

[0026] Icons: 110 - machine housing; 120 - light source device; 111 - first surface; 112 - second surface; 211 - first slot; 212 - second slot; 213 - first fixing member; 214 - cover plate; 215 - ventilation fan. DETAILED DESCRIPTION

[0027] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.

[0028] See also Figures 1 to 3 , Figure 1 The internal structure diagram of the test machine provided in the embodiment of the present application is shown. Figure 2 and Figure 3 The external schematic diagram of the test machine is shown. The test machine includes: a machine housing 110, a PCB board (not shown) and a light source device 120, wherein the PCB board is arranged inside the machine housing 110, and the light source device 120 is fixedly installed inside the machine housing 110. The installation direction of the light source device 120 forms a first preset angle with the first surface 111 of the machine housing 110. The first surface 111 is the light emitting surface of the test machine, and a light outlet is provided on the light emitting surface, and the light emitted by the light source device 120 is transmitted through the light outlet. Figure 4 is a schematic diagram of the light source device 120 .

[0029] The chip to be tested is opposite to the light-emitting surface of the test machine, and can generate digital signals based on the light emitted from the light outlet. The test machine can test one or more chips to be tested at the same time. The chip to be tested in the embodiment of the present application is an image sensor chip, including but not limited to a CCD chip and a CIS chip.

[0030] Optionally, a slot is further provided inside the machine housing 110, wherein the extension direction of the slot body forms a second preset angle with the first surface 111 of the machine housing 110, and the slot is used to plug in the PCB board. The first preset angle and the second preset angle can be the same, for example, they can be an angle perpendicular to the first surface 111 or an angle close to perpendicular. A plurality of interfaces are provided on the PCB board. After the PCB board is inserted into the internal slot, the test machine is connected to the chip to be tested and the signal processing device through the plurality of interfaces provided on the PCB, and the signal processing device is used to process digital signals. For example, the signal processing device can be a digital signal processor (DSP).

[0031] In this embodiment, the number of slots can be one or more, and the number of PCB boards can be one or more, and the specific number can be set according to the actual application scenario, which is not limited in this embodiment. The PCB board can provide power, clock and other signals to the chip under test, as well as some necessary digital signals, such as configuration signals, and the PCB board can be a rectangular circuit board.

[0032] In a specific scenario, Figure 1 As shown, the slots provided inside the machine include a first slot 211 and a second slot 212, and the first slot 211 and the second slot 212 are respectively fixedly installed on both sides of the light source device 120. A first fixing member 213 and a second fixing member (not shown) are provided inside the machine housing 110, the first fixing member 213 abuts against one end of the light source device 120, and the second fixing member abuts against the other end of the light source device 120, the first end of the first fixing member 213 and the first end of the second fixing member are fixed to the first slot 211, and the second end of the first fixing member 213 and the second end of the second fixing member are fixed to the second slot 212.

[0033] Optionally, a top mounting plate and a bottom mounting plate are provided inside the machine housing 110, and both the top mounting plate and the bottom mounting plate are parallel to the first surface 111, and the top mounting plate is fixedly mounted on a side close to the first surface 111, and the bottom mounting plate is fixedly mounted on a side away from the first surface 111, and the first slot 211 and the second slot 212 are both vertically mounted on the top mounting plate and the bottom mounting plate, so that both ends of the first slot 211 and both ends of the second slot 212 can be firmly fixed inside the machine. The first fixing member 213 is mounted on the bottom mounting plate, and the second fixing member is mounted on the top mounting plate.

[0034] Optionally, the first end of the first fixing member 213 and the first end of the second fixing member may be fixed to the first slot 211 by screws, and the second end of the first fixing member 213 and the second end of the second fixing member may be fixed to the second slot 212 by screws. The first fixing member 213 and the first slot 211 and the second slot 212, and the second fixing member and the first slot 211 and the second slot 212 may also be fixed by other forms of fasteners.

[0035] In this embodiment, the light source device 120 includes: a light source and a light source controller. The light source controller is electrically connected to the light source and is used to control the light source to emit light. The light source controller is connected to the test terminal, can receive test instructions from the test terminal, and control the light source to emit light of a specific wavelength.

[0036] Optional, such as Figure 2As shown, the test machine also includes: a cover plate 214, which is arranged on the side of the light outlet away from the machine housing 110, and the cover plate 214 can be displaced relative to the first surface 111 of the machine housing 110. The shape of the light outlet can be circular or square, and the cover plate 214 is used to cover the light outlet. When the test machine is not testing, the light outlet can be covered by the cover plate 214 to play a role in avoiding dust and dust. Before the test machine is tested, the cover plate 214 is removed from above the light outlet so that the light emitted by the light source device 120 can be transmitted to complete the test. The connection relationship between the cover plate 214 and the first surface 111 of the machine housing 110 can be a detachable connection. For example, when the cover plate 214 is needed, the cover plate 214 and the first surface 111 are locked by screws to fix the two. When the cover plate 214 is not needed, the screws are unscrewed and the cover plate 214 is removed. The connection between the cover plate 214 and the first surface 111 may also be movably connected, for example, the cover plate 214 and the first surface 111 may be movably connected by sliding, rotating, or folding. It should be noted that the specific connection method between the cover plate 214 and the machine housing 110 should not be understood as a limitation to the present application.

[0037] Optional, such as Figure 2 and Figure 3 As shown, at least one ventilation fan 215 is respectively disposed on the second surface 112 and the third surface of the machine housing 110, wherein the second surface 112 and the third surface are two opposite surfaces, and the second surface 112 and the third surface are connected to the first surface 111. In this embodiment, the machine housing 110 may be a rectangular parallelepiped frame structure, the first surface may be the top surface of the test machine, the second surface 112 and the third surface may be two opposite side surfaces of the test machine, a plurality of air inlet fans are disposed on the second surface, and a plurality of air exhaust fans are disposed on the third surface, so that when the test machine is running, the air circulation inside the machine can be promoted to achieve the effect of heat dissipation and ventilation, thereby ensuring the stable operation of the test machine.

[0038] The application scenarios of the test machine provided in this embodiment are as follows:

[0039] The test terminal, signal processing device and test machine form a chip test system. The test terminal is connected to the signal processing device and the test machine respectively, the signal processing device is connected to the test machine, and the test machine is used to connect to the chip under test. Figure 5 ,The process of testing the chip under test includes:

[0040] Step 310: The test terminal sends a test instruction to the test machine to make the light source device in the test machine emit light.

[0041] Before testing, the chip to be tested is connected to the PCB board of the test machine. The test machine provides power signals, clock signals and configuration signals to the chip to be tested through the PCB board, and configures the register of the chip to be tested to the required working state through the configuration signal. Next, the light source device in the test machine applies light of a specific wavelength to the chip to be tested, wherein the light applied to the chip to be tested includes but is not limited to red, green, blue and other three-color light, as well as light of different brightness. The specific parameters of the applied light signal can be determined according to the chip manual.

[0042] Step 320: The test machine receives a digital signal returned by the connected chip under test, and sends the digital signal to a signal processing device. The digital signal is generated by the chip under test based on light.

[0043] After sensing the light signal, the chip under test captures the image information and converts the light signal into a digital signal through photoelectric conversion. The digital signal is output through the digital pin of the chip and output to the connected test machine. After the test machine collects the digital signal of the chip under test, it saves it and sends it to the connected DSP through a high-speed data interface.

[0044] Step 330: The signal processing device performs parameter calculation on the digital signal and sends the calculation result to the test terminal.

[0045] Step 340: The test terminal tests the chip to be tested according to the calculation results.

[0046] After receiving the digital signal from the test machine, the DSP performs a large number of parameter calculations and returns the calculation results to the test terminal. The chip manual specifies the qualified range of the corresponding parameters. The test terminal compares the calculation results sent by the DSP with the pre-specified qualified range. If the calculation result is within the specified qualified range, the test is passed. If the calculation result is not within the specified qualified range, the test is failed.

[0047] During the test process, the DSP completes data transmission and calculation, and the test terminal completes the determination of the test results. The test terminal can specifically be a computer.

[0048] In summary, the test machine provided in the embodiment of the present application integrates the light source device required for the test, and has a high degree of integration. Moreover, since a space for the light source structure is specially reserved in the machine, the light source itself can be made larger, which is conducive to placing a light source with better light quality in the machine. Compared with the external small light source in the prior art, the quality of the optical signal is improved. Furthermore, a larger light source will bring a larger area of ​​the emitted light spot, so that the number of chips that can be tested at a time is increased. For example, the external small light source in the prior art can test 1-2 CIS chips at a time, and the large light source in this embodiment can test 4-5 CIS chips at a time, which effectively reduces the test time and improves the test efficiency.

[0049] In this document, relational terms such as first and second, etc. are used merely to distinguish one entity or operation from another entity or operation, but do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0050] The above description is only an embodiment of the present application and is not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A testing machine, characterized in that: include: Machine housing; A PCB board disposed inside the machine housing; A light source device is fixedly installed inside the machine housing, wherein the installation direction of the light source device forms a first preset angle with the first surface of the machine housing; the first surface is a light emitting surface, and a light emitting port is provided on the light emitting surface, and the light emitted by the light source device is transmitted through the light emitting port; A slot is further provided inside the machine housing, wherein an extending direction of the slot body forms a second preset angle with the first surface of the machine housing, and the slot is used to plug in the PCB board; The slot includes a first slot and a second slot, the first slot and the second slot are respectively fixedly installed on two sides of the light source device, and a first fixing member and a second fixing member are also arranged inside the machine housing, the first fixing member abuts against one end of the light source device, and the second fixing member abuts against the other end of the light source device, the first end of the first fixing member and the first end of the second fixing member are fixed to the first slot, and the second end of the first fixing member and the second end of the second fixing member are fixed to the second slot; The light source device comprises: a light source and a light source controller, wherein the light source controller is electrically connected to the light source and is used to control the light source to emit light.

2. The test machine according to claim 1, characterized in that: The first end of the first fixing member and the first end of the second fixing member are fixed to the first slot by screws, and the second end of the first fixing member and the second end of the second fixing member are fixed to the second slot by screws.

3. The test machine according to claim 1, characterized in that: The test machine also includes: A cover plate is arranged on a side of the light outlet away from the machine housing, and is used to cover the light outlet.

4. The test machine according to claim 3, characterized in that: The cover plate is detachably connected to the first surface of the machine housing.

5. The test machine according to claim 3, characterized in that: The cover plate is movably connected to the first surface of the machine housing.

6. The test machine according to claim 1, characterized in that: The second surface of the machine housing and the third surface opposite to the second surface are respectively provided with at least one ventilation fan, and the second surface and the third surface are connected to the first surface.

7. A chip testing method, characterized in that: Applicable to a chip testing system, the system comprising: a test terminal, a signal processing device and a test machine according to any one of claims 1 to 6, the test terminal being connected to the signal processing device and the test machine respectively, and the signal processing device being connected to the test machine; The test terminal sends a test instruction to the test machine to make the light source device in the test machine emit light; The test machine receives a digital signal returned by the connected chip under test, and sends the digital signal to the signal processing device, wherein the digital signal is generated by the chip under test based on the light; The signal processing device performs parameter calculation on the digital signal and sends the calculation result to the test terminal; The test terminal tests the chip to be tested according to the calculation result.

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