Millimeter wave material testing system

Abstract

The present disclosure relates to systems and methods related to test and measurement systems, and in particular to millimeter wave material testing systems including a test and measurement instrument for testing the radar transmittance and reflectivity of a material. The test and measurement equipment measures the insertion loss of the material under test. The test and measurement equipment includes a reference device in contact with a first surface of the material under test, the reference device including a reflective component and an absorptive component. The test device is in contact with a second surface of the material under test that is opposite to the first surface. The test device includes: a first transmitter for outputting a first signal of a predetermined frequency to the reflective component of the reference device through the material under test; a first receiver for receiving the first reflected signal from the reflective component; a second transmitter for outputting a second signal of a predetermined frequency to the absorptive component of the reference device through the material under test; and a second receiver for receiving the second reflected signal from the material under test.

Description

[0001] priority

[0002] This disclosure claims the benefit of U.S. Provisional Application No. 62 / 859,650, filed on June 10, 2019, and entitled “MILLIMETER WAVE MATERIAL TEST SYSTEM,” which is incorporated herein by reference in its entirety. Technical Field

[0003] The present disclosure relates to systems and methods related to test and measurement systems, and in particular to millimeter wave material testing systems including a test and measurement instrument for testing radar transmission and reflectivity of materials. Background Art

[0004] Many vehicles now include advanced driver assistance systems (ADAS), such as automatic emergency braking and lane change assistance. These ADAS often involve the use of radar to detect the presence of other vehicles or other objects in front of the vehicle and / or to reduce vehicle speed. Radar determines the distance, angle, and relative speed of an object by transmitting radio waves and receiving their reflections from its surface. Traditionally, many radar systems use frequencies in the 24 GHz band, but many newer vehicles use frequencies in the 77 GHz band.

[0005] Because various vehicle components can sometimes interact with and / or block the radar's transmit frequencies, they must be tested to ensure they adequately transmit and receive frequencies in these desired frequency bands. Traditionally, coaxial cable systems have been used to test these systems. However, coaxial cables capable of handling the 77 GHz band are often very expensive and fragile.

[0006] Embodiments of the present disclosure address these and other deficiencies of the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Aspects, features, and advantages of embodiments of the present disclosure will become apparent from the following description of embodiments with reference to the accompanying drawings, in which:

[0008] Figure 1 is a diagram of an example millimeter wave materials tester according to some embodiments of the present disclosure;

[0009] Figure 2 During the operation of the millimeter wave material tester Figure 1 Another illustration of the millimeter wave material tester;

[0010] Figure 3 yes Figure 1 Block diagram of the surface of the millimeter wave material tester;

[0011] Figure 4 yes Figure 1 A block diagram of a surface reference assembly of a millimeter wave material tester;

[0012] Figure 5 It is an explanation Figure 1 Flowchart of the operation of the millimeter wave materials tester. DETAILED DESCRIPTION

[0013] This document discloses a handheld millimeter-wave material testing unit designed to assist in automotive manufacturing and repair. The unit can test the radar transmission and reflectivity of materials such as, but not limited to, paint, coatings, bumpers, and door panels. The unit can be used on these materials to ensure sufficient transmission and / or reflection of radar signals from the tested material.

[0014] Figure 1 An example of a millimeter wave material tester 100 according to some embodiments of the present disclosure is shown. The millimeter wave material tester 100 may include a measuring instrument 102 and a reference unit 104. The measuring instrument may include a display 106 to provide information about the test status to a user. The millimeter wave material tester 100 is a lightweight, handheld device that can quickly test materials to ensure that the material allows sufficient radar transmission for radar systems, particularly automotive radar systems. In some embodiments, the millimeter wave material tester 100 may be battery-powered.

[0015] The millimeter wave material tester 100 may also include one or more user inputs, which may include, for example, a button 108 for executing a test and a button 110 for executing a calibration. However, the one or more user inputs are not limited to Figure 1 The buttons 108 and 110 are not shown in the figure, but can be any user input, such as but not limited to a switch, a joystick, a touch screen, a keyboard, etc.

[0016] The measuring gauge 102 also includes a transmitter and receiver surface 112 that is aligned with corresponding surfaces of the reference block 102 and / or the material being measured ( Figure 1 As will be appreciated by those skilled in the art, the measuring instrument 102 also includes a plurality of hardware components, such as but not limited to one or more processors, storage media, communication interfaces, power supplies, and the like.

[0017] Figure 2The millimeter wave materials testing instrument 100 is shown being used to test a material 200. The material 200 is positioned between the measuring instrument 102 and the reference unit 104. As will be discussed in greater detail below, the surface 112 of the measuring instrument 102 and the corresponding surface of the reference unit 104 include alignment mechanisms for aligning the measuring instrument 102 and the reference unit 104 with respect to each other through the material 200. The alignment mechanisms may include, for example, magnets, corresponding pins and holes in the surfaces 112 and 400, or any other mechanism for aligning the surfaces 112 and 300.

[0018] The user may select the test input 108 or otherwise instruct the meter 102 to perform a test on the material 200 between the meter 102 and the reference cell 102. Based on the test results, which will be discussed in more detail below, the display 106 may display relevant information to the user. For example, Figure 2 As shown, the display 106 outputs that the material 200 passed the transmittance and reflectance tests. Although the example display 106 only outputs whether the material passed or failed, embodiments of the present disclosure are not limited to this summary output and can provide more information, such as a graphical representation of the transmittance and reflectance of the material.

[0019] Figure 3 An example of a transmitter and receiver surface 112 of a measurement instrument 102, according to some embodiments of the present disclosure, is shown. The transmitter and receiver surface 112 includes two transducer pairs. Each transducer pair consists of a transmitter pair 302 and a receiver pair 304. Each transducer pair can be activated independently. The receiving and transmitting sides can be arranged on the surface 112 (which can be a printed circuit board) so that net surface wave coupling or transmission in the plane of the surface 112 is zero (as in a conventional antenna), and can be primarily sensitive to signals perpendicular to the surface 112.

[0020] Circuitry 306 is located at the edge of transmitter and receiver surface 112. Circuitry 306 may be located beneath a protective panel on transmitter and receiver surface 112. Circuitry 306 may include, for example, a frequency modulated (FM), continuous wave (CW), or linear frequency chirped radar integrated circuit that may support multiple input and output channels. Transmitter 302 and receiver 306 antennas may be printed directly on the surface of transmitter and receiver surface 112.

[0021] The transmitter and receiver surfaces 112 also include an alignment mechanism. The alignment mechanism ensures that the transmitter and receiver surfaces 112 are aligned with the corresponding surfaces of the reference unit 104. Figure 3 In the embodiment illustrated in , the transmitter and receiver surface 114 may include a plurality of different magnets 308 that are to be attached to corresponding magnets of opposite polarity in the reference unit 104 .

[0022] Figure 4An example surface 400 of the reference block 104 is shown. The surface 400 of the reference block 104 includes corresponding alignment structures for aligning the transmitter and receiver surfaces 112 of the measurement gauge 102 with the surface 400 of the reference block 104. Figure 4 In FIG, the alignment mechanism includes corresponding magnets 402 of opposite polarity to the magnets on the transmitter and receiver surfaces 112.

[0023] Surface 400 also includes an absorptive or low-reflective component 404 and a reflective component 406. Absorptive component 404 absorbs the transmitted radar to allow gauge 102 to determine what is directly reflected back by material 200, and reflective component 406 reflects the signal back to gauge 102 to determine the extent to which the material being tested transmits the signal.

[0024] The absorbing component 404 can be any component and / or surface that absorbs the transmitted signal, and the reflecting component 406 can be any component and / or surface that reflects the signal. In some embodiments, the reflecting component 406 is a corner cube, which is a retroreflector composed of three mutually perpendicular, intersecting flat surfaces that reflects the wave directly back toward the source. Corner cubes are effective for situations where a non-contact, highly reflective patch is required that is independent of angle and alignment. Corner cubes can allow the incoming signal to reflect across multiple surfaces of highly reflective materials (such as aluminum, silver, copper, etc.) and return directly to the source, even when misaligned. Metal surfaces with oxide coatings (such as aluminum) work well because the oxide form has low loss and can transmit to the reflective aluminum beneath the oxide coating.

[0025] The corner cubes can be molded in metal and then plated, or in some embodiments, can be made of plastic and then plated. The exposed areas of the corner cubes can be covered with a dielectric film suspended from the surface, or the surface can be treated for protection, or the exposed areas can be allowed to oxidize naturally. As molded components, the corner cubes can be obtained at a relatively low cost, and the outer edges or rear portions of the reference cell 104 can have significant draft angles or hollow spaces to reduce the cost of molded reflective assembly 406.

[0026] In some embodiments, both surfaces 112 and 400 are smooth and non-abrasive to allow the gauge 102 and reference unit 104 to slide along or across the material being tested without damaging the material, in order to test portions of a large piece of material being tested, such as, for example, a car bumper.

[0027] Figure 5is a flow chart illustrating an example operation of the millimeter wave materials testing instrument 100 according to some embodiments of the present disclosure. Initially, in optional operation 500, a user may perform a calibration of the measuring instrument 102. To do so, the user may place the reference block 102 directly on the measuring instrument 102 so that the alignment mechanisms of both the measuring instrument 102 and the reference block 102 align the transmitter and receiver surfaces 112 of the measuring instrument with the surface 400 of the reference block. The user may then select button 110 to calibrate or zero the measuring instrument 102.

[0028] In operation 502, a material to be tested, such as material 200 discussed above, is placed between the measuring machine 102 and the reference unit 104. The material 200 may be, for example, a fender or a car door panel. Because the material may be large, the alignment mechanism of the surfaces 112 and 300 can ensure that the measuring machine 102 and the reference unit 104 are aligned to accurately measure the material.

[0029] In operation 504, the measuring instrument 102 may receive input for testing the material under test. Upon receiving the input for testing the material, in operation 506, the transmitter 302 of the first transducer pair may output a signal at a predetermined frequency, and the corresponding receiver 304 may measure the return signal. In operation 508, the transmitter 302 of the second transducer pair may output a signal at a predetermined frequency, and the corresponding receiver 304 may measure the return signal. As described above, a transmitted signal is output toward the absorptive component 404, so the return signal measured by the corresponding receiver 304 is any signal reflected from the material 200. Another transmitted signal at the predetermined frequency is output toward the reflective component 406, so the return signal measured by the corresponding receiver 304 is the reflected signal from the reflective component 406 plus any signal reflected from the material 200. In some embodiments, the predetermined frequency may be adjustable. In some embodiments, the measuring instrument 102 may transmit and measure test signals at a plurality of discrete predetermined frequencies. In some embodiments, the measuring instrument 102 may sweep across a range of predetermined frequencies.

[0030] In operation 510, using the two returned signals, the processor in the meter 102 can determine whether the material 200 is sufficiently transmitting the signal at the predetermined frequency. In some embodiments, the processor in the meter 102 can determine the insertion loss of the material and whether the insertion loss is within an acceptable range. Based on the transmitted signal and the received signal, any known method can be used to determine the insertion loss. The processor can output a pass / fail output, such as Figure 2 , or the processor may output a more detailed output, such as a graphical response showing the received predetermined frequency signal. The predetermined frequency may be selected by the user or may be stored in a memory of the meter 102. Figure 5The operations shown in allow the millimeter meter 100 to test the radar transmission and reflection of materials such as paint, coatings, bumpers, door panels, etc., and quickly output whether the material passes the radar required for the radar system to operate.

[0031] The reference unit 104 and the gauge 102 can be separated from the material 200 and slid or moved across the material 200 to test another portion of the material. An alignment mechanism, such as a magnet or a pin and hole mechanism, can ensure that the reference unit 104 and the gauge 102 are aligned for the next reading on the material 200.

[0032] Aspects of the present disclosure may operate on specially created hardware, firmware, digital signal processors, or on a specially programmed computer including a processor operating according to programmed instructions. As used herein, the terms "controller" or "processor" are intended to include microprocessors, microcomputers, application-specific integrated circuits (ASICs), and dedicated hardware controllers. One or more aspects of the present disclosure may be embodied in computer-usable data and computer-executable instructions, such as in one or more program modules executed by one or more computers (including monitoring modules) or other devices. Generally, program modules include routines, programs, objects, components, data structures, etc., which, when executed by a processor in a computer or other device, perform specific tasks or implement specific abstract data types. Computer-executable instructions may be stored on computer-readable storage media, such as hard disks, optical disks, removable storage media, solid-state memory, random access memory (RAM), etc. As will be appreciated by those skilled in the art, the functionality of the program modules may be combined or distributed across various aspects as desired. Furthermore, the functionality may be embodied in whole or in part in firmware or hardware equivalents, such as integrated circuits and FPGAs. Certain data structures may be used to more efficiently implement one or more aspects of the present disclosure, and such data structures are contemplated as being within the scope of the computer-executable instructions and computer-usable data described herein.

[0033] In some cases, the disclosed aspects may be implemented in hardware, firmware, software, or any combination thereof. The disclosed aspects may also be implemented as instructions carried by or stored on one or more computer-readable storage media, which may be read and executed by one or more processors. Such instructions may be referred to as a computer program product. As discussed herein, a computer-readable medium refers to any medium that can be accessed by a computing device. By way of example and not limitation, a computer-readable medium may include computer storage media and communication media.

[0034] Computer storage media refers to any medium that can be used to store computer-readable information. By way of example, and not limitation, computer storage media may include RAM, ROM, electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital video disc (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, and any other volatile or nonvolatile, removable or non-removable media implemented in any technology. Computer storage media does not include signals themselves or transient forms of signal transmission.

[0035] Communication media refers to any medium that can be used to communicate computer-readable information. By way of example, and not limitation, communication media can include coaxial cables, fiber optic cables, air, or any other medium suitable for communication of electrical, optical, radio frequency (RF), infrared, acoustic, or other types of signals.

[0036] Example

[0037] Illustrative examples of the technology disclosed herein are provided below. Implementations of the technology may include any one or more of the examples described below, and any combination of these examples.

[0038] Example 1 is a testing and measuring device, comprising: a reference device, configured to contact a first surface of a material under test, the reference device including a reflective component and an absorptive component; and a testing device, configured to contact a second surface of the material under test opposite to the first surface, the testing device including: a first transmitter, configured to output a first signal of a predetermined frequency to the reflective component of the reference device through the material under test; a first receiver, configured to receive the first reflected signal from the reflective component; a second transmitter, configured to output a second signal of a predetermined frequency to the absorptive component of the reference device through the material under test; and a second receiver, configured to receive the second reflected signal from the material under test.

[0039] Example 2 is the test and measurement device of Example 1, wherein the test device further includes a processor configured to determine whether the material under test meets predetermined requirements based on the first signal, the second signal, the first reflected signal, and the second reflected signal.

[0040] Example 3 is the test and measurement device of Example 2, wherein the processor is further configured to determine whether the material under test passes a transmission standard based on the first reflection signal, and to determine whether the material under test passes a reflection standard based on the second reflection signal.

[0041] Example 4 is the test and measurement device of Example 2 or 3, wherein the test device further includes a display configured to output a determination of whether the material under test meets predetermined requirements.

[0042] Example 5 is the test and measurement device of any of Examples 1 to 4, further comprising an alignment mechanism configured to align a surface of the reference device with a surface of the test device.

[0043] Example 6 is the test and measurement device of Example 5, wherein the alignment mechanism includes a magnet on a reference device surface and a complementary magnet on a test device surface.

[0044] Example 7 is the test and measurement device of any of Examples 1 to 6, wherein the reference device is further configured to be in direct contact with the test device during the calibration operation.

[0045] Example 8 is the test and measurement device of Example 7, wherein the test device includes an input to initiate a calibration operation.

[0046] Example 9 is the test and measurement device of any of Examples 1 to 8, wherein the first transmitter and the first receiver are a transducer pair including two first transmitters and two first receivers.

[0047] Example 10 is the test and measurement device of Example 9, wherein the second transmitter and the second receiver are a transducer pair including two second transmitters and two second receivers.

[0048] Example 11 is the test and measurement device of any of Examples 1 to 10, wherein the predetermined frequency is a frequency for a signal output of a radar system.

[0049] Example 12 is the test and measurement device of any of Examples 1 to 11, wherein the test and measurement device is handheld.

[0050] Example 13 is a method for measuring the characteristics of a material under test, comprising: transmitting a first signal of a predetermined frequency toward an absorbing component through the material; receiving a first response signal in response to the transmission of the first signal; transmitting a second signal of a predetermined frequency toward a reflecting component through the material; receiving a second response signal in response to the transmission of the second signal; and determining the insertion loss of the material.

[0051] Example 14 is the method of Example 13, further comprising determining whether an insertion loss of the material meets predetermined requirements.

[0052] Example 15 is the method of Example 14, further comprising displaying a determination of whether the tested material meets predetermined requirements.

[0053] Example 16 is the method of any of Examples 13 to 15, further comprising aligning a surface of the reference device with a surface of the test device by an alignment mechanism.

[0054] Example 17 is the method of Example 16, wherein the alignment mechanism comprises a magnet on a surface of the reference device and a complementary magnet on a surface of the test device.

[0055] Example 18 is the method of any one of Examples 13 to 17, further comprising performing a calibration procedure by the following steps: transmitting a first signal of a predetermined frequency toward an absorbing component without the material; receiving a third response signal in response to the transmission of the first signal; transmitting a second signal of a predetermined frequency toward a reflecting component without the material; and receiving a fourth response signal in response to the transmission of the second signal.

[0056] Example 19 is the method of any one of Examples 13 to 18, wherein the first transmitter for transmitting the first signal and the first receiver for receiving the first response signal are a transducer pair including two first transmitters and two first receivers.

[0057] Example 20 is the method of any of Examples 13 to 19, wherein the predetermined frequency is a frequency for a signal output of the radar system.

[0058] The previously described versions of the disclosed subject matter have many advantages that have been described or are apparent to those of ordinary skill in the art. Even so, not all of these advantages or features are required in all versions of the disclosed apparatus, system, or method.

[0059] Additionally, the written description mentions specific features. It should be understood that the disclosure in this specification includes all possible combinations of those specific features. When a specific feature is disclosed in the context of a particular aspect or example, the feature may also be used in the context of other aspects and examples to the greatest extent possible.

[0060] Furthermore, when a method having two or more defined steps or operations is referred to herein, the defined steps or operations may be performed in any order or concurrently, unless the context excludes those possibilities.

[0061] Although specific examples of the present invention have been illustrated and described for purposes of illustration, it will be appreciated that various modifications can be made without departing from the spirit and scope of the invention. Accordingly, the present invention is not to be limited except as in the appended claims.

Claims

1. A test and measurement device comprising: a reference device configured to contact the first surface of the material under test, the reference device comprising a reflective component and an absorptive component; and a test device configured to contact a second surface of the material being tested opposite the first surface, the test device comprising: A first transmitter is configured to output a first signal of a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver configured to receive a first reflected signal from the reflective component; a second transmitter configured to output a second signal of a predetermined frequency to the absorption component of the reference device through the material under test, and The second receiver is configured to receive a second reflected signal from the material under test.

2. The test and measurement device of claim 1, wherein the test device further comprises a processor configured to determine whether the material under test meets predetermined requirements based on the first signal, the second signal, the first reflected signal, and the second reflected signal.

3. The test and measurement device of claim 2, wherein the processor is further configured to determine whether the tested material passes a transmission standard based on the first reflection signal, and to determine whether the tested material passes a reflectance standard based on the second reflection signal.

4. The test and measurement device of claim 2, wherein the test device further comprises a display configured to output a determination of whether the material under test meets predetermined requirements. 5 . The test and measurement device of claim 1 , further comprising an alignment mechanism configured to align a surface of the reference device with a surface of the test device.

6. The test and measurement device of claim 5, wherein the alignment mechanism comprises a magnet on a surface of the reference device and a complementary magnet on a surface of the test device.

7. The test and measurement device of claim 1, wherein the reference device is further configured to be in direct contact with the test device during a calibration operation.

8. The test and measurement device of claim 7, wherein the test device includes an input to initiate a calibration operation. 9 . The test and measurement device of claim 1 , wherein the first transmitter and the first receiver are a transducer pair including two first transmitters and two first receivers. 10 . The test and measurement device of claim 9 , wherein the second transmitter and the second receiver are a transducer pair including two second transmitters and two second receivers.

11. The test and measurement device of claim 1, wherein the predetermined frequency is a frequency for a signal output of a radar system.

12. The test and measurement device of claim 1, wherein the test and measurement device is handheld.

13. A method for measuring a property of a material using the test and measurement device according to any one of claims 1 to 12, comprising: emitting a first signal of a predetermined frequency through the material toward the absorbing component; receiving a first response signal in response to the transmitting of the first signal; transmitting a second signal of a predetermined frequency through the material toward the reflective component; receiving a second response signal in response to the transmission of the second signal; as well as Determine the insertion loss of the material. The method of claim 13 , further comprising determining whether the insertion loss of the material meets predetermined requirements.

15. The method of claim 14, further comprising displaying a determination of whether the tested material meets predetermined requirements.

16. The method of claim 13, further comprising aligning a surface of the reference device with a surface of the test device via an alignment mechanism.

17. The method of claim 16, wherein the alignment mechanism comprises a magnet on a surface of the reference device and a complementary magnet on a surface of the test device.

18. The method of claim 13, further comprising performing a calibration procedure by: emitting a first signal of a predetermined frequency toward an absorbing component without the material; receiving a third response signal in response to transmitting the first signal; emitting a second signal of a predetermined frequency toward the reflective component without the material; as well as In response to the transmission of the second signal, a fourth response signal is received. 19 . The method of claim 13 , wherein the first transmitter for transmitting the first signal and the first receiver for receiving the first response signal are a transducer pair including two first transmitters and two first receivers.

20. The method of claim 13, wherein the predetermined frequency is a frequency for a signal output of a radar system.

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