Processing system, processing method and storage medium

Abstract

A processing system, a processing method and a storage medium are provided, which can determine whether a detector is in contact with a welding object. According to an embodiment of the present invention, the processing system has a processing device for performing a first determination. In the first determination, if a detector including a plurality of detection elements arranged along a first direction, transmitting ultrasonic waves toward a welding object and detecting reflected waves detects the reflected waves, it is determined whether the detector is in contact with the welding object based on the detection result.

Description

Technical Field

[0001] Embodiments of the present invention relate to a processing system, a processing method, and a storage medium. Background Art

[0002] In welding, parts of two or more components are melted and joined together. Whether the welded parts of the welded components (hereinafter referred to as welds) are properly joined is checked. For example, in nondestructive testing, a person holding a detector (inspector) brings the detector into contact with the weld. Ultrasonic waves are sent from the detector toward the weld, and the presence of joining is checked based on the reflected waves.

[0003] When the detector is not in proper contact with the welded portion during inspection, the reflected wave reflecting the state of the welded portion cannot be detected. Therefore, it is desirable that the detector be in proper contact with the welded portion during inspection. Summary of the invention

[0004] Embodiments of the present invention provide a processing system, a processing method, and a storage medium, which can determine whether a detector is in contact with a welding object.

[0005] According to an embodiment of the present invention, the processing system has a processing device for performing a first determination. In the first determination, if a detector including a plurality of detection elements arranged along a first direction, transmitting ultrasonic waves toward a welding object and detecting reflected waves detects the reflected waves, it is determined whether the detector is in contact with the welding object based on the detection result.

[0006] According to the embodiment, it is possible to determine whether the detector is in contact with the welding object. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 It is a block diagram showing the structure of a processing system according to an embodiment.

[0008] Figure 2 It is a schematic diagram showing the status of nondestructive inspection.

[0009] Figure 3 This is a schematic diagram showing the internal structure of the detector front end.

[0010] Figure 4 This is a flowchart showing the flow of contact determination using a detector of the processing system according to the embodiment.

[0011] Figure 5 It is a schematic diagram showing the state of detection by the detector.

[0012] Figure 6 It is a schematic diagram of an image showing the detection result of the reflected wave.

[0013] Figure 7is a graph of the intensity distribution of an example reflected wave.

[0014] Figure 8 This is an example of a user interface displayed on a display device.

[0015] Fig. 9 is a graph of the intensity distribution of an example reflected wave.

[0016] Fig.10 is a graph of an example spectrum.

[0017] Fig.11 This is a flowchart showing the flow of inspection using the processing system according to the embodiment.

[0018] Fig.12 : is a graph showing an example of the intensity distribution of the reflected wave in the Z direction in one cross section.

[0019] Fig.13 is a graph illustrating the intensity distribution of the reflected wave in the Z direction.

[0020] Fig.14 : is a graph illustrating the result of filtering the intensity distribution of the reflected wave.

[0021] Fig.15 is a schematic diagram illustrating the detection results of an example reflected wave.

[0022] Fig.16 This is an example of the intensity distribution of the reflected wave in the XY plane.

[0023] Fig.17 is a schematic diagram illustrating the detection results of an example reflected wave.

[0024] Fig.18 It is a flowchart showing the process of estimating the scope of the processing system related to the embodiment.

[0025] Fig.19 is an image showing an example of the detection result of the reflected wave.

[0026] Fig. 20 It is a diagram for explaining the processing of the processing system according to the embodiment.

[0027] Fig.21 This is an example of an image obtained by the processing system according to the embodiment.

[0028] Fig. 22 This is an example of an image obtained by the processing system according to the embodiment.

[0029] Fig.23 It is a schematic diagram for explaining the inspection method of the processing system related to the embodiment.

[0030] Fig.24 It is a schematic diagram showing the structure of a processing system according to a modified example of the embodiment.

[0031] Fig.25 It is a perspective view showing a part of a processing system according to a modified example of the embodiment.

[0032] Fig.26 This is a flowchart showing the operation of a processing system according to a modification example of the embodiment.

[0033] Fig. 27 It is a block diagram showing the hardware structure of the system. DETAILED DESCRIPTION

[0034] Hereinafter, various embodiments of the present invention will be described with reference to the drawings.

[0035] The accompanying drawings are schematic or conceptual drawings, and the relationship between the thickness and width of each part, the ratio of the dimensions between the parts, etc. are not necessarily the same as the actual situation. Even when the same part is shown, the mutual dimensions and ratios may be shown differently depending on the drawings.

[0036] In the present specification and drawings, the same elements as those already described are denoted by the same reference numerals, and detailed description thereof will be appropriately omitted.

[0037] Figure 1 It is a block diagram showing the structure of a processing system according to an embodiment.

[0038] like Figure 1 As shown, the processing system 100 according to the embodiment includes a processing device 110 and a storage device 120. The storage device 120 stores data related to welding inspection. The processing device 110 processes the data related to welding inspection.

[0039] Figure 1 The processing system 100 shown further includes a detector 130, an input device 140, and a display device 150. The detector 130 transmits ultrasonic waves toward an object and detects (receives) the reflected waves thereof. The detector 130 includes, for example, a probe. Hereinafter, the transmission of ultrasonic waves and the detection of reflected waves by the detector 130 are referred to as probing.

[0040] The processing device 110 performs various processing based on the detected reflected waves. For example, the processing device 110 causes the display device 150 to display a user interface. The user can easily confirm the data obtained by the processing through the user interface displayed on the display device 150. In addition, the user can input data to the processing device 110 through the user interface through the input device 140.

[0041] Here, the welding inspection is described in detail. In the welding inspection, nondestructive inspection of the welded portion is performed.

[0042] Figure 2 It is a schematic diagram showing the status of nondestructive inspection.

[0043] The detector 130 includes a plurality of detection elements for inspecting the welded portion. Figure 2 The detector 130 has a shape that a person can hold with his hand. The person holding the detector 130 makes the front end of the detector 130 contact the weld 13 to inspect the weld 13. Here, an example of a person holding the detector 130 to perform welding inspection is described. Hereinafter, a person (e.g., an inspector) holding the detector 130 to perform welding inspection is referred to as a user.

[0044] Figure 3 This is a schematic diagram showing the internal structure of the detector front end.

[0045] Inside the front end of the detector 130, such as Figure 3 As shown, an element array 131 including a plurality of detection elements 132 is provided. The detection element 132 is, for example, a sensor. The element array 131 emits, for example, ultrasonic waves with a frequency of more than 1 MHz and less than 100 MHz. The plurality of detection elements 132 can be arranged in a linear shape along one direction, or in a matrix shape along two directions intersecting each other. Figure 3 In the example shown, the plurality of detection elements 132 are arranged along the X direction (first direction) and the Y direction (second direction) which are perpendicular to each other.

[0046] The element array 131 is covered by, for example, a hard transmission member 133. When the front end of the detector 130 is brought into contact with the weld 13, the hard transmission member 133 is located between the element array 131 and the weld 13. The hard transmission member 133 is made of a resin material or the like through which ultrasonic waves can be easily transmitted. By providing a hard transmission member 133 corresponding to the shape of the surface of the weld 13, ultrasonic waves can be easily transmitted to the inside of the weld 13. Furthermore, the hard transmission member 133 can suppress deformation, damage, etc. of the element array 131 when the detector 130 contacts the weld 13. The hard transmission member 133 has sufficient hardness to suppress deformation, damage, etc. when in contact with the weld 13.

[0047] Figure 2 and Figure 3 1 shows the state of a member 10 to be welded. The member 10 is made by spot welding a metal plate 11 (first member) and a metal plate 12 (second member) at a welding portion 13. Figure 3 As shown, at the welded portion 13 , a portion of the metal plate 11 and a portion of the metal plate 12 are melted and mixed to form a solidified portion 14 .

[0048] During inspection, coupling agent 15 is applied to the surface of the object so that ultrasonic waves can easily propagate between the object and detector 130. Each detection element 132 transmits ultrasonic waves US toward member 10 coated with coupling agent 15 and receives reflected waves RW from member 10.

[0049] Alternatively, a soft transmission member that allows ultrasonic waves to propagate easily may be provided at the front end of the detector 130 instead of the coupling agent 15. The soft transmission member is softer than the hard transmission member 133. When the soft transmission member contacts the welding portion 13, it deforms in accordance with the surface shape of the welding portion 13. The soft transmission member is made of, for example, a gel-like resin.

[0050] For example, Figure 3 As shown, one detection element 132 transmits ultrasonic waves US toward the welded portion 13. A portion of the ultrasonic waves US is reflected on the upper surface or the lower surface of the member 10. The plurality of detection elements 132 receive (detect) the reflected waves RW, respectively. Each detection element 132 transmits ultrasonic waves US in sequence, and each reflected wave RW is received by the plurality of detection elements 132.

[0051] The processing device 110 determines whether the detector 130 is in contact with the welding object based on the obtained detection result of the reflected wave. In addition, the processing device 110 can also calculate the inclination relative to the welding part 13 and inspect the welding part 13 based on the obtained detection result of the reflected wave. For example, the processing device 110 stores the contact determination result, the inclination calculation result, the inspection result of the welding part 13, etc. in the storage device 120.

[0052] Here, the angle between the normal direction of the surface of the weld 13 and the direction of the detector 130 is called the tilt. The direction of the detector 130 corresponds to the Z direction perpendicular to the arrangement direction of the detection elements 132. When the detector 130 is in perpendicular contact with the surface of the weld 13, the tilt is zero.

[0053] The processing device 110 is connected to the storage device 120 , the detector 130 , the input device 140 , and the display device 150 via wired communication, wireless communication, or a network.

[0054] Figure 4 This is a flowchart showing the flow of contact determination using a detector of the processing system according to the embodiment.

[0055] First, a condition for determining whether the detector 130 is in contact with the welding object is set (step S1). After setting the condition, the user moves the detector 130 so that the detector 130 contacts the welding part 13. If the user determines that the front end of the detector 130 has contacted the welding part 13, the user performs detection by the detector 130 (step S2). For example, a button for performing detection is provided on the detector 130. The user can perform detection by the detector 130 by operating the button. Alternatively, the user can also perform detection by the detector 130 through a user interface displayed on the display device 150.

[0056] If the reflected wave is detected by the detection, the processing device 110 performs a first determination of whether the detector 130 is in contact with the welding object (step S3). The processing device 110 performs the first determination based on the detected reflected wave and the conditions set in step S1.

[0057] If the result of the first determination is that the detector 130 is determined not to be in contact with the welding object, the processing device 110, for example, notifies the user (step S4). The method of notification is arbitrary. The detector 130 can emit sound or light to the user. The display of the display device 150 can also change. For example, an error message can be displayed on the display device 150. If it is determined that the detector 130 is in contact with the welding object, for example, calculation of the tilt of the detector 130 or inspection of the welding object is performed.

[0058] If the detector 130 is not in contact with the welding object, it is impossible to obtain a detection result reflecting the state of the welding portion 13. If the calculation or inspection of the tilt is performed using the detection result when the detector 130 is not in contact, an erroneous result may be output. By performing the first determination, it is possible to suppress the calculation or inspection of the tilt using the detection result when the detector 130 is not in contact.

[0059] The determination of whether the detector 130 is in contact with the welding object, that is, whether an appropriate detection result of the reflected wave can be obtained. For example, the detector 130 may not directly contact the welding object, but may contact it via a coupling agent. In this case, ultrasonic waves are fully propagated between the detector 130 and the welding object via the coupling agent. Therefore, a detection result suitable for calculation or inspection of the tilt can be obtained. Even if the detector 130 is in direct contact with the welding object, when the space between the detector 130 and the welding object is not filled with enough coupling agent, it may not be possible to obtain an appropriate detection result. Here, the situation in which the detection result of the reflected wave is determined to be usable for calculation or inspection of the tilt is referred to as the detector 130 being in contact with the welding object.

[0060] For example, even if the detector 130 seems to be in contact with the welding object, there are actually foreign objects such as dust or waste materials during processing between the detector 130 and the welding object. In addition, when the surface of the welding object has a concave portion or a convex portion, a gap sometimes occurs between the detector 130 and the welding object. According to an embodiment, in these cases, when the ultrasonic wave cannot be sufficiently transmitted between the detector 130 and the welding object even through the coupling agent, a notification to the user is performed. Thus, in the case where it is difficult to determine the contact of the detector 130 by visual observation, the user can also know whether the detector 130 is in proper contact with the welding object.

[0061] The setting of the condition in step S1 and the first determination in step S3 will be described in detail.

[0062] In step S1, detection is performed in a state where the detector 130 is in contact with the member and in a state where the detector 130 has left the member. The processing device 110 sets a first threshold using the detection result of the reflected wave when the detector 130 is in contact with the member (first detection result) and the detection result of the reflected wave when the detector 130 has left the member (second detection result).

[0063] Figure 5 It is a schematic diagram showing the state of detection by the detector.

[0064] If ultrasonic waves US are sent from the detector 130, Figure 5 As shown, a part of the ultrasonic wave US is reflected by the upper surface 11a of the metal plate 11 or the upper surface 13a of the weld 13. The other part of the ultrasonic wave US is incident on the component 10 and reflected by the lower surface 11b of the metal plate 11, the lower surface 13b of the weld 13, etc. The detector 130 detects the intensity of the reflected wave from each surface.

[0065] The intensity of the reflected wave can be expressed in any form. For example, the reflected wave intensity output from the detection element 132 includes positive values ​​and negative values ​​corresponding to the phase. Various processes can be performed based on the reflected wave intensity including positive values ​​and negative values. The reflected wave intensity including positive values ​​and negative values ​​can also be converted into an absolute value. The average value of the reflected wave intensity can also be subtracted from the reflected wave intensity at each moment. Alternatively, the weighted average value, weighted moving average value, etc. of the reflected wave intensity can also be subtracted from the reflected wave intensity at each moment. Even when the results obtained by applying these processes to the reflected wave intensity are used, the various processes described here can be performed.

[0066] Figure 6 It is a schematic diagram of an image showing the detection result of the reflected wave.

[0067] Figure 6 Indicates Figure 5The detection result when the detector 130 is in contact with the member 10 as the welding object is shown. Figure 6 Indicates the state of the welded object in the XZ cross section.

[0068] exist Figure 6 In the figure, points with high reflected wave intensity are indicated in white. Here, the reflected wave intensity is represented schematically in binary form. The position in the Z direction corresponds to the time from the emission of the ultrasonic wave to the reception of the reflected wave. The white line extending in the X direction or the Y direction represents the surface of the component.

[0069] exist Figure 6 In the diagram, the plurality of white lines located in the center in the X direction or the Y direction are based on the reflected waves from the upper surface 13a and the lower surface 13b of the welded portion 13. The plurality of white lines located at the end sides in the X direction or the Y direction are based on the reflected waves from the upper surface 11a of the metal plate 11, the lower surface 11b of the metal plate 11, and the lower surface 12b of the metal plate 12. Figure 6 In the figure, there are more than three white lines in the Z direction. This means that Figure 5 The ultrasonic wave US shown is multiply reflected between the upper and lower surfaces of the parts of the component 10 .

[0070] For example, white line WL1 is based on a reflected wave from the upper surface 13a of the weld 13. White line WL2 is based on a reflected wave from the lower surface 13b of the weld 13. White line WL3 is based on a multiple reflected wave reflected between the upper surface 13a and the lower surface 13b. Similarly, white line WL4 is based on a reflected wave from the upper surface 11a of the metal plate 11. White line WL5 is based on a reflected wave from the lower surface 11b of the metal plate 11. White line WL6 is based on a multiple reflected wave reflected between the upper surface 11a and the lower surface 11b and a reflected wave from the lower surface 12b of the metal plate 12. And, white line WL0 is based on a reflected wave from the surface of the hard propagation member 133.

[0071] In addition, Figure 5 In the member 10 shown in the figure, the lower surface 11b of the metal plate 11 is in contact with the upper surface 12a of the metal plate 12, and there is no space between these surfaces. In addition, the thickness of the metal plate 11 is the same as the thickness of the metal plate 12. Figure 6 The detection results shown do not include the reflected waves from the upper surface 12a of the metal plate 12. Also, the intervals between the white lines based on the reflected waves from the upper surface 11a, the lower surface 11b, and the lower surface 12b are substantially the same.

[0072] When setting the conditions, the processing device 110 averages or accumulates the intensity of at least a part of the detected reflected waves.

[0073] Specifically, the processing device 110 averages the intensity of at least a portion of the reflected waves included in the first detection result to calculate a first reference value. The processing device 110 averages the intensity of at least a portion of the reflected waves included in the second detection result to calculate a second reference value. Alternatively, the processing device 110 may also accumulate the intensity of at least a portion of the reflected waves included in the first detection result to calculate the first reference value. The processing device 110 may also accumulate the intensity of at least a portion of the reflected waves included in the second detection result to calculate the second reference value. When averaging or accumulating the intensity, the processing device 110 may also convert the intensity of the reflected wave into an absolute value. Alternatively, the processing device 110 may also apply a prescribed process to each intensity so that the signs of each intensity are the same. The processing device 110 sets the value between the first reference value and the second reference value as the first threshold value.

[0074] When the detector 130 has moved away from the object, the reflected wave is weakened compared to when the detector 130 is in contact with the object. For example, in a case where the stronger the reflected wave, the greater the positive value indicating the intensity, the second reference value is smaller than the first reference value. For example, the processing device 110 sets the middle value of the first reference value and the second reference value as the first threshold value. The processing device 110 can also add or subtract a value corresponding to the difference between the first reference value and the second reference value to the first reference value or the second reference value, thereby setting the first threshold value.

[0075] If the condition (first threshold) is set in step S1, the processing device 110 stores the condition in the storage device 120. In step S3, the processing device 110 uses the condition to perform the first determination. Specifically, the processing device 110 calculates the first determination value using the intensity of at least a portion of the reflected wave detected by the detection in step S2. When calculating the first determination value, the same operation as when calculating the first reference value and the second reference value is used. That is, when the first reference value and the second reference value are calculated by averaging the intensity, the first determination value is calculated by averaging the intensity in the same manner. When the first reference value and the second reference value are calculated by accumulating the intensity, the first determination value is calculated by accumulating the intensity.

[0076] The processing device 110 compares the first determination value with the first threshold value. For example, when the stronger the reflected wave is, the larger the positive value indicating the intensity is, the processing device 110 determines whether the first determination value exceeds the first threshold value. When the first determination value exceeds the first threshold value, the processing device 110 determines that the detector 130 is in contact with the welding object. When the first determination value is less than the first threshold value, the processing device 110 determines that the detector 130 is away from the welding object.

[0077] In calculating the first determination value, the intensity of all detected reflected waves may be used, or the intensity of a portion of detected reflected waves may be used. In order to reduce the amount of calculation and shorten the time required for determination, it is preferred to calculate the first determination value using only the intensity of a portion of reflected waves. When the first determination value is calculated using only the intensity of a portion of reflected waves, the first reference value and the second reference value are also calculated using the intensity of a portion of reflected waves included in the first detection result and the second detection result, respectively.

[0078] Figure 7 is a graph of the intensity distribution of an example reflected wave.

[0079] exist Figure 7 In FIG. 1 , the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. Figure 7 represents the intensity distribution of the reflected wave in the Z direction in an XZ section. Figure 7 The results of converting the reflected wave intensity into absolute values ​​are shown in FIG.

[0080] exist Figure 7 The intensity distribution shown shows multiple peaks. Peak Pe0 is based on the reflected wave from the interface between the hard transmission member 133 and the coupling agent 15. Peak Pe1 is based on the reflected wave from the upper surface 13a of the welding portion 13. Peak Pe2 is based on the reflected wave from the lower surface 13b of the welding portion 13. Peak Pe3 and subsequent periodic multiple peaks are based on multiple reflected waves between the upper surface 13a and the lower surface 13b. Figure 6 The white lines WL0 to WL3 shown correspond to the peaks Pe0 to Pe3 , respectively. The plurality of peaks having intensities smaller than the peaks Pe0 to Pe3 are based on reflected waves and multiple reflected waves from the upper and lower surfaces of the metal plates 11 and 12 other than the welded portion 13 .

[0081] The peak value Pe0 is based on the reflected wave from the interface between the hard transmission member 133 and the coupling agent 15. Therefore, the peak value Pe0 is detected regardless of whether the detector 130 is in contact with the object. Moreover, the position of the peak value Pe0 is fixed regardless of whether the detector 130 is in contact with the object. The intensity other than the peak value Pe0 varies depending on whether the detector 130 is in contact with the welding object. Therefore, when averaging or accumulating the intensity of the reflected wave, it is preferable to use the intensity of the reflected wave detected after the peak value Pe0.

[0082] In particular, when inspecting the weld 13, the ultrasonic wave is reflected by the lower surface 13b of the weld 13 and is multiply reflected between the upper surface 13a and the lower surface 13b. The intensity of these reflected waves varies greatly depending on whether the detector 130 is in contact with the weld object. Figure 7As shown, in the calculation of the first judgment value, at least one of the intensity of the portion P1 detecting the reflected wave from the lower surface 13b of the welded portion 13 and the intensity of the portion P2 detecting the multiple reflected waves between the upper surface 13a and the lower surface 13b is used. Thus, in the first judgment, the contact between the detector 130 and the welding object can be determined with good accuracy.

[0083] The ranges of the parts P1 and P2 can be set in advance. The period of the peaks other than the peak Pe0 is determined by the thickness of the weld 13. When the thickness of the weld 13 is known, the ranges of the parts P1 and P2 can be set according to the thickness. The part P2 can be set to include all the peaks from the peak Pe3, or Figure 7 The setting shown is to include only a portion of the peaks starting from the peak Pe3.

[0084] For example, the processing device 110 extracts the first part where multiple reflected waves are detected from the first detection result, and averages or accumulates the intensity of the reflected waves of the first part to calculate the first reference value. The processing device 110 extracts the second part where multiple reflected waves are detected from the second detection result, and averages or accumulates the intensity of the reflected waves of the second part to calculate the second reference value.

[0085] And, in Figure 6 and Figure 7 The detection result in an XZ section is exemplified in FIG. The first determination value may be calculated based on the intensity distribution in an XZ section, or may be calculated based on the intensity distribution in an XZ section and a YZ section. Alternatively, the processing device 110 averages or accumulates the intensity of at least a portion of the XY plane at each point in the Z direction to generate an intensity distribution, and calculates the first determination value based on the intensity distribution.

[0086] For example, when the diameter of the weld 13 is known, the processing device 110 can set the range for calculating the first determination value in the XY plane according to the diameter of the weld 13. The diameter of the weld 13 refers to the length of the weld 13 in the direction perpendicular to the direction in which the metal plates 11 and 12 are overlapped. By using the strength of only a part of the XY plane, the amount of calculation can be reduced.

[0087] The user may be able to designate the range of the detection results used for calculating the first determination value, the first reference value, and the second reference value through a user interface displayed on the display device 150 .

[0088] Figure 8 This is an example of a user interface displayed on a display device.

[0089] For example, the processing device 110 uses Figure 8The user interface 900 shown is displayed on the display device 150. For example, the first image 910, the second image 920, and the third image 930 are displayed on the user interface 900. The first image 910 to the third image 930 show the intensity of the reflected wave at each point. Points with high intensity of the reflected wave are shown in white. Here, the intensity of the reflected wave is schematically represented in binary form.

[0090] The first image 910 shows the result of integrating the intensity of the reflected wave in the Z direction at each point on the XY plane. The second image 920 shows the intensity of the reflected wave in the XZ cross section at the center of the first image 910 in the Y direction. The third image 930 shows the intensity of the reflected wave in the YZ cross section at the center of the first image 910 in the X direction.

[0091] For example, the user can use the input device 140 to operate the pointer 901 to draw the frame line F1 or F2 on the second image 920 or the third image 930. For example, if one of the frame lines F1 and F2 is set, the other of the frame lines F1 and F2 is automatically set at the same position in the Z direction as the one of the frame lines F1 and F2. The size of the frame line F1, the position of the frame line F1 in the X direction, the size of the frame line F2, and the position of the frame line F2 in the Y direction can be freely set by the user. Alternatively, the center of the frame line F1 in the X direction may be fixed to the center of the second image 920 in the X direction, and the center of the frame line F2 in the Y direction may be fixed to the center of the third image 930 in the Y direction. For example, if the user changes the size of one of the frame lines F1 and F2, the size of the other of the frame lines F1 and F2 may also change in conjunction with this.

[0092] For example, the user can adjust the size of the frame lines F1 and F2 by operating the pointer 901 to drag the frame lines F1 and F2. If the size of the frame lines F1 and F2 is changed, the processing device 110 stores the changed positions of the frame lines F1 and F2. The processing device 110 calculates the first reference value based on the intensity of the reflected wave included in the frame lines F1 and F2 in the first detection result. The processing device 110 calculates the second reference value based on the intensity of the reflected wave included in the frame lines F1 and F2 in the second detection result. The processing device 110 calculates the first determination value based on the intensity of the reflected wave included in the frame lines F1 and F2 in the detection result obtained by the detection in step S2.

[0093] The processing device 110 may set the first range according to the first reference value and the second reference value. The processing device 110 may also set the first threshold value in addition to setting the first range. The lower limit value and the upper limit value of the first range are set between the first reference value and the second reference value. In the case where the stronger the reflected wave, the greater the positive value representing the intensity, the lower limit value and the upper limit value of the first range are greater than the second reference value and less than the first reference value. For example, the processing device 110 calculates a first intermediate value of the first reference value and the second reference value. The processing device 110 sets the intermediate value of the first intermediate value and the first reference value as the upper limit value of the first range. The processing device 110 sets the intermediate value of the first intermediate value and the second reference value as the lower limit value of the first range.

[0094] For example, the processing device 110 sets the middle value between the first middle value and the first reference value as the first threshold value. The first threshold value may be set outside the first range. The processing device 110 stores the set first threshold value and the first range in the storage device 120.

[0095] When the first threshold and the first range are set, when the first determination value is less than the first threshold, the processing device 110 determines whether the first determination value is within the first range. When the first determination value is outside the first range (less than the lower limit value of the first range), the processing device 110 determines that the detector 130 has left the object. When the first determination value is greater than the lower limit value and less than the upper limit value of the first range, the processing device 110 determines that the state of the detector 130 cannot be determined.

[0096] When the processing device 110 determines in step S3 that the detector 130 has moved away from the object or the state of the detector 130 cannot be determined, it notifies the user in step S4.

[0097] Fig. 9 is a graph of the intensity distribution of an example reflected wave.

[0098] Fig. 9 (a) and Fig. 9 (b) with Figure 7 Similarly, it represents the intensity of the reflected wave at each point in the Z direction in one XZ cross section. The processing device 110 may also set a condition related to the period or position of the peak in step S1.

[0099] In step S1, a member 10 having the same structure as the object to be actually inspected is used. The detector 130 is brought into contact with the weld 13 to perform detection. The processing device 110 generates an intensity distribution of the reflected wave in the Z direction based on the detection result obtained when the detector 130 is brought into contact with the weld 13. The processing device 110 detects a peak value existing in the intensity distribution. The processing device 110 extracts, for example, Fig. 9As shown in (a), the processing device 110 removes the first peak Pe0 in the Z direction and only retains the peaks Pe1 to Pe4 caused by the reflected wave from the component 10. The threshold TH1 can be set in advance by the user, and can also be set based on the average value of at least a part of the intensity distribution.

[0100] For example, the processing device 110 Fig. 9 (b) calculates the average of the periods In1 to In3 between the peaks Pe1 to Pe4. The processing device 110 uses this average as a reference to set conditions related to the period of the peak. Alternatively, the processing device 110 may use the positions of the peaks Pe1 to Pe4 as a reference to set conditions related to the period of the peak. For example, Fig. 9 As shown in (b), the processing device 110 sets the peak range PRa1 to PRa4 according to the peak values ​​Pe1 to Pe4. For example, the center position of the range PRa1 to PRa4 corresponds to the position of the maximum intensity of the peak values ​​Pe1 to Pe4, respectively. The size of the peak range can be preset by the user, and can also be set according to the half-height width of the detected peak value, etc. The processing device 110 stores the conditions related to the period or position of the peak value in the storage device 120.

[0101] The processing device 110 extracts peaks of intensities greater than or equal to the threshold value TH1 from the intensity distribution of the reflected waves detected in the first determination.

[0102] The processing device 110 determines whether the period of the extracted peak value satisfies the condition related to the period of the peak value set in step S1. For example, when the period of the extracted peak value is greater than (1-x) times and less than (1+x) times the average value AVG of the period of the peak value calculated in step S1, the processing device 110 determines that the condition is satisfied. x is preset by the user. Alternatively, x can also be set according to the standard deviation of the period of the peak value, etc.

[0103] Alternatively, the processing device 110 determines whether the position of the extracted peak satisfies the condition related to the position of the peak set in step S1. For example, the processing device 110 determines whether the extracted peak is respectively located in the range PRa1 to PRa4 set in step S1. When the peak is located in the range PRa1 to PRa4 in the first determination, the processing device 110 determines that the condition is satisfied.

[0104] The processing device 110 may perform the first determination using both the condition related to the period of the peak and the condition related to the position of the peak.

[0105] Alternatively, the processing device 110 may determine the contact of the detector 130 based on the spectrum of the reflected wave intensity. In step S1, a component 10 having the same structure as the object to be actually inspected is used. The detector 130 is brought into contact with the weld 13 and detection is performed. The processing device 110 generates an intensity distribution of the reflected wave in the Z direction based on the detection result obtained when the detector 130 contacts the weld 13. The processing device 110 performs spectrum analysis on the intensity distribution and generates a spectrum indicating the relationship between the inverse of the thickness (mm) of the component and the reflected wave intensity. The spectrum analysis uses Fourier transform.

[0106] Fig.10 is a graph of an example spectrum.

[0107] exist Fig.10 In the figure, the horizontal axis represents the inverse of the thickness (mm) of the component, and the vertical axis represents the intensity of the reflected wave corresponding to each component of the horizontal axis. Figure 5 As shown, the ultrasonic wave is multiply reflected on the metal plate 11, the metal plate 12 or the weld 13. Therefore, the intensity of the reflected wave has a periodicity corresponding to the thickness of the metal plate 11, the thickness of the metal plate 12 and the thickness of the weld 13. For example, when the thickness of the metal plate 11 is the same as the thickness of the metal plate 12, as shown in FIG. Fig.10 As shown, the peaks of the intensity appear at the inverses of the thicknesses of the metal plates 11 , 12 and the inverse of the thickness of the weld 13 .

[0108] If a spectrum is generated in step S1, the processing device 110 Fig.10 As shown, the peaks with intensities above the threshold value TH2 are extracted. The processing device 110 sets the conditions based on the value V1 of the inverse of the thickness where each peak appears. Then, if a spectrum is generated in the first judgment, the processing device 110 extracts the peaks with intensities above the threshold value TH2. The processing device 110 determines whether the value V2 of the inverse of the thickness where each peak appears satisfies the conditions. For example, when the value V2 of the inverse of the thickness where each peak appears is greater than (1-y) times and less than (1+y) times the value V1, the processing device 110 determines that the conditions are satisfied. y is preset by the user. Alternatively, y can also be set based on the standard deviation of the period, etc.

[0109] The peak period, the peak position, or the peak position in the spectrum are values ​​specific to the welding object. By using these values ​​as the conditions for the first determination, it is possible to accurately determine whether the detector 130 is in contact.

[0110] When the processing system 100 determines that the detector 130 is in contact with the welding object, it can calculate the inclination of the detector 130 or inspect the welded portion 13. In addition, the processing system 100 can set the range of the detection results used for calculating the inclination.

[0111] Fig.11 This is a flowchart showing the flow of inspection using the processing system according to the embodiment.

[0112] Steps S1 to S4 are Figure 4 In step S3, if it is determined that the detector 130 is in contact with the welding object, the processing device 110 determines whether the range corresponding to the reflected wave from the welding part 13 has been estimated in the detection result (step S5). If the range has not been estimated, the processing device 110 estimates the range (step S6).

[0113] For example Figure 5 , Figure 6 and Figure 8 As shown, the ultrasonic wave is also reflected from the surface other than the welded portion 13. The processing device 110 estimates the range corresponding to the reflected wave from the welded portion 13, and performs the subsequent calculation of the tilt based on the reflected wave included in the range. Thus, the necessary amount of calculation can be reduced. In addition, the accuracy of the calculated tilt can be improved.

[0114] The processing device 110 calculates the tilt of the detector 130 based on the detection result of the reflected wave within the estimated range (step S7), and determines whether the calculated tilt is within the allowable range (step S8). The determination can be performed by the user or by the processing device 110. In the case where the determination is performed by the processing device 110, the allowable range can be set in advance by the user or can be set based on the historical records of past inspection results.

[0115] For example, when the processing device 110 performs the inspection of the weld 13, it also measures the diameter of the weld 13 based on the detection result. The diameter of the weld 13 corresponds to the length of the portion in the X direction and the Y direction where the reflected wave from the upper surface and the lower surface of the weld 13 is detected. For example, when the inclination of the detector 130 is too large, the diameter of the weld 13 is calculated to be smaller than the actual diameter. As the inclination of the weld 13 decreases, the calculated diameter of the weld 13 increases. When the inclination of the detector 130 is sufficiently small, the calculated diameter of the weld 13 hardly changes. The relationship between the inclination of the detector 130 and the diameter of the weld 13 calculated in the past is stored in the storage device 120. Based on the data stored in the storage device 120, the processing device 110 determines a critical value at which the change in the diameter of the weld 13 becomes smaller relative to the change in the inclination of the detector 130. The processing device 110 sets the size of the allowable range based on the critical value. For example, the processing device 110 sets the critical value to the size of the allowable range. Alternatively, in order to further improve the accuracy of the inspection, the processing device 110 may also set a smaller value calculated based on the critical value as the allowable range.

[0116] When executing steps S6 and S7, the detection by the detector 130 may be performed again. Preferably, when executing steps S6 and S7, the detection result used in the first determination of step S3 is used. Thus, the number of detection executions can be reduced, and the amount of calculation of the processing device 110 and the detector 130 can be reduced.

[0117] When the tilt is not within the allowable range, the user adjusts the tilt of the detector 130 (step S9). When the processing device 110 executes step S8, the user can be notified that the tilt is not within the allowable range. After step S9, step S2 is executed again according to the adjusted tilt. As a result, after adjusting the tilt, it is determined again whether the detector 130 is in contact with the welding object. Therefore, it is possible to suppress the recalculation of the tilt using the detection result when the detector 130 is not in contact after adjusting the tilt.

[0118] In addition, after the tilt is adjusted and the detection of step S2 is performed, step S3 can be omitted. In step S3 before the tilt is adjusted, it is determined that the detector 130 is in contact with the welding object. Therefore, after the tilt is adjusted, the possibility that the detector 130 is separated from the welding object is small. By omitting step S3, the amount of calculation of the processing device 110 can be reduced.

[0119] When the tilt is within the allowable range, the inspection is performed (step S10). When the user compares the tilt with the allowable range, the processing device 110 is caused to perform the inspection when the tilt is within the allowable range. When the processing device 110 compares the tilt with the allowable range, the inspection is automatically performed when the tilt is within the allowable range. The processing device 110 outputs the inspection result to the display device 150 (step S11). The inspection result includes information indicating whether welding has been performed, the diameter of the welded portion, the minimum diameter of the welded portion, the maximum diameter of the welded portion, etc.

[0120] Next, an example of specific processing for estimating the range, calculating and checking the tilt will be described.

[0121] (Range estimate)

[0122] Reference Figures 12 to 19 Step S6 will be described in detail.

[0123] For example, in Figure 6 The detection result of the reflected wave is represented two-dimensionally. The detection result of the reflected wave can also be represented three-dimensionally. For example, the component 10 is represented by a plurality of voxels. Each coordinate in the X direction, the Y direction, and the Z direction is set for each voxel. According to the detection result of the reflected wave, the reflected wave intensity is associated with each voxel. The processing device 110 estimates the range (group of voxels) corresponding to the welding part 13 in the plurality of voxels.

[0124] The number of pixels to be set and the size of each pixel may be automatically determined or may be set by the user through the user interface 900 .

[0125] Fig.12 (a) and Fig.12 (b) is a graph illustrating the intensity distribution of the reflected wave in the Z direction in one cross section.

[0126] Fig.13 Graph showing the intensity distribution of reflected waves in the Z direction.

[0127] The processing device 110 generates the intensity distribution of the reflected wave in the Z direction based on the detection result of the reflected wave. Fig.12 (a) and Fig.12 (b) is one example. If an intensity distribution has already been generated when determining the contact of the detector 130, the intensity distribution can be used. Fig.12 (a) and Fig.12 In (b), the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. Fig.12 (a) illustrates an example of the intensity distribution of the reflected wave in the Z direction in an XZ cross section. Fig.12 (b) shows an example of the intensity distribution of the reflected wave in the Z direction in a YZ cross section. Fig.12 (a) and Fig.12 (b) shows the result obtained by converting the reflected wave intensity into an absolute value.

[0128] Alternatively, the processing device 110 may calculate the reflected wave intensity in the XY plane at each point in the Z direction, and generate the reflected wave intensity distribution in the Z direction. Fig.13 is one example. Fig.13 In the figure, the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. Fig.13 , the result obtained by converting the reflected wave intensity into an absolute value and subtracting the average value of the reflected wave intensity from the reflected wave intensity at each point in the Z direction is shown.

[0129] The intensity distribution of the reflected wave in the Z direction includes components reflected on the upper surface 13a and the lower surface 13b of the weld 13, and components reflected on the upper surface and the lower surface of other parts. The processing device 110 extracts only the components reflected on the upper surface 13a and the lower surface 13b of the weld 13 from the intensity distribution of the reflected wave by filtering. For example, a value corresponding to an integer multiple of half the thickness of the weld 13 in the Z direction (the distance between the upper surface 13a and the lower surface 13b) is preset. The processing device 110 refers to the value and extracts only the periodic component of the value.

[0130] As the filtering process, a bandpass filter, a zero phase filter, a low-pass filter, a high-pass filter, or a threshold determination on the intensity after filtering can be used.

[0131] Fig.14 : is a graph illustrating the result of filtering the intensity distribution of the reflected wave.

[0132] exist Fig.14 In the figure, the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. Fig.14 As shown, only the components reflected on the upper and lower surfaces of the welded portion are extracted from the filtering results.

[0133] The processing device 110 estimates the Z-direction range of the welded portion based on the extraction result. For example, the processing device 110 detects the peaks included in the extraction result. The processing device 110 detects the Z-direction position of the first peak and the Z-direction position of the second peak. The processing device 110 uses these positions as a reference, for example Fig.14 The range Ra1 shown is estimated to be the range of the welded portion in the Z direction.

[0134] Depending on the structure of the weld, the structure of the element array 131, etc., the sign (positive or negative) of the reflected wave intensity from the upper surface of the weld and the sign of the reflected wave intensity from the lower surface of the weld are sometimes reversed. In this case, the processing device 110 can detect a peak value of one of the positive and negative values, and a peak value of the other of the positive and negative values. The processing device 110 estimates the range of the weld in the Z direction based on the positions of these peaks. And, depending on the processing of the reflected wave intensity, sometimes only one of the positive and negative values ​​is used to represent the reflected wave intensity. In this case, the range of the weld in the Z direction can be estimated based on the positions of multiple peaks, or it can be estimated based on the positions of peaks and valleys, or it can be estimated based on the positions of multiple valleys. That is, the processing device 110 estimates the range of the weld in the Z direction based on the positions of multiple extreme values ​​for the reflected wave intensity after filtering.

[0135] When generating the intensity distribution of the reflected wave of each of the XZ section and the YZ section, the range of the Z direction based on the intensity distribution of the XZ section and the range of the Z direction based on the intensity distribution of the YZ section are estimated. For example, the processing device 110 calculates the average, weighted average, weighted moving average, etc. of these multiple estimation results, and estimates the calculation result as the range of the Z direction of the entire weld.

[0136] Alternatively, the processing device 110 may estimate the range of the weld in the Z direction based on the intensity distribution of the reflected wave in one of the XZ section and the YZ section, and regard the estimated result as the range of the weld in the Z direction as a whole. Alternatively, the processing device 110 may estimate the range of the weld in the Z direction based on the intensity distribution of the reflected wave in a part of the X direction and a part of the Y direction, and regard the estimated result as the range of the weld in the Z direction as a whole. According to these processes, the amount of calculation required for generating the intensity distribution of the reflected wave can be reduced.

[0137] exist Fig.14 In the example, the Z-direction position of the lower limit of the range Ra1 is set to a value obtained by subtracting a predetermined value from the Z-direction position of the first peak. The Z-direction position of the upper limit of the range Ra1 is set to a value obtained by adding a predetermined value to the Z-direction position of the second peak. In this way, when the upper and lower surfaces of the weld are tilted relative to the arrangement direction of the detection elements 132, it is possible to suppress the second peak from deviating from the Z-direction range at any point in the XY plane of the weld when the upper and lower surfaces of the weld are tilted relative to the arrangement direction of the detection elements 132.

[0138] After estimating the range of the weld portion in the Z direction, the processing device 110 estimates the range of the weld portion in the X direction and the range of the weld portion in the Y direction.

[0139] Fig.15 and Fig.17 is a schematic diagram illustrating the detection results of an example reflected wave.

[0140] exist Fig.15 and Fig.17 In FIG. 1 , region R represents the entire region where the detection result of the reflected wave can be obtained by the element array 131. A cross section of region R includes components of the reflected wave at the upper and lower surfaces of the welded portion and components of the reflected wave at the upper and lower surfaces of other portions.

[0141] The processing device 110 generates an intensity distribution of the reflected wave on the XY plane at each point in the Z direction. The processing device 110 can also generate an intensity distribution within a preset range in the Z direction. Thus, the amount of calculation can be reduced. Alternatively, the processing device 110 can also generate an intensity distribution within an estimated range in the Z direction. Thus, the amount of calculation can be reduced, and at the same time, when generating the intensity distribution of the reflected wave on the XY plane, the deviation of the reflected wave component from the lower surface of the weld can be suppressed.

[0142] Fig.16 (a)~ Fig.16 (c) is an example of intensity distribution of reflected waves in the XY plane. Fig.16 (a) shows the intensity distribution of the reflected wave on the XY plane at the coordinate of Z=1. Fig.16 (b) shows the intensity distribution of the reflected wave on the XY plane at the coordinate of Z=2. Fig.16(c) shows the intensity distribution of the reflected wave on the XY plane at the coordinate of Z=350. Fig.15 , Fig.16 (a)~ Fig.16 (c) and Fig.17 In FIG. 1 , the intensity of the reflected wave is schematically represented in binary form.

[0143] The processing device 110 calculates the centroid position of the intensity distribution of the reflected wave on the XY plane at each point in the Z direction. Here, the centroid position of the intensity distribution is obtained by calculating the centroid position of the image representing the intensity distribution. For example, according to Fig.16 (a)~ Fig.16 As shown in (c), the processing device 110 calculates the centroid positions C1 to C350 of each image. Fig.17 In FIG. 1 , the line segment L represents the result of connecting all the centroid positions from Z=0 to Z=350.

[0144] The processing device 110 averages the centroid positions from Z=0 to Z=350. In this way, the average position of the centroid in the X direction and the average position of the centroid in the Y direction can be obtained. Fig.17 The average position AP represents the average position of the center of gravity in the X direction and the average position of the center of gravity in the Y direction. The processing device 110 defines a predetermined range in the X direction and the Y direction as a range Ra2 of the weld in the X direction and a range Ra3 of the weld in the Y direction, respectively, with the average position AP as the center.

[0145] For example, in order to estimate the range Ra2 and the range Ra3, a value V indicating the diameter of the detector 130 (element array 131) is set in advance. The processing device 110 sets the range from AP-V / 2 to AP+V / 2 in the X direction and the Y direction as the range Ra2 and the range Ra3, respectively. In this case, the estimated range in the XY plane becomes a quadrilateral. Not limited to this example, the estimated range in the XY plane may also be a polygonal shape or a circle with a pentagon or more. The shape of the estimated range in the XY plane may be appropriately changed according to the shape of the welded portion.

[0146] The range Ra2 and the range Ra3 may be determined using other values ​​based on the value V. Instead of the value indicating the diameter of the detector 130, a value indicating the diameter of the weld may be preset. This is because the diameter of the weld corresponds to the diameter of the detector 130. The value indicating the diameter of the weld can be substantially regarded as a value indicating the diameter of the detector 130.

[0147] Through the above processing, the range Ra1 in the Z direction, the range Ra2 in the X direction, and the range Ra3 in the Y direction of the weld are estimated. After the range is estimated, the detection result of the reflected wave in the estimated range is executed. Fig.11 Step S7 is shown.

[0148] Fig.18 It is a flowchart showing the process of estimating the scope of the processing system related to the embodiment.

[0149] The processing device 110 generates an intensity distribution of the reflected wave in the Z direction based on the detection result of the reflected wave by the detector 130 (step S601). The processing device 110 performs filtering processing on the intensity distribution according to the value of the thickness of the weld (step S602). Thus, only the reflected wave component of the weld 13 is extracted from the intensity distribution. The processing device 110 estimates the range of the weld in the Z direction based on the extraction result (step S603). The processing device 110 calculates the centroid position of the reflected wave intensity on the XY plane at each point in the Z direction (step S604). The processing device 110 averages the calculated multiple centroid positions, thereby calculating the average position (step S605). The processing device 110 estimates the range of the X direction and the Y direction based on the average position and the diameter of the detector 130 (step S606).

[0150] In addition, the estimation of the range in the Z direction may be performed after the estimation of the range in the X direction and the Y direction. Fig.18 In the flowchart shown, steps S601 to S603 may also be executed after steps S604 to S606. In this case, the processing device 110 may calculate the intensity distribution of the reflected wave in the Z direction based on the estimated ranges in the X direction and the Y direction. This may reduce the amount of calculation.

[0151] (Calculation of tilt)

[0152] Fig.19 is an image showing an example of the detection result of the reflected wave.

[0153] exist Fig.19 The whiter the color, the greater the intensity of the reflected wave at this point. Fig.19 The test results shown are performed Fig.18 As a result, the range Ra is estimated.

[0154] Next, a specific example of a method for calculating the inclination in the range Ra will be described.

[0155] Fig. 20 It is a diagram for explaining the processing of the processing system according to the embodiment.

[0156] Fig.21 and Fig. 22 This is an example of an image obtained by the processing system according to the embodiment.

[0157] Fig.21 It is three-dimensional volume data drawn based on the detection results of reflected waves. Fig. 22 (a) indicates Fig.21 The surface of the welded portion 13 in the volume data is shown. Fig. 22 (b) indicates Fig.21 The YZ cross section near the weld portion 13 in the volume data is shown. Fig. 22 (c) indicates Fig.21 The XZ cross section near the welding part 13 in the volume data shown. Fig. 22 (b) and Fig. 22 In (c), the upper side is the surface of the weld, and the data in the depth direction are shown downward. The part with high brightness is the part with high reflection intensity of the ultrasonic wave. The ultrasonic wave is strongly reflected by the bottom surface of the weld 13, the surface between the unjoined components, etc.

[0158] The tilt of the detector 130 and Fig. 20 The angle between the direction 13d perpendicular to the weld 13 and the direction 130a of the detector 130 corresponds. The angle is represented by the angle θx around the X direction and the angle θy around the Y direction. The direction 130a of the detector 130 is perpendicular to the arrangement direction of the detection elements 132.

[0159] Angle θx is Fig. 22 As shown in (b), the calculation is performed based on the detection results in the YZ section. Fig. 22 As shown in (c), the calculation is performed based on the detection result in the XZ section. The processing device 110 calculates the average of the three-dimensional brightness gradient for each section as the angle θx and θy. The processing device 110 stores the calculated angles θx and θy as the tilt of the detector 130 in the storage device 120. The processing device 110 can also cause the display device 150 to display the calculated tilt.

[0160] (examine)

[0161] Fig.23 It is a schematic diagram for explaining the inspection method of the processing system related to the embodiment.

[0162] like Fig.23 As shown in (a), part of the ultrasonic wave US is reflected by the upper surface 11a of the metal plate 11 or the upper surface 13a of the weld 13. The other part of the ultrasonic wave US enters the member 10 and is reflected by the lower surface 11b of the metal plate 11 or the lower surface 13b of the weld 13.

[0163] The upper surface 11a, the upper surface 13a, the lower surface 11b, and the lower surface 13b are located at different positions in the Z direction. That is, the distances in the Z direction between these surfaces and the detection element 132 are different. If the detection element 132 receives the reflected waves from these surfaces, the peak value of the intensity of the reflected waves is detected. By calculating the time from the transmission of the ultrasonic wave US to the detection of each peak value, it is possible to confirm which surface the ultrasonic wave US is reflected from.

[0164] Fig.23 (b) and Fig.23 (c) is a graph showing the relationship between the time after the ultrasonic wave US is transmitted and the intensity of the reflected wave RW. Fig.23 (b) and Fig.23 In (c), the vertical axis represents the time elapsed after the ultrasonic wave US is transmitted, and the horizontal axis represents the intensity of the detected reflected wave RW. Here, the intensity of the reflected wave RW is represented by an absolute value. Fig.23 The graph of (b) illustrates the detection results of the reflected waves RW from the upper surface 11 a and the lower surface 11 b of the metal plate 11 . Fig.23 The graph of (c) illustrates the detection result of the reflected wave RW from the upper surface 13 a and the lower surface 13 b of the welded portion 13 .

[0165] exist Fig.23 In the graph of (b), the first peak Pe11 is based on the reflected wave RW from the upper surface 11a. The second peak Pe12 is based on the reflected wave RW from the lower surface 11b. The times when the peak Pe11 and the peak Pe12 are detected correspond to the positions of the upper surface 11a and the lower surface 11b of the metal plate 11 in the Z direction, respectively. The time difference TD1 between the time when the peak Pe11 is detected and the time when the peak Pe12 is detected corresponds to the distance Di1 in the Z direction between the upper surface 11a and the lower surface 11b.

[0166] Similarly, in Fig.23 In the graph of (c), the first peak Pe13 is based on the reflected wave RW from the upper surface 13a. The second peak Pe14 is based on the reflected wave RW from the lower surface 13b. The times when the peaks Pe13 and Pe14 are detected correspond to the positions of the upper surface 13a and the lower surface 13b of the welded portion 13 in the Z direction, respectively. The time difference TD2 between the time when the peak Pe13 is detected and the time when the peak Pe14 is detected corresponds to the distance Di2 in the Z direction between the upper surface 13a and the lower surface 13b.

[0167] The processing device 110 determines whether the time difference between the peak values ​​of each point in the XY plane corresponds to the thickness of the weld 13. When it is determined that the time difference between the peak values ​​corresponds to the thickness of the weld 13, it is determined that the point is welded. The set of points determined to be welded corresponds to the weld 13. Therefore, the diameter of the weld 13 can be calculated based on the size of the set of points. For example, the processing device 110 compares the calculated diameter of the weld 13 with a preset threshold value to determine whether the welding is good.

[0168] In addition, the upper surface 13a and the lower surface 13b of the welded portion 13 are sometimes inclined relative to the upper surface 11a of the metal plate 11. This is based on the fact that the welded portion 13 includes the solidified portion 14, the deformation of the shape during the welding process, etc. In this case, it is desirable that the ultrasonic wave US is transmitted in a direction perpendicular to the upper surface 13a or the lower surface 13b on average. As a result, the ultrasonic wave is strongly reflected at the upper surface 13a and the lower surface 13b, which can improve the accuracy of the inspection.

[0169] (Variation Example)

[0170] The inspection of the welded portion described above can also be automatically performed by a robot.

[0171] Fig.24 It is a schematic diagram showing the structure of a processing system according to a modified example of the embodiment.

[0172] Fig.25 It is a perspective view showing a part of a processing system according to a modified example of the embodiment.

[0173] Fig.24 The processing system 100a shown includes a processing device 110 and a robot 160. The robot 160 includes a detector 130, an imaging device 161, a coating device 162, an arm 163, and a control device 164.

[0174] The camera device 161 captures the welded components and obtains an image. The camera device 161 extracts the welding trace from the image and detects the approximate position of the welded portion 13. The coating device 162 coats the coupling agent on the upper surface of the welded portion 13.

[0175] The detector 130, the camera device 161 and the coating device 162 are as follows: Fig.25 As shown, it is arranged at the front end of the arm 163. The arm 163 is, for example, a vertical multi-joint robot with six degrees of freedom including a plurality of connecting rods and a plurality of rotating axes. The arm 163 includes a plurality of actuators (such as motors). The plurality of actuators respectively move the plurality of rotating axes. By driving the arm 163, the detector 130, the camera device 161 and the coating device 162 can be shifted. The control device 164 controls the movement of each component of the robot 160 (the detector 130, the camera device 161, the coating device 162, the arm 163).

[0176] Fig.26 This is a flowchart showing the operation of a processing system according to a modification example of the embodiment.

[0177] First, before the processing system 100a is operated, the conditions for determining the contact between the detector 130 and the welding object are pre-set. The method for setting the conditions is as described above. After setting the conditions, the processing device 110 sends the coordinates of the welding portion 13 stored in the storage device 120 to the control device 164. The control device 164 drives the arm 163 to move the front end of the arm toward the received coordinates (step S21). If the detector 130 is moved to the vicinity of the received coordinates, the camera device 161 photographs the component 10 and detects the specific position of the welding portion 13 based on the acquired image (step S22). The control device 164 drives the arm 163 to move the coating device 162 to the vicinity of the detected position (step S23). The coating device 162 applies the coupling agent to the welding portion 13 (step S24). The control device 164 drives the arm 163 to move the detector 130 so that the front end of the detector 130 contacts the welding portion 13 coated with the coupling agent (step S25). Thereafter, Fig.11 Steps S2 to S11 of the flowchart shown are executed in the same manner.

[0178] When the result of the first determination in step S3 is that the detector 130 is determined not to be in contact with the welding object, the processing system 100a may also perform actions other than notification. For example, the processing system 100a may further move the front end of the detector 130 toward the welding part photographed in step S22. Depending on the form of irradiation of light toward the welding part during shooting, the position of the welding part may be erroneously detected. By moving the front end of the detector 130, the front end of the detector 130 may be in proper contact with the welding part. Alternatively, the processing system 100a may also perform step S22 again. At this time, the processing system 100a may also change the conditions for image processing, the conditions for detecting the position of the welding part, etc. from the previous conditions. Thereby, the position of the welding part can be detected more accurately. After detecting the position of the welding part, for example, the steps from step S23 are performed again. Alternatively, the processing system 100a may also perform notification on the basis of these actions.

[0179] For the processing system 100a of the related modification example, it is also possible to replace the arm 163 with other movable mechanisms having more than two degrees of freedom including an actuator. The detector 130 is mounted on the movable mechanism. For example, the movable mechanism includes at least one selected from a parallel linkage mechanism with six degrees of freedom, a horizontal multi-joint mechanism with six degrees of freedom, and an angle meter head with two degrees of freedom. The control device 164 controls and drives the movable mechanism. The movable mechanism moves, thereby changing the inclination of the detector 130. When the degrees of freedom of the movable mechanism are less than six degrees of freedom, it is preferred to convey the component 10 in contact with the detector 130 by a conveying mechanism not shown in the figure. The action of the conveying mechanism can be controlled based on the result of the first judgment.

[0180] Fig. 27 It is a block diagram showing the hardware structure of the system.

[0181] For example, the processing device 110 of the processing system 100 of the embodiment is a computer having a ROM (Read Only Memory) 111, a RAM (Random Access Memory) 112, a CPU (Central Processing Unit) 113, and a HDD (Hard Disk Drive) 114.

[0182] The ROM 111 stores a program for controlling the operation of the computer. The ROM 111 stores a program necessary for causing the computer to realize each of the above-mentioned processes.

[0183] RAM 112 functions as a storage area for expanding the program stored in ROM 111. CPU 113 includes a processing circuit. CPU 113 reads the control program stored in ROM 111 and controls the operation of the computer according to the control program. In addition, CPU 113 expands various data obtained by the operation of the computer in RAM 112. HDD 114 stores data required for reading and data obtained during reading. HDD 114 can be used as Figure 1 The storage device 120 is shown to function.

[0184] The processing device 110 may also replace the HDD 114 and include an eMMC (embedded Multi Media Card), an SSD (Solid State Drive), an SSHD (Solid State Hybrid Drive), or the like.

[0185] The various processes and functions of the processing device 110 may also be implemented through the cooperation of more computers.

[0186] The input device 140 includes at least one of a mouse, a keyboard, and a touch pad. The display device 150 includes at least one of a monitor and a projector. A device that functions as both the input device 140 and the display device 150, such as a touch screen, may be used.

[0187] In the above, an example of inspecting the spot-welded welded portion 13 by the processing system 100 or 100a is described. Without being limited to this example, the processing system 100 or 100a may inspect components welded by other methods. For example, the processing system 100 or 100a may inspect components welded by arc welding, laser welding, or seam welding. Nondestructive inspection using the detector 130 may also be performed on components welded by these methods.

[0188] The implementation method may also include the following schemes.

[0189] (Scheme 1)

[0190] A processing system, the processing system having a processing device, when the detector including a plurality of detection elements arranged along a first direction sends ultrasonic waves toward a welding object and detects the reflected waves, performs a first determination based on the detection result as to whether the detector is in contact with the welding object.

[0191] (Solution 2)

[0192] According to the processing system of claim 1, when the processing device determines that the detector is in contact with the welding object, it calculates the inclination of the detector relative to the welding object or inspects the welding object based on the detection result.

[0193] (Scheme 3)

[0194] According to the processing system of scheme 1, when the processing device determines that the detector is in contact with the welding object, it performs calculation of the inclination of the detector relative to the welding object or inspection of the welding object based on the detection result used in the first determination.

[0195] (Scheme 4)

[0196] According to the processing system described in any one of Schemes 1 to 3, the processing device extracts a portion where multiple reflected waves are detected from the detection result, and performs the first determination based on the reflected waves of the extracted portion.

[0197] (Scheme 5)

[0198] According to the processing system described in Option 4, the processing device compares a first judgment value obtained by accumulating or averaging the intensity of the extracted portion of the reflected wave with a preset first threshold value, thereby performing the first judgment.

[0199] (Scheme 6)

[0200] According to the processing system of the fifth solution, the processing device extracts a first part of the multiple reflected waves detected from the first detection result of the reflected waves when the detector contacts the component, and averages or accumulates the intensity of the reflected waves of the first part to calculate the first reference value.

[0201] The processing device extracts a second part in which multiple reflected waves are detected from a second detection result of the reflected waves when the component and the detector are separated, and averages or accumulates the intensity of the reflected waves in the second part to calculate a second reference value.

[0202] The first threshold is set between the first reference value and the second reference value.

[0203] (Scheme 7)

[0204] According to the processing system described in any one of Schemes 1 to 3, the processing device compares the period of the peak of the reflected wave, the position of the peak or the position of the spectrum contained in the detection result with a preset condition, thereby performing the first judgment.

[0205] (Scheme 8)

[0206] According to the processing system described in any one of the first to seventh aspects, the processing device notifies a user when it is determined that the detector is not in contact with the welding object.

[0207] (Scheme 9)

[0208] According to the processing system described in any one of schemes 1 to 8, the processing system further comprises:

[0209] the detector;

[0210] a movable mechanism, including an actuator, on which the detector is mounted;

[0211] A control device controls the detector and the movable mechanism.

[0212] (Scheme 10)

[0213] According to the processing system described in any one of the first to ninth solutions, the processing system further includes a display device that displays a user interface including an image representing the detection result.

[0214] (Scheme 11)

[0215] According to the processing system of the tenth solution, the processing device accepts the user's designation of the range of the image input in the user interface,

[0216] The processing device performs the first determination by comparing a first determination value obtained by integrating or averaging the intensities of the reflected waves in the designated range with a preset first threshold value.

[0217] (Scheme 12)

[0218] A processing method determines whether the detector is in contact with the welding object according to the detection result if a detector including a plurality of detection elements arranged in a first direction transmits ultrasonic waves toward the welding object and detects the reflected waves detects the reflected waves.

[0219] (Scheme 13)

[0220] According to the processing method described in the twelfth solution, when it is determined that the detector is in contact with the welding object, calculation of the inclination of the detector relative to the welding object or inspection of the welding object is performed based on the detection result.

[0221] (Scheme 14)

[0222] According to the processing method described in Scheme 12 or 13, the portion where multiple reflected waves are detected is extracted from the detection result, and the first determination is performed based on the reflected waves of the extracted portion.

[0223] (Scheme 15)

[0224] According to the processing method described in Scheme 12 or 13, the period of the peak of the reflected wave, the position of the peak or the position of the spectrum contained in the detection result is compared with a preset condition, thereby performing the first determination.

[0225] (Scheme 16)

[0226] A program causes a computer to execute a first determination, the first determination being: if a detector including a plurality of detection elements arranged in a first direction that transmits ultrasonic waves toward a welding object and detects reflected waves detects the reflected waves, then determining whether the detector is in contact with the welding object based on the detection result.

[0227] (Scheme 17)

[0228] According to the program of claim 16, when it is determined that the detector is in contact with the welding object, the program causes the computer to calculate the inclination of the detector relative to the welding object or inspect the welding object based on the detection result.

[0229] (Scheme 18)

[0230] According to the program described in the sixteenth or seventeenth aspect, the program causes the computer to extract a portion where multiple reflected waves are detected from the detection result, and to perform the first determination based on the reflected waves of the extracted portion.

[0231] (Scheme 19)

[0232] According to the program described in Scheme 16 or 17, the program causes the computer to compare the period of the peak of the reflected wave, the position of the peak or the position of the spectrum contained in the detection result with a preset condition, thereby performing the first determination.

[0233] (Scheme 20)

[0234] A storage medium storing the program described in any one of schemes 16 to 19.

[0235] By using the processing system and processing method of the above-described embodiments, the contact between the detector and the welding object can be determined with good accuracy. By performing the contact determination between the detector and the welding object, the accuracy of the calculation or inspection of the tilt performed later can be improved. In addition, by using a program that causes a computer to operate as a processing system, the same effect can be obtained.

[0236] The processing of the above-mentioned various data can also be recorded as a program that can be executed by a computer, on a disk (floppy disk, hard disk, etc.), an optical disk (CD-ROM, CD-R, CD-RW, DVD-ROM, DVD±R, DVD±RW, etc.), a semiconductor memory or other recording media.

[0237] For example, the data recorded in the recording medium can be read out by a computer (or embedded system). In the recording medium, the recording format (storage format) is arbitrary. For example, the computer reads out the program from the recording medium, and the CPU executes the instructions recorded in the program according to the program. In the computer, the acquisition (or reading) of the program can also be carried out through a network.

[0238] Several embodiments of the present invention are illustrated above, but these embodiments are presented as examples and are not intended to limit the scope of the invention. These new embodiments can be implemented in various other forms, and various omissions, substitutions, changes, etc. can be made without departing from the scope of the main purpose of the invention. These embodiments and their modifications are included in the scope or main purpose of the invention, and are included in the invention described in the claims and the scope of their equivalents. In addition, the aforementioned embodiments can be implemented in combination with each other.

Claims

1. A processing system, wherein: The processing system includes a processing device, which performs a first determination based on the detection result to determine whether the detector is in contact with the welding object, if the detector, which includes a plurality of detection elements arranged in a first direction and transmits ultrasonic waves toward the welding object and detects the reflected waves, detects the reflected waves, The processing device extracts a portion where multiple reflected waves are detected from the detection result, and performs the first determination based on the reflected waves of the extracted portion. The processing device compares a first determination value obtained by integrating or averaging the intensity of the reflected wave of the extracted portion with a preset first threshold value, thereby performing the first determination. The processing device extracts a first part of the multiple reflected waves from the first detection result of the reflected waves when the detector contacts the component, and averages or accumulates the intensity of the reflected waves in the first part to calculate a first reference value. The processing device extracts a second part in which multiple reflected waves are detected from a second detection result of the reflected waves when the component and the detector are separated, and averages or accumulates the intensity of the reflected waves in the second part to calculate a second reference value. The first threshold is set between the first reference value and the second reference value.

2. The processing system according to claim 1, wherein: When the processing device determines that the detector is in contact with the welding object, the processing device calculates the inclination of the detector relative to the welding object or inspects the welding object based on the detection result.

3. The processing system according to claim 1, wherein: When the processing device determines that the detector is in contact with the welding object, the processing device calculates the inclination of the detector relative to the welding object or inspects the welding object based on the detection result used in the first determination.

4. The processing system according to any one of claims 1 to 3, wherein: The processing device performs the first determination by comparing a period of a peak of the reflected wave, a position of a peak, or a position of a spectrum included in the detection result with a preset condition.

5. The processing system according to any one of claims 1 to 3, wherein: The processing device notifies a user when it is determined that the detector is not in contact with the welding object.

6. The processing system according to any one of claims 1 to 3, wherein: The processing system also has: the detector; a movable mechanism, including an actuator, on which the detector is mounted; A control device controls the detector and the movable mechanism.

7. The processing system according to any one of claims 1 to 3, wherein: The processing system further includes a display device for displaying a user interface including an image representing the detection result.

8. The processing system according to claim 7, wherein: The processing device receives a user's designation of a range of the image input in the user interface, The processing device performs the first determination by comparing a first determination value obtained by integrating or averaging the intensities of the reflected waves in the designated range with a preset first threshold value.

9. A processing method, wherein: If the reflected wave is detected by a detector including a plurality of detection elements arranged in a first direction and transmitting ultrasonic waves toward the welding object and detecting the reflected wave, a first determination is performed to determine whether the detector is in contact with the welding object based on the detection result, extracting a portion where multiple reflected waves are detected from the detection result, and performing the first determination based on the reflected waves of the extracted portion; The first determination is performed by comparing a first determination value obtained by integrating or averaging the intensity of the reflected wave of the extracted portion with a preset first threshold value, extracting a first portion of the reflected waves detected by the detector when the detector is in contact with the component, averaging or accumulating the intensity of the reflected waves in the first portion to calculate a first reference value, extracting a second part in which multiple reflected waves are detected from a second detection result of the reflected waves when the component and the detector are separated, averaging or accumulating the intensities of the reflected waves in the second part to calculate a second reference value, The first threshold is set between the first reference value and the second reference value.

10. The processing method according to claim 9, wherein: When it is determined that the detector is in contact with the welding object, calculation of the inclination of the detector relative to the welding object or inspection of the welding object is performed based on the detection result.

11. The processing method according to claim 9 or 10, wherein: The first determination is performed by comparing a peak period, a peak position, or a frequency spectrum position of the reflected wave included in the detection result with a preset condition.

12. A storage medium storing a program, wherein: The program causes the computer to perform the following processing: if a detector including a plurality of detection elements arranged in a first direction that transmits ultrasonic waves toward a welding object and detects reflected waves detects the reflected waves, a first determination is performed to determine whether the detector is in contact with the welding object based on the detection result; The program causes the computer to extract a portion where multiple reflected waves are detected from the detection result, and to perform the first determination based on the reflected waves of the extracted portion. The program causes the computer to compare a first determination value obtained by integrating or averaging the intensity of the reflected waves of the extracted portion with a preset first threshold value, thereby performing the first determination. The program causes the computer to extract a first portion where multiple reflected waves are detected from a first detection result of the reflected waves when the detector is in contact with a component, and to average or accumulate the intensities of the reflected waves in the first portion to calculate a first reference value. The program causes the computer to extract a second portion in which multiple reflected waves are detected from a second detection result of the reflected waves when the component and the detector are separated, and to average or accumulate the intensities of the reflected waves in the second portion to calculate a second reference value. The program causes the computer to set the first threshold value between the first reference value and the second reference value.

13. The storage medium according to claim 12, wherein: The program causes the computer to calculate the inclination of the detector relative to the welding object or to inspect the welding object based on the detection result when it is determined that the detector is in contact with the welding object.

14. The storage medium according to claim 12 or 13, wherein: The program causes the computer to compare a period of a peak of the reflected wave, a position of a peak, or a position of a spectrum included in the detection result with a preset condition, thereby executing the first determination.

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